ETC WSF128K16

WSF128K16-XXX
128Kx16 SRAM/FLASH MODULE, SMD 5962-96900
FEATURES
n Access Times of 35ns (SRAM) and 70ns (FLASH)
n Access Times of 70ns (SRAM) and 120ns (FLASH)
n
Built-in Decoupling Caps and Multiple Ground Pins for
Low Noise Operation
n
Weight
• WSF128K16-XHX - 13 grams typical
• WSF128K16-H1X - 13 grams typical
• WSF128K16-XG1UX - 5 grams typical
n Packaging
• 66-pin, PGA Type, 1.075 inch square HIP, Hermetic
Ceramic HIP (Package 400)
FLASH MEMORY FEATURES
• 66-pin, PGA Type, 1.185 inch square HIP, Hermetic
Ceramic HIP (Package 401)
• 68 lead, Hermetic CQFP (G1U), 22.4mm (0.880
inch) square (Package 519). Designed to fit JEDEC
68 lead 0.990” CQFJ footprint (Fig. 2)
n
10,000 Erase/Program Cycles
n
Sector Architecture
• 8 equal size sectors of 16K bytes each
• Any combination of sectors can be concurrently
erased.
Also supports full chip erase
n 128Kx16 SRAM
n 128Kx16 5V FLASH
n Organized as 128Kx16 of SRAM and 128Kx16 of Flash
Memory with separate Data Buses
n
5 Volt Programming; 5V ± 10% Supply
n
Embedded Erase and Program Algorithms
n Both blocks of memory are User Configurable as
256Kx8
n
Hardware Write Protection
n
Page Program Operation and Internal Program Control
Time.
n Low Power CMOS
n Commercial, Industrial and Military Temperature Ranges
Note: For programming information refer to Flash Programming 1M5
Application Note.
n TTL Compatible Inputs and Outputs
PIN DESCRIPTION
FIG.1 PIN CONFIGURATION FOR WSF128K16-XHX AND WSF128K16-XH1X
TOP VIEW
FD0-15
Flash Data Inputs/Outputs
SD0-15
SRAM Data Inputs/Outputs
A 0-16
Address Inputs
SWE1-2
SRAM Write Enable
SCS1-2
SRAM Chip Selects
OE
Output Enable
VCC
Power Supply
GND
Ground
NC
Not Connected
FWE1-2
Flash Write Enable
FCS1-2
Flash Chip Select
BLOCK DIAGRAM
May 2001 Rev. 5
1
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WSF128K16-XXX
FIG. 2 PIN CONFIGURATION FOR WSF128K16-XG1UX
PIN DESCRIPTION
TOP VIEW
The WEDC 68 lead G1U CQFP
fills the same fit and function
as the JEDEC 68 lead CQFJ or
68 PLCC. But the G1U has the
TCE and lead inspection
advantage of the CQFP form.
FD 0-15
Flash Data Inputs/Outputs
SD0-15
SRAM Data Inputs/Outputs
A 0-16
Address Inputs
SWE1-2
SRAM Write Enable
SCS1-2
SRAM Chip Selects
OE
Output Enable
VCC
Power Supply
GND
Ground
NC
Not Connected
FWE1-2
Flash Write Enable
FCS1-2
Flash Chip Select
BLOCK DIAGRAM
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
2
WSF128K16-XXX
SRAM TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Min
Max
Unit
SCS
OE
SWE
Mode
Data I/O
Power
TA
-55
+125
°C
°C
H
L
L
L
X
L
H
X
X
H
H
L
Standby
Read
Read
Write
High Z
Data Out
High Z
Data In
Standby
Active
Active
Active
Operating Temperature
Storage Temperature
T STG
-65
+150
Signal Voltage Relative to GND
VG
-0.5
7.0
V
Junction Temperature
TJ
150
°C
7.0
V
Supply Voltage
VCC
-0.5
CAPACITANCE
(TA = +25°C)
Parameter
Flash Data Retention
10 years
Flash Endurance (write/erase cycles)
10,000
Test
NOTES:
1. Stresses above the absolute maximum rating may cause permanent damage to
the device. Extended operation at the maximum levels may degrade
performance and affect reliability.
RECOMMENDED OPERATING CONDITIONS
Parameter
Symbol
Condition
Max
Unit
OE Capacitance
COE
V IN = 0V, f = 1.0MHz 50
pF
F/S WE 1-2 Capacitance
C WE
V IN = 0V, f = 1.0MHz 20
pF
F/S CS 1-2 Capacitance
C CS
V IN = 0V, f = 1.0MHz 20
pF
SD0-15/FD0-15 Capacitance
CI / O
V IN = 0V, f = 1.0MHz 20
pF
A0 - A16 Capacitance
C AD
V IN = 0V, f = 1.0MHz 50
pF
This parameter is guaranteed by design but not tested.
