FAIRCHILD FODM8071R2

FODM8071
3.3V/5V Logic Gate Output Optocoupler with
High Noise Immunity
Features
Description
■ High noise immunity characterized by common mode
The FODM8071 is a 3.3V/5V high-speed logic gate
output Optocoupler, which supports isolated communications allowing digital signals to communicate between
systems without conducting ground loops or hazardous
voltages. It utilizes Fairchild’s patented coplanar packaging technology, Optoplanar®, and optimized IC design to
achieve high noise immunity, characterized by high common mode rejection specifications.
rejection
– 20kV/µs minimum common mode rejection
■ High speed
– 20Mbit/sec date rate (NRZ)
– 55ns max. propagation delay
– 20ns max. pulse width distortion
– 30ns max. propagation delay skew
3.3V
and 5V CMOS compatibility
■
■ Specifications guaranteed over 3V to 5.5V supply
voltage and -40°C to +110°C temperature range
■ Safety and regulatory approvals
– UL1577, 3750 VACRMS for 1 min.
– IEC60747-5-2 (pending)
Applications
This high-speed logic gate output optocoupler, housed in
a compact 5-Pin Mini-Flat package, consists of a highspeed AlGaAs LED at the input coupled to a CMOS
detector IC at the output. The detector IC comprises an
integrated photodiode, a high-speed transimpedance
amplifier and a voltage comparator with an output driver.
The CMOS technology coupled with a high efficiency
LED achieves low power consumption as well as very
high speed (55ns propagation delay, 20ns pulse width
distortion).
■ Microprocessor system interface
■
■
■
■
– SPI, I2C
Industrial fieldbus communications
– DeviceNet, CAN, RS485
Programmable logic control
Isolated data acquisition system
Voltage level translator
Related Resources
■ www.fairchildsemi.com/products/opto/
■ www.fairchildsemi.com/pf/FO/FOD8001.html
■ www.fairchildsemi.com/pf/FO/FOD0721.html
Functional Schematic
Truth Table
ANODE 1
6 VDD
5 VO
CATHODE 3
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
LED
Output
Off
High
On
Low
4 GND
www.fairchildsemi.com
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
December 2009
Number
Name
1
ANODE
3
CATHODE
4
GND
Function Description
Anode
Cathode
Output Ground
5
VO
Output Voltage
6
VDD
Output Supply Voltage
Safety and Insulation Ratings for Mini-Flat Package (SO5 Pin)
As per IEC60747-5-2 (Pending Certification). This optocoupler is suitable for “safe electrical insulation” only within the
safety limit data. Compliance with the safety ratings shall be ensured by means of protective circuits.
Symbol
Parameter
Min.
Typ.
Max.
Unit
Installation Classifications per DIN VDE 0110/1.89 Table 1
For rated main voltage < 150Vrms
I-IV
For rated main voltage < 300Vrms
I-III
Climatic Classification
40/110/21
Pollution Degree (DIN VDE 0110/1.89)
2
CTI
Comparative Tracking Index
175
VPR
Input to Output Test Voltage, Method b,
VIORM x 1.875 = VPR, 100% Production Test with
tm = 1 sec, Partial Discharge < 5 pC
1060
V
VPR
Input to Output Test Voltage, Method a,
VIORM x 1.5 = VPR, Type and Sample Test with
tm = 60 sec, Partial Discharge < 5 pC
848
V
VIORM
Max Working Insulation Voltage
565
Vpeak
VIOTM
Highest Allowable Over Voltage
4000
Vpeak
External Creepage
5.0
mm
External Clearance
5.0
mm
Insulation Thickness
0.5
mm
Safety Limit Values, Maximum Values allowed in the event
of a failure, Case Temperature
150
°C
Insulation Resistance at TSTG,VIO = 500V
109
Ω
TCase
RIO
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
2
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Pin Definitions
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only. .
