Freescale Semiconductor, Inc. MOTOROLA Document order number: MC33879 Rev 3.0, 06/2004 SEMICONDUCTOR TECHNICAL DATA Preliminary Information 33879 Freescale Semiconductor, Inc... Configurable Octal Serial Switch with Open Load Detect Current Disable The 33879 device is an 8-output hardware-configurable, high-side/low-side switch with 16-bit serial input control. Two of the outputs may be controlled directly via microprocessor for PWM applications. The 33879 incorporates SMARTMOS technology, with CMOS logic, bipolar/MOS analog circuitry, and DMOS power MOSFETs. The 33879 controls various inductive, incandescent, or LED loads by directly interfacing with a microcontroller. The circuit’s innovative monitoring and protection features include very low standby currents, cascade fault reporting, internal +45 V clamp voltage for low-side configuration, -20 V high-side configuration, output-specific diagnostics, and independent overtemperature protection. CONFIGURABLE OCTAL SERIAL SWITCH WITH OPEN LOAD DETECT CURRENT DISABLE Features • Designed to Operate 5.5 V < VPWR < 26.5 V EK (Pb-FREE) SUFFIX DWB SUFFIX CASE 1437-01 32-LEAD SOICW-EP • 16-Bit SPI for Control and Fault Reporting, 3.3 V/5.0 V Compatible • Outputs Are Current Limited (0.5 A to 1.0 A) to Drive Incandescent Lamps • Output Voltage Clamp, +45 V (Low Side) and -20 V (High Side) During Inductive Switching • On/Off Control of Open Load Detect Current (LED Application) • Internal Reverse Battery Protection on VPWR ORDERING INFORMATION Device • Loss of Ground or Supply Will Not Energize Loads or Damage IC • Maximum 5.0 µA IPWR Standby Current at 13.0 V VPWR PC33879DWB/R2 PC33879EK/R2 • RDS(ON) of 1.0 Ω at 25°C Typical • Short Circuit Detect and Current Limit with Automatic Retry • Independent Overtemperature Protection • Motorola Now Offers Pb-Free Packaging with the Suffix EK Simplified Application Diagram 33879 Simplified Application Diagram VPWR +5.0 V MCU 33879 VDD VPWR A0 MOSI SCLK CS EN DI SCLK CS MISO DO PWM1 IN5 PWM2 IN6 GND VBAT D1 D2 D3 D4 S1 S2 S3 S4 High-Side Drive M D5 D6 D7 D8 S5 S6 S7 S8 H-Bridge Configuration VBAT Low-Side Drive This document contains information on a product under development. Motorola reserves the right to change or discontinue this product without notice. © Motorola, Inc. 2004 VBAT For More Information On This Product, Go to: www.freescale.com Temperature Range (TA) Package -40°C to 125°C 32 SOICW-EP Freescale Semiconductor, Inc. VDD __ CS VPWR ~50 µA Internal Bias Power Supply SCLK DI Overvoltage Shutdown/POR Sleep State Charge Pump GND DO Freescale Semiconductor, Inc... EN ~110 kΩ OV, POR, SLEEP SPI and Interface Logic Typical of all 8 output drivers TLIM SPI Bit 0 IN5 ~50 µA Enable SPI Bit 4 IN5 IN6 Open Load Detect Current ~80 µA Gate Drive Control Current Limit + – ~50 µA + – Open/Short Comparator +– ~3.5 V Open/Short Threshold Open Load Detect Current ~80 µA TLIM Gate Drive Control Current Limit + – + – Open/Short Comparator + – D1 D2 D3 D4 D7 D8 Drain Outputs S1 S2 S3 S4 S7 S8 Source Outputs D5 D6 Drain Outputs S5 Source Outputs S6 ~3.5 V Open/Short Threshold Figure 1. 33879 Simplified Internal Block Diagram 33879 2 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. Freescale Semiconductor, Inc... GND VDD S8 NC D8 S2 D2 NC NC S1 D1 D6 S6 IN6 EN SCLK 1 32 2 31 3 30 4 29 5 28 6 27 7 26 8 25 9 24 10 23 11 22 12 21 13 20 14 19 DO VPWR NC S7 D7 S4 D4 NC NC S3 D3 D5 S5 IN5 15 18 CS 16 17 DI PIN FUNCTION DESCRIPTION Pin Pin Name Formal Name 1 GND Ground Definition 2 VDD Logic Supply Voltage 3 S8 Source Output 8 4, 8, 9, 24, 25, 30 NC Not Connected No internal connection to this pin. 5 D8 Drain Output 8 Output eight MOSFETdrain pin. 6 S2 Source Output 2 Output two MOSFET source pin. 7 D2 Drain Output 2 10 S1 Source Output 1 11 D1 Drain Output 1 Output one MOSFET drain pin. 12 D6 Drain Output 6 Output six MOSFET drain pin. 13 S6 Source Output 6 14 IN6 Command Input 6 PWM direct control input pin for output 6. IN6 is “OR” with SPI bit. 15 EN Enable Input IC Enable. Active high. With EN low, the device is in sleep mode. 16 SCLK SPI Clock 17 DI Serial Data Input SPI control data input pin from MCU to the 33879. Logic [1] activates output. 18 CS SPI Chip Select SPI control chip select input pin from MCU to the 33879. Logic [0] allows data to be transferred in. 19 IN5 Command Input 5 20 S5 Source Output 5 21 D5 Drain Output 5 Output five MOSFET drain pin. 22 D3 Drain Output 3 Output three MOSFET drain pin. 23 S3 Source Output 3 26 D4 Drain Output 4 27 S4 Source Output 4 Output four MOSFET source pin. 28 D7 Drain Output 7 Output seven MOSFET drain pin. 29 S7 Source Output 7 31 VPWR Battery Input 32 DO Serial Data Output Digital ground. Logic supply for SPI interface. With VDD low the device will be in sleep mode. Output eight MOSFET source pins. Output two MOSFET drain pin. Output one MOSFET source pin. Output six MOSFET source pin. SPI control clock input pin. PWM direct control input pin for output 5. IN5 is “OR” with SPI bit. Output five MOSFET source pin. Output three MOSFET source pin. Output four MOSFET drain pin. Output seven MOSFET