TI SN65LVDS93AZQLR

SN65LVDS93A
www.ti.com................................................................................................................................................................................................. SLLS992 – AUGUST 2009
FLATLINK™ TRANSMITTER
Check for Samples: SN65LVDS93A
FEATURES
1
•
•
2
•
•
•
•
•
Industrial Temperature Range –40°C to 85°C
LVDS Display Serdes Interfaces Directly to
LCD Display Panels with Integrated LVDS
Package Options: 4.5mm × 7mm BGA, and
8.1mm × 14mm TSSOP
1.8V up to 3.3V Tolerant Data Inputs to
Connect Directly to Low-Power, Low-Voltage
Application and Graphic Processors
Transfer Rate up to 135Mpps (Mega Pixel Per
Second); Pixel Clock Frequency Range 10MHz
to 135MHz
Suited for Display Resolutions Ranging From
HVGA up to HD With Low EMI
Operates From a Single 3.3V Supply and
170mW (typ.) at 75MHz
•
•
•
•
•
•
28 Data Channels Plus Clock In Low-Voltage
TTL to 4 Data Channels Plus Clock Out
Low-Voltage Differential
Consumes Less Than 1mW When Disabled
Selectable Rising or Falling Clock Edge
Triggered Inputs
ESD: 5kV HBM
Support Spread Spectrum Clocking (SSC)
Compatible with all OMAP ™ 2x, OMAP™3x,
and DaVinci ™ Application Processors
APPLICATIONS
•
•
•
LCD Display Panel Driver
UMPC and Netbook PC
Digital Picture Frame
DESCRIPTION
The SN65LVDS93A LVDS serdes (serializer/deserializer) transmitter contains four 7-bit parallel load serial-out
shift registers, a 7 × clock synthesizer, and five low-voltage differential signaling (LVDS) drivers in a single
integrated circuit. These functions allow 28 bits of single-ended LVTTL data to be synchronously transmitted over
five balanced-pair conductors for receipt by a compatible receiver, such as the SN65LVDS94.
When transmitting, data bits D0 through D27 are each loaded into registers upon the edge of the input clock
signal (CLKIN). The rising or falling edge of the clock can be selected via the clock select (CLKSEL) pin. The
frequency of CLKIN is multiplied seven times and then used to serially unload the data registers in 7-bit slices.
The four serial streams and a phase-locked clock (CLKOUT) are then output to LVDS output drivers. The
frequency of CLKOUT is the same as the input clock, CLKIN.
The SN65LVDS93A requires no external components and little or no control. The data bus appears the same at
the input to the transmitter and output of the receiver with the data transmission transparent to the user(s). The
only user intervention is selecting a clock rising edge by inputting a high level to CLKSEL or a falling edge with a
lowlevel input and the possible use of the shutdown/clear (SHTDN). SHTDN is an active-low input to inhibit the
clock and shut off the LVDS output drivers for lower power consumption. A low level on this signal clears all
internal registers at a low level.
The SN65LVDS93A is characterized for operation over ambient air temperatures of –40°C to 85°C.
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
OMAP, DaVinci are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009, Texas Instruments Incorporated
SN65LVDS93A
SLLS992 – AUGUST 2009................................................................................................................................................................................................. www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION (1)
(1)
PART NUMBER
PART MARKING
PACKAGE
SN65LVDS93AZQLR
LVDS93A in BGA package
56-pin ZQL LARGE T&R
SN65LVDS93ADGG
LVDS93A in TSSOP package
56-pin DGG TUBE
SN65LVDS93ADGGR
LVDS93A in TSSOP package
56-pin DGG LARGE T&R
For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or
refer to our web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS (1)
Supply voltage range, VCC, IOVCC, LVDSVCC, PLLVCC (2)
Voltage range at any output terminal
Voltage range at any input terminal
Continuous power dissipation
Charged Device Model (CDM)
(4)
all pins
Machine Model (MM) (5) all pins
(1)
(2)
(3)
(4)
(5)
2
UNIT
V
-0.5 to VCC + 0.5
V
-0.5 to IOVCC + 0.5
V
See the dissipation rating table
Human Body Model (HBM) (3) all pins
ESD rating
VALUE
-0.5 to 4
5
kV
500
V
150
V
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
All voltages are with respect to the GND terminals.
