STMICROELECTRONICS STM32F101RG

STM32F101xF
STM32F101xG
XL-density access line, ARM-based 32-bit MCU with 768 KB
to 1 MB Flash, 15 timers, 1 ADC and 10 communication interfaces
Preliminary data
Features
■
■
■
■
■
Core: ARM 32-bit Cortex™-M3 CPU with MPU
– 36 MHz maximum frequency,
1.25 DMIPS/MHz (Dhrystone 2.1)
performance
– Single-cycle multiplication and hardware
division
Memories
– 768 Kbytes to 1 Mbyte of Flash memory
(dual bank with read-while-write capability)
– 80 Kbytes of SRAM
– Flexible static memory controller with 4
Chip Select. Supports Compact Flash,
SRAM, PSRAM, NOR and NAND
memories
– LCD parallel interface, 8080/6800 modes
LQFP144
20 × 20 mm
LQFP100
14 × 14 mm
LQFP64
10 × 10 mm
– 51/80/112 I/Os, all mappable on 16
external interrupt vectors and almost all
5 V-tolerant
■
Debug mode
– Serial wire debug (SWD) & JTAG interfaces
– Cortex-M3 Embedded Trace Macrocell™
■
Up to 15 timers
– Up to ten 16-bit timers, with up to 4
IC/OC/PWM or pulse counters
– 2 × watchdog timers (Independent and
Window)
– SysTick timer: a 24-bit downcounter
– 2 × 16-bit basic timers to drive the DAC
■
Up to 10 communication interfaces
– Up to 2 x I2C interfaces (SMBus/PMBus)
– Up to 5 USARTs (ISO 7816 interface, LIN,
IrDA capability, modem control)
– Up to 3 SPIs (18 Mbit/s)
Low power
– Sleep, Stop and Standby modes
– VBAT supply for RTC and backup registers
■
CRC calculation unit, 96-bit unique ID
■
ECOPACK® packages
1 x 12-bit, 1 µs A/D converters (up to 16
channels)
– Conversion range: 0 to 3.6 V
– Temperature sensor
Table 1.
Clock, reset and supply management
– 2.0 to 3.6 V application supply and I/Os
– POR, PDR, and programmable voltage
detector (PVD)
– 4-to-16 MHz crystal oscillator
– Internal 8 MHz factory-trimmed RC
– Internal 40 kHz RC with calibration
capability
– 32 kHz oscillator for RTC with calibration
■
2 × 12-bit D/A converters
■
DMA
– 12-channel DMA controller
– Peripherals supported: timers, ADC, DAC,
SPIs, I2Cs and USARTs
■
Up to 112 fast I/O ports
November 2010
Device summary
Reference
Part number
STM32F101xF
STM32F101RF STM32F101VF
STM32F101ZF
STM32F101xG
STM32F101RG STM32F101VG
STM32F101ZG
Doc ID 17143 Rev 2
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to
change without notice.
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1
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.1
Device overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.2
Full compatibility throughout the family . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2.3
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.3.1
ARM® Cortex™-M3 core with embedded Flash and SRAM . . . . . . . . . 15
2.3.2
Memory protection unit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.3.3
Embedded Flash memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.3.4
CRC (cyclic redundancy check) calculation unit . . . . . . . . . . . . . . . . . . 15
2.3.5
Embedded SRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2.3.6
FSMC (flexible static memory controller) . . . . . . . . . . . . . . . . . . . . . . . . 16
2.3.7
LCD parallel interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2.3.8
Nested vectored interrupt controller (NVIC) . . . . . . . . . . . . . . . . . . . . . . 16
2.3.9
External interrupt/event controller (EXTI) . . . . . . . . . . . . . . . . . . . . . . . 16
2.3.10
Clocks and startup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.3.11
Boot modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.3.12
Power supply schemes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.3.13
Power supply supervisor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.3.14
Voltage regulator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
2.3.15
Low-power modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
2.3.16
DMA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
2.3.17
RTC (real-time clock) and backup registers . . . . . . . . . . . . . . . . . . . . . . 19
2.3.18
Timers and watchdogs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
2.3.19
I²C bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.3.20
Universal synchronous/asynchronous receiver transmitters (USARTs) 21
2.3.21
Serial peripheral interface (SPI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.3.22
GPIOs (general-purpose inputs/outputs) . . . . . . . . . . . . . . . . . . . . . . . . 21
2.3.23
ADC (analog to digital converter) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.3.24
DAC (digital-to-analog converter) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.3.25
Temperature sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.3.26
Serial wire JTAG debug port (SWJ-DP) . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.3.27
Embedded Trace Macrocell™ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3
Pinouts and pin descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
4
Memory mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
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5
Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
5.1
6
Parameter conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
5.1.1
Minimum and maximum values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
5.1.2
Typical values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
5.1.3
Typical curves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
5.1.4
Loading capacitor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
5.1.5
Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
5.1.6
Power supply scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
5.1.7
Current consumption measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
5.2
Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
5.3
Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
5.3.1
General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
5.3.2
Operating conditions at power-up / power-down . . . . . . . . . . . . . . . . . . 38
5.3.3
Embedded reset and power control block characteristics . . . . . . . . . . . 38
5.3.4
Embedded reference voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
5.3.5
Supply current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
5.3.6
External clock source characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
5.3.7
Internal clock source characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
5.3.8
PLL characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
5.3.9
Memory characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
5.3.10
FSMC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
5.3.11
EMC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
5.3.12
Absolute maximum ratings (electrical sensitivity) . . . . . . . . . . . . . . . . . 78
5.3.13
I/O current injection characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
5.3.14
I/O port characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
5.3.15
NRST pin characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
5.3.16
TIM timer characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
5.3.17
Communications interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
5.3.18
12-bit ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
5.3.19
DAC electrical specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
5.3.20
Temperature sensor characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
Package characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
6.1
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
6.2
Thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
6.2.1
Reference document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
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6.2.2
Evaluating the maximum junction temperature for an application . . . . 105
7
Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
8
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
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Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Table 15.
Table 16.
Table 17.
Table 18.
Table 19.
Table 20.
Table 21.
Table 22.
Table 23.
Table 24.
Table 25.
Table 26.
Table 27.
Table 28.
Table 29.
Table 30.
Table 31.
Table 32.
Table 33.
Table 34.
Table 35.
Table 36.
Table 37.
Table 38.
Table 39.
Table 40.
Table 41.
Table 42.
Table 43.
Table 44.
Table 45.
Table 46.
Table 47.
Table 48.
Table 49.
Device summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
STM32F101xF and STM32F101xG features and peripheral counts . . . . . . . . . . . . . . . . . 11
STM32F101xx family . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
STM32F101xF and STM32F101xG timer feature comparison . . . . . . . . . . . . . . . . . . . . . . 19
STM32F101xF and STM32F101xG pin definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
FSMC pin definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Thermal characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Operating conditions at power-up / power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Embedded reset and power control block characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 39
Embedded internal reference voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Maximum current consumption in Run mode, code with data processing
running from Flash . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Maximum current consumption in Run mode, code with data processing
running from RAM. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Maximum current consumption in Sleep mode, code running from Flash or RAM. . . . . . . 43
Typical and maximum current consumptions in Stop and Standby modes . . . . . . . . . . . . 43
Typical current consumption in Run mode, code with data processing
running from Flash . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Typical current consumption in Sleep mode, code running from Flash or RAM . . . . . . . . . 47
Peripheral current consumption . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
High-speed external user clock characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Low-speed user external clock characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
HSE 4-16 MHz oscillator characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
LSE oscillator characteristics (fLSE = 32.768 kHz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
HSI oscillator characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
LSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
Low-power mode wakeup timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
PLL characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Flash memory characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Flash memory endurance and data retention . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Asynchronous non-multiplexed SRAM/PSRAM/NOR read timings . . . . . . . . . . . . . . . . . . 58
Asynchronous non-multiplexed SRAM/PSRAM/NOR write timings . . . . . . . . . . . . . . . . . . 59
Asynchronous multiplexed NOR/PSRAM read timings. . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Asynchronous multiplexed NOR/PSRAM write timings . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Synchronous multiplexed NOR/PSRAM read timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
Synchronous multiplexed PSRAM write timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
Synchronous non-multiplexed NOR/PSRAM read timings . . . . . . . . . . . . . . . . . . . . . . . . . 67
Synchronous non-multiplexed PSRAM write timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
Switching characteristics for PC Card/CF read and write cycles . . . . . . . . . . . . . . . . . . . . 73
Switching characteristics for NAND Flash read and write cycles . . . . . . . . . . . . . . . . . . . . 76
EMS characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
EMI characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
ESD absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
Electrical sensitivities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
I/O current injection susceptibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
I/O static characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
Output voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
I/O AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
NRST pin characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
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Table 50.
Table 51.
Table 52.
Table 53.
Table 54.
Table 55.
Table 56.
Table 57.
Table 58.
Table 59.
Table 60.
Table 61.
Table 62.
Table 63.
Table 64.
Table 65.
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TIMx characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
I2C characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
SCL frequency (fPCLK1= 36 MHz, VDD = 3.3 V) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
STM32F10xxx SPI characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
SPI characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
RAIN max for fADC = 14 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
ADC accuracy - limited test conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
ADC accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
DAC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
TS characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
LQFP144, 20 x 20 mm, 144-pin thin quad flat package mechanical data . . . . . . . . . . . . 101
LQPF100 – 14 x 14 mm, 100-pin low-profile quad flat package mechanical data . . . . . . 102
LQFP64 – 10 x 10 mm, 64 pin low-profile quad flat package mechanical data . . . . . . . . 103
Package thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
STM32F101xF and STM32F101xG ordering information scheme . . . . . . . . . . . . . . . . . . 106
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List of figures
List of figures
Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Figure 6.
Figure 7.
Figure 8.
Figure 9.
Figure 10.
Figure 11.
Figure 12.
Figure 13.
Figure 14.
Figure 15.
Figure 16.
Figure 17.
Figure 18.
Figure 19.
Figure 20.
Figure 21.
Figure 22.
Figure 23.
Figure 24.
Figure 25.
Figure 26.
Figure 27.
Figure 28.
Figure 29.
Figure 30.
Figure 31.
Figure 32.
Figure 33.
Figure 34.
Figure 35.
Figure 36.
Figure 37.
Figure 38.
Figure 39.
Figure 40.
STM32F101xF and STM32F101xG access line block diagram . . . . . . . . . . . . . . . . . . . . . 12
Clock tree . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
STM32F101xF and STM32F101xG access line LQFP144 pinout . . . . . . . . . . . . . . . . . . . 23
STM32F101xF and STM32F101xG LQFP100 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
STM32F101xF and STM32F101xG LQFP64 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Memory map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Pin loading conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Power supply scheme. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Current consumption measurement scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Typical current consumption in Run mode versus frequency (at 3.6 V) code with data processing running from RAM, peripherals enabled. . . . . . . . . . . . . . . . . . 42
Typical current consumption in Run mode versus frequency (at 3.6 V) code with data processing running from RAM, peripherals disabled . . . . . . . . . . . . . . . . . 42
Typical current consumption on VBAT with RTC on vs. temperature at
different VBAT values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Typical current consumption in Stop mode with regulator in run mode
versus temperature at different VDD values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Typical current consumption in Stop mode with regulator in low-power
mode versus temperature at different VDD values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Typical current consumption in Standby mode versus temperature at
different VDD values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
High-speed external clock source AC timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Low-speed external clock source AC timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Typical application with an 8 MHz crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Typical application with a 32.768 kHz crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Asynchronous non-multiplexed SRAM/PSRAM/NOR read waveforms . . . . . . . . . . . . . . . 58
Asynchronous non-multiplexed SRAM/PSRAM/NOR write waveforms . . . . . . . . . . . . . . . 59
Asynchronous multiplexed NOR/PSRAM read waveforms. . . . . . . . . . . . . . . . . . . . . . . . . 60
Asynchronous multiplexed NOR/PSRAM write waveforms . . . . . . . . . . . . . . . . . . . . . . . . 62
Synchronous multiplexed NOR/PSRAM read timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
Synchronous multiplexed PSRAM write timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Synchronous non-multiplexed NOR/PSRAM read timings . . . . . . . . . . . . . . . . . . . . . . . . . 67
Synchronous non-multiplexed PSRAM write timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
PC Card/CompactFlash controller waveforms for common memory read access . . . . . . . 69
PC Card/CompactFlash controller waveforms for common memory write access . . . . . . . 70
PC Card/CompactFlash controller waveforms for attribute memory read
access. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
PC Card/CompactFlash controller waveforms for attribute memory write
access. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
PC Card/CompactFlash controller waveforms for I/O space read access . . . . . . . . . . . . . 72
PC Card/CompactFlash controller waveforms for I/O space write access . . . . . . . . . . . . . 73
NAND controller waveforms for read access . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
NAND controller waveforms for write access . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
NAND controller waveforms for common memory read access . . . . . . . . . . . . . . . . . . . . . 75
NAND controller waveforms for common memory write access. . . . . . . . . . . . . . . . . . . . . 76
Standard I/O input characteristics - CMOS port . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
Standard I/O input characteristics - TTL port . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
Doc ID 17143 Rev 2
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List of figures
Figure 41.
Figure 42.
Figure 43.
Figure 44.
Figure 45.
Figure 46.
Figure 47.
Figure 48.
Figure 49.
Figure 50.
Figure 51.
Figure 52.
Figure 53.
Figure 54.
Figure 55.
Figure 56.
Figure 57.
Figure 58.
Figure 59.
Figure 60.
8/108
STM32F101xF, STM32F101xG
5 V tolerant I/O input characteristics - CMOS port . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
5 V tolerant I/O input characteristics - TTL port . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
I/O AC characteristics definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
Recommended NRST pin protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
I2C bus AC waveforms and measurement circuit(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
SPI timing diagram - slave mode and CPHA=0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
SPI timing diagram - slave mode and CPHA=1(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
SPI timing diagram - master mode(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
ADC accuracy characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
Typical connection diagram using the ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
Power supply and reference decoupling (VREF+ not connected to VDDA). . . . . . . . . . . . . . 96
Power supply and reference decoupling (VREF+ connected to VDDA) . . . . . . . . . . . . . . . 97
12-bit buffered /non-buffered DAC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
LQFP144, 20 x 20 mm, 144-pin thin quad flat
package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
Recommended footprint(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
LQFP100 – 14 x 14 mm, 100-pin low-profile quad flat package outline . . . . . . . . . . . . . . 102
Recommended footprint(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
LQFP64 – 10 x 10 mm, 64 pin low-profile quad flat package outline . . . . . . . . . . . . . . . . 103
Recommended footprint(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
LQFP64 PD max vs. TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
1
Introduction
Introduction
This datasheet provides the ordering information and mechanical device characteristics of
the STM32F101xF and STM32F101xG XL-density access line microcontrollers. For more
details on the whole STMicroelectronics STM32F101xx family, please refer to Section 2.2:
Full compatibility throughout the family.
The XL-density STM32F101xx datasheet should be read in conjunction with the
STM32F10xxx reference manual.
For information on programming, erasing and protection of the internal Flash memory
please refer to the STM32F10xxx Flash programming manual.
The reference and Flash programming manuals are both available from the
STMicroelectronics website www.st.com.
For information on the Cortex™-M3 core please refer to the Cortex™-M3 Technical
Reference Manual, available from the www.arm.com website at the following address:
http://infocenter.arm.com/help/index.jsp?topic=/com.arm.doc.ddi0337e/.
Doc ID 17143 Rev 2
9/108
Description
2
STM32F101xF, STM32F101xG
Description
The STM32F101xF and STM32F101xG access line family incorporates the highperformance ARM® Cortex™-M3 32-bit RISC core operating at a 36 MHz frequency, highspeed embedded memories (Flash memory up to 1 Mbyte and SRAM of 80 Kbytes), and an
extensive range of enhanced I/Os and peripherals connected to two APB buses. All devices
offer one 12-bit ADC, ten general-purpose 16-bit timers, as well as standard and advanced
communication interfaces: up to two I2Cs, three SPIs and five USARTs.
The STM32F101xx XL-density access line family operates in the –40 to +85 °C temperature
range, from a 2.0 to 3.6 V power supply. A comprehensive set of power-saving mode allows
the design of low-power applications.
These features make the STM32F101xx XL-density access line microcontroller family
suitable for a wide range of applications such as medical and handheld equipment, PC
peripherals and gaming, GPS platforms, industrial applications, PLC, printers, scanners
alarm systems , power meters, and video intercom.
10/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
2.1
Description
Device overview
The STM32F101xx XL-density access line family offers devices in 3 different package types:
from 64 pins to 144 pins. Depending on the device chosen, different sets of peripherals are
included, the description below gives an overview of the complete range of peripherals
proposed in this family.
●
Figure 1 shows the general block diagram of the device family.
Table 2.
STM32F101xF and STM32F101xG features and peripheral counts
Peripherals
STM32F101Rx
Flash memory
768 KB
1 MB
STM32F101Vx
768 KB
1 MB
STM32F101Zx
768 KB
1 MB
SRAM in Kbytes
80
80
80
FSMC
No
Yes
Yes
General-purpose
10
Basic
2
Timers
SPI
Communication 2
I C
interfaces
USART
3
2
5
GPIOs
51
80
112
12-bit ADC
Number of channels
2
16
2
16
2
16
12-bit DAC
Number of channels
2
2
CPU frequency
36 MHz
Operating voltage
Operating temperatures
Package
2.0 to 3.6 V
Ambient temperature: –40 to +85 °C (see Table 10)
Junction temperature: –40 to +105 °C (see Table 10)
LQFP64
LQFP100(1)
LQFP144
1. For the LQFP100 package, only FSMC Bank1 and Bank2 are available. Bank1 can only support a
multiplexed NOR/PSRAM memory using the NE1 Chip Select. Bank2 can only support a 16- or 8-bit NAND
Flash memory using the NCE2 Chip Select. The interrupt line cannot be used since Port G is not available
in this package.
Doc ID 17143 Rev 2
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Description
STM32F101xF, STM32F101xG
TPIU
ETM
Trace
controller
Pbus
SW/JTAG Trace/trig
Ibus
MPU
Cortex-M3 CPU
Fmax: 36 MHz
Dbus
System
NVIC
@VDD
Flash obl
interface
NJTRST
JTDI
JTCK/SWCLK
JTMS/SWDIO
JTDO
as AF
Flash 512 Kbyte
64 bit
Flash obl
interface
TRACECLK
TRACED[0:3]
as AS
STM32F101xF and STM32F101xG access line block diagram
Bus matrix
Figure 1.
Flash 512 Kbyte
64 bit
VDD
@VDDA
SRAM
80 Kbyte
RC 8 MHz
GP DMA1
RC 40 kHz
7 channels
PLL
GP DMA2
A[25:0]
D[15:0]
CLK
NOE
NWE
NE[4:1]
NBL[1:0]
NWAIT
NL
as AF
5 channels
Reset &
clock
control
PVD
@VDD
XTAL OSC
4-16 MHz
Standby
interface
@VBAT
XTAL32kHz
RTC Backup
reg
AWU
Backup interface
AHB2
APB1
TIM2
APB1: Fmax = 24/36 MHz
EXT.IT
WKUP
GPIO port A
PB[15:0]
GPIO port B
PC[15:0]
GPIO port C
PD[15:0]
GPIO port D
PE[15:0]
GPIO port E
PF[15:0]
GPIO port F
PG[15:0]
GPIO port G
2 channels as AF
TIM9
1 channel as AF
TIM10
1 channel as AF
TIM11
MOSI, MISO, SCK,
NSS as AF
SPI1
RX, TX, CTS, RTS
as AF
USART1
APB2: Fmax = 24/36 MHz
PA[15:0]
Int
@VDDA
Supply
supervision
POR /PDR
NRST
VDDA
VSSA
OSC_IN
OSC_OUT
VBAT =1.8 V to 3.6 V
OSC32_IN
OSC32_OUT
TAMPER-RTC/
ALARM/SECOND OUT
4 channels as AF
TIM3
4 channels as AF
TIM4
4 channels as AF
TIM5
4 channels as AF
TIM12
2 channels as AF
TIM13
1 channel as AF
TIM14
USART2
USART3
WWDG
VSS
IWDG
PCLK1
PCLK2
HCLK
FCLK
FSMC
AHB2
APB2
112AF
POR
Reset
Power
Volt. reg.
3.3 V to 1.8 V
1 channel as AF
RX, TX, CTS, RTS,
CK, as AF
RX, TX, CTS, RTS,
CK, as AF
UART4
RX,TX as AF
UART5
RX,TX as AF
SPI2
MOSI, MISO
SCK, NSS as AF
SPI3
MOSI, MISO
SCK, NSS as AF
I2C1
SCL, SDA, SMBA as AF
I2C2
SCL, SDA, SMBA as AF
Temp. sensor
ADC_IN[0:15]
VREF–
VREF+
12-bit ADC
TIM6
IF 12bit DAC1
IF
DAC_OUT1 as AF
TIM7
12bit DAC 2
DAC_OUT2 as AF
IF
VREF+
@ VDDA
@VDDA
ai15830
1. TA = –40 °C to +85 °C (junction temperature up to 105 °C).
2. AF = alternate function on I/O port pin.
12/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Figure 2.
Description
Clock tree
&,)4&#,+
-(Z
(3)2#
(3)
&3-##,+
0ERIPHERALCLOCK
ENABLE
-(ZMAX
0,,32#
37
0,,-5,
(3)
X
XXX
0,,
393#,+
!("
0RESCALER
-(Z
MAX
0,,#,+
!0"
0RESCALER
-(ZMAX
0#,+
TO!0"
PERIPHERALS
0ERIPHERAL#LOCK
%NABLE
!0"
0RESCALER
0,,8402%
-(Z
(3%/3#
TO#ORTEX3YSTEMTIMER
&#,+#ORTEX
FREERUNNINGCLOCK
4)-
)F!0"PRESCALERX
ELSEX
#33
/3#?).
/3#?/54
,3%/3#
K(Z
TO4)-
AND
4)-X#,+
0ERIPHERAL#LOCK
%NABLE
-(ZMAX
0ERIPHERAL#LOCK
%NABLE
4)-
)F!0"PRESCALERX
ELSEX
/3#?).
TO&3-#
(#,+
TO!("BUSCORE
MEMORYAND$-!
#LOCK
%NABLE
(3%
/3#?/54
TO&LASHPROGRAMMING
INTERFACE
TO24#
,3%
24##,+
!$#
0RESCALER
0#,+
TO!0"PERIPHERALS
TO4)-4)-
AND4)-
4)-X#,+
0ERIPHERAL#LOCK
%NABLE
TO!$#
!$##,+
24#3%,;=
,3)2#
K(Z
TOINDEPENDENTWATCHDOG)7$'
,3)
)7$'#,+
-AIN
#LOCK/UTPUT
-#/
0,,#,+
,EGEND
(3%(IGHSPEEDEXTERNALCLOCKSIGNAL
IG
(3)
(3) (IGHSPEEDINTERNALCLOCKSIGNAL
(3%
,3) ,OWSPEEDINTERNALCLOCKSIGNAL
393#,+
,3% ,OWSPEEDEXTERNALCLOCKSIGNAL
-#/
AI
1. When the HSI is used as a PLL clock input, the maximum system clock frequency that can be achieved is
36 MHz.
2. To have an ADC conversion time of 1 µs, APB2 must be at 14 MHz or 28 MHz.
Doc ID 17143 Rev 2
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Description
2.2
STM32F101xF, STM32F101xG
Full compatibility throughout the family
The STM32F101xx is a complete family whose members are fully pin-to-pin, software and
feature compatible. In the reference manual, the STM32F101x4 and STM32F101x6 are
identified as low-density devices, the STM32F101x8 and STM32F101xB are referred to as
medium-density devices, the STM32F101xC, STM32F101xD, STM32F101xE are referred
to as high-density devices, and the STM32F101xF and STM32F101xG are referred to as
XL-density devices.