source pin. Power supply pin to the 33879. VPWR has internal reverse battery protection. SPI control data output pin from the 33879 to the MCU. DO=0 no fault, DO=1 specific output has fault. MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com 33879 3 Freescale Semiconductor, Inc. MAXIMUM RATINGS All voltages are with respect to ground unless otherwise noted. Rating Symbol Value Unit VDD -0.3 to 7.0 VDC – -0.3 to 7.0 VDC VPWR Supply Voltage (Note 1) VPWR -16 to 40 VDC Output Clamp Energy (Note 2) ECLAMP 50 mJ Human Body Model (Note 3) VESD1 ±2000 Machine Model (Note 4) VESD2 ±200 TSTG -55 to 150 °C Operating Case Temperature TC -40 to 125 °C Operating Junction Temperature TJ -40 to 150 °C Maximum Junction Temperature TJ -40 to 150 °C Power Dissipation (Note 5) PD 1.7 W Junction-to-Ambient RθJA 71 Between the Die and the Exposed Die Pad RθJC 1.2 VDD Supply Voltage (Note 1) CS, DI, DO, SCLK, IN5, IN6, and EN (Note 1) Freescale Semiconductor, Inc... ESD Voltage V Storage Temperature °C/W Thermal Resistance Notes 1. Exceeding these limits may cause malfunction or permanent damage to the device. 2. Maximum output clamp energy capability at 150°C junction temperature using single non-repetitive pulse method with I = 350 mA. 3. ESD1 testing is performed in accordance with the Human Body Model (CZAP = 100 pF, RZAP = 1500 Ω). 4. ESD2 testing is performed in accordance with the Machine Model (CZAP = 200 pF, RZAP = 0 Ω). 5. Maximum power dissipation at TA = 25°C with no heatsink used. 33879 4 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. STATIC ELECTRICAL CHARACTERISTICS Characteristics noted under conditions of 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40°C ≤ TC ≤ 125°C unless otherwise noted. Where applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25°C. Characteristic Symbol Min Typ Max Unit POWER INPUT Supply Voltage Range VPWR(fo) Fully Operational Supply Current IPWR(on) Sleep State Supply Current IPWR(ss) VDD or EN ≤ 0.8 V, VPWR = 13 V Sleep State Supply Current 5.5 – 26.5 – 14 24 mA µA – 2.0 5.0 – 2.0 5.0 µA IVDD(ss) EN ≤ 0.8 V, VDD = 5.5 V Freescale Semiconductor, Inc... V VPWR Overvoltage Shutdown Threshold Voltage VPWR(OV) 27 28.5 32 V VPWR Overvoltage Shutdown Hysteresis Voltage VPWR(OV-hys) 0.2 1.5 2.5 V VPWR Undervoltage Shutdown Threshold Voltage VPWR(UV) 3.0 4.0 5.0 V VPWR Undervoltage Shutdown Hysteresis Voltage VPWR(UV-hys) 300 500 700 mV Logic Supply Voltage VDD 3.1 – 5.5 V Logic Supply Current IDD 250 400 700 µA Logic Supply Sleep State Threshold Voltage VDD(SS) 0.8 2.5 3.0 V Logic Supply Sleep State Hysteresis (Note 6) VDD(SS-hys) 0.3 – 1.5 V Notes 6. This parameter is guaranteed by design but is not production tested. MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com 33879 5 Freescale Semiconductor, Inc. STATIC ELECTRICAL CHARACTERISTICS (continued) Characteristics noted under conditions of 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40°C ≤ TC ≤ 125°C unless otherwise noted. Where applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25°C. Characteristic Symbol Min Typ Max – – 1.4 – 1.0 – – – – 0.5 – 1.0 2.5 3.5 4.2 35 55 70 Unit POWER OUTPUT RDS (ON) Drain-to-Source ON Resistance IOUT = 0.350 A, TJ = 125°C, VPWR = 13 V IOUT = 0.350 A, TJ = 25°C, VPWR = 13 V IOUT = 0.350 A, TJ = -40°C, VPWR = 13 V Output Self Limiting Current High-Side and Low-Side Configurations IOUT(LIM) Output Fault Detection Voltage Threshold (Note 7) VOUT(flt-th) Freescale Semiconductor, Inc... Outputs Programmed OFF Output Fault Detection Current @ Threshold, High-Side Configuration Output OFF Open Load Detection Current, High-Side Configuration 20 30 50 65 100 160 40 75 135 40 45 55 µA µA IOCO VDrain = 16 V, VSource = 0 V, Outputs Programmed OFF Output Clamp Voltage Low-Side Drive µA IOCO VDrain = 16 V, VSource = 0 V, Outputs Programmed OFF Output OFF Open Load Detection Current, Low-Side Configuration µA IOUT(flt-th) Outputs Programmed OFF V VOC(LSD) ID = 10 mA V VOC(HSD) Output Clamp Voltage High-Side Drive -15 IS = -10 mA Output Leakage Current High-Side and Low-Side Configurations – 5 µA IOUT(LKG) VDD = 5.0 V, VDrain = 16 V, VSource = 0 V, Open Load Detection Current Disabled Overtemperature Shutdown Hysteresis (Note 8) 7.0 µA – Overtemperature Shutdown (Note 8) – IOUT(LKG) VDD = 5.0 V, VDrain = 16 V, VSource = 0 V, Open Load Detection Current Disabled Output Leakage Current High-Side Configuration -25 µA – Output Leakage Current Low-Side Configuration -20 IOUT(LKG) VDD = 0 V, VDrain = 16 V, VSource = 0 V A V IOUT(flt-th) Outputs Programmed OFF Output Fault Detection Current @ Threshold, Low-Side Configuration Ω – – 20 TLIM 155 – 185 °C TLIM(hys) 5.0 10 15 °C Notes 7. Output fault detection thresholds with outputs programmed OFF. Output fault detect thresholds are the same for output open and shorts. 8. This parameter is guaranteed by design but is not production tested. 