FAIRCHILD 74ABT543CMSAX

Revised January 1999
74ABT543
Octal Registered Transceiver with 3-STATE Outputs
■ Separate controls for data flow in each direction
General Description
The ABT543 octal transceiver contains two sets of D-type
latches for temporary storage of data flowing in either
direction. Separate Latch Enable and Output Enable inputs
are provided for each register to permit independent control of inputting and outputting in either direction of data
flow.
■ Guaranteed output skew
■ Guaranteed multiple output switching specifications
■ Output switching specified for both 50 pF and 250 pF
loads
■ Guaranteed simultaneous switching noise level and
dynamic threshold performance
■ Guaranteed latchup protection
Features
■ Back-to-back registers for storage
■ High impedance glitch free bus loading during entire
power up and power down cycle
■ Bidirectional data path
■ Nondestructive hot insertion capability
■ A and B outputs have current sourcing capability of 32
mA and current sinking capability of 64 mA
Ordering Code:
Order Number
Package Number
74ABT543CSC
M24B
Package Description
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body
74ABT543CMSA
MSA24
24-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide
74ABT543CMTC
MTC24
24-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Connection Diagram
Pin Descriptions
Pin Assignment for
SOIC, SSOP and TSSOP
© 1999 Fairchild Semiconductor Corporation
Pin Names
DS011508.prf
Description
OEAB, OEBA
Output Enable Inputs
LEAB, LEBA
Latch Enable Inputs
CEAB, CEBA
Chip Enable Inputs
A0–A7
Side A Inputs or 3-STATE Outputs
B0–B7
Side B Inputs or 3-STATE Outputs
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74ABT543 Octal Registered Transceiver with 3-STATE Outputs
November 1992
74ABT543
Functional Description
Data I/O Control Table
The ABT543 contains two sets of D-type latches, with separate input and output controls for each. For data flow from
A to B, for example, the A to B Enable (CEAB) input must
be low in order to enter data from the A Port or take data
from the B Port as indicated in the Data I/O Control Table.
With CEAB low, a low signal on (LEAB) input makes the A
to B latches transparent; a subsequent low to high transition of the LEAB line puts the A latches in the storage
mode and their outputs no longer change with the A inputs.
With CEAB and OEAB both low, the B output buffers are
active and reflect the data present on the output of the A
latches. Control of data flow from B to A is similar, but using
the CEBA, LEBA and OEBA.
Inputs
Output Buffers
Latched
HIGH Z
—
H
X
X
X
H
X
Latched
L
L
X
Transparent
—
X
X
H
—
HIGH Z
L
X
L
—
Driving
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Logic Diagram
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Latch Status
CEAB LEAB OEAB
2
Over Voltage Latchup (I/O)
−65°C to +150°C
Storage Temperature
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150°C
−0.5V to +7.0V
Free Air Ambient Temperature
Input Voltage (Note 2)
−0.5V to +7.0V
Supply Voltage
Input Current (Note 2)
−30 mA to +5.0 mA
−0.5V to +5.5V
−0.5V to VCC
in the HIGH State
+4.5V to +5.5V
Data Input
50 mV/ns
Enable Input
20 mV/ns
Clock Input
100 mV/ns
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Current Applied to Output
in LOW State (Max)
−40°C to +85°C
Minimum Input Edge Rate (∆V/∆t)
Voltage Applied to Any Output
in the Disable or Power-Off State
10V
Recommended Operating
Conditions
VCC Pin Potential to
Ground Pin
−500 mA
DC Latchup Source Current
twice the rated IOL (mA)
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
Min
Typ
Max
Units
VCC
Conditions
VIH
Input HIGH Voltage
2.0
V
Recognized HIGH Signal
VIL
Input LOW Voltage
0.8
V
Recognized LOW Signal
VCD
Input Clamp Diode Voltage
V
IIN = −18 mA (Non I/O Pins)
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VID
Input Leakage Test
IIH
Input HIGH Current
−1.2
2.5
IOH = −3 mA, (An, Bn)
2.0
IOH = −32 mA, (An, Bn)
0.55
4.75
V
Min
IOL = 64 mA, (An, Bn)
V
0.0
IID = 1.9 µA, (Non-I/O Pins)
µA
Max
All Other Pins Grounded
1
IBVI
Input HIGH Current Breakdown Test
IBVIT
Input HIGH Current
VIN = 2.7V (Non-I/O Pins) (Note 3)
VIN = VCC (Non-I/O Pins)
1
7
µA
Max
VIN = 7.0V (Non-I/O Pins)
100
µA
Max
VIN = 5.5V (An, Bn)
−1
µA
Max
VIN = 0.5V (Non-I/O Pins) (Note 3)
Breakdown Test (I/O)
IIL
Input LOW Current
−1
VIN = 0.0V (Non-I/O Pins)
IIH + IOZH Output Leakage Current
10
µA
0V–5.5V VOUT = 2.7V (An, Bn);
IIL + IOZL Output Leakage Current
−10
µA
0V–5.5V VOUT = 0.5V (An, Bn);
−275
mA
OEAB or CEAB = 2V
OEAB or CEAB = 2V
−100
Max
VOUT = 0V (An, Bn)
µA
Max
VOUT = VCC (An, Bn)
µA
0.0V
VOUT = 5.5V (An, Bn);
50
µA
Max
All Outputs HIGH
Power Supply Current
30
mA
Max
All Outputs LOW
Power Supply Current
50
µA
Max
Outputs 3-STATE
Additional ICC/Input
2.5
mA
Max
IOS
Output Short-Circuit Current
ICEX
Output HIGH Leakage Current
50
IZZ
Bus Drainage Test
100
ICCLH
Power Supply Current
ICCL
ICCZ
ICCT
All Others GND
All Others at VCC or GND
VI = VCC − 2.1V
All Others at VCC or GND
ICCD
Dynamic ICC
No Load
(Note 5)
Outputs Open, CEAB
0.18
mA/MHz
Max
and OEAB = GND, CEBA = VCC, One Bit Toggling,
50% Duty Cycle, (Note 4)
Note 3: Guaranteed but not tested.