Symbol
Parameter
Value
Units
TSTG
Storage Temperature
-40 to +125
ºC
TOPR
Operating Temperature
-40 to +110
ºC
Junction Temperature
-40 to +125
ºC
260 for 10sec
ºC
TJ
TSOL
Lead Solder Temperature (Refer to Reflow
Temperature Profile)
IF
Forward Current
20
mA
VR
Reverse Voltage
5
V
VDD
Supply Voltage
0 to 6.0
V
VO
Output Voltage
-0.5 to VDD+0.5
V
IO
Average Output Current
10
mA
40
mW
70
mW
PDI
PDO
Input Power
Dissipation(1)(3)
Output Power
Dissipation(2)(3)
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Min.
Max.
Unit
Ambient Operating Temperature
-40
+110
ºC
VDD
Supply Voltages(4)
3.0
5.5
V
VFL
Logic Low Input Voltage
0
0.8
V
IFH
Logic High Input Current
5
16
mA
IOL
Logic Low Output Current
0
7
mA
TA
Parameter
Isolation Characteristics
(Apply over all recommended conditions, typical value is measured at TA = 25ºC)
Symbol
Parameter
Conditions
VISO
Input-Output Isolation Voltage freq = 60Hz, t = 1.0min,
II-O ≤ 10µA(5)(6)
RISO
Isolation Resistance
CISO
Isolation Capacitance
VI-O = 500V(5)
VI-O = 0V, freq =
1.0MHz(5)
Min.
Typ.
Max.
Units
3750
VacRMS
1011
Ω
0.2
pF
Notes:
1. Derate linearly from 95˚C at a rate of -1.4mW/˚C
2. Derate linearly from 100˚C at a rate of -3.47mW/˚C.
3. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected
to conditions outside these ratings.
4. 0.1µF bypass capacitor must be connected between 4 and 6.
5. Device is considered a two terminal device: Pins 1, and 3 are shorted together and Pins 4, 5, and 6 are shorted
together.
6. 3,750 VACRMS for 1 minute duration is equivalent to 4,500 VACRMS for 1 second duration.
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
3
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Absolute Maximum Ratings (TA = 25ºC unless otherwise specified)
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Units
1.05
1.35
1.8
V
5
15
INPUT CHARACTERISTICS
VF
Forward Voltage
IF = 10mA, Fig. 1
BVR
Input Reverse Breakdown
Voltage
IR = 10µA
IFHL
Threshold Input Current
Fig. 2
2.8
5
mA
VDD = 3.3V, IF = 10mA, Fig. 3, 5
3.3
4.8
mA
VDD = 5.0V, IF = 10mA, Fig. 3, 6
4.0
5.0
mA
V
OUTPUT CHARACTERISTICS
IDDL
IDDH
VOH
VOL
Logic Low Output Supply
Current
Logic High Output Supply
Current
VDD = 3.3V, IF = 0mA, Fig. 4
3.3
4.8
mA
VDD = 5.0V, IF = 0mA, Fig. 4
4.0
5.0
mA
Logic High Output Voltage
VDD = 3.3V, IO = -20µA, IF = 0mA
VDD – 0.1V
3.3
V
VDD = 3.3V, IO = -4mA, IF = 0mA
VDD – 0.5V
3.1
V
VDD = 5.0V, IO = -20µA, IF = 0mA
VDD – 0.1V
5.0
V
VDD = 5.0V, IO = -4mA, IF = 0mA
VDD – 0.5V
Logic Low Output Voltage
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
4.9
V
IO = 20µA, IF = 10mA
0.0027
0.01
V
IO = 4mA, IF = 10mA
0.27
0.8
V
www.fairchildsemi.com
4
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Electrical Characteristics (Apply over all recommended conditions)
(TA = -40ºC to +110ºC, 3.0V ≤ VDD ≤ 5.5V), unless otherwise specified.
Typical value is measured at TA = 25ºC and VDD = 3.3V.
(TA = -40ºC to +110ºC, 3.0V ≤ VDD ≤ 5.5V, IF = 5mA), unless otherwise specified.
