PRODUCT BULLETIN # 16862A Generic Copy Issue Date: 07-Nov-2012 TITLE: SOIC-7/8, 14 Lead Conversions from MSL3 to MSL1 PROPOSED FIRST SHIP DATE: 12-Nov-2012 AFFECTED CHANGE CATEGORY(S): Assembly Process Moisture Sensitivity Level (MSL) FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor sales office or <[email protected]> NOTIFICATION TYPE: ON Semiconductor considers this change approved unless specific conditions of acceptance are provided in writing. To do so, contact <[email protected]>. DESCRIPTION AND PURPOSE: Through continuous process improvement of our SOIC assembly line, ON Semiconductor would like to announce that it will be changing the Moisture Sensitivity Level for those products listed in this Bulletin from MSL3 to MSL1. This means that the product listed in this product bulletin will no longer be shipped in dry packing materials. There has been no change in the BOM material set to achieve this higher MSL rating, only improvements to the assembly process. RELIABILITY DATA SUMMARY: Reliability was performed to confirm the improvement with the results summarized here: NCP1271D65R2G # Test Test Conditions 1 TC-PC -65C to +150C 2 UHAST-PC TA=130C, RH=85%, PSI=18.8, no Bias 3 HAST-PC TA=130C, RH=85%, PSI=18.8, Bias 4 SAT-PC Post MSL1 260C Read Points Test @ 1008cycles Test @ 1008hrs Test @ 1008hrs Pre and Post PC Sample Size 1 lot x 80 units 1 lot x 80 units 1 lot x 80 units 1 lot x 80 units Results 0/80 0/80 0/80 0/5 NCP1396DR2G # Test Test Conditions 1 TC-PC -65C to +150C 2 UHAST-PC TA=130C, RH=85%, PSI=18.8, no Bias 3 HAST-PC TA=130C, RH=85%, PSI=18.8, Bias 4 SAT-PC Post MSL1 260C Read Points Test @ 1008cycles Test @ 1008hrs Test @ 1008hrs Pre and Post PC Sample Size 1 lot x 80 units 1 lot x 80 units 1 lot x 80 units 1 lot x 80 units Results 0/80 0/80 0/80 0/5 Issue Date: 07-Nov-2012 Rev. 06-Jan-2010 Page 1 of 2 PRODUCT BULLETIN #16862A SCY99124DR2G # Test Test Conditions 1 TC-PC -65C to +150C 2 UHAST-PC TA=130C, RH=85%, PSI=18.8, no Bias 3 SAT-PC Post MSL1 260C Read Points Sample Size Test @ 1008cycles 1 lot x 80 units Test @ 1008hrs 1 lot x 80 units Pre and Post PC 1 lot x 80 units Results 0/240 0/240 0/15 NCP1606ADR2G # Test Test Conditions 1 TC-PC -65C to +150C 2 AC-PC TA=121C, RH=100%, PSI=15 3 UHAST-PC TA=130C, RH=85%, PSI=18.8, no Bias 4 SAT-PC Post MSL1 260C Read Points Test @ 1008cycles Test @ 96 hrs Test @ 1008hrs Pre and Post PC Sample Size 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 5 units Results 0/240 0/240 0/240 0/15 NCP1654BD65R2G # Test Test Conditions 1 TC-PC -65C to +150C 2 UHAST-PC TA=130C, RH=85%, PSI=18.8, no Bias 3 SAT-PC Post MSL1 260C Read Points Test @ 500 cycles Test @ 1008hrs Pre and Post PC Sample Size 1 lot x 80 units 1 lot x 80 units 1 lot x 5 units Results 0/80 0/80 0/5 NCP1652DR2G # Test Test Conditions 1 TC-PC -65C to +150C 2 AC-PC TA=121C, RH=100%, PSI=15 3 UHAST-PC TA=130C, RH=85%, PSI=18.8, no Bias 4 SAT-PC Post MSL1 260C Read Points Test @ 1008cycles Test @ 96 hrs Test @ 1008hrs Pre and Post PC Sample Size 1 lot x 77 units 1 lot x 77 units 1 lot x 77 units 1 lot x 5 units Results 0/77 0/77 0/77 0/5 NCP1928DR2G # Test Test Conditions 1 TC-PC -65C to +150C 2 SAT-PC Post MSL1 260C Read Points Test @ 500 cycles Pre and Post PC Sample Size 1 lot x 80 units 1 lot x 5 units Results 0/80 0/5 List of affected General Parts: NCP1336ADR2G NCP1336BDR2G NCP1246AD065R2G NCP1246AD100R2G NCP1246BD065R2G NCP1246BD100R2G Issue Date: 07-Nov-2012 Rev. 06-Jan-2010 Page 2 of 2