In accordance with JEDEC Standard 22, Test Method A114-A.
In accordance with JEDEC Standard 22, Test Method C101.
In accordance with JEDEC Standard 22, Test Method A115-A.
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RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
Supply voltage, VCC
PARAMETER
3
3.3
3.6
LVDS output Supply voltage, LVDSVCC
3
3.3
3.6
PLL analog supply voltage, PLLVCC
3
3.3
3.6
1.62
1.8 / 2.5 / 3.3
3.6
IO input reference Supply voltage, IOVCC
Power supply noise on any VCC terminal
UNIT
V
0.1
High-level input voltage, VIH
Low-level input voltage, VIL
IOVCC = 1.8V
IOVCC/2 + 0.3V
IOVCC = 2.5V
IOVCC/2 + 0.4V
IOVCC = 3.3V
IOVCC/2 + 0.5V
V
IOVCC = 1.8V
IOVCC/2 - 0.3V
IOVCC = 2.5V
IOVCC/2 - 0.4V
IOVCC = 3.3V
IOVCC/2 - 0.5V
Differential load impedance, ZL
Operating free-air temperature, TA
V
90
132
Ω
-45
85
C
DISSIPATION RATINGS
PACKAGE
CIRCUIT BOARD MODEL
DGG
ZQL
DGG
ZQL
(1)
(2)
Low-K
High-K
(1)
TJA ≤ 25°C
DERATING FACTOR (2)
ABOVE TJA = 25°C
TJA = 70°C
POWER RATING
1111mW
12.3mW/°C
555mW
1034mW
11.5mW/°C
517mW
1730mW
19mW/°C
865mW
2000mW
22mW/°C
1000mW
In accordance with the High-K and Low-K thermal metric definitions of EIA/JESD51-2.
This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.
TIMING REQUIREMENTS
PARAMETER
Input clock period, tc
MIN
MAX
UNIT
7.4
100
ns
Input clock modulation
w/ modulation frequency 30kHz
8%
w/ modulation frequency 50kHz
6%
High-level input clock pulse width duration, tw
0.4 tc
Input signal transition time, tt
Data set up time, D0 through D27 before CLKIN (See Figure 3)
Data hold time, D0 through D27 after CLKIN
0.6 tc
ns
3
ns
2
ns
0.8
ns
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DGG PACKAGE
(TOP VIEW)
IOVCC
1
56
D5
2
3
55
54
D7
GND
D8
4
53
5
52
GND
D1
6
51
D0
D9
D10
7
50
8
49
D27
GND
VCC
D11
9
10
48
47
D12
11
46
D13
12
45
Y1P
GND
D14
13
44
14
15
43
42
LVDSVCC
GND
Y2M
16
41
17
18
40
39
19
38
D19
GND
20
37
CLKOUTP
Y3M
Y3P
21
36
GND
D20
35
34
GND
D21
22
23
D22
24
33
D23
25
32
IOVCC
D24
D25
26
31
27
30
28
29
D6
D15
D16
CLKSEL
D17
D18
D4
D3
D2
Y0M
Y0P
Y1M
Y2P
CLKOUTM
PLLVCC
GND
SHTDN
CLKIN
D26
GND
DGG PIN LIST
4
Pin #
Signal
Pin #
Signal
Pin #
Signal
Pin #
1
IOVCC
15
D15
29
GND
43
GND
2
D5
16
D16
30
D26
44
LVDSVCC
3
D6
17
CLKSEL
31
CLKIN
45
Y1P
4
D7
18
D17
32
SHTDN
46
Y1M
5
GND
19
D18
33
GND
47
Y0P
6
D8
20
D19
34
PLLVCC
48
Y0M
7
D9
21
GND
35
GND
49
GND
8
D10
22
D20
36
GND
50
D27
9
VCC
23
D21
37
Y3P
51
D0
10
D11
24
D22
38
Y3M
52
D1
11
D12
25
D23
39
CLKOUTP
53
GND
12
D13
26
IOVCC
40
CLKOUTM
54
D2
13
GND
27
D24
41
Y2P
55
D3
14
D14
28
D25
42
Y2M
56