33879 6 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. STATIC ELECTRICAL CHARACTERISTICS (continued) Characteristics noted under conditions of 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40°C ≤ TC ≤ 125°C, unless otherwise noted. Typical values, where applicable, reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25°C Characteristic Symbol Min Typ Max Unit Input Logic High-Voltage Thresholds (Note 9) VIH 0.7 x VDD – VDD + 0.3 V Input Logic Low-Voltage Thresholds (Note 9) VIL GND - 0.3 – 0.2 x VDD V -10 – 10 30 45 100 DIGITAL INTERFACE µA I IN5, I IN6, I EN IN5, IN6, EN Input Logic Current IN5, IN6, EN = 0 V µA I IN5, I IN6, IN5, IN6 Pull-Down Current Freescale Semiconductor, Inc... 0.8 V to 5.0 V EN Pull-Down Current µA I EN EN = 5.0 V 30 45 100 -10 – 10 -10 – 10 -30 – -100 µA I SCK, I DI, I TriDO SCLK, DI Input, Tri-State DO Output 0 V to 5.0 V CS Input Current µA ICS CS = VDD CS Pull-Up Current µA ICS CS = 0 V µA ICS(LKG) CS Leakage Current to VDD – – 10 VDD - 0.4 – VDD – – 0.4 – – 20 CS = 5.0 V, VDD = 0 V DO High-State Output Voltage V VDOHIGH IDO-HIGH = -1.6 mA V VDOLOW DO Low-State Output Voltage IDO-LOW = 1.6 mA Input Capacitance on SCLK, DI, Tri-State DO, IN5, IN6, EN (Note 10) CIN pF Notes 9. Upper and lower logic threshold voltage levels apply to DI, CS, SCLK, IN5, IN6, and EN. 10. This parameter is guaranteed by design but not production tested. MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com 33879 7 Freescale Semiconductor, Inc. DYNAMIC ELECTRICAL CHARACTERISTICS Characteristics noted under conditions of 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40°C ≤ TC ≤ 125°C unless otherwise noted. Where applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25°C. Characteristic Symbol Min Typ Max 0.1 0.5 1.0 0.1 0.5 1.0 0.1 0.3 1.0 0.1 0.3 1.0 1.0 15 50 1.0 30 100 100 – 300 100 – – 100 – – Units POWER OUTPUT TIMING Output Slew Rate Low-Side Configuration (Note 11) t SR(rise) RLOAD = 620 Ω, CL = 200 pF Output Slew Rate Low-Side Configuration (Note 11) t SR(fall) RLOAD = 620 Ω, CL = 200 pF Freescale Semiconductor, Inc... Output Rise Time High-Side Configuration (Note 11) Output Turn ON Delay Time, High-Side and Low-Side Configuration (Note 12) t DLY(on) Output Turn OFF Delay Time, High-Side and Low-Side Configuration (Note 12) t DLY(off) Output Fault Delay Time (Note 13) t FAULT VDD or EN ≤ 0.2 V V/µs µs µs µs µs tPOR Delay Time Required from Rising Edge of EN and VDD to SPI Active Low-State Duration on VDD or EN for Reset V/µs t SR(fall) RLOAD = 620 Ω, CL = 200 pF Power-ON Reset Delay V/µs t SR(rise) RLOAD = 620 Ω, CL = 200 pF Output Fall Time High-Side Configuration (Note 11) V/µs t RESET µs Notes 11. Output slew rate respectively measured across a 620 Ω resistive load at 10 to 90 percent and 90 to 10 percent voltage points. CL Capacitor is connected from Drain or Source output to Ground. 12. Output turn ON and OFF delay time measured from 50 percent rising edge of CS to the beginning of the 10 and 90 percent transition points. 13. Duration of fault before fault bit is set. Duration between access times must be greater than 300 µs to read faults. 33879 8 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. DYNAMIC ELECTRICAL CHARACTERISTICS (continued) Characteristics noted under conditions of 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40°C ≤ TC ≤ 125°C unless otherwise noted. Where applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25°C. Characteristic Symbol Min Typ Max Units f SPI – 4.0 – MHz Falling Edge of CS to Rising Edge of SCLK (Required Setup Time) t LEAD 100 – – ns Falling Edge of SCLK to Rising Edge of CS (Required Setup Time) t LAG 50 – – ns DI to Falling Edge of SCLK (Required Setup Time) t DI(su) 16 – – ns Falling Edge of SCLK to DI (Required Hold Time) t DI(HOLD) 20 – – ns DI, CS, SCLK Signal Rise Time (Note 15) t r (DI) – 5.0 – ns DI, CS, SCLK Signal Fall Time (Note 15) t f (DI) – 5.0 – ns Time from Falling Edge of CS to DO Low Impedance (Note 16) t DO(EN) – – 55 ns Time from Rising Edge of CS to DO High Impedance (Note 17) t DO(DIS) – – 55 ns t VALID – 25 55 ns DIGITAL INTERFACE TIMING (Note 14) Freescale Semiconductor, Inc... Recommended Frequency of SPI Operation (Note 14) Time from Rising Edge of SCLK to DO Data Valid (Note 18) Notes 14. 15. 16. 17. 18. This parameter is guaranteed by design. Production test equipment uses 4.16 MHz, 5.5V/3.1V SPI interface. Rise and Fall time of incoming DI, CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing. Time required for output status data to be available for use at DO pin. Time required for output status data to be terminated at DO pin Time required to obtain valid data out from DO following the rise of SCLK. MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com 33879 9 Freescale Semiconductor, Inc. Timing Diagrams CS 0.2 VDD tlead tlag 0.7 VDD SCLK 0.2 VDD tDI(su) 0.7 VDD 0.2 VDD Freescale Semiconductor, Inc... DI tDI(hold) MSB in tDO(en) 0.7 VDD 0.2 VDD DO tDO(dis) tvalid MSB out LSB out Figure 2. SPI Timing Diagram tr(DI) VDD = 5.0 V 0.7 VDD SCLK SCLK 33879 Under Test tf(DI) < 50 ns < 50 ns 3.3/5.0 V 50% 0.2 VDD 0V DO 0.7 VDD CL = 200 pF 0.2 VDD DO tr(DO) (Low-to-High) DO NOTE: CL represents the total capacitance of the test fixture and probe. <50 ns 90% 3.3/5.0 V 0.7 VDD 10% 0V tDO(en) tDO(dis) VTri-State 90% 10% tDO(en) tDO(dis) 90% DO VOL tr(CS) <50 ns DO (Tri-State to Low) VOH Figure 4. Valid Data Delay Time and Valid Time Waveforms tf(CS) 0.2 VDD tvalid 0.2 VDD Figure 3. Valid Data Delay Time and Valid Time Test Circuit CS VOL 0.7 VDD (High-to-Low) VOH 10% VOL VOH VTri-State (Tri-State to High) Figure 5. Enable and Disable Time Waveforms 33879 10 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. 