V6204646 VID

REVISIONS
LTR
DESCRIPTION
A
Add a footnote to Table I. Add footnotes to
figure 1. Update boilerplate paragraphs to
current requirements. - ro
DATE
APPROVED
10-10-19
C. SAFFLE
CURRENT DESIGN ACTIVITY CAGE CODE 16236
HAS CHANGED NAMES TO:
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
Prepared in accordance with ASME Y14.24
Vendor item drawing
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PMIC N/A
PREPARED BY
RICK OFFICER
Original date of drawing
YY-MM-DD
CHECKED BY
TOM HESS
04-02-11
TITLE
MICROCIRCUIT, DIGITAL-LINEAR, 2.7 V TO 5.5 V
LOW POWER DUAL 12-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN,
MONOLITHIC SILICON
APPROVED BY
RAYMOND MONNIN
SIZE
A
REV
AMSC N/A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
CODE IDENT. NO.
DWG NO.
V62/04646
16236
A
PAGE
1
OF
14
5962-V075-10
1. SCOPE
1.1 Scope. This drawing documents the general requirements of a high performance low power dual 12-bit digital-to-analog
converter (DAC) with power down microcircuit, with an operating temperature range of -55C to +125C.
1.2 Vendor Item Drawing Administrative Control Number. The manufacturer’s PIN is the item of identification. The vendor item
drawing establishes an administrative control number for identifying the item on the engineering documentation:
-
V62/04646
Drawing
number
01
X
E
Device type
(See 1.2.1)
Case outline
(See 1.2.2)
Lead finish
(See 1.2.3)
1.2.1 Device type(s).
Generic
Device type
01
Circuit function
TLV5618A-EP
2.7 V to 5.5 V low power dual 12-bit
digital-to-analog converter with power down
1.2.2 Case outline(s). The case outline(s) are as specified herein.
Outline letter
Number of pins
X
8
JEDEC PUB 95
Package style
MS-012-AA
Plastic small outline
1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacture:
Finish designator
A
B
C
D
E
Z
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Material
Hot solder dip
Tin-lead plate
Gold plate
Palladium
Gold flash palladium
Other
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CODE IDENT NO.
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1.3 Absolute maximum ratings.
1/
Supply voltage (VDD to AGND) .......................................................................... 7 V
Reference input voltage range ............................................................................ -0.3 V VDD +0.3 V
Digital input voltage range .................................................................................. -0.3 V VDD +0.3 V
Operating free-air temperature range (TA) .........................................................
Storage temperature range ................................................................................
Lead temperature 1.6 mm (1/16 inch) from case for 10 seconds .......................
Package thermal impedance (RJA) ..................................................................
-55C to +125C 2/
-65C to +150C 2/
+260C
131C/W
1.4 Recommended operating conditions. 3/
Supply voltage (VDD):
With VDD = 5 V ............................................................................................... 4.5 V minimum to 5.5 V maximum
With VDD = 3 V ............................................................................................... 2.7 V minimum to 3.3 V maximum
Power on reset ................................................................................................... 0.55 V minimum to 2 V maximum
High level digital input voltage (VIH):
With VDD = 2.7 V ............................................................................................ 2 V minimum
With VDD = 5.5 V ............................................................................................ 2.4 V minimum
Low level digital input voltage (VIL):
With VDD = 2.7 V ............................................................................................ 0.6 V maximum
With VDD = 5.5 V ............................................................................................ 1 V maximum
Reference voltage, Vref to REF terminal:
With VDD = 5 V ............................................................................................... AGND to VDD – 1.5 V 4/
With VDD = 3 V ............................................................................................... AGND to VDD – 1.5 V 4/
Load resistance (RL) .......................................................................................... 2 k minimum
Load capacitance (CL) ........................................................................................ 100 pF maximum
Clock frequency (fCLK) ....................................................................................... 20 MHz maximum
Operating free air temperature range (TA) .......................................................... -55C to +125C
1/
2/
3/
4/
Stresses beyond those listed under “absolute maximum rating” may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those indicated under
“recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may
affect device reliability.
