PHILIPS BUK573-48C

Philips Semiconductors
Product specification
PowerMOS transistor
Clamped logic level FET
BUK573-48C
GENERAL DESCRIPTION
QUICK REFERENCE DATA
Protected N-channel enhancement
mode logic level field-effect power
transistor in a plastic full-pack
envelope.
The device is intended for use in
automotive applications. It has
built-in zener diodes providing active
drain voltage clamping.
SYMBOL
PARAMETER
V(CL)DSR
ID
Ptot
WDSRR
Drain-source clamp voltage
Drain current (DC)
Total power dissipation
Repetitive clamped turn off
energy; Tj = 150˚C
Drain-source on-state
resistance; VGS = 5 V
PINNING - SOT186A
PIN CONFIGURATION
PIN
RDS(ON)
MIN.
40
TYP. MAX. UNIT
48
58
13
25
50
V
A
W
mJ
85
mΩ
SYMBOL
DESCRIPTION
d
case
1
gate
2
drain
3
source
case isolated
g
s
1 2 3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL
PARAMETER
CONDITIONS
VDS
VDG
±VGS
ID
ID
IDM
Drain-source voltage
Drain-gate voltage
Gate-source voltage
Drain current (DC)
Drain current (DC)
Drain current (pulse peak
value)
Total power dissipation
Storage temperature
Junction Temperature
Ptot
Tstg
Tj
MIN.
MAX.
UNIT
continuous
continuous
Ths = 25 ˚C
Ths = 100 ˚C
Ths = 25 ˚C
-
30
30
15
13
8.2
52
V
V
V
A
A
A
Ths = 25 ˚C
-
- 55
- 55
25
150
150
W
˚C
˚C
THERMAL RESISTANCES
SYMBOL
PARAMETER
CONDITIONS
Rth j-hs
Thermal resistance junction to
heatsink
Thermal resistance junction to
ambient
with heatsink compound
Rth j-a
August 1994
1
MIN.
TYP.
MAX.
UNIT
-
-
5
K/W
-
55
-
K/W
Rev 1.000
Philips Semiconductors
Product specification
PowerMOS transistor
Clamped logic level FET
BUK573-48C
STATIC CHARACTERISTICS
Tj = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
V(BR)DG
Drain-gate zener voltage
VGS(TO)
VGS(ON)
Gate threshold voltage
Gate voltage
IDSS
IGSS
RDS(ON)
Zero gate voltage drain current
Gate source leakage current
Drain-source on-state
resistance
0.2 < -IG < 0.4 mA;
-55˚C < Tj < 150˚C
VDS = VGS; ID = 1 mA
VDS = 10 V; ID = 10 A;
-55˚C < Tj < 150˚C
VDS = 30 V; VGS = 0 V; Tj =150 ˚C
VGS = ±15 V; VDS = 0 V; Tj =150 ˚C
VGS = 5 V; ID = 10 A
MIN.
TYP.
MAX.
UNIT
38
45
54
V
1.0
2.0
1.5
3.1
2.0
4.0
V
V
-
0.01
0.1
65
1.0
10
85
mA
µA
mΩ
MIN.
TYP.
MAX.
UNIT
DYNAMIC CHARACTERISTICS
Tj = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
V(CL)DSR
Drain source clamp voltage
(peak value)
RG = 10 kΩ; ID = 10 A;
-55 < Tj < 150˚C; Inductive load.
40
48
58
V
gfs
Forward transconductance
VDS = 25 V; ID = 10 A
7
12
-
S
Ciss
Coss
Crss
Input capacitance
Output capacitance
Feedback capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz
-
550
240
100
825
350
160
pF
pF
pF
td on
tr
td off
tf
Turn-on delay time
Turn-on rise time
Turn-off delay time
Turn-off fall time
VDD = 12 V; ID = 5 A;
VGS = 5 V; RG = 10 kΩ;
-
3.5
22
16
18
-
µs
µs
µs
µs
Ld
Internal drain inductance
-
4.5
-
nH
Ls
Internal source inductance
Measured from drain lead 6 mm
from package to centre of die
Measured from source lead 6 mm
from package to source bond pad
-
7.5
-
nH
MIN.