Low-, high-density and XL-density devices are an extension of the STM32F101x8/B
medium-density devices, they are specified in the STM32F101x4/6, STM32F101xC/D/E and
STM32F101xF/G datasheets, respectively.
Low-density devices feature lower Flash memory and RAM capacities, less timers and
peripherals. High-density devices have higher Flash memory and RAM densities, and
additional peripherals like FSMC and DAC. XL-density devices bring greater Flash and RAM
capacities, and more features, namely an MPU, a higher number of timers and a dual bank
Flash memory, while remaining fully compatible with the other members of the family.
The STM32F101x4, STM32F101x6, STM32F101xC, STM32F101xD, STM32F101xE,
STM32F101xF and STM32F101xG are a drop-in replacement for the STM32F101x8/B
devices, allowing the user to try different memory densities and providing a greater degree
of freedom during the development cycle.
Moreover, the STM32F101xx access line family is fully compatible with all existing
STM32F103xx performance line and STM32F102xx USB access line devices.
Table 3.
STM32F101xx family
Memory size
Low-density devices
Pinout
16 KB
Flash
32 KB
Flash(1)
Medium-density devices
64 KB
Flash
128 KB
Flash
4 KB RAM 6 KB RAM 10 KB RAM 16 KB RAM
144
100
64
2 × USARTs
2 × 16-bit timers
1 × SPI, 1 × I2C
1 × ADC
3 × USARTs
3 × 16-bit timers
2 × SPIs, 2 × I2Cs,
1 × ADC
High-density devices
XL-density devices
256 KB 384 KB 512 KB
Flash Flash Flash
768 KB
Flash
1 MB
Flash
32 KB
RAM
80 KB
RAM
80 KB
RAM
48 KB
RAM
48 KB
RAM
5 × USARTs
10 × 16-bit timers,
5 × USARTs
2 × basic timers
4 × 16-bit timers,
3 × SPIs, 2 × I2Cs,
2 × basic timers
1 × ADC, 1 × DAC
3 × SPIs, 2 × I2Cs,
FSMC (100 and 144
1 × ADC, 1 × DAC
pins), Cortex-M3 with
FSMC (100 and 144 pins)
MPU, Dual bank Flash
memory
48
36
1. For orderable part numbers that do not show the A internal code after the temperature range code (6), the reference
datasheet for electrical characteristics is that of the STM32F101x8/B medium-density devices.
14/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Description
2.3
Overview
2.3.1
ARM® Cortex™-M3 core with embedded Flash and SRAM
The ARM Cortex™-M3 processor is the latest generation of ARM processors for embedded
systems. It has been developed to provide a low-cost platform that meets the needs of MCU
implementation, with a reduced pin count and low-power consumption, while delivering
outstanding computational performance and an advanced system response to interrupts.
The ARM Cortex™-M3 32-bit RISC processor features exceptional code-efficiency,
delivering the high-performance expected from an ARM core in the memory size usually
associated with 8- and 16-bit devices.
The STM32F101xF and STM32F101xG access line family having an embedded ARM core,
is therefore compatible with all ARM tools and software.
Figure 1 shows the general block diagram of the device family.
2.3.2
Memory protection unit
The memory protection unit (MPU) is used to separate the processing of tasks from the data
protection. The MPU can manage up to 8 protection areas that can all be further divided up
into 8 subareas. The protection area sizes are between 32 bytes and the whole 4 gigabytes
of addressable memory.
The memory protection unit is especially helpful for applications where some critical or
certified code has to be protected against the misbehavior of other tasks. It is usually
managed by an RTOS (real-time operating system). If a program accesses a memory
location that is prohibited by the MPU, the RTOS can detect it and take action. In an RTOS
environment, the kernel can dynamically update the MPU area setting, based on the
process to be executed.
The MPU is optional and can be bypassed for applications that do not need it.
2.3.3
Embedded Flash memory
768 Kbytes to 1 Mbyte of embedded Flash are available for storing programs and data. The
Flash memory is organized as two banks. The first bank has a size of 512 Kbytes. The
second bank is either 256 or 512 Kbytes depending on the device. This gives the device the
capability of writing to one bank while executing code from the other bank (read-while-write
capability).
2.3.4
CRC (cyclic redundancy check) calculation unit
The CRC (cyclic redundancy check) calculation unit is used to get a CRC code from a 32-bit
data word and a fixed generator polynomial.
Among other applications, CRC-based techniques are used to verify data transmission or
storage integrity. In the scope of the EN/IEC 60335-1 standard, they offer a means of
verifying the Flash memory integrity. The CRC calculation unit helps compute a signature of
the software during runtime, to be compared with a reference signature generated at linktime and stored at a given memory location.
Doc ID 17143 Rev 2
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Description
2.3.5
STM32F101xF, STM32F101xG
Embedded SRAM
80 Kbytes of embedded SRAM accessed (read/write) at CPU clock speed with 0 wait states.
2.3.6
FSMC (flexible static memory controller)
The FSMC is embedded in the STM32F101xF and STM32F101xG access line family. It has
four Chip Select outputs supporting the following modes: PC Card/Compact Flash, SRAM,
PSRAM, NOR and NAND.
Functionality overview:
2.3.7
●
The three FSMC interrupt lines are ORed in order to be connected to the NVIC
●
Write FIFO
●
Code execution from external memory except for NAND Flash and PC Card
●
The targeted frequency is HCLK/2, so external access is at 18 MHz when HCLK is at
36 MHz
LCD parallel interface
The FSMC can be configured to interface seamlessly with most graphic LCD controllers. It
supports the Intel 8080 and Motorola 6800 modes, and is flexible enough to adapt to
specific LCD interfaces. This LCD parallel interface capability makes it easy to build costeffective graphic applications using LCD modules with embedded controllers or highperformance solutions using external controllers with dedicated acceleration.
2.3.8
Nested vectored interrupt controller (NVIC)
The STM32F101xF and STM32F101xG access line embeds a nested vectored interrupt
controller able to handle up to 60 maskable interrupt channels (not including the 16 interrupt
lines of Cortex™-M3) and 16 priority levels.
●
Closely coupled NVIC gives low-latency interrupt processing
●
Interrupt entry vector table address passed directly to the core
●
Closely coupled NVIC core interface
●
Allows early processing of interrupts
●
Processing of late arriving higher priority interrupts
●
Support for tail-chaining
●
Processor state automatically saved
●
Interrupt entry restored on interrupt exit with no instruction overhead
This hardware block provides flexible interrupt management features with minimal interrupt
latency.
2.3.9
External interrupt/event controller (EXTI)
The external interrupt/event controller consists of 19 edge detector lines used to generate
interrupt/event requests. Each line can be independently configured to select the trigger
event (rising edge, falling edge, both) and can be masked independently. A pending register
maintains the status of the interrupt requests. The EXTI can detect an external line with a
pulse width shorter than the Internal APB2 clock period. Up to 112 GPIOs can be connected
to the 16 external interrupt lines.
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Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
2.3.10
Description
Clocks and startup
System clock selection is performed on startup, however the internal RC 8 MHz oscillator is
selected as default CPU clock on reset. An external 4-16 MHz clock can be selected, in
which case it is monitored for failure. If failure is detected, the system automatically switches
back to the internal RC oscillator. A software interrupt is generated if enabled. Similarly, full
interrupt management of the PLL clock is available when necessary (for example with failure
of an indirectly used external oscillator).
Several prescalers are used to configure the AHB frequency, the high-speed APB (APB2)
domain and the low-speed APB (APB1) domain. The maximum frequency of the AHB and
APB domains is 36 MHz. See Figure 2 for details on the clock tree.
2.3.11
Boot modes
At startup, boot pins are used to select one of three boot options:
●
Boot from user Flash: you have an option to boot from any of two memory banks. By
default, boot from Flash memory bank 1 is selected. You can choose to boot from Flash
memory bank 2 by setting a bit in the option bytes.
●
Boot from system memory
●
Boot from embedded SRAM
The bootloader is located in system memory. It is used to reprogram the Flash memory by
using USART1.
2.3.12
Power supply schemes
●
VDD = 2.0 to 3.6 V: external power supply for I/Os and the internal regulator.
Provided externally through VDD pins.
●
VSSA, VDDA = 2.0 to 3.6 V: external analog power supplies for ADC, DAC, Reset blocks,
RCs and PLL (minimum voltage to be applied to VDDA is 2.4 V when the ADC or DAC is
used). VDDA and VSSA must be connected to VDD and VSS, respectively.
●
VBAT = 1.8 to 3.6 V: power supply for RTC, external clock 32 kHz oscillator and backup
registers (through power switch) when VDD is not present.
For more details on how to connect power pins, refer to Figure 9: Power supply scheme.
2.3.13
Power supply supervisor
The device has an integrated power-on reset (POR)/power-down reset (PDR) circuitry. It is
always active, and ensures proper operation starting from/down to 2 V. The device remains
in reset mode when VDD is below a specified threshold, VPOR/PDR, without the need for an
external reset circuit.
The device features an embedded programmable voltage detector (PVD) that monitors the
VDD/VDDA power supply and compares it to the VPVD threshold. An interrupt can be
generated when VDD/VDDA drops below the VPVD threshold and/or when VDD/VDDA is higher
than the VPVD threshold. The interrupt service routine can then generate a warning
message and/or put the MCU into a safe state. The PVD is enabled by software. Refer to
Table 12: Embedded reset and power control block characteristics for the values of
VPOR/PDR and VPVD.
Doc ID 17143 Rev 2
17/108
Description
2.3.14
STM32F101xF, STM32F101xG
Voltage regulator
The regulator has three operation modes: main (MR), low power (LPR) and power down.
●
MR is used in the nominal regulation mode (Run)
●
LPR is used in the Stop modes.
●
Power down is used in Standby mode: the regulator output is in high impedance: the
kernel circuitry is powered down, inducing zero consumption (but the contents of the
registers and SRAM are lost)
This regulator is always enabled after reset. It is disabled in Standby mode.
2.3.15
Low-power modes
The STM32F101xF and STM32F101xG access line supports three low-power modes to
achieve the best compromise between low power consumption, short startup time and
available wakeup sources:
●
Sleep mode
In Sleep mode, only the CPU is stopped. All peripherals continue to operate and can
wake up the CPU when an interrupt/event occurs.
●
Stop mode
Stop mode achieves the lowest power consumption while retaining the content of
SRAM and registers. All clocks in the 1.8 V domain are stopped, the PLL, the HSI RC
and the HSE crystal oscillators are disabled. The voltage regulator can also be put
either in normal or in low power mode.
The device can be woken up from Stop mode by any of the EXTI line. The EXTI line
source can be one of the 16 external lines, the PVD output or the RTC alarm.
●
Standby mode
The Standby mode is used to achieve the lowest power consumption. The internal
voltage regulator is switched off so that the entire 1.8 V domain is powered off. The
PLL, the HSI RC and the HSE crystal oscillators are also switched off. After entering
Standby mode, SRAM and register contents are lost except for registers in the Backup
domain and Standby circuitry.
The device exits Standby mode when an external reset (NRST pin), a IWDG reset, a
rising edge on the WKUP pin, or an RTC alarm occurs.
Note:
The RTC, the IWDG, and the corresponding clock sources are not stopped by entering Stop
or Standby mode.
2.3.16
DMA
The flexible 12-channel general-purpose DMAs (7 channels for DMA1 and 5 channels for
DMA2) are able to manage memory-to-memory, peripheral-to-memory and memory-toperipheral transfers.
The two DMA controllers support circular buffer management, removing the need for user
code intervention when the controller reaches the end of the buffer.
Each channel is connected to dedicated hardware DMA requests, with support for software
trigger on each channel. Configuration is made by software and transfer sizes between
source and destination are independent.
DMA can be used with the main peripherals: SPI, I2C, USART, general-purpose and basic
timers TIMx, DAC and ADC.
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Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
2.3.17
Description
RTC (real-time clock) and backup registers
The RTC and the backup registers are supplied through a switch that takes power either on
VDD supply when present or through the VBAT pin. The backup registers are forty-two 16-bit
registers used to store 84 bytes of user application data when VDD power is not present.
They are not reset by a system or power reset, and they are not reset when the device
wakes up from the Standby mode.
The real-time clock provides a set of continuously running counters which can be used with
suitable software to provide a clock calendar function, and provides an alarm interrupt and a
periodic interrupt. It is clocked by a 32.768 kHz external crystal, resonator or oscillator, the
internal low power RC oscillator or the high speed external clock divided by 128. The
internal low-speed RC has a typical frequency of 40 kHz. The RTC can be calibrated using
an external 512 Hz output to compensate for any natural quartz deviation. The RTC features
a 32-bit programmable counter for long term measurement using the Compare register to
generate an alarm. A 20-bit prescaler is used for the time base clock and is by default
configured to generate a time base of 1 second from a clock at 32.768 kHz.
2.3.18
Timers and watchdogs
The XL-density STM32F101xx access line devices include up to ten general-purpose
timers, two basic timers, two watchdog timers and a SysTick timer.
Table 4: STM32F101xF and STM32F101xG timer feature comparison compares the
features of the general-purpose and basic timers.
Table 4.
STM32F101xF and STM32F101xG timer feature comparison
Counter
resolution
Timer
TIM2, TIM3,
TIM4, TIM5
16-bit
TIM9, TIM12
16-bit
TIM10, TIM11,
TIM13, TIM14
TIM6, TIM7
Counter
type
Prescaler factor
DMA
Capture/compare Complementary
request
channels
outputs
generation
Up, down, Any integer between
up/down
1 and 65536
Yes
4
No
Up
Any integer between
1 and 65536
No
2
No
16-bit
Up
Any integer between
1 and 65536
No
1
No
16-bit
Up
Any integer between
1 and 65536
Yes
0
No
General-purpose timers (TIMx)
There are 10 synchronizable general-purpose timers embedded in the STM32F101xF and
STM32F101xG XL-density access line devices (see Table 4 for differences).
●
TIM2, TIM3, TIM4, TIM5
There are up to 4 synchronizable general-purpose timers (TIM2, TIM3, TIM4 and TIM5)
embedded in the STM32F101xF and STM32F101xG access line devices.
These timers are based on a 16-bit auto-reload up/down counter, a 16-bit prescaler
and feature 4 independent channels each for input capture/output compare, PWM or
Doc ID 17143 Rev 2
19/108
Description
STM32F101xF, STM32F101xG
one-pulse mode output. This gives up to 16 input captures / output compares / PWMs
on the largest packages.
Their counter can be frozen in debug mode. Any of the general-purpose timers can be
used to generate PWM outputs. They all have independent DMA request generation.
These timers are capable of handling quadrature (incremental) encoder signals and the
digital outputs from 1 to 3 hall-effect sensors.
●
TIM10, TIM11 and TIM9
These timers are based on a 16-bit auto-reload upcounter and a 16-bit prescaler.
TIM10 and TIM11 feature one independent channel, whereas TIM9 has two
independent channels for input capture/output compare, PWM or one-pulse mode
output. They can be synchronized with the TIM2, TIM3, TIM4, TIM5 full-featured
general-purpose timers. They can also be used as simple time bases.
●
TIM13, TIM14 and TIM12
These timers are based on a 16-bit auto-reload upcounter and a 16-bit prescaler.
TIM13 and TIM14 feature one independent channel, whereas TIM12 has two
independent channels for input capture/output compare, PWM or one-pulse mode
output. They can be synchronized with the TIM2, TIM3, TIM4, TIM5 full-featured
general-purpose timers. They can also be used as simple time bases.
Basic timers TIM6 and TIM7
These timers are mainly used for DAC trigger generation. They can also be used as a
generic 16-bit time base.
Independent watchdog
The independent watchdog is based on a 12-bit downcounter and 8-bit prescaler. It is
clocked from an independent 40 kHz internal RC and as it operates independently from the
main clock, it can operate in Stop and Standby modes. It can be used either as a watchdog
to reset the device when a problem occurs, or as a free running timer for application timeout
management. It is hardware or software configurable through the option bytes. The counter
can be frozen in debug mode.
Window watchdog
The window watchdog is based on a 7-bit downcounter that can be set as free running. It
can be used as a watchdog to reset the device when a problem occurs. It is clocked from the
main clock. It has an early warning interrupt capability and the counter can be frozen in
debug mode.
SysTick timer
This timer is dedicated to real-time operating systems, but could also be used as a standard
down counter. It features:
20/108
●
A 24-bit down counter
●
Autoreload capability
●
Maskable system interrupt generation when the counter reaches 0.
●
Programmable clock source
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
2.3.19
Description
I²C bus
Up to two I²C bus interfaces can operate in multi-master and slave modes. They support
standard and fast modes.
They support 7/10-bit addressing mode and 7-bit dual addressing mode (as slave). A
hardware CRC generation/verification is embedded.
They can be served by DMA and they support SMBus 2.0/PMBus.
2.3.20
Universal synchronous/asynchronous receiver transmitters (USARTs)
The STM32F101xF and STM32F101xG access line embeds three universal
synchronous/asynchronous receiver transmitters (USART1, USART2 and USART3) and
two universal asynchronous receiver transmitters (UART4 and UART5).
These five interfaces provide asynchronous communication, IrDA SIR ENDEC support,
multiprocessor communication mode, single-wire half-duplex communication mode and
have LIN Master/Slave capability. The five interfaces are able to communicate at speeds of
up to 2.25 Mbit/s.
USART1, USART2 and USART3 also provide hardware management of the CTS and RTS
signals, Smart Card mode (ISO 7816 compliant) and SPI-like communication capability. All
interfaces can be served by the DMA controller except for UART5.
2.3.21
Serial peripheral interface (SPI)
Up to three SPIs are able to communicate up to 18 Mbits/s in slave and master modes in
full-duplex and simplex communication modes. The 3-bit prescaler gives 8 master mode
frequencies and the frame is configurable to 8 bits or 16 bits. The hardware CRC
generation/verification supports basic SD Card/MMC modes.
All SPIs can be served by the DMA controller.
2.3.22
GPIOs (general-purpose inputs/outputs)
Each of the GPIO pins can be configured by software as output (push-pull or open-drain), as
input (with or without pull-up or pull-down) or as peripheral alternate function. Most of the
GPIO pins are shared with digital or analog alternate functions. All GPIOs are high currentcapable except for analog inputs.
The I/Os alternate function configuration can be locked if needed following a specific
sequence in order to avoid spurious writing to the I/Os registers.
2.3.23
ADC (analog to digital converter)
A 12-bit analog-to-digital converter is embedded into STM32F101xF and STM32F101xG
access line devices. It has up to 16 external channels, performing conversions in single-shot
or scan modes. In scan mode, automatic conversion is performed on a selected group of
analog inputs.
The ADC can be served by the DMA controller.
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all selected channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
Doc ID 17143 Rev 2
21/108
Description
STM32F101xF, STM32F101xG
The events generated by the general-purpose timers (TIMx) can be internally connected to
the ADC start trigger and injection trigger, respectively, to allow the application to
synchronize A/D conversion and timers.
2.3.24
DAC (digital-to-analog converter)
The two 12-bit buffered DAC channels can be used to convert two digital signals into two
analog voltage signal outputs. The chosen design structure is composed of integrated
resistor strings and an amplifier in inverting configuration.
This dual digital Interface supports the following features:
●
two DAC converters: one for each output channel
●
8-bit or 12-bit monotonic output
●
left or right data alignment in 12-bit mode
●
synchronized update capability
●
noise-wave generation
●
triangular-wave generation
●
dual DAC channel independent or simultaneous conversions
●
DMA capability for each channel
●
external triggers for conversion
●
input voltage reference VREF+
Seven DAC trigger inputs are used in the STM32F101xF and STM32F101xG access line
family. The DAC channels are triggered through the timer update outputs that are also
connected to different DMA channels.
2.3.25
Temperature sensor
The temperature sensor has to generate a voltage that varies linearly with temperature. The
conversion range is between 2 V < VDDA < 3.6 V. The temperature sensor is internally
connected to the ADC_IN16 input channel which is used to convert the sensor output
voltage into a digital value.
2.3.26
Serial wire JTAG debug port (SWJ-DP)
The ARM SWJ-DP Interface is embedded, and is a combined JTAG and serial wire debug
port that enables either a serial wire debug or a JTAG probe to be connected to the target.
The JTAG TMS and TCK pins are shared respectively with SWDIO and SWCLK and a
specific sequence on the TMS pin is used to switch between JTAG-DP and SW-DP.
2.3.27
Embedded Trace Macrocell™
The ARM® Embedded Trace Macrocell provides a greater visibility of the instruction and
data flow inside the CPU core by streaming compressed data at a very high rate from the
STM32F10xxx through a small number of ETM pins to an external hardware trace port
analyzer (TPA) device. The TPA is connected to a host computer using Ethernet, or any
other high-speed channel. Real-time instruction and data flow activity can be recorded and
then formatted for display on the host computer running debugger software. TPA hardware
is commercially available from common development tool vendors. It operates with third
party debugger software tools.
22/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Pinouts and pin descriptions
Pinouts and pin descriptions
Figure 3.
STM32F101xF and STM32F101xG access line LQFP144 pinout
144
143
142
141
140
139
138
137
136
135
134
133
132
131
130
129
128
127
126
125
124
123
122
121
120
119
118
117
116
115
114
113
112
111
110
109
VDD_3
VSS_3
PE1
PE0
PB9
PB8
BOOT0
PB7
PB6
PB5
PB4
PB3
PG15
VDD_11
VSS_11
PG14
PG13
PG12
PG11
PG10
PG9
PD7
PD6
VDD_10
VSS_10
PD5
PD4
PD3
PD2
PD1
PD0
PC12
PC11
PC10
PA15
PA14
3
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
108
107
106
105
104
103
102
101
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
75
74
73
VDD_2
VSS_2
NC
PA13
PA12
PA11
PA10
PA9
PA8
PC9
PC8
PC7
PC6
VDD_9
VSS_9
PG8
PG7
PG6
PG5
PG4
PG3
PG2
PD15
PD14
VDD_8
VSS_8
PD13
PD12
PD11
PD10
PD9
PD8
PB15
PB14
PB13
PB12
VSS_6
VDD_6
PF13
PF14
PF15
PG0
PG1
PE7
PE8
PE9
VSS_7
VDD_7
PE10
PE11
PE12
PE13
PE14
PE15
PB10
PB11
VSS_1
VDD_1
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
LQFP144
PA3
VSS_4
VDD_4
PA4
PA5
PA6
PA7
PC4
PC5
PB0
PB1
PB2
PF11
PF12
PE2
PE3
PE4
PE5
PE6
VBAT
PC13-TAMPER-RTC
PC14-OSC32_IN
PC15-OSC32_OUT
PF0
PF1
PF2
PF3
PF4
PF5
VSS_5
VDD_5
PF6
PF7
PF8
PF9
PF10
OSC_IN
OSC_OUT
NRST
PC0
PC1
PC2
PC3
VSSA
VREFVREF+
VDDA
PA0-WKUP
PA1
PA2
ai14667
Doc ID 17143 Rev 2
23/108
Pinouts and pin descriptions
STM32F101xF and STM32F101xG LQFP100 pinout
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
VDD_3
VSS_3
PE1
PE0
PB9
PB8
BOOT0
PB7
PB6
PB5
PB4
PB3
PD7
PD6
PD5
PD4
PD3
PD2
PD1
PD0
PC12
PC11
PC10
PA15
PA14
Figure 4.