D4
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ZQL PACKAGE
(TOP VIEW)
6
5
4
3
2
1
D8
D7
D5
D4
D2
D1
D9
GND
D6
D3
D0
D27
D11
VCC
D10
GND
Y0P
Y0M
D13
D12
IOVCC
GND
Y1P
Y1M
D14
GND
GND
D16
D15
Y2P
Y2M
D17
D18
CLKSEL
GND
CLKP
CLKM
D19
GND
IOVCC
GND
Y3P
Y3M
D20
D21
D25
SHTDN
PLLVCC
GND
D22
D23
D24
D26
CLKIN
GND
K
J
H
G
F
LVDSVCC
E
D
C
B
A
ZQL PIN LIST
Ball #
Signal
Ball #
Signal
Ball #
Signal
A1
GND
A2
CLKIN
A3
D26
A4
D24
A5
D23
A6
D22
B1
GND
B2
PLLVCC
B3
SHTDN
B4
D25
B5
D21
B6
D20
C1
Y3M
C2
Y3P
C3
GND
C4
IOVCC
C5
GND
C6
D19
D1
CLKM
D2
CLKP
D3
GND
D4
CLKSEL
D5
D18
D6
D17
E1
Y2M
E2
Y2P
E3
ball not populated
E4
ball not populated
E5
D15
E6
D16
F1
LVDSVCC
F2
GND
F3
ball not populated
F4
ball not populated
F5
GND
F6
D14
G1
Y1M
G2
Y1P
G3
GND
G4
IOVCC
G5
D12
G6
D13
H1
Y0M
H2
Y0P
H3
GND
H4
D10
H5
VCC
H6
D11
J1
D27
J2
D0
J3
D3
J4
D6
J5
GND
J6
D9
K1
D1
K2
D2
K3
D4
K4
D5
K5
D7
K6
D8
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PIN FUNCTIONS
PIN
I/O
Y0P, Y0M, Y1P,
Y1M, Y2P, Y2M
Y3P, Y3M
DESCRIPTION
Differential LVDS data outputs.
Outputs are high-impedance when SHTDN is pulled low (de-asserted)
LVDS Out
Differential LVDS Data outputs.
Output is high-impedance when SHTDN is pulled low (de-asserted).
Note: if the application only requires 18-bit color, this output can be left open.
CLKP, CLKM
Differential LVDS pixel clock output.
Output is high-impedance when SHTDN is pulled low (de-asserted).
D0 – D27
Data inputs; supports 1.8V to 3.3V input voltage selectable by VDD supply. To connect a graphic source
successfully to a display, the bit assignment of D[27:0] is critical (and not necessarily intuitive).
Note: if application only requires 18-bit color, connect unused inputs D5, D10, D11, D16, D17, D23, and D27 to
GND.
CMOS IN with
pulldn
CLKIN
Input pixel clock; rising or falling clock polarity is selectable by Control input CLKSEL.
SHTDN
Device shut down; pull low (de-assert) to shut down the device (low power, resets all registers) and high (assert)
for normal operation.
CLKSEL
Selects between rising edge input clock trigger (CLKSEL = VIH and falling edge input clock trigger (CLKSEL =
VIL).
VCC
3.3V digital Supply Voltage
IOVCC
I/O supply reference voltage (1.8V up to 3.3V matching the GPU data output signal swing)
PLLVCC
Power Supply (1)
3.3V PLL analog supply
LVDSVCC
3.3V LVDS output analog supply
GND
Supply Ground for VCC, IOVCC, LVDSVCC, and PLLVCC.
(1)
6
For a multilayer pcb, it is recommended to keep one common GND layer underneath the device and connect all ground terminals
directly to this plane.
