PHILIPS BUJ100B

Philips Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ100B
GENERAL DESCRIPTION
High-voltage, high-speed planar-passivated npn power switching transistor in the SOT54 (TO92) envelope intended
for use in high frequency electronic lighting ballast applications, converters and inverters, etc.
QUICK REFERENCE DATA
SYMBOL
PARAMETER
CONDITIONS
TYP.
MAX.
UNIT
VCESM
VCBO
VCEO
IC
ICM
Ptot
VCEsat
hFE
tfi
Collector-emitter voltage peak value
Collector-Base voltage (open emitter)
Collector-emitter voltage (open base)
Collector current (DC)
Collector current peak value
Total power dissipation
Collector-emitter saturation voltage
VBE = 0 V
0.27
12
56
700
700
350
1.0
2.0
2.0
1.0
19
76
V
V
V
A
A
W
V
Fall time (Inductive)
PINNING - SOT54 (TO92)
PIN
Tlead ≤ 25 ˚C
IC = 1.0 A;IB = 0.2 A
IC = 1.0 A; VCE = 5 V
IC = 1.0 A; IB1= 0.2 A
PIN CONFIGURATION
SYMBOL
DESCRIPTION
1
Base
2
Collector
3
Emitter
ns
c
b
e
3 2 1
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum Rating System (IEC 134)
SYMBOL
PARAMETER
CONDITIONS
VCESM
VCEO
VCBO
IC
ICM
IB
IBM
Ptot
Tstg
Tj
Collector to emitter voltage
Collector to emitter voltage (open base)
Collector to base voltage (open emitter)
Collector current (DC)
Collector current peak value
Base current (DC)
Base current peak value
Total power dissipation
Storage temperature
Junction temperature
VBE = 0 V
Tmb ≤ 25 ˚C
MIN.
MAX.
UNIT
-65
-
700
350
700
1.0
2.0
0.5
1.0
2.0
150
150
V
V
V
A
A
A
A
W
˚C
˚C
TYP.
MAX.
UNIT
-
60
K/W
150
-
K/W
THERMAL RESISTANCES
SYMBOL
PARAMETER
Rth j-lead
Thermal resistance junction to lead
Rth j-a
Thermal resistance junction to ambient
May 2001
CONDITIONS
pcb mounted; lead
length = 4 mm
1
Rev 1.000
Philips Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ100B
STATIC CHARACTERISTICS
Tmb = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
1
ICES,ICBO
ICES
Collector cut-off current
ICEO
IEBO
VCEOsust
Collector cut-off current 1
Emitter cut-off current
Collector-emitter sustaining voltage
VCEsat
VBEsat
hFE
hFE
hFE
Collector-emitter saturation voltage
Base-emitter saturation voltage
DC current gain
VBE = 0 V; VCE = VCESMmax
VBE = 0 V; VCE = VCESMmax;
Tj = 125 ˚C
VCEO = VCEOMmax (350V)
VEB = 9 V; IC = 0 A
IB = 0 A; IC = 10 mA;
L = 25 mH
IC = 1 A; IB = 0.2 A
IC = 1 A; IB = 0.2 A
IC = 1mA; VCE = 5 V
IC = 100mA; VCE = 5 V
IC = 1.0 A; VCE = 5 V
MIN.
TYP.
MAX.
UNIT
-
0.8
2.0
100
500
µA
µA
350
0.05
-
100
100
-
µA
µA
V
17
19
9
0.27
1.03
23
30
12
1.0
1.3
46
19
V
V
TYP.
MAX.
UNIT
1.0
1.95
0.22
1.28
2.61
0.30
µs
µs
µs
0.55
56
0.74
76
µs
ns
-
1.5
140
µs
ns
DYNAMIC CHARACTERISTICS
Tmb = 25 ˚C unless otherwise specified
SYMBOL
ton
ts
tf
PARAMETER
CONDITIONS
Switching times (resistive load)
ICon = 1.0 A; IBon = -IBoff = 0.2 A;
RL = 75 ohms; VBB2 = 4V;
Turn-on time
Turn-off storage time
Turn-off fall time
Switching times (inductive load)
tsi
tfi
Turn-off storage time
Turn-off fall time
Switching times (inductive load)
tsi
tfi
Turn-off storage time
Turn-off fall time
ICon = 1.0 A; IBon = 0.2 A; LB = 1 µH;
-VBB = 5 V
ICon = 1.0 A; IBon = 0.2 A; LB = 1 µH;
-VBB = 5 V; Tj = 100 ˚C
1 Measured with half sine-wave voltage (curve tracer).
May 2001
2
Rev 1.000
Philips Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ100B
!
