IRF IRFHS9301TRPBF

PD - 97581A
IRFHS9301PbF
HEXFET® Power MOSFET
VDS
-30
V
VGS max
±20
V
RDS(on) max
(@VGS = -10V)
Qg (typical)
ID
(@TC = 25°C)
TOP VIEW
D 1
37
mΩ
13
nC
D 2
A
G 3
-8.5
d
D
6 D
D
D
D
5 D
D
S
G
4 S
D
S
S
2mm x 2mm PQFN
Applications
l
l
Charge and Discharge Switch for Battery Application
System/load switch
Features and Benefits
Features
Low RDSon (≤ 37mΩ)
Low Thermal Resistance to PCB (≤ 13°C/W)
Low Profile (≤ 1.0 mm)
Compatible with Existing Surface Mount Techniques
RoHS Compliant Containing no Lead, no Bromide and no Halogen
MSL1, Consumer Qualification
Orderable part number
IRFHS9301TRPBF
IRFHS9301TR2PBF
Package Type
PQFN 2mm x 2mm
PQFN 2mm x 2mm
Benefits
Lower Conduction Losses
Enable better thermal dissipation
results in Increased Power Density
Easier Manufacturing
Environmentally Friendlier
Increased Reliability
Standard Pack
Form
Quantity
Tape and Reel
4000
Tape and Reel
400
Note
Absolute Maximum Ratings
VDS
VGS
ID @ TA = 25°C
ID @ TA = 70°C
ID @ TC = 25°C
ID @ TC = 70°C
ID @ TC = 25°C
IDM
PD @TA = 25°C
PD @ TA = 70°C
Parameter
Drain-to-Source Voltage
Gate-to-Source Voltage
Continuous Drain Current, VGS @ -10V
Continuous Drain Current, VGS @ -10V
Continuous Drain Current, VGS @ -10V
Continuous Drain Current, VGS @ -10V
Continuous Drain Current, VGS @ 10V (Package Limited)
Pulsed Drain Current
Power Dissipation
Power Dissipation
TJ
TSTG
Linear Derating Factor
Operating Junction and
Storage Temperature Range
f
f
c
Max.
-30
± 20
-6.0
-4.8
-13
-10
-8.5
d
d
d
-52
2.1
1.3
0.02
-55 to + 150
Units
V
A
W
W/°C
°C
Notes  through … are on page 2
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1
11/12/10
IRFHS9301TR/TR2PbF
Static @ TJ = 25°C (unless otherwise specified)
Min.
Typ.
Max.
Units
BVDSS
Drain-to-Source Breakdown Voltage
Parameter
-30
–––
–––
V
ΔΒVDSS/ΔTJ
Breakdown Voltage Temp. Coefficient
–––
0.02
–––
V/°C
–––
30
37
65
-2.4
–––
RDS(on)
Static Drain-to-Source On-Resistance
VGS(th)
ΔVGS(th)
Gate Threshold Voltage
Gate Threshold Voltage Coefficient
–––
-1.3
–––
52
-1.8
-4.8
IDSS
Drain-to-Source Leakage Current
–––
–––
-1.0
–––
–––
-150
Gate-to-Source Forward Leakage
–––
–––
-100
Gate-to-Source Reverse Leakage
–––
–––
100
IGSS
mΩ
Conditions
VGS = 0V, ID = -250μA
Reference to 25°C, ID = -1mA
e
= -6.2A e
VGS = -10V, ID = -7.8A
VGS = -4.5V, ID
V
VDS = VGS, ID = -25μA
mV/°C
VDS = -24V, VGS = 0V
μA
VDS = -24V, VGS = 0V, TJ = 125°C
nA
VGS = -20V
VGS = 20V
gfs
Qg
Forward Transconductance
9.3
–––
–––
S
VDS = -10V, ID = -7.8A
Total Gate Charge
–––
6.9
–––
nC
VDS = -15V,VGS = -4.5V,ID = - 7.8A
Qg
Total Gate Charge
–––
13
–––
Qgs
Gate-to-Source Charge
–––
2.1
–––
nC
VDS = -15V
Qgd
Gate-to-Drain Charge
–––
3.9
–––
RG
Gate Resistance
–––
17
–––
td(on)
Turn-On Delay Time
–––
12
–––
VDD = -15V, VGS = -4.5V
ID = -7.8A
tr
Rise Time
–––
80
–––
td(off)
Turn-Off Delay Time
–––
13
–––
tf
Fall Time
–––
25
–––
Ciss
Input Capacitance
–––
580
–––
Coss
Output Capacitance
–––
125
–––
Crss
Reverse Transfer Capacitance
–––
79
–––
Min.