TYP.
MAX.
UNIT
ISOLATION
Tj = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
Visol(rms)
R.M.S. isolation voltage from all f = 50-60 Hz; sinusoidal waveform;
three terminals to external
R.H. < 65 %; clean and dust free
heatsink
-
-
2500
VRMS
Cisol
Capacitance from T2 to
external heatsink
-
10
-
pF
August 1994
CONDITIONS
f = 1 MHz
2
Rev 1.000
Philips Semiconductors
Product specification
PowerMOS transistor
Clamped logic level FET
BUK573-48C
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
IDR
Continuous reverse drain
current
Pulsed reverse drain current
Diode forward voltage
IDRM
VSD
MIN.
TYP.
MAX.
UNIT
-
-
-
13
A
IF = 13 A ; VGS = 0 V
-
1.05
52
1.3
A
V
CLAMPED ENERGY LIMITING VALUE
SYMBOL
PARAMETER
CONDITIONS
WDSRS
Drain-source non repetitive
clamped inductive turn off
energy
WDSRR
120
MIN.
MAX.
UNIT
Tj = 25˚C prior to clamping;
ID = 10 A; VGS = 5 V; RGS = 10 kΩ;
inductive load (see Figs. 17,18)
-
200
mJ
Drain-source repetitive clamped Tj = 150˚C prior to clamping;
inductive turn off energy
ID = 10 A; VGS = 5 V; RGS = 10 kΩ;
inductive load (see Figs. 17,18)
-
50
mJ
Normalised Power Derating
PD%
120
with heatsink compound
110
Normalised Current Derating
ID%
with heatsink compound
110
100
90
100
90
80
70
80
70
60
60
50
50
40
40
30
30
20
20
10
10
0
0
20
40
60
80
Ths / C
100
120
0
140
0
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Ths)
August 1994
20
40
60
80
Ths / C
100
120
140
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Ths); conditions: VGS ≥ 5 V
3
Rev 1.000
Philips Semiconductors
Product specification
PowerMOS transistor
Clamped logic level FET
100
BUK573-48C
BUK573-48C
tp =
ID / A
ID
S/
=
N)
VD
1E+01
10 us
100 us
O
S(
0.5
RD
10
0.2
1E+00
1 ms
0.1
0.05
10 ms
DC
1
ZTHX43
Zth j-hs / (K/W)
100 ms
0.02
1E-01
PD
Self-clamped
0
1E-02
1E-07
0.1
1
100
10
VDS / V
Fig.3. Safe operating area. Ths = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter tp
ID / A
40
tp
D=
t
T
1E-05
1E-03
t/s
tp
T
1E-01
1E+01
Fig.6. Transient thermal impedance.
Zth j-hs = f(t); parameter D = tp/T
BUK5Y3-48C
40
VGS / V = 5
ID / A
BUK5Y3-48C
10
4.5
30
30
4
20
20
3.5
3
10
10
Tmb / degC =
150
25
-55
2.5
0
0
2
4
6
8
0
10
0
1
2
VDS / V
Fig.4. Typical output characteristics, Tj = 25 ˚C.
ID = f(VDS); parameter VGS
0.5
2.5
3
3.5
5
6
7
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V.
BUK5Y3-48C
RDS(ON) / Ohm
3
4
VGS / V
20
gfs / S
BUK5Y3-48C
VGS / V = 4
0.4
15
4.5
0.3
5
10
0.2
5
0.1
0
Tmb / degC =
150
25
-55
10
0
10
20
VDS / V
30
0
40
Fig.5. Typical on-state resistance, Tj = 25 ˚C.