+ 50v
100-200R
100
Zth / (K/W)
0.5
10
0.2
0.1
0.05
1
0.02
Horizontal
Oscilloscope
PD
Vertical
tp
D=
tp
T
0.1
30-60 Hz
D=0
1R
300R
t
T
6V
0.01
1u
Fig.1. Test circuit for VCEOsust.
10u 100u 1m 10m 100m
t/s
1
10
100
Fig.4. Transient thermal impedance.
Zth j-lead = f(t); parameter D = tp/T
HFE
50
IC / mA
25 C
125 C
30
20
-40 C
15
250
10
VCE = 1V
5
100
10
0
2
min
VCE / V
VCEOsust
Fig.2. Oscilloscope display for VCEOsust.
0.01
0.05
0.1
0.5
1
2
3
IC/A
Fig.5. Typical DC current gain. hFE = f(IC)
parameter VCE
HFE
50
Normalised Power Derating
PD%
120
125 C
110
25 C
30
100
90
20
80
15
-40 C
70
10
VCE = 5V
60
50
5
40
30
20
2
10
0
0
20
40
60
80
100
Tmb / C
120
140
0.01
0.1
0.5
1
2
3
IC/A
Fig.3. Normalised power dissipation.
PD% = 100⋅PD/PD 25˚C = f (Tmb)
May 2001
0.05
Fig.6. Typical DC current gain. hFE = f(IC)
parameter VCE
3
Rev 1.000
Philips Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ100B
VCEsat/V
VBEsat/V
1.3
1.2
1.2
1
1.1
0.8
1
0.6
0.9
0.4
0.8
0.2
0.7
0
0.01
0.02
0.05
0.1
0.2
0.5
1
0.6
0.01
2
0.02
0.05
0.1
IC/A
0.2
0.5
1
2
IC/A
Fig.7. Collector-Emitter saturation voltage.
Solid Lines = typ values, IC/IB = 3
Fig.8. Base-Emitter saturation voltage.
Solid Lines = typ values, IC/IB = 3
INDUCTIVE SWITCHING
VCC
ICon
90 %
IC
LC
10 %
tf
ts
IBon
LB
t
toff
T.U.T.
IBon
IB
-VBB
t
-IBoff
Fig.9. Test circuit inductive load.
VCC = 300 V; -VBE = 5 V, LC = 200 µH; LB = 1 µH
Fig.10. Switching times waveforms with inductive load.
tfi /ns
200
tfi /ns
250
IC/IB = 10
200
IC = 1.5A
150
150
IC = 1A
100
100
IC/IB = 5
50
50
IC = 0.5A
0
2
3
4
5
6
7
HFE GAIN (IC/IB)
8
9
10
0
0.2
11
Fig.11. Inductive switching.
tfi = f(hFE)
May 2001
0.4
0.6
0.8
1
1.2
IC/A
1.4
1.6
1.8
2
2.2
Fig.12. Inductive switching.
tfi = f(IC)
4
Rev 1.000
Philips Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ100B
tsi /us
1
tsi /us
1
IC/IB = 3
0.8
0.8
IC = 1.5A
IC/IB = 5
0.6
0.6
IC = 1A
0.4
0.4
IC/IB = 10
IC = 0.5A
0.2
0.2
0
0.2
0
2
3
4
5
6
7
HFE GAIN (IC/IB)
8
9
10
11
0.4
0.6
Fig.13. Inductive switching.
tsi = f(hFE)
0.8
1
1.2
IC/A
1.4
1.6
1.8
2
2.2
Fig.14. Inductive switching.
tsi = f(IC)
RESISTIVE SWITCHING
VCC
ICon
90 %
90 %
IC
RL
10 %
ts
VIM
RB
ton
0
IBon
IB
tp
tf
toff
T.U.T.
