SiE806DF Datasheet

SiE806DF
Vishay Siliconix
N-Channel 30-V (D-S) MOSFET
FEATURES
PRODUCT SUMMARY
• Halogen-free According to IEC 61249-2-21
Definition
• TrenchFET® Gen II Power MOSFET
• Ultra Low Thermal Resistance Using TopExposed PolarPAK® Package for Double-Sided
Cooling
• Leadframe-Based New Encapsulated Package
- Die Not Exposed
- Same Layout Regardless of Die Size
• Low Qgd/Qgs Ratio Helps Prevent Shoot-Through
• 100 % Rg and UIS Tested
• Compliant to RoHS directive 2002/95/EC
ID (A)
RDS(on) (Ω)e
Silicon
Limit
0.0017 at VGS = 10 V
202
60
0.0021 at VGS = 4.5 V
187
60
VDS (V)
30
Package
Qg (Typ.)
Limit
75 nC
Package Drawing
www.vishay.com/doc?72945
PolarPAK
10
D
9
G
8
S
7
S
6
D
6
7
8
9
10
APPLICATIONS
D
D
S
G
D
• VRM
• DC/DC Conversion: Low-Side
• Synchronous Rectification
D
G
D
1
G
2
S
S
3
4
Top View
D
5
5
4
3
2
1
S
Bottom View
Top surface is connected to pins 1, 5, 6, and 10
N-Channel MOSFET
For Related Documents
Ordering Information: SiE806DF-T1-E3 (Lead (Pb)-free)
SiE806DF-T1-GE3 (Lead (Pb)-free and Halogen-free)
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ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter
Drain-Source Voltage
Gate-Source Voltage
Symbol
VDS
VGS
TC = 25 °C
Continuous Drain Current (TJ = 150 °C)
TC = 70 °C
TA = 25 °C
TA = 70 °C
Pulsed Drain Current
Continuous Source-Drain Diode Current
Single Pulse Avalanche Current
Avalanche Energy
ID
IDM
TC = 25 °C
TA = 25 °C
IS
L = 0.1 mH
IAS
EAS
Limit
30
± 12
202 (Silicon Limit)
60a (Package Limit)
60a
41.3b, c
33b, c
100
60a
4.3b, c
50
125
125
80
5.2b, c
3.3b, c
- 55 to 150
260
Unit
V
A
mJ
TC = 25 °C
TC = 70 °C
PD
W
Maximum Power Dissipation
TA = 25 °C
TA = 70 °C
TJ, Tstg
Operating Junction and Storage Temperature Range
°C
Soldering Recommendations (Peak Temperature)d, e
Notes:
a. Package limited is 60 A.
b. Surface Mounted on 1" x 1" FR4 board.
c. t = 10 s.
d. See Solder Profile (www.vishay.com/doc?73257). The PolarPAK is a leadless package. The end of the lead terminal is exposed copper not
plated) as a result of the singulation process in manufacturing. A solder fillet at the exposed copper tip cannot be guaranteed and is not
required to ensure adequate bottom side solder interconnection.
e. Rework Conditions: manual soldering with a soldering iron is not recommended for leadless components.
Document Number: 73740
S09-1337-Rev. B, 13-Jul-09
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1
SiE806DF
Vishay Siliconix
THERMAL RESISTANCE RATINGS
Parameter
t ≤ 10 s
Maximum Junction-to-Ambienta, b
Maximum Junction-to-Case (Drain Top)
Steady State
Maximum Junction-to-Case (Source)a, c
Notes:
a. Surface Mounted on 1" x 1" FR4 board.
b. Maximum under Steady State conditions is 68 °C/W.
c. Measured at source pin (on the side of the package).
Symbol
RthJA
RthJC (Drain)
RthJFC(Source)
Typical
20
0.8
2.2
Maximum
24
1
2.7
Unit
°C/W
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min.
VDS
ΔVDS/TJ
ΔVGS(th)/TJ
VGS = 0 V, ID = 250 µA
30
Gate-Source Threshold Voltage
Gate-Source Leakage
VGS(th)
IGSS
Zero Gate Voltage Drain Current
IDSS
On-State Drain Currenta
ID(on)
VDS = VGS , ID = 250 µA
VDS = 0 V, VGS = ± 12 V
VDS = 30 V, VGS = 0 V
VDS = 30 V, VGS = 0 V, TJ = 55 °C
VDS ≥ 5 V, VGS = 10 V
VGS = 10 V, ID = 25 A
VGS = 4.5 V, ID = 25 A
VDS = 15 V, ID = 25 A
Typ.
Max.
