TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 QUAD DIFFERENTIAL PECL DRIVERS FEATURES • • • • • • • • • • • • DESCRIPTION Functional Replacements for the Agere BDG1A, BPNGA and BDGLA Pin-Equivalent to the General-Trade 26LS31 Device 2.0 ns Maximum Propagation Delays 0.15 ns Output Skew Typical Between ± Pairs Capable of Driving 50-Ω Loads 5.0-V or 3.3-V Supply Operation TB5D1M Includes Surge Protection on Differential Outputs TB5D2H No Line Loading When VCC = 0 Third State Output Capability -40°C to 85°C Operating Temp Range ESD Protection HBM > 3 kV and CDM > 2 kV Available in Gull-Wing SOIC (JEDEC MS-013, DW) and SOIC (D) Packages These quad differential drivers are TTL input to pseudo-ECL differential output used for digital data transmission over balanced transmission lines. The TB5D1M device is a pin and functional replacement for the Agere systems BDG1A and BPNGA quad differential drivers. The TB5D1M has a built-in lightning protection circuit to absorb large transitions on the transmission lines without destroying the device. When the circuit is powered down it loads the transmission line, because of the protection circuit. The TB5D2H device is a pin and functional replacement for the Agere systems BDG1A and BDGLA quad differential drivers. Upon power down the TB5D2H output circuit appears as an open circuit and does not load the transmission line. Both drivers feature a 3-state output with a third-state level of less than 0.1 V. The packaging options available for these quad differential line drivers include a 16-pin SOIC gull-wing (DW) and a 16-pin SOIC (D) package. APPLICATIONS • Digital Data or Clock Transmission Over Balanced Transmission Lines Both drivers are characterized for operation from -40°C to 85°C The logic inputs of this device include internal pull-up resistors of approximately 40 kΩ that are connected to VCC to ensure a logical high level input if the inputs are open circuited. DW AND D PACKAGE (TOP VIEW) AI AO AO E1 BO BO BI GND FUNCTIONAL DIAGRAM AO 1 16 V CC 2 15 3 14 4 13 5 12 6 11 7 10 8 9 DI DO DO E2 CO CO CI AI AO BO BI BO ENABLE TRUTH TABLE CO E1 E2 Condition CO 0 0 1 0 Active 0 1 1 1 Disabled Active CI DO DI DO Active E1 E2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2003–2004, Texas Instruments Incorporated TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ORDERING INFORMATION PART NUMBER PART MARKING PACKAGE LEAD FINISH STATUS TB5D1MDW TB5D1M Gull-wing SOIC NiPdAu Production TB5D1MD TB5D1M SOIC NiPdAu Production TB5D2HDW TB5D2H Gull-wing SOIC NiPdAu Production TB5D2HD TB5D2H SOIC NiPdAu Production TB5D1MLDW TB5D1ML Gull-wing SOIC SnPb Production TB5D1MLD TB5D1ML SOIC SnPb Production TB5D2HLDW TB5D2HL Gull-wing SOIC SnPb Production TB5D2HLD TB5D2HL SOIC SnPb Production PACKAGE DISSIPATION RATINGS PACKAGE D DW (1) (2) (3) TA ≤ 25°C POWER RATING THERMAL RESISTANCE, JUNCTION-TO-AMBIENT WITH NO AIR FLOW DERATING FACTOR (1) ABOVE TA = 25°C TA = 85°C POWER RATING Low-K (2) 754 mW 132.6 °C/W 7.54 mW/°C 301 mW High-K (3) 1166 mW 85.8 °C/W 11.7 mW/°C 466 mW Low-K (2) 816 mW 122.5 °C/W 8.17 mW/°C 326 mW High-K (3) 1206 mW 82.9 °C/W 12.1 mW/°C 482 mW CIRCUIT BOARD MODEL This is the inverse of the junction-to-ambient thermal resistance when board-mounted with no air flow. In accordance with the low-K thermal metric definitions of EIA/JESD51-3. In accordance with the high-K thermal metric definitions of EIA/JESD51-7. THERMAL CHARACTERISTICS PARAMETER θJB Junction-to-board thermal resistance θJC Junction-to-case thermal resistance PACKAGE VALUE UNITS D 51.4 °C/W DW 56.6 °C/W D 45.7 °C/W DW 49.2 °C/W ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range