TI TAS5121DKDR

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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
TM
FEATURES
APPLICATIONS
D DVD Receiver
D Home Theatre
D Mini/Micro Component Systems
D Internet Music Appliance
D 100-W RMS Power (BTL) Into 4 Ω With Less
Than 10% THD+N
D 80-W RMS Power (BTL) Into 4 Ω With Less
Than 0.2% THD+N
DESCRIPTION
D 0.05% THD+N at 1 W Into 4 Ω
The TAS5121 is a high-performance digital amplifier
power stage designed to drive a 4-Ω speaker up to 100 W.
The device incorporates PurePath Digital technology
and can be used with a TI audio PWM processor and a
simple passive demodulation filter to deliver high-quality,
high-efficiency digital audio amplification.
D Power Stage Efficiency Greater Than 90%
Into 4 Ω Load
D Self-Protecting Design
D 36-Pin PSOP3 Package
The efficiency of this digital amplifier can be greater than
90%, depending on the system design. Overcurrent
protection, overtemperature protection, and undervoltage
protection are built into the TAS5121, safeguarding the
device and speakers against fault conditions that could
damage the system.
D 3.3-V Digital Interface
D EMI Compliant When Used With
Recommended System Design
TOTAL HARMONIC DISTORTION + NOISE
vs
POWER
90
RL = 4 Ω
TC = 75°C
Gain = 3 dB
80
70
PO − Output Power − W
THD+N − Total Harmonic Distortion + Noise − %
10
UNCLIPPED OUTPUT POWER
vs
H-BRIDGE VOLTAGE
1
0.1
4Ω
60
6Ω
50
40
30
8Ω
20
10
0.01
0.1
0
1
10
100
P − Power − W
0
4
8
12
16
20
24
28
32
PVDD_X − H-Bridge Voltage − V
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
PurePath Digital and PowerPAD are trademarks of Texas Instruments.
Other trademarks are the property of their respective owners.
! "#$ %!& %
"! "! '! ! !( ! %% )*&
% "!+ %! !!$* $%! !+ $$ "!!&
Copyright  2004, Texas Instruments Incorporated
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during
storage or handling to prevent electrostatic damage to the MOS gates.
GENERAL INFORMATION
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
Terminal Assignment
DKD PACKAGE
(TOP VIEW)
GND
PWM_BP
GND
RESET
DREG_RTN
GVDD
M3
DREG
DGND
M1
M2
DVDD
SD
DGND
OTW
GND
PWM_AP
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
UNITS
TAS5121
The TAS5121 is offered in a thermally enhanced 36-pin
PSOP3 (DKD) package. The DKD package has the
thermal pad on top.
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
GVDD_B
GVDD_B
GND
BST_B
PVDD_B
PVDD_B
OUT_B
OUT_B
GND
GND
OUT_A
OUT_A
PVDD_A
PVDD_A
BST_A
GND
GVDD_A
GVDD_A
DVDD TO DGND
–0.3 V to 4.2 V
GVDD_x TO GND
14.2 V
PVDD_X TO GND (dc voltage)
PVDD_X TO GND(2))
33.5 V
OUT_X TO GND (dc voltage)
OUT_X TO GND(2))
33.5 V
BST_X TO GND (DC voltage)
BST_X TO GND(2))
46 V
48 V
48 V
53 V
PWM_XP, RESET, M1, M2, M3, SD,
OTW
–0.3 V to DVDD + 0.3 V
Maximum junction temperature range,
TJ
Storage temperature
–40°C to 150°C
–40°C to 125°C
(1) Stresses beyond those listed under “absolute maximum ratings”
may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any
other conditions beyond those indicated under “recommended
operating conditions” is not implied. Exposure to absolutemaximum-rated conditions for extended periods may affect device
reliability.
(2) The duration should be less than 100 ns (see application note
SLEA025).