10 %
T
tr
30ns
-IBoff
Fig.15. Test circuit resistive load. VIM = -6 to +8 V
VCC = 250 V; tp = 20 µs; δ = tp / T = 0.01.
RB and RL calculated from ICon and IBon requirements.
Fig.16. Switching times waveforms with resistive load.
ts us
2.5
ton /us
2
IC/IB = 3
IC/IB = 10
2
1.5
IC/IB = 5
1.5
IC/IB = 5
1
1
0.5
IC/IB = 3
0.5
IC/IB = 10
0
0.2
0.4
0.6
0.8
1
1.2
IC/A
1.4
1.6
1.8
2
0
0.2
2.2
Fig.17. Resistive switching.
ton = f(IC)
May 2001
0.4
0.6
0.8
1
1.2
IC/A
1.4
1.6
1.8
2
2.2
Fig.18. Resistive switching.
ts = f(IC)
5
Rev 1.000
Philips Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ100B
tf /ns
5,000
2,000
IC/IB = 3
1,000
IC/IB = 5
500
200
IC/IB = 10
100
50
0.2
0.4
0.6
0.8
1
1.2
IC /A
1.4
1.6
1.8
2
2.2
Fig.19. Resistive switching.
tf = f(IC)
IC/A
VCC
2.5
2.25
2
1.75
LC
1.5
1.25
VCL(RBSOAR)
IBon
1
PROBE POINT
LB
0.75
0.5
-VBB
-9V
-5V
T.U.T.
0.25
-3V
-1V
0
0
100
200
300
400
500
600
700
800
VCEclamp/V
Fig.21. Reverse bias safe operating area Tj ≤ Tjmax
for -VBE = 9V, 5V,3V & 1V
Fig.20. Test Circuit for the RBSOA test.
Vcl ≤ 700V; Vcc = 150V; LB = 1µH; Lc = 200µH
May 2001
6
Rev 1.000
Philips Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ100B
MECHANICAL DATA
Plastic single-ended leaded (through hole) package; 3 leads
SOT54
c
E
d
A
L
b
1
e1
2
D
e
3
b1
L1
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
b
b1
c
D
d
E
mm
5.2
5.0
0.48
0.40
0.66
0.56
0.45
0.40
4.8
4.4
1.7
1.4
4.2
3.6
e1
L
L1(1)
1.27
14.5
12.7
2.5
e
2.54
Note
1. Terminal dimensions within this zone are uncontrolled to allow for flow of plastic and terminal irregularities.
REFERENCES
OUTLINE
VERSION
IEC
SOT54
JEDEC
EIAJ
TO-92
SC-43
EUROPEAN
PROJECTION
ISSUE DATE
97-02-28
Fig.22. TO92 ; plastic envelope; Net Mass: 0.2 g
Notes
1. Epoxy meets UL94 V0 at 1/8".
May 2001
7
Rev 1.000
Philips Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ100B
DEFINITIONS
DATA SHEET STATUS
DATA SHEET
STATUS2
PRODUCT
STATUS3
DEFINITIONS
Objective data
Development
This data sheet contains data from the objective specification for
product development. Philips Semiconductors reserves the right to
change the specification in any manner without notice
Preliminary data
Qualification
This data sheet contains data from the preliminary specification.
Supplementary data will be published at a later date. Philips
Semiconductors reserves the right to change the specification without
notice, in ordere to improve the design and supply the best possible
product
Product data
Production
This data sheet contains data from the product specification. Philips
Semiconductors reserves the right to make changes at any time in
order to improve the design, manufacturing and supply. Changes will
be communicated according to the Customer Product/Process
Change Notification (CPCN) procedure SNW-SQ-650A
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
 Philips Electronics N.V. 2001
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The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
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from such improper use or sale.
2 Please consult the most recently issued datasheet before initiating or completing a design.
3 The product status of the device(s) described in this datasheet may have changed since this datasheet was published. The latest information is
available on the Internet at URL http://www.semiconductors.philips.com.
May 2001
8
Rev 1.000