STM32F101xF, STM32F101xG
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
LQFP100
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
VDD_2
VSS_2
NC
PA 13
PA 12
PA 11
PA 10
PA 9
PA 8
PC9
PC8
PC7
PC6
PD15
PD14
PD13
PD12
PD11
PD10
PD9
PD8
PB15
PB14
PB13
PB12
PA3
VSS_4
VDD_4
PA4
PA5
PA6
PA7
PC4
PC5
PB0
PB1
PB2
PE7
PE8
PE9
PE10
PE11
PE12
PE13
PE14
PE15
PB10
PB11
VSS_1
VDD_1
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
PE2
PE3
PE4
PE5
PE6
VBAT
PC13-TAMPER-RTC
PC14-OSC32_IN
PC15-OSC32_OUT
VSS_5
VDD_5
OSC_IN
OSC_OUT
NRST
PC0
PC1
PC2
PC3
VSSA
VREFVREF+
VDDA
PA0-WKUP
PA1
PA2
ai14391
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Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
STM32F101xF and STM32F101xG LQFP64 pinout
VDD_3
VSS_3
PB9
PB8
BOOT0
PB7
PB6
PB5
PB4
PB3
PD2
PC12
PC11
PC10
PA15
PA14
Figure 5.
Pinouts and pin descriptions
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
48
1
47
2
46
3
45
4
44
5
43
6
42
7
41
8
LQFP64
40
9
39
10
38
11
37
12
36
13
35
14
34
15
33
16
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
VDD_2
VSS_2
PA13
PA12
PA11
PA10
PA9
PA8
PC9
PC8
PC7
PC6
PB15
PB14
PB13
PB12
PA3
VSS_4
VDD_4
PA4
PA5
PA6
PA7
PC4
PC5
PB0
PB1
PB2
PB10
PB11
VSS_1
VDD_1
VBAT
PC13-TAMPER-RTC
PC14-OSC32_IN
PC15-OSC32_OUT
PD0-OSC_IN
PD1-OSC_OUT
NRST
PC0
PC1
PC2
PC3
VSSA
VDDA
PA0-WKUP
PA1
PA2
ai14392
STM32F101xF and STM32F101xG pin definitions
Alternate functions(4)
LQFP100
Default
LQFP64
Main
function(3)
(after reset)
LQFP144
Type(1)
Pins
I / O level(2)
Table 5.
Pin name
1
-
1
PE2
I/O FT
PE2
TRACECLK / FSMC_A23
2
-
2
PE3
I/O FT
PE3
TRACED0 / FSMC_A19
3
-
3
PE4
I/O FT
PE4
TRACED1 / FSMC_A20
4
-
4
PE5
I/O FT
PE5
TRACED2 / FSMC_A21
TIM9_CH1
5
-
5
PE6
I/O FT
PE6
TRACED3 / FSMC_A22
TIM9_CH2
6
1
6
VBAT
(5)
S
VBAT
I/O
PC13(6)
TAMPER-RTC
7
2
7
PC13-TAMPER-RTC
8
3
8
PC14-OSC32_IN(5)
I/O
PC14(6)
OSC32_IN
9
4
9
PC15-OSC32_OUT(5)
I/O
PC15(6)
OSC32_OUT
10
-
-
PF0
I/O FT
PF0
FSMC_A0
11
-
-
PF1
I/O FT
PF1
FSMC_A1
12
-
-
PF2
I/O FT
PF2
FSMC_A2
13
-
-
PF3
I/O FT
PF3
FSMC_A3
14
-
-
PF4
I/O FT
PF4
FSMC_A4
15
-
-
PF5
I/O FT
PF5
FSMC_A5
16
-
10
VSS_5
S
VSS_5
17
-
11
VDD_5
S
VDD_5
Doc ID 17143 Rev 2
Remap
25/108
Pinouts and pin descriptions
STM32F101xF and STM32F101xG pin definitions (continued)
Alternate functions(4)
Remap
LQFP100
Default
LQFP64
Main
function(3)
(after reset)
LQFP144
Type(1)
Pins
I / O level(2)
Table 5.
STM32F101xF, STM32F101xG
18
-
-
PF6
I/O
PF6
FSMC_NIORD
TIM10_CH1
19
-
-
PF7
I/O
PF7
FSMC_NREG
TIM11_CH1
20
-
-
PF8
I/O
PF8
FSMC_NIOWR
TIM3_CH1
21
-
-
PF9
I/O
PF9
FSMC_CD
TIM14_CH1
22
-
-
PF10
I/O
PF10
FSMC_INTR
23
5
12
OSC_IN
I
OSC_IN
24
6
13
OSC_OUT
O
OSC_OUT
25
7
14
NRST
I/O
NRST
26
8
15
PC0
I/O
PC0
ADC_IN10
27
9
16
PC1
I/O
PC1
ADC_IN11
28 10 17
PC2
I/O
PC2
ADC_IN12
29 11 18
PC3
I/O
PC3
ADC_IN13
30 12 19
VSSA
S
VSSA
31
-
20
VREF-
S
VREF-
32
-
21
VREF+
S
VREF+
33 13 22
VDDA
S
VDDA
34 14 23
PA0-WKUP
I/O
PA0
WKUP/ USART2_CTS(7)/
ADC_IN0 / TIM5_CH1/
TIM2_CH1_ETR(7)
PA1
USART2_RTS(7)/
ADC_IN1 / TIM5_CH2
TIM2_CH2(7)
35 15 24
Pin name
PA1
I/O
36 16 25
PA2
I/O
PA2
USART2_TX(7)/
TIM5_CH3 / ADC_IN2/
TIM2_CH3(7) / TIM9_CH1
37 17 26
PA3
I/O
PA3
USART2_RX(7) / TIM5_CH4/
ADC_IN3 / TIM2_CH4(7)/
TIM9_CH2
38 18 27
VSS_4
S
VSS_4
39 19 28
VDD_4
S
VDD_4
40 20 29
PA4
I/O
PA4
SPI1_NSS/ DAC_OUT1 /
ADC_IN4 / USART2_CK(7)
41 21 30
PA5
I/O
PA5
SPI1_SCK / DAC_OUT2 /
ADC_IN5
42 22 31
PA6
I/O
PA6
SPI1_MISO / ADC_IN6 /
TIM3_CH1(7) / TIM13_CH1
26/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
STM32F101xF and STM32F101xG pin definitions (continued)
Pin name
Type(1)
LQFP100
LQFP64
LQFP144
Pins
I / O level(2)
Table 5.
Pinouts and pin descriptions
Alternate functions(4)
Main
function(3)
(after reset)
Default
Remap
43 23 32
PA7
I/O
PA7
SPI1_MOSI / ADC_IN7 /
TIM3_CH2(7)/ TIM14_CH1
44 24 33
PC4
I/O
PC4
ADC_IN14
45 25 34
PC5
I/O
PC5
ADC_IN15
46 26 35
PB0
I/O
PB0
ADC_IN8 / TIM3_CH3(7)
47 27 36
PB1
I/O
PB1
ADC_IN9 / TIM3_CH4(7)
48 28 37
PB2
I/O FT
PB2/BOOT1
49
-
-
PF11
I/O FT
PF11
FSMC_NIOS16
50
-
-
PF12
I/O FT
PF12
FSMC_A6
51
-
-
VSS_6
S
VSS_6
52
-
-
VDD_6
S
VDD_6
53
-
-
PF13
I/O FT
PF13
FSMC_A7
54
-
-
PF14
I/O FT
PF14
FSMC_A8
55
-
-
PF15
I/O FT
PF15
FSMC_A9
56
-
-
PG0
I/O FT
PG0
FSMC_A10
57
-
-
PG1
I/O FT
PG1
FSMC_A11
58
-
38
PE7
I/O FT
PE7
FSMC_D4
59
-
39
PE8
I/O FT
PE8
FSMC_D5
60
-
40
PE9
I/O FT
PE9
FSMC_D6
61
-
-
VSS_7
S
VSS_7
62
-
-
VDD_7
S
VDD_7
63
-
41
PE10
I/O FT
PE10
FSMC_D7
64
-
42
PE11
I/O FT
PE11
FSMC_D8
65
-
43
PE12
I/O FT
PE12
FSMC_D9
66
-
44
PE13
I/O FT
PE13
FSMC_D10
67
-
45
PE14
I/O FT
PE14
FSMC_D11
68
-
46
PE15
I/O FT
PE15
FSMC_D12
69 29 47
PB10
I/O FT
PB10
I2C2_SCL / USART3_TX(7)
TIM2_CH3
70 30 48
PB11
I/O FT
PB11
I2C2_SDA / USART3_RX(7)
TIM2_CH4
71 31 49
VSS_1
S
VSS_1
72 32 50
VDD_1
S
VDD_1
73 33 51
PB12
I/O FT
PB12
SPI2_NSS(7) / I2C2_SMBA /
USART3_CK(7)
Doc ID 17143 Rev 2
27/108
Pinouts and pin descriptions
STM32F101xF and STM32F101xG pin definitions (continued)
74 34 52
Pin name
PB13
Type(1)
LQFP100
LQFP64
LQFP144
Pins
I / O level(2)
Table 5.
STM32F101xF, STM32F101xG
I/O FT
Alternate functions(4)
Main
function(3)
(after reset)
Default
PB13
SPI2_SCK(7) /
USART3_CTS(7)
Remap
75 35 53
PB14
I/O FT
PB14
SPI2_MISO(7) /
USART3_RTS(7) /
TIM12_CH1
76 36 54
PB15
I/O FT
PB15
SPI2_MOSI(7) / TIM12_CH2
77
-
55
PD8
I/O FT
PD8
FSMC_D13
USART3_TX
78
-
56
PD9
I/O FT
PD9
FSMC_D14
USART3_RX
79
-
57
PD10
I/O FT
PD10
FSMC_D15
USART3_CK
80
-
58
PD11
I/O FT
PD11
FSMC_A16
USART3_CTS
81
-
59
PD12
I/O FT
PD12
FSMC_A17
TIM4_CH1 /
USART3_RTS
82
-
60
PD13
I/O FT
PD13
FSMC_A18
TIM4_CH2
83
-
-
VSS_8
S
VSS_8
84
-
-
VDD_8
S
VDD_8
85
-
61
PD14
I/O FT
PD14
FSMC_D0
TIM4_CH3
86
-
62
PD15
I/O FT
PD15
FSMC_D1
TIM4_CH4
87
-
-
PG2
I/O FT
PG2
FSMC_A12
88
-
-
PG3
I/O FT
PG3
FSMC_A13
89
-
-
PG4
I/O FT
PG4
FSMC_A14
90
-
-
PG5
I/O FT
PG5
FSMC_A15
91
-
-
PG6
I/O FT
PG6
FSMC_INT2
92
-
-
PG7
I/O FT
PG7
FSMC_INT3
93
-
-
PG8
I/O FT
PG8
94
-
-
VSS_9
S
VSS_9
95
-
-
VDD_9
S
VDD_9
96 37 63
PC6
I/O FT
PC6
TIM3_CH1
97 38 64
PC7
I/O FT
PC7
TIM3_CH2
98 39 65
PC8
I/O FT
PC8
TIM3_CH3
99 40 66
PC9
I/O FT
PC9
TIM3_CH4
100 41 67
PA8
I/O FT
PA8
USART1_CK / MCO
101 42 68
PA9
I/O FT
PA9
USART1_TX(7)
102 43 69
PA10
I/O FT
PA10
USART1_RX(7)
103 44 70
PA11
I/O FT
PA11
USART1_CTS
28/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
STM32F101xF and STM32F101xG pin definitions (continued)
Pin name
Type(1)
LQFP100
LQFP64
LQFP144
Pins
I / O level(2)
Table 5.
Pinouts and pin descriptions
Alternate functions(4)
Main
function(3)
(after reset)
Default
PA12
USART1_RTS
104 45 71
PA12
I/O FT
105 46 72
PA13
I/O FT JTMS-SWDIO
106
-
73
Remap
PA13
Not connected
107 47 74
VSS_2
S
VSS_2
108 48 75
VDD_2
S
VDD_2
109 49 76
PA14
I/O FT
JTCKSWCLK
110 50 77
PA15
I/O FT
JTDI
SPI3_NSS
TIM2_CH1_ETR/
PA15 /SPI1_NSS
111 51 78
PC10
I/O FT
PC10
UART4_TX
USART3_TX
112 52 79
PC11
I/O FT
PC11
UART4_RX
USART3_RX
113 53 80
PC12
I/O FT
PC12
UART5_TX
USART3_CK
114 5
81
PD0
I/O FT
OSC_IN(8)
FSMC_D2(9)
115 6
82
PD1
I/O FT OSC_OUT(8)
116 54 83
PD2
I/O FT
PD2
TIM3_ETR / UART5_RX
117
-
84
PD3
I/O FT
PD3
FSMC_CLK
USART2_CTS
118
-
85
PD4
I/O FT
PD4
FSMC_NOE
USART2_RTS
119
-
86
PD5
I/O FT
PD5
FSMC_NWE
USART2_TX
120
-
-
VSS_10
S
VSS_10
121
-
-
VDD_10
S
VDD_10
122
-
87
PD6
I/O FT
PD6
FSMC_NWAIT
USART2_RX
123
-
88
PD7
I/O FT
PD7
FSMC_NE1 / FSMC_NCE2
USART2_CK
124
-
-
PG9
I/O FT
PG9
FSMC_NE2 / FSMC_NCE3
125
-
-
PG10
I/O FT
PG10
FSMC_NE3 /
FSMC_NCE4_1
126
-
-
PG11
I/O FT
PG11
FSMC_NCE4_2
127
-
-
PG12
I/O FT
PG12
FSMC_NE4
128
-
-
PG13
I/O FT
PG13
FSMC_A24
129
-
-
PG14
I/O FT
PG14
FSMC_A25
130
-
-
VSS_11
S
VSS_11
131
-
-
VDD_11
S
VDD_11
132
-
-
PG15
I/O FT
PA14
FSMC_D3(9)
PG15
Doc ID 17143 Rev 2
29/108
Pinouts and pin descriptions
STM32F101xF and STM32F101xG pin definitions (continued)
Pin name
Type(1)
LQFP100
LQFP64
LQFP144
Pins
Alternate functions(4)
I / O level(2)
Table 5.
STM32F101xF, STM32F101xG
Main
function(3)
(after reset)
Default
Remap
133 55 89
PB3
I/O FT
JTDO
SPI3_SCK
TIM2_CH2 /PB3
TRACESWO
SPI1_SCK
134 56 90
PB4
I/O FT
NJTRST
SPI3_MISO
PB4 / TIM3_CH1
SPI1_MISO
135 57 91
PB5
I/O
PB5
I2C1_SMBA/ SPI3_MOSI
TIM3_CH2 /
SPI1_MOSI
136 58 92
PB6
I/O FT
PB6
I2C1_SCL / TIM4_CH1(7)
USART1_TX
137 59 93
PB7
I/O FT
PB7
I2C1_SDA / FSMC_NADV /
TIM4_CH2(7)
USART1_RX
138 60 94
BOOT0
139 61 95
PB8
PB8
TIM4_CH3 (7)
I2C1_SCL
PB9
(7)
I2C1_SDA
140 62 96
PB9
I
BOOT0
I/O FT
I/O FT
141
-
97
PE0
I/O FT
PE0
142
-
98
PE1
I/O FT
PE1
143 63 99
VSS_3
S
VSS_3
144 64 100
VDD_3
S
VDD_3
TIM4_CH4
TIM4_ETR(7)
/ FSMC_NBL0
FSMC_NBL1
1. I = input, O = output, S = supply.
2. FT = 5 V tolerant.
3. Function availability depends on the chosen device.
4. If several peripherals share the same I/O pin, to avoid conflict between these alternate functions only one peripheral should
be enabled at a time through the peripheral clock enable bit (in the corresponding RCC peripheral clock enable register).
5. PC13, PC14 and PC15 are supplied through the power switch. Since the switch only sinks a limited amount of current
(3 mA), the use of GPIOs PC13 to PC15 in output mode is limited: the speed should not exceed 2 MHz with a maximum
load of 30 pF and these IOs must not be used as a current source (e.g. to drive an LED).
6. Main function after the first backup domain power-up. Later on, it depends on the contents of the Backup registers even
after reset (because these registers are not reset by the main reset). For details on how to manage these IOs, refer to the
Battery backup domain and BKP register description sections in the STM32F10xxx reference manual, available from the
STMicroelectronics website: www.st.com.
7. This alternate function can be remapped by software to some other port pins (if available on the used package). For more
details, refer to the Alternate function I/O and debug configuration section in the STM32F10xxx reference manual,
available from the STMicroelectronics website: www.st.com.
8. For the LQFP64 package, the pins number 5 and 6 are configured as OSC_IN/OSC_OUT after reset, however the
functionality of PD0 and PD1 can be remapped by software on these pins. For the LQFP100 and LQFP144 packages, PD0
and PD1 are available by default, so there is no need for remapping. For more details, refer to Alternate function I/O and
debug configuration section in the STM32F10xxx reference manual
9. For devices delivered in LQFP64 packages, the FSMC function is not available.
30/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Table 6.
Pinouts and pin descriptions
FSMC pin definition
FSMC
Pins
LQFP100(1)
NOR/PSRAM/
SRAM
NOR/PSRAM
Mux
PE2
A23
A23
Yes
PE3
A19
A19
Yes
PE4
A20
A20
Yes
PE5
A21
A21
Yes
PE6
A22
A22
Yes
CF
CF/IDE
NAND 16 bit
PF0
A0
A0
A0
-
PF1
A1
A1
A1
-
PF2
A2
A2
A2
-
PF3
A3
A3
-
PF4
A4
A4
-
PF5
A5
A5
-
PF6
NIORD
NIORD
-
PF7
NREG
NREG
-
PF8
NIOWR
NIOWR
-
PF9
CD
CD
-
PF10
INTR
INTR
-
PF11
NIOS16
NIOS16
-
PF12
A6
A6
-
PF13
A7
A7
-
PF14
A8
A8
-
PF15
A9
A9
-
PG0
A10
A10
-
A11
-
PG1
PE7
D4
D4
D4
DA4
D4
Yes
PE8
D5
D5
D5
DA5
D5
Yes
PE9
D6
D6
D6
DA6
D6
Yes
PE10
D7
D7
D7
DA7
D7
Yes
PE11
D8
D8
D8
DA8
D8
Yes
PE12
D9
D9
D9
DA9
D9
Yes
PE13
D10
D10
D10
DA10
D10
Yes
PE14
D11
D11
D11
DA11
D11
Yes
PE15
D12
D12
D12
DA12
D12
Yes
PD8
D13
D13
D13
DA13
D13
Yes
Doc ID 17143 Rev 2
31/108
Pinouts and pin descriptions
Table 6.
STM32F101xF, STM32F101xG
FSMC pin definition (continued)
FSMC
Pins
CF/IDE
NOR/PSRAM/
SRAM
NOR/PSRAM
Mux
NAND 16 bit
PD9
D14
D14
D14
DA14
D14
Yes
PD10
D15
D15
D15
DA15
D15
Yes
PD11
A16
A16
CLE
Yes
PD12
A17
A17
ALE
Yes
PD13
A18
A18
Yes
PD14
D0
D0
D0
DA0
D0
Yes
PD15
D1
D1
D1
DA1
D1
Yes
PG2
A12
-
PG3
A13
-
PG4
A14
-
PG5
A15
-
PG6
INT2
-
PG7
INT3
-
PD0
D2
D2
D2
DA2
D2
Yes
PD1
D3
D3
D3
DA3
D3
Yes
CLK
CLK
PD3
Yes
PD4
NOE
NOE
NOE
NOE
NOE
Yes
PD5
NWE
NWE
NWE
NWE
NWE
Yes
PD6
NWAIT
NWAIT
NWAIT
NWAIT
NWAIT
Yes
PD7
NE1
NE1
NCE2
Yes
PG9
NE2
NE2
NCE3
-
NE3
NE3
PG10
NCE4_1
NCE4_1
PG11
NCE4_2
NCE4_2
-
PG12
NE4
NE4
-
PG13
A24
A24
-
PG14
A25
A25
-
PB7
NADV
NADV
Yes
PE0
NBL0
NBL0
Yes
PE1
NBL1
NBL1
Yes
1. Ports F and G are not available in devices delivered in 100-pin packages.
32/108
LQFP100(1)
CF
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
4
Memory mapping
Memory mapping
The memory map is shown in Figure 6.
Figure 6.