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FUNCTIONAL BLOCK DIAGRAM
Parallel-Load 7-bit
Shift Register
D0, D1, D2, D3,
D4, D6, D7
7
A,B,...G
SHIFT/LOAD
>CLK
Y0P
Y0M
Parallel-Load 7-bit
Shift Register
D8, D9, D12, D13,
D14, D15, D18
7
A,B,...G
SHIFT/LOAD
>CLK
Y1P
Y1M
Parallel-Load 7-bit
Shift Register
D19, D20, D21, D22,
D24, D25, D26
7
A,B,...G
SHIFT/LOAD
>CLK
Y2P
Y2M
Parallel-Load 7-bit
Shift Register
D27, D5, D10, D11,
D16, D17, D23
7
A,B,...G
SHIFT/LOAD
>CLK
Y3P
Y3M
Control Logic
SHTDN
7X Clock/PLL
7XCLK
CLKIN
>CLK
CLKINH
CLKSEL
CLKOUTP
CLKOUTM
RISING/FALLING EDGE
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Dn
CLKIN
or
CLKIN
CLKOUT
Previous cycle
Next
Current cycle
Y0
D0-1
D7
D6
D4
D3
D2
D1
D0
D7+1
Y1
D8-1
D18
D15
D14
D13
D12
D9
D8
D18+1
Y2
D19-1
D26
D25
D24
D22
D21
D20
D19
D26+1
Y3
D27-1
D23
D17
D16
D11
D10
D5
D27
D23+1
Figure 1. Typical SN65LVDS93A Load and Shift Sequences
LVDSVCC
IOVCC
5W
D or
SHTDN
50W
7V
YnP or
YnM
10kW
300kW
7V
Figure 2. Equivalent Input and Output Schematic Diagrams
8
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ELECTRICAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
PARAMETER
VT
Input voltage threshold
|VOD|
Differential steady-state output voltage
magnitude
TEST CONDITIONS
MIN
TYP
(1)
MAX
IOVCC/2
250
UNIT
V
450
mV
RL = 100Ω, See Figure 4
Δ|VOD|
Change in the steady-state differential
output voltage magnitude between
opposite binary states
VOC(SS)
Steady-state common-mode output
voltage
VOC(PP)
Peak-to-peak common-mode output
voltage
See Figure 4
tR/F (Dx, CLKin) = 1ns
IIH
High-level input current
VIH = IOVCC
IIL
Low-level input current
VIL = 0 V
±10
μA
VOY = 0 V
±24
mA
1
1.125
35
1.375
mV
V
35
mV
25
μA
IOS
Short-circuit output current
VOD = 0 V
±12
mA
IOZ
High-impedance state output current
VO = 0 V to VCC
±20
μA
Rpdn
Input pull-down integrated resistor on all
inputs (Dx, CLKSEL, SHTDN, CLKIN)
IOVCC = 1.8V
200
IOVCC = 3.3V
100
IQ
Quiescent current
disabled, all inputs at GND;
SHTDN = VIL
2
kΩ
100
μA
SHTDN = VIH, RL = 100Ω (5 places),
grayscale pattern (Figure 5)
VCC = 3.3V, fCLK = 75MHz
I(VCC) + I(PLLVCC) + I(LVDSVCC)
51.9
62
I(IOVCC) with IOVCC = 3.3V
0.4
1.2
I(IOVCC) with IOVCC = 1.8V
0.1
mA
SHTDN = VIH, RL = 100Ω (5 places), 50%
transition density pattern (Figure 5),
VCC = 3.3V, fCLK = 75MHz
I(VCC) + I(PLLVCC) + I(LVDSVCC)
53.3
65
I(IOVCC) with IOVCC = 3.3V
0.6
2.5
I(IOVCC) with IOVCC = 1.8V
0.2
mA
SHTDN = VIH, RL = 100Ω (5 places),
worst-case pattern (Figure 6),
VCC = 3.6V, fCLK = 75MHz
ICC
Supply current (average)
I(VCC) + I(PLLVCC) + I(LVDSVCC)
63.7
77
I(IOVCC) with IOVCC = 3.3V
1.3
3.3
I(IOVCC) with IOVCC = 1.8V
0.5
mA
SHTDN = VIH, RL = 100Ω (5 places),
worst-case pattern (Figure 6),
fCLK = 100MHz
I(VCC) + I(PLLVCC) + I(LVDSVCC)
81.6
94
I(IOVCC) with IOVCC = 3.6V
1.6
3.8
I(IOVCC) with IOVCC = 1.8V
0.6
mA
SHTDN = VIH, RL = 100Ω (5 places),
worst-case pattern (Figure 6),
fCLK = 135MHz
CI
(1)
I(VCC) + I(PLLVCC) + I(LVDSVCC)
102.2
116
I(IOVCC) with IOVCC = 3.6V
2.1
4.5
I(IOVCC) with IOVCC = 1.8V
0.8
Input capacitance
2
mA
pF
All typical values are at VCC = 3.3 V, TA = 25°C.
