FAIRCHILD KSC2335Y

KSC2335
KSC2335
High Speed, High Voltage Switching
•
Industrial Use
TO-220
1
NPN Epitaxial Silicon Transistor
1.Base
2.Collector
3.Emitter
Absolute Maximum Ratings TC=25°C unless otherwise noted
Symbol
VCBO
Collector-Base Voltage
Parameter
Value
500
Units
V
V CEO
Collector-Emitter Voltage
VEBO
Emitter-Base Voltage
400
V
7
IC
Collector Current (DC)
7
V
A
ICP
*Collector Current (Pulse)
15
A
IB
Base Current (DC)
3.5
A
PC
Collector Dissipation (Ta=25°C)
1.5
W
PC
Collector Dissipation (TC=25°C)
40
W
TJ
Junction Temperature
150
°C
TSTG
Storage Temperature
- 55 ~ 150
°C
* PW≤300µs, Duty Cycle≤10%
Electrical Characteristics TC=25°C unless otherwise noted
Symbol
VCEO(sus)
Parameter
Collector-Emitter Sustaining Voltage
Test Condition
IC = 3A, IB1 = 0.6A, L = 1mH
Min.
400
VCEX(sus)1
Collector-Emitter Sustaining Voltage
IC = 3A, IB1 = -IB2 = 0.6A
VBE(off) = -5V, L = 180µH, Clamped
450
V
VCEX(sus)2
Collector-Emitter Sustaining Voltage
IC = 6A,IB1= 2A, IB2 = -0.6A
VBE(off) = -5V, L = 180µH, Clamped
400
V
ICBO
Collector Cut-off Current
VCB = 400V, IE = 0
ICER
Collector Cut-off Current
VCE = 400V, RBE= 51Ω @ TC=125°C
ICEX1
Collector Cut-off Current
VCE = 400V, VBE(off)= -1.5V
ICEX2
Collector Cut-off Current
VCE = 400V, VBE(off)= -1.5V @
TC=125°C
Max.
Units
V
10
µA
1
mA
10
µA
1
mA
10
µA
IEBO
Emitter Cut-off Current
VEB = 5V, IC = 0
hFE1
hFE2
hFE3
* DC Current Gain
VCE = 5V, IC = 0.1A
VCE = 5V, IC = 1A
VCE = 5V, IC = 3A
VCE(sat)
* Collector-Emitter Saturation Voltage
IC = 3A, IB = 0.6A
1
V
VBE(sat)
* Base-Emitter Saturation Voltage
IC = 3A, IB = 0.6A
1.2
V
VCC =150V, IC= 3A
IB1 = -IB2 = 0.6A
RL= 50Ω
1
µs
2.5
µs
1
µs
tON
Turn ON Time
tSTG
Storage Time
tF
Fall Time
20
20
10
80
80
* Pulse Test: PW≤350µs, Duty Cycle≤2% Pulsed
hFE Classification
Classification
R
O
Y
hFE2
20 ~ 40
30 ~ 60
40 ~ 80
©2001 Fairchild Semiconductor Corporation
Rev. A1, June 2001
KSC2335
Typical Characteristics
IB=0.45A
5
VCE = 5 V
Pulsed
IB=0.30A
4
IB=0.25A
IB=0.20A
3
IB=0.15A
IB=0.10A
2
IB=0.05A
1
hFE, DC CURRENT GAIN
IC[A], COLLECTOR CURRENT
1000
IB=0.40A
IB=0.35A
IB=0.50A
100
10
1
0.01
0
0
1
2
3
4
5
VCE[V], COLLECTOR-EMITTER VOLTAGE
Figure 1. Static Characteristic
VCE(SAT) [V], VBE(SAT) [V], SATURATION VOLTAGE
0.1
1
10
Ic[A], COLLECTOR CURRENT
Figure 2. DC current Gain
160
10
IC = 5 IB
Pulsed
140
dT [%], IC DERATING
120
VBE(SAT)
1
0.1
100
80
S/b Limited
60
40
Dissipation Limited
VCE(SAT)
20
0
0.01
0.01
0.1
1
0
10
50
100
150
200
o
TC [ C], CASE TEMPERATURE
VCB[V], COLLECTOR-BASE VOLTAGE
Figure 3. Base-Emitter Saturation Voltage
Collector-Emitter Saturation Voltage
Figure 4. Derating Curve of Safe Operating Areas
10
100
Single Pulse
IC [A], COLLECTOR CURRENT
8
6
VCEO(SUS)
4
2
VCEX(SUS)
IC [A], COLLECTOR CURRENT
PW = 10 us
0
0
100
200
300
400
VCE [V], COLLECTOR-EMITTER VOLTAGE
Figure 5. Reverse Bias Safe Operating Area
©2001 Fairchild Semiconductor Corporation
500
10
50 us
Dissipation Limoted
1
0.1 ms
0.3 ms
S/b Limited
0.1
1 ms
100 ms
10 ms
0.01
1E-3
1
10
100
1000
10000
VCE [V], COLLECTOR-EMITTER VOLTAGE
Figure 6. Forward Bias Safe Operating Area
Rev. A1, June 2001
KSC2335
Package Demensions
TO-220
4.50 ±0.20
2.80 ±0.10
(3.00)
+0.10
1.30 –0.05
18.95MAX.
(3.70)
ø3.60 ±0.10
15.90 ±0.20
1.30 ±0.10
(8.70)
(1.46)
9.20 ±0.20
(1.70)
9.90 ±0.20
1.52 ±0.10
0.80 ±0.10
2.54TYP
[2.54 ±0.20]
10.08 ±0.30
(1.00)
13.08 ±0.20
)
(45°
1.27 ±0.10
+0.10
0.50 –0.05
2.40 ±0.20
2.54TYP
[2.54 ±0.20]
10.00 ±0.20
Dimensions in Millimeters
©2001 Fairchild Semiconductor Corporation
Rev. A1, June 2001
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intended to be an exhaustive list of all such trademarks.
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QFET™
QS™
QT Optoelectronics™
Quiet Series™
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Stealth™
SuperSOT™-3
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PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
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LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
2. A critical component is any component of a life support
1. Life support devices or systems are devices or systems
device or system whose failure to perform can be
which, (a) are intended for surgical implant into the body,
reasonably expected to cause the failure of the life support
or (b) support or sustain life, or (c) whose failure to perform
device or system, or to affect its safety or effectiveness.
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
©2001 Fairchild Semiconductor Corporation
Rev. H3