Memory map
Reserved
FSMC register
0x9000 0000 - 0x9FFF FFFF
0x8000 0000 - 0x8FFF FFFF
0x6C00 0000 - 0x6FFF FFFF
FSMC bank 1 NOR/PSRAM 3
0x6800 0000 - 0x6BFF FFFF
FSMC bank 1 NOR/PSRAM 2
0x6400 0000 - 0x67FF FFFF
FSMC bank 1 NOR/PSRAM 1
0x6000 0000 - 0x63FF FFFF
Reserved
0x4002 3400 - 0x5FFF FFFF
CRC
0x4002 3000 - 0x4002 33FF
Reserved
0x4002 2400 - 0x4002 2FFF
Flash interfaces 1 & 2
0x4002 2000 - 0x4002 23FF
Reserved
0x4002 1400 - 0x4002 1FFF
512-Mbyte
block 6
Not used
0xC000 0000
0xBFFF FFFF
512-Mbyte
block 5
FSMC register
0x4002 0400 - 0x4002 0FFF
DMA2
0x4002 0400 - 0x4002 07FF
DMA1
0x4002 0000 - 0x4002 03FF
0x8000 0000
0x7FFF FFFF
0x6000 0000
0x5FFF FFFF
512-Mbyte
block 4
FSMC bank3
& bank4
0x4001 5000 - 0x4001 53FF
TIM9
0x4001 4C00 - 0x4001 4FFF
Reserved
0x4001 3C00 - 0x4001 4BFF
USART1
0x4001 3800 - 0x4001 3BFF
Reserved
0x4001 3400 - 0x4001 37FF
SPI1
0x4001 3000 - 0x4001 33FF
Reserved
0x4001 2800 - 0x4001 2FFF
ADC1
0x4001 2400 - 0x4001 27FF
Port G
0x4001 2000 - 0x4001 23FF
Port F
0x4001 1C00 - 0x4001 1FFF
Port E
0x4001 1800 - 0x4001 1BFF
Port D
0x4001 1400 - 0x4001 17FF
Port C
0x4001 1000 - 0x4001 13FF
Port B
0x4001 0C00 - 0x4001 0FFF
Port A
0x4001 0800 - 0x4001 0BFF
0x4000 0000
0x3FFF FFFF
512-Mbyte
block 1
SRAM
0x2000 0000
0x1FFF FFFF
512-Mbyte
block 0
Code
Reserved
0x3FFF FFFF
0x2001 4000
SRAM (80 KB aliased
by bit-banding)
0x2000 0000 - 0x2001 3FFF
Option Bytes
System memory
Reserved
0x1FFF F800 - 0x1FFF F80F
0x1FFF E000- 0x1FFF F7FF
0x0810 0000 - 0x1FFF DFFF
Flash memory bank 2
(256 KB or 512 KB)
0x0808 0000 - 0x080F FFFF
Flash memory bank 1 0x0800 0000 - 0x0807 FFFF
(512 KB)
0x0010 0000 - 0x07FF FFFF
Reserved
Aliased to Flash or system 0x000F FFFF
memory depending on
0x0000 0000
BOOT pins
Doc ID 17143 Rev 2
0x4001 0400 - 0x4001 07FF
AFIO
0x4001 0000 - 0x4001 03FF
Reserved
0x4000 7800 - 0x4000 FFFF
DAC
0x4000 7400 - 0x4000 77FF
0x4000 7000 - 0x4000 73FF
BKP
0x4000 6C00 - 0x4000 6FFF
Reserved
0x4000 5C00 - 0x4000 6BFF
I2C2
0x4000 5800 - 0x4000 5BFF
I2C1
0x4000 5400 - 0x4000 57FF
UART5
0x4000 5000 - 0x4000 53FF
UART4
0x4000 4C00 - 0x4000 4FFF
USART3
0x4000 4800 - 0x4000 4BFF
USART2
512-Mbyte
block 2
Peripherals
0x0000 0000
0x4001 5400 - 0x4001 57FF
TIM10
PWR
512-Mbyte
block 3
FSMC bank1
& bank2
0x4001 5800 - 0x4001 FFFF
TIM11
EXTI
0xA000 0000
0x9FFF FFFF
0x4002 1000 - 0x4002 13FF
Reserved
Reserved
0xE000 0000
0xDFFF FFFF
0x7000 0000 - 0x7FFF FFFF
FSMC bank 1 NOR/PSRAM 4
RCC
512-Mbyte
block 7
Cortex-M3's
internal
peripherals
0xA000 0000 - 0xA000 0FFF
FSMC bank 3 NAND (NAND2)
FSMC bank 2 NAND (NAND1)
0xFFFF FFFF
0xA000 1000 - 0xBFFF FFFF
FSMC bank 4 PCCARD
0x4000 4400 - 0x4000 47FF
Reserved
0x4000 4000 - 0x4000 43FF
SPI3
0x4000 3C00 - 0x4000 3FFF
SPI2
0x4000 3800 - 0x4000 3BFF
Reserved
0x4000 3400 - 0x4000 37FF
IWDG
0x4000 3000 - 0x4000 33FF
WWDG
0x4000 2C00 - 0x4000 2FFF
RTC
0x4000 2800 - 0x4000 2BFF
Reserved
0x4000 2400 - 0x4000 27FF
TIM14
0x4000 2000 - 0x4000 23FF
TIM13
0x4000 1C00 - 0x4000 1FFF
TIM12
TIM7
0x4000 1800 - 0x4000 1BFF
TIM6
0x4000 1000 - 0x4000 13FF
TIM5
0x4000 0C00 - 0x4000 0FFF
TIM4
0x4000 0800 - 0x4000 0BFF
0x4000 1400 - 0x4000 17FF
TIM3
0x4000 0400 - 0x4000 07FF
TIM2
0x4000 0000 - 0x4000 03FF
ai15831
33/108
Electrical characteristics
STM32F101xF, STM32F101xG
5
Electrical characteristics
5.1
Parameter conditions
Unless otherwise specified, all voltages are referenced to VSS.
5.1.1
Minimum and maximum values
Unless otherwise specified the minimum and maximum values are guaranteed in the worst
conditions of ambient temperature, supply voltage and frequencies by tests in production on
100% of the devices with an ambient temperature at TA = 25 °C and TA = TAmax (given by
the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics
are indicated in the table footnotes and are not tested in production. Based on
characterization, the minimum and maximum values refer to sample tests and represent the
mean value plus or minus three times the standard deviation (mean±3).
5.1.2
Typical values
Unless otherwise specified, typical data are based on TA = 25 °C, VDD = 3.3 V (for the
2 V  VDD  3.6 V voltage range). They are given only as design guidelines and are not
tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from
a standard diffusion lot over the full temperature range, where 95% of the devices have an
error less than or equal to the value indicated (mean±2).
5.1.3
Typical curves
Unless otherwise specified, all typical curves are given only as design guidelines and are
not tested.
5.1.4
Loading capacitor
The loading conditions used for pin parameter measurement are shown in Figure 7.
34/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
5.1.5
Electrical characteristics
Pin input voltage
The input voltage measurement on a pin of the device is described in Figure 8.
Figure 7.
Pin loading conditions
Figure 8.
Pin input voltage
STM32F101 PIN
STM32F101 PIN
C=50pF
VIN
ai14123
5.1.6
ai14124
Power supply scheme
Figure 9.
Power supply scheme
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Caution:
In Figure 9, the 4.7 µF capacitor must be connected to VDD3.
Doc ID 17143 Rev 2
35/108
Electrical characteristics
5.1.7
STM32F101xF, STM32F101xG
Current consumption measurement
Figure 10. Current consumption measurement scheme
IDD_VBAT
VBAT
IDD
VDD
VDDA
ai14126
5.2
Absolute maximum ratings
Stresses above the absolute maximum ratings listed in Table 7: Voltage characteristics,
Table 8: Current characteristics, and Table 9: Thermal characteristics may cause permanent
damage to the device. These are stress ratings only and functional operation of the device
at these conditions is not implied. Exposure to maximum rating conditions for extended
periods may affect device reliability.
Table 7.
Symbol
VDD VSS
VIN
|VDDx|
|VSSX VSS|
VESD(HBM)
Voltage characteristics
Ratings
Min
Max
External main supply voltage (including
VDDA and VDD)(1)
–0.3
4.0
Input voltage on five volt tolerant pin(2)
VSS  0.3
VDD+4 V
Input voltage on any other pin(3)
VSS 0.3
4.0
Variations between different VDD power pins
50
Variations between all the different ground
pins
50
Electrostatic discharge voltage (human body
model)
Unit
V
mV
see Section 5.3.12: Absolute
maximum ratings (electrical
sensitivity)
1. All main power (VDD, VDDA) and ground (VSS, VSSA) pins must always be connected to the external power
supply, in the permitted range.
2. Positive injection is not possible on these I/Os. VIN maximum must always be respected. IINJ(PIN) must
never be exceeded. A negative injection is induced by VIN<VSS.
3. IINJ(PIN) must never be exceeded. This is implicitly insured if VIN maximum is respected. If VIN maximum
cannot be respected, the injection current must be limited externally to the IINJ(PIN) value. A positive
injection is induced by VIN>VDD while a negative injection is induced by VIN<VSS
36/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Table 8.
Electrical characteristics
Current characteristics
Symbol
Ratings
Max.
Total current into VDD/VDDA power lines (source)(1)
IVDD
Total current out of VSS ground lines (sink)
IVSS
150
(1)
150
Output current sunk by any I/O and control pin
IIO
25
 25
Output current source by any I/Os and control pin
(3)
Injected current on five volt tolerant pins
IINJ(PIN)(2)
Injected current on any other pin
IINJ(PIN)
mA
-5/+0
(4)
Total injected current (sum of all I/O and control pins)
Unit
±5
(5)
± 25
1. All main power (VDD, VDDA) and ground (VSS, VSSA) pins must always be connected to the external power
supply, in the permitted range.
2. Negative injection disturbs the analog performance of the device. See note in Section 5.3.18: 12-bit ADC
characteristics.
3. Positive injection is not possible on these I/Os. VIN maximum must always be respected. IINJ(PIN) must
never be exceeded. A negative injection is induced by VIN<VSS.
4. IINJ(PIN) must never be exceeded. This is implicitly insured if VIN maximum is respected. If VIN maximum
cannot be respected, the injection current must be limited externally to the IINJ(PIN) value. A positive
injection is induced by VIN>VDD while a negative injection is induced by VIN<VSS.
5. When several inputs are submitted to a current injection, the maximum IINJ(PIN) is the absolute sum of the
positive and negative injected currents (instantaneous values). These results are based on
characterization with IINJ(PIN) maximum current injection on four I/O port pins of the device.
Table 9.
Thermal characteristics
Symbol
TSTG
TJ
Ratings
Storage temperature range
Maximum junction temperature
Doc ID 17143 Rev 2
Value
Unit
–65 to +150
°C
150
°C
37/108
Electrical characteristics
STM32F101xF, STM32F101xG
5.3
Operating conditions
5.3.1
General operating conditions
Table 10.
Symbol
General operating conditions
Parameter
Conditions
Min
Max
fHCLK
Internal AHB clock frequency
0
36
fPCLK1
Internal APB1 clock frequency
0
36
fPCLK2
Internal APB2 clock frequency
0
36
Standard operating voltage
2
3.6
2
3.6
VDD
VDDA(1)
Analog operating voltage
(ADC not used)
Analog operating voltage
(ADC used)
VBAT
Backup operating voltage
PD
Power dissipation at TA =
85 °C(3)
TA
TJ
Ambient temperature
Must be the same potential
as VDD(2)
Unit
MHz
V
V
2.4
3.6
1.8
3.6
LQFP144
666
LQFP100
434
LQFP64
444
V
mW
Maximum power dissipation
–40
85
°C
Low power dissipation(4)
–40
105
°C
–40
105
°C
Junction temperature range
1. When the ADC is used, refer to Table 55: ADC characteristics.
2. It is recommended to power VDD and VDDA from the same source. A maximum difference of 300 mV
between VDD and VDDA can be tolerated during power-up and operation.
3. If TA is lower, higher PD values are allowed as long as TJ does not exceed TJmax (see Table 6.2: Thermal
characteristics on page 104).
4. In low power dissipation state, TA can be extended to this range as long as TJ does not exceed TJmax (see
Table 6.2: Thermal characteristics on page 104).
5.3.2
Operating conditions at power-up / power-down
The parameters given in Table 11 are derived from tests performed under the ambient
temperature condition summarized in Table 10.
Table 11.
Symbol
tVDD
5.3.3
Operating conditions at power-up / power-down
Parameter
Conditions
Min
Max
VDD rise time rate
0

VDD fall time rate
20

Embedded reset and power control block characteristics
The parameters given in Table 12 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 10.
38/108
Doc ID 17143 Rev 2
Unit
µs/V
STM32F101xF, STM32F101xG
.
Table 12.
Embedded reset and power control block characteristics
Symbol
Parameter
Conditions
Programmable voltage
detector level selection
VPVD
VPVDhyst
Electrical characteristics
(2)
VPOR/PDR
VPDRhyst
(2)
Min
Typ
Max
Unit
PLS[2:0]=000 (rising edge)
2.1
2.18
2.26
V
PLS[2:0]=000 (falling edge)
2
2.08
2.16
V
PLS[2:0]=001 (rising edge)
2.19
2.28
2.37
V
PLS[2:0]=001 (falling edge)
2.09
2.18
2.27
V
PLS[2:0]=010 (rising edge)
2.28
2.38
2.48
V
PLS[2:0]=010 (falling edge)
2.18
2.28
2.38
V
PLS[2:0]=011 (rising edge)
2.38
2.48
2.58
V
PLS[2:0]=011 (falling edge)
2.28
2.38
2.48
V
PLS[2:0]=100 (rising edge)
2.47
2.58
2.69
V
PLS[2:0]=100 (falling edge)
2.37
2.48
2.59
V
PLS[2:0]=101 (rising edge)
2.57
2.68
2.79
V
PLS[2:0]=101 (falling edge)
2.47
2.58
2.69
V
PLS[2:0]=110 (rising edge)
2.66
2.78
2.9
V
PLS[2:0]=110 (falling edge)
2.56
2.68
2.8
V
PLS[2:0]=111 (rising edge)
2.76
2.88
3
V
PLS[2:0]=111 (falling edge)
2.66
2.78
2.9
V
PVD hysteresis
100
Power on/power down
reset threshold
mV
Falling edge
1.8(1)
1.88
1.96
V
Rising edge
1.84
1.92
2.0
V
PDR hysteresis
40
tRSTTEMPO(2) Reset temporization
1.5
2.5
mV
3.5
ms
1. The product behavior is guaranteed by design down to the minimum VPOR/PDR value.
2. Guaranteed by design, not tested in production.
Doc ID 17143 Rev 2
39/108
Electrical characteristics
5.3.4
STM32F101xF, STM32F101xG
Embedded reference voltage
The parameters given in Table 13 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 10.
Table 13.
Symbol
VREFINT
Embedded internal reference voltage
Parameter
Internal reference voltage
TS_vrefint(1)
ADC sampling time when reading
the internal reference voltage
VRERINT(2)
Internal reference voltage spread
over the temperature range
TCoeff(2)
Conditions
Min
Typ
Max
Unit
–40 °C < TA < +85 °C
1.16
1.20
1.24
V
5.1
17.1(2)
µs
10
mV
100
ppm/
°C
VDD = 3 V ±10 mV
Temperature coefficient
1. Shortest sampling time can be determined in the application by multiple iterations.
2. Guaranteed by design, not tested in production.
5.3.5
Supply current characteristics
The current consumption is a function of several parameters and factors such as the
operating voltage, ambient temperature, I/O pin loading, device software configuration,
operating frequencies, I/O pin switching rate, program location in memory and executed
binary code.
The current consumption is measured as described in Figure 10: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to Dhrystone 2.1 code.
Maximum current consumption
The MCU is placed under the following conditions:
●
All I/O pins are in input mode with a static value at VDD or VSS (no load)
●
All peripherals are disabled except if it is explicitly mentioned
●
The Flash access time is adjusted to fHCLK frequency (0 wait state from 0 to 24 MHz, 1
wait state from 24 to 36 MHz)
●
Prefetch in on (reminder: this bit must be set before clock setting and bus prescaling)
●
When the peripherals are enabled fPCLK1 = fHCLK/2, fPCLK2 = fHCLK
The parameters given in Table 14 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 10.
Table 14.
Maximum current consumption in Run mode, code with data processing
running from Flash
Max(1)
Symbol
Parameter
Conditions
fHCLK
Unit
TA = 85 °C
40/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Table 14.
Electrical characteristics
Maximum current consumption in Run mode, code with data processing
running from Flash
Max(1)
Symbol
Parameter
Conditions
fHCLK
Unit
TA = 85 °C
External clock (2), all
peripherals enabled
IDD
Supply current
in Run mode
36 MHz
41
24 MHz
29
16 MHz
22
8 MHz
12.5
36 MHz
24
24 MHz
17.5
16 MHz
14
8 MHz
8.5
mA
External clock (2), all
peripherals disabled
1. Based on characterization, not tested in production.
2. External clock is 8 MHz and PLL is on when fHCLK > 8 MHz.
Table 15.
Maximum current consumption in Run mode, code with data processing
running from RAM
Max(1)
Symbol
Parameter
Conditions
fHCLK
Unit
TA = 85 °C
External clock (2), all
peripherals enabled
IDD
Supply current in
Run mode
36 MHz
37
24 MHz
26.5
16 MHz
19
8 MHz
11.5
36 MHz
20.5
24 MHz
15
16 MHz
11
8 MHz
7.5
mA
External clock(2) all
peripherals disabled
1. Based on characterization, tested in production at VDD max, fHCLK max.
2. External clock is 8 MHz and PLL is on when fHCLK > 8 MHz.
Doc ID 17143 Rev 2
41/108
Electrical characteristics
STM32F101xF, STM32F101xG
Figure 11. Typical current consumption in Run mode versus frequency (at 3.6 V) code with data processing running from RAM, peripherals enabled
35
30
8 MHz
16 MHz
Consumption (mA)
25
24 MHz
36 MHz
20
15
10
5
0
-45
25
70
85
Temperature (°C)
Figure 12. Typical current consumption in Run mode versus frequency (at 3.6 V) code with data processing running from RAM, peripherals disabled
18
16
Consumption (mA)
8 MHz
14
16 MHz
12
24 MHz
36 MHz
10
8
6
4
2
0
-45
25
70
Temperature (°C)
42/108
Doc ID 17143 Rev 2
85
STM32F101xF, STM32F101xG
Table 16.
Electrical characteristics
Maximum current consumption in Sleep mode, code running from Flash
or RAM
Max(1)
Symbol
Parameter
Conditions
fHCLK
Unit
TA = 85 °C
External clock(2) all
peripherals enabled
IDD
Supply current in
Sleep mode
36 MHz
27.5
24 MHz
20
16 MHz
15
8 MHz
9
36 MHz
6.9
24 MHz
5.9
16 MHz
5.4
8 MHz
4.7
mA
External clock(2), all
peripherals disabled
1. Based on characterization, tested in production at VDD max, fHCLK max with peripherals enabled.
2. External clock is 8 MHz and PLL is on when fHCLK > 8 MHz.
Table 17.
Typical and maximum current consumptions in Stop and Standby modes
Typ(1)
Symbol
Parameter
Supply current
in Stop mode
IDD
Supply current
in Standby
mode
IDD_VBAT
Conditions
Max
VDD/ VBAT VDD/ VBAT VDD/VBAT TA =
= 2.0 V
= 2.4 V
= 3.3 V 85 °C
Regulator in Run mode,
Low-speed and high-speed internal RC
oscillators and high-speed oscillator
OFF (no independent watchdog)
34.5
35
379
Regulator in Low-power mode,
Low-speed and high-speed internal RC
oscillators and high-speed oscillator
OFF (no independent watchdog)
24.5
25
365
Low-speed internal RC oscillator and
independent watchdog ON
3
3.8
Low-speed internal RC oscillator ON,
independent watchdog OFF
2.8
3.6
Low-speed internal RC oscillator and
independent watchdog OFF, low-speed
oscillator and RTC OFF
1.9
2.1
5(2)
1.1
1.4
2(2)
Backup domain
Low-speed oscillator and RTC ON
supply current
1.05
Unit
µA
1. Typical values are measured at TA = 25 °C.
2. Based on characterization, not tested in production.
Doc ID 17143 Rev 2
43/108
Electrical characteristics
STM32F101xF, STM32F101xG
Figure 13. Typical current consumption on VBAT with RTC on vs. temperature at
different VBAT values
2.5
Consumption (µA)
2
1.8 V
1.5
2V
2.4 V
3.3 V
1
3.6 V
0.5
0
–45
25
85
105
Temperature (°C)
ai17337
Figure 14. Typical current consumption in Stop mode with regulator in run mode
versus temperature at different VDD values
300
Consumption (µA)
250
200
150
100
2.4V
2.7V
3.0V
3.3V
3.6V
50
0
-45
25
70
Temperature (°C)
44/108
Doc ID 17143 Rev 2
85
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 15. Typical current consumption in Stop mode with regulator in low-power
mode versus temperature at different VDD values
300
Consumption (µA)
250
200
150
100
2.4V
2.7V
3.0V
3.3V
3.6V
50
0
-45
25
70
85
Temperature (°C)
Figure 16. Typical current consumption in Standby mode versus temperature at
different VDD values
3.5
3
Consumption (µA)
2.5
2
1.5
1
2.4V
2.7V
3.0V
3.3V
3.6V
0.5
0
-45
25
70
85
Temperature (°C)
Doc ID 17143 Rev 2
45/108
Electrical characteristics
STM32F101xF, STM32F101xG
Typical current consumption
The MCU is placed under the following conditions:
●
All I/O pins are in input mode with a static value at VDD or VSS (no load)
●
All peripherals are disabled except if it is explicitly mentioned
●
The Flash access time is adjusted to fHCLK frequency (0 wait state from 0 to 24 MHz, 1
wait state from 24 to 36 MHz)
●
Prefetch is on (reminder: this bit must be set before clock setting and bus prescaling)
●
When the peripherals are enabled fPCLK1 = fHCLK/4, fPCLK2 = fHCLK/2, fADCCLK =
fPCLK2/4
●
When the peripherals are enabled fPCLK1 = fHCLK, fPCLK2 = fHCLK, fADCCLK = fPCLK2/2
The parameters given in Table 18 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 10.
Table 18.
Symbol
Typical current consumption in Run mode, code with data processing
running from Flash
Parameter
Conditions
External
clock(3)
IDD
Supply
current in
Run mode
Typ(1)
Typ(1)
All peripherals
enabled(2)
All peripherals
disabled
36 MHz
28.5
18.7
24 MHz
24.1
12.8
16 MHz
14
9.2
8 MHz
7.7
5.4
4 MHz
4.6
3.4
2 MHz
3
2.3
1 MHz
2.2
1.8
500 kHz
1.7
1.5
125 kHz
1.4
1.3
36 MHz
27.5
17.5
24 MHz
18.9
11.6
16 MHz
12.2
8.2
8 MHz
7.2
4.8
4 MHz
4
2.7
2 MHz
2.3
1.7
1 MHz
1.5
1.2
500 kHz
1.1
0.9
125 kHz
0.75
0.7
fHCLK
mA
Running on
high speed
internal RC
(HSI), AHB
prescaler
used to
reduce the
frequency
1. Typical values are measures at TA = 25 °C, VDD = 3.3 V.
2. Add an additional power consumption of 0.8 mA per ADC for the analog part. In applications, this
consumption occurs only while the ADC is on (ADON bit is set in the ADC_CR2 register).
3. External clock is 8 MHz and PLL is on when fHCLK > 8 MHz.
46/108
Unit
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Table 19.
Electrical characteristics
Typical current consumption in Sleep mode, code running from Flash or
RAM
Typ(1)
Symbol
Parameter
Conditions
(3)
External clock
Supply
current in
Sleep mode
IDD
fHCLK
Typ(1)
All peripherals All peripherals
enabled(2)
disabled
36 MHz
17.7
4
24 MHz
12.2
3.1
16 MHz
8.4
2.3
8 MHz
4.6
1.5
4 MHz
3
1.3
2 MHz
2.15
1.25
1 MHz
1.7
1.2
500 kHz
1.5
1.15
125 kHz
1.35
1.15
36 MHz
17
3.35
24 MHz
11.6
2.3
16 MHz
7.7
1.6
8 MHz
3.9
0.8
4 MHz
2.3
0.7
2 MHz
1.5
0.6
1 MHz
1.1
0.5
500 kHz
0.9
0.5
125 kHz
0.7
0.5
Unit
mA
Running on High
Speed Internal
RC (HSI), AHB
prescaler used to
reduce the
frequency
1. Typical values are measures at TA = 25 °C, VDD = 3.3 V.
2. Add an additional power consumption of 0.8 mA per ADC for the analog part. In applications, this
consumption occurs only while the ADC is on (ADON bit is set in the ADC_CR2 register).
3. External clock is 8 MHz and PLL is on when fHCLK > 8 MHz.
On-chip peripheral current consumption
The current consumption of the on-chip peripherals is given in Table 20. The MCU is placed
under the following conditions:
●
all I/O pins are in input mode with a static value at VDD or VSS (no load)
●
all peripherals are disabled unless otherwise mentioned
●
the given value is calculated by measuring the current consumption
●
–
with all peripherals clocked off
–
with only one peripheral clocked on
ambient operating temperature and VDD supply voltage conditions summarized in
Table 7.
