HYNIX HY62U8400ALLT2-I

HY62U8400A Series
512Kx8bit CMOS SRAM
Document Title
512K x8 bit 3.0V Low Power CMOS slow SRAM
Revision History
Revision No
History
Draft Date
04
Revision History Insert
Revised
- Insert 70ns Part
- Improved standby current
Isb1 : 30uA ¡ æ20uA
Jul.26.2000
Final
05
Revised
- Change Iccdr Value : 15uA => 20uA
Aug.04.2000
Final
06
Marking Information Add
Revised
- E.T (-25~85°C), I.T (-40~85°C) Part Insert
- AC Test Condition Add : 5pF Test Load
- tCLZ Value Change : 15ns/20ns - > 10ns
- VIH max : Vcc + 0.2V => Vcc + 0.3V
- VIL min : - 0.2V => - 0.3V
Dec.04.2000
Final
07
Changed Logo
- HYUNDAI -> hynix
- Marking Information Change
Apr.30.2001
Final
Remark
This document is a general product description and is subject to change without notice. Hynix Electronics does not assume any responsibility
for use of circuits described. No patent licenses are implied.
Rev 07 / Apr. 2001
Hynix Semiconductor
HY62U8400A Series
DESCRIPTION
FEATURES
The HY62U8400A is a high-speed, low power and
4M bits CMOS SRAM organized as 512K words
by 8 bits. The HY62U8400A uses Hynix's high
performance twin tub CMOS process technology
and was designed for high-speed and low power
circuit technology. It is particularly well suited for
use in high-density and low power system
applications. This device has a data retention
mode that guarantees data to remain valid at the
minimum power supply voltage of 2.0V.
•
•
•
•
Fully static operation and Tri-state outputs
TTL compatible inputs and outputs
Low power consumption
Battery backup(LL-part)
-. 2.0V(min) data retention
• Standard pin configuration
-. 32pin 525mil SOP
-. 32pin 400mil TSOP-II
(Standard and Reversed)
Product
Voltage
Speed
Operation
No.
(V)
(ns)
Current/Icc(mA)
HY62U8400A
2.7~3.3
70*/85/100
5
HY62U8400A-E 2.7~3.3
70*/85/100
5
HY62U8400A-I
2.7~3.3
70*/85/100
5
Note 1. Current value is max.
* 70ns is available with 30pF test load
Standby Current(uA)
LL
20
30
30
Temperature
(°C)
0~70
-25~85
-40~85
PIN CONNECTION
A18
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O1
I/O2
I/O3
Vss
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Vcc
A15
A17
/WE
A13
A8
A9
A11
/OE
A10
/CS
I/O8
I/O7
I/O6
I/O5
I/O4
SOP
A18
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O1
I/O2
I/O3
Vss
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
Vcc
A15
A17
/WE
A13
A8
A9
A11
/OE
A10
/CS
I/O8
I/O7
I/O6
I/O5
I/O4
TSOP-II (Standard)
Vcc
A15
A17
/WE
A13
A8
A9
A11
/OE
A10
/CS
I/O8
I/O7
I/O6
I/O5
I/O4
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
TSOP-II (Reversed)
PIN DESCRIPTION
ROW DECODER
A0
WRITE DRIVER
MEMORY ARRAY
512Kx 8
I/O1
DATA I/O
BUFFER
SENSE AMP
COLUMN DECODER
Pin Function
Chip Select
Write Enable
Output Enable
Address Input
Data Input/Output
Power(2.7~3.3V)
Ground
BLOCK DIAGRAM
ADD INPUT BUFFER
Pin Name
/CS
/WE
/OE
A0 ~ A18
I/O1 ~ I/O8
Vcc
Vss
A18
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O1
I/O2
I/O3
Vss
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
I/O8
A18
/OE
/WE
Rev 07 / Apr. 2001
CONTROL
LOGIC
/CS
2
HY62U8400A Series
ORDERING INFORMATION
Part No.