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SWITCHING CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
(1)
MAX
0
0.1
ns
UNIT
t0
Delay time, CLKOUT↑ after Yn valid
(serial bit position 0, equal D1, D9,
D20, D5)
t1
Delay time, CLKOUT↑ after Yn valid
(serial bit position 1, equal D0, D8,
D19, D27)
1
/7 tc - 0.1
1
/7 tc + 0.1
ns
t2
Delay time, CLKOUT↑ after Yn valid
(serial bit position 2, equal D7, D18,
D26. D23)
2
/7 tc - 0.1
2
/7 tc + 0.1
ns
t3
Delay time, CLKOUT↑ after Yn valid
(serial bit position 3; equal D6, D15,
D25, D17)
3
/7 tc - 0.1
3
/7 tc + 0.1
ns
t4
Delay time, CLKOUT↑ after Yn valid
(serial bit position 4, equal D4, D14,
D24, D16)
4
/7 tc - 0.1
4
/7 tc + 0.1
ns
t5
Delay time, CLKOUT↑ after Yn valid
(serial bit position 5, equal D3, D13,
D22, D11)
5
/7 tc - 0.1
5
/7 tc + 0.1
ns
t6
Delay time, CLKOUT↑ after Yn valid
(serial bit position 6, equal D2, D12,
D21, D10)
6
/7 tc - 0.1
6
/7 tc + 0.1
ns
tc(o)
Output clock period
Δtc(o)
-0.1
See Figure 7, tC = 10ns,
|Input clock jitter| < 25ps
(2)
tc
Output clock cycle-to-cycle jitter
(3)
tC = 10ns; clean reference clock, see
Figure 8
±26
tC = 10ns with 0.05UI added noise
modulated at 3MHz, see Figure 8
±44
tC = 7.4ns; clean reference clock,
see Figure 8
±35
tC = 7.4ns with 0.05UI added noise
modulated at 3MHz, see Figure 8
±42
ns
ps
tw
High-level output clock pulse
duration
tr/f
Differential output voltage transition
time (tr or tf)
See Figure 4
ten
Enable time, SHTDN↑ to phase lock
(Yn valid)
f(clk) = 135MHz, See Figure 9
6
ns
tdis
Disable time, SHTDN↓ to off-state
(CLKOUT high-impedance)
f(clk) = 135MHz, See Figure 10
7
ns
(1)
(2)
(3)
4
/7 tc
225
ns
500
ps
All typical values are at VCC = 3.3 V, TA = 25°C.
|Input clock jitter| is the magnitude of the change in the input clock period.
The output clock cycle-to-cycle jitter is the largest recorded change in the output clock period from one cycle to the next cycle observed
over 15,000 cycles.Tektronix TDSJIT3 Jitter Analysis software was used to derive the maximum and minimum jitter value.
PARAMETER MEASUREMENT INFORMATION
tsu
thold
Dn
CLKIN
All input timing is defined at IOVDD / 2 on an input signal with a 10% to 90% rise or fall time of less than 3 ns.
CLKSEL = 0V.
Figure 3. Set Up and Hold Time Definition
10
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PARAMETER MEASUREMENT INFORMATION (continued)
49.9W ± 1% (2 PLCS)
YP
VOD
VOC
YM
100%
80%
VOD(H)
0V
VOD(L)
20%
0%
tf
tr
VOC(PP)
VOC(SS)
VOC(SS)
0V
Figure 4. Test Load and Voltage Definitions for LVDS Outputs.
CLKIN
D0,8,16
D1,9,17
D2,10,18
D3,11,19
D4-7,12-15,20-23
D24-27
The 16 grayscale test pattern test device power consumption for a typical display pattern.
Figure 5. 16 Grayscale Test Pattern
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PARAMETER MEASUREMENT INFORMATION (continued)
T
CLKIN
EVEN Dn
ODD Dn
The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs.
Figure 6. Worst-Case Power Test Pattern
t7
CLKIN
CLKOUT
t6
t5
t4
t3
t2
t0
Yn
t1
VOD(H)
~2.5V
CLKOUT
or Yn
1.40V
CLKIN
0.00V
~0.5V
VOD(L)
t7
t0-6
CLKOUT is shown with CLKSEL at high-level.
