AT24C08A (AT3552E) 2-Wire Serial EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT24C08A 2-Wire Serial EEPROMs are fabricated on Atmel's AT35000 CMOS process. With the exception of HBM ESD, all testing is performed at the Atmel Colorado Springs Facility. Test samples are selected randomly from standard product. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance, for the AT24C08A Serial EEPROMs. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT24C08A for Commercial, Industrial and Automotive applications. Package specific qualification data is available separately. • 2325 Orchard Parkway • San Jose CA 95131 • AT24C08A Product Qualification ESD Characterization ORYX Model 11000 ESD Test System Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C and 125C Stress Test Temperature: 25C Quantity Tested: 3/Lot/Voltage Device: AT3552E Human Body Model Testing – Mil Std 883, Method 3015 Lot Number: 3h6489 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 500V 2000V Name 1000V 4000V Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 2000 Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 2000 A0 Address Input/Output 3/0 3/0 3/0 3/3 3/0 2000 A1 Address Input/Output 3/0 3/0 3/0 3/3 3/0 2000 A2 Address Input/Output 3/0 3/0 3/0 3/3 3/0 2000 WP Write Protect Input/Output 3/0 3/0 3/0 3/3 3/0 2000 SCL Serial Clock Input Input/Output 3/0 3/0 3/0 3/3 3/0 2000 SDA Serial Data Input/Output 3/0 3/0 3/0 3/3 3/0 2000 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 3/3 3/0 2000 Machine Model Testing – JEDEC Std 22A, Method 115A Lot Number: 3h6489 1 Positive & 1 Negative Pulse per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 50V 150V Name 100V 200V Vcc Power Vcc 3/0 3/0 3/0 3/0 3/0 200 Gnd Ground Gnd 3/0 3/0 3/0 3/0 3/0 200 A0 Address Input/Output 3/0 3/0 3/0 3/0 3/0 200 A1 Address Input/Output 3/0 3/0 3/0 3/0 3/0 200 A2 Address Input/Output 3/0 3/0 3/0 3/0 3/0 200 WP Write Protect Input/Output 3/0 3/0 3/0 3/0 3/0 200 SCL Serial Clock Input Input/Output 3/0 3/0 3/0 3/0 3/0 200 SDA Serial Data Input/Output 3/0 3/0 3/0 3/0 3/0 200 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 • 2325 Orchard Parkway • San Jose CA 95131 • 3/0 3/0 200 AT24C08A Product Qualification ESD Characterization ORYX, Orion 9000 ESD Test System Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C and 125C Stress Test Temperature: 25C Quantity Tested: 3/Lot/Voltage Device: AT3552E Charged Device Model Testing – JESD 22-C101A Lot Number: 3h6489 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 250V 750V Name 500V 1000V Vcc Power Vcc 3/0 3/0 3/0 3/0 3/0 1000 Gnd Ground Gnd 3/0 3/0 3/0 3/0 3/0 1000 A0 Address Input/Output 3/0 3/0 3/0 3/0 3/0 1000 A1 Address Input/Output 3/0 3/0 3/0 3/0 3/0 1000 A2 Address Input/Output 3/0 3/0 3/0 3/0 3/0 1000 WP Write Protect Input/Output 3/0 3/0 3/0 3/0 3/0 1000 SCL Serial Clock Input Input/Output 3/0 3/0 3/0 3/0 3/0 1000 SDA Serial Data Input/Output 3/0 3/0 3/0 3/0 3/0 1000 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 • 2325 Orchard Parkway • San Jose CA 95131 • 3/0 3/0 1000 AT24C08A Product Qualification Latch-Up Characterization ORYX Model 11000 ESD Test System Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C and 125C Test Method: JEDEC 78 Quantity Tested: 5/Lot Stress Test Temperature: 125C Over Current Test Voltage Vcc = 5.0 V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 9.0 V Device: AT3552E Lot Number: 3h6489 Max Trigger Current Pin Name Function Tested As Passing* -I (mA) Vcc Gnd A0 A1 A2 WP SCL SDA SDA Power Ground Address Address Address Write Protect Serial Clock Input Serial Data Serial Data Vcc Gnd Input Input Input Input Input Input Output ----200 200 200 200 200 200 200 Max Trigger Voltage Passing* Compliance Passing* Passing* Compliance +I (mA) Setting (V) -V (V) +V (V) Setting (mA) ----200 200 200 200 200 200 200 ----7.0 7.0 7.0 7.0 7.0 7.0 7.0 ------------------- 7.0 ----------------- * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ 25C and 125C Device: AT3552E Lot Number: LLL Quantity Tested: 100 Stress Test Temperature: 25C Vcc = 5.0 V Write Mode: Page Highest Passing Cycles: 1,000,000 Cycles to First Failure: NA Quantity Failed: 0 • 2325 Orchard Parkway • San Jose CA 95131 • 250 -----------------