Long term high temperature storage and/or extended use at maximum recommended operating conditions may result in a
reduction of overall device life.
Use of this product beyond the manufacturers design rules or stated parameters is done at the user’s risk. The manufacturer
and/or distributor maintain no responsibility or liability for product used beyond the stated limits.
Due to the x2 output buffer, a reference input voltage  (VDD – 0.4 V) / 2 causes clipping of the transfer function.
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2. APPLICABLE DOCUMENTS
JEDEC PUB 95
–
Registered and Standard Outlines for Semiconductor Devices
(Applications for copies should be addressed to the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington,
VA 22201-3834 or online at http://www.jedec.org)
3. REQUIREMENTS
3.1 Marking. Parts shall be permanently and legibly marked with the manufacturer’s part number as shown in 6.3 herein and as
follows:
A.
B.
C.
Manufacturer’s name, CAGE code, or logo
Pin 1 identifier
ESDS identification (optional)
3.2 Unit container. The unit container shall be marked with the manufacturer’s part number and with items A and C (if applicable)
above.
3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are
as specified in 1.3, 1.4, and table I herein.
3.4 Design, construction, and physical dimension. The design, construction, and physical dimensions are as specified herein.
3.5 Diagrams.
3.5.1 Case outline. The case outline shall be as shown in 1.2.2 and figure 1.
3.5.2 Terminal connections. The terminal connections shall be as shown in figure 2.
3.5.3 Logic diagram. The logic diagram shall be as shown in figure 3.
3.5.4 Timing waveforms. The timing waveforms shall be as shown in figure 4.
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TABLE I. Electrical performance characteristics. 1/
Test
Symbol
Conditions
Temperature,
TA
Device
type
Limits
Min
Unit
Max
Power supply section
Power supply current
IDD
Fast, no load, DAC latch = All ones,
All inputs = AGND or VDD,
01
-55C to +125C
2.3
mA
VDD = 2.7 V to 5.5 V
Slow, no load, DAC latch = All ones,
All inputs = AGND or VDD,
1
VDD = 2.7 V to 5.5 V
Power down supply
current
Power supply
rejection ration
PSRR
Zero scale 2/
-55C to +125C
01
1 typical
A
-55C to +125C
01
-65 typical
dB
Full scale 3/
-65 typical
Static DAC specifications section
Resolution
-55C to +125C
01
12
bits
Integral nonlinearity
INL
4/
-55C to +125C
01
4
LSB
Differential
nonlinearity
DNL
5/
-55C to +125C
01
1
LSB
Zero scale error
(offset error at zero
scale)
EZS
6/
-55C to +125C
01
12
mV
Zero scale error
temperature
coefficient
EZS(TC)
7/
-55C to +125C
01
Gain error
EG
VDD = 2.7 V – 5.5 V
-55C to +125C
01
Gain error
temperature
coefficient
EG(TC)
9/
-55C to +125C
01
RL = 10 k
-55C to +125C
01
VO = 4.096 V, 2.048 V,
-55C to +125C
01
8/
3 typical
0.6
ppm /
C
% full
scale V
1 typical
ppm /
C
Output specifications section
Output voltage range
VO
Output load regulation
accuracy
0
VDD 0.4
V
0.29
% FS
RL = 2 k to 10 k
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – continued. 1/
Test
Symbol
Conditions
Temperature,
TA
Device
type
Limits
Unit
Min
Max
0
VDD –
1.5
Reference input section
Input voltage range
VI
-55C to +125C
01
Input resistance
RI
-55C to +125C
01
10 typical
M
Input capacitance
CI
-55C to +125C
01
5 typical
pF
-55C to +125C
01
1.3 typical
MHz
525 typical
kHz
Reference input
bandwidth
Fast, REF = 0.2 VPP + 1.024 V dc