unless otherwise noted (1) TB5D1M, TB5D2H Supply voltage, VCC 0 V to 6 V Input voltage ESD - 0.3 V to (VCC + 0.3 V) Human Body Model (2) All Pins ±3 kV Charged-Device Model (3) All Pins ±2 kV Continuous power dissipation See Dissipation Rating Table Storage temperature, Tstg -65°C to 130°C Junction temperature, TJ Lightning surge, TB5D1M only, see Figure 6 (1) (2) (3) 2 130°C D Package -80 V to 100 V DW Package -100 V to 100 V Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Tested in accordance with JEDEC Standard 22, Test Method A114-A. Tested in accordance with JEDEC Standard 22, Test Method C101. TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 RECOMMENDED OPERATING CONDITIONS (1) Supply voltage, VCC MIN NOM MAX UNIT 5.0-V nominal supply 4.5 5 5.5 V 3.3-V nominal supply 3.0 3.3 3.6 V 85 °C Operating free-air temperature, TA (1) -40 The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet, unless otherwise stated. ELECTRICAL CHARACTERISTICS over recommended operating conditions unless otherwise noted parameter ICC test conditions Supply current PD Power dissipation min typ (1) max VCC = 4.5 V to 5.5 V, no loads 40 VCC = 3.0 V to 3.6 V, no loads 40 unit mA VCC = 4.5 V to 5.5 V, Figure 3 loads all outputs 290 360 VCC = 3.0 V to 3.6 V, Figure 4 loads all outputs 280 360 VCC - 1.8 VCC - 1.3 VCC - 0.8 V VOH - 1.4 VOH - 1.2 VOH - 0.7 V mW VOH Output high voltage VOL Output low voltage VOD Differential output voltage |VOH - VOL| 0.7 1.2 1.4 V VOH Output high voltage VCC - 1.8 VCC - 1.3 VCC - 0.8 V VOL Output low voltage VOH - 1.4 VOH - 1.1 VOH - 0.5 V VOD Differential output voltage |VOH - VOL| 0.5 1.1 1.4 V VOC(PP) Peak-to-peak common-mode output voltage CL= 5 pF, Figure 5 230 600 mV VOZ Third-state output voltage Figure 3 or Figure 4 load 0.1 V 0.8 V VCC = 4.5 V to 5.5 V, Figure 3 VCC = 3.0 V to 3.6 V, Figure 4 voltage (2) VIL Low level input VIH High level input voltage VIK Enable input clamp voltage 2 V VCC = 4.5 V, II = -5 mA -1 (3) VCC = 5.5 V, VO = 0 V -250 (3) VCC = 5.5 V, VOD = 0 V ±10 (3) V IOS Output short-circuit current (4) IIL Input low current, enable or data VCC = 5.5 V, VI = 0.4 V -400 (3) µA Input high current, enable or data VCC = 5.5 V, VI =2.7 V 20 µA Input reverse current, enable or data VCC = 5.5 V, VI =5.5 V 100 µA IIH CIN (1) (2) (3) (4) Input capacitance 5 mA pF All typical values are at 25°C and with a 3.3-V or 5-V supply. The input level provides no noise immunity and should be tested only in a static, noise-free environment. This parameter is listed using a magnitude and polarity/direction convention, rather than an algebraic convention, to match the original Agere data sheet. Test must be performed one output at a time to prevent damage to the device. No test circuit attached. 3 TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 THIRD STATE—A TB5D1M (or TB5D2H) driver produces pseudo-ECL levels, and has a third-state mode, which is different than a conventional TTL device. When a TB5D1M (or TB5D2H) driver is placed in the third state, the base of the output transistors is pulled low, bringing the outputs below the active-low level of standard PECL devices. [For example: The TB5D1M low output level is typically 2.7 V, while the third state output level is less than 0.1 V.] In a bidirectional, multipoint, bus application, the driver of one device, which is in its third state, may be back driven by another driver on the bus whose voltage in the low state is lower than the third-stated device. This could come about due to differences in the driver's independent power supplies. In this case, the device in the third state controls