View detail for AT25040/20/10 Reliability Qualification Report

AT25040/20/10
(AT35534/35/36)
Serial EEPROM
Product Qualification
• 2325 Orchard Parkway • San Jose CA 95131 •
The AT25010/20/40 Serial EEPROMs are fabricated on the AT35000 CMOS process.
With the exception of ESD, all tests were performed at Atmel’s Colorado Springs
Facility.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance for the AT25010/20/40 Serial EEPROMs. This data, in conjunction with the
AT35000 Process Qualification and Reliability Report, qualifies the AT25010/20/40.
Package specific qualification data is provided separately.
• 2325 Orchard Parkway • San Jose CA 95131 •
AT35534/35/36 Product Qualification
ESD Characterization
Device: AT25040A/020A/010A
Lot Number: LOT# 2h0444
Quantity Tested: 3/ lot per Voltage
Test Temperature: 25C
ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Model
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C
Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations
Pin
Name
Vcc
Gnd
CS
Hold
SI
WP
SCK
SO
Function
Tested As
Power
Ground
Chip Select
Suspend Input
Serial Data IN
Write Protect
Serial Clock
Serial Data OUT
Vcc
Gnd
Input
Input
Input
Input
Input
Output
Functional Test Only
Failing Pin Not Identified
See Above
3 Positive & 3 Negative Pulses per The Specified Pin
Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Qty/Fail
Qty/Fail
Qty/Fail Voltage
2000V
500V
1000V
4000V
3/0
3/0
3/0
3/0
3/0
4000
3/0
3/0
3/0
3/0
3/0
4000
3/0
3/0
3/0
3/0
3/0
4000
3/0
3/0
3/0
3/0
3/0
4000
3/0
3/0
3/0
3/0
3/0
4000
3/0
3/0
3/0
3/0
3/0
4000
3/0
3/0
3/0
3/0
3/0
4000
3/0
3/0
3/0
3/0
3/0
4000
3/0
3/0
• 2325 Orchard Parkway • San Jose CA 95131 •
3/0
3/0
3/0
4000
AT35534/35/36 Product Qualification
Latch-Up Characterization
Device: AT25040A/020A/010A
Lot Number: LOT# 2h0444
Quantity Tested: 5 per lot
Test Method: JEDEC 78
Test Temperature: 125C
Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C
Over Current Test Voltage Vcc = 5.0V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 7.0 V
Pin
Name
Function
Vcc
Gnd
CS
Hold
SI
WP
SCK
SO
Power
Ground
Chip Select
Suspend Input
Serial Data IN
Write Protect
Serial Clock
Serial Data OUT
Max Trigger Current
Max Trigger Voltage
Complianc
Passing* Passing*
Passing* Passing* Compliance
e Setting
Tested As -I (mA)
+V (V) Setting (mA)
+I (mA)
-V (V)
(V)
Vcc
--------7.0
250
Gnd
------------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Output
200
200
7.0
-------
* 0 Fails for Latchup or Post Stress Functional Tests.
Write Endurance Characterization @ 25C
Device: AT25040A/020A/010A
Lot Number: LOT# 2h0444
Quantity Tested: 200
Test Temperature: 25C
Vcc: 5 Volts
Write Mode: Page
Highest Passing Cycles: 1,000,000
Cycles To First Failure: NA
Write Endurance Characterization @125C
Device: AT25040A/020A/010A
Lot Number: LOT# 2h0444
Quantity Tested: 100
Test Temperature: 125C
Vcc: 5 Volts
Write Mode: Page
Highest Passing Cycles: 100,000
Cycles To First Failure: 200,000
• 2325 Orchard Parkway • San Jose CA 95131 •