STMICROELECTRONICS STN2NF10_07

STN2NF10
N-channel 100V - 0.23Ω - 2.4A - SOT-223
STripFET™ II Power MOSFET
Features
Type
VDSS
RDS(on)
ID
STN2NF10
100V
< 0.26Ω
2.4A
2
Description
1
This Power MOSFET is the latest development of
STMicroelectronics unique “single feature size”
strip-based process. The resulting transistor
shows extremely high packing density for low onresistance, rugged avalanche characteristics and
less critical alignment steps therefore a
remarkable manufacturing reproducibility.
Application
■
2
3
SOT-223
Internal schematic diagram
Switching application
– DC-DC converters
Order code
Part number
Marking
Package
Packaging
STN2NF10
N2NF10
SOT-223
Tape & reel
April 2007
Rev 6
1/13
www.st.com
13
Contents
STN2NF10
Contents
1
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2
Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2.1
Electrical characteristics (curves)
............................. 6
3
Test circuit
4
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
5
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2/13
................................................ 9
STN2NF10
1
Electrical ratings
Electrical ratings
Table 1.
Absolute maximum ratings
Symbol
Parameter
Value
Unit
VDS
Drain-source voltage (VGS=0)
100
V
VGS
Gate-source voltage
± 20
V
ID
Drain current (continuous) at TC = 25°C
2.4
A
ID
Drain current (continuous) at TC = 100°C
1.5
A
Drain current (pulsed)
17
A
0.026
W/°C
IDM (1)
Derating factor
PTOT (2)
Total dissipation at TC = 25°C
3.3
W
EAS (3)
Single pulse avalanche energy
200
mJ
dv/dt (4)
Peak diode recovery voltage slope
30
V/ns
-55 to 150
°C
Value
Unit
Rthj-amb (1) Thermal resistance junction-amb
38
°C/W
Rthj-amb (2) Thermal resistance junction-amb
62.5
°C/W
Tj
Tstg
Operating junction temperature
Storage temperature
1. Pulse width limited by safe operating area
2. This value is rated according to Rthj-amb, t < 10sec
3. IAS = 2.4A, VDD = 30V, Rg=4.7Ω, starting Tj = 25°C
4. ISD < 6A, di/dt < 500A/µs, VDD= 80% V(BR)DSS
Table 2.
Symbol
Thermal data
Parameter
1. When mounted on 1inch² FR-4 board, 2 oz. Cu, (t < 10sec)
2. When mounted on 1inch² FR-4 board, 2 oz. Cu, (t >10sec)
3/13
Electrical characteristics
2
STN2NF10
Electrical characteristics
(TCASE=25°C unless otherwise specified)
Table 3.
Symbol
V(BR)DSS
IDSS
Parameter
Drain-source breakdown
voltage
Zero gate voltage drain
current (VGS = 0)
Test conditions
ID = 250µA, VGS= 0
Gate threshold voltage
VDS= VGS, ID = 250µA
RDS(on)
Static drain-source on
resistance
VGS= 10V, ID= 1.2A
Parameter
Forward transconductance
Ciss
Input capacitance
Output capacitance
Reverse transfer
capacitance
Crss
Qg
Qgs
Qgd
Unit
V
1
10
1
µA
µA
µA
±100
nA
4
V
0.23
0.26
Ω
Typ.
Max.
Unit
2
Dynamic
gfs
Coss
Max.
100
VDS = 30V, Tc=125°C
VGS(th)
Symbol
Typ.
VDS = Max rating,Tc=125°C
VGS = ±20V
Table 4.
Min.
VDS = Max rating,
Gate body leakage current
(VDS = 0)
IGSS
4/13
On/off states
Total gate charge
Gate-source charge
Gate-drain charge
Test conditions
Min.
VDS =15V, ID=1.2A
2.5
S
VDS =25V, f=1MHz, VGS=0
280
45
20
pF
pF
pF
VDD=80V, ID = 6A
VGS =10V
(see Figure 15)
10
2.5
4
14
nC
nC
nC
STN2NF10
Electrical characteristics
Table 5.
Symbol
td(on)
tr
td(off)
tf
Table 6.
Symbol
ISD
Switching times
Parameter
Test conditions
Unit
6
10
ns
ns
Turn-off delay time
Fall time
VDD=50V, ID = 2.4A
VGS =10V, RG=4.7Ω
(see Figure 14)
20
3
ns
ns
Source drain diode
Parameter
Test conditions
VSD(2)
Forward on voltage
ISD= 2.4A, VGS=0
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD= 6A, VDD=10V
IRRM
Max.
VDD=50V, ID = 2.4A
VGS =10V, RG=4.7Ω
(see Figure 14)
Source-drain current
Source-drain current (pulsed)
Qrr
Typ.
Turn-on delay time
Rise time
ISDM (1)
trr
Min.
di/dt=100A/µs,Tj=150°C
(see Figure 19)
Min.
Typ.
70
175
5
Max
Unit
2.4
17
A
A
1.2
V
ns
nC
A
1. Pulse width limited by safe operating area
2.
Pulsed: pulse duration = 300µs, duty cycle 1.5%
5/13
Electrical characteristics
STN2NF10
2.1
Electrical characteristics (curves)
Figure 1.
Safe operating area
Figure 2.
Thermal impedance
Figure 3.
Output characteristics
Figure 4.
Transfer characteristics
Figure 5.
Transconductance
Figure 6.
Static drain-source on resistance
6/13
STN2NF10
Electrical characteristics
Figure 7.
Gate charge vs. gate-source
voltage
Figure 8.
Figure 9.
Normalized gate threshold voltage
vs. temperature
Figure 10. Normalized on resistance vs.
temperature
Figure 11. Source-drain diode forward
characteristics
Capacitance variations
Figure 12. Normalized BVDSS vs. temperature
7/13
Electrical characteristics
Figure 13. Max drain current vs. temperature
8/13
STN2NF10
STN2NF10
3
Test circuit
Test circuit
Figure 14. Switching times test circuit for
resistive load
Figure 15. Gate charge test circuit
Figure 16. Test circuit for inductive load
Figure 17. Unclamped inductive load test
switching and diode recovery times
circuit
Figure 18. Unclamped inductive waveform
Figure 19. Switching time waveform
9/13
Package mechanical data
4
STN2NF10
Package mechanical data
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a Lead-free second level interconnect. The category of
second level interconnect is marked on the package and on the inner box label, in
compliance with JEDEC Standard JESD97. The maximum ratings related to soldering
conditions are also marked on the inner box label. ECOPACK is an ST trademark.
ECOPACK specifications are available at: www.st.com
10/13
STN2NF10
Package mechanical data
SOT-223 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
A
inch
MAX.
MIN.
TYP.
1.80
MAX.
0.071
B
0.60
0.70
0.80
0.024
0.027
0.031
B1
2.90
3.00
3.10
0.114
0.118
0.122
c
0.24
0.26
0.32
0.009
0.010
0.013
D
6.30
6.50
6.70
0.248
0.256
0.264
e
2.30
0.090
e1
4.60
0.181
E
3.30
3.50
3.70
0.130
0.138
0.146
H
6.70
7.00
7.30
0.264
0.276
0.287
V
A1
10
o
10o
0.02
P008B
11/13
Revision history
5
STN2NF10
Revision history
Table 7.
12/13
Revision history
Date
Revision
Changes
14-Sep-2006
4
The document has been reformatted
29-Mar-2007
5
Figure 1 has been updated
04-Apr-2007
6
New test condition for IDSS on Table 3
STN2NF10
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13/13