Type OptiMOS®3 Power-Transistor IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G Product Summary Features V DS • Fast switching MOSFET for SMPS 30 R DS(on),max • Optimized technology for DC/DC converters V 13.5 ID mΩ 30 A 1) • Qualified according to JEDEC for target applications • N-channel, logic level • Excellent gate charge x R DS(on) product (FOM) • Very low on-resistance R DS(on) • Avalanche rated • Pb-free plating; RoHS compliant Type IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G Package PG-TO252-3-11 PG-TO252-3-23 PG-TO251-3-11 PG-TO251-3-21 Marking 135N03L 135N03L 135N03L 135N03L Maximum ratings, at T j=25 °C, unless otherwise specified Parameter Symbol Conditions Continuous drain current ID Value V GS=10 V, T C=25 °C 30 V GS=10 V, T C=100 °C 26 V GS=4.5 V, T C=25 °C 30 V GS=4.5 V, T C=100 °C 21 Unit A Pulsed drain current2) I D,pulse T C=25 °C 210 Avalanche current, single pulse 3) I AS T C=25 °C 30 Avalanche energy, single pulse E AS I D=10 A, R GS=25 Ω 20 mJ Reverse diode dv /dt dv /dt I D=30 A, V DS=24 V, di /dt =200 A/µs, T j,max=175 °C 6 kV/µs Gate source voltage V GS 1) Rev. 1.0 ±20 V J-STD20 and JESD22 page 1 2006-10-23 IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G Maximum ratings, at T j=25 °C, unless otherwise specified Parameter Symbol Conditions Power dissipation P tot Operating and storage temperature T j, T stg Value T C=25 °C IEC climatic category; DIN IEC 68-1 Parameter Unit 31 W -55 ... 175 °C 55/175/56 Values Symbol Conditions Unit min. typ. max. - - 4.9 minimal footprint - - 75 6 cm² cooling area 4) - - 50 30 - - Thermal characteristics Thermal resistance, junction - case R thJC SMD version, device on PCB R thJA K/W Electrical characteristics, at T j=25 °C, unless otherwise specified Static characteristics Drain-source breakdown voltage V (BR)DSS V GS=0 V, I D=1 mA Gate threshold voltage V GS(th) V DS=V GS, I D=250 µA 1 - 2.2 Zero gate voltage drain current I DSS V DS=30 V, V GS=0 V, T j=25 °C - 0.1 1 V DS=30 V, V GS=0 V, T j=125 °C - 10 100 I GSS V GS=20 V, V DS=0 V - 10 100 nA R DS(on) V GS=4.5 V, I D=20 A - 16.4 20.5 mΩ V GS=10 V, I D=30 A - 11.3 13.5 - 1.2 - Ω 22 43 - S Gate-source leakage current Drain-source on-state resistance 5) Gate resistance RG Transconductance g fs 2) See figure 3 for more detailed information 3) See figure 13 for more detailed information |V DS|>2|I D|R DS(on)max, I D=30 A V µA 4) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. 5) Rev. 1.0 Measured from drain tab to source pin page 2 2006-10-23 Parameter IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G Values Symbol Conditions Unit min. typ. max. - 770 1000 - 350 470 Dynamic characteristics Input capacitance C iss V GS=0 V, V DS=15 V, f =1 MHz Output capacitance C oss Reverse transfer capacitance Crss - 16 - Turn-on delay time t d(on) - 3 - Rise time tr - 3 - Turn-off delay time t d(off) - 12 - Fall time tf - 2 - Gate to source charge Q gs - 2.7 - Gate charge at threshold Q g(th) - 1.2 - Gate to drain charge Q gd - 1.2 - Switching charge Q sw - 2.6 - Gate charge total Qg - 4.8 - Gate plateau voltage V plateau - 3.5 - Gate charge total Qg V DD=15 V, I D=30 A, V GS=0 to 10 V - 10 - Gate charge total, sync. FET Q g(sync) V DS=0.1 V, V GS=0 to 4.5 V - 4.2 - Output charge Q oss V DD=15 V, V GS=0 V - 9 - - - 25 - - 210 V DD=15 V, V GS=10 V, I D=30 A, R G=1.6 Ω pF ns Gate Charge Characteristics 6) V DD=15 V, I D=30 A, V GS=0 to 4.5 V nC V nC Reverse Diode Diode continuous forward current IS Diode pulse current I S,pulse Diode forward voltage V SD V GS=0 V, I F=30 A, T j=25 °C - 0.98 1.2 V Reverse recovery charge