AT25160A and 25080A (AT35537/38) SPI EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT25160A and 25080A Serial Peripheral Interface EEPROMs are fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all testing is performed at Atmel’s Colorado Springs Facility. Test samples are selected from standard product product. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance, for the AT25160A and 25080A SPI EEPROMs. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT25160A and AT25080A for Commercial, Industrial and Automotive applications. For the AT25080A and AT25160A Write Endurance, ESD and Latchup levels are the same due to design and layout similarity. Package specific qualification data is available separately. • 2325 Orchard Parkway • San Jose CA 95131 • AT35537/38 Product Qualification ESD Characterization Device: AT25160A Lot Number: Lot#3g0848 Quantity Tested: 3/ lot per Voltage Test Temperature: 25C ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Mod Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations Pin Name Vcc Gnd CS Hold SI WP SCK SO Function Tested As Power Ground Chip Select Suspend Input Serial Data IN Write Protect Serial Clock Serial Data OUT Vcc Gnd Input Input Input Input Input Output Functional Test Only Failing Pin Not Identified See Above 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Qty/Fail Qty/Fail Qty/Fail Voltage 500V 1000V 2000V 4000V 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 Charged Device Model Testing – JESD 22-C101A Lot Number: 4e0140 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 250V 750V Name 500V 1000V Vcc Power Vcc 3/0 3/0 3/0 3/0 3/0 1000 Gnd Ground Gnd 3/0 3/0 3/0 3/0 3/0 1000 CS Chip Select Input 3/0 3/0 3/0 3/0 3/0 1000 Hold Suspend Input Input 3/0 3/0 3/0 3/0 3/0 1000 SI Serial Data IN Input 3/0 3/0 3/0 3/0 3/0 1000 WP Write Protect Input 3/0 3/0 3/0 3/0 3/0 1000 SCK Serial Clock Input 3/0 3/0 3/0 3/0 3/0 1000 SO Serial Data OUT Input/Output 3/0 3/0 3/0 3/0 3/0 1000 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 • 2325 Orchard Parkway • San Jose CA 95131 • 3/0 3/0 1000 AT35537/38 Product Qualification Latch-Up Characterization Device: AT25160A Lot Number: Lot# 3g0848 Quantity Tested: 5 per lot Test Method: JEDEC 78 Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C Over Current Test Voltage Vcc = 5.0V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 7.0 V Max Trigger Current @ 125C Pin Name Vcc Gnd CS Hold SI WP SCK SO Max Trigger Voltage @ 125C Passing* Passing* Compliance Passing* Passing* Compliance Tested As -I (mA) +V (V) Setting (mA) +I (mA) Setting (V) -V (V) Vcc --------7.0 250 Gnd ------------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Output 200 200 7.0 ------- Function Power Ground Chip Select Suspend Input Serial Data IN Write Protect Serial Clock Serial Data OUT * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization @ 25C Device: AT25160A Lot Number: Lot# 3g0848 Quantity Tested: 100 Test Temperature: -40C, 25C, 125C Vcc: 5 Volts Write Mode: Page Highest Passing Cycles: 1,000,000 Cycles To First Failure: NA • 2325 Orchard Parkway • San Jose CA 95131 •