CSD16325Q5 www.ti.com ........................................................................................................................................... SLPS218A – AUGUST 2009 – REVISED SEPTEMBER 2009 N-Channel NexFET™ Power MOSFETs Check for Samples: CSD16325Q5 FEATURES 1 • • • • • • • • 2 Table 1. PRODUCT SUMMARY Optimized for 5V Gate Drive Ultralow Qg and Qgd Low Thermal Resistance Avalanche Rated Pb Free Terminal Plating RoHS Compliant Halogen Free SON 5-mm × 6-mm Plastic Package VDS Drain to Source Voltage 25 V Qg Gate Charge Total (4.5V) 18 nC Qgd Gate Charge Gate to Drain RDS(on) Drain to Source On Resistance VGS(th) Threshold Voltage • nC 2.1 mΩ VGS = 4.5V 1.7 mΩ VGS = 8V 1.5 mΩ 1.1 V ORDERING INFORMATION APPLICATIONS • 3.5 VGS = 3V Point-of-Load Synchronous Buck in Networking, Telecom and Computing Systems Optimized for Synchronous FET Applications Device Package Media CSD16325Q5 SON 5-mm × 6-mm Plastic Package 13-Inch Reel Qty Ship 2500 Tape and Reel ABSOLUTE MAXIMUM RATINGS DESCRIPTION TA = 25°C unless otherwise stated The NexFET™ power MOSFET has been designed to minimize losses in power conversion applications and optimized for 5V gate drive applications. VALUE UNIT VDS Drain to Source Voltage 25 V VGS Gate to Source Voltage +10 / –8 V Continuous Drain Current, TC = 25°C 100 A Continuous Drain Current (1) 33 A IDM Pulsed Drain Current, TA = 25°C (2) 210 A PD Power Dissipation (1) 3.1 W TJ, TSTG Operating Junction and Storage Temperature Range –55 to 150 °C EAS Avalanche Energy, single pulse ID = 100A, L = 0.1mH, RG = 25Ω 500 mJ ID Top View S 8 1 S 7 2 S 3 G 4 D D 6 D 5 D D (1) (2) P0094-01 RθJA = 38°C/W on 1-inch2 (6.45-cm2), 2-oz. (0.071-mm thick) Cu pad on a 0.06-inch (1.52-mm) thick FR4 PCB. Pulse duration ≤300μs, duty cycle ≤2% RDS(on) vs VGS GATE CHARGE 10 ID = 30A TC = 125°C 3 2 1 ID = 30A VDS = 12.5V 9 4 VG − Gate Voltage − V RDS(on) − On-State Resistance − mW 5 8 7 6 5 4 3 2 TC = 25°C 1 0 0 0 1 2 3 4 5 6 7 8 VGS − Gate to Source Voltage − V 9 10 G006 0 5 10 15 20 25 Qg − Gate Charge − nC 30 35 40 G003 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. NexFET is a trademark of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2009, Texas Instruments Incorporated CSD16325Q5 SLPS218A – AUGUST 2009 – REVISED SEPTEMBER 2009 ........................................................................................................................................... www.ti.com ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Static Characteristics BVDSS Drain to Source Voltage VGS = 0V, ID = 250μA IDSS Drain to Source Leakage Current VGS = 0V, VDS = 20V IGSS Gate to Source Leakage Current VDS = 0V, VGS = +10/–8V VGS(th) Gate to Source Threshold Voltage VDS = VGS, ID = 250μA RDS(on) Drain to Source On Resistance gfs Transconductance 25 V 1 μA 100 nA 1.1 1.4 V VGS = 3.0V, ID = 30A 2.1 2.7 mΩ VGS = 4.5V, ID = 30A 1.7 2.2 mΩ VGS = 8.0V, ID = 30A 1.5 2 mΩ VDS = 15V, ID = 30A 159 0.9 S Dynamic Characteristics CISS Input Capacitance COSS Output Capacitance CRSS Reverse Transfer Capacitance 120 150 Rg Series Gate Resistance 1.6 3.2 Ω Qg Gate Charge Total (4.5V) 18 25 nC Qgd Gate Charge – Gate to Drain Qgs Gate Charge – Gate to Source Qg(th) Gate Charge at Vth QOSS Output Charge td(on) Turn On Delay Time tr Rise Time td(off) Turn Off Delay Time tf Fall Time VGS = 0V, VDS = 12.5V, f = 1MHz VDS = 12.5V, IDS = 30A VDS = 13V, VGS = 0V VDS = 12.5V, VGS = 4.5V, IDS = 30A RG =2Ω 3070 4000 pF 2190 2850 pF pF 3.5 nC 6.6 nC 3.3 nC 43 nC 10.5 ns 16 ns 32 ns 12 ns Diode Characteristics VSD Diode Forward Voltage IDS = 30A, VGS = 0V 0.8 1 V Qrr Reverse Recovery Charge VDD = 10V, IF = 30A, di/dt = 300A/μs 63 nC trr Reverse Recovery Time VDD = 10V, IF = 30A, di/dt = 300A/μs 47 ns THERMAL CHARACTERISTICS (TA = 25°C unless otherwise stated) PARAMETER RθJC Thermal Resistance Junction to Case (1) RθJA Thermal Resistance Junction to Ambient (1) (1) (2) 2 MIN (2) 2 TYP MAX UNIT 1 °C/W 50 °C/W 2 RθJC is determined with the device mounted on a 1-inch (6.45-cm ), 2-oz. (0.071-mm thick) Cu pad on a 1.5-inch × 1.5-inch (3.81-cm × 3.81-cm), 0.06-inch (1.52-mm) thick FR4 PCB. RθJC is specified by design, whereas RθJA is determined by the user’s board design. Device mounted on FR4 material with 1-inch2 (6.45-cm2), 2-oz. (0.071-mm thick) Cu. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): CSD16325Q5 CSD16325Q5 www.ti.com ........................................................................................................................................... SLPS218A – AUGUST 2009 – REVISED SEPTEMBER 2009 GATE GATE Source N-Chan 5x6 QFN TTA MIN Rev3 N-Chan 5x6 QFN TTA MAX Rev3 Max RθJA = 48°C/W when mounted on 1 inch2 (6.45 cm2) of 2-oz. (0.071-mm thick) Cu. Source Max RθJA = 113°C/W when mounted on minimum pad area of 2-oz. (0.071-mm thick) Cu. DRAIN DRAIN M0137-02 M0137-01 Text and Text and Text and Text and br Added for Spacing br br br Added Added Added for for for Spacing Spacing Spacing TYPICAL MOSFET CHARACTERISTICS (TA = 25°C unless otherwise stated) ZqJA – NormalizedThermal Impedance 10 1 0.5 0.3 0.1 0.01 0.1 0.05 Duty Cycle = t1/t2 0.02 0.01 P t1 t2 0.001 0.0001 0.001 Single Pulse RqJA = 101°C/W (min Cu) TJ = P x ZqJA x RqJA 0.01 0.1 1 10 100 1k tp – Pulse Duration–s G012 Figure 1. Transient Thermal Impedance Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): CSD16325Q5 3 CSD16325Q5 SLPS218A – AUGUST 2009 – REVISED SEPTEMBER 2009 ........................................................................................................................................... www.ti.com TYPICAL MOSFET CHARACTERISTICS (continued) (TA = 25°C unless otherwise stated) TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 100 100 90 VGS = 8V 80 VGS = 4.5V 70 60 ID − Drain Current − A ID − Drain Current − A 90 VGS = 3V 50 VGS = 2V VGS = 2.5V 40 30 60 50 30 20 10 1.0 1.5 TC = -55°C 0 1.00 2.0 VDS − Drain to Source Voltage − V TC = 25°C 40 10 0.5 TC = 125°C 70 20 0 0.0 VDS = 5V 80 1.25 TEXT ADDED FOR SPACING 2.25 2.50 G002 TEXT ADDED FOR SPACING 8 ID = 30A VDS = 12.5V 9 C − Capacitance − nF 8 f = 1MHz VGS = 0V 7 7 6 5 4 3 2 6 COSS = CDS + CGD 5 0 CISS = CGD + CGS 4 3 2 CRSS = CGD 1 1 0 0 5 10 15 20 25 30 35 Qg − Gate Charge − nC 40 0 5 10 15 20 25 VDS − Drain to Source Voltage − V G003 Figure 4. Gate Charge G004 Figure 5. Capacitance TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 5 RDS(on) − On-State Resistance − mW 1.6 VGS(th) − Threshold Voltage − V 2.00 Figure 3. Transfer Characteristics 10 ID = 250mA 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 −75 ID = 30A 4 TC = 125°C 3 2 1 TC = 25°C 0 −25 25 75 125 TC − Case Temperature − °C 175 0 1 2 3 4 5 6 7 8 VGS − Gate to Source Voltage − V G005 Figure 6. Threshold Voltage vs. Temperature 4 1.75 VGS − Gate to Source Voltage − V G001 Figure 2. Saturation Characteristics VG − Gate Voltage − V 1.50 9 10 G006 Figure 7. On-State Resistance vs. Gate to Source Voltage Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): CSD16325Q5 CSD16325Q5 www.ti.com ........................................................................................................................................... SLPS218A – AUGUST 2009 – REVISED SEPTEMBER 2009 TYPICAL MOSFET CHARACTERISTICS (continued) (TA = 25°C unless otherwise stated) TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 100 ID = 30A VGS = 4.5V 1.4 ISD − Source to Drain Current − A Normalized On-State Resistance 1.6 1.2 1.0 0.8 0.6 0.4 0.2 0.0 −75 10 1 TC = 125°C 0.1 TC = 25°C 0.01 0.001 0.0001 −25 25 75 125 175 TC − Case Temperature − °C 0.0 0.2 0.6 0.8 VSD − Source to Drain Voltage − V G007 Figure 8. Normalized On-State Resistance vs. Temperature 1.0 G008 Figure 9. Typical Diode Forward Voltage TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 1k I(AV) − Peak Avalanche Current − A 1k ID − Drain Current − A 0.4 100 1ms 10 10ms 100ms 1 Area Limited by RDS(on) 1s 0.1 0.01 0.01 Single Pulse RqJA = 101°C/W (min Cu) 0.1 DC 1 10 10 TC = 125°C 1 0.01 100 VDS − Drain To Source Voltage − V TC = 25°C 100 0.1 1 10 t(AV) − Time in Avalanche − ms G009 Figure 10. Maximum Safe Operating Area 100 G010 Figure 11. Single Pulse Unclamped Inductive Switching TEXT ADDED FOR SPACING 120 ID − Drain Current − A 100 80 60 40 20 0 −50 −25 0 25 50 75 100 125 150 175 TC − Case Temperature − °C G011 Figure 12. Maximum Drain Current vs. Temperature Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): CSD16325Q5 5 CSD16325Q5 SLPS218A – AUGUST 2009 – REVISED SEPTEMBER 2009 ........................................................................................................................................... www.ti.com MECHANICAL DATA Q5 Package Dimensions K L L c1 E1 E2 b D2 4 4 5 5 e 3 6 3 6 E D1 7 7 2 2 8 8 1 1 q Top View Bottom View Side View c E1 A q Front View M0140-01 DIM MILLIMETERS MAX MIN MAX A 0.950 1.050 0.037 0.039 b 0.360 0.460 0.014 0.018 c 0.150 0.250 0.006 0.010 c1 0.150 0.250 0.006 0.010 D1 4.900 5.100 0.193 0.201 D2 4.320 4.520 0.170 0.178 E 4.900 5.100 0.193 0.201 E1 5.900 6.100 0.232 0.240 E2 3.920 4.12 0.154 e 6 INCHES MIN 1.27 TYP L 0.510 θ 0.00 0.162 0.050 0.710 Submit Documentation Feedback 0.020 0.028 Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): CSD16325Q5 CSD16325Q5 www.ti.com ........................................................................................................................................... SLPS218A – AUGUST 2009 – REVISED SEPTEMBER 2009 MILLIMETERS INCHES Recommended PCB Pattern DIM MIN MAX MIN MAX F1 F1 6.205 6.305 0.244 0.248 F2 4.46 4.56 0.176 0.18 F3 4.46 4.56 0.176 0.18 F4 0.65 0.7 0.026 0.028 F5 0.62 0.67 0.024 0.026 F6 0.63 0.68 0.025 0.027 F7 0.7 0.8 0.028 0.031 F8 0.65 0.7 0.026 0.028 F9 0.62 0.67 0.024 0.026 F7 F3 8 1 F2 F11 F5 F9 5 4 F6 F10 4.9 5 0.193 0.197 F11 4.46 4.56 0.176 0.18 F8 F4 F10 M0139-01 For recommended circuit layout for PCB designs, see application note SLPA005 – Reducing Ringing Through PCB Layout Techniques. K0 4.00 ±0.10 (See Note 1) 0.30 ±0.05 2.00 ±0.05 +0.10 –0.00 12.00 ±0.30 Ø 1.50 1.75 ±0.10 Q5 Tape and Reel Information 5.50 ±0.05 B0 R 0.30 MAX A0 8.00 ±0.10 Ø 1.50 MIN A0 = 6.50 ±0.10 B0 = 5.30 ±0.10 K0 = 1.40 ±0.10 R 0.30 TYP M0138-01 Notes: 1. 10-sprocket hole-pitch cumulative tolerance ±0.2 2. Camber not to exceed 1mm in 100mm, noncumulative over 250mm 3. Material: black static-dissipative polystyrene 4. All dimensions are in mm, unless otherwise specified. 5. A0 and B0 measured on a plane 0.3mm above the bottom of the pocket 6. MSL1 260°C (IR and convection) PbF reflow compatible Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): CSD16325Q5 7 CSD16325Q5 SLPS218A – AUGUST 2009 – REVISED SEPTEMBER 2009 ........................................................................................................................................... www.ti.com Package Marking Information Location 8 1st Line CSD 5 5 8 4 1 = Fixed Characters NNNNN = 5-digit Product Code 2nd Line (Date Code) YY = Last 2 digits of the Year WW = 2-digit Work Week C = Country of Origin CSDNNNNN YYWWC LLLLL > Philippines = P > Taiwan = T > China = C 3rd Line LLLLL = Last 5 digits of the Wafer Lot Number 1 4 Pin 1 Identifier M0141-01 REVISION HISTORY Changes from Original (August 2009) to Revision A ..................................................................................................... Page • 8 Changed Qrr Reverse Recovery Charge typical value From: 102nC To: 63nC ................................................................... 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): CSD16325Q5 PACKAGE OPTION ADDENDUM www.ti.com 14-Oct-2009 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing CSD16325Q5 ACTIVE SON DQH Pins Package Eco Plan (2) Qty 8 2500 Green (RoHS & no Sb/Br) Lead/Ball Finish Call TI MSL Peak Temp (3) Level-1-260C-UNLIM (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. 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