the line, thus clamping the line and reducing the signal swing. If the difference voltage between the independent driver power supplies is small, this consideration can be ignored. Again using the TB5D1M driver as an example, a typical supply voltage difference between separate drivers of > 2 V can exist without significantly affecting the amplitude of the signal. SWITCHING CHARACTERISTICS, 5-V NOMINAL SUPPLY over recommended operating conditions unless otherwise noted parameter test conditions output (2) tP1 Propagation delay time, input high to tP2 Propagation delay time, input low to output (2) ∆tP Capacitive delay tPHZ Propagation delay time, high-level-to-high-impedance output tPLZ Propagation delay time, low-level-to-high-impedance output tPZH Propagation delay time, high-impedance-to-high-level output tPZL Propagation delay time, high-impedance-to-low-level output tskew1 tshew2 unit 1.2 2 0.01 0.03 7 12 7 12 5 12 4 12 Output skew, |tP1 - tP2| 0.15 0.3 Output skew, |tPHH - tPHL|, |tPLH - tPLL| CL = 5 pF, See Figure 1 and Figure 3 0.15 1.1 0.1 1 CL = 5 pF, See Figure 1 and Figure 3 0.7 2 0.7 2 skew (3) ∆tskew Output skew, difference between drivers (4) tTLH Rise time (20% - 80%) tTHL Fall time (80% - 20%) 4 max 2 Part-to-part (4) typ (1) 1.2 tskew(pp) (1) (2) (3) min CL = 5 pF, See Figure 1 and Figure 3 CL = 5 pF, See Figure 2 and Figure 3 ns ns/pF ns ns 0.3 ns All typical values are at 25°C and with a 5-V supply. Parameters tP1 and tP2 are measured from the 1.5 V point of the input to the crossover point of the outputs (see Figure 1). tskew(pp) is the magnitude of the difference in differential propagation delay times, tP1 or tP2, between any specified outputs of two devices when both devices operate with the same supply voltage, at the same temperature, and have identical packages and test circuits. ∆tskew is the magnitude of the difference in differential skew tskew1 between any specified outputs of a single device. TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 SWITCHING CHARACTERISTICS, 3.3-V NOMINAL SUPPLY over recommended operating conditions unless otherwise noted parameter test conditions tP1 Propagation delay time, input high to output (2) tP2 Propagation delay time, input low to output (2) ∆tP Capacitive delay tPHZ Propagation delay time, high-level-to-high-impedance output tPLZ Propagation delay time, low-level-to-high-impedance output tPZH Propagation delay time, high-impedance-to-high-level output tPZL Propagation delay time, high-impedance-to-low-level output tskew1 Output skew, |tP1 - tP2| tshew2 Output skew, |tPHH - tPHL|, |tPLH - tPLL| tskew(pp) Part-to-part skew (3) ∆tskew Output skew, difference between drivers (4) tTLH Rise time (20% - 80%) tTHL Fall time (80% - 20%) (1) (2) (3) (4) CL = 5 pF, See Figure 1 and Figure 4 CL = 5 pF, See Figure 2 and Figure 4 min typ (1 ) max unit 1.2 3.5 1.2 3.5 0.01 0.03 8 12 5 12 5 12 8 12 0.15 0.3 CL = 5 pF, See Figure 1 and Figure 4 0.15 1.2 0.1 1 CL = 5 pF, See Figure 1 and Figure 4 0.7 2 0.7 2 ns ns/pF ns ns 0.3 ns All typical values are at 25°C and with a 3.3-V supply. Parameters tP1 and tP2 are measured from the 1.5 V point of the input to the crossover point of the outputs (see Figure 1). tskew(pp) is the magnitude of the difference in differential propagation delay times, tP1 or tP2, between any specified outputs of two devices when both devices operate with the same supply voltage, at the same temperature, and have identical packages and test circuits. ∆tskew is the magnitude of the difference in differential skew tskew1 between any specified outputs of a single device. 