Doc ID 17143 Rev 2
47/108
Electrical characteristics
Table 20.
STM32F101xF, STM32F101xG
Peripheral current consumption
Peripheral
APB1
TIM2
0.8
TIM3
0.8
TIM4
0.8
TIM5
0.75
TIM6
0.3
TIM7
0.3
TIM12
0.5
TIM13
0.4
TIM14
0.4
SPI2
0.3
SPI3
0.3
USART2
0.35
USART3
0.35
USART4
0.35
USART5
0.35
I2C1
0.3
I2C2
0.3
CAN
0.45
DAC
48/108
Typical consumption at 25 °C(1)
(2)
1.05
Doc ID 17143 Rev 2
Unit
mA
STM32F101xF, STM32F101xG
Table 20.
Electrical characteristics
Peripheral current consumption (continued)
Peripheral
APB2
Typical consumption at 25 °C(1)
GPIOA
0.35
GPIOB
0.4
GPIOC
0.4
GPIOD
0.4
GPIOE
0.4
GPIOF
0.4
GPIOG
0.4
TIM1
1
TIM8
1
TIM9
0.5
TIM10
0.4
TIM11
0.4
(3)
1.4
ADC2(3)
1.4
(3)
1.4
ADC1
ADC3
SPI1
0.3
USART1
0.6
Unit
mA
1. fHCLK = 36 MHz, fAPB1 = fHCLK/2, fAPB2 = fHCLK, default prescaler value for each peripheral.
2. Specific conditions for DAC: EN1, EN2 bits in the DAC_CR register are set to 1 and the converted value
set to 0x800.
3. Specific conditions for ADC: fHCLK = 28 MHz, fAPB1 = fHCLK/2, fAPB2 = fHCLK, fADCCLK = fAPB2/2, ADON bit
in the ADC_CR2 register is set to 1.
5.3.6
External clock source characteristics
High-speed external user clock generated from an external source
The characteristics given in Table 21 result from tests performed using an high-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 10.
Doc ID 17143 Rev 2
49/108
Electrical characteristics
Table 21.
STM32F101xF, STM32F101xG
High-speed external user clock characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
8
25
MHz
fHSE_ext
User external clock source
frequency(1)
1
VHSEH
OSC_IN input pin high level
voltage
0.7VDD
VDD
VHSEL
OSC_IN input pin low level
voltage
VSS
0.3VDD
tw(HSE)
tw(HSE)
OSC_IN high or low time(1)
16
tr(HSE)
tf(HSE)
OSC_IN rise or fall time(1)
V
Cin(HSE)
ns
20
OSC_IN input capacitance(1)
5
DuCy(HSE) Duty cycle
IL
pF
45
VSS  VIN  VDD
OSC_IN Input leakage current
55
%
±1
µA
1. Guaranteed by design, not tested in production
Low-speed external user clock generated from an external source
The characteristics given in Table 22 result from tests performed using an low-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 10.
Table 22.
Symbol
Low-speed user external clock characteristics
Parameter
Conditions
Min
fLSE_ext
User external clock source
frequency(1)
VLSEH
OSC32_IN input pin high
level voltage
VLSEL
OSC32_IN input pin low level
voltage
VSS
tw(LSE)
tw(LSE)
OSC32_IN high or low time(1)
450
Typ
Max
Unit
32.768
1000
kHz
VDD
0.7VDD
V
tr(LSE)
tf(LSE)
Cin(LSE)
ns
OSC32_IN rise or fall
time(1)
50
OSC32_IN input
capacitance(1)
5
DuCy(LSE) Duty cycle
IL
30
OSC32_IN Input leakage
current
VSS  VIN  VDD
1. Guaranteed by design, not tested in production.
50/108
0.3VDD
Doc ID 17143 Rev 2
pF
70
%
±1
µA
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 17. High-speed external clock source AC timing diagram
VHSEH
90%
VHSEL
10%
tr(HSE)
tf(HSE)
tW(HSE)
t
tW(HSE)
THSE
External
clock source
fHSE_ext
OSC _IN
IL
STM32F10xxx
ai14127b
Figure 18. Low-speed external clock source AC timing diagram
VLSEH
90%
VLSEL
10%
tr(LSE)
tf(LSE)
tW(LSE)
OSC32_IN
IL
tW(LSE)
t
TLSE
External
clock source
fLSE_ext
STM32F10xxx
ai14140c
Doc ID 17143 Rev 2
51/108
Electrical characteristics
STM32F101xF, STM32F101xG
High-speed external clock generated from a crystal/ceramic resonator
The high-speed external (HSE) clock can be supplied with a 4 to 16 MHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on characterization
results obtained with typical external components specified in Table 23. In the application,
the resonator and the load capacitors have to be placed as close as possible to the oscillator
pins in order to minimize output distortion and startup stabilization time. Refer to the crystal
resonator manufacturer for more details on the resonator characteristics (frequency,
package, accuracy).
Table 23.
Symbol
fOSC_IN
HSE 4-16 MHz oscillator characteristics(1)(2)
Parameter
Conditions
Oscillator frequency
Min
Typ
Max
Unit
4
8
16
MHz
RF
Feedback resistor
200
k
C
Recommended load capacitance
versus equivalent serial
RS = 30
resistance of the crystal (RS)(3)
30
pF
i2
HSE driving current
VDD = 3.3 V
VIN = VSS with 30 pF
load
gm
Oscillator transconductance
Startup
tSU(HSE)(4) Startup time
1
25
VDD is stabilized
mA
mA/V
2
ms
1. Resonator characteristics given by the crystal/ceramic resonator manufacturer.
2. Based on characterization results, not tested in production.
3. The relatively low value of the RF resistor offers a good protection against issues resulting from use in a
humid environment, due to the induced leakage and the bias condition change. However, it is
recommended to take this point into account if the MCU is used in tough humidity conditions.
4. tSU(HSE) is the startup time measured from the moment it is enabled (by software) to a stabilized 8 MHz
oscillation is reached. This value is measured for a standard crystal resonator and it can vary significantly
with the crystal manufacturer
For CL1 and CL2, it is recommended to use high-quality external ceramic capacitors in the
5 pF to 25 pF range (typ.), designed for high-frequency applications, and selected to match
the requirements of the crystal or resonator (see Figure 19). CL1 and CL2 are usually the
same size. The crystal manufacturer typically specifies a load capacitance which is the
series combination of CL1 and CL2. PCB and MCU pin capacitance must be included (10 pF
can be used as a rough estimate of the combined pin and board capacitance) when sizing
CL1 and CL2. Refer to the application note AN2867 “Oscillator design guide for ST
microcontrollers” available from the ST website www.st.com.
52/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 19. Typical application with an 8 MHz crystal
Resonator with
integrated capacitors
CL1
fHSE
OSC_IN
8 MH z
resonator
CL2
REXT(1)
RF
Bias
controlled
gain
STM32F10xxx
OSC_OU T
ai14128b
1. REXT value depends on the crystal characteristics.
Low-speed external clock generated from a crystal/ceramic resonator
The low-speed external (LSE) clock can be supplied with a 32.768 kHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on characterization
results obtained with typical external components specified in Table 24. In the application,
the resonator and the load capacitors have to be placed as close as possible to the oscillator
pins in order to minimize output distortion and startup stabilization time. Refer to the crystal
resonator manufacturer for more details on the resonator characteristics (frequency,
package, accuracy).
Table 24.
Symbol
LSE oscillator characteristics (fLSE = 32.768 kHz)(1) (2)
Parameter
Conditions
Min
Typ
Max
RF
Feedback resistor
C
Recommended load capacitance
versus equivalent serial
resistance of the crystal (RS)
RS = 30 K
15
pF
I2
LSE driving current
VDD = 3.3 V
VIN = VSS
1.4
µA
gm
Oscillator transconductance
tSU(LSE)(3)
5
Unit
5
VDD is
stabilized
Startup time
M
µA/V
TA = 50 °C
1.5
TA = 25 °C
2.5
TA = 10 °C
4
TA = 0 °C
6
TA = -10 °C
10
TA = -20 °C
17
TA = -30 °C
32
TA = -40 °C
60
s
1. Based on characterization, not tested in production.
2. Refer to the note and caution paragraphs below the table, and to the application note AN2867 “Oscillator design guide for
ST microcontrollers”.
3.
tSU(LSE) is the startup time measured from the moment it is enabled (by software) to a stabilized 32.768 kHz oscillation is
reached. This value is measured for a standard crystal and it can vary significantly with the crystal manufacturer
Doc ID 17143 Rev 2
53/108
Electrical characteristics
STM32F101xF, STM32F101xG
Note:
For CL1 and CL2, it is recommended to use high-quality ceramic capacitors in the 5 pF to
15 pF range selected to match the requirements of the crystal or resonator. CL1 and CL2, are
usually the same size. The crystal manufacturer typically specifies a load capacitance which
is the series combination of CL1 and CL2.
Load capacitance CL has the following formula: CL = CL1 x CL2 / (CL1 + CL2) + Cstray where
Cstray is the pin capacitance and board or trace PCB-related capacitance. Typically, it is
between 2 pF and 7 pF.
Caution:
To avoid exceeding the maximum value of CL1 and CL2 (15 pF) it is strongly recommended
to use a resonator with a load capacitance CL  7 pF. Never use a resonator with a load
capacitance of 12.5 pF.
Example: if you choose a resonator with a load capacitance of CL = 6 pF, and Cstray = 2 pF,
then CL1 = CL2 = 8 pF.
Figure 20. Typical application with a 32.768 kHz crystal
Resonator with
integrated capacitors
CL1
fLSE
OSC32_IN
32.768 KH z
resonator
CL2
Bias
controlled
gain
RF
STM32F10xxx
OSC32_OU T
ai14129b
5.3.7
Internal clock source characteristics
The parameters given in Table 25 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 10.
High-speed internal (HSI) RC oscillator
Table 25.
Symbol
fHSI
HSI oscillator characteristics(1)
Parameter
Conditions
Min
Frequency
Typ
8
DuCy(HSI) Duty cycle
45
Accuracy of the HSI
oscillator
TA = –40 to 105 °C
TA = –10 to 85 °C
Factory(4)
calibrated
TA = 0 to 70 °C
TA = 25 °C
tsu(HSI)(4)
HSI oscillator startup
time
IDD(HSI)(4)
HSI oscillator power
consumption
54/108
Doc ID 17143 Rev 2
MHz
%
1(3)
%
–2
2.5
%
–1.5
2.2
%
–1.3
2
%
–1.1
1.8
%
1
2
µs
100
µA
80
1. VDD = 3.3 V, TA = –40 to 85 °C unless otherwise specified.
Unit
55
User-trimmed with the RCC_CR
register(2)
ACCHSI
Max
STM32F101xF, STM32F101xG
Electrical characteristics
2. Refer to application note AN2868 “STM32F10xxx internal RC oscillator (HSI) calibration” available from
the ST website www.st.com.
3. Guaranteed by design, not tested in production.
4. Based on characterization, not tested in production.
Low-speed internal (LSI) RC oscillator
LSI oscillator characteristics (1)
Table 26.
Symbol
fLSI(2)
Parameter
Frequency
tsu(LSI)(3)
LSI oscillator startup time
IDD(LSI)(3)
LSI oscillator power consumption
Min
Typ
Max
Unit
30
40
60
kHz
85
µs
1.2
µA
0.65
1. VDD = 3 V, TA = –40 to 85 °C unless otherwise specified.
2. Based on characterization, not tested in production.
3. Guaranteed by design, not tested in production.
Wakeup time from low-power mode
The wakeup times given in Table 27 are measured on a wakeup phase with an 8-MHz HSI
RC oscillator. The clock source used to wake up the device depends from the current
operating mode:
●
Stop or Standby mode: the clock source is the RC oscillator
●
Sleep mode: the clock source is the clock that was set before entering Sleep mode.
All timings are derived from tests performed under ambient temperature and VDD supply
voltage conditions summarized in Table 10.
Table 27.
Low-power mode wakeup timings
Symbol
tWUSLEEP(1)
tWUSTOP(1)
tWUSTDBY(1)
Parameter
Typ
Unit
Wakeup from Sleep mode
1.8
µs
Wakeup from Stop mode (regulator in run mode)
3.6
Wakeup from Stop mode (regulator in low-power mode)
5.4
Wakeup from Standby mode
50
µs
µs
1. The wakeup times are measured from the wakeup event to the point at which the user application code
reads the first instruction.
Doc ID 17143 Rev 2
55/108
Electrical characteristics
5.3.8
STM32F101xF, STM32F101xG
PLL characteristics
The parameters given in Table 28 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 10.
Table 28.
PLL characteristics
Value
Symbol
Parameter
Unit
Min(1)
Typ
Max(1)
PLL input clock(2)
1
8.0
25
MHz
PLL input clock duty cycle
40
60
%
fPLL_OUT
PLL multiplier output clock
16
36
MHz
tLOCK
PLL lock time
200
µs
Jitter
Cycle-to-cycle jitter
300
ps
fPLL_IN
1. Based on characterization, not tested in production.
2. Take care of using the appropriate multiplier factors so as to have PLL input clock values compatible with
the range defined by fPLL_OUT.
5.3.9
Memory characteristics
Flash memory
The characteristics are given at TA = –40 to 85 °C unless otherwise specified.
Table 29.
Symbol
Flash memory characteristics
Parameter
Conditions
Min
Typ
Max(1)
Unit
52.5
70
µs
tprog
16-bit programming time
TA–40 to +85 °C
40
tERASE
Page (2 KB) erase time
TA –40 to +85 °C
20
40
ms
Mass erase time
TA –40 to +85 °C
20
40
ms
Read mode
fHCLK = 36 MHz with 1
wait state, VDD = 3.3 V
28
mA
Write mode
fHCLK = 36 MHz, VDD =
3.3 V
7
mA
Erase mode
fHCLK = 36 MHz, VDD =
3.3 V
5
mA
Power-down mode / Halt,
VDD = 3.0 to 3.6 V
50
µA
3.6
V
tME
IDD
Vprog
Supply current
Programming voltage
1. Guaranteed by design, not tested in production.
56/108
Doc ID 17143 Rev 2
2
STM32F101xF, STM32F101xG
Table 30.
Electrical characteristics
Flash memory endurance and data retention
Value
Symbol
NEND
Parameter
Endurance
Conditions
TA = –40 °C to 85 °C
(2)
tRET
Data retention
Min(1)
10
TA = 85 °C, 1 kcycle
30
TA = 55 °C, 10 kcycle(2)
20
Unit
kcycles
Years
1. Based on characterization, not tested in production.
2. Cycling performed over the whole temperature range.
5.3.10
FSMC characteristics
Asynchronous waveforms and timings
Figure 21 through Figure 24 represent asynchronous waveforms and Table 31 through
Table 34 provide the corresponding timings. The results shown in these tables are obtained
with the following FSMC configuration:
●
AddressSetupTime = 0
●
AddressHoldTime = 1
●
DataSetupTime = 1
Doc ID 17143 Rev 2
57/108
Electrical characteristics
STM32F101xF, STM32F101xG
Figure 21. Asynchronous non-multiplexed SRAM/PSRAM/NOR read waveforms
TW.%
&3-#?.%
T V./%?.%
T W./%
T H.%?./%
&3-#?./%
&3-#?.7%
TV!?.%
&3-#?!;=
T H!?./%
!DDRESS
TV",?.%
T H",?./%
&3-#?.",;=
T H$ATA?.%
T SU$ATA?./%
TH$ATA?./%
T SU$ATA?.%
$ATA
&3-#?$;=
T V.!$6?.%
TW.!$6
&3-#?.!$6 -36
1. Mode 2/B, C and D only. In Mode 1, FSMC_NADV is not used.
Table 31.
Symbol
58/108
Asynchronous non-multiplexed SRAM/PSRAM/NOR read timings(1) (2)
Parameter
Min
Max
Unit
tw(NE)
FSMC_NE low time
5THCLK – 1.5
5THCLK + 2
ns
tv(NOE_NE)
FSMC_NEx low to FSMC_NOE low
0.5
1.5
ns
tw(NOE)
FSMC_NOE low time
5THCLK – 1.5
5THCLK + 1.5
ns
th(NE_NOE)
FSMC_NOE high to FSMC_NE high hold time –1.5
tv(A_NE)
FSMC_NEx low to FSMC_A valid
th(A_NOE)
Address hold time after FSMC_NOE high
tv(BL_NE)
FSMC_NEx low to FSMC_BL valid
th(BL_NOE)
FSMC_BL hold time after FSMC_NOE high
0
ns
tsu(Data_NE)
Data to FSMC_NEx high setup time
2THCLK + 25
ns
tsu(Data_NOE) Data to FSMC_NOEx high setup time
2THCLK + 25
ns
th(Data_NOE)
Data hold time after FSMC_NOE high
0
ns
th(Data_NE)
Data hold time after FSMC_NEx high
0
ns
Doc ID 17143 Rev 2
ns
7
0.1
ns
ns
0
ns
STM32F101xF, STM32F101xG
Electrical characteristics
Asynchronous non-multiplexed SRAM/PSRAM/NOR read timings(1) (2)
Table 31.
Symbol
Parameter
Min
Max
Unit
tv(NADV_NE)
FSMC_NEx low to FSMC_NADV low
5
ns
tw(NADV)
FSMC_NADV low time
THCLK + 1.5
ns
1. CL = 15 pF.
2. Preliminary values.
Figure 22. Asynchronous non-multiplexed SRAM/PSRAM/NOR write waveforms
tw(NE)
FSMC_NEx
FSMC_NOE
tv(NWE_NE)
tw(NWE)
t h(NE_NWE)
FSMC_NWE
tv(A_NE)
FSMC_A[25:0]
th(A_NWE)
Address
tv(BL_NE)
FSMC_NBL[1:0]
th(BL_NWE)
NBL
tv(Data_NE)
th(Data_NWE)
Data
FSMC_D[15:0]
t v(NADV_NE)
tw(NADV)
FSMC_NADV(1)
ai14990
1. Mode 2/B, C and D only. In Mode 1, FSMC_NADV is not used.
Table 32.
Symbol
Asynchronous non-multiplexed SRAM/PSRAM/NOR write timings(1)(2)
Parameter
Min
Max
Unit
tw(NE)
FSMC_NE low time
3THCLK – 1
3THCLK + 2
ns
tv(NWE_NE)
FSMC_NEx low to FSMC_NWE low
THCLK – 0.5
THCLK + 1.5
ns
tw(NWE)
FSMC_NWE low time
THCLK – 0.5
THCLK + 1.5
ns
th(NE_NWE)
FSMC_NWE high to FSMC_NE high hold time
THCLK
tv(A_NE)
FSMC_NEx low to FSMC_A valid
th(A_NWE)
Address hold time after FSMC_NWE high
tv(BL_NE)
FSMC_NEx low to FSMC_BL valid
th(BL_NWE)
FSMC_BL hold time after FSMC_NWE high
tv(Data_NE)
FSMC_NEx low to Data valid
th(Data_NWE)
Data hold time after FSMC_NWE high
Doc ID 17143 Rev 2
ns
7.5
THCLK
ns
1.5
THCLK – 0.5
ns
ns
THCLK + 7
THCLK
ns
ns
ns
59/108
Electrical characteristics
STM32F101xF, STM32F101xG
Asynchronous non-multiplexed SRAM/PSRAM/NOR write timings(1)(2)
Table 32.
Symbol
Parameter
Min
Max
Unit
tv(NADV_NE)
FSMC_NEx low to FSMC_NADV low
5.5
ns
tw(NADV)
FSMC_NADV low time
THCLK + 1.5
ns
1. CL = 15 pF.
2. Preliminary values.
Figure 23. Asynchronous multiplexed NOR/PSRAM read waveforms
tw(NE)
FSMC_NE
tv(NOE_NE)
t h(NE_NOE)
FSMC_NOE
t w(NOE)
FSMC_NWE
tv(A_NE)
FSMC_A[25:16]
t h(A_NOE)
Address
tv(BL_NE)
th(BL_NOE)
FSMC_NBL[1:0]
NBL
th(Data_NE)
tsu(Data_NE)
t v(A_NE)
tsu(Data_NOE)
Address
FSMC_AD[15:0]
t v(NADV_NE)
th(Data_NOE)
Data
th(AD_NADV)
tw(NADV)
FSMC_NADV
ai14892b
Table 33.
Symbol
60/108
Asynchronous multiplexed NOR/PSRAM read timings(1)(2)
Parameter
Min
Max
Unit
tw(NE)
FSMC_NE low time
7THCLK – 2
tv(NOE_NE)
FSMC_NEx low to FSMC_NOE low
3THCLK – 0.5 3THCLK + 1.5
ns
tw(NOE)
FSMC_NOE low time
4THCLK – 1
ns
th(NE_NOE)
FSMC_NOE high to FSMC_NE high hold time
–1
tv(A_NE)
FSMC_NEx low to FSMC_A valid
tv(NADV_NE)
FSMC_NEx low to FSMC_NADV low
tw(NADV)
7THCLK + 2
4THCLK + 2
ns
ns
0
ns
3
5
ns
FSMC_NADV low time
THCLK –1.5
THCLK + 1.5
ns
th(AD_NADV)
FSMC_AD (address) valid hold time after
FSMC_NADV high
THCLK
ns
th(A_NOE)
Address hold time after FSMC_NOE high
THCLK
ns
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Table 33.
Electrical characteristics
Asynchronous multiplexed NOR/PSRAM read timings(1)(2) (continued)
Symbol
Parameter
Min
Max
0
Unit
th(BL_NOE)
FSMC_BL hold time after FSMC_NOE high
ns
tv(BL_NE)
FSMC_NEx low to FSMC_BL valid
tsu(Data_NE)
Data to FSMC_NEx high setup time
2THCLK + 24
ns
tsu(Data_NOE) Data to FSMC_NOE high setup time
2THCLK + 25
ns
0
ns
th(Data_NE)
Data hold time after FSMC_NEx high
0
ns
th(Data_NOE)
Data hold time after FSMC_NOE high
0
ns
1. CL = 15 pF.
2. Preliminary values.
Doc ID 17143 Rev 2
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Electrical characteristics
STM32F101xF, STM32F101xG
Figure 24. Asynchronous multiplexed NOR/PSRAM write waveforms
tw(NE)
FSMC_NEx
FSMC_NOE
tv(NWE_NE)
tw(NWE)
t h(NE_NWE)
FSMC_NWE
tv(A_NE)
FSMC_A[25:16]
th(A_NWE)
Address
tv(BL_NE)
th(BL_NWE)
FSMC_NBL[1:0]
NBL
t v(A_NE)
t v(Data_NADV)
Address
FSMC_AD[15:0]
t v(NADV_NE)
th(Data_NWE)
Data
th(AD_NADV)
tw(NADV)
FSMC_NADV
ai14891B
Table 34.
