STMICROELECTRONICS EMIF02

EMIF02-MIC02F2
®
2 LINES EMI FILTER
INCLUDING ESD PROTECTION
IPAD™
MAIN PRODUCT CHARACTERISTICS:
Where EMI filtering in ESD sensitive equipment is
required:
■ Mobile phones and communication systems
■ Computers, printers and MCU Boards
DESCRIPTION
The EMIF02-MIC02 is a highly integrated devices
designed to suppress EMI/RFI noise in all systems
subjected to electromagnetic interferences. The
EMIF02 flip chip packaging means the package
size is equal to the die size.
This filter includes an ESD protection circuitry
which prevents the device from destruction when
subjected to ESD surges up 15kV.
Flip-Chip
(6 Bumps)
Table 1: Order Code
Part Number
EMIF02-MIC02F2
BENEFITS
■ EMI symmetrical (I/O) low-pass filter
■ High efficiency in EMI filtering
■ Lead free package
■ Very low PCB space consuming:
1.07mm x 1.57mm
■ Very thin package: 0.65 mm
■ High efficiency in ESD suppression
■ High reliability offered by monolithic integration
■ High reducing of parasitic elements through
integration & wafer level packaging.
Figure 1: Pin Configuration (Ball side)
COMPLIES WITH THE FOLLOWING STANDARDS:
IEC61000-4-2
Level 4 on input pins 15kV (air discharge)
8kV (contact discharge)
Level 1 on output pins 2kV
2kV
Marking
FJ
3
2
1
I2
GND
I1
A
O2
GND
O1
B
(air discharge)
(contact discharge)
Figure 2: Basic Cell Configuration
Low-pass Filter
Input
Output
Ri/o = 470Ω
Cline = 16pF
GND
GND
GND
TM: IPAD is a trademark of STMicroelectronics.
October 2004
REV. 1
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EMIF02-MIC02F2
Table 2: Absolute Ratings (limiting values)
Symbol
Tj
Parameter and test conditions
Value
Unit
125
°C
Maximum junction temperature
Top
Operating temperature range
- 40 to + 85
°C
Tstg
Storage temperature range
- 55 to + 150
°C
Table 3: Electrical Characteristics (Tamb = 25°C)
Symbol
Parameter
I
VBR
Breakdown voltage
IRM
Leakage current @ VRM
VRM
Stand-off voltage
VCL
Clamping voltage
Rd
Dynamic impedance
IPP
Peak pulse current
RI/O
Series resistance between Input &
Output
Cline
Input capacitance per line
Symbol
IPP
VCL VBR VRM
IRM
IR
IR = 1 mA
IRM
VRM = 12V per line
Min.
Typ.
14
16
423
RI/O
Cline
VRM VBR VCL
V
IPP
Test conditions
VBR
IR
IRM
470
Max.