CLKIN polarity depends on CLKSEL input level.
Figure 7. SN65LVDS93A Timing Definitions
12
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PARAMETER MEASUREMENT INFORMATION (continued)
Reference
+
Device
Under
Test
VCO
+
Modulation
v(t) = A sin(2 pfmodt)
HP8656B Signal
Generator,
0.1 MHz-990 MHz
HP8665A Synthesized
Signal Generator,
0.1 MHz-4200 MHz
Device Under
Test
RF Output
Modulation Input
RF Output
CLKIN
DTS2070C
Digital
TimeScope
CLKOUT
Input
Figure 8. Output Clock Jitter Test Set Up
CLKIN
Dn
ten
SHTDN
Invalid
Yn
Valid
Figure 9. Enable Time Waveforms
CLKIN
tdis
SHTDN
CLKOUT
Figure 10. Disable Time Waveforms
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TYPICAL CHARACTERISTICS
AVERAGE GRAYSCALE ICC
vs
CLOCK FREQUENCY
800
Total Device Current (Using Grayscale
pattern) Over Pixel Clock Frequency
Output Jitter
90
700
80
600
Period Clock Jitter - ps-pp
ICC - Average Supply Current - mA
100
OUTPUT CLOCK JITTER
vs
INPUT CLOCK JITTER
VCC = 3.6V
70
60
50
VCC = 3.3V
40
Input Jitter
500
400
300
200
VCC = 3V
CLK Frequency During Test = 100MHz
30
100
20
10
30
50
70
90
110
130
0
0.01
fclk - Clock Frequency - MHz
0.10
1
10
f(mod) - Input Modular Frequency - MHz
Figure 11.
Figure 12.
TYPICAL PRBS OUTPUT SIGNAL
OVER ONE CLOCK PERIOD
PRBS Data Signal
V - Voltage - 80mV/div
CLKL Signal
Clock Signal: 135MHz
tk - Time - 1ns/div
Figure 13.
14
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APPLICATION INFORMATION
Power Up Sequence
The SN65LVDS93A does not require a specific power up sequence.
It is permitted to power up IOVCC while VCC, VCCPLL, and VCCLVDS remain powered down and connected to
GND. The input level of the SHTDN during this time does not matter as only the input stage is powered up while
all other device blocks are still powered down.
It is also permitted to power up all 3.3V power domains while IOVCC is still powered down to GND. The device
will not suffer damage. However, in this case, all the I/Os are detected as logic HIGH, regardless of their true
input voltage level. Hence, connecting SHTDN to GND will still be interpreted as a logic HIGH; the LVDS output
stage will turn on. The power consumption in this condition is significantly higher than standby mode, but still
lower than normal mode.
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Typical Application Schematic
Figure 14 represents the schematic drawing of the SN65LVDS93A evaluation module.
J1
U1H
GND1
GND2
GND3
GND4
GND5
GND6
GND7
PLLGND
LVDSGND1
LVDSGND2
J3
CLKM
CLKP
Y0P
Y0M
Y1P
Y1M
Y2P
Y2M
IOVCC
R4
4.7k
R5
4.7k
R6
4.7k
R7
4.7k
R8
4.7k
R9
4.7k
Y3P
Y3M
R10
4.7k
JMP1
U1B
J2
K1
K2
J3
K3
J4
K5
D0
D1
D2
D3
D4
D6
D7
D1
D2
G2
G1
J5
E1
E2
sma_surface
J6
sma_surface
C2
C1
J7
sma_surface
SN65LVDS93AZQL
J8
sma_surface
J9
sma_surface
14
Header 7x2
J10
sma_surface
IOVCC
R11
4.7k
R12
4.7k
R13
4.7k
R14
4.7k
R15
4.7k
R16
4.7k
R17
4.7k
sma_surface
JMP2
U1C
D8
D9
D12
D13
D14
D15
D18
J4
sma_surface
H2
H1
1 2
SN65LVDS93AZQL
K6
J6
G5
G6
F6
E5
D5
sma_surface
U1A
SN65LVDS93AZQL
D0
D1
D2
D3
D4
D6
D7
J2
sma_surface
C3
C5
D3
F5
G3
H3
J5
A1
B1
F2
D8
D9
D12
D13
D14
D15
D18
1 2
IOVCC
IOVCC
14
R1
4.7k
Header 7x2
SN65LVDS93AZQL
R2
IOVCC
R18
4.7k
R19
4.7k
R20
4.7k
R21
4.7k
R22
4.7k
R23
4.7k
R24
4.7k
JMP6
U1G
JMP3
U1D
D19
D20
D21
D22
D24