ORDERING INFORMATION
TA
PACKAGE
TRANSPORT
MEDIA
DESCRIPTION
0°C to 70°C
TAS5121DKD
Tube
36-pin PSOP3
0°C to 70°C
TAS5121DKDR
Tape and reel
36-pin PSOP3
PACKAGE DISSIPATION RATINGS
PACKAGE
RθJC
(°C/W)
RθJA
(°C/W)
36-Pin DKD PSOP3
0.85
See Note 1
(1) The TAS5121 package is thermally enhanced for conductive
cooling using an exposed metal pad area. It is impractical to use the
devices with the pad exposed to ambient air as the only heat sinking
of the device.
For this reason, RθJA, a system parameter that characterizes the
thermal treatment, is provided in the Application Information section
of the data sheet. An example and discussion of typical system
RθJA values are provided in the Thermal Information section. This
example provides additional information regarding the power
dissipation ratings. This example should be used as a reference to
calculate the heat dissipation ratings for a specific application.
2
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
Terminal Functions
TERMINAL
NAME
BST_A
DKD
FUNCTION(1)
DESCRIPTION
22
P
High-side bootstrap supply (BST), external resistor and capacitor to OUT_A required
BST_B
33
P
High-side bootstrap supply (BST), external resistor and capacitor to OUT_B required
DGND
9, 14
P
I/O reference ground
DREG
8
P
Digital supply voltage regulator decoupling pin, 1-µF capacitor connected to DREG_RTN
DREG_RTN
5
P
Decoupling return pin
DVDD
12
P
I/O reference supply input: 100 Ω to DREG, decoupled to GND, 0.1-µF capacitor connected to
GND
1, 3, 16,
18, 21,
27, 28,
34
P
Power ground, connected to system GND
6
P
Local GVDD decoupling \pin
GVDD_A
19, 20
P
Gate drive input voltage
GVDD_B
35, 36
P
Gate drive input voltage
M1
10
I
Protection mode selection pin, connect to GND
M2
11
I
Protection mode selection pin, connect to DREG
M3
7
I
Output mode selection pin; connect to GND
OTW
15
O
Overtemperature warning output, open drain with internal pullup resistor, active-low when temperature exceeds 115°C
OUT_A
25, 26
O
Output, half-bridge A
OUT_B
29, 30
O
Output, half-bridge B
PVDD_A
23, 24
P
Power supply input for half-bridge A
PVDD_B
31, 32
P
Power supply input for half-bridge B
PWM_AP
17
I
PWM input signal, half-bridge A
PWM_BP
2
I
PWM input signal, half-bridge B
RESET
4
I
Reset signal, active-low
SD
13
O
Shutdown signal for half-bridges A and B (open drain with internal pullup resistor), active-low
GND
GVDD
(1) I = input, O = Output, P = Power
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
FUNCTIONAL BLOCK DIAGRAM
GVDD_A
GVDD_A
BST_A
PVDD_A
OCH
DREG
Gate
Drive
DVDD DREG
PWM_AP
PWM
Receiver
Timing
Control
GVDD_A
and
Protection
DGND
OUT_A
Gate
Drive
GND
OCL
GVDD_B
RESET
GVDD_B
BST_B
PVDD_B
OCH
DREG
DVDD
DVDD
PWM_BP
Gate
Drive
DREG
PWM
Receiver
Timing
Control
GVDD_B
and
Protection
DGND
OUT_B
Gate
Drive
GND
OCL
GVDD
DREG
OTW
SD
M1
M2
M3
4
DREG
Protection
Logic
OT
and
UVP
DREG
DREG
Internally
Connected
to GVDD_x
DREG_RTN
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
RECOMMENDED OPERATING CONDITIONS
DVDD
Digital supply (1)
Relative to DGND
GVDD_x
Supply for internal gate drive and logic
regulators
Relative to GND
PVDD_x
Half-bridge supply
Relative to GND, RL= 4 Ω
TJ
Junction temperature
(1) It is recommended for DVDD to be connected to DREG via a 100-Ω resistor.