Asynchronous multiplexed NOR/PSRAM write timings(1)(2)
Symbol
Parameter
Min
Unit
tw(NE)
FSMC_NE low time
5THCLK – 1
5THCLK + 2
ns
tv(NWE_NE)
FSMC_NEx low to FSMC_NWE low
2THCLK
2THCLK + 1
ns
tw(NWE)
FSMC_NWE low time
2THCLK – 1
2THCLK + 2
ns
th(NE_NWE)
FSMC_NWE high to FSMC_NE high hold time
THCLK – 1
tv(A_NE)
FSMC_NEx low to FSMC_A valid
tv(NADV_NE)
FSMC_NEx low to FSMC_NADV low
tw(NADV)
ns
7
ns
3
5
ns
FSMC_NADV low time
THCLK – 1
THCLK + 1
ns
th(AD_NADV)
FSMC_AD (address) valid hold time after
FSMC_NADV high
THCLK – 3
ns
th(A_NWE)
Address hold time after FSMC_NWE high
4THCLK
ns
tv(BL_NE)
FSMC_NEx low to FSMC_BL valid
th(BL_NWE)
FSMC_BL hold time after FSMC_NWE high
1.6
THCLK – 1.5
tv(Data_NADV) FSMC_NADV high to Data valid
th(Data_NWE)
Data hold time after FSMC_NWE high
1. CL = 15 pF.
2. Preliminary values.
62/108
Max
Doc ID 17143 Rev 2
ns
THCLK + 1.5
THCLK – 5
ns
ns
ns
STM32F101xF, STM32F101xG
Electrical characteristics
Synchronous waveforms and timings
Figure 25 through Figure 28 represent synchronous waveforms and Table 36 through
Table 38 provide the corresponding timings. The results shown in these tables are obtained
with the following FSMC configuration:
●
BurstAccessMode = FSMC_BurstAccessMode_Enable;
●
MemoryType = FSMC_MemoryType_CRAM;
●
WriteBurst = FSMC_WriteBurst_Enable;
●
CLKDivision = 1; (0 is not supported, see the STM32F10xxx reference manual)
●
DataLatency = 1 for NOR Flash; DataLatency = 0 for PSRAM
Figure 25. Synchronous multiplexed NOR/PSRAM read timings
BUSTURN = 0
tw(CLK)
tw(CLK)
FSMC_CLK
Data latency = 1
td(CLKL-NExL)
td(CLKH-NExH)
FSMC_NEx
td(CLKL-NADVL)
td(CLKL-NADVH)
FSMC_NADV
td(CLKH-AIV)
td(CLKL-AV)
FSMC_A[25:16]
td(CLKL-NOEL)
td(CLKH-NOEH)
FSMC_NOE
td(CLKL-ADIV)
tsu(ADV-CLKH)
td(CLKL-ADV)
FSMC_AD[15:0]
AD[15:0]
th(CLKH-ADV)
tsu(ADV-CLKH)
D1
tsu(NWAITV-CLKH)
th(CLKH-ADV)
D2
th(CLKH-NWAITV)
FSMC_NWAIT
(WAITCFG = 1b, WAITPOL + 0b)
tsu(NWAITV-CLKH)
th(CLKH-NWAITV)
FSMC_NWAIT
(WAITCFG = 0b, WAITPOL + 0b)
tsu(NWAITV-CLKH)
th(CLKH-NWAITV)
ai14893e
Doc ID 17143 Rev 2
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Electrical characteristics
Table 35.
STM32F101xF, STM32F101xG
Synchronous multiplexed NOR/PSRAM read timings(1)(2)
Symbol
Parameter
Max
Unit
tw(CLK)
FSMC_CLK period
td(CLKL-NExL)
FSMC_CLK low to FSMC_NEx low (x = 0...2)
td(CLKH-NExH)
FSMC_CLK high to FSMC_NEx high (x = 0...2)
td(CLKL-NADVL)
FSMC_CLK low to FSMC_NADV low
td(CLKL-NADVH)
FSMC_CLK low to FSMC_NADV high
td(CLKL-AV)
FSMC_CLK low to FSMC_Ax valid (x = 16...25)
td(CLKH-AIV)
FSMC_CLK high to FSMC_Ax invalid (x = 16...25) THCLK + 2
td(CLKL-NOEL)
FSMC_CLK low to FSMC_NOE low
td(CLKH-NOEH)
FSMC_CLK high to FSMC_NOE high
td(CLKL-ADV)
FSMC_CLK low to FSMC_AD[15:0] valid
td(CLKL-ADIV)
FSMC_CLK low to FSMC_AD[15:0] invalid
0
ns
tsu(ADV-CLKH)
FSMC_A/D[15:0] valid data before FSMC_CLK
high
6
ns
th(CLKH-ADV)
FSMC_A/D[15:0] valid data after FSMC_CLK high THCLK – 10
tsu(NWAITV-CLKH) FSMC_NWAIT valid before FSMC_CLK high
th(CLKH-NWAITV)
FSMC_NWAIT valid after FSMC_CLK high
1. CL = 15 pF.
2. Preliminary values.
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Min
Doc ID 17143 Rev 2
27.7
ns
1.5
THCLK + 2
ns
ns
4
5
ns
ns
0
ns
ns
THCLK +1
THCLK + 0.5
ns
ns
12
ns
ns
8
ns
2
ns
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 26. Synchronous multiplexed PSRAM write timings
BUSTURN = 0
tw(CLK)
tw(CLK)
FSMC_CLK
Data latency = 1
td(CLKL-NExL)
td(CLKH-NExH)
FSMC_NEx
td(CLKL-NADVL)
td(CLKL-NADVH)
FSMC_NADV
td(CLKL-AV)
td(CLKH-AIV)
FSMC_A[25:16]
td(CLKL-NWEL)
td(CLKH-NWEH)
FSMC_NWE
td(CLKL-ADIV)
td(CLKL-ADV)
FSMC_AD[15:0]
td(CLKL-Data)
td(CLKL-Data)
AD[15:0]
D1
D2
FSMC_NWAIT
(WAITCFG = 0b, WAITPOL + 0b)
tsu(NWAITV-CLKH)
th(CLKH-NWAITV)
td(CLKL-NBLH)
FSMC_NBL
ai14992d
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Electrical characteristics
Table 36.
STM32F101xF, STM32F101xG
Synchronous multiplexed PSRAM write timings(1)(2)
Symbol
Parameter
Max
Unit
tw(CLK)
FSMC_CLK period
td(CLKL-NExL)
FSMC_CLK low to FSMC_Nex low (x = 0...2)
td(CLKH-NExH)
FSMC_CLK high to FSMC_NEx high (x = 0...2)
td(CLKL-NADVL)
FSMC_CLK low to FSMC_NADV low
td(CLKL-NADVH)
FSMC_CLK low to FSMC_NADV high
td(CLKL-AV)
FSMC_CLK low to FSMC_Ax valid (x = 16...25)
td(CLKH-AIV)
FSMC_CLK high to FSMC_Ax invalid (x = 16...25)
td(CLKL-NWEL)
FSMC_CLK low to FSMC_NWE low
td(CLKH-NWEH)
FSMC_CLK high to FSMC_NWE high
td(CLKL-ADV)
FSMC_CLK low to FSMC_AD[15:0] valid
td(CLKL-ADIV)
FSMC_CLK low to FSMC_AD[15:0] invalid
td(CLKL-Data)
FSMC_A/D[15:0] valid after FSMC_CLK low
tsu(NWAITV-CLKH)
FSMC_NWAIT valid before FSMC_CLK high
7
ns
th(CLKH-NWAITV)
FSMC_NWAIT valid after FSMC_CLK high
2
ns
td(CLKL-NBLH)
FSMC_CLK low to FSMC_NBL high
1
ns
1. CL = 15 pF.
2. Preliminary values.
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Min
Doc ID 17143 Rev 2
27.7
ns
2
THCLK + 2
ns
ns
4
5
ns
ns
0
TCK + 2
ns
ns
1
THCLK +1
ns
ns
12
3
ns
ns
6
ns
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 27. Synchronous non-multiplexed NOR/PSRAM read timings
BUSTURN = 0
tw(CLK)
tw(CLK)
FSMC_CLK
td(CLKL-NExL)
td(CLKH-NExH)
Data latency = 1
FSMC_NEx
td(CLKL-NADVL)
td(CLKL-NADVH)
FSMC_NADV
td(CLKH-AIV)
td(CLKL-AV)
FSMC_A[25:0]
td(CLKL-NOEL)
td(CLKH-NOEH)
FSMC_NOE
tsu(DV-CLKH)
th(CLKH-DV)
tsu(DV-CLKH)
th(CLKH-DV)
D1
FSMC_D[15:0]
tsu(NWAITV-CLKH)
D2
th(CLKH-NWAITV)
FSMC_NWAIT
(WAITCFG = 1b, WAITPOL + 0b)
tsu(NWAITV-CLKH)
th(CLKH-NWAITV)
FSMC_NWAIT
(WAITCFG = 0b, WAITPOL + 0b)
tsu(NWAITV-CLKH)
th(CLKH-NWAITV)
ai14894d
Table 37.
Synchronous non-multiplexed NOR/PSRAM read timings(1)(2)
Symbol
Parameter
Min
Max
tw(CLK)
FSMC_CLK period
td(CLKL-NExL)
FSMC_CLK low to FSMC_NEx low (x = 0...2)
td(CLKH-NExH)
FSMC_CLK high to FSMC_NEx high (x = 0...2)
td(CLKL-NADVL)
FSMC_CLK low to FSMC_NADV low
td(CLKL-NADVH)
FSMC_CLK low to FSMC_NADV high
td(CLKL-AV)
FSMC_CLK low to FSMC_Ax valid (x = 0...25)
td(CLKH-AIV)
FSMC_CLK high to FSMC_Ax invalid (x = 0...25) THCLK + 4
td(CLKL-NOEL)
FSMC_CLK low to FSMC_NOE low
td(CLKH-NOEH)
FSMC_CLK high to FSMC_NOE high
tsu(DV-CLKH)
FSMC_D[15:0] valid data before FSMC_CLK high 6.5
ns
th(CLKH-DV)
FSMC_D[15:0] valid data after FSMC_CLK high
7
ns
tsu(NWAITV-CLKH) FSMC_NWAIT valid before FSMC_SMCLK high
7
ns
th(CLKH-NWAITV)
2
ns
FSMC_NWAIT valid after FSMC_CLK high
27.7
Unit
ns
1.5
THCLK + 2
ns
ns
4
5
ns
ns
0
ns
ns
THCLK + 1.5 ns
THCLK + 1.5
ns
1. CL = 15 pF.
2. Preliminary values.
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Electrical characteristics
STM32F101xF, STM32F101xG
Figure 28. Synchronous non-multiplexed PSRAM write timings
BUSTURN = 0
tw(CLK)
tw(CLK)
FSMC_CLK
td(CLKL-NExL)
td(CLKH-NExH)
Data latency = 1
FSMC_NEx
td(CLKL-NADVL)
td(CLKL-NADVH)
FSMC_NADV
td(CLKL-AV)
td(CLKH-AIV)
FSMC_A[25:0]
td(CLKL-NWEL)
td(CLKH-NWEH)
FSMC_NWE
td(CLKL-Data)
FSMC_D[15:0]
td(CLKL-Data)
D1
D2
FSMC_NWAIT
(WAITCFG = 0b, WAITPOL + 0b)
tsu(NWAITV-CLKH)
td(CLKL-NBLH)
th(CLKH-NWAITV)
FSMC_NBL
ai14993e
Table 38.
Synchronous non-multiplexed PSRAM write timings(1)(2)
Symbol
Parameter
Max
FSMC_CLK period
td(CLKL-NExL)
FSMC_CLK low to FSMC_NEx low (x = 0...2)
td(CLKH-NExH)
FSMC_CLK high to FSMC_NEx high (x = 0...2)
td(CLKL-NADVL)
FSMC_CLK low to FSMC_NADV low
td(CLKL-NADVH)
FSMC_CLK low to FSMC_NADV high
td(CLKL-AV)
FSMC_CLK low to FSMC_Ax valid (x = 16...25)
td(CLKH-AIV)
FSMC_CLK high to FSMC_Ax invalid (x = 16...25)
td(CLKL-NWEL)
FSMC_CLK low to FSMC_NWE low
td(CLKH-NWEH)
FSMC_CLK high to FSMC_NWE high
td(CLKL-Data)
FSMC_D[15:0] valid data after FSMC_CLK low
tsu(NWAITV-CLKH)
FSMC_NWAIT valid before FSMC_CLK high
7
ns
th(CLKH-NWAITV)
FSMC_NWAIT valid after FSMC_CLK high
2
ns
td(CLKL-NBLH)
FSMC_CLK low to FSMC_NBL high
1
ns
2. Preliminary values.
Doc ID 17143 Rev 2
27.7
Unit
tw(CLK)
1. CL = 15 pF.
68/108
Min
ns
2
THCLK + 2
ns
ns
4
5
ns
ns
0
TCK + 2
ns
ns
1
THCLK + 1
ns
ns
6
ns
STM32F101xF, STM32F101xG
Electrical characteristics
PC Card/CompactFlash controller waveforms and timings
Figure 29 through Figure 34 represent synchronous waveforms and Table 39 provides the
corresponding timings. The results shown in this table are obtained with the following FSMC
configuration:
●
COM.FSMC_SetupTime = 0x04;
●
COM.FSMC_WaitSetupTime = 0x07;
●
COM.FSMC_HoldSetupTime = 0x04;
●
COM.FSMC_HiZSetupTime = 0x00;
●
ATT.FSMC_SetupTime = 0x04;
●
ATT.FSMC_WaitSetupTime = 0x07;
●
ATT.FSMC_HoldSetupTime = 0x04;
●
ATT.FSMC_HiZSetupTime = 0x00;
●
IO.FSMC_SetupTime = 0x04;
●
IO.FSMC_WaitSetupTime = 0x07;
●
IO.FSMC_HoldSetupTime = 0x04;
●
IO.FSMC_HiZSetupTime = 0x00;
●
TCLRSetupTime = 0;
●
TARSetupTime = 0;
Figure 29. PC Card/CompactFlash controller waveforms for common memory read
access
FSMC_NCE4_2(1)
FSMC_NCE4_1
th(NCEx-AI)
tv(NCEx-A)
FSMC_A[10:0]
th(NCEx-NREG)
th(NCEx-NIORD)
th(NCEx-NIOWR)
td(NREG-NCEx)
td(NIORD-NCEx)
FSMC_NREG
FSMC_NIOWR
FSMC_NIORD
FSMC_NWE
td(NCE4_1-NOE)
tw(NOE)
FSMC_NOE
tsu(D-NOE)
th(NOE-D)
FSMC_D[15:0]
ai14895b
1. FSMC_NCE4_2 remains high (inactive during 8-bit access.
Doc ID 17143 Rev 2
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Electrical characteristics
STM32F101xF, STM32F101xG
Figure 30. PC Card/CompactFlash controller waveforms for common memory write
access
FSMC_NCE4_1
FSMC_NCE4_2
High
tv(NCE4_1-A)
th(NCE4_1-AI)
FSMC_A[10:0]
th(NCE4_1-NREG)
th(NCE4_1-NIORD)
th(NCE4_1-NIOWR)
td(NREG-NCE4_1)
td(NIORD-NCE4_1)
FSMC_NREG
FSMC_NIOWR
FSMC_NIORD
td(NCE4_1-NWE)
tw(NWE)
td(NWE-NCE4_1)
FSMC_NWE
FSMC_NOE
MEMxHIZ =1
td(D-NWE)
tv(NWE-D)
th(NWE-D)
FSMC_D[15:0]
ai14896b
70/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 31. PC Card/CompactFlash controller waveforms for attribute memory read
access
FSMC_NCE4_1
tv(NCE4_1-A)
FSMC_NCE4_2
th(NCE4_1-AI)
High
FSMC_A[10:0]
FSMC_NIOWR
FSMC_NIORD
td(NREG-NCE4_1)
th(NCE4_1-NREG)
FSMC_NREG
FSMC_NWE
td(NCE4_1-NOE)
tw(NOE)
td(NOE-NCE4_1)
FSMC_NOE
tsu(D-NOE)
th(NOE-D)
FSMC_D[15:0](1)
ai14897b
1. Only data bits 0...7 are read (bits 8...15 are disregarded).
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Electrical characteristics
STM32F101xF, STM32F101xG
Figure 32. PC Card/CompactFlash controller waveforms for attribute memory write
access
FSMC_NCE4_1
FSMC_NCE4_2
High
tv(NCE4_1-A)
th(NCE4_1-AI)
FSMC_A[10:0]
FSMC_NIOWR
FSMC_NIORD
td(NREG-NCE4_1)
th(NCE4_1-NREG)
FSMC_NREG
td(NCE4_1-NWE)
tw(NWE)
FSMC_NWE
td(NWE-NCE4_1)
FSMC_NOE
tv(NWE-D)
FSMC_D[7:0](1)
ai14898b
1. Only data bits 0...7 are driven (bits 8...15 remains HiZ).
Figure 33. PC Card/CompactFlash controller waveforms for I/O space read access
FSMC_NCE4_1
FSMC_NCE4_2
th(NCE4_1-AI)
tv(NCEx-A)
FSMC_A[10:0]
FSMC_NREG
FSMC_NWE
FSMC_NOE
FSMC_NIOWR
tw(NIORD)
td(NIORD-NCE4_1)
FSMC_NIORD
tsu(D-NIORD)
td(NIORD-D)
FSMC_D[15:0]
ai14899B
72/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 34. PC Card/CompactFlash controller waveforms for I/O space write access
FSMC_NCE4_1
FSMC_NCE4_2
tv(NCEx-A)
th(NCE4_1-AI)
FSMC_A[10:0]
FSMC_NREG
FSMC_NWE
FSMC_NOE
FSMC_NIORD
td(NCE4_1-NIOWR)
tw(NIOWR)
FSMC_NIOWR
ATTxHIZ =1
tv(NIOWR-D)
th(NIOWR-D)
FSMC_D[15:0]
ai14900b
Table 39.
Switching characteristics for PC Card/CF read and write cycles(1)(2)
Symbol
Parameter
tv(NCEx-A)
tv(NCE4_1-A)
FSMC_NCEx low (x = 4_1/4_2) to FSMC_Ay valid (y =
0...10)
FSMC_NCE4_1 low (x = 4_1/4_2) to FSMC_Ay valid (y =
0...10)
th(NCEx-AI)
th(NCE4_1-AI)
FSMC_NCEx high (x = 4_1/4_2) to FSMC_Ax invalid (x =
0...10)
FSMC_NCE4_1 high (x = 4_1/4_2) to FSMC_Ax invalid (x
= 0...10)
td(NREG-NCEx)
td(NREG-NCE4_1)
FSMC_NCEx low to FSMC_NREG valid
FSMC_NCE4_1 low to FSMC_NREG valid
th(NCEx-NREG)
th(NCE4_1-NREG)
FSMC_NCEx high to FSMC_NREG invalid
FSMC_NCE4_1 high to FSMC_NREG invalid
td(NCE4_1-NOE)
FSMC_NCE4_1 low to FSMC_NOE low
tw(NOE)
Min
Max
0
2.5
Unit
ns
ns
5
THCLK + 3
ns
ns
5THCLK + 2
ns
FSMC_NOE low width
8THCLK –1.5 8THCLK + 1
ns
td(NOE-NCE4_1
FSMC_NOE high to FSMC_NCE4_1 high
5THCLK + 2
ns
tsu(D-NOE)
FSMC_D[15:0] valid data before FSMC_NOE high
25
ns
th(NOE-D)
FSMC_D[15:0] valid data after FSMC_NOE high
15
ns
tw(NWE)
FSMC_NWE low width
8THCLK – 1
td(NWE-NCE4_1)
FSMC_NWE high to FSMC_NCE4_1 high
5THCLK + 2
td(NCE4_1-NWE)
FSMC_NCE4_1 low to FSMC_NWE low
5THCLK + 1.5
ns
tv(NWE-D)
FSMC_NWE low to FSMC_D[15:0] valid
0
ns
th(NWE-D)
FSMC_NWE high to FSMC_D[15:0] invalid
Doc ID 17143 Rev 2
11THCLK
8THCLK + 2
ns
ns
ns
73/108
Electrical characteristics
Table 39.
STM32F101xF, STM32F101xG
Switching characteristics for PC Card/CF read and write cycles(1)(2) (continued)
Symbol
Parameter
Min
Max
Unit
td(D-NWE)
FSMC_D[15:0] valid before FSMC_NWE high
13THCLK
ns
tw(NIOWR)
FSMC_NIOWR low width
8THCLK + 3
ns
tv(NIOWR-D)
FSMC_NIOWR low to FSMC_D[15:0] valid
th(NIOWR-D)
FSMC_NIOWR high to FSMC_D[15:0] invalid
5THCLK +1
11THCLK
td(NCE4_1-NIOWR) FSMC_NCE4_1 low to FSMC_NIOWR valid
FSMC_NCEx high to FSMC_NIOWR invalid
th(NCEx-NIOWR)
th(NCE4_1-NIOWR) FSMC_NCE4_1 high to FSMC_NIOWR invalid
ns
5THCLK+3ns
5THCLK – 5
td(NIORD-NCEx)
FSMC_NCEx low to FSMC_NIORD valid
td(NIORD-NCE4_1) FSMC_NCE4_1 low to FSMC_NIORD valid
ns
ns
ns
5THCLK + 2.5
ns
th(NCEx-NIORD)
FSMC_NCEx high to FSMC_NIORD invalid
th(NCE4_1-NIORD) FSMC_NCE4_1 high to FSMC_NIORD invalid
5THCLK – 5
ns
tsu(D-NIORD)
FSMC_D[15:0] valid before FSMC_NIORD high
4.5
ns
td(NIORD-D)
FSMC_D[15:0] valid after FSMC_NIORD high
9
ns
tw(NIORD)
FSMC_NIORD low width
8THCLK + 2
ns
1. CL = 15 pF.
2. Preliminary values.
NAND controller waveforms and timings
Figure 35 through Figure 38 represent synchronous waveforms and Table 40 provides the
corresponding timings. The results shown in this table are obtained with the following FSMC
configuration:
74/108
●
COM.FSMC_SetupTime = 0x01;
●
COM.FSMC_WaitSetupTime = 0x03;
●
COM.FSMC_HoldSetupTime = 0x02;
●
COM.FSMC_HiZSetupTime = 0x01;
●
ATT.FSMC_SetupTime = 0x01;
●
ATT.FSMC_WaitSetupTime = 0x03;
●
ATT.FSMC_HoldSetupTime = 0x02;
●
ATT.FSMC_HiZSetupTime = 0x01;
●
Bank = FSMC_Bank_NAND;
●
MemoryDataWidth = FSMC_MemoryDataWidth_16b;
●
ECC = FSMC_ECC_Enable;
●
ECCPageSize = FSMC_ECCPageSize_512Bytes;
●
TCLRSetupTime = 0;
●
TARSetupTime = 0;
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 35. NAND controller waveforms for read access
FSMC_NCEx
Low
ALE (FSMC_A17)
CLE (FSMC_A16)
FSMC_NWE
td(ALE-NOE)
th(NOE-ALE)
FSMC_NOE (NRE)
tsu(D-NOE)
th(NOE-D)
FSMC_D[15:0]
ai14901b
Figure 36. NAND controller waveforms for write access
FSMC_NCEx
Low
ALE (FSMC_A17)
CLE (FSMC_A16)
td(ALE-NWE)
th(NWE-ALE)
FSMC_NWE
FSMC_NOE (NRE)
tv(NWE-D)
th(NWE-D)
FSMC_D[15:0]
ai14902b
Figure 37. NAND controller waveforms for common memory read access
FSMC_NCEx
Low
ALE (FSMC_A17)
CLE (FSMC_A16)
td(ALE-NOE)
th(NOE-ALE)
FSMC_NWE
tw(NOE)
FSMC_NOE
tsu(D-NOE)
th(NOE-D)
FSMC_D[15:0]
ai14912b
Doc ID 17143 Rev 2
75/108
Electrical characteristics
STM32F101xF, STM32F101xG
Figure 38. NAND controller waveforms for common memory write access
FSMC_NCEx
Low
ALE (FSMC_A17)
CLE (FSMC_A16)
td(ALE-NOE)
tw(NWE)
th(NOE-ALE)
FSMC_NWE
FSMC_NOE
td(D-NWE)
tv(NWE-D)
th(NWE-D)
FSMC_D[15:0]
ai14913b
Table 40.