5 TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 2.4 V 1.5 V INPUT 0.4 V tP1 tP2 VOH OUTPUTS VOL tPHH tPLL VOH OUTPUT (VOH + VOL)/2 VOL tPHL tPLH VOH OUTPUT (VOH + VOL)/2 VOL OUTPUT 80% VOH 80% 20% 20% ttLH VOL ttHL Figure 1. Propagation Delay Time Waveforms 2.4 V E1(1) 1.5 V 0.4 V 2.4 V E2(2) 1.5 V 0.4 V tPHZ tPZH VOH VOL + 0.2 V VOL OUTPUT VOL − 0.1 V tPLZ tPZL VOL OUTPUT VOL − 0.1 V (1) E2 = 1 while E1 changes state E1 = 0 while E2 changes state NOTE: In the third state, both outputs (OUTPUT and OUTPUT) are 0.1 V (max). (2) Figure 2. Enable and Disable Delay Time Waveforms 6 TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 test conditions Parametric values specified under the Electrical Characteristics and Switching Characteristics sections are measured with the following output load circuit. 100 Ω OUTPUT CL 200 Ω OUTPUT 200 Ω CL Figure 3. Driver Test Circuits, 5-V Nominal Supplies 100 Ω OUTPUT 75 Ω CL OUTPUT 75 Ω CL Figure 4. Driver Test Circuits, 3.3-V Nominal Supplies VOC 50 Ω OUTPUT CL 200 Ω VOC 50 Ω CP = 2 pF 200 Ω OUTPUT OUTPUT CL CL Note: VOC(PP) load circuit for 5-V nominal supplies. 50 Ω 75 Ω OUTPUT 50 Ω CP = 2 pF 75 Ω CL Note: VOC(PP) load circuit for 3.3-V nominal supplies. VOH OUTPUT VOL VOC VOC(PP) Note: All input pulses are supplied by a generator having the following characteristics: tr or tf = 1 ns, pulse repetition rate (PRR) = 0.25 Mbps, pulse width = 500 ± 10 ns. CP includes the instrumentation and fixture capacitance within 0,06 m of the D.U.T. The measurement of VOC(PP) is made on test equipment with a –3 dB bandwidth of at least 1 GHz. Figure 5. Test Circuits and Definitions for the Driver Common-Mode Output Voltage 7 TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 VCC 110 Ω DUT 110 Ω + _ Lightning Surge Test Generators + _ Note: Surges may be applied simultaneously, but never in opposite polarities. Surge test pulses have tr = tf = 2 µs, pulse width = 7 µs (50% points), and period = 250 ms. Figure 6. Lightning-Surge Testing Configuration for TB5D1M 8 TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 TYPICAL CHARACTERISTICS OUTPUT VOLTAGE RELATIVE TO VCC vs OUTPUT CURRENT OUTPUT VOLTAGE RELATIVE TO VCC vs FREE-AIR TEMPERATURE 0 0 VCC = 4.5 V to 5.5 V, Figure 3 Load VO - Output Voltage Relative To VCC - V VO - Output Voltage Relative To VCC - V TA = 25C -0.5 VOH -1 -1.5 -2 -2.5 VOL -3 -3.5 -50 -3 -50 VOL Max VOL Min -2.5 -3 -50 Figure 8. OUTPUT VOLTAGE RELATIVE TO VCC vs FREE-AIR TEMPERATURE DIFFERENTIAL OUTPUT VOLTAGE vs FREE-AIR TEMPERATURE -10 0 150 1.6 VOD - Differential Output Voltage - V VO - Output Voltage Relative To VCC - V -2.5 -2 Figure 7. -20 -0.5 -2 VOH Min -1.5 IO - Output Current - mA -30 VCC = 3 V to 3.6 V, Figure 4 Load -1.5 VOH Max -1 0 50 100 TA - Free-Air Temperature - °C -40 0 -1 -0.5 VOH Max VOH Min VOL Max VOL Min 0 50 100 TA - Free-Air Temperature - °C Figure 9. 150 VOD Max VCC = 4.5 V to 5.5 V, Figure 3 Load 1.4 VOD Nom 1.2 VOD Min 1 0.8 -50 0 50 100 TA - Free-Air Temperature - °C 150 Figure 10. 9 TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 TYPICAL CHARACTERISTICS (continued) DIFFERENTIAL OUTPUT VOLTAGE vs FREE-AIR TEMPERATURE PROPAGATION DELAY TIME tP1 or tP2 vs FREE-AIR TEMPERATURE 1.6 VCC = 4.5 V to 5.5 V, Figure 3 Load VOD Max 1.2 t P − Propagation Delay Time − ns VOD - Differential Output Voltage - V 1.4 VOD Nom 1 VOD Min 0.8 VCC = 3 V to 3.6 V, Figure 4 Load 0.6 -50 0 50 100 TA - Free-Air Temperature - °C 1.4 1.2 Max Delay 1 Min Delay 0.8 0 −50 150 50 100 0 TA - Free-Air Temperature - C Figure 11. Figure 12. PROPAGATION DELAY TIME tP1 or tP2 vs FREE-AIR TEMPERATURE 3.5 t P − Propagation Delay Time − ns VCC = 3 V to 3.6 V, Figure 4 Load 3 2.5 Max Delay 2 1.5 Min Delay 1 0.5 0 −50 50 100 0 TA - Free-Air Temperature - C Figure 13. 