Speed
HY62U8400ALLG
70*/85/100
HY62U8400ALLG-E
70*/85/100
HY62U8400ALLG-I
70*/85/100
HY62U8400ALLT2
70*/85/100
HY62U8400ALLT2-E
70*/85/100
HY62U8400ALLT2-I
70*/85/100
HY62U8400ALLR2
70*/85/100
HY62U8400ALLR2-E
70*/85/100
HY62U8400ALLR2-I
70*/85/100
* 70ns is available with 30pF test load
Power
LL-part
LL-part
LL-part
LL-part
LL-part
LL-part
LL-part
LL-part
LL-part
Temp
0~70 °C
-25~85 °C
-40~85 °C
0~70 °C
-25~85 °C
-40~85 °C
0~70 °C
-25~85 °C
-40~85 °C
Package
SOP
SOP
SOP
TSOP-II (Standard)
TSOP-II (Standard)
TSOP-II (Standard)
TSOP-II (Reversed)
TSOP-II (Reversed)
TSOP-II (Reversed)
ABSOLUTE MAXIMUM RATING (1)
Symbol
Vcc, VIN, VOUT
TA
Parameter
Power Supply, Input/Output Voltage
Operating Temperature
HY62U8400A
HY62U8400A-E
HY62U8400A-I
Storage Temperature
Power Dissipation
Data Output Current
Lead Soldering Temperature & Time
TSTG
PD
IOUT
TSOLDER
Rating
-0.5 to 4.0
0 to 70
-25 to 85
-40 to 85
-65 to 150
1.0
50
260 •10
Unit
V
°C
°C
°C
°C
W
MA
°C•sec
Note
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent
damage to the device. This is stress rating only and the functional operation of the device under these or
any other conditions above those indicated in the operation of this specification is not implied.
Exposure to the absolute maximum rating conditions for extended period may affect reliablity.
TRUTH TABLE
/CS
H
L
L
L
/WE
X
H
H
L
/OE
X
H
L
X
MODE
Deselected
Output Disabled
Read
Write
I/O OPERATION
High-Z
High-Z
Data Out
Data In
Power
Standby
Active
Active
Active
Note :
1. H=VIH, L=VIL, X=don't care (VIH or VIL)
Rev 07 / Apr. 2001
2
HY62U8400A Series
RECOMMENDED DC OPERATING CONDITION
TA = 0¡ Éto 70¡ É(Normal)/-25°C to 85°C (Extended) /-40°C to 85°C (Industrial), unless otherwise specified.
Symbol
Parameter
Min.
Typ.
Max.
Unit
Vcc
Supply Voltage
2.7
3.0
3.3
V
Vss
Ground
0
0
0
V
VIH
Input High Voltage
2.2
Vcc+0.3
V
VIL
Input Low Voltage
-0.3(1)
0.4
V
Note :
1. VIL = -1.5V for pulse width less than 30ns and not 100% tested.
DC ELECTRICAL CHARACTERISTICS
TA = 0¡ Éto 70¡ É(Normal)/-25°C to 85°C (Extended) /-40°C to 85°C (Industrial), unless otherwise specified.
Symbol
Parameter
Test Condition
Min Typ Max Unit
ILI
Input Leakage Current
Vss < VIN < Vcc
-1
1
uA
ILO
Output Leakage Current
Vss < VOUT < Vcc, /CS = VIH or
-1
1
uA
/OE = VIH or /WE = VIL
Icc
Operating Power Supply
/CS = VIL,
5
mA
Current
VIN = VIH or VIL, II/O = 0mA
35
mA
ICC1
Average Operating Current
/CS = VIL
Min Duty Cycle = 100%,
VIN = VIH or VIL, II/O = 0mA
ISB
TTL Standby Current
/CS = VIH
0.5
mA
(TTL Input)
VIN = VIH or VIL
Standby Current
ISB1
/CS > Vcc - 0.2V,
LL
20
uA
(CMOS Input)
VIN > Vcc - 0.2V or
LL-E/I
30
uA
VIN < Vss + 0.2V
VOL
Output Low Voltage
IOL = 2.1mA
0.4
V
VOH
Output High Voltage
IOH = -1mA
2.2
V
Note : Typical values are at Vcc = 3.0V, TA = 25°C
CAPACITANCE
Temp = 25°C, f= 1.0MHz
Symbol
Parameter
CIN
Input Capacitance
COUT
Output Capacitance
Condition
VIN = 0V
VI/O = 0V
Max.
6
8
Unit
pF
pF
Note : This parameter is sampled and not 100% tested
Rev 07 / Apr. 2001
3
HY62U8400A Series
AC CHARACTERISTICS
TA = 0¡ Éto 70¡ É(Normal)/-25°C to 85°C (Extended) /-40°C to 85°C (Industrial), unless otherwise specified.
-70*
-85
-10
# Symbol
Parameter
Unit
Min.