MIN
TYP
MAX
UNIT
3
3.3
3.6
V
10.8
12
13.2
V
0
30.5
32
V
125
_C
0
ELECTRICAL CHARACTERISTICS
PVDD_X = 30.5 V, GVDD_x = 12 V, DVDD connected to DREG via a 100-Ω resistor, RL = 4 Ω, 8X fs = 384 kHz, TAS5026 PWM processor,
unless otherwise noted
TYPICAL
SYMBOL
PARAMETER
TEST CONDITIONS
OVER TEMPERATURE
TC=75°C
UNITS
MIN/TYP/
MAX
RL = 4 Ω, THD = 10%, AES17
filter
100
W
Typ
RL = 4 Ω, THD = unclipped,
AES17 filter
80
W
Typ
RL = 8 Ω, THD =unclipped,
AD mode
44
W
Typ
Po = 1 W/ channel, RL = 4 Ω,
AES17 filter
0.05
%
Typ
Po = 10 W/channel, RL = 4 Ω,
AES17 filter
0.1
%
Typ
Po = 80 W/channel, RL = 4 Ω,
AES17 filter
0.2
%
Typ
TA=25°C
TA=25°C
AC PERFORMANCE, BTL Mode, 1 kHz
Po
THD+N
Output power
Total harmonic distortion + noise
Vn
Output integrated noise voltage
A-weighted, RL = 4 Ω,
20 Hz to 20 kHz, AES17 filter
300
µV
Max
SNR
Signal-to-noise ratio
A-weighted, AES17 filter
95
dB
Typ
DR
Dynamic range
f = 1 kHz, −60 dB,
A-weighted, AES17 filter
95
dB
Typ
5
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
ELECTRICAL CHARACTERISTICS
PVDD_X = 30.5 V, GVDD_x = 12 V, DVDD connected to DREG via a 100-Ω resistor, RL = 4 Ω, 8X fs = 384 kHz, TAS5026 PWM processor,
unless otherwise noted
TYPICAL
SYMBOL
PARAMETER
TEST CONDITIONS
TA=25°C
OVER TEMPERATURE
TA=25°C
TC=75°C
UNITS
MIN/TYP/
MAX
INTERNAL VOLTAGE REGULATOR AND CURRENT CONSUMPTION
V
Min
V
Max
30
mA
Max
1
5
mA
Max
120
132
mΩ
Max
120
132
mΩ
Max
7
V
Min
8.2
V
Max
DREG
Voltage regulator
Io = 1 mA
3.3
IGVDD_x
Total GVDD supply current, operating
fS = 384 kHz, no load,
50% duty cycle
24
IDVDD
DVDD supply current, operating
fS = 384 kHz, no load
OUTPUT STAGE MOSFETs
RDSon,LS Forward on-resistance, low side
RDSon,HS Forward on-resistance, high side
TJ = 25°C
TJ = 25°C
INPUT/OUTPUT PROTECTION
Vuvp,G
Undervoltage protection limit, GVDD
7.6
OTW
Overtemperature warning
Static
115
°C
Typ
OTE
Overtemperature error
Static
150
°C
Typ
OC
Overcurrent protection
See Note 1.
9.5
A
Min
STATIC DIGITAL INPUT SPECIFICATION, PWM, PROTECTION MODE SELECTION PINS AND OUTPUT MODE SELECTION PINS
VIH
High-level input voltage
VIL
Low-level input voltage
Leakage
Input leakage current
2
V
Min
DVDD
V
Max
0.8
V
Max
−10
µA
Min
10
µA
Max
22
kΩ
Min
OTW/SHUTDOWN (SD)
Internal pullup resistor from OTW and
SD to DVDD
32
VOL
Low-level output voltage
IO = 1 mA
0.4
V
Max
(1) To optimize device performance and prevent overcurrent (OC) protection activation, the demodulation filter must be designed with special care.