Switching characteristics for NAND Flash read and write cycles(1)
Symbol
td(D-NWE)(2)
Parameter
Min
Unit
FSMC_D[15:0] valid before FSMC_NWE high
6THCLK + 12
ns
FSMC_NOE low width
4THCLK – 1.5 4THCLK + 1.5
ns
tsu(D-NOE)(2)
FSMC_D[15:0] valid data before FSMC_NOE
high
25
ns
th(NOE-D)(2)
FSMC_D[15:0] valid data after FSMC_NOE high 7
tw(NOE)
(2)
tw(NWE)
(2)
FSMC_NWE low width
tv(NWE-D)(2)
FSMC_NWE low to FSMC_D[15:0] valid
th(NWE-D)(2)
FSMC_NWE high to FSMC_D[15:0] invalid
td(ALE-NWE)(3)
FSMC_ALE valid before FSMC_NWE low
th(NWE-ALE)(3)
FSMC_NWE high to FSMC_ALE invalid
4THCLK – 1
th(NOE-ALE)(3)
FSMC_NWE high to FSMC_ALE invalid
1. CL = 15 pF.
2. Preliminary values.
3. Guaranteed by design, not tested in production.
Doc ID 17143 Rev 2
ns
4THCLK + 2.5
ns
0
ns
10THCLK + 4
ns
3THCLK + 1.5
3THCLK + 4.5
td(ALE-NOE)(3) FSMC_ALE valid before FSMC_NOE low
76/108
Max
ns
3THCLK + 2
3THCLK + 4.5
ns
ns
ns
STM32F101xF, STM32F101xG
5.3.11
Electrical characteristics
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (Electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the
device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
●
Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
●
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and
VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 41. They are based on the EMS levels and classes
defined in application note AN1709.
Table 41.
EMS characteristics
Symbol
Parameter
Conditions
Level/Class
VFESD
VDD 3.3 V, LQFP144,
Voltage limits to be applied on any I/O pin to
TA +25 °C, fHCLK 36 MHz
induce a functional disturbance
conforms to IEC 61000-4-2
2B
VEFTB
Fast transient voltage burst limits to be
applied through 100 pF on VDD and VSS
pins to induce a functional disturbance
VDD3.3 V, LQFP144,
TA +25 °C, fHCLK 36 MHz
conforms to IEC 61000-4-4
4A
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and pre
qualification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
Corrupted program counter
●
Unexpected reset
●
Critical Data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second. To complete these trials, ESD stress can be applied directly on the device, over the
range of specification values. When unexpected behavior is detected, the software can be
hardened to prevent unrecoverable errors occurring (see application note AN1015).
Doc ID 17143 Rev 2
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Electrical characteristics
STM32F101xF, STM32F101xG
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device is monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 42.
EMI characteristics
Symbol Parameter
SEMI
5.3.12
Peak level
Conditions
Max vs. [fHSE/fHCLK]
Monitored
frequency band
Unit
8/36 MHz
0.1 MHz to 30 MHz
VDD 3.3 V, TA 25 °C,
30 MHz to 130 MHz
LQFP144 package
compliant with
130 MHz to 1 GHz
IEC 61967-2
SAE EMI Level
8
27
dBµV
26
4
-
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 43.
ESD absolute maximum ratings
Symbol
Ratings
Conditions
Class Maximum value(1) Unit
VESD(HBM)
Electrostatic discharge
TA +25 °C, conforming
2
voltage (human body model) to JESD22-A114
2000
VESD(CDM)
Electrostatic discharge
TA +25 °C, conforming
II
voltage (charge device model) to JESD22-C101
500
V
1. Based on characterization results, not tested in production.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
●
A supply overvoltage is applied to each power supply pin
●
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78 IC latch-up standard.
Table 44.
Symbol
LU
78/108
Electrical sensitivities
Parameter
Static latch-up class
Conditions
TA +85 °C conforming to JESD78A
Doc ID 17143 Rev 2
Class
II level A
STM32F101xF, STM32F101xG
5.3.13
Electrical characteristics
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in Table 45
Table 45.
I/O current injection susceptibility
Functional susceptibility
Symbol
IINJ
Description
Negative
injection
Positive
injection
Injected current on OSC_IN32,
OSC_OUT32, PA4, PA5, PC13
-0
+0
Injected current on all FT pins
-5
+0
Injected current on any other pin
-5
+5
Doc ID 17143 Rev 2
Unit
mA
79/108
Electrical characteristics
5.3.14
STM32F101xF, STM32F101xG
I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Table 46 are derived from tests
performed under the conditions summarized in Table 10. All I/Os are CMOS and TTL
compliant.
Table 46.
Symbol
VIL
VIH
Vhys
Ilkg
I/O static characteristics
Parameter
Conditions
Min
Typ
Max
Unit
Standard IO input low
level voltage
–0.3
0.28*(VDD-2 V)+0.8 V
V
IO FT(1) input low level
voltage
–0.3
0.32*(VDD-2V)+0.75 V
V
Standard IO input high
level voltage
0.41*(VDD-2 V)+1.3 V
VDD+0.3
V
IO FT(1) input high level
voltage
5.5
VDD > 2 V
0.42*(VDD-2 V)+1 V
VDD  2 V
V
5.2
Standard IO Schmitt
trigger voltage
hysteresis(2)
200
mV
IO FT Schmitt trigger
voltage hysteresis(2)
5% VDD(3)
mV
Input leakage current (4)
VSS  VIN  VDD
Standard I/Os
1
µA
VIN = 5 V
I/O FT
3
RPU
Weak pull-up equivalent
resistor(5)
VIN VSS
30
40
50
k
RPD
Weak pull-down
equivalent resistor(5)
VIN VDD
30
40
50
k
CIO
I/O pin capacitance
5
pF
1. FT = Five-volt tolerant. In order to sustain a voltage higher than VDD+0.5 the internal pull-up/pull-down resistors must be
disabled.
2. Hysteresis voltage between Schmitt trigger switching levels. Based on characterization, not tested in production.
3. With a minimum of 100 mV.
4. Leakage could be higher than max. if negative current is injected on adjacent pins.
5. Pull-up and pull-down resistors are designed with a true resistance in series with a switchable PMOS/NMOS. This
PMOS/NMOS contribution to the series resistance is minimum (~10% order).
All I/Os are CMOS and TTL compliant (no software configuration required). Their
characteristics cover more than the strict CMOS-technology or TTL parameters. The
coverage of these requirements is shown in Figure 39 and Figure 40 for standard I/Os, and
in Figure 41 and Figure 42 for 5 V tolerant I/Os.
80/108
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STM32F101xF, STM32F101xG
Electrical characteristics
Figure 39. Standard I/O input characteristics - CMOS port
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Doc ID 17143 Rev 2
81/108
Electrical characteristics
STM32F101xF, STM32F101xG
Figure 41. 5 V tolerant I/O input characteristics - CMOS port
6)(6),6
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Figure 42. 5 V tolerant I/O input characteristics - TTL port
6)(6),6
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Output driving current
The GPIOs (general purpose input/outputs) can sink or source up to +/-8 mA, and sink or
source up to +/- 20 mA (with a relaxed VOL/VOH).
In the user application, the number of I/O pins which can drive current must be limited to
respect the absolute maximum rating specified in Section 5.2:
82/108
●
The sum of the currents sourced by all the I/Os on VDD, plus the maximum Run
consumption of the MCU sourced on VDD, cannot exceed the absolute maximum rating
IVDD (see Table 8).
●
The sum of the currents sunk by all the I/Os on VSS plus the maximum Run
consumption of the MCU sunk on VSS cannot exceed the absolute maximum rating
IVSS (see Table 8).
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Electrical characteristics
Output voltage levels
Unless otherwise specified, the parameters given in Table 47 are derived from tests
performed under ambient temperature and VDD supply voltage conditions summarized in
Table 10. All I/Os are CMOS and TTL compliant.
Table 47.
Output voltage characteristics
Symbol
Parameter
VOL(1)
VOH
(3)
VOL(1)
VOH
(3)
VOL(1)
VOH
(3)
VOL(1)
VOH
(3)
Output Low level voltage for an I/O pin
when 8 pins are sunk at the same time
Output High level voltage for an I/O pin
when 8 pins are sourced at the same time
Output low level voltage for an I/O pin
when 8 pins are sunk at the same time
Output high level voltage for an I/O pin
when 8 pins are sourced at the same time
Output low level voltage for an I/O pin
when 8 pins are sunk at the same time
Output high level voltage for an I/O pin
when 8 pins are sourced at the same time
Output low level voltage for an I/O pin
when 8 pins are sunk at the same time
Output high level voltage for an I/O pin
when 8 pins are sourced at the same time
Conditions
CMOS port(2),
IIO = +8 mA,
2.7 V < VDD < 3.6 V
TTL port(2)
IIO = +8 mA
2.7 V < VDD < 3.6 V
IIO = +20 mA(4)
2.7 V < VDD < 3.6 V
IIO = +6 mA(4)
2 V < VDD < 2.7 V
Min
Max
Unit
0.4
V
VDD–0.4
0.4
V
2.4
1.3
V
VDD–1.3
0.4
V
VDD–0.4
1. The IIO current sunk by the device must always respect the absolute maximum rating specified in Table 8
and the sum of IIO (I/O ports and control pins) must not exceed IVSS.
2. TTL and CMOS outputs are compatible with JEDEC standards JESD36 and JESD52.
3. The IIO current sourced by the device must always respect the absolute maximum rating specified in
Table 8 and the sum of IIO (I/O ports and control pins) must not exceed IVDD.
4. Based on characterization data, not tested in production.
Doc ID 17143 Rev 2
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Electrical characteristics
STM32F101xF, STM32F101xG
Input/output AC characteristics
The definition and values of input/output AC characteristics are given in Figure 43 and
Table 48, respectively.
Unless otherwise specified, the parameters given in Table 48 are derived from tests
performed under ambient temperature and VDD supply voltage conditions summarized in
Table 10.
Table 48.
MODEx
[1:0] bit
value(1)
I/O AC characteristics(1)
Symbol
Parameter
fmax(IO)out Maximum frequency(2)
10
tf(IO)out
Output high to low level fall
time
tr(IO)out
Output low to high level rise
time
fmax(IO)out Maximum frequency(2)
01
tf(IO)out
Output high to low level fall
time
tr(IO)out
Output low to high level rise
time
Fmax(IO)out Maximum
11
tf(IO)out
tr(IO)out
-
tEXTIpw
Frequency(2)
Output high to low level fall
time
Output low to high level rise
time
Conditions
CL = 50 pF, VDD = 2 V to 3.6 V
Max
Unit
2
MHz
125(3)
CL = 50 pF, VDD = 2 V to 3.6 V
ns
(3)
125
CL= 50 pF, VDD = 2 V to 3.6 V
10
MHz
25(3)
CL= 50 pF, VDD = 2 V to 3.6 V
ns
25(3)
CL= 30 pF, VDD = 2.7 V to 3.6 V
50
MHz
CL = 50 pF, VDD = 2.7 V to 3.6 V
30
MHz
CL = 50 pF, VDD = 2 V to 2.7 V
20
MHz
CL = 30 pF, VDD = 2.7 V to 3.6 V
5(3)
CL = 50 pF, VDD = 2.7 V to 3.6 V
8(3)
CL = 50 pF, VDD = 2 V to 2.7 V
12(3)
CL = 30 pF, VDD = 2.7 V to 3.6 V
5(3)
CL = 50 pF, VDD = 2.7 V to 3.6 V
8(3)
CL = 50 pF, VDD = 2 V to 2.7 V
12(3)
Pulse width of external
signals detected by the
EXTI controller
10
ns
ns
1. The I/O speed is configured using the MODEx[1:0] bits. Refer to the STM32F10xxx reference manual for a
description of GPIO Port configuration register.
2. The maximum frequency is defined in Figure 43.
3. Guaranteed by design, not tested in production.
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STM32F101xF, STM32F101xG
Electrical characteristics
Figure 43. I/O AC characteristics definition
90%
10%
50%
50%
90%
10%
EXT ERNAL
OUTPUT
ON 50pF
tr(I O)out
tr(I O)out
T
Maximum frequency is achieved if (tr + tf) 2/3)T and if the duty cycle is (45-55%)
when loaded by 50pF
ai14131
5.3.15
NRST pin characteristics
The NRST pin input driver uses CMOS technology. It is connected to a permanent pull-up
resistor, RPU (see Table 46).
Unless otherwise specified, the parameters given in Table 49 are derived from tests
performed under ambient temperature and VDD supply voltage conditions summarized in
Table 10.
Table 49.
NRST pin characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
VIL(NRST)(1)
NRST Input low level voltage
–0.5
0.8
VIH(NRST)(1)
NRST Input high level voltage
2
VDD+0.5
Vhys(NRST)
NRST Schmitt trigger voltage
hysteresis
VF(NRST)
V
Weak pull-up equivalent resistor(2)
RPU
(1)
Unit
200
VIN VSS
30
40
NRST Input filtered pulse
VNF(NRST)(1) NRST Input not filtered pulse
mV
50
k
100
ns
300
ns
1. Guaranteed by design, not tested in production.
2. The pull-up is designed with a true resistance in series with a switchable PMOS. This PMOS contribution to
the series resistance must be minimum (~10% order).
Figure 44. Recommended NRST pin protection
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1. The reset network protects the device against parasitic resets.
2. The user must ensure that the level on the NRST pin can go below the VIL(NRST) max level specified in
Table 49. Otherwise the reset will not be taken into account by the device.
Doc ID 17143 Rev 2
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Electrical characteristics
5.3.16
STM32F101xF, STM32F101xG
TIM timer characteristics
The parameters given in Table 50 are guaranteed by design.
Refer to Section 5.3.14: I/O port characteristics for details on the input/output alternate
function characteristics (output compare, input capture, external clock, PWM output).
Table 50.
Symbol
tres(TIM)
fEXT
ResTIM
tCOUNTER
TIMx(1) characteristics
Parameter
Conditions
Min
Max
1
tTIMxCLK
27.8
ns
Timer resolution time
fTIMxCLK = 36 MHz
Timer external clock
frequency on CH1 to CH4
fTIMxCLK = 36 MHz
0
fTIMxCLK/2
MHz
0
18
MHz
16
bit
65536
tTIMxCLK
1820
µs
65536 × 65536
tTIMxCLK
119.2
s
Timer resolution
16-bit counter clock period
when internal clock is
selected
tMAX_COUNT Maximum possible count
Unit
1
fTIMxCLK = 36 MHz 0.0278
fTIMxCLK = 36 MHz
1. TIMx is used as a general term to refer to the TIM1, TIM2, TIM3 and TIM4 timers.
5.3.17
Communications interfaces
I2C interface characteristics
Unless otherwise specified, the parameters given in Table 51 are derived from tests
performed under ambient temperature, fPCLK1 frequency and VDD supply voltage conditions
summarized in Table 10.
The STM32F101xC, STM32F101xD and STM32F101xESTM32F101xF and STM32F101xG
access line I2C interface meets the requirements of the standard I2C communication
protocol with the following restrictions: the I/O pins SDA and SCL are mapped to are not
“true” open-drain. When configured as open-drain, the PMOS connected between the I/O
pin and VDD is disabled, but is still present.
The I2C characteristics are described in Table 51. Refer also to Section 5.3.14: I/O port
characteristics for more details on the input/output alternate function characteristics (SDA
and SCL).
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Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Table 51.
Electrical characteristics
I2C characteristics
Standard mode I2C(1) Fast mode I2C(1)(2)
Symbol
Parameter
Unit
Min
Max
Min
Max
tw(SCLL)
SCL clock low time
4.7
1.3
tw(SCLH)
SCL clock high time
4.0
0.6
tsu(SDA)
SDA setup time
250
100
(3)
0(4)
900(3)
20+0.1Cb
300
µs
th(SDA)
SDA data hold time
tr(SDA)
tr(SCL)
SDA and SCL rise time
1000
tf(SDA)
tf(SCL)
SDA and SCL fall time
300
th(STA)
Start condition hold time
4.0
0.6
tsu(STA)
Repeated Start condition setup
time
4.7
0.6
tsu(STO)
Stop condition setup time
4.0
0.6
µs
tw(STO:STA)
Stop to Start condition time (bus
free)
4.7
1.3
µs
Cb
Capacitive load for each bus line
0
ns
300
µs
400
400
pF
1. Guaranteed by design, not tested in production.
2. fPCLK1 must be higher than 2 MHz to achieve standard mode I2C frequencies. It must be higher than 4 MHz
to achieve the fast mode I2C frequencies and it must be a multiple of 10 MHz in order to reach the I2C fast
mode maximum clock speed of 400 kHz.
3. The maximum hold time of the Start condition has only to be met if the interface does not stretch the low
period of SCL signal.
4. The device must internally provide a hold time of at least 300 ns for the SDA signal in order to bridge the
undefined region of the falling edge of SCL.
Doc ID 17143 Rev 2
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Electrical characteristics
STM32F101xF, STM32F101xG
Figure 45. I2C bus AC waveforms and measurement circuit(1)
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1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
Table 52.
SCL frequency (fPCLK1= 36 MHz, VDD = 3.3 V)(1)(2)
fSCL
I2C_CCR value
(kHz)
RP = 4.7 k
400
0x801E
300
0x8028
200
0x803C
100
0x00B4
50
0x0168
20
0x0384
1. RP = External pull-up resistance, fSCL = I2C speed,
2. For speeds around 200 kHz, the tolerance on the achieved speed is of 5%. For other speed ranges, the
tolerance on the achieved speed 2%. These variations depend on the accuracy of the external
components used to design the application.
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STM32F101xF, STM32F101xG
Electrical characteristics
SPI interface characteristics
Unless otherwise specified, the parameters given in Table 53Table 54 are derived from tests
performed under ambient temperature, fPCLKx frequency and VDD supply voltage conditions
summarized in Table 10.
Refer to Section 5.3.14: I/O port characteristics for more details on the input/output alternate
function characteristics (NSS, SCK, MOSI, MISO).
Table 53.
STM32F10xxx SPI characteristics
Symbol
Parameter
fSCK
1/tc(SCK)
SPI clock frequency
tr(SCK)
tf(SCK)
tsu(NSS)(1)
th(NSS)
(1)
Slave mode
10
4tPCLK
NSS hold time
Slave mode
73
Master mode, fPCLK = 36 MHz,
presc = 4
50
Master mode - SPI1
3
Master mode - SPI2
5
Slave mode
4
Master mode - SPI1
4
Data input hold time Master mode - SPI2
6
Data output access
time
8
Slave mode
5
Slave mode, fPCLK = 36 MHz,
presc = 4
0
Slave mode, fPCLK = 20 MHz
Data output disable
time
Slave mode
tv(SO) (1)
Data output valid
time
Slave mode (after enable edge)
tv(MO)(1)
Data output valid
time
Master mode (after enable edge)
tdis(SO)(1)(3)
th(SO)(1)
th(MO)
(1)
Data output hold
time
Unit
MHz
Slave mode
th(SI)(1)
ta(SO)(1)(2)
10
NSS setup time
Data input setup
time
Max
Master mode
Capacitive load: C = 30 pF
tw(SCKH)
SCK high and low
tw(SCKL)(1) time
th(MI) (1)
Min
SPI clock rise and
fall time
(1)
tsu(MI) (1)
tsu(SI)(1)
Conditions
Slave mode (after enable edge)
Master mode (after enable edge)
60
ns
55
4tPCLK
10
25
6
25
6
1. Based on characterization, not tested in production.
2. Min time is for the minimum time to drive the output and the max time is for the maximum time to validate
the data.
3. Min time is for the minimum time to invalidate the output and the max time is for the maximum time to put
the data in Hi-Z
Doc ID 17143 Rev 2
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Electrical characteristics
Table 54.
Symbol
fSCK
1/tc(SCK)
tr(SCK)
tf(SCK)
DuCy(SCK)
tsu(NSS)(2)
th(NSS)
(2)
STM32F101xF, STM32F101xG
SPI characteristics(1)
Parameter
tsu(MI) (2)
tsu(SI)(2)
th(MI)
SPI clock rise and fall
time
Max
18
Slave mode
18
Capacitive load: C = 30 pF
8
ns
70
%
MHz
30
NSS setup time
Slave mode
4tPCLK
NSS hold time
Slave mode
2tPCLK
SCK high and low time
Master mode, fPCLK = 36 MHz,
presc = 4
50
Master mode
5
Slave mode
5
Master mode
5
Slave mode
4
60
Data input setup time
Data input hold time
ns
ta(SO)(2)(3)
Data output access time
Slave mode, fPCLK = 20 MHz
0
3tPCLK
tdis(SO)(2)(4)
2
10
Data output disable time
Slave mode
tv(SO)
(2)(1)
Data output valid time
Slave mode (after enable edge)
25
tv(MO)
(2)(1)
Data output valid time
Master mode (after enable edge)
5
th(SO)(2)
th(MO)(2)
Unit
Master mode
SPI slave input clock duty
Slave mode
cycle
(2)
th(SI)(2)
Min
SPI clock frequency
(2)
tw(SCKH)
tw(SCKL)(2)
Conditions
Slave mode (after enable edge)
15
Master mode (after enable edge)
2
Data output hold time
1. Remapped SPI1 characteristics to be determined.
2. Based on characterization, not tested in production.
3. Min time is for the minimum time to drive the output and the max time is for the maximum time to validate
the data.
4. Min time is for the minimum time to invalidate the output and the max time is for the maximum time to put
the data in Hi-Z
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STM32F101xF, STM32F101xG
Electrical characteristics
Figure 46. SPI timing diagram - slave mode and CPHA=0
NSS input
tc(SCK)
th(NSS)
SCK Input
tSU(NSS)
CPHA= 0
CPOL=0
tw(SCKH)
tw(SCKL)
CPHA= 0
CPOL=1
tv(SO)
ta(SO)
MISO
OUT P UT
tr(SCK)
tf(SCK)
th(SO)
MS B O UT
BI T6 OUT
tdis(SO)
LSB OUT
tsu(SI)
MOSI
I NPUT
B I T1 IN
M SB IN
LSB IN
th(SI)
ai14134c
Figure 47. SPI timing diagram - slave mode and CPHA=1(1)
NSS input
SCK Input
tSU(NSS)
CPHA=1
CPOL=0
CPHA=1
CPOL=1
tc(SCK)
tw(SCKH)
tw(SCKL)
tv(SO)
ta(SO)
MISO
OUT P UT
MS B O UT
tsu(SI)
MOSI
I NPUT
th(NSS)
th(SO)
BI T6 OUT
tr(SCK)
tf(SCK)
tdis(SO)
LSB OUT
th(SI)
B I T1 IN
M SB IN
LSB IN
ai14135
1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
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Electrical characteristics
STM32F101xF, STM32F101xG
Figure 48. SPI timing diagram - master mode(1)
High
NSS input
SCK Input
CPHA= 0
CPOL=0
SCK Input
tc(SCK)
CPHA=1
CPOL=0
CPHA= 0
CPOL=1
CPHA=1
CPOL=1
tsu(MI)
MISO
INP UT
tw(SCKH)
tw(SCKL)
tr(SCK)
tf(SCK)
MS BIN
BI T6 IN
LSB IN
th(MI)
MOSI
OUTUT
B I T1 OUT
M SB OUT
tv(MO)
LSB OUT
th(MO)
ai14136
1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
5.3.18
12-bit ADC characteristics
Unless otherwise specified, the parameters given in Table 55 are preliminary values derived
from tests performed under ambient temperature, fPCLK2 frequency and VDDA supply voltage
conditions summarized in Table 10.
