ONSEMI NTZD5110NT1G

NTZD5110N
Small Signal MOSFET
60 V, 310 mA, Dual N−Channel
with ESD Protection, SOT−563
Features
•
•
•
•
•
Low RDS(on) Improving System Efficiency
Low Threshold Voltage
ESD Protected Gate
Small Footprint 1.6 x 1.6 mm
These are Pb−Free Devices
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V(BR)DSS
D1
G1
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted.)
Symbol
Value
Unit
Drain−to−Source Voltage
VDSS
60
V
Gate−to−Source Voltage
VGS
±20
V
ID
294
mA
Continuous Drain
Current (Note 1)
Steady
State
Power Dissipation
(Note 1)
TA = 25°C
TA = 85°C
Steady State
Continuous Drain
Current (Note 1)
tv5 s
Power Dissipation
(Note 1)
TA = 25°C
PD
250
mW
ID
310
mA
225
PD
280
mW
IDM
590
mA
TJ,
TSTG
−55 to
150
°C
Source Current (Body Diode)
IS
350
mA
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
TL
260
°C
ESD
900
V
Symbol
Max
Unit
RqJA
500
°C/W
tv5s
Pulsed Drain Current
tp = 10 ms
Operating Junction and Storage Temperature
Gate−Source ESD Rating (HBM, Method 3015)
D2
G2
S1
N−Channel
MOSFET
S2
MARKING
DIAGRAM
212
TA = 85°C
310 mA
2.5 W @ 4.5 V
Load/Power Switches
Driver Circuits: Relays, Lamps, Displays, Memories, etc.
Battery Management/Battery Operated Systems
Cell Phones, Digital Cameras, PDAs, Pagers, etc.
Parameter
ID Max
1.6 W @ 10 V
60
Applications
•
•
•
•
RDS(on) MAX
6
1
SOT−563−6
CASE 463A
S7 D
S7 = Specific Device Code
D = Date Code
PINOUT: SOT−563
S1 1
6 D1
G1 2
5 G2
D2
4 S2
THERMAL RESISTANCE RATINGS
Parameter
Junction−to−Ambient – Steady State (Note 1)
Junction−to−Ambient – t v 5 s (Note 1)
447
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits
are exceeded, device functional operation is not implied, damage may occur
and reliability may be affected.
1. Surface mounted on FR4 board using 1 in sq pad size
(Cu. area = 1.127 in sq [1 oz] including traces).
© Semiconductor Components Industries, LLC, 2007
April, 2007 − Rev. 3
1
3
Top View
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 4 of this data sheet.
Publication Order Number:
NTZD5110N/D
NTZD5110N
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted.)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Drain−to−Source Breakdown Voltage
V(BR)DSS
VGS = 0 V, ID = 250 mA
60
−
−
V
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V(BR)DSS/TJ
−
−
71
−
mV/°C
TJ = 25°C
−
−
1.0
mA
TJ = 125°C
−
−
500
TJ = 25°C
−
−
100
nA
VDS = 0 V, VGS = "20 V
−
−
"10
mA
VDS = 0 V, VGS = "10 V
−
−
450
nA
VDS = 0 V, VGS = "5.0 V
−
−
150
nA
VGS(TH)
VGS = VDS, ID = 250 mA
1.0
−
2.5
V
VGS(TH)/TJ
−
−
4.0
−
mV/°C
VGS = 10 V, ID = 500 mA
−
1.19
1.6
W
VGS = 4.5 V, ID = 200 mA
−
1.33
2.5
VDS = 5.0 V, ID = 200 mA
−
80
−
S
−
24.5
−
pF
−
4.2
−
−
2.2
−
−
0.7
−
−
0.1
−
−
0.3
−
OFF CHARACTERISTICS
Zero Gate Voltage Drain Current
IDSS
VGS = 0 V
VDS = 60 V
VGS = 0 V
VDS = 50 V
Gate−to−Source Leakage Current
IGSS
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage
Negative Threshold Temperature Coefficient
Drain−to−Source On Resistance
Forward Transconductance
RDS(on)
gFS
CHARGES AND CAPACITANCES
Input Capacitance
CISS
Output Capacitance
COSS
Reverse Transfer Capacitance
CRSS
VGS = 0 V, f = 1.0 MHz,
VDS = 20 V
Total Gate Charge
QG(TOT)
Threshold Gate Charge
QG(TH)
Gate−to−Source Charge
QGS
Gate−to−Drain Charge
QGD
−
0.1
−
td(ON)
−
12
−
−
7.3
−
−
63.7
−
−
30.6
−
TJ = 25°C
−
0.8
1.2
TJ = 85°C
−
0.7
−
VGS = 4.5 V, VDS = 10 V;
ID = 200 mA
nC
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time
Rise Time
Turn−Off Delay Time
Fall Time
tr
td(OFF)