Typical value is measured at TA = 25ºC and VDD = 3.3V
Symbol
Parameter
Test Conditions
Min.
Typ.
Date Rate(7)
Max.
Units
20
Mbps
tPW
Pulse Width
tPHL
Propagation Delay Time
to Logic Low Output
CL = 15pF, Fig. 7, 8, 12
50
31
55
ns
ns
tPLH
Propagation Delay Time
to Logic High Output
CL = 15pF, Fig. 7, 8, 12
25
55
ns
PWD
Pulse Width Distortion,
| tPHL - tPLH|
CL = 15pF, Fig. 9, 10
5.5
20
ns
tPSK
Propagation Delay Skew
CL = 15pF(8)
30
ns
tR
Output Rise Time
(10% to 90%)
Fig. 11, 12
5.8
ns
tF
Output Fall Time
(90% to 10%)
Fig. 11, 12
5.3
ns
| CMH |
Common Mode Transient
Immunity at Output High
IF = 0mA, VO > 0.8VDD,
VCM = 1000V, TA = 25ºC,
Fig. 13(9)
20
40
kV/µs
| CML |
Common Mode Transient
Immunity at Output Low
IF = 5mA, VO < 0.8V,
VCM = 1000V, TA = 25ºC,
Fig. 13(9)
20
40
kV/µs
CPDO
Output Dynamic Power
Dissipation
Capacitance(10)
4
pF
Notes:
7. Data rate is based on 10MHz, 50% NRZ pattern with a 50nsec minimum bit time.
8. tPSK is equal to the magnitude of the worst case difference in tPHL and/or tPLH that will be seen between any two units
from the same manufacturing date code that are operated at same case temperature (±5°C), at same operating
conditions, with equal loads (RL = 350Ω and CL = 15pF), and with an input rise time less than 5ns.
9. Common mode transient immunity at output high is the maximum tolerable positive dVcm/dt on the leading edge of
the common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient immunity
at output low is the maximum tolerable negative dVcm/dt on the trailing edge of the common pulse signal, Vcm,
to assure that the output will remain low.
10.Unloaded dynamic power dissipation is calculated as follows: CPD x VDD x f + IDD + VPD where f is switched
time in MHz.
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
5
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Switching Characteristics (Apply over all recommended conditions)
Fig. 2 Input Threshold Current vs. Ambient Temperature
Fig. 1 Input Forward Current vs. Forward Voltage
4.0
IFHL – INPUT THRESHOLD CURRENT (mA)
IF – INPUT FORWARD CURRENT (mA)
100
10
1
0.1
TA = 110°C
0.01
0.8
0.9
TA = 25°C
TA = -40°C
1.0
1.1
1.2
1.3
1.4
VF – FORWARD VOLTAGE (V)
1.5
3.5
VDD = 5.0V
3.0
VDD = 3.3V
2.5
2.0
-40
1.6
IDDH – LOGIC HIGH OUTPUT SUPPLY CURRENT (mA)
IDDL – LOGIC LOW OUTPUT SUPPLY CURRENT (mA)
IF = 10mA
4.5
V DD = 5.0V
4.0
VDD = 3.3V
3.5
3.0
2.5
2.0
0
20
40
60
80
TA – AMBIENT TEMPERATURE (°C)
100
IDDL – DYNAMIC LOGIC LOW OUTPUT
SUPPLY CURRENT (mA)
IDDL – DYNAMIC LOGIC LOW OUTPUT
SUPPLY CURRENT (mA)
80
100
IF = 0mA
4.5
V DD = 5.0V
4.0
V
3.5
DD
= 3.3V
3.0
2.5
2.0
-40
5.5
4.0
TA = 25°C
3.5
TA = 110°C
60
-20
0
20
40
60
80
TA – AMBIENT TEMPERATURE (°C)
100
Fig. 6 Dynamic Logic Low Output Supply Current