Unit
V
500
nA
517
Ω
16
@ 0V
Figure 3: S21 (dB) attenuation measurement
and Aplac simulation
- 10.00
dB
- 15.00
pF
Figure 4: Analog crosstalk measurements
-20.00
dB
--30.00
- 20.00
Measurement
I2/O1
--40.00
- 25.00
- 30.00
--50.00
- 35.00
--60.00
- 40.00
--70.00
- 45.00
Simulation
- 50.00
1.0M
2/7
3.0M
10.0M
30.0M
100.0M
f/Hz
300.0M
1.0G
3.0G
--80.00
1.0M
3.0M
10.0M
30.0M
100.0M
f/Hz
300.0M
1.0G
3.0G
EMIF02-MIC02F2
Figure 5: Digital crosstalk measurement
Figure 6: ESD response to IEC61000-4-2
(+15kV air discharge) on one input V(in) and on
one output (Vout)
Figure 7: ESD response to IEC61000-4-2
(+15kV air discharge) on one input V(in) and on
one output (Vout)
Figure 8: Line capacitance versus applied
voltage
C(pF)
20
F=1MHz
Vosc=30mVRMS
Tj=25°C
18
16
14
12
10
8
6
4
2
VR(V)
0
0
1
2
3
4
5
6
7
8
9
10
11
12
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EMIF02-MIC02F2
Figure 9: Aplac model
I1
Cox
MODEL = D01-int
gnd
O1
R_470R
Cox
50pH
MODEL = D01-ext
Rsubump
Rsubump
50pH
50m
50m
Lgnd
Lgnd
MODEL = D01-gnd
gnd
Rsubump
Rsubump
Cgnd
MODEL = D01-ext
Cox
MODEL = D01-int
Cox
I2
Cgnd
Rgnd
O2
R_470R
Figure 10: Aplac parameters
Model D01-ext
BV = 7
CJO = Cz_ext
IBV = 1u
IKF = 1000
IS = 10f
ISR = 100p
N=1
M = 0.3333
RS = Rs_ext
VJ = 0.6
TT = 50n
Model D01-int
BV = 7
CJO = Cz_int
IBV = 1u
IKF = 1000
IS = 10f
ISR = 100p
N=1
M = 0.3333
RS = Rs_int
VJ = 0.6
TT = 50n
Model D01-gnd
BV = 7
CJO = Cz_gnd
IBV = 1u
IKF = 1000
IS = 10f
ISR = 100p
N=1
M = 0.3333
RS = Rs_gnd
VJ = 0.6
TT = 50n
Ls 400pH
Rs 100m
R_470R 482.6
Cz_ext 8.73pF
Rs_ext 850m
Cz_int 2.9pF
Rs_int 850m
Cz_gnd 215.61pF
Rs_gnd 470m
Rgnd 10m
Lgnd 48pH
Cgnd 0.15pF
Cox 3.05pF
Rsubump 200m
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Rgnd
EMIF02-MIC02F2
Figure 11: Ordering Information Scheme
EMIF
yy
-
xxx zz
Fx
EMI Filter
Number of lines
Information
x = resistance value (Ohms)
z = capacitance value / 10(pF)
or
3 letters = application
2 digits = version
Package
F = Flip-Chip
x = 1: 500µm, Bump = 315µm
= 2: Leadfree Pitch = 500µm, Bump = 315µm
= 3: Leadfree Pitch = 400µm, Bump = 250µm
Figure 12: FLIP-CHIP Package Mechanical Data
315µm ± 50
650µm ± 65
1.57mm ± 50µm
500µm ± 50
500µm ± 50
1.07mm ± 50µm
Figure 13: Foot print recommendations
Solder stencil opening : 330µm
Dot, ST logo
xx = marking
z = packaging
location
yww = datecode
(y = year
ww = week)
365
240
365
Copper pad Diameter :
250µm recommended , 300µm max
Figure 14: Marking
E
220
x x z
y ww
40
Solder mask opening recommendation :
340µm min for 300µm copper pad diameter
All dimensions in µm
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EMIF02-MIC02F2
Figure 15: FLIP-CHIP Tape and Reel Specification
Dot identifying Pin A1 location
1.75 +/- 0.1
Ø 1.5 +/- 0.1
4 +/- 0.1
3.5 +/- 0.1
ST E
xxz
yww
ST E
xxz
yww
ST E
xxz
yww
8 +/- 0.3
0.73 +/- 0.05
4 +/- 0.1
User direction of unreeling
All dimensions in mm
Table 4: Ordering Information
Ordering code
Marking
Package
Weight
Base qty
Delivery mode
EMIF02-MIC02F2
FJ
Flip-Chip
2.3 mg
5000
Tape & reel 7”
Note: More informations are available in the application notes:
AN1235: “Flip-Chip: Package description and recommendations for use”
AN1751: "EMI Filters: Recommendations and measurements"
Table 5: Revision History
6/7
Date
Revision
12-Oct-2004
1
Description of Changes
First issue
EMIF02-MIC02F2
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics.
All other names are the property of their respective owners
© 2004 STMicroelectronics - All rights reserved
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