D25
D 26
C6
B6
B5
A6
A4
B4
A3
D19
D20
D21
D22
D24
D25
D26
SHTDN
CLKSEL
1 2
B3
D4
SHTDN
CLKSEL
1 2
3 4
Header 2x2
SN65LVDS93AZQL
14
U1J
NC1
NC2
NC3
NC4
Header 7x2
SN65LVDS93AZQL
IOVCC
R25
4.7k
R26
4.7k
R27
4.7k
R28
4.7k
R29
4.7k
R30
4.7k
E3
E4
F3
F4
SN65LVDS93AZQL
R31
4.7k
JMP4
U1E
D5
D10
D11
D16
D17
D23
D27
D5
D10
D11
D16
D17
D23
D27
K4
H4
H6
E6
D6
A5
J1
VCC
1 2
IOVCC
U1I
VCC
PLLVCC
LVDSVCC
14
IOVCC1
IOVCC2
Header 7x2
SN65LVDS93AZQL
G4
B2
F1
H5
C4
SN65LVDS93AZQL
VCC
VCC
C31
1uF
C32
0.1uF
C33
0.01uF
VCC
C34
1uF
C35
0.1uF
C36
0.01uF
IOVCC
C40
1uF
C41
0.1uF
C42
0.01uF
C37
1uF
C38
0.1uF
C39
0.01uF
PLACE UNDER LVDS93A
(bottom pcb side)
Figure 14. Schematic Example (SN65LVDS93A Evaluation Board)
16
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PCB Routing
Figure 15 shows a possible breakout of the data input and output signals from the BGA package.
R1
R2
R3
R4
R5
R6
R7
R8
G0
G1
D8
D7
D5
D4
D2
D1
D9
GND
D6
D3
D0
D27
D11
VCC
D10
GND
Y0P
Y0M
D13
D12
IOVCC
GND
Y1P
Y1M
D14
GND
GND
GND
D16
D15
GND
D17
D18
CLKSEL
D19
GND
IOVCC
D20
D21
D25
D22
D23
D24
G2
G3
G4
G5
G6
G7
B0
B1
LVDS GND LVDS VCC
Y2P
Y2M
GND
CLKP
CLKM
GND
Y3P
Y3M
B2
B3
B4
B5
B6
SHTDN PLLVCC LVDS GND
+PLL GND
D26
CLKIN
PLL GND
B7
HS
VS
EN
CLK
Figure 15. PCB Routing Example
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16-BIT BUS EXTENSION
In a 16-bit bus application (Figure 16), TTL data and clock coming from bus transceivers that interface the
backplane bus arrive at the Tx parallel inputs of the LVDS serdes transmitter. The clock associated with the bus
is also connected to the device. The on-chip PLL synchronizes this clock with the parallel data at the input. The
data is then multiplexed into three different line drivers which perform the TTL to LVDS conversion. The clock is
also converted to LVDS and presented to a separate driver. This synchronized LVDS data and clock at the
receiver, which recovers the LVDS data and clock, performs a conversion back to TTL. Data is then
demultiplexed into a parallel format. An on-chip PLL synchronizes the received clock with the parallel data, and
then all are presented to the parallel output port of the receiver.
16-Bit
BTL Bus
Interface
SN74FB2032
SN74FB2032
CLK
TTL
Interface
LVDS
Interface
0 To 10 Meters
(Media Dependent)
SN65LVDS94
SN65LVDS93A
TTL
Interface
D0–D7 8
8
D8–D15 8
8 D8–D15
XMIT Clock
D0–D7
RCV Clock
Backplane
Bus
16-Bit
BTL Bus
Interface
SN74FB2032
SN74FB2032
CLK
Backplane
Bus
Figure 16. 16-Bit Bus Extension
16-BIT BUS EXTENSION WITH PARITY
In the previous application we did not have a checking bit that would provide assurance that the data crosses the
link. If we add a parity bit to the previous example, we would have a diagram similar to the one in Figure 17. The
device following the SN74FB2032 is a low-cost parity generator. Each transmit-side transceiver/parity generator
takes the LVTTL data from the corresponding transceiver, performs a parity calculation over the byte, and then
passes the bits with its calculated parity value on the parallel input of the LVDS serdes transmitter. Again, the
on-chip PLL synchronizes this transmit clock with the eighteen parallel bits (16 data + 2 parity) at the input. The
synchronized LVDS data/parity and clock arrive at the receiver.