Symbol
Min
Max
Supply Voltage
V CC
4.5
5.5
Unit
V
Input High Voltage
VIH
2.2
V CC + 0.3
V
Input Low Voltage
V IL
-0.5
+0.8
V
DC CHARACTERISTICS
(VCC = 5.0V, VSS = 0V, TA = -55°C TO +125°C)
Parameter
Max
Unit
Input Leakage Current
ILI
V CC = 5.5, V IN = GND to VCC
10
µA
Output Leakage Current
ILO
SCS = VIH, OE = VIH, VOUT = GND to VCC
10
µA
I CCx16
SCS = VIL, OE = FCS = VIH, f = 5MHz, V CC = 5.5
360
mA
Standby Current
I SB
FCS = SCS = VIH, OE = VIH, f = 5MHz, V CC = 5.5
40
mA
SRAM Output Low Voltage
V OL
I OL = 2.1mA, V CC = 4.5
0.4
SRAM Output High Voltage
VOH
I OH = -1.0mA, V CC = 4.5
Flash V CC Active Current for Read (1)
ICC1
FCS = VIL, OE = SCS = VIH
100
mA
Flash V CC Active Current for Program or
Erase (2)
ICC2
FCS = VIL, OE = SCS = VIH
130
mA
Flash Output Low Voltage
V OL
I OL = 8.0mA, V CC = 4.5
Flash Output High Voltage
V OH1
I OH = -2.5 mA, V CC = 4.5
0.85 x V CC
Flash Output High Voltage
V OH2
I OH = -100 µA, V CC = 4.5
V CC -0.4
V
Flash Low V CC Lock Out Voltage
V LKO
3.2
V
SRAM Operating Supply Current x 16 Mode
Symbol
Conditions
Min
2.4
V
V
0.45
V
V
NOTES:
1. The ICC current listed includes both the DC operating current and the frequency dependent component (@ 5 MHz).
The frequency component typically is less than 2 mA/MHz, with OE at VIH.
2. ICC active while Embedded Algorithm (program or erase) is in progress.
3. DC test conditions: VIL = 0.3V, VIH = VCC - 0.3V
3
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WSF128K16-XXX
SRAM AC CHARACTERISTICS
(VCC = 5.0V, TA = -55°C TO +125°C)
SRAM AC CHARACTERISTICS
(VCC = 5.0V, TA = -55°C TO +125°C)
Parameter
Symbol
Read Cycle
-35
Min
-70
Max
35
Min
-35
Min
-70
Unit
Max
ns
Write Cycle Time
t WC
35
70
ns
ns
Chip Select to End of Write
tCW
25
60
ns
ns
Address Valid to End of Write
t AW
25
60
ns
70
ns
Data Valid to End of Write
t DW
20
30
ns
35
ns
Write Pulse Width
t WP
25
50
ns
ns
Address Setup Time
t AS
0
5
ns
ns
Address Hold Time
t AH
0
5
ns
ns
Output Active from End of Write
t OW 1
4
5
Write Enable to Output in High Z
t WHZ 1
t RC
Address Access Time
t AA
70
Output Hold from Address Change
tOH
Chip Select Access Time
t ACS
35
Output Enable to Output Valid
tOE
20
Chip Select to Output in Low Z
t CLZ 1
3
Output Enable to Output in Low Z
t OLZ 1
0
Chip Disable to Output in High Z
t CHZ 1
20
25
Output Disable to Output in High Z
t OHZ 1
20
25
ns
0
Symbol
Write Cycle
Read Cycle Time
35
Parameter
Unit
Max
70
3
3
0
1. This parameter is guaranteed by design but not tested.
Data Hold from Write Time
tDH
20
0
ns
25
0
ns
ns
1. This parameter is guaranteed by design but not tested.
FIG. 3 AC TEST C IRCUIT
AC TEST C ONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75W.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
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WSF128K16-XXX
FIG. 4 SRAM T IMING W AVEFORM - READ CYCLE
FIG. 5 SRAM WRITE CYCLE - SWE CONTROLLED
FIG. 6 SRAM W RITE CYCLE - SCS CONTROLLED
WS32K32-XHX
5
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WSF128K16-XXX
FL ASH AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS, FWE CONTROLLED
(VCC = 5.0V, TA = -55°C TO +125°C)
Parameter
Symbol
-70
Min
-120
Max
Min
Unit
Max
Write Cycle Time
t AVAV
t WC
70
120
ns
Chip Select Setup Time
tELWL
tCS
0
0
ns
Write Enable Pulse Width
t WLWH
t WP
35
50
ns
Address Setup Time
tAVWL
t AS
0
0
ns
Data Setup Time
t DVWH
tDS
30
50
ns
Data Hold Time
t WHDX
tDH
0
0
ns
Address Hold Time
tWLAX
t AH
45
50
ns
Chip Select Hold Time
t WHEH
t CH
0
0
ns
Write Enable Pulse Width High
t WHWL
t WPH
20
20
ns
Duration of Byte Programming Operation (min)
t WHWH1
14
14
µs
Chip and Sector Erase Time
t WHWH2
2.2
t GHWL
0
0
µs
t VCS
50
50
µs
Output Enable Setup Time
tOES
0
0
ns
Output Enable Hold Time (1)