1.4 VPWR @ 18 V 19 VPWR @ 13 V High Side Drive 1.2 18 1.0 RDS(ON) (Ω) IPWR Current into VPWR Pin (mA) 20 17 16 15 0.8 0.6 0.4 14 -40 -25 0 25 50 75 100 125 -40 -25 TA, Ambient Temperature (°C) 1.4 VPWR @ 13 V 50 75 100 125 TA = 25°C High Side Drive 1.2 5 10 4 8 3 6 2 4 1 2 1.0 RDS(ON) (Ω) IPWR IPWRCurrent Currentinto intoVV Pin(uA) (µA) PWR PWRPin 25 Figure 9. RDS(ON) vs. Temperature at 350 mA Sleep State IPWR versus Temperature 7 14 6 12 0 TA, Ambient Temperature (°C) Figure 6. IPWR vs. Temperature 0.8 0.6 0.4 0.2 -40 -25 -40 -25 0 0 25 50 75 100 25 50 75 100 TA, Ambient Temperature (°C) TA Ambient Temperature 125 125 0 5 10 15 20 25 VPWR (V) Figure 7. Sleep State IPWR vs. Temperature Figure 10. RDS(ON) vs. VPWR at 350 mA 140 IPWR Current into VPWR Pin (µA) Freescale Semiconductor, Inc... Typical Electrical Characteristics TA = 25°C 120 100 80 60 40 20 0 5 10 15 20 25 VPWR Figure 8. Sleep State IPWR vs. VPWR MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com 33879 11 Freescale Semiconductor, Inc. Freescale Semiconductor, Inc... IOCO, Open Load (µA) 140 120 VPWR @ 16 V 100 80 60 40 20 -40 -25 0 25 50 75 100 125 TA, Ambient Temperature (°C) Figure 11. Open Load Detection Current at Threshold 33879 12 VOUT(flt-th), Open Load Threshold (V) Typical Electrical Characteristics (continued) 5.0 TA = 25°C Open Load Detect Enabled 4.5 4.0 3.5 3.0 2.5 2.0 0 5 10 15 20 25 TA, Ambient Temperature (°C) Figure 12. Open Load Detection Threshold vs. Temperature MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. SYSTEM/APPLICATION INFORMATION FUNCTIONAL PIN DESCRIPTION CS Pin Freescale Semiconductor, Inc... The system MCU selects the 33879 with which to communicate through the use of the chip select CS pin. Logic low on CS enables the data output (DO) driver and allows data to be transferred from the MCU to the 33879 and vice versa. Data clocked into the 33879 is acted upon on the rising edge of CS. follows a first-in, first-out protocol with both input and output words transferring the most significant bit (MSB) first. EN Pin To avoid any spurious data, it is essential the high-to-low transition of the CS signal occur only when SPI clock (SCLK) is in a logic low state. The EN pin on the 33879 enables the device. With the EN pin high, output drivers may be activated and open/short fault detection performed and reported. With the EN pin low, all outputs become inactive, Open Load Detection Current is disabled, and the device enters sleep mode. The 33879 will perform Power-ON Reset on rising edge of the enable signal. SCLK Pin IN5 and IN6 Pins The SCLK pin clocks the internal shift registers of the 33879. The serial data input (DI) pin is latched into the input shift register on the falling edge of the SCLK. The serial data output (DO) pin shifts data out of the shift register on the rising edge of the SCLK signal. False clocking of the shift register must be avoided to ensure validity of data. It is essential that the SCLK pin be in a logic low state when the CS pin makes any transition. For this reason, it is recommended the SCLK pin is commanded to a logic low state when the device is not accessed (CS in logic high state). With CS in a logic high state, signals present on SCLK and DI are ignored and the DO output is tri-state. The IN5 and IN6 command inputs allow outputs five and six to be used in PWM applications. The IN5 and IN6 pins are OR-ed with the Serial Peripheral Interface (SPI) command input bits. For SPI control of outputs five and six, the IN5 and IN6 pins should be grounded or held low by the microprocessor. When using IN5 or IN6 to PWM the output, the control SPI bit must be logic [0]. Maximum PWM frequency for each output is 2.0 kHz. DI Pin The DI pin is used for serial instruction data input. DI information is latched into the input register on the falling edge of SCLK. A logic high state present on DI will program a specific output on. The specific output will turn on with the rising edge of the CS signal. Conversely, a logic low state present on the DI pin will program the output off. The specific output will turn off with the rising edge of the CS signal. To program the eight outputs and Open Load Detection Current on or off, send the DI data beginning with the Open Load Detection Current bits, followed by output eight, output seven, and so on to output one. For each falling edge of the SCLK while CS is logic low, a data bit instruction (on or off) is loaded into the shift register per the data bit DI state. Sixteen bits of entered information is required to fill the input shift register. DO Pin The DO pin is the output from the shift register. The DO pin remains tri-state until the CS pin