FINAL PRODUCT/PROCESS CHANGE NOTIFICATION # 16721 Generic Copy Issue Date: 09-Sep-2011 TITLE: VHVIC 2nd Source Qualification to Gresham FAB – Phase 2 PROPOSED FIRST SHIP DATE: 09-Dec-2011 AFFECTED CHANGE CATEGORY(S): Wafer Fab location FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor Sales Office or Scott Brow<[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Ken Fergus<[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. implementation of the change. FPCNs are issued at least 90 days prior to ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact <[email protected]>. DESCRIPTION AND PURPOSE: The purpose of this final PCN is to notify customers of the qualification of a second source for the devices listed in this FPCN at ON Semiconductor’s wafer fabrication facilities in Gresham, Oregon. This qualification is being made to increase the capacity for these devices. This technology is currently produced out of ON Semiconductor’s wafer fabrication facilities in Aizu, Japan. These devices are being duplicated at the Gresham wafer FAB. No die design changes have occurred. No changes to the device performance, data sheets or packaging have been made. Issue Date: 09-Sep-2011 Rev. 06-Jan-2010 Page 1 of 3 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION # 16721 RELIABILITY DATA SUMMARY: Reliability Test Results: NCP1271D65R2G # Test Test Conditions 1 HTBB TA=125C, 450V Bias 2 HVTHB TA=85C, 60%RH, 450V Bias 3 HTOL TA=125C, 100V Bias 4 HTSL TA=150C 5 TC-PC -65C to +150C 6 AC-PC TA=121C, RH=100%, PSI=15 7 UHAST-PC TA=130C, RH=85%, PSI=18.8 no Bias 8 HAST-PC TA=130C, RH=85%, PSI=18.8 Bias 9 SAT-PC Post MSL3 260C Read Points Test @ 1008hrs Test @ 168hrs Test @ 1008hrs Test @ 1008hrs Test @ 500 Cycles Test @ 96hrs Test @ 1008hrs Test @ 1008hrs Pre and Post PC Sample Size 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lot x 5 units Results 0/240 0/240 0/240 0/240 0/240 0/240 0/240 0/240 0/15 Read Points Test @ 1008hrs Test @ 1008hrs Test @ 1008hrs Test @ 500 Cycles Test @ 96hrs Test @ 1008hrs Test @ 1008hrs Pre and Post PC Sample Size 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lot x 5 units Results 0/239* 0/240 0/240 0/240 0/240 0/240 0/240 0/15 Test Conditions TA=125C, 500V Bias TA=125C, 380V Bias TA=150C -65C to +150C Read Points Test @ 1008hrs Test @ 1008hrs Test @ 1008hrs Test @ 500 Cycles Sample Size 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units 3 lots x 80 units Results 0/240 0/240 0/240 0/240 SCY991900DWR2G # Test Test Conditions 1 HTOL TA=125C, 600V Bias 2 TC-PC -65C to +150C * (1) EOS failure after 504hrs Read Points Test @ 1008hrs Test @ 500 Cycles Sample Size 1 lot x 80 units 1 lot x 80 units Results 0/79* 0/80 Read Points Test @ 1008hrs Test @ 500 Cycles Sample Size 1 lot x 80 units 1 lot x 80 units Results 0/80 0/80 NCP1396ADR2G # Test Test Conditions 1 HTBB TA=125C, 600V Bias 2 HTOL TA=125C, 600V Bias 3 HTSL TA=150C 4 TC-PC -65C to +150C 5 AC-PC TA=121C, RH=100%, PSI=15 6 UHAST-PC TA=130C, RH=85%, PSI=18.8 no Bias 7 HAST-PC TA=130C, RH=85%, PSI=18.8 Bias 8 SAT-PC Post MSL3 260C * (1) EOS failure after 504hrs NCP1237AD65R2G # Test 1 HTBB 3 HTOL 4 HTSL 5 TC-PC NCP1380BDR2G # Test 1 HTOL 2 TC-PC NCP4303ADR2G # Test 1 HTOL Issue Date: 09-Sep-2011 Test Conditions TA=125C, 30V Bias -65C to +150C Test Conditions TA = 125C, 200V Bias Rev. 06-Jan-2010 Read Points Test @ 1008hrs Sample Size 1 lot x 80 units Results 0/80 Page 2 of 3 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION # 16721 ELECTRICAL CHARACTERISTIC SUMMARY: There is no change in the electrical performance. Datasheet specifications remain unchanged. CHANGED PART IDENTIFICATION: Affected products with date code WW36-2011 and greater may be sourced from either Gresham or Aizu wafer Fabrication site. List of affected General Parts: NCP4303ADR2G NCP4303BDR2G NCP4303AMNTWG NCP4303BMNTWG Issue Date: 09-Sep-2011 Rev. 06-Jan-2010 Page 3 of 3