View detail for AT34C02 Reliability Qualification Report

AT34C02
(AT35526)
2-Wire Serial EEPROM
Product Qualification
• 2325 Orchard Parkway • San Jose CA 95131 •
The AT34C02 2-Wire Serial EEPROMs are fabricated on Atmel's AT35000 CMOS
process. With the exception of HBM ESD, all testing is performed at the Atmel
Colorado Springs Facility. Test samples are selected randomly from standard product.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance, for the AT34C02 Serial EEPROMs. This data, in conjunction with the
AT35000 Process Qualification and Reliability Report, qualifies the AT34C02 for
Commercial, Industrial and Automotive applications.
Package specific qualification data is available separately.
• 2325 Orchard Parkway • San Jose CA 95131 •
AT34C02 Product Qualification
ESD Characterization
ORYX Model 11000 ESD Test System
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C
Stress Test Temperature: 25C
Quantity Tested: 3/Lot/Voltage
Device: AT35526
Human Body Model Testing – Mil Std 883, Method 3015
Lot Number: 4e4398
3 Positive & 3 Negative Pulses per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
500V
2000V
Name
1000V
4000V
Vcc
Power
Vcc
3/0
3/0
3/0
3/3
3/0
2500
Gnd
Ground
Gnd
3/0
3/0
3/0
3/3
3/0
2500
A0
Address
Input/Output
3/0
3/0
3/0
3/3
3/0
2500
A1
Address
Input/Output
3/0
3/0
3/0
3/3
3/0
2500
A2
Address
Input/Output
3/0
3/0
3/0
3/3
3/0
2500
WP
Write Protect
Input/Output
3/0
3/0
3/0
3/3
3/0
2500
SCL
Serial Clock Input
Input/Output
3/0
3/0
3/0
3/3
3/0
2500
SDA
Serial Data
Input/Output
3/0
3/0
3/0
3/3
3/0
2500
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/0
3/3
3/0
2500
Machine Model Testing – JEDEC Std 22A, Method 115A
Lot Number: 4e4398
1 Positive & 1 Negative Pulse per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
50V
150V
Name
100V
200V
Vcc
Power
Vcc
3/0
3/0
3/0
3/0
3/0
200
Gnd
Ground
Gnd
3/0
3/0
3/0
3/0
3/0
200
A0
Address
Input/Output
3/0
3/0
3/0
3/0
3/0
200
A1
Address
Input/Output
3/0
3/0
3/0
3/0
3/0
200
A2
Address
Input/Output
3/0
3/0
3/0
3/0
3/0
200
WP
Write Protect
Input/Output
3/0
3/0
3/0
3/0
3/0
200
SCL
Serial Clock Input
Input/Output
3/0
3/0
3/0
3/0
3/0
200
SDA
Serial Data
Input/Output
3/0
3/0
3/0
3/0
3/0
200
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/0
• 2325 Orchard Parkway • San Jose CA 95131 •
3/0
3/0
200
AT34C02 Product Qualification
Latch-Up Characterization
ORYX Model 11000 ESD Test System
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C
Test Method: JEDEC 78
Quantity Tested: 5/Lot
Stress Test Temperature: 25C
Over Current Test Voltage Vcc = 5.0 V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 9.0 V
Device: AT35526
Lot Number: 4e4398
Max Trigger Current
Pin
Name
Function
Tested As
Passing*
-I (mA)
Vcc
Gnd
A0
A1
A2
WP
SCL
SDA
SDA
Power
Ground
Address
Address
Address
Write Protect
Serial Clock Input
Serial Data
Serial Data
Vcc
Gnd
Input
Input
Input
Input
Input
Input
Output
----200
200
200
200
200
200
200
Max Trigger Voltage
Passing* Compliance Passing* Passing* Compliance
+I (mA) Setting (V) -V (V)
+V (V) Setting (mA)
----200
200
200
200
200
200
200
----7.0
7.0
7.0
7.0
7.0
7.0
7.0
-------------------
7.0
-----------------
* 0 Fails for Latchup or Post Stress Functional Tests.
Write Endurance Characterization
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C and 125C
Device: AT35526
Lot Number: LLL
Quantity Tested: 100
Stress Test Temperature: 25C
Vcc = 5.0 V
Write Mode: Page
Highest Passing Cycles: 1,600,000
Cycles to First Failure: 1,800,000
Quantity Failed: 5
• 2325 Orchard Parkway • San Jose CA 95131 •
250
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