is in a logic low state. All faults on the 33879 device are reported as logic [1] through the DO data pin. Regardless of the configuration of the driver, open loads and shorted loads are reported as logic [1]. Conversely, normal operating outputs with non-faulted loads are reported as logic [0]. Outputs programmed with Open Load Detection Current disabled will report logic [0] in the off state. The first eight positive transitions of SCLK will report logic [0] followed by the status of the eight output drivers. The DI/DO shifting of data MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA VDD Pin The VDD input pin is used to determine logic levels on the microprocessor interface (SPI) pins. Current from VDD is used to drive DO output and the pull-up current for CS. VDD must be applied for normal mode operation. The 33879 device will perform Power-ON Reset with the application of VDD. VPWR Pin The VPWR pin is battery input and Power-ON Reset to the 33879 IC. The VPWR pin has internal reverse battery protection. All internal logic current is provided from the VPWR pin. The 33879 will perform Power-ON Reset with the application of VPWR. D1–D8 Pins The D1 to D8 pins are the open-drain outputs of the 33879. For high-side drive configurations, the drain pins are connected to battery supply. In low-side drive configurations, the drain pins are connected to the low side of the load. All outputs may be configured individually as desired. When configured as low-side drive, the 33879 limits the positive inductive transient to 45 V. S1–S8 Pins The S1 to S8 pins are the source outputs of the 33879. For high-side drive configurations, the source pins are connected directly to the load. In low-side drive configurations, the source is connected to ground. All outputs may be configured individually as desired. When high-side drive is used, the 33879 will limit the negative inductive transient to negative 20 V. For More Information On This Product, Go to: www.freescale.com 33879 13 Freescale Semiconductor, Inc. MCU INTERFACE DESCRIPTION Introduction The 33879 is an 8-output hardware-configurable power switch with 16-bit serial control. A simplified block diagram of the 33879 is shown in Figure 1 on page 2. Freescale Semiconductor, Inc... The 33879 device uses high-efficiency up-drain power DMOS output transistors exhibiting low drain-to-source ON resistance (RDS(ON) = 1.0 Ω at 25°C typical) and dense CMOS control logic. All outputs have independent voltage clamps to provide fast inductive turn-off and transient protection. In operation, the 33879 functions as an 8-output serial switch serving as a MCU bus expander and buffer with fault management and fault reporting features. In doing so, the device directly relieves the MCU of the fault management functions. This device directly interfaces to an MCU using a SPI for control and diagnostic readout. Figure 13 illustrates the basic SPI configuration between an MCU and one 33879. Figure 14 illustrates the daisy chain configuration using the 33879. Data from the MCU is clocked daisy chain through each device while the CS bit is commanded low by the MCU. During each clock cycle, output status from the daisy chain is transferred to the MCU via the Master In Slave Out (MISO) line. On rising edge of CS, command data stored in the input register is then transferred to the output driver. SCLK Parallel Port 33879 CS MC68HCxx MISO Microcontroller DO with SPI Interface DI 8 Outputs MC68HCxx Microcontroller 33879 Shift Register Shift Register MISO DO 16 Bits SCLK CS SCLK DO DI DO DI 8 Outputs MOSI 16 Bits Multiple 33879 devices can be controlled in a parallel input fashion using the SPI. Figure 15 illustrates the control of 24 loads using three dedicated parallel MCU ports for chip select. 33879 SCLK Receive Buffer Parallel Ports 8 Outputs Figure 14. 33879 SPI System Daisy Chain DI MOSI 33879 33879 CS MOSI To Logic SCLK MISO CS Figure 13. SPI Interface with Microcontroller All inputs are compatible with 5.0 V and 3.3 V CMOS logic levels and incorporate positive logic. When a SPI bit is programmed to a logic [0], the corresponding output will be OFF. Conversely, when a SPI bit is programmed to logic [1] the output being controlled will be ON. Diagnostics are treated in a similar manner. Outputs with a fault will feed back (via DO) a logic [1] to the microcontroller, while normal operating outputs will provide a logic [0]. MC68HCxx Microcontroller with SPI Interface DI SCLK DO 8 Outputs CS 33879 DI SCLK DO CS 8 Outputs 33879 Parallel Ports A DI B SCLK C DO 8 Outputs CS Figure 15. Parallel Input SPI Control 33879 14 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. SPI DEFINITION On each SPI communication, a 16-bit command word is sent to the 33879 and a 16-bit status word is received from the 33879. The MSB is sent and received first. As Table 1 shows, the Command Register defines the position and operation the 33879 will perform on rising edge of CS. The Fault Register, shown in Table 2, defines the previous state status of the output driver. Table 3 identifies the type of fault and the method