View detail for AT25160/080A Reliability Qualification Report

AT25160A and 25080A
(AT35537/38)
SPI EEPROM
Product Qualification
• 2325 Orchard Parkway • San Jose CA 95131 •
The AT25160A and 25080A Serial Peripheral Interface EEPROMs are fabricated on the
AT35000 CMOS process. With the exception of HBM ESD, all testing is performed at
Atmel’s Colorado Springs Facility. Test samples are selected from standard product
product.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance, for the AT25160A and 25080A SPI EEPROMs. This data, in conjunction
with the AT35000 Process Qualification and Reliability Report, qualifies the AT25160A
and AT25080A for Commercial, Industrial and Automotive applications.
For the AT25080A and AT25160A Write Endurance, ESD and Latchup levels are the
same due to design and layout similarity.
Package specific qualification data is available separately.
• 2325 Orchard Parkway • San Jose CA 95131 •
AT35537/38 Product Qualification
ESD Characterization
Device: AT25160A
Lot Number: Lot#3g0848
Quantity Tested: 3/ lot per Voltage
Test Temperature: 25C
ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Mod
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C
Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations
Pin
Name
Vcc
Gnd
CS
Hold
SI
WP
SCK
SO
Function
Tested As
Power
Ground
Chip Select
Suspend Input
Serial Data IN
Write Protect
Serial Clock
Serial Data OUT
Vcc
Gnd
Input
Input
Input
Input
Input
Output
Functional Test Only
Failing Pin Not Identified
See Above
3 Positive & 3 Negative Pulses per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Qty/Fail
Qty/Fail
Qty/Fail Voltage
500V
1000V
2000V
4000V
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
Charged Device Model Testing – JESD 22-C101A
Lot Number: 4e0140
3 Positive & 3 Negative Pulses per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
250V
750V
Name
500V
1000V
Vcc
Power
Vcc
3/0
3/0
3/0
3/0
3/0
1000
Gnd
Ground
Gnd
3/0
3/0
3/0
3/0
3/0
1000
CS
Chip Select
Input
3/0
3/0
3/0
3/0
3/0
1000
Hold
Suspend Input
Input
3/0
3/0
3/0
3/0
3/0
1000
SI
Serial Data IN
Input
3/0
3/0
3/0
3/0
3/0
1000
WP
Write Protect
Input
3/0
3/0
3/0
3/0
3/0
1000
SCK
Serial Clock
Input
3/0
3/0
3/0
3/0
3/0
1000
SO
Serial Data OUT
Input/Output
3/0
3/0
3/0
3/0
3/0
1000
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/0
• 2325 Orchard Parkway • San Jose CA 95131 •
3/0
3/0
1000
AT35537/38 Product Qualification
Latch-Up Characterization
Device: AT25160A
Lot Number: Lot# 3g0848
Quantity Tested: 5 per lot
Test Method: JEDEC 78
Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C
Over Current Test Voltage Vcc = 5.0V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 7.0 V
Max Trigger Current @ 125C
Pin
Name
Vcc
Gnd
CS
Hold
SI
WP
SCK
SO
Max Trigger Voltage @ 125C
Passing* Passing* Compliance Passing* Passing* Compliance
Tested As -I (mA)
+V (V) Setting (mA)
+I (mA) Setting (V) -V (V)
Vcc
--------7.0
250
Gnd
------------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Output
200
200
7.0
-------
Function
Power
Ground
Chip Select
Suspend Input
Serial Data IN
Write Protect
Serial Clock
Serial Data OUT
* 0 Fails for Latchup or Post Stress Functional Tests.
Write Endurance Characterization @ 25C
Device: AT25160A
Lot Number: Lot# 3g0848
Quantity Tested: 100
Test Temperature: -40C, 25C, 125C
Vcc: 5 Volts
Write Mode: Page
Highest Passing Cycles: 1,000,000
Cycles To First Failure: NA
• 2325 Orchard Parkway • San Jose CA 95131 •