Typ.
Max.
VGS = -10V
ID = -7.8A
Ω
ns
e
RG = 2.0Ω
See Figs. 19a & 19b
VGS = 0V
pF
VDS = -25V
ƒ = 1.0KHz
Diode Characteristics
Parameter
IS
Continuous Source Current
(Body Diode)
ISM
Pulsed Source Current
c
(Body Diode)
d
–––
–––
-8.5
–––
–––
-52
–––
-1.2
Units
Conditions
MOSFET symbol
A
D
showing the
integral reverse
G
p-n junction diode.
S
e
VSD
Diode Forward Voltage
–––
trr
Reverse Recovery Time
–––
30
45
ns
TJ = 25°C, IF = -7.8A, VDD = -15V
Qrr
Reverse Recovery Charge
–––
110
170
nC
di/dt = 280/μs
V
TJ = 25°C, IS = -7.8A, VGS = 0V
Thermal Resistance
Typ.
Max.
RθJC (Bottom)
Junction-to-Case
–––
13
RθJC (Top)
–––
90
RθJA
Junction-to-Ambient f
RθJA
Junction-to-Ambient (t<10s)
Parameter
g
Junction-to-Case g
f
60
–––
e
Units
°C/W
42
Notes:
 Repetitive rating; pulse width limited by max. junction temperature.
‚ Current limited by package.
ƒ Pulse width ≤ 400μs; duty cycle ≤ 2%.
„ When mounted on 1 inch square copper board.
… Rθ is measured at TJ of approximately 90°C.
.
2
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IRFHS9301TR/TR2PbF
1000
1000
100
BOTTOM
10
-2.8V
1
100
BOTTOM
10
-2.8V
1
≤60μs PULSE WIDTH
≤60μs PULSE WIDTH
Tj = 25°C
0.1
0.1
1
Tj = 150°C
0.1
10
0.1
100
1
100
Fig 2. Typical Output Characteristics
Fig 1. Typical Output Characteristics
100
1.6
RDS(on) , Drain-to-Source On Resistance
(Normalized)
-ID, Drain-to-Source Current(A)
10
-VDS, Drain-to-Source Voltage (V)
-VDS, Drain-to-Source Voltage (V)
10
TJ = 150°C
1
TJ = 25°C
VDS = -15V
≤60μs PULSE WIDTH
0.1
ID = -7.8A
VGS = -10V
1.4
1.2
1.0
0.8
0.6
1
2
3
4
5
6
-60 -40 -20 0
Fig 3. Typical Transfer Characteristics
10000
-V GS, Gate-to-Source Voltage (V)
ID= -7.8A
Coss = Cds + Cgd
Ciss
Coss
100
Fig 4. Normalized On-Resistance vs. Temperature
14
VGS = 0V,
f = 1 KHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
1000
20 40 60 80 100 120 140 160
TJ , Junction Temperature (°C)
-VGS, Gate-to-Source Voltage (V)
C, Capacitance (pF)
VGS
-10V
-8.0V
-5.0V
-4.5V
-3.5V
-3.3V
-3.0V
-2.8V
TOP
-ID, Drain-to-Source Current (A)
-ID, Drain-to-Source Current (A)
TOP
VGS
-10V
-8.0V
-5.0V
-4.5V
-3.5V
-3.3V
-3.0V
-2.8V
Crss
10
VDS= -24V
VDS= -15V
12
VDS= -6V
10
8
6
4
2
0
1
10
100
-VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage
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0
2
4
6
8
10
12
14
16
18
QG, Total Gate Charge (nC)
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage
3
IRFHS9301TR/TR2PbF
1000
-ID, Drain-to-Source Current (A)
-ISD, Reverse Drain Current (A)
100
TJ = 150°C
10
TJ = 25°C
VGS = 0V
0.6
0.8
100
1msec
10
100μsec
1
0.1
Tc = 25°C
Tj = 150°C
Single Pulse
DC
10msec
0.01
1.0
0.4
OPERATION IN THIS AREA
LIMITED BY RDS(on)
0.1
1.0
1
10
100
VDS, Drain-to-Source Voltage (V)
-VSD , Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
14
2.0
-VGS(th), Gate threshold Voltage (V)
LIMITED BY PACKAGE
ID, Drain Current (A)
12
10
8
6
4
2
ID = -25uA
1.5
1.0
0
25
50
75
100
125
150
0.5
-75 -50 -25
TC, Case Temperature (°C)
0
25
50
75 100 125 150
TJ , Temperature ( °C )
Fig 10. Threshold Voltage vs. Temperature
Fig 9. Maximum Drain Current vs.