vs. Input Frequency (VDD = 5.0V)
Frequency = 10MHz
Duty Cycle = 50%
IF = 10mA
VDD = 3.3V
4.5
40
5.0
Fig. 5 Dynamic Logic Low Output Supply Current
vs. Input Frequency (VDD = 3.3V)
5.0
20
Fig 4. Logic High Output Supply Current
vs. Ambient Temperature
5.0
-20
0
TA – AMBIENT TEMPERATURE (°C)
Fig 3. Logic Low Output Supply Current
vs. Ambient Temperature
-40
-20
TA = -40°C
3.0
2.5
Frequency = 10MHz
Duty Cycle = 50%
IF = 10mA
VDD = 5.0V
5.0
T = 25°C
A
4.5
TA = -40°C
4.0
TA = 110°C
3.5
3.0
0
2000
4000
6000
8000
f – INPUT FREQUENCY (kHz)
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
0
10000
2000
4000
6000
8000
10000
f – INPUT FREQUENCY (kHz)
www.fairchildsemi.com
6
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Typical Performance Curves (Continued)
Fig 7. Propagation Delay vs. Ambient Temperature
50
tP – PROPAGATION DELAY (ns)
Frequency = 10MHz
Duty Cycle = 50%
IF = 5mA
45
tP – PROPAGATION DELAY (ns)
Fig 8. Propagation Delay vs. Pulse Input Current
40
40
35
tPHL
30
tPHL
tPLH
25
tPLH
20
Frequency = 10MHz
Duty Cycle = 50%
TA = 25°C
35
tPLH
30
tPLH
25
tPHL
20
tPHL
15
15
VDD = 3.3V
V
= 5.0V
DD
VDD = 3.3V
VDD = 5.0V
10
10
-40
-20
0
20
40
60
80
4
100
6
TA – AMBIENT TEMPERATURE (°C)
Frequency = 10MHz
Duty Cycle = 50%
IF = 5mA
15
10
VDD = 3.3V
5
VDD = 5.0V
0
-5
-40
14
16
Fig 10. Pulse Width Distortion vs Pulse Input Current
(| tPHL – tPLH |) – PULSE WIDTH DISTORTION (ns)
(| tPHL – tPLH |) – PULSE WIDTH DISTORTION (ns)
Fig 9. Pulse Width Distortion vs. Ambient Temperature
20
8
10
12
IF – PULSE INPUT CURRENT (mA)
15
Frequency = 10MHz
Duty Cycle = 50%
TA = 25°C
12
9
VDD = 3.3V
6
3
VDD = 5.0V
0
-20
0
20
40
60
80
TA – AMBIENT TEMPERATURE (°C)
100
4
6
8
10
12
14
IF – PULSE INPUT CURRENT (mA)
16
Fig 11. Rise and Fall Time vs. Ambient Temperature
10
tR, tF – RISE, FALL TIME (ns)
Frequency = 10MHz
Duty Cycle = 50%
I = 5mA
9 F
8
7
tR
6
tF
tR
5
tF
4
3
-40
-20
0
VDD = 3.3V
VDD = 5.0V
20
40
60
80
100
TA – AMBIENT TEMPERATURE (°C)
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
7
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Typical Performance Curves (Continued)
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Schematics
VCC
Pulse Gen.
tf = tr = 5ns
ZO = 50Ω
0.1µF
Input
Monitoring
Node
VO
Monitoring
Node
CL = 15pF
RIN
IF = 5mA
50%
Input
tPHL
tPLH
tf
Output
tr
90%
90%
50%
10%
VOL
10%
Figure 12. Test Circuit for Propagation Delay Time, Rise Time and Fall Time
IF
VDD
0.1µF
Bypass
A
Output
(Vo)
B
VFF
VCM
Pulse Gen
VCM
GND
VOH
Switching Pos. (A), IF = 0
CMH
0.8 x VDD
0.8V
VOL
Switching Pos. (B), IF = 5mA
CML
Figure 13. Test Circuit for Instantaneous Common Mode Rejection Voltage
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
8
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Package Dimensions
Notes:
1. No standard applies to this package.
2. All dimensions are in millimeters.
3. Dimensions are exclusive of burrs, mold flash, and tie bar extrusion.
4. Drawings filesname and revision: MKT-MFP05A.
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,
specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
9
8.0 ± 0.1
3.5 ± 0.2
2 ± 0.05
0.3 MAX
4.0 ± 0.1
Ø1.5 MIN
1.75 ± 0.10
5.5 ± 0.05
12.0 ± 0.3
8.3 ± 0.1
0.1 MAX
5.2 ± 0.2
6.4 ± 0.2
Ø1.5 + 0.1/-0
User Direction of Feed
Note:
All dimensions are in millimeters.
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
10
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Carrier Tape Specification
Option
Order Entry Identifier
No Suffix
FODM8071
R2
FODM8071R2
Description
Mini-Flat 5-pin, shipped in tubes (100 units per tube)
Mini-Flat 5-pin, tape and reel (2,500 units per reel)
All packages are lead free per JEDEC: J-STD-020B standard.
Marking Information
1
V
3
M8071
2
X YY M
6
4
5
Definitions
1
Fairchild logo
2
Device number
3
IEC60747-5-2 (VDE marking)
4
One digit year code, e.g., ‘9’
5
Two digit work week ranging from ‘01’ to ‘53’
6
Assembly package code
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
11
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Ordering Information
FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
Reflow Profile
Temperature (°C)
TP
260
240
TL
220
200
180
160
140
120
100
80
60
40
20
0
Max. Ramp-up Rate = 3°C/S
Max. Ramp-down Rate = 6°C/S
tP
Tsmax
tL
Preheat Area
Tsmin
ts
120
240
360
Time 25°C to Peak
Time (seconds)
Profile Feature
Pb-Free Assembly Profile
Temperature Min. (Tsmin)
150°C
Temperature Max. (Tsmax)
200°C
Time (tS) from (Tsmin to Tsmax)
60–120 seconds
Ramp-up Rate (tL to tP)
3°C/second max.
Liquidous Temperature (TL)
217°C
Time (tL) Maintained Above (TL)
60–150 seconds
Peak Body Package Temperature
260°C +0°C / –5°C
Time (tP) within 5°C of 260°C
30 seconds
Ramp-down Rate (TP to TL)
6°C/second max.
Time 25°C to Peak Temperature
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
8 minutes max.
www.fairchildsemi.com
12
AccuPower™
Auto-SPM™
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CorePLUS™
CorePOWER™
CROSSVOLT™
CTL™
Current Transfer Logic™
DEUXPEED®
Dual Cool™
EcoSPARK®
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EZSWITCH™*
™*
®
®
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Fairchild Semiconductor®
FACT Quiet Series™
FACT®
®
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®
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Global Power Resource
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OPTOLOGIC®
®
OPTOPLANAR
®
PDP SPM™
Power-SPM™
PowerTrench®
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QFET®
QS™
Quiet Series™
RapidConfigure™
™
Saving our world, 1mW/W/kW at a time™
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SPM®
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®
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TINYOPTO™
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TriFault Detect™
TRUECURRENT™*
µSerDes™
®
UHC
Ultra FRFET™
UniFET™
VCX™
VisualMax™
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* Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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and (c) whose failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury of the user.
2. A critical component in any component of a life support, device, or
system whose failure to perform can be reasonably expected to
cause the failure of the life support device or system, or to affect its
safety or effectiveness.
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Definition
Datasheet contains the design specifications for product development. Specifications may change in
any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild
Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes
at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor.
The datasheet is for reference information only.
Rev. I45
©2008 Fairchild Semiconductor Corporation
FODM8071 Rev. 1.0.6
www.fairchildsemi.com
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FODM8071 — 3.3V/5V Logic Gate Output Optocoupler with High Noise Immunity
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