Q rr V R=15 V, I F=I S, di F/dt =400 A/µs - - 10 nC 6) Rev. 1.0 T C=25 °C A See figure 16 for gate charge parameter definition page 3 2006-10-23 IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G 2 Drain current P tot=f(T C) I D=f(T C); V GS≥10 V 35 35 30 30 25 25 20 20 I D [A] P tot [W] 1 Power dissipation 15 15 10 10 5 5 0 0 0 50 100 150 200 0 50 100 T C [°C] 150 200 T C [°C] 3 Safe operating area 4 Max. transient thermal impedance I D=f(V DS); T C=25 °C; D =0 Z thJC=f(t p) parameter: t p parameter: D =t p/T 103 10 limited by on-state resistance 100 ns 0.5 1 µs 102 10 µs 0.2 1 Z thJC [K/W] 0.1 I D [A] 100 µs 101 DC 1 ms 0.05 0.02 0.01 0.1 10 10-1 10-1 100 101 102 0.01 0 0 0 0 0 0 1 10-6 10-5 10-4 10-3 10-2 10-1 100 t p [s] V DS [V] Rev. 1.0 single pulse 0 page 4 2006-10-23 IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G 5 Typ. output characteristics 6 Typ. drain-source on resistance I D=f(V DS); T j=25 °C R DS(on)=f(I D); T j=25 °C parameter: V GS parameter: V GS 120 30 5V 100 25 10 V 4.5 V I D [A] 4.5 V 20 R DS(on) [mΩ] 80 4V 3.5 V 60 4V 40 15 10 V 11.5 V 10 3.5 V 20 5V 5 3.2 V 2.8 V 3V 0 0 0 1 2 3 0 20 40 V DS [V] 60 80 100 80 100 I D [A] 7 Typ. transfer characteristics 8 Typ. forward transconductance I D=f(V GS); |V DS|>2|I D|R DS(on)max g fs=f(I D); T j=25 °C parameter: T j 100 80 80 60 I D [A] g fs [S] 60 40 40 20 20 175 °C 25 °C 0 0 0 1 2 3 4 5 Rev. 1.0 0 20 40 60 I D [A] V GS [V] page 5 2006-10-23 IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G 10 Typ. gate threshold voltage R DS(on)=f(T j); I D=30 A; V GS=10 V V GS(th)=f(T j); V GS=V DS; I D=250 µA 25 2.5 20 2 15 98 % 1.5 V GS(th) [V] R DS(on) [mΩ] 9 Drain-source on-state resistance typ 10 1 5 0.5 0 0 -60 -20 20 60 100 140 180 -60 -20 20 60 100 140 180 T j [°C] T j [°C] 11 Typ. capacitances 12 Forward characteristics of reverse diode C =f(V DS); V GS=0 V; f =1 MHz I F=f(V SD) parameter: T j 104 1000 103 Ciss 100 10 2 175 °C, 98% 25 °C I F [A] C [pF] Coss 175 °C 25 °C, 98% 10 Crss 101 100 1 0 10 20 30 Rev. 1.0 0.0 0.5 1.0 1.5 2.0 V SD [V] V DS [V] page 6 2006-10-23 IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G 13 Avalanche characteristics 14 Typ. gate charge I AS=f(t AV); R GS=25 Ω V GS=f(Q gate); I D=30 A pulsed parameter: T j(start) parameter: V DD 100 12 15 V 6V 10 24 V 10 150 °C 100 °C V GS [V] I AV [A] 8 25 °C 6 4 2 1 0 10-1 100 101 102 103 0 4 t AV [µs] 8 12 Q gate [nC] 15 Drain-source breakdown voltage 16 Gate charge waveforms V BR(DSS)=f(T j); I D=1 mA 34 V GS Qg 32 V BR(DSS) [V] 30 28 26 V g s(th) 24 Q g(th) 22 Q sw Q gs 20 -60 -20 20 60 100 140 Q g ate Q gd 180 T j [°C] Rev. 1.0 page 7 2006-10-23 Package Outline Footprint: Rev. 1.0 IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G PG-TO252-3-11 Packaging: page 8 2006-10-23 Package Outline Footprint: Rev. 1.0 IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G PG-TO252-3-23 Packaging: page 9 2006-10-23 Package Outline IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G PG-TO251-3-11 PG-TO251-3-11: Outline PG-TO251-3-21: Outline Rev. 1.0 page 10 2006-10-23 Package Outline IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G PG-TO251-3-21 PG-TO251-3-11: Outline PG-TO251-3-21: Outline Rev. 1.0 page 11 2006-10-23 IPD135N03L G IPF135N03L G IPS135N03L G IPU135N03L G Published by Infineon Technologies AG 81726 München, Germany © Infineon Technologies AG 2006. All Rights Reserved. Attention please! The information given in this data sheet shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office (www.infineon.com ). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 1.0 page 12 2006-10-23