View detail for AT24C128 Reliability Qualification Report

AT24C128
(AT35523)
2-Wire Bus Serial EEPROM
Product Qualification
• 2325 Orchard Parkway • San Jose CA 95131 •
The AT24C128 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS
process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado
Springs Facility.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance for the AT24C128 Serial EEPROM. This data, in conjunction with the
AT35000 Process Qualification and Reliability Report, qualifies the AT24C128.
Package specific qualification data is provided separately.
• 2325 Orchard Parkway • San Jose CA 95131 •
AT35523 Product Qualification
ESD Characterization
ORYX Model 11000 ESD Test System
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester
Quantity Tested: 3/Lot/Voltage
Device: AT24C128
Human Body Model Testing – Mil Std 883, Method 3015
Lot Number: 2g5605
3 Positive & 3 Negative Pulses per The Specified Pin
Combinations
Max Passing
Voltage
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
2000V
Name
500V
1000V
4000V
Vcc
Power
Vcc
3/0
3/0
3/0
2/1
3/0
3000
Gnd
Ground
Gnd
3/0
3/0
3/0
2/1
3/0
3000
A0
Address
Input
3/0
3/0
3/0
2/1
3/0
3000
A1
Address
Input
3/0
3/0
3/0
2/1
3/0
3000
A2
Address
Input
3/0
3/0
3/0
2/1
3/0
3000
WP
Write Protect
Input
3/0
3/0
3/0
2/1
3/0
3000
SCL
Serial Clock Input
Input
3/0
3/0
3/0
2/1
3/0
3000
SDA
Serial Data
Input/Output
3/0
3/0
3/0
2/1
3/0
3000
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/0
2/1
3/0
3000
Machine Model Testing – JEDEC Std 22A, Method 115A
Lot Number: 1c0715
1 Positive & 1 Negative Pulse per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
50V
150V
Name
100V
200V
Vcc
Power
Vcc
3/0
3/0
3/1
3/3
3/0
100
Gnd
Ground
Gnd
3/0
3/0
3/1
3/3
3/0
100
A0
Address
Input
3/0
3/0
3/1
3/3
3/0
100
A1
Address
Input
3/0
3/0
3/1
3/3
3/0
100
A2
Address
Input
3/0
3/0
3/1
3/3
3/0
100
WP
Write Protect
Input
3/0
3/0
3/1
3/3
3/0
100
SCL
Serial Clock Input
Input
3/0
3/0
3/1
3/3
3/0
100
SDA
Serial Data
Input/Output
3/0
3/0
3/1
3/3
3/0
100
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/1
• 2325 Orchard Parkway • San Jose CA 95131 •
3/3
3/0
100
AT35523 Product Qualification
Latch-Up Characterization
Device: AT24C128
Lot Number: B2G5605
Quantity Tested: 5 per lot
Test Method: JEDEC 78
Test Temperature: 25C
Over Current Test Voltage Vcc = 5.0V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 7.0 V
Max Trigger Current
Pin
Na
me
Vcc
Gnd
A0
A1
A2
WP
SC
L
SD
A
SD
A
Max Trigger Voltage
Function
Tested As
Passing*
-I (mA)
Passing*
+I (mA)
Compliance Passing* Passing* Compliance
Setting (V)
-V (V)
+V (V) Setting (mA)
Power
Ground
Address
Address
Address
Write Protect
Serial Clock Input
Vcc
Gnd
Input
Input
Input
Input
Input
----200
200
200
200
200
----200
200
200
200
200
----7.0
7.0
7.0
7.0
7.0
---------------
7.0
-------------
250
-------------
Serial Data
Input
200
200
7.0
---
---
---
Serial Data
Output
200
200
7.0
---
---
---
* 0 Fails for Latchup or Post Stress Functional Tests.
Write Endurance Characterization
Device: AT24C128
Lot Number: 2G5606
Quantity Tested: 100
Test Temperature: 25C
Vcc: 5 Volts
Write Mode: Page
Highest Passing Cycles: 1.600,000
Cycles To First Failure: NA
Quantity Failed: 0
• 2325 Orchard Parkway • San Jose CA 95131 •