View detail for AT24C04 Reliability Qualification Report

AT24C04
(AT3552C)
Serial EEPROM
Product Qualification
• 2325 Orchard Parkway • San Jose CA 95131 •
The AT24C04 Serial EEPROM is fabricated on the AT35000 CMOS process. With the
exception of HBM ESD, all tests were performed at Atmel’s Colorado Springs Facility.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance for the AT24C04 Serial EEPROM. This data, in conjunction with the
AT35000 Process Qualification and Reliability Report, qualifies the AT24C04.
Package specific qualification data is provided separately.
• 2325 Orchard Parkway • San Jose CA 95131 •
AT3552C Product Qualification
ESD Characterization
Device: AT24C04
Lot Number: Lot#3e3886
Quantity Tested: 3/ lot per Voltage
Test Temperature: 25C
ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Model
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C
Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations
AT24C04
Pin
Name
Vcc
Gnd
CS
Hold
SI
WP
SCK
SO
Function
Tested As
Power
Ground
Chip Select
Suspend Input
Serial Data IN
Write Protect
Serial Clock
Serial Data OUT
Vcc
Gnd
Input
Input
Input
Input
Input
Output
Functional Test Only
Failing Pin Not Identified
See Above
3 Positive & 3 Negative Pulses per The Specified Pin
Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Qty/Fail
Qty/Fail
Qty/Fail Voltage
2000V
500V
1000V
4000V
3/0
3/0
3/2
3/3
3/0
3000
3/0
3/0
3/2
3/3
3/0
3000
3/0
3/0
3/2
3/3
3/0
3000
3/0
3/0
3/2
3/3
3/0
3000
3/0
3/0
3/2
3/3
3/0
3000
3/0
3/0
3/2
3/3
3/0
3000
3/0
3/0
3/2
3/3
3/0
3000
3/0
3/0
3/2
3/3
3/0
3000
3/0
3/0
• 2325 Orchard Parkway • San Jose CA 95131 •
3/2
3/3
3/0
3000
AT3552C Product Qualification
Latch-Up Characterization
Device: AT24C04
Lot Number: Lot# 3e3886
Quantity Tested: 5 per lot
Test Method: JEDEC 78
Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C
Over Current Test Voltage Vcc = 5.0V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 7.0 V
Max Trigger Current
Pin
Name
Vcc
Gnd
CS
Hold
SI
WP
SCK
SO
Max Trigger Voltage
Passing* Passing* Compliance Passing* Passing* Compliance
Tested As -I (mA)
+V (V) Setting (mA)
+I (mA) Setting (V) -V (V)
Vcc
--------7.0
250
Gnd
------------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Output
200
200
7.0
-------
Function
Power
Ground
Chip Select
Suspend Input
Serial Data IN
Write Protect
Serial Clock
Serial Data OUT
* 0 Fails for Latchup or Post Stress Functional Tests.
Write Endurance Characterization
Device: AT24C04
Lot Number: Lot# 3e3886
Quantity Tested: 100
Test Temperature: -40C, 25C, 125C
Vcc: 5 Volts
Write Mode: Page
Highest Passing Cycles: 900,000
Cycles To First Failure: 1,000,000
• 2325 Orchard Parkway • San Jose CA 95131 •