10 150 150 TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 APPLICATION INFORMATION Power dissipation The power dissipation rating, often listed as the package dissipation rating, is a function of the ambient temperature, TA, and the airflow around the device. This rating correlates with the device's maximum junction temperature, sometimes listed in the absolute maximum ratings tables. The maximum junction temperature accounts for the processes and materials used to fabricate and package the device, in addition to the desired life expectancy. There are two common approaches to estimating the internal die junction temperature, TJ. In both of these methods, the device’s internal power dissipation, PD, needs to be calculated. This is done by totaling the supply power(s) to arrive at the system power dissipation: (V Sn I Sn ) (1) and then subtracting the total power dissipation of the external load(s): (V Ln I Ln ) (2) The first TJ calculation uses the power dissipation and ambient temperature, along with one parameter: θJA, the junction-to-ambient thermal resistance, in degrees Celsius per watt. The product of PD and θJA is the junction temperature rise above the ambient temperature. Therefore: T J T A (PD JA ) (3) 140 the device and PCB. JEDEC/EIA has defined standardized test conditions for measuring θJA. Two commonly used conditions are the low-K and the high-K boards, covered by EIA/JESD51-3 and EIA/JESD51-7 respectively. Figure 14 shows the low-K and high-K values of θJA versus air flow for this device and its package options. The standardized θJA values may not accurately represent the conditions under which the device is used. This can be due to adjacent devices acting as heat sources or heat sinks, to nonuniform airflow, or to the system PCB having significantly different thermal characteristics than the standardized test PCBs. The second method of system thermal analysis is more accurate. This calculation uses the power dissipation and ambient temperature, along with two device and two system-level parameters: • θJC, the junction-to-case thermal resistance, in degrees Celsius per watt • θJB, the junction-to-board thermal resistance, in degrees Celsius per watt • θCA, the case-to-ambient thermal resistance, in degrees Celsius per watt • θBA, the board-to-ambient thermal resistance, in degrees Celsius per watt. In this analysis, there are two parallel paths, one through the case (package) to the ambient, and another through the device to the PCB to the ambient. The system-level junction-to-ambient thermal impedance,θJA(S), is the equivalent parallel impedance of the two parallel paths: T J T A (PD JA(S) ) (4) where Thermal Impedance − C/W 120 D, Low−K JA(S) DW, Low−K 80 DW, High−K 40 0 D, High−K 100 200 300 ( JC CA JB BA ) The device parameters θJC and θJB account for the internal structure of the device. The system-level parameters θCA and θBA take into account details of the PCB construction, adjacent electrical and mechanical components, and the environmental conditions including airflow. Finite element (FE), finite difference (FD), or computational fluid dynamics (CFD) programs can determine θCA and θBA. Details on using these programs are beyond the scope of this data sheet, but are available from the software manufacturers. 