by which the fault is communicated to the microprocessor. Table 1. Command Register Definition Freescale Semiconductor, Inc... MSB LSB Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 ON/OFF Open Load Detect 8 ON/OFF Open Load Detect 7 ON/OFF Open Load Detect 6 ON/OFF Open Load Detect 5 ON/OFF Open Load Detect 4 ON/OFF Open Load Detect 3 ON/OFF Open Load Detect 2 ON/OFF Open Load Detect 1 ON/OFF OUT 8 ON/OFF OUT 7 ON/OFF OUT 6 ON/OFF OUT 5 ON/OFF OUT 4 ON/OFF OUT 3 ON/OFF OUT 2 ON/OFF OUT 1 0 = Bits 0 to 7, Output commanded OFF. 0 = Bits 8 to 15, Open Load Detection Current OFF. 1 = Bits 0 to 7, Output commanded ON. 1 = Bits 8 to 15 Open Load Detection Current ON. Table 2. Fault Register Definition MSB LSB Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 0 0 0 0 0 0 0 0 OUT 8 Status OUT 7 Status OUT 6 Status OUT 5 Status OUT 4 Status OUT 3 Status OUT 2 Status OUT 1 Status 0 = Bits 0 to 7, No Fault at Output. 1 = Bits 0 to 7, Output Short-to-Battery, Short-to-GND, Open Load, or TLIM. Bits 8 to 15 will always return “0”. Table 3. Fault Operation Serial Output (DO) Pin Reports Overtemperature Fault reported by serial output (DO) pin. Overcurrent DO pin reports short to battery/supply or overcurrent condition. Output ON Open Load Fault Not reported. Output OFF Open Load Fault DO pin reports output OFF open load condition only with Open Load Detection Current enabled. DO pin will report “0” for Output OFF Open Load Fault with Open Load Detection Current disabled. Device Shutdowns Overvoltage Total device shutdown at VPWR = 27 V–30 V. Resumes normal operation with proper voltage. All outputs assuming the previous state upon recovery from overvoltage. Overtemperature Only the output experiencing an overtemperature shuts down. Output assumes previous state upon recovery from overtemperature. MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com 33879 15 Freescale Semiconductor, Inc. DEVICE OPERATION Power Supply SPI Integrity Check The 33879 device has been designed with ultra-low sleep mode currents. The device may enter sleep mode via the EN pin or the VDD pin. In the sleep mode (EN or VDD ≤ 0.8 V), the current consumed by the VPWR pin is less than 5.0 µA. Checking the integrity of the SPI communication with the initial power-up of the VDD and EN pins is recommended. After initial system start-up or reset, the MCU will write one 32-bit pattern to the 33879. The first 16 bits read by the MCU will be 8 logic [0]s followed by the fault status of the outputs. The second 16 bits will be the same bit pattern sent by the MCU. By the MCU receiving the same bit pattern it sent, bus integrity is confirmed. Please note the second 16-bit pattern the MCU sends to the device is the command word and will be transferred to the outputs with rising edge of CS. Freescale Semiconductor, Inc... Placing the 33879 in sleep mode resets the internal registers to the Power-ON Reset state. The reset state is defined as all outputs off and Open Load Detection Current disabled. To place the 33879 in the sleep mode, either command all outputs off and apply logic low to the EN input pin or remove power from the VDD supply pin. Prior to removing VDD from the device, it is recommended that all control inputs from the MCU be low. Paralleling of Outputs Using MOSFETs as an output switch conveniently allows the paralleling of outputs for increased current capability. RDS(ON) of MOSFETs have an inherent positive temperature coefficient that provides balanced current sharing between outputs without destructive operation. This mode of operation may be desirable in the event the application requires lower power dissipation or the added capability of switching higher currents. Performance of parallel operation results in a corresponding decrease in RDS(ON) while the output OFF Open Load Detection Currents and the output current limits increase correspondingly. Paralleling outputs from two or more different IC devices is possible but not recommended. Fault Logic Operation Fault logic of the 33879 device has been greatly simplified over other devices using SPI communications. As command word one is being written into the shift register, a fault status word is being simultaneously written out and received by the MCU. Regardless of the configuration, with no outputs faulted and Open Load Detection Current enabled, all status bits being received by the MCU will be zero. When outputs are faulted (off state open circuit or on state short circuit/overtemperature), the status bits being received by the MCU will be one. The distinction between open circuit fault and short/ overtemperature is completed via the command word. For example, when a zero command bit is sent and a one fault is received in the following word, the fault is open/short-to-battery for high-side drive or open/short-to-ground for low-side drive. In the same manner, when a one command bit is sent and a one fault is received in the following word, the fault is a short-toground/overtemperature for high-side drive or short-to-battery/ overtemperature for low-side drive. The timing between two write words must be greater than 300 µs to allow adequate time to sense and report the proper fault status. 