RDS(ON) = f(ID); parameter VGS
August 1994
0
10
20
Id / A
30
40
Fig.8. Typical transconductance.
gfs = f(ID); conditions: VDS = 25 V
4
Rev 1.000
Philips Semiconductors
Product specification
PowerMOS transistor
Clamped logic level FET
51
BUK573-48C
V(CL)DSR / V
BUK5Y3-48C
58
50
V(CL)DSR / V
BUK5Y3-48C
Tmb / degC =
150
25
-55
56
49
54
48
52
47
50
46
Tmb / degC =
45
44
43
48
150
25
-55
0
2
4
6
ID / A
8
46
10
44
12
1
Fig.9. Typical clamping voltage
V(CL)DSR = f(ID) ; conditions: RG = 10 kΩ
a
2
10
5
RG / kOhm
20
Fig.12. Typical clamping voltgage
V(CL)DSR = f(RG) ; conditions: ID = 10 A.
VGS(TO) / V
Normalised RDS(ON) = f(Tj)
max.
2
1.5
typ.
1.0
min.
1
0.5
0
0
-60 -40 -20
0
20
40 60
Tj / C
80
-60
100 120 140
Fig.10. Normalised drain-source on-state resistance.
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 10 A; VGS = 5 V
40
IS / A
-40
-20
0
20
40
60
Tj / C
80
100
120
140
Fig.13. Gate threshold voltage.
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
BUK5Y3-48C
1E-01
SUB-THRESHOLD CONDUCTION
ID / A
Tmb / degC =
150
25
-55
30
1E-02
2%
1E-03
98 %
typ
20
1E-04
10
0
1E-05
1E-06
0
0.5
VSDS / V
1
0
1.5
Fig.11. Typical reverse diode current.
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
August 1994
0.4
0.8
1.2
VGS / V
1.6
2
2.4
Fig.14. Sub-threshold drain current.
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS
5
Rev 1.000
Philips Semiconductors
Product specification
PowerMOS transistor
Clamped logic level FET
2000
BUK573-48C
C / pF
BUK5Y3-48C
VDD
Load
1000
t p : adjust for correct Ic
500
Ciss
200
Coss
D.U.T.
RG
VGE
100
Crss
Id measure
50
0.01
0.1
1
VDS / V
10
0V
100
0R1
Fig.17. Inductive clamping test circuit.
Fig.15. Typical capacitances, Ciss, Coss, Crss.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
7
VGS / V
I,V
BUK5Y3-48C
V(CL)DSR
VDD / V = 12
30
6
5V
5
ID
VDS
VGS
4
t
3
P,E
PDS = ID x VDS
2
E = PDS dt
1
0
WDSR
0
5
10
QG / nC
15
20
t
Fig.16. Typical turn-on gate-charge characteristics.
VGS = f(QG); conditions: ID = 10 A.
August 1994
Fig.18. Typical Inductive Clamping waveforms
6
Rev 1.000
Philips Semiconductors
Product specification
PowerMOS transistor
Clamped logic level FET
BUK573-48C
MECHANICAL DATA
Dimensions in mm
Net Mass: 2 g
10.3
max
4.6
max
3.2
3.0
2.9 max
2.8
Recesses (2x)
2.5
0.8 max. depth
6.4
15.8
19
max. max.
15.8
max
seating
plane
3 max.
not tinned
3
2.5
13.5
min.
1
0.4
2
3
M
1.0 (2x)
0.6
2.54
0.9
0.7
0.5
2.5
5.08
1.3
Fig.19. SOT186A; The seating plane is electrically isolated from all terminals.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Refer to mounting instructions for F-pack envelopes.
3. Epoxy meets UL94 V0 at 1/8".
August 1994
7
Rev 1.000
Philips Semiconductors
Product specification
PowerMOS transistor
Clamped logic level FET
BUK573-48C
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
 Philips Electronics N.V. 1996
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
August 1994
8
Rev 1.000
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573-48.C
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