Unit
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
VGS(th) Temperature Coefficient
Drain-Source On-State Resistancea
Forward Transconductancea
Dynamicb
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
RDS(on)
gfs
Ciss
Coss
Crss
Qg
ID = 250 µA
VDS = 15 V, VGS = 0 V, f = 1 MHz
VDS = 15 V, VGS = 10 V, ID = 20 A
VDS = 15 V, VGS = 4.5 V, ID = 20 A
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
Rg
f = 1 MHz
Gate Resistance
td(on)
Turn-On Delay Time
VDD = 15 V, RL = 1.5 Ω
tr
Rise Time
td(off)
ID ≅ 10 A, VGEN = 4.5 V, Rg = 1 Ω
Turn-Off Delay Time
tf
Fall Time
td(on)
Turn-On Delay Time
VDD = 15 V, RL = 1.5 Ω
tr
Rise Time
ID ≅ 10 A, VGEN = 10 V, Rg = 1 Ω
td(off)
Turn-Off Delay Time
tf
Fall Time
Drain-Source Body Diode Characteristics
TC = 25 °C
IS
Continuous Source-Drain Diode Current
ISM
Pulse Diode Forward Currenta
IS = 10 A
VSD
Body Diode Voltage
trr
Body Diode Reverse Recovery Time
Qrr
Body Diode Reverse Recovery Charge
IF = 10 A, dI/dt = 100 A/µs, TJ = 25 °C
ta
Reverse Recovery Fall Time
tb
Reverse Recovery Rise Time
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
0.6
V
29
- 5.1
1.3
mV/°C
2
± 100
1
10
25
V
nA
µA
A
0.0014
0.0017
130
13000
1150
550
165
75
23
9.5
0.9
125
160
85
15
20
50
85
10
0.9
52
55
25
27
0.0017
0.0021
Ω
S
pF
250
115
1.35
190
240
130
25
30
75
130
15
60
100
1.2
80
105
nC
Ω
ns
A
V
ns
nC
ns
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 73740
S09-1337-Rev. B, 13-Jul-09
SiE806DF
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
20
100
VGS = 10 V thru 3 V
16
I D - Drain Current (A)
I D - Drain Current (A)
80
60
40
12
TC = 125 °C
8
TC = 25 °C
4
20
VGS = 1 V
0
0.0
0.1
0.2
VGS = 2 V
0.3
0.4
TC = - 55 °C
0
1.0
0.5
1.5
2.0
2.5
VDS - Drain-to-Source Voltage (V)
VGS - Gate-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
0.0022
15 000
0.0020
12 000
3.0
C - Capacitance (pF)
RDS(on) - On-Resistance (Ω)
Ciss
VGS = 4.5 V
0.0018
0.0016
9000
6000
VGS = 10 V
3000
0.0014
Coss
Crss
0
0.0012
0
20
40
60
80
0
100
5
10
15
25
ID - Drain Current (A)
VDS - Drain-to-Source Voltage (V)
On-Resistance vs. Drain Current and Gate Voltage
Capacitance
10
30
1.8
VGS = 4.5 V, 10 V
ID = 25 A
ID = 20 A
1.6
8
6
VDS = 24 V
4
2
1.4
(Normalized)
VDS = 15 V
RDS(on) - On-Resistance
VGS - Gate-to-Source Voltage (V)
20
1.2
1.0
0.8
0
0
30
Document Number: 73740
S09-1337-Rev. B, 13-Jul-09
60
90
120
150
180
0.6
- 50
- 25
0
25
50
75
100
125
Qg - Total Gate Charge (nC)
TJ - Junction Temperature (°C)
Gate Charge
On-Resistance vs. Junction Temperature
150
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SiE806DF
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
0.0050
TJ = 150 °C
RDS(on) - Drain-to-Source On-Resistance (Ω)
I S - Source Current (A)
100
TJ = 25 °C
10
1
0.0
0.0040
0.0035
0.0030
0.0025
125 °C
0.0020
25 °C
0.0015
0.0010
0.2
0.4
0.6
0.8
1.0
0
1.2
1
2
3
4
5
6
7
8
9
10
VSD - Source-to-Drain Voltage (V)
VGS - Gate-to-Source Voltage (V)
Source-Drain Diode Forward Voltage
On-Resistance vs. Gate-to-Source Voltage
1.8
50
1.6
40
ID = 250 µA
Power (W)
1.4
VGS(th) (V)
ID = 25 A
0.0045
1.2
30
20
1.0
10
0.8
0.6
- 50
- 25
0
25
50
75
100
125
0
0.01
150
0.1
1
10
100
TJ - Temperature (°C)
Time (s)
Threshold Voltage
Single Pulse Power, Junction-to-Ambient
1000
ID - Drain Current (A)
100
Limited by RDS(on)*
1 ms
10
10 ms
100 ms
1
1s
TA = 25 °C
Single Pulse
0.1
10 s
DC
BVDSS
Limited
0.01
0.01
0.1
1
10
100
VDS - Drain-to-Source Voltage (V)
* VDS > minimum VGS at which RDS(on) is specified
Safe Operating Area, Junction-to-Ambient
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Document Number: 73740
S09-1337-Rev. B, 13-Jul-09
SiE806DF
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
140
250
120
Power Dissipation (W)
I D - Drain Current (A)
200
150
100
100
80
60
40
50
20
Package Limited
0
0
0
25
50
75
100
125
150
25
50
75
100
125
TC - Case Temperature (°C)
TC - Case Temperature (°C)
Current Derating*
Power Derating, Junction-to-Case
150
* The power dissipation PD is based on TJ(max) = 150 °C, using junction-to-case thermal resistance, and is more useful in settling the upper
dissipation limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package
limit.
Document Number: 73740
S09-1337-Rev. B, 13-Jul-09
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SiE806DF
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
Normalized Effective Transient
Thermal Impedance
2
1
Duty Cycle = 0.5
0.2
Notes:
0.1
PDM
0.1
0.05
t1
t2
1. Duty Cycle, D =
0.02
2. Per Unit Base = RthJA = 55°C/W
3. TJM - TA = PDMZthJA(t)
Single Pulse
0.01
t1
t2
10-4
10-3
10-2
4. Surface Mounted
10-1
1
10
100
600
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Ambient
Normalized Effective Transient
Thermal Impedance
2
1
Duty Cycle = 0.5
0.2
0.1
0.05
0.1
0.02
Single Pulse
0.01
10-4
10-3
10-2
10-1
1
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Case (Drain Top)
Normalized Effective Transient
Thermal Impedance
2
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10-4
10-3
10-2
10-1
1
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Source
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?73740.
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Document Number: 73740
S09-1337-Rev. B, 13-Jul-09
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Revision: 02-Oct-12
1
Document Number: 91000