AT24C128 (AT35523) 2-Wire Bus Serial EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT24C128 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado Springs Facility. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance for the AT24C128 Serial EEPROM. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT24C128. Package specific qualification data is provided separately. • 2325 Orchard Parkway • San Jose CA 95131 • AT35523 Product Qualification ESD Characterization ORYX Model 11000 ESD Test System Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester Quantity Tested: 3/Lot/Voltage Device: AT24C128 Human Body Model Testing – Mil Std 883, Method 3015 Lot Number: 2g5605 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Pin Qty/Fail Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 2000V Name 500V 1000V 4000V Vcc Power Vcc 3/0 3/0 3/0 2/1 3/0 3000 Gnd Ground Gnd 3/0 3/0 3/0 2/1 3/0 3000 A0 Address Input 3/0 3/0 3/0 2/1 3/0 3000 A1 Address Input 3/0 3/0 3/0 2/1 3/0 3000 A2 Address Input 3/0 3/0 3/0 2/1 3/0 3000 WP Write Protect Input 3/0 3/0 3/0 2/1 3/0 3000 SCL Serial Clock Input Input 3/0 3/0 3/0 2/1 3/0 3000 SDA Serial Data Input/Output 3/0 3/0 3/0 2/1 3/0 3000 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 2/1 3/0 3000 Machine Model Testing – JEDEC Std 22A, Method 115A Lot Number: 1c0715 1 Positive & 1 Negative Pulse per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 50V 150V Name 100V 200V Vcc Power Vcc 3/0 3/0 3/1 3/3 3/0 100 Gnd Ground Gnd 3/0 3/0 3/1 3/3 3/0 100 A0 Address Input 3/0 3/0 3/1 3/3 3/0 100 A1 Address Input 3/0 3/0 3/1 3/3 3/0 100 A2 Address Input 3/0 3/0 3/1 3/3 3/0 100 WP Write Protect Input 3/0 3/0 3/1 3/3 3/0 100 SCL Serial Clock Input Input 3/0 3/0 3/1 3/3 3/0 100 SDA Serial Data Input/Output 3/0 3/0 3/1 3/3 3/0 100 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/1 • 2325 Orchard Parkway • San Jose CA 95131 • 3/3 3/0 100 AT35523 Product Qualification Latch-Up Characterization Device: AT24C128 Lot Number: B2G5605 Quantity Tested: 5 per lot Test Method: JEDEC 78 Test Temperature: 25C Over Current Test Voltage Vcc = 5.0V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 7.0 V Max Trigger Current Pin Na me Vcc Gnd A0 A1 A2 WP SC L SD A SD A Max Trigger Voltage Function Tested As Passing* -I (mA) Passing* +I (mA) Compliance Passing* Passing* Compliance Setting (V) -V (V) +V (V) Setting (mA) Power Ground Address Address Address Write Protect Serial Clock Input Vcc Gnd Input Input Input Input Input ----200 200 200 200 200 ----200 200 200 200 200 ----7.0 7.0 7.0 7.0 7.0 --------------- 7.0 ------------- 250 ------------- Serial Data Input 200 200 7.0 --- --- --- Serial Data Output 200 200 7.0 --- --- --- * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization Device: AT24C128 Lot Number: 2G5606 Quantity Tested: 100 Test Temperature: 25C Vcc: 5 Volts Write Mode: Page Highest Passing Cycles: 1.600,000 Cycles To First Failure: NA Quantity Failed: 0 • 2325 Orchard Parkway • San Jose CA 95131 •