Slow, REF = 0.2 VPP + 1.024 V dc
Reference feedthrough
V
10/
REF = 1 VPP at 1 kHz + 1.024 V dc
-55C to +125C
01
-80 typical
dB
1
A
Digital inputs section
High level digital input
current
IIH
VI = VDD
-55C to +125C
01
Low level digital input
current
IIL
VI = 0 V
-55C to +125C
01
Input capacitance
CI
-55C to +125C
01
-55C to +125C
01
A
-1
8 typical
pF
Analog output dynamic performance section
Output settling time,
full scale
ts(FS)
Fast, RL = 10 k, CL = 100 pF 11/
10
Slow, RL = 10 k, CL = 100 pF 11/
Output settling time,
code to code
ts(CC)
Fast, RL = 10 k, CL = 100 pF 12/
01
-55C to +125C
SR
Fast, RL = 10 k, CL = 100 pF 13/
01
-55C to +125C
DIN = 0 to 1, FCLK = 100 kHz,
3 typical
V/s
0.5 typical
Slow, RL = 10 k, CL = 100 pF 13/
Glitch energy
s
1 typical
2 typical
Slow, RL = 10 k, CL = 100 pF 12/
Slew rate
s
3
01
-55C to +125C
5 typical
nV-s
CS = VDD
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – continued. 1/
Test
Symbol
Conditions
Temperature,
TA
Device
type
Limits
Min
Unit
Max
Analog output dynamic performance section - continued
Signal to noise ratio
SNR
fs = 102 kSPS, fout = 1 kHz,
-55C to +125C
01
76 typical
dB
-55C to +125C
01
68 typical
dB
-55C to +125C
01
-68 typical
dB
-55C to +125C
01
72 typical
dB
RL = 10 k, CL = 100 pF
Signal to noise +
distortion
SINAD
Total harmonic
distortion
THD
Spurious free dynamic
range
SFDR
fs = 102 kSPS, fout = 1 kHz,
RL = 10 k, CL = 100 pF
fs = 102 kSPS, fout = 1 kHz,
RL = 10 k, CL = 100 pF
fs = 102 kSPS, fout = 1 kHz,
RL = 10 k, CL = 100 pF
Digital input timing requirements section
Setup time, CS low
before first negative
SCLK edge
tsu
(CS CK)
-55C to +125C
01
10
ns
Setup time, 16 th
negative SCLK edge
tsu
(C16 CS)
-55C to +125C
01
10
ns
SCLK pulse width high
tWH
-55C to +125C
01
25
ns
SCLK pulse width low
tWL
-55C to +125C
01
25
ns
Setup time, data
ready before SCLK
falling edge
tsu(D)
-55C to +125C
01
8
ns
Hold time, data held
valid after SCLK
falling edge
th(D)
-55C to +125C
01
10
ns
Hold time, CS high
between cycles
th(CSH)
-55C to +125C
01
25
ns
before CS rising
edge
VDD = 5 V
50
VDD = 3 V
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – continued. 1/
1/
Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over
the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters
may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization
and/or design.
2/
Power supply rejection ratio at zero scale is measured by varying VDD and is given by:
PSRR = 20 log [ EZS ( VDD max ) – ( EZS ( VDD min ) / VDD max ) ].
3/
Power supply rejection ratio at full scale is measured by varying VDD and is given by:
PSRR = 20 log [ EG ( VDD max ) – ( EG ( VDD min ) / VDD max ) ].
4/
The relative accuracy of integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation
of the output from the line between zero and full scale, excluding the effects of zero code and full scale errors.
5/
The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and
ideal 1 LSB amplitude change of any two adjacent codes.
6/
Zero scale error is the deviation from zero voltage output when the digital input code is zero.
7/
Zero scale error temperature coefficient is given by:
6
EZS TC = [ EZS ( Tmax ) – EZS ( Tmin ) ] / 2Vref x 10 / ( Tmax – Tmin ).
8/
Gain error is the deviation from the ideal output ( 2Vref – 1 LSB ) with an output load of 10 k.
9/
Gain temperature coefficient is given by: EG TC = [EG ( Tmax ) – Eg( Tmin )] / 2Vref x 10 / ( Tmax – Tmin ).