See Demodulation Filter Design in the Application Information section of the data sheet and consider the recommended inductors and capacitors
for optimal performance. It is also important to consider PCB design and layout for optimum performance of the TAS5121.
6
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
TYPICAL APPLICATION AND CHARACTERIZATION CONFIGURATION USED WITH TAS5026
PWM PROCESSOR
TAS5121DKD
1
2
PWM_AP_1
3
4
5
6
100
nF
7
8
9
1 µF
10
11
100 Ω
12
13
100 nF
14
15
16
PWM_BP_1
17
18
1 µF
GND
GVDD_B
PWM_BP
GVDD_B
GND
RESET
DREG_RTN
GVDD
34
GND
33
1Ω
100 nF
BST_B
2.7 Ω
32
PVDD_B
PVDD_B
31
75 nH LPCB‡
33 nF 10 µH
30
OUT_B
DREG
OUT_B
29
DGND
GND
M1
GND
28
TVS Zener†
27
TVS Zener†
26
M2
OUT_A
DVDD
OUT_A
10 µH
1 µF
1 µF
4.7 kΩ
H-Bridge
Power Supply
1000 µF
4.7 kΩ
25
33 nF
75 nH LPCB‡
24
SD
PVDD_A
DGND
PVDD_A
OTW
BST_A
GND
GND
GND
22 Ω
35
M3
PWM_AP
Gate-Drive
Power Supply
36
23
21
GVDD_A
GVDD_A
2.7 Ω
22
20
1Ω
100 nF
22 Ω
19
33 µF
1 µF
Microcontroller
† Voltage suppressor diodes: 1SMA33CAT3
‡ LPCB : Track in the PCB 1,0 mm wide and 50 mm long)
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
TOTAL HARMONIC DISTORTION + NOISE
vs
POWER
90
RL = 4 Ω
TC = 75°C
Gain = 3 dB
80
70
PO − Output Power − W
THD+N − Total Harmonic Distortion + Noise − %
10
UNCLIPPED OUTPUT POWER
vs
H-BRIDGE VOLTAGE
1
0.1
4Ω
60
6Ω
50
40
30
8Ω
20
10
0
0.01
0.1
1
10
0
100
P − Power − W
4
8
12
16
20
24
28
32
PVDD_X − H-Bridge Voltage − V
Figure 1
Figure 2
POWER LOSS
vs
TOTAL OUTPUT POWER
UNCLIPPED OUTPUT POWER
vs
CASE TEMPERATURE
14
100
90
12
80
PO − Output Power − W
Power Loss − W
10
8
6
4
70
60
50
40
30
20
2
10
0
0
10
20
30
40
50
60
PO(Total) − Total Output Power − W
Figure 3
8
70
80
0
−30
0
30
60
90
TC − Case Temperature − °C
Figure 4
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
EFFICIENCY
vs
TOTAL OUTPUT POWER
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
1
THD+N − Total Harmonic Distortion + Noise − %
100
90
80
η − Efficiency − %
70
60
50
40
30
20
10
0
0
10
20
30
40
50
60
70
RL = 4 Ω
TC = 75°C
75 W
0.1
10 W
1W
0.01
0.001
20
80
100
PO(Total) − Total Output Power − W
Figure 6
AMPLITUDE
vs
FREQUENCY
AMPLITUDE
vs
FREQUENCY
0
PO = 1 W
TC = 75°C
−20
0.3
8Ω
−40
0.2
Amplitude − dBr A
Amplitude − dBr A
10k 20k
Figure 5
0.5
0.4
1k
f − Frequency − Hz
6Ω
0.1
−0.0
0.0
−0.1
−0.2
4Ω
−60
−80
−100
−120
−0.3
−140
−0.4
−0.5
10
−160
100
1k
f − Frequency − Hz
Figure 7
10k 20k
0
2
4
6
8
10
12
14
16
18
20
22
f − Frequency − kHz
Figure 8
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
THEORY OF OPERATION
RECOMMENDATIONS FOR POWERING UP
> 1 ms
POWER SUPPLIES
> 1 ms
This power device requires only two power supply
voltages, GVDD_x and PVDD_x.