100 60 ( JC CA ) ( JB BA ) 400 500 Air Flow − LFM Figure 14. Thermal Impedance vs Air Flow Note that θJA is highly dependent on the PCB on which the device is mounted, and on the airflow over 11 TB5D1M, TB5D2H www.ti.com SLLS579B – SEPTEMBER 2003 – REVISED MAY 2004 Load Circuits Transmission Line The test load circuits shown in Figure 3 and Figure 4 are based on a recommended pi type of load circuit shown in Figure 15. The 100-Ω differential load resistor RT at the receiver provide proper termination for the interconnecting transmission line, assuming it has a 100-Ω characteristic impedance. The two resistors RS to ground at the driver end of the transmission line link provide dc current paths for the emitter follower output transistors. The two resistors to ground normally should not be placed at the receiver end, as they shunt the termination resistor, potentially creating an impedance mismatch with undesirable reflections. INPUT OUTPUT Recommended Resistor Values: For 5 V Nom Supplies, RT = 200 Ω, RS = 90 Ω For 3.3 V Nom Supplies, RT = 100 Ω, RS = 30 Ω RT/2 RT/2 RS Figure 16. A Recommended Y Load Circuit An additional load circuit, similar to one commonly used with ECL and PECL, is shown in Figure 17. Transmission Line INPUT OUTPUT Transmission Line INPUT RT = 100 RS RS OUTPUT RT/2 RT/2 + _ VT Recommended Resistor Values: For 5-V Nominal Supplies, RS = 200 For 3.3-V Nominal Supplies, RS = 75 Figure 15. A Recommended pi Load Circuit Another common load circuit, a Y load, is shown in Figure 16. The receiver-end line termination of RT is provided by the series combination of the two RT/2 resistors, while the dc current path to ground is provided by the single resistor RS. Recommended values, as a function of the nominal supply voltage range, are indicated in the figure. 12 Recommended Resistor Values: For 5 V and 3.3 V Nom Supplies, RT = 100 Ω, VT = VCC - 2.55 V Figure 17. A Recommended PECL-Style Load Circuit An important feature of all of these recommended load circuits is that they ensure that both of the emitter follower output transistors remain active (conducting current) at all times. When deviating from these recommended values, it is important to make sure that the low-side output transistor does not turn off. Failure to do so increases the tskew2 and VOC(PP) values, increasing the potential for electromagnetic radiation. PACKAGE OPTION ADDENDUM www.ti.com 4-Feb-2005 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Eco Plan (2) Qty TB5D1MD ACTIVE SOIC D 16 40 Pb-Free (RoHS) CU NIPDAU Level-2-250C-1YEAR/ Level-1-220C-UNLIM TB5D1MDR ACTIVE SOIC D 16 2500 Pb-Free (RoHS) CU NIPDAU Level-2-250C-1YEAR/ Level-1-220C-UNLIM TB5D1MDW ACTIVE SOIC DW 16 40 Pb-Free (RoHS) CU NIPDAU Level-2-250C-1YEAR/ Level-1-220C-UNLIM TB5D1MDWR ACTIVE SOIC DW 16 2000 Pb-Free (RoHS) CU NIPDAU Level-2-250C-1YEAR/ Level-1-220C-UNLIM TB5D2HD ACTIVE SOIC D 16 40 Pb-Free (RoHS) CU NIPDAU Level-2-250C-1YEAR/ Level-1-220C-UNLIM TB5D2HDR ACTIVE SOIC D 16 2500 Pb-Free (RoHS) CU NIPDAU Level-2-250C-1YEAR/ Level-1-220C-UNLIM TB5D2HDW ACTIVE SOIC DW 16 40 Pb-Free (RoHS) CU NIPDAU Level-2-250C-1YEAR/ Level-1-220C-UNLIM TB5D2HDWR ACTIVE SOIC DW 16 2000 Pb-Free (RoHS) CU NIPDAU Level-2-250C-1YEAR/ Level-1-220C-UNLIM Lead/Ball Finish MSL Peak Temp (3) (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - May not be currently available - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. None: Not yet available Lead (Pb-Free). Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Green (RoHS & no Sb/Br): TI defines "Green" to mean "Pb-Free" and in addition, uses package materials that do not contain halogens, including bromine (Br) or antimony (Sb) above 0.1% of total product weight. (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDECindustry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. 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