33879 16 Important A SCLK pulse count strategy has been implemented to ensure integrity of SPI communications. SPI messages consisting of 16 SCLK pulses and multiples of 8 clock pulses thereafter will be acknowledged. SPI messages consisting of other than 16 + multiples of 8 SCLK pulses will be ignored by the device. Overtemperature Fault Overtemperature detection and shutdown circuits are specifically incorporated for each individual output. The shutdown following an overtemperature condition is independent of the system clock or any other logic signal. Each independent output shuts down at 155°C to 185°C. When an output shuts down owing to an overtemperature fault, no other outputs are affected. The MCU recognizes the fault by a one in the fault status register. After the 33879 device has cooled below the switch point temperature and 15°C hysteresis, the output will activate unless told otherwise by the MCU via SPI to shut down. Overvoltage Fault An overvoltage condition on the VPWR pin will cause the device to shut down all outputs until the overvoltage condition is removed. When the overvoltage condition is removed, the outputs will resume their previous state. This device does not detect an overvoltage on the VDD pin. The overvoltage threshold on the VPWR pin is specified as 27 V to 30 V, with 1.0 V typical hysteresis. A VPWR overvoltage detection is global, causing all outputs to be turned OFF. Output OFF Open Load Fault An output OFF open load fault is the detection and reporting of an open load when the corresponding output is disabled (input bit programmed to a logic low state). The Output OFF Open Load fault is detected by comparing the drain-to-source voltage of the specific MOSFET output to an internally generated reference. Each output has one dedicated comparator for this purpose. MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. An output OFF open load fault is indicated when the drain-tosource voltage is less than the output threshold voltage (VOUT(flt-th)) of 2.5 V to 4.0 V. Hence, the 33879 will declare the load open in the OFF state when the output drain-to-source voltage is less than VOUT(flt-th). Freescale Semiconductor, Inc... This device has an internal 80 µA current source connected from drain to source of the output MOSFET. The current source may be programmed on or off via SPI. The Power-ON Reset state for the current source is “off” and must be enabled via SPI. To achieve low sleep mode quiescent currents, the Open Load Detection Current source of each driver is switched off when VDD or EN is removed. During output switching, especially with capacitive loads, a false output OFF open load fault may be triggered. To prevent this false fault from being reported, an internal fault filter of 100 µs to 300 µs is incorporated. A false fault reporting is a function of the load impedance, RDS(ON), COUT of the MOSFET, as well as the supply voltage, VPWR. The rising edge of CS triggers the built-in fault delay timer. The timer will time out before the fault comparator is enabled and the fault is detected. Once the condition causing the open load fault is removed, the device will resume normal operation. The open load fault, however, will be latched in the output DO register for the MCU to read. Shorted Load Fault A shorted load (overcurrent) fault can be caused by any output being shorted directly to supply, or an output experiencing a current greater than the current limit. There are two safety circuits progressively in operation during load short conditions that provide system protection: 1. The device’s output current is monitored in an analog fashion using SENSEFET approach and current limited. 2. The device’s output thermal limit is sensed and when attained causes only the specific faulted output to shut down. The output will remain off until cooled. The device will then reassert the output automatically. The cycle will continue until fault is removed or the command bit instructs the output off. Shorted load faults will be reported properly through SPI regardless of Open Load Detection Current enable bits. Undervoltage Shutdown An undervoltage condition on VDD or VPWR will result in the shutdown of all outputs. The VDD undervoltage threshold is between 0.8 V and 3.0 V. VPWR undervoltage threshold is between 3.0 V and 5.0 V. When the supplies fall below their respective thresholds, all outputs are turned OFF. As both supplies returns to normal levels, internal logic is reset and the device resumes normal operation. MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA Output Voltage Clamp Each output of the 33879 incorporates an internal voltage clamp to provide fast turn-off and transient protection of each output. Each clamp independently limits the drain-to-source voltage to 45 V for low-side drive configurations and -20 V for high-side drive configurations. The total energy clamped (E J) can be calculated by multiplying the current area under the current curve (I A) times the clamp voltage (V CL) (see Figure 16). Characterization of the output clamps, using a single pulse non-repetitive method at 0.35 A, indicates the maximum energy per output to be 50 mJ at 150°C junction temperature. Drain-to-Source Clamp Voltage (V CL = 45 V) Drain Voltage Drain Current (I D = 0.3 A) Drain-to-Source ON Voltage (V DS(ON)) GND Clamp Energy (E J = I A x V CL) Current Area (I A) Time Drain-to-Source ON Voltage (V DS(ON)) VS GND BAT Time Current Area (I A) Clamp Energy (E J = I A x V CL) Source Current (I S = 0.3 A) Source Clamp Voltage (V CL = -15 V) Source Voltage Figure 16. Output Voltage Clamping SPI Configurations The SPI configuration on the 33879 device is consistent with other devices in the Octal Serial Switch (OSS) family. This device may be used in serial SPI or parallel SPI with the 33298 and 33291. Different SPI configurations may be provided. For more information, contact Motorola Analog Products Division or local Motorola representative. Reverse Battery The 33879 has been designed with reverse battery protection on the VPWR pin. All outputs consist of a power MOSFET with an integral substrate diode. During the reverse battery condition, current will flow through the load via the substrate diode. Under this circumstance, relays may energize and lamps will turn on. Where load reverse battery protection is desired, a reverse battery blocking diode must be placed in series with the load. For More Information On This Product, Go to: www.freescale.com 33879 17 Freescale Semiconductor, Inc. PACKAGE DIMENSIONS EK (Pb-FREE) SUFFIX DWB SUFFIX 32-LEAD SOIC WIDE BODY EXPOSED PAD PLASTIC PACKAGE CASE 1437-01 ISSUE O 10.3 7.6 7.4 C 5 Freescale Semiconductor, Inc... 1 B 2.65 2.35 9 30X 32 0.65 PIN 1 ID 4 B 9 B 16 11.1 10.9 CL 17 32X 2X 16 TIPS 0.3 SEATING PLANE A 5.15 0.10 A A B C A (0.29) C BASE METAL C A 0.25 0.19 (0.203) 6 0.3 0.38 0.22 PLATING A B C 0.13 5.3 4.7 M C A M B 8 SECTION A-A ROTATED 90 ° CLOCKWISE 6.4 5.7 0.3 A B C NOTES: 1. ALL DIMENSIONS ARE IN MILLIMETERS. 2. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 3. DATUMS B AND C TO BE DETERMINED AT THE PLANE WHERE THE BOTTOM OF THE LEADS EXIT THE PLASTIC BODY. 4. THIS DIMENSION DOES NOT INCLUDE MOLD FLASH, PROTRUSION OR GATE BURRS. MOLD FLASH, PROTRUSION OR GATE BURRS SHALL NOT EXCEED 0.15 mm PER SIDE. THIS DIMENSION IS DETERMINED AT THE PLANE WHERE THE BOTTOM OF THE LEADS EXIT THE PLASTIC BODY. 5. THIS DIMENSION DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSIONS. INTERLEAD FLASH AND PROTRUSIONS SHALL NOT EXCEED 0.25 mm PER SIDE. THIS DIMENSION IS DETERMINED AT THE PLANE WHERE THE BOTTOM OF THE LEADS EXIT THE PLASTIC BODY. 6. THIS DIMENSION DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL NOT CAUSE THE LEAD WIDTH TO EXCEED 0.4 mm PER SIDE. DAMBAR CANNOT BE LOCATED ON THE LOWER RADIUS OR THE FOOT. MINIMUM SPACE BETWEEN PROTRUSION AND ADJACENT LEAD SHALL NOT LESS THAN 0.07 mm. 7. EXACT SHAPE OF EACH CORNER IS OPTIONAL. 8. THESE DIMENSIONS APPLY TO THE FLAT SECTION OF THE LEAD BETWEEN 0.10 mm AND 0.3 mm FROM THE LEAD TIP. 9. THE PACKAGE TOP MAY BE SMALLER THAN THE PACKAGE BOTTOM. THIS DIMENSION IS DETERMINED AT THE OUTERMOST EXTREMES OF THE PLASTIC BODY EXCLUSIVE OF MOLD FLASH, TIE BAR BURRS, GATE BURRS AND INTER-LEAD FLASH, BUT INCLUDING ANY MISMATCH BETWEEN THE TOP AND BOTTOM OF THE PLASTIC BODY. R0.08 MIN 0.25 0° GAUGE PLANE 8° 0° MIN 0.1 0.0 0.9 0.5 SECTION B-B VIEW C-C 33879 18 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com Freescale Semiconductor, Inc. Freescale Semiconductor, Inc... NOTES MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA For More Information On This Product, Go to: www.freescale.com 33879 19 Freescale Semiconductor, Inc... Freescale Semiconductor, Inc. Information in this document is provided solely to enable system and software implementers to use Motorola products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters which may be provided in Motorola data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. Motorola does not convey any license under its patent rights nor the rights of others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury or death may occur. Should Buyer purchase or use Motorola products for any such unintended or unauthorized application, Buyer shall indemnify and hold Motorola and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Motorola was negligent regarding the design or manufacture of the part. MOTOROLA and the Stylized M Logo are registered in the US Patent and Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2004 HOW TO REACH US: USA/EUROPE/LOCATIONS NOT LISTED: Motorola Literature Distribution P.O. Box 5405, Denver, Colorado 80217 1-800-521-6274 or 480-768-2130 JAPAN: Motorola Japan Ltd.; SPS, Technical Information Center 3-20-1 Minami-Azabu. Minato-ku, Tokyo 106-8573, Japan 81-3-3440-3569 ASIA/PACIFIC: Motorola Semiconductors H.K. Ltd.; Silicon Harbour Centre 2 Dai King Street, Tai Po Industrial Estate, Tai Po, N.T., Hong Kong 852-26668334 HOME PAGE: http://motorola.com/semiconductors For More Information On This Product, Go to: www.freescale.com MC33879