Case Temperature
Thermal Response ( ZthJC )
100
10
D = 0.50
0.20
1
0.1
0.01
0.10
0.05
0.02
0.01
SINGLE PULSE
( THERMAL RESPONSE )
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.001
1E-006
1E-005
0.0001
0.001
0.01
0.1
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
4
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100
( Ω)
RDS(on), Drain-to -Source On Resistance m
RDS(on), Drain-to -Source On Resistance (mΩ)
IRFHS9301TR/TR2PbF
ID = -7.8A
80
60
TJ = 125°C
40
TJ = 25°C
20
0
5
10
15
100
Vgs = -4.5V
80
60
40
Vgs = -10V
20
20
0
5
10
15
20
25
30
-ID, Drain Current (A)
-VGS, Gate -to -Source Voltage (V)
Fig 13. Typical On-Resistance vs. Drain Current
Fig 12. On-Resistance vs. Gate Voltage
600
500
Power (W)
400
300
200
100
0
1E-5
1E-4
1E-3
1E-2
1E-1
1E+0
Time (sec)
Fig 14. Typical Power vs. Time
D.U.T *
Driver Gate Drive
+
ƒ
+
‚
-
„
*
D.U.T. ISD Waveform
Reverse
Recovery
Current
+

RG
•
•
•
•
di/dt controlled by RG
Driver same type as D.U.T.
I SD controlled by Duty Factor "D"
D.U.T. - Device Under Test
VDD
+
-
Re-Applied
Voltage
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Body Diode
Reverse Polarity of D.U.T for P-Channel
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VDD
Forward Drop
Inductor
Current
Inductor Curent
Ripple ≤ 5%
*
P.W.
Period
VGS=10V
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
D=
Period
P.W.
ISD
* VGS = 5V for Logic Level Devices
Fig 15. Diode Reverse Recovery Test Circuit for P-Channel HEXFET® Power MOSFETs
5
IRFHS9301TR/TR2PbF
Id
Vds
Vgs
L
VCC
DUT
0
20K
1K
Vgs(th)
SS
Qgodr
Fig 16a. Gate Charge Test Circuit
VDS
RG
RD
tr
t d(off)
tf
VGS
D.U.T.
-
+
10%
V DD
-VGS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 17a. Switching Time Test Circuit
6
Qgs2 Qgs1
Fig 16b. Gate Charge Waveform
td(on)
VGS
Qgd
90%
VDS
Fig 17b. Switching Time Waveforms
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IRFHS9301TR/TR2PbF
PQFN Package Details
PQFN Part Marking
9301
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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7
IRFHS9301TR/TR2PbF
PQFN Tape and Reel
CORE
TAPE
Remark:
Width
Table 2:
COVER
TAPE
(WIDTH)
5.4 mm
9.5 mm
- Dimension above are typical dimensions.
- Cover tape thickness is 0.048mm +/- 0.005mm.
- Surface resistivity 10E5 < Rs <10E9.
TOLERANCE
+/- 0.1 mm
+/- 0.1 mm
Qualification information
†
††
Qualification level
Moisture Sensitivity Level
RoHS compliant
Consumer
(per JEDEC JESD47F
PQFN 2mm x 2mm
†††
guidelines )
MSL1
(per IPC/JEDEC J-STD-020D†† † )
Yes
Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
††
Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
††† Applicable version of JEDEC standard at the time of product release.
†
Data and specifications subject to change without notice.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.11/2010
8
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