GVDD_x is the gate drive supply for the device, which is
usually supplied from an external 12-V power supply.
GVDD_x is also connected to an internal LDR that
regulates the GVDD_x voltage down to the logic power
supply, 3.3 V, for the TAS5121 internal logic blocks. Each
GVDD_x pin is decoupled to system ground by a 1-µF
capacitor.
PVDD_x is the H-bridge power supply. Two power pins are
provided for each half-bridge due to the high current
density. It is important to follow the circuit and PCB layout
recommendations for the design of the PVDD_x
connection. For component suggestions, see the Typical
System Configuration section in this document. For layout
guidelines, see the reference design layout for the
TAS5121. Following these recommendations is important
because they influence key system parameters such as
EMI, idle current, and audio performance.
When GVDD_x is applied, while RESET is held low, the
error latches are cleared, SHUTDOWN is set high, and the
outputs are held in a high-impedance state. The bootstrap
capacitor is charged by the current path through the
internal bootstrap diode and external resistors placed on
the PCB from each OUT_x pin to ground. A subsequent
section describes the charging of the bootstrap capacitor.
Ideally, PVDD_x is applied after GVDD_x. When GVDD_x
and PVDD_x are applied, the TAS5121 is ready for
operation. PWM input signals can then be applied any time
during the power-on sequence, but they must be active
and stable before RESET is set high.
RESET
GVDD
PVDD_X
PWM_xP
The following table describes the input conditions and the
output states of the device:
INPUTS
OUTPUTS
RESET PWM PWM SHUT_AP _BP DOWN
OUT_
A
OUT_
B
Condition
Description
X
X
X
0
Hi-Z
Hi-Z
Shutdown
0
X
X
1
Hi-Z
Hi-Z
Reset
1
0
0
1
GND
GND
1
0
0
1
PVDD PVDD
1
0
1
1
GND
1
1
1
1
PVDD PVDD
PVDD
Normal
Normal
Reserved
After the previously mentioned conditions are met, the
device output begins. If PWM_AP is equal to a high and
PMW_BP is equal to a low, the high-side MOSFET in the
A half-bridge of the output H-bridge conducts while the
low-side MOSFET in the A half-bridge is not conducting.
Because the source of the high-side MOSFET is
referenced to the drain of the low-side MOSFET, a
bootstrapped gate drive is used to eliminate the need for
additional high-voltage power supplies. Under the above
condition, the opposite is true for the B half-bridge of the
output H-bridge. The low-side MOSFET in B half-bridge
conducts while the high-side MOSFET is not conducting;
therefore, the load connected between the OUT_A and
OUT_B pins has PVDD applied to it from the A side while
ground is applied from the B side for the period of time
PWM_AP is high and PWM_BP is low. Furthermore, when
the PWM signals change to the condition where PWM_AP
is low and PWM_BP is high, the opposite condition exists.
A constant high level is not permitted on the PWM inputs.
This condition causes the bootstrap capacitors to
discharge and can cause device damage.
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
A digitally controlled dead-time circuit controls the
transitions between the high-side and low-side MOSFETs
to ensure that both devices in each half-bridge are not
conducting simultaneously.
POWERING DOWN
For power down of the TAS5121, an opposite approach is
necessary. The RESET must be asserted LOW before the
valid PWM signal is removed.
PRECAUTION
The TAS5121 must always start up in the high-impedance
(Hi-Z) state. In this state, the bootstrap (BST) capacitor is
precharged by a resistor on each PWM output node to
ground. See the system configuration. This ensures that
the TAS5121 is ready for receiving PWM pulses, indicating
either HIGH- or LOW-side turnon after RESET is
de-asserted to the back end.