Note 4: For 8-bit toggling. ICCD < 1.4 mA/MHz.
Note 5: Guaranteed, but not tested.
3
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74ABT543
Absolute Maximum Ratings(Note 1)
74ABT543
DC Electrical Characteristics
(SOIC Package)
Conditions
Symbol
Parameter
Min
Typ
Max
Units
VCC
CL = 50 pF,
0.7
1.0
V
5.0
TA = 25°C (Note 6)
RL = 500Ω
VOLP
Quiet Output Maximum Dynamic VOL
VOLV
Quiet Output Minimum Dynamic VOL
−1.2
−0.8
V
5.0
TA = 25°C (Note 6)
VOHV
Minimum HIGH Level Dynamic Output Voltage
2.5
3.0
V
5.0
TA = 25°C (Note 7)
VIHD
Minimum HIGH Level Dynamic Input Voltage
2.0
1.7
V
5.0
TA = 25°C (Note 8)
VILD
Maximum LOW Level Dynamic Input Voltage
V
5.0
TA = 25°C (Note 8)
0.7
0.9
Note 6: Max number of outputs defined as (n). n − 1 data inputs are driven 0V to 3V. One output at LOW. Guaranteed, but not tested.
Note 7: Max number of outputs defined as (n). n−1 data inputs are driven 0V to 3V. One output HIGH. Guaranteed, but not tested.
Note 8: Max number of data inputs (n) switching. n − 1 inputs switching 0V to 3V. Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD ).
Guaranteed, but not tested.
AC Electrical Characteristics
(SOIC and SSOP Packages)
Symbol
Parameter
TA = +25°C
TA = −40°C to +85°C
VCC = +5.0V
VCC = 4.5V–5.5V
CL = 50 pF
CL = 50 pF
Min
Typ
Max
Min
Max
tPLH
Propagation Delay
1.5
3.1
4.8
1.5
4.8
tPHL
An to Bn or Bn to An
1.5
4.8
1.5
4.8
tPLH
Propagation Delay
tPHL
tPZH
tPZL
LEAB to Bn, LEBA to An
1.6
OEBA or OEAB to An or Bn
1.6
3.4
5.3
1.6
5.3
5.3
1.6
5.3
Units
ns
ns
Enable Time
LEAB to Bn, LEBA to An
1.5
OEBA or OEAB to An or Bn
1.5
tPHZ
Disable Time
2.0
tPLZ
CEBA or CEAB to An or Bn
2.0
3.6
4.0
5.8
1.5
5.8
5.8
1.5
5.8
6.5
2.0
6.5
6.5
2.0
6.5
ns
ns
AC Operating Requirements
(SOIC and SSOP Packages)
Symbol
Parameter
TA = +25°C
TA = −40°C to +85°C
VCC = +5.0V
VCC = 4.5V–5.5V
CL = 50 pF
CL = 50 pF
Min
Max
Min
tS(H)
Setup Time, HIGH or LOW
1.5
1.5
tS(L)
An or Bn to LEBA or LEAB
1.5
1.5
tH(H)
Hold Time, HIGH or LOW
1.0
1.0
tH(L)
An or Bn to LEBA or LEAB
1.0
1.0
tS(H)
Setup Time, HIGH or LOW
1.5
1.5
tS(L)
An or Bn to CEAB or CEBA
1.5
1.5
tH(H)
Hold Time, HIGH or LOW
1.3
1.3
tH(L)
An or Bn to CEAB or CEBA
1.3
1.3
tW(L)
Pulse Width, LOW
3.0
3.0
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4
Units
Max
ns
ns
ns
ns
ns
74ABT543
Extended AC Electrical Characteristics
(SOIC Package)
Symbol
TA = −40°C to +85°C
TA = −40°C to +85°C
TA = −40°C to +85°C
VCC = 4.5V–5.5V
VCC = 4.5V–5.5V
VCC = 4.5V–5.5V
CL = 50 pF
CL = 250 pF
CL = 250 pF
8 Outputs Switching
1 Output Switching
8 Outputs Switching
Parameter
(Note 9)
Min
Typ
(Note 10)
Units
(Note 11)
Max
Min
Max
Min
Max
fTOGGLE
Max Toggle Frequency
tPLH
Propagation Delay
1.5
6.2
2.0
7.5
2.5
10.0
tPHL
An to Bn or Bn to An
1.5
6.2
2.0
7.5
2.5
10.0
tPLH
Propagation Delay
1.5
6.5
2.0
8.0
2.5
10.5
tPHL
LEAB to Bn, LEBA to An
1.5
6.5
2.0
8.0
2.5
10.5
tPZH
Output Enable Time
tPZL
OEBA or OEAB to An or Bn
1.5
7.5
2.0
8.5
2.5
11.0
CEBA or CEAB to An or Bn
1.5
7.5
2.0
8.5
2.5
11.0
OEBA or OEAB to An or Bn
1.5
8.5
CEBA or CEAB to An or Bn
1.5
8.5
tPHZ
100
MHz
ns
ns
ns
Output Disable Time
tPLZ
(Note 12)
(Note 12)
ns
Note 9: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase (i.e., all LOW-toHIGH, HIGH-to-LOW, etc.).