10/
6
Reference feedthrough is measured at the DAC output with an input code = 0x000.
11/ Settling time is the time for the output signal to remain within 0.5 LSB of the final measured value for a digital input
code change of 0x020 to 0xFDF and 0xFDF to 0x020 respectively. Not tested, assured by design.
12/ Settling time is the time for the output signal to remain within 0.5 LSB of the final measured value for a digital input
code change of one count. Not tested, assured by design
13/ Slew rate determines the time it takes for a change of the DAC output from 10% to 90% of full scale voltage.
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Case X
FIGURE 1. Case outline.
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Case X
Dimensions
Inches
Symbol
Millimeters
Min
Max
Min
Max
A
---
0.069
---
1.75
A1
0.004
0.010
0.10
0.25
b
0.012
0.020
0.31
0.51
c
0.005
0.010
0.13
0.25
D
0.189
0.197
4.80
5.00
e
0.050 BSC
1.27 BSC
E
0.150
0.157
3.80
4.00
E1
0.228
0.244
5.80
6.20
L
0.016
0.050
0.40
1.27
n
8 leads
8 leads
NOTE:
1. Controlling dimensions are inch, millimeter dimensions are given for reference only.
2. For dimension D, body length does not include mold flash, protrusion, or gate burrs. Mold flash, protrusion,
or gate burrs shall not exceed 0.006 inch (0.15 mm) per end.
3. For dimension E, body width does not include interlead flash. Interlead flash shall not exceed 0.017 inch (0.43 mm)
per side.
4. Falls within reference to JEDEC MS-012-AA.
FIGURE 1. Case outline. – continued.
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Device type 01
Case outline X
Terminal number
Terminal
symbol
I/O/P
Description
1
DIN
I
Digital serial data input.
2
SCLK
I
Digital serial clock input.
3
CS
I
Chip select. Digital input active low, used
to enable/disable inputs.
4
OUTA
O
DAC A analog voltage output.
5
AGND
P
Ground.
6
REF
I
Analog reference voltage input.
7
OUTB
O
DAC B analog voltage output.
8
VDD
P
Positive power supply.
FIGURE 2. Terminal connections.
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FIGURE 3. Block diagram.
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FIGURE 4. Timing waveforms.
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4. VERIFICATION
4.1 Product assurance requirements. The manufacturer is responsible for performing all inspection and test requirements as
indicated in their internal documentation. Such procedures should include proper handling of electrostatic sensitive devices,
classification, packaging, and labeling of moisture sensitive devices, as applicable.
5. PREPARATION FOR DELIVERY
5.1 Packaging. Preservation, packaging, labeling, and marking shall be in accordance with the manufacturer’s standard commercial
practices for electrostatic discharge sensitive devices.
6. NOTES
6.1 ESDS. Devices are electrostatic discharge sensitive and are classified as ESDS class 1 minimum.
6.2 Configuration control. The data contained herein is based on the salient characteristics of the device manufacturer’s data book.
The device manufacturer reserves the right to make changes without notice. This drawing will be modified as changes are provided.
6.3 Suggested source(s) of supply. Identification of the suggested source(s) of supply herein is not to be construed as a guarantee
of present or continued availability as a source of supply for the item.
Vendor item drawing
administrative control
number 1/
Device
manufacturer
CAGE code
V62/04646-01XE
01295
Package 2/
SOIC (D)
Tape and
reel
Vendor part number
Top side marking
TLV5618AMDREP
5618ME
1/
The vendor item drawing establishes an administrative control number for identifying the item on the
engineering documentation.
2/
Package drawings, standard packaging quantities, thermal data, symbolization, and printed
circuit board (PCB) design guidelines are available at www.ti.com/sc/package.
CAGE code
01295
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Source of supply
Texas Instruments, Inc.
Semiconductor Group
8505 Forest Lane
P.O. Box 660199
Dallas, TX 75243
Point of contact: U.S. Highway 75 South
P.O. Box 84, M/S 853
Sherman, TX 75090-9493
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