With the following pulldown resistor and BST capacitor
size, the BST charge time is:
C = 33 nF, R = 4.7 kΩ
R × C × 5 = 775.5 µs
After GVDD has been applied, it takes approximately 800
µs to fully charge the BST capacitor. During this time,
RESET must be kept low. After approximately 1 ms the
back end BST is charged and ready. RESET can now be
released if the PWM modulator is ready and is streaming
valid PWM signals to the device. Valid PWM signals are
switching PWM signals with a frequency between
350−400 kHz. A constant HIGH level on the PWM+ forces
the high-side MOSFET ON until it eventually runs out of
BST capacitor energy. Putting the device in this condition
should be avoided.
In practice this means that the DVDD-to-PWM processor
(front-end) should be stable and initialization should be
completed before RESET is de-asserted to the TAS5121.
CONTROL I/O
SD
RESET
DESCRIPTION
0
0
Reserved
0
1
Device in protection mode, i.e., UVP and/or OC
and/or OT error
1(2)
0
Device set high-impedance (Hi-Z), SD forced high
1
1
Normal operation
(2) SD is pulled high when RESET is asserted low independent of chip
state (i.e., protection mode). This is desirable to maintain
compatibility with some TI PWM front ends.
Overtemperature Warning Pin: OTW
The OTW pin gives a temperature warning signal when
temperature exceeds the set limit. The pin is of the
open-drain type with an internal pullup resistor to DVDD.
OTW
DESCRIPTION
0
Junction temperature higher than 115°C
1
Junction temperature lower than 115°C
Overall Reporting
The SD pin, together with the OTW pin, gives chip state
information as described in Table 1.
Table 1. Error Signal Decoding
OTW
SD
DESCRIPTION
0
0
Overtemperature error (OTE)
0
1
Overtemperature warning (OTW)
1
0
Overcurrent (OC) or undervoltage (UVP) error
1
1
Normal operation, no errors/warnings
Chip Protection
The TAS5121 protection function is generally
implemented in a closed loop control system with, for
example, a system controller. The TAS5121 contains three
individual systems protecting the device against fault
conditions. All of the error events result in the output stage
being set in a high-impedance state (Hi-Z) for maximum
protection of the device and connected equipment.
The device can be recovered by toggling RESET low and
then high, after all errors are cleared. It is recommended
that if the error persists, the device is held in reset until user
intervention clears the error.
Shutdown Pin: SD
Overcurrent (OC) Protection
The SD pin functions as an output pin and is intended for
protection-mode signaling to, for example, a controller or
other front-end device. The pin is open-drain with an
internal pullup resistor to DVDD.
The logic output is, as shown in the following table, a
combination of the device state and RESET input:
The device has individual current protection on both
high-side and low-side power stage FETs. The OC
protection works only with the demodulation filter present
at the output. See Filter Demodulation Design in the
Application Information section of the data sheet for design
constraints.
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SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
Overtemperature (OT) Protection
Timing and Function
The function of the autorecovery circuit is as follows:
A dual temperature protection system asserts a warning
signal when the device junction temperature exceeds
115°C and shuts down the device when the junction
temperature exceeds 150°C. The OT protection circuit is
shared by both half-bridges.
1. An error event occurs and sets the
protection latch (output stage goes Hi-Z).
2. The counter is started.
3. After n/2 cycles, the protection latch is
cleared but the output stage remains Hi-Z
(identical to pulling RESET low).
4. After n cycles, operation is resumed
(identical to pulling RESET high) (n = 512).
Undervoltage Protection (UVP)
Undervoltage lockout occurs when GVDD is insufficient
for proper device operation. The UV protection system
protects the device under fault power-up and power-down
situations by shutting the device down. The UV protection
circuits are shared by both half-bridges.