Max. Min.
Max. Min
Max.
READ CYCLE
1
tRC
Read Cycle Time
70
85
100
ns
2
tAA
Address Access Time
70
85
100
ns
3
tACS
Chip Select Access Time
70
85
100
ns
4
tOE
Output Enable to Output Valid
40
45
50
ns
5
tCLZ
Chip Select to Output in Low Z
10
10
10
ns
6
tOLZ
Output Enable to Output in Low Z
5
5
5
ns
7
tCHZ
Chip Deselection to Output in High Z
0
30
0
30
0
30
ns
8
tOHZ
Out Disable to Output in High Z
0
30
0
30
0
30
ns
9
tOH
Output Hold from Address Change
10
10
15
ns
WRITE CYCLE
10 tWC
Write Cycle Time
70
85
100
ns
11 tCW
Chip Selection to End of Write
60
70
80
ns
12 tAW
Address Valid to End of Write
60
70
80
ns
13 tAS
Address Set-up Time
0
0
0
ns
14 tWP
Write Pulse Width
50
60
70
ns
15 tWR
Write Recovery Time
0
0
0
ns
16 tWHZ
Write to Output in High Z
0
25
0
30
0
35
ns
17 tDW
Data to Write Time Overlap
30
40
45
ns
18 tDH
Data Hold from Write Time
0
0
0
ns
19 tOW
Output Active from End of Write
5
5
10
ns
Note * 70ns is available with 30pF test load
AC TEST CONDITIONS
TA = 0¡ Éto 70¡ É(Normal)/-25°C to 85°C (Extended) /-40°C to 85°C (Industrial), unless otherwise specified.
Parameter
Value
Input Pulse Level
0.4V to 2.2V
Input Rise and Fall Time
5ns
Input and Output Timing Reference Level
1.5V
Output Load
tCLZ,tOLZ,tCHZ,tOHZ,tWHZ,tOW
CL = 5pF + 1TTL Load
Others
CL = 100pF + 1TTL Load
CL = 30pF + 1TTL Load
AC TEST LOADS
TTL
CL(1)
Note
1. Including jig and scope capacitance
Rev 07 / Apr. 2001
4
HY62U8400A Series
TIMING DIAGRAM
READ CYCLE 1(Note 1,4)
tRC
ADDR
tAA
tOH
tACS
/CS
tCHZ(3)
tOE
/OE
tOLZ(3)
Data
Out
High-Z
tOHZ(3)
tCLZ(3)
Data Valid
READ CYCLE 2(Note 1,2,4)
tRC
ADDR
tAA
tOH
tOH
Data
Out
Previous Data
Data Valid
READ CYCLE 3(Note 1,2,4)
/CS
tACS
tCLZ(3)
Data
Out
tCHZ(3)
Data Valid
Notes:
1. A read occurs during the overlap of a low /OE, a high /WE and a low /CS.
2. /OE = VIL
3. Transition is measured + 200mV from steady state voltage.
This parameter is sampled and not 100% tested.
4. /CS in high for the standby, low for active
Rev 07 / Apr. 2001
5
HY62U8400A Series
WRITE CYCLE 1(1,4,5,8) (/WE Controlled)
tWC
ADDR
tWR(2)
tCW
/CS
tAW
/WE
tWP
tAS
Data In
tDW
High-Z
tDH
Data Valid
tWHZ(3,7)
tOW
(5)
(6)
Data
Out
WRITE CYCLE 2 (Note 1,4,5,8) (/CS Controlled)
tWC
ADDR
tCW
tAS
tWR(2)
/CS
tAW
tWP
/WE
tDW
Data In
Data
Out
Rev 07 / Apr. 2001
High-Z
tDH
Data Valid
High-Z
6
HY62U8400A Series
Notes:
1. A write occurs during the overlap of a low /WE and a low /CS.
2. tWR is measured from the earlier of /CS or /WE going high to the end of write cycle.
3. During this period, I/O pins are in the output state so that the input signals of opposite phase to the
output must not be applied.
4. If the /CS low transition occur simultaneously with the /WE low transition or after the
/WE transition, outputs remain in a high impedance state.
5. Q(data out) is the same phase with the write data of this write cycle.
6. Q(data out) is the read data of the next address.
7. Transition is measured + 200mV from steady state.
This parameter is sampled and not 100% tested.