VGS = 10 V, VDD = 30 V,
ID = 200 mA, RG = 10 W
tf
ns
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
VSD
VGS = 0 V,
IS = 200 mA
2. Surface−mounted on FR4 board using 1 in. sq. pad size (Cu. area = 1.127 in sq [1 oz] including traces).
3. Pulse Test: pulse width v 300 ms, duty cycle v2%.
4. Switching characteristics are independent of operating junction temperatures.
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2
V
NTZD5110N
TYPICAL CHARACTERISTICS
9.0 V
8.0 V
7.0 V
6.0 V
1.2
1.2
5.0 V
4.5 V
VGS = 10 V
4.0 V
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
1.6
3.5 V
0.8
3.0 V
0.4
0.8
TJ = 25°C
0.4
2.5 V
0
2
4
0
6
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
TJ = 125°C
TJ = 85°C
TJ = 25°C
2.0
1.6
TJ = −55°C
1.2
0.8
0.4
0.2
0.4
0.6
0.8
1.0
1.2
6
3.2
VGS = 10 V
2.8
2.4
TJ = 125°C
2.0
TJ = 85°C
1.6
TJ = 25°C
1.2
TJ = −55°C
0.8
0.4
0
0
0.2
0.4
0.6
0.8
1.0
1.2
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
Figure 3. On−Resistance vs. Drain Current and
Temperature
Figure 4. On−Resistance vs. Drain Current and
Temperature
2.4
2.2
2.0
ID = 500 mA
1.6
ID = 200 mA
1.2
0.8
0.4
4
Figure 2. Transfer Characteristics
VGS = 4.5 V
0
2
Figure 1. On−Region Characteristics
2.4
0
0
TJ = −55°C
VGS, GATE−TO−SOURCE VOLTAGE (V)
3.2
2.8
TJ = 125°C
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
RDS(on), DRAIN−TO−SOURCE
RESISTANCE (NORMALIZED)
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
0
2
4
6
8
ID = 0.2 A
1.8
VGS = 10 V
1.4
1.0
0.6
−50
10
VGS = 4.5 V
−25
0
25
50
75
100
125
VGS, GATE−TO−SOURCE VOLTAGE (V)
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance vs. Gate−to−Source
Voltage
Figure 6. On−Resistance Variation with
Temperature
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3
150
NTZD5110N
TYPICAL CHARACTERISTICS
VGS, GATE−TO−SOURCE VOLTAGE (V)
30
C, CAPACITANCE (pF)
Ciss
20
TJ = 25°C
VGS = 0 V
Coss
10
0
Crss
0
4
8
12
16
20
5
TJ = 25°C
ID = 0.2 A
4
3
2
1
0
0
0.2
0.4
0.6
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (V)
Qg, TOTAL GATE CHARGE (nC)
Figure 7. Capacitance Variation
Figure 8. Gate−to−Source and
Drain−to−Source Voltage vs. Total Charge
0.8
10
IS, SOURCE CURRENT (A)
VGS = 0 V
1
TJ = 85°C
TJ = 25°C
0.1
0.01
0.4
0.6
0.8
1.0
1.2
VSD, SOURCE−TO−DRAIN VOLTAGE (V)
Figure 9. Diode Forward Voltage vs. Current
ORDERING INFORMATION
Device
Package
Shipping
NTZD5110NT1
SOT−563
3000 / Tape & Reel
NTZD5110NT1G
SOT−563
(Pb−Free)
3000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.
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4
NTZD5110N
PACKAGE DIMENSIONS
SOT−563, 6 LEAD
CASE 463A−01
ISSUE D
A
−X−
6
5
1
G
2
C
4
3
B
−Y−
D 65 PL
0.08 (0.003)
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETERS
3. MAXIMUM LEAD THICKNESS INCLUDES
LEAD FINISH THICKNESS. MINIMUM LEAD
THICKNESS IS THE MINIMUM THICKNESS
OF BASE MATERIAL.
K
DIM
A
B
C
D
G
J
K
S
S
J
M
X Y
MILLIMETERS
MIN
MAX
1.50
1.70
1.10
1.30
0.50
0.60
0.17
0.27
0.50 BSC
0.08
0.18
0.10
0.30
1.50
1.70
INCHES
MIN
MAX
0.059 0.067
0.043 0.051
0.020 0.024
0.007 0.011
0.020 BSC
0.003 0.007
0.004 0.012
0.059 0.067
SOLDERING FOOTPRINT*
0.3
0.0118
0.45
0.0177
1.35
0.0531
1.0
0.0394
0.5
0.5
0.0197 0.0197
SCALE 20:1
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
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For additional information, please contact your local
Sales Representative
NTZD5110N/D