Reset Function
Error
Protection
Latch
Shutdown
SD
The reset has two functions:
Autorecovery
D
Reset is used for re-enabling operation after a
latched error event.
D
Reset is used for disabling output stage
switching, hard mute function. Use modulator
control for soft mute.
PWM
Counter
In protection modes where the reset input functions as the
means to re-enable operation after an error event, the error
latch is cleared on the falling edge of reset and normal
operation is resumed on the rising edge of RESET.
AR-RESET
Figure 9. Autorecovery Function
Latching Shutdown on All Errors (PMODE1)
In latching shutdown mode, all error situations result in a
power down (output stage Hi-Z). Re-enabling can be done
by toggling the RESET pin.
All Protection Systems Disabled (PMODE2)
PROTECTION MODE
In PMODE2, all protection systems are disabled. This
mode is purely intended for testing and characterization
purposes and thus not recommended for normal device
operation.
Autorecovery (AR) After Errors (PMODE0)
MODE Pins Selection
In autorecovery mode (PMODE0) the TAS5121 is
self-supported in handling of error situations. All protection
systems are active, setting the output stage in the
high-impedance state to protect the output stage and
connected equipment. However, after a short time the
device autorecovers, i.e., operation is automatically
resumed provided that the system is fully operational.
The autorecovery timing is set by counting PWM input
cycles, i.e., the timing is relative to the switching frequency.
The AR system is common to both half-bridges.
12
The protection mode is selected by connecting M1/M2 to
DREG or DGND according to Table 2.
Table 2. Protection Mode Selection
M1
M2
0
0
Autorecovery after errors (PMODE 0)
PROTECTION MODE
0
1
Latched shutdown on all errors
1
0
Reserved
1
1
Reserved
The output configuration mode is selected by connecting
the M3 pin to DREG or DGND according to Table 3.
www.ti.com
SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
Table 3. Output Mode Selection
M3
OUTPUT MODE
0
Bridge-tied load output stage (BTL)
1
Reserved
APPLICATION INFORMATION
In general, 10-µH inductors suffice for most applications.
The frequency response of the amplifier is slightly altered
by the change in output load resistance; however, unless
tight control of frequency response is necessary (better
than 0.5 dB), it is not necessary to deviate from 10 µH.
The graphs in Figure 11 display the inductance vs current
characteristics of two inductors that are suggested for use
with the TAS5121.
DEMODULATION FILTER DESIGN
INDUCTANCE
vs
CURRENT
The TAS5121 amplifier outputs are driven by high-current
DMOS transistors in an H-bridge configuration. These
transistors are either off or fully on.
11
The result is a square-wave output signal with a duty cycle
that is proportional to the amplitude of the audio signal. It
is recommended that a second-order LC filter be used to
recover the audio signal.
Output A
L
C1
R(Load)
C2
Output B
9
L − Inductance − µH
TAS5121
DBF1310A
10
DASL983XX−1023
8
7
6
5
L
4
0
5
10
15
I − Current − A
Figure 10. Demodulation Filter
The main purpose of the demodulation filter is to attenuate
the high-frequency components of the output signals that
are out of the audio band.
Design of the demodulation filter affects the audio
performance of the power amplifier significantly. As a
result, to ensure proper operation of the overcurrent (OC)
protection circuit and meet the device THD+N
specifications, the selection of the inductors used in the
output filter must be considered according to the following.
The rule is that the inductance should remain stable within
the range of peak current seen at maximum output power
and deliver approximately 5 µH of inductance at 15 A.
If this rule is observed, the TAS5121 should not have
distortion issues due to the output inductors. This prevents
device damage due to overcurrent conditions because of
inductor saturation in the output filter.
Another parameter to be considered is the idle current loss
in the inductor. This can be measured or specified as
inductor dissipation (D). The target specification for
dissipation is less than 0.05. If this specification is not met,
idle current increases.