Note 10: This specification is guaranteed but not tested. The limits represent propagation delay with 250pF load capacitors in place of the 50 pF load capacitors in the standard AC load. This specification pertains to single output switching only.
Note 11: This specification is guaranteed but not tested. The limits represent propagation delays for all paths described switching in phase (i.e., all LOW-toHIGH, HIGH-to-LOW, etc.) with 250 pF load capacitors in place of the 50 pF load capacitors in the standard AC load.
Note 12: The 3-STATE delay times are dominated by the RC network (500Ω, 250 pF) on the output and has been excluded from the datasheet
Skew
(SOIC Package)
Symbol
TA = −40°C to +85°C
TA = −40°C to +85°C
VCC = 4.5V–5.5V
VCC = 4.5V–5.5V
CL = 50 pF
CL = 250 pF
8 Outputs Switching
8 Outputs Switching
(Note 13)
(Note 14)
Max
Max
1.0
2.0
ns
1.3
2.0
ns
2.0
4.0
ns
2.0
4.0
ns
2.5
4.5
ns
Parameter
tOSHL
Pin to Pin Skew
(Note 15)
HL Transitions
tOSLH
Pin to Pin Skew
(Note 15)
LH Transitions
tPS
Duty Cycle
(Note 16)
LH–HL Skew
tOST
Pin to Pin Skew
(Note 15)
LH/HL Transitions
tPV
Device to Device Skew
(Note 17)
LH/HL Transitions
Units
Note 13: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase (i.e., all LOW-toHIGH, HIGH-to-LOW, etc.).
Note 14: This specification is guaranteed but not tested. The limits represent propagation delays with 250 pF load capacitors in place of the 50 pF load
capacitors in the standard AC load.
Note 15: Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device.
The specification applies to any outputs switching HIGH-to-LOW (tOSHL), LOW-to-HIGH (tOSLH), or any combination switching LOW-to-HIGH and/or HIGHto-LOW (tOST). This specification is guaranteed but not tested.
Note 16: This describes the difference between the delay of the LOW-to-HIGH and the HIGH-to-LOW transition on the same pin. It is measured across all
the outputs (drivers) on the same chip, the worst (largest delta) number is the guaranteed specification. This specification is guaranteed but not tested.
Note 17: Propagation delay variation for a given set of conditions (i.e., temperature and VCC) from device to device. This specification is guaranteed but not
tested.
5
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74ABT543
Capacitance
Symbol
Parameter
Conditions: TA = 25°C
Typ
Units
CIN
Input Capacitance
5.0
pF
VCC = 0V (non I/O pins)
CI/O (Note 18)
Output Capacitance
11.0
pF
VCC = 5.0V (An, Bn)
Note 18: CI/O is measured at frequency, f = 1 MHz, PER MLT-STD-883B, METHOD 3012.
AC Loading
FIGURE 2. VM = 1.5V
Input Pulse Requirements
*Includes jig and probe capacitance
FIGURE 1. Standard AC Test Load
Amplitude Rep. Rate
3V
1 MHz
tW
tr
tf
500 ns
2.5 ns
2.5 ns
FIGURE 3. Test Input Signal Requirements
AC Waveforms
FIGURE 4. Propagation Delay Waveforms for Inverting
and Non-Inverting Functions
FIGURE 6. 3-STATE Output HIGH
and LOW Enable and Disable Times
FIGURE 5. Propagation Delay,
Pulse Width Waveforms
FIGURE 7. Setup Time, Hold Time
and Recovery Time Waveforms
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6
74ABT543
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body
Package Number M24B
24-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide
Package Number MSA24
7
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74ABT543 Octal Registered Transceiver with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
24-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Package Number MTC24
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
1. Life support devices or systems are devices or systems
device or system whose failure to perform can be reawhich, (a) are intended for surgical implant into the
sonably expected to cause the failure of the life support
body, or (b) support or sustain life, and (c) whose failure
device or system, or to affect its safety or effectiveness.
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
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user.
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.