8. /CS in high for the standby, low for active
DATA RETENTION ELECTRIC CHARATERISTIC
TA = 0¡ Éto 70¡ É(Normal)/-25°C to 85°C (Extended) /-40°C to 85°C (Industrial), unless otherwise specified.
Symbol
Parameter
Test Condition
Min
Typ
Max
Unit
VDR
Vcc for Data Retention
/CS > Vcc-0.2V,
2.0
V
VIN > Vcc-0.2V or VIN < 0.2V
ICCDR
Data Retention Current
Vcc = 3.0V,
LL
20
uA
/CS>Vcc-0.2V,
LL-E
30
uA
VIN>Vcc-0.2V or VIN<0.2V
LL-I
30
uA
tCDR
Chip Deselect to Data
0
ns
Retention Time
tR
Operating Recovery Time
tRC(2)
ns
Notes:
1. Typical values are at the condition of TA = 25°C.
2. tRC is read cycle time.
DATA RETENTION TIMING DIAGRAM
DATA RETENTION MODE
VCC
2.7V
tCDR
tR
2.2V
VDR
/CS > VCC-0.2V
/CS
VSS
Rev 07 / Apr. 2001
7
HY62U8400A Series
PACKAGE INFORMATION
32pin 400mil Thin Small Outline Package Standard(T2)
0.404(10.2620)
0.396(10.0580()
UNIT : INCH(mm)
MAX.
MIN.
0.470(11.9380)
0.462(11.7350)
0.829(21.0570)
0.822(20.8790)
GAGE PLANE
BASE PLANE
0-5
0.0235(0.5970)
0.050BSC
(1.2700)
0.017(0.4500)
0.012(0.3050)
0.047(1.1940)
SEATING PLANE
0.0160(0.4060)
0.0059(0.1500)
0.0083(0.2100)
0.0020(0.0500)
0.0047(0.1200)
0.039(0.9910)
32pin 400mil Thin Small Outline Package Reversed(R2)
0.404(10.2620)
0.396(10.0580)
UNIT : INCH(mm)
MAX.
MIN.
0.470(11.9380)
0.462(11.7350)
0.829(21.0570)
0.822(20.8790)
GAGE PLANE
BASE PLANE
0-5
0.0235(0.5970)
0.050 BSC
(1.2700)
0.047(1.1940)
0.039(0.9910)
Rev 07 / Apr. 2001
0.017(0.4500)
0.012(0.3050)
SEATING PLANE
0.0059(0.1500)
0.0020(0.0500)
0.0160(0.4060)
0.0083(0.2100)
0.0047(0.1200)
8
HY62U8400A Series
32pin 525mil Small Outline Package(G)
UNIT : INCH(mm)
0.810(20.574)
0.804(20.422)
0.444(11.278)
0.438(11.125)
0.564(14.326)
0.546(13.868)
0.109(2.769)
0.099(2.515)
0.011(0.279)
0.004(0.102)
0.050(1.27)BSC
Rev 07 / Apr. 2001
0.0125(0.318)
0.0061(0.155)
0.020(0.508)
0 deg
0.0425(1.080)
0.014(0.356)
8 deg
0.0235(0.597)
9
HY62U8400A Series
MARKING INFORMATION
Package
SOP
TSOP-II
Marking Example
h
y
n
i
x
H
Y
6
2
U
y
y
w
w
p
h
y
n
i
x
H
Y
6
2
U
y
y
w
w
p
8
8
4
4
0
0
A
c
c
0
0
A
c
c
T
K
O
R
E
A
G
-
s
s
t
K
O
R
E
A
2
-
s
s
t
Index
• hynix
• KOREA
• HY62U8400A
• yy
• ww
•p
• cc
• G / T2
• ss
•t
Note
- Capital Letter
- Small Letter
Rev 07 / Apr. 2001
: hynix Logo
: Origin Country
: Part Name
: Year ( ex : 00 = year 2000, 01 = year 2001 )
: Work Week ( ex : 12 = ww12 )
: Process Code
: Power Consumption
-L
: Low Power
- LL
: Low Low Power
: Package Type
-G
: SOP
- T2
: TSOP-II
: Speed
- 85
: 85ns
- 10
: 100ns
: Temperature
- Blank
: Commercial ( 0 ~ 70 °C )
-E
: Extended ( -25 ~ 85 °C )
-I
: Industrial ( -40 ~ 85 °C )
: Fixed Item
: Non-fixed Item (Except hynix)
10