The receiver performs the conversion from LVDS to LVTTL and the transceiver/parity generator performs the
parity calculations. These devices compare their corresponding input bytes with the value received on the parity
bit. The transceiver/parity generator will assert its parity error output if a mismatch is detected.
18
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16-Bit
BTL Bus
Interface
TTL
Interface
LVDS
Interface
0 To 10 Meters
(Media Dependent)
TTL
Interface
W/Parity
SN65LVDS93A
SN74FB2032
9 Bit Latchable
Transceiver/ With
Parity Generator
8
Parity
Parity
8
D8–D15
SN74FB2032
9 Bit Latchable
Transceiver/ With
Parity Generator
TTL
Interface
16-Bit
BTL Bus
Interface
SN65LVDS94
8
D0–D7
TTL
Interface
W/Parity
9 Bit Latchable
Transceiver/ With
Parity Generator
8
Parity
Parity
D0–D7
SN74FB2032
D8–D15
9 Bit Latchable
Transceiver/ With
Parity Generator
SN74FB2032
Parity
Error
CLK
XMIT Clock
RCV Clock
CLK
Backplane
Bus
Backplane
Bus
Figure 17. 16-Bit Bus Extension With Parity
LOW COST VIRTUAL BACKPLANE TRANSCEIVER
Figure 18 represents LVDS serdes in an application as a virtual backplane transceiver (VBT). The concept of a
VBT can be achieved by implementing individual LVDS serdes chipsets in both directions of subsystem
serialized links.
Depending on the application, the designer will face varying choices when implementing a VBT. In addition to the
devices shown in Figure 18, functions such as parity and delay lines for control signals could be included. Using
additional circuitry, half-duplex or full-duplex operation can be achieved by configuring the clock and control lines
properly.
The designer may choose to implement an independent clock oscillator at each end of the link and then use a
PLL to synchronize LVDS serdes's parallel I/O to the backplane bus. Resynchronizing FIFOs may also be
required.
Figure 18. Virtual Backplane Transceiver
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PACKAGE OPTION ADDENDUM
www.ti.com
4-Sep-2009
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
SN65LVDS93ADGG
ACTIVE
TSSOP
DGG
56
SN65LVDS93ADGGR
ACTIVE
TSSOP
DGG
SN65LVDS93AZQLR
ACTIVE
BGA MI
CROSTA
R JUNI
OR
ZQL
35
Lead/Ball Finish
MSL Peak Temp (3)
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
56
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
56
1000 Green (RoHS &
no Sb/Br)
SNAGCU
Level-2-260C-1 YEAR
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
3-Sep-2009
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
SN65LVDS93ADGGR
Package Package Pins
Type Drawing
TSSOP
DGG
56
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
2000
330.0
24.4
Pack Materials-Page 1
8.6
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
15.6
1.8
12.0
24.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
3-Sep-2009
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
SN65LVDS93ADGGR
TSSOP
DGG
56
2000
346.0
346.0
41.0
Pack Materials-Page 2
MECHANICAL DATA
MTSS003D – JANUARY 1995 – REVISED JANUARY 1998
DGG (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
48 PINS SHOWN
0,27
0,17
0,50
48
0,08 M
25
6,20
6,00
8,30
7,90
0,15 NOM
Gage Plane
1
0,25
24
0°– 8°
A
0,75
0,50
Seating Plane
0,15
0,05
1,20 MAX
PINS **
0,10
48
56
64
A MAX
12,60
14,10
17,10
A MIN
12,40
13,90
16,90
DIM
4040078 / F 12/97
NOTES: A.
B.
C.
D.
All linear dimensions are in millimeters.
This drawing is subject to change without notice.
Body dimensions do not include mold protrusion not to exceed 0,15.
Falls within JEDEC MO-153
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
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