Note:
92/108
It is recommended to perform a calibration after each power-up.
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Table 55.
Symbol
Electrical characteristics
ADC characteristics
Parameter
Conditions
Min
Typ
Max
Unit
VDDA
Power supply
2.4
3.6
V
VREF+
Positive reference voltage
2.4
VDDA
V
IVREF
Current on the VREF input
pin
220(1)
µA
fADC
ADC clock frequency
0.6
14
MHz
fS(2)
Sampling rate
0.05
1
MHz
823
kHz
17
1/fADC
VREF+
V
50
k
1
k
8
pF
fTRIG(2)
VAIN
RAIN(2)
External trigger frequency
160(1)
fADC = 14 MHz
0 (VSSA or VREFtied to ground)
Conversion voltage range(3)
External input impedance
See Equation
1 and Table 56
for details
RADC(2) Sampling switch resistance
CADC(2)
Internal sample and hold
capacitor
tCAL(2)
Calibration time
fADC = 14 MHz
tlat(2)
Injection trigger conversion
latency
fADC = 14 MHz
tlatr(2)
Regular trigger conversion
latency
fADC = 14 MHz
tS(2)
Sampling time
Power-up time
tCONV(2)
Total conversion time
(including sampling time)
µs
83
1/fADC
0.214
(4)
3
fADC = 14 MHz
tSTAB(2)
5.9
1/fADC
0.143
µs
2(4)
1/fADC
0.107
17.1
µs
1.5
239.5
1/fADC
1
µs
18
µs
0
fADC = 14 MHz
µs
0
1
14 to 252 (tS for sampling +12.5 for
1/fADC
successive approximation)
1. Preliminary values.
2. Guaranteed by design, not tested in production.
3. VREF+ can be internally connected to VDDA and VREF- can be internally connected to VSSA, depending on
the package. Refer to Section 3: Pinouts and pin descriptions for further details.
4. For external triggers, a delay of 1/fPCLK2 must be added to the latency specified in Table 55.
Equation 1: RAIN max formula:
TS
R AIN  ------------------------------------------------------------- – R ADC
N+2
f ADC  C ADC  ln  2

Doc ID 17143 Rev 2
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Electrical characteristics
STM32F101xF, STM32F101xG
The formula above (Equation 1) is used to determine the maximum external impedance
allowed for an error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 56.
RAIN max for fADC = 14 MHz(1)
Ts (cycles)
tS (µs)
RAIN max (k)
1.5
0.11
0.4
7.5
0.54
5.9
13.5
0.96
11.4
28.5
2.04
25.2
41.5
2.96
37.2
55.5
3.96
50
71.5
5.11
NA
239.5
17.1
NA
1. Guaranteed by design, not tested in production.
Table 57.
Symbol
ADC accuracy - limited test conditions(1)(2)
Parameter
ET
Total unadjusted error
EO
Offset error
EG
Gain error
ED
Differential linearity error
EL
Integral linearity error
Test conditions
Typ
Max(3)
fPCLK2 = 28 MHz,
fADC = 14 MHz, RAIN < 10 k,
VDDA = 3 V to 3.6 V, TA = 25 °C
Measurements made after
ADC calibration
VREF+ = VDDA
±1.3
±2
±1
±1.5
±0.5
±1.5
±0.7
±1
±0.8
±1.5
Unit
LSB
1. ADC DC accuracy values are measured after internal calibration.
2. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (nonrobust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in Section 5.3.14 does not
affect the ADC accuracy.
3. Preliminary values.
94/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
ADC accuracy(1) (2)(3)
Table 58.
Symbol
ET
Electrical characteristics
Parameter
Test conditions
Total unadjusted error
EO
Offset error
EG
Gain error
ED
Differential linearity error
EL
Integral linearity error
fPCLK2 = 28 MHz,
fADC = 14 MHz, RAIN < 10 k,
VDDA = 2.4 V to 3.6 V
Measurements made after
ADC calibration
Typ
Max(4)
±2
±5
±1.5
±2.5
±1.5
±3
±1
±2
±1.5
±3
Unit
LSB
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted VDD, frequency, VREF and temperature ranges.
3. ADC accuracy vs. negative injection current: Injecting negative current on any of the standard (non-robust)
analog input pins should be avoided as this significantly reduces the accuracy of the conversion being
performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to standard
analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in Section 5.3.14 does not
affect the ADC accuracy.
4. Preliminary values.
Figure 49. ADC accuracy characteristics
V
V
[1LSBIDEAL = REF+ (or DDA depending on package)]
4096
4096
EG
4095
4094
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
4093
(2)
ET
(3)
7
(1)
6
5
4
EO
EL
3
ED
2
ET=Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset Error: deviation between the first actual
transition and the first ideal one.
EG=Gain Error: deviation between the last ideal
transition and the last actual one.
ED=Differential Linearity Error: maximum deviation
between actual steps and the ideal one.
EL=Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
1 LSBIDEAL
1
0
1
VSSA
2
3
4
5
6
7
4093 4094 4095 4096
VDDA
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ai14395b
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Electrical characteristics
STM32F101xF, STM32F101xG
Figure 50. Typical connection diagram using the ADC
STM32F10xxx
VDD
RAIN(1)
Sample and hold ADC
converter
VT
0.6 V
RADC(1)
AINx
VT
0.6 V
VAIN
Cparasitic
IL±1 µA
12-bit
converter
CADC(1)
ai14139d
1. Refer to Table 55 for the values of RAIN, RADC and CADC.
2. Cparasitic represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the
pad capacitance (roughly 7 pF). A high Cparasitic value will downgrade conversion accuracy. To remedy
this, fADC should be reduced.
General PCB design guidelines
Power supply decoupling should be performed as shown in Figure 51 or Figure 52,
depending on whether VREF+ is connected to VDDA or not. The 10 nF capacitors should be
ceramic (good quality). They should be placed them as close as possible to the chip.
Figure 51. Power supply and reference decoupling (VREF+ not connected to VDDA)
STM32F10xxx
V REF+
1 µF // 10 nF
V DDA
1 µF // 10 nF
V SSA/V REF-
ai14380b
1. VREF+ and VREF- inputs are available only on 100-pin packages.
96/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 52. Power supply and reference decoupling (VREF+ connected to VDDA)
STM32F10xxx
VREF+/VDDA
1 µF // 10 nF
VREF–/VSSA
ai14381b
1. VREF+ and VREF- inputs are available only on 100-pin packages.
5.3.19
DAC electrical specifications
Table 59.
DAC characteristics
Symbol
Parameter
Min
Max(1)
Typ
Unit
Comments
VDDA
Analog supply voltage
2.4
3.6
V
VREF+
Reference supply voltage
2.4
3.6
V
VSSA
Ground
0
0
V
RLOAD(2)
Resistive load with buffer ON
5
RO(2)
Impedance output with buffer
OFF
15
k
When the buffer is OFF, the
minimum resistive load
between DAC_OUT and VSS to
have a 1% accuracy is 1.5 M
CLOAD(2)
Capacitive load
50
pF
Maximum capacitive load at
DAC_OUT pin (when the buffer
is ON).
DAC_OUT
min(2)
Lower DAC_OUT voltage with
buffer ON
DAC_OUT
max(2)
Higher DAC_OUT voltage with
buffer ON
DAC_OUT
min(2)
Lower DAC_OUT voltage with
buffer OFF
DAC_OUT
max(2)
Higher DAC_OUT voltage with
buffer OFF
VREF+ must always be below
VDDA
k
0.2
V
VDDA – 0.2
0.5
V
It gives the maximum output
excursion of the DAC.
It corresponds to 12-bit input
code (0x0E0) to (0xF1C) at
VREF+ = 3.6 V and (0x155) and
(0xEAB) at VREF+ = 2.4 V.
mV
It gives the maximum output
excursion of the DAC.
VREF+ – 1LSB V
Doc ID 17143 Rev 2
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Electrical characteristics
Table 59.
DAC characteristics (continued)
Symbol
IDDVREF+
IDDA
DNL(3)
INL(3)
Offset(3)
STM32F101xF, STM32F101xG
Parameter
Min
DAC DC current consumption
in quiescent mode (Standby
mode)
DAC DC current consumption
in quiescent mode (Standby
mode)
Differential non linearity
Difference between two
consecutive code-1LSB)
Integral non linearity (difference
between measured value at
Code i and the value at Code i
on a line drawn between Code
0 and last Code 1023)
Offset error
(difference between measured
value at Code (0x800) and the
ideal value = VREF+/2)
Gain error(3) Gain error
tSETTLING(3)
Settling time (full scale: for a
10-bit input code transition
between the lowest and the
highest input codes when
DAC_OUT reaches final value
±1LSB
Max(1)
Typ
3
Max frequency for a correct
DAC_OUT change when small
Update rate(3)
variation in the input code (from
code i to i+1LSB)
Unit
Comments
220
µA
With no load, worst code
(0xF1C) at VREF+ = 3.6 V in
terms of DC consumption on
the inputs.
380
µA
With no load, middle code
(0x800) on the inputs.
480
µA
With no load, worst code
(0xF1C) at VREF+ = 3.6 V in
terms of DC consumption on
the inputs.
±0.5
LSB
Given for the DAC in 10-bit
configuration.
±2
LSB
Given for the DAC in 12-bit
configuration.
±1
LSB
Given for the DAC in 10-bit
configuration.
±4
LSB
Given for the DAC in 12-bit
configuration.
±10
mV
Given for the DAC in 12-bit
configuration.
±3
LSB
Given for the DAC in 10-bit at
VREF+ = 3.6 V.
±12
LSB
Given for the DAC in 12-bit at
VREF+ = 3.6 V.
±0.5
%
Given for the DAC in 12bit
configuration.
4
µs
CLOAD  50 pF, RLOAD  5 k
1
MS/s CLOAD  50 pF, RLOAD  5 k
tWAKEUP(3)
Wakeup time from off state
(Setting the ENx bit in the DAC
Control register)
6.5
10
µs
CLOAD  50 pF, RLOAD  5 k
input code between lowest and
highest possible ones.
PSRR+ (2)
Power supply rejection ratio (to
VDDA) (static DC measurement
–67
–40
dB
No RLOAD, CLOAD = 50 pF
1. Preliminary values.
2. Guaranteed by design, not tested in production.
3. Preliminary values.
98/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Electrical characteristics
Figure 53. 12-bit buffered /non-buffered DAC
Buffered/Non-buffered DAC
Buffer(1)
R LOAD
12-bit
digital to
analog
converter
DACx_OUT
C LOAD
ai17157
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external
loads directly without the use of an external operational amplifier. The buffer can be bypassed by
configuring the BOFFx bit in the DAC_CR register.
5.3.20
Temperature sensor characteristics
Table 60.
TS characteristics
Symbol
TL(1)
Parameter
Min
VSENSE linearity with temperature
Typ
Max
Unit
1
2
°C
Avg_Slope(1) Average slope
4.0
4.3
4.6
mV/°C
V25(1)
Voltage at 25°C
1.34
1.43
1.52
V
tSTART(2)
Startup time
10
µs
TS_temp(3)(2)
ADC sampling time when reading the
temperature
17.1
µs
4
1. Preliminary values.
2. Guaranteed by design, not tested in production.
3. Shortest sampling time can be determined in the application by multiple iterations.
Doc ID 17143 Rev 2
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Package characteristics
STM32F101xF, STM32F101xG
6
Package characteristics
6.1
Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
100/108
Doc ID 17143 Rev 2
STM32F101xF, STM32F101xG
Package characteristics
Figure 54. LQFP144, 20 x 20 mm, 144-pin thin quad flat
package outline(1)
Figure 55. Recommended
footprint(1)(2)
Seating plane
C
A
A2 A1
c
b
ccc
0.25 mm
gage plane
C
D
k
108
109
1.35
73
72
0.35
D1
A1
D3
0.5
L
73
108
L1
17.85
19.9
72
109
144
E1
22.6
37
E
1
E3
36
19.9
22.6
ai149
144
Pin 1
identification
37
36
1
e
ME_1A
1. Drawing is not to scale.
2. Dimensions are in millimeters.
Table 61.
LQFP144, 20 x 20 mm, 144-pin thin quad flat package mechanical data
inches(1)
millimeters
Symbol
Min
Typ
A
Max
Min
Typ
1.60
A1
0.050
A2
1.350
b
0.170
c
0.090
D
21.800
D1
Max
0.0630
0.15
0.0020
1.400
1.45
0.0531
0.0551
0.0571
0.220
0.27
0.0067
0.0087
0.0106
0.20
0.0035
22.000
22.20
0.8583
0.8661
0.874
19.800
20.000
20.20
0.7795
0.7874
0.7953
E
21.800
22.000
22.20
0.8583
0.8661
0.874
E1
19.800
20.000
20.20
0.7795
0.7874
0.7953
D3
17.500
0.0059
0.0079
0.689
E3
17.500
0.689
e
0.500
0.0197
L
0.450
L1
k
ccc
0.600
0.75
0.0177
1.000
0°
3.5°
0.0236
0.0295
0.0394
7°
0.080
0°
3.5°
7°
0.0031
1. Values in inches are converted from mm and rounded to 4 decimal digits.
Doc ID 17143 Rev 2
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Package characteristics
STM32F101xF, STM32F101xG
Figure 56. LQFP100 – 14 x 14 mm, 100-pin low-profile Figure 57. Recommended footprint(1)(2)
quad flat package outline(1)
0.25 mm
0.10 inch
GAGE PLANE
k
75
51
D
L
D1
76
L1
D3
51
75
50
0.5
C
76
0.3
50
16.7
14.3
b
E3 E1 E
100
26
1.2
1
100
26
Pin 1
1
identification
25
12.3
25
C
ccc
16.7
ai14906b
e
A1
A2
A
SEATING PLANE
C
1L_ME
1. Drawing is not to scale.
2. Dimensions are in millimeters.
Table 62.
LQPF100 – 14 x 14 mm, 100-pin low-profile quad flat package mechanical data
inches(1)
millimeters
Symbol
Min
Typ
A
Max
Min
Typ
1.600
A1
0.050
A2
1.350
b
0.170
c
0.090
D
15.800
D1
13.800
D3
Max
0.0630
0.150
0.0020
1.400
1.450
0.0531
0.0551
0.0571
0.220
0.270
0.0067
0.0087
0.0106
0.200
0.0035
16.000
16.200
0.622
0.6299
0.6378
14.000
14.200
0.5433
0.5512
0.5591
12.000
0.0059
0.0079
0.4724
E
15.800
16.000
16.200
0.622
0.6299
0.6378
E1
13.800
14.000
14.200
0.5433
0.5512
0.5591
E3
12.000
e
L
0.500
0.450
L1
k
ccc
0.4724
0.600
0.0197
0.750
1.000
0°
3.5°
0.0236
0.0295
0.0394
7°
0.08
0°
3.5°
0.0031
1. Values in inches are converted from mm and rounded to 4 decimal digits.
102/108
0.0177
Doc ID 17143 Rev 2
7°
STM32F101xF, STM32F101xG
Package characteristics
Figure 58. LQFP64 – 10 x 10 mm, 64 pin low-profile quad Figure 59. Recommended
flat package outline(1)
footprint(1)(2)
D
48
ccc C
D1
33
48
33
A
A2
D3
0.3
49
32
0.5
32
49
12.7
b
10.3
L1
10.3
E3 E1 E
64
17
1.2
L
A1
K
1
16
7.8
64
17
Pin 1
identification
12.7
16
1
c
ai14909
5W_ME
1. Drawing is not to scale.
2. Dimensions are in millimeters.
Table 63.
LQFP64 – 10 x 10 mm, 64 pin low-profile quad flat package mechanical data
inches(1)
millimeters
Symbol
Min
Typ
A
Max
Min
Typ
1.600
A1
0.050
A2
1.350
b
0.170
c
0.090
D
11.800
D1
9.800
D.
Max
0.0630
0.150
0.0020
0.0059
1.400
1.450
0.0531
0.0551
0.0571
0.220
0.270
0.0067
0.0087
0.0106
0.200
0.0035
12.000
12.200
0.4646
0.4724
0.4803
10.000
10.200
0.3858
0.3937
0.4016
0.0079
7.500
E
11.800
12.000
12.200
0.4646
0.4724
0.4803
E1
9.800
10.00
10.200
0.3858
0.3937
0.4016
e
0.500
0.0197
k
0°
3.5°
7°
0°
3.5°
7°
L
0.450
0.600
0.75
0.0177
0.0236
0.0295
L1
1.000
0.0394
ccc
0.080
0.0031
Number of pins
N
64
1. Values in inches are converted from mm and rounded to 4 decimal digits.
Doc ID 17143 Rev 2
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Package characteristics
6.2
STM32F101xF, STM32F101xG
Thermal characteristics
The maximum chip junction temperature (TJmax) must never exceed the values given in
Table 10: General operating conditions on page 38.
The maximum chip-junction temperature, TJ max, in degrees Celsius, may be calculated
using the following equation:
TJ max = TA max + (PD max × JA)
Where:
●
TA max is the maximum ambient temperature in °C,
●
JA is the package junction-to-ambient thermal resistance, in °C/W,
●
PD max is the sum of PINT max and PI/O max (PD max = PINT max + PI/Omax),
●
PINT max is the product of IDD and VDD, expressed in Watts. This is the maximum chip
internal power.
PI/O max represents the maximum power dissipation on output pins where:
PI/O max = (VOL × IOL) + ((VDD – VOH) × IOH),
taking into account the actual VOL / IOL and VOH / IOH of the I/Os at low and high level in the
application.
Table 64.
Package thermal characteristics
Symbol
JA
6.2.1
Parameter
Value
Thermal resistance junction-ambient
LQFP144 - 20 x 20 mm / 0.5 mm pitch
30
Thermal resistance junction-ambient
LQFP100 - 14 x 14 mm / 0.5 mm pitch
46
Thermal resistance junction-ambient
LQFP64 - 10 x 10 mm / 0.5 mm pitch
45
Unit
°C/W
Reference document
JESD51-2 Integrated Circuits Thermal Test Method Environment Conditions - Natural
Convection (Still Air). Available from www.jedec.org.
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STM32F101xF, STM32F101xG
Evaluating the maximum junction temperature for an application
When ordering the microcontroller, the temperature range is specified in the ordering
information scheme shown in Table 65: STM32F101xF and STM32F101xG ordering
information scheme.
Each temperature range suffix corresponds to a specific guaranteed ambient temperature at
maximum dissipation and, to a specific maximum junction temperature. Here, only
temperature range 6 is available (–40 to 85 °C).
The following example shows how to calculate the temperature range needed for a given
application, making it possible to check whether the required temperature range is
compatible with the STM32F10xxx junction temperature range.
Example: High-performance application
Assuming the following application conditions:
Maximum ambient temperature TAmax = 82 °C (measured according to JESD51-2),
IDDmax = 50 mA, VDD = 3.5 V, maximum 20 I/Os used at the same time in output at low
level with IOL = 8 mA, VOL= 0.4 V and maximum 8 I/Os used at the same time in output
mode at low level with IOL = 20 mA, VOL= 1.3 V
PINTmax = 50 mA × 3.5 V= 175 mW
PIOmax = 20 × 8 mA × 0.4 V + 8 × 20 mA × 1.3 V = 272 mW
This gives: PINTmax = 175 mW and PIOmax = 272 mW
PDmax = 175 + 272 = 447 mW
Thus: PDmax = 447 mW
Using the values obtained in Table 65 TJmax is calculated as follows:
–
For LQFP64, 45 °C/W
TJmax = 82 °C + (45 °C/W × 447 mW) = 82 °C + 20.1 °C = 102.1 °C
This is within the junction temperature range of the STM32F10xxx (–40 < TJ < 105 °C).
Figure 60. LQFP64 PD max vs. TA
700
600
PD (mW)
6.2.2
Package characteristics
500
400
Suffix 6
300
200
100
0
65
75
85
95
105
115
TA (°C)
Doc ID 17143 Rev 2
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Part numbering
7
STM32F101xF, STM32F101xG
Part numbering
Table 65.
STM32F101xF and STM32F101xG ordering information scheme
Example:
STM32 F 101 R
F
T
6
xxx
Device family
STM32 = ARM-based 32-bit microcontroller
Product type
F = general-purpose
Device subfamily
101 = access line
Pin count
R = 64 pins
V = 100 pins
Z = 144 pins
Flash memory size
F = 768 Kbytes of Flash memory
G = 1 Mbyte of Flash memory
Package
T = LQFP
Temperature range
6 = Industrial temperature range, –40 to 85 °C.
Options
xxx = programmed parts
TR = tape and real
For a list of available options (speed, package, etc.) or for further information on any aspect
of this device, please contact your nearest ST sales office.
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STM32F101xF, STM32F101xG
8
Revision history
Revision history
Table 66.
Document revision history
Date
Revision
27-Oct-2009
1
Initial release.
2
LQFP64 package mechanical data updated: see Figure 58: LQFP64 –
10 x 10 mm, 64 pin low-profile quad flat package outline and Table 63:
LQFP64 – 10 x 10 mm, 64 pin low-profile quad flat package mechanical
data.
Internal code removed from Table 65: STM32F101xF and
STM32F101xG ordering information scheme.
Updated note 2 below Table 51: I2C characteristics
Updated Figure 45: I2C bus AC waveforms and measurement circuit(1)
Updated Figure 44: Recommended NRST pin protection
Updated note 1 below Table 46: I/O static characteristics
Updated Table 20: Peripheral current consumption
Updated Table 14: Maximum current consumption in Run mode, code
with data processing running from Flash
Updated Table 15: Maximum current consumption in Run mode, code
with data processing running from RAM
Updated Table 16: Maximum current consumption in Sleep mode, code
running from Flash or RAM
Updated Table 17: Typical and maximum current consumptions in Stop
and Standby modes
Updated Table 18: Typical current consumption in Run mode, code with
data processing running from Flash
Updated Table 19: Typical current consumption in Sleep mode, code
running from Flash or RAM
Updated Table 24: LSE oscillator characteristics (fLSE = 32.768 kHz)
Updated Figure 21: Asynchronous non-multiplexed
SRAM/PSRAM/NOR read waveforms on page 58
Added Section 5.3.13: I/O current injection characteristics on page 79
15-Nov-2010
Changes
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STM32F101xF, STM32F101xG
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