Figure 11. Inductance Saturation
The selection of the capacitors that are placed from the
output of each inductor to ground is simple. To complete
the output filter, use a 1-µF capacitor with a voltage rating
at least twice the voltage applied to the output stage
(PVDD_x).
This capacitor should be a good quality polyester
dielectric.
THERMAL INFORMATION
The following is provided as an example.
The thermally enhanced package provided with the
TAS5121 are designed to be interfaced directly to
heatsinks using a thermal interface compound (for
example, Wakefield Engineering type 126 thermal
grease.) The heatsink then absorbs heat from the ICs and
transfers it to the ambient air. If the heatsink is carefully
designed, this process can reach equilibrium and heat can
be continually removed from the ICs without device
overtemperature shutdown. Because of the efficiency of
the TAS5121, heatsinks are smaller than those required
for linear amplifiers of equivalent performance.
13
www.ti.com
SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
RθJA is a system thermal resistance from junction to
ambient air. As such, it is a system parameter with roughly
the following components:
D
RθJC (the thermal resistance from junction to
case, or in this case the metal pad)
D
Heatsink compound thermal resistance
D
Heatsink thermal resistance
The thermal grease thermal resistance can be calculated
from the exposed pad area and the thermal grease
manufacturer’s area thermal resistance (expressed in
°C-in2/W). The area thermal resistance of the example
thermal grease with a 0.001-inch thick layer is about 0.054
°C-in2/W. The approximate exposed pad area is as
follows:
36-pin PSOP3
0.116 in2
Dividing the example thermal grease area resistance by
the area of the pad gives the actual resistance through the
thermal grease for the device:
36-pin PSOP3
The following table indicates modeled parameters for one
TAS5121 IC on a heatsink. The junction temperature is set
at 110°C while delivering 70 W RMS into 4-Ω loads with no
clipping. It is assumed that the thermal grease is about
0.001 inch thick (this is critical).
Table 4. Example of Thermal Simulation
36-Pin PSOP3
Ambient temperature
25°C
Power to load
70 W
Delta T inside package
5.5°C
Delta T through thermal grease
3.2°C
Required heatsink thermal resistance
11.0°C/W
Junction temperature
110°C
System RθJA
12.3°C/W
RθJA * power dissipation
RθJC
85°C
0.85°C/W
As an indication of the importance of keeping the thermal
grease layer thin, if the thermal grease layer increases to
0.002 inches thick, the required heatsink thermal
resistance increases to 5.2°C/W for the PSOP3 package.
0.47 °C/W
REFERENCES
The thermal resistance of thermally conductive pads is
generally higher than a thin thermal grease layer. Thermal
tape has an even higher thermal resistance and should not
be used with this package.
1.
Digital Audio Measurements application report—TI
(SLAA114)
2.
PowerPAD Thermally Enhanced
technical brief—TI (SLMA002)
Heatsink thermal resistance is generally predicted by the
heatsink vendor, modeled using a continuous flow
dynamics (CFD) model, or measured.
3.
System Design Considerations for True Digital
Audio Power Amplifiers application report—TI
(SLAA117)
Thus, for a single monaural IC, the system RθJA = RθJC +
thermal grease resistance + heatsink resistance.
4.
Voltage Spike Measurement Technique and
Specification application note—TI (SLEA025)
14
Package
www.ti.com
SLES086A − NOVEMBER 2003 − REVISED MARCH 2004
MECHANICAL DATA
15
PACKAGE OPTION ADDENDUM
www.ti.com
9-Mar-2007
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
TAS5121DKD
ACTIVE
SSOP
DKD
36
29
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-4-260C-72 HR
TAS5121DKDE4
ACTIVE
SSOP
DKD
36
29
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-4-260C-72 HR
TAS5121DKDR
ACTIVE
SSOP
DKD
36
500
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-4-260C-72 HR
TAS5121DKDRE4
ACTIVE
SSOP
DKD
36
500
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-4-260C-72 HR
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
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Addendum-Page 1
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