tOEH
10
10
ns
Read Recovery Time Before Write
VCC Set-up Time
60
Chip Programming Time
2.2
60
12.5
12.5
sec
sec
1. For Toggle and Data Polling.
FL ASH AC CHARACTERISTICS – READ ONLY OPERATIONS
(VCC = 5.0V, TA = -55°C TO +125°C)
Parameter
Symbol
-70
Min
Max
70
-120
Min
Unit
Max
Read Cycle Time
t AVAV
t RC
Address Access Time
t AVQV
t ACC
70
120
ns
Chip Select Access Time
t ELQV
t CE
70
120
ns
OE to Output Valid
t GLQV
tOE
35
50
ns
Chip Select to Output High Z (1)
t EHQZ
t DF
20
30
ns
OE High to Output High Z (1)
t GHQZ
t DF
20
30
ns
Output Hold from Address, CS or OE Change, whichever is first
t AXQX
tOH
1. Guaranteed by design, not tested.
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
6
0
120
0
ns
ns
WSF128K16-XXX
FL ASH AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS, FCS CONTROLLED
(VCC = 5.0V, TA = -55°C TO +125°C)
Parameter
Symbol
-70
Min
-120
Max
Min
Unit
Max
Write Cycle Time
t AVAV
t WC
70
120
ns
FWE Setup Time
tWLEL
t WS
0
0
ns
FCS Pulse Width
t ELEH
t CP
35
50
ns
Address Setup Time
t AVEL
t AS
0
0
ns
Data Setup Time
tDVEH
tDS
30
50
ns
Data Hold Time
t EHDX
tDH
0
0
ns
Address Hold Time
tELAX
t AH
45
50
ns
FWE Hold from FWE High
t EHWH
t WH
0
0
ns
tEHEL
tCPH
FCS Pulse Width High
20
20
ns
Duration of Programming Operation
t WHWH1
14
14
µs
Duration of Erase Operation
t WHWH2
2.2
t GHEL
0
Read Recovery before Write
Chip Programming Time
60
60
sec
12.5
sec
0
12.5
7
2.2
ns
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WSF128K16-XXX
FIG. 7 AC WAVEFORMS FOR F L ASH MEMORY READ OPERATIONS
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
8
WSF128K16-XXX
FIG. 8 WRITE/ERASE/PROGRAM OPERATION, FL ASH MEMORY FWE CONTROLLED
NOTES:
1. PA is the address of the memory location
to be programmed.
2. PD is the data to be programmed at byte address.
3. D7 is the output of the complement of the
data written to the device.
4. DOUT is the output of the data written to
the device.
5. Figure indicates last two bus cycles of four bus
cycle sequence.
9
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WSF128K16-XXX
FIG. 9 AC WAVEFORMS CHIP/SECTOR ERASE OPERATIONS FOR FL ASH MEMORY
Notes:
1. SA is the sector address
for Sector Erase.
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10
WSF128K16-XXX
FIG. 10 AC WAVEFORMS FOR DATA POLLING DURING EMBEDDED ALGORITHM OPERATIONS FOR FL ASH MEMORY
11
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WSF128K16-XXX
FIG. 11 WRITE/ERASE/PROGRAM OPERATION FOR FL ASH MEMORY, CS CONTROLLED
NOTES:
1. PA represents the address of the memory location to be programmed.
2. PD represents the data to be programmed at byte address.
3. D7 is the output of the complement of the data written to the device.
4. DOUT is the output of the data written to the device.
5. Figure indicates the last two bus cycles of a four bus cycle sequence.
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
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WSF128K16-XXX
PACKAGE 400: 66 PIN, PGA TYPE, CERAMIC HEX-IN-L INE PACKAGE, HIP (H1)
ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES
13
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WSF128K16-XXX
PACKAGE 519: 68 LEAD, CERAMIC QUAD FL AT PACK, CQFP (G1U)
The WEDC 68 lead G1U CQFP
fills the same fit and function
as the JEDEC 68 lead CQFJ or
68 PLCC. But the G1U has the
TCE and lead inspection
advantage of the CQFP form.
ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520
14
WSF128K16-XXX
ORDERING INFORMATION
W S F 128K16 - XXX X X X
LEAD FINISH:
Blank =Gold plated leads
A
= Solder dip leads
DEVICE GRADE:
M
I
C
= Military Screened
= Industrial
= Commercial
-55°C to +125°C
-40°C to +85°C
0°C to +70°C
PACKAGE TYPE:
H1
H
G1U
= 1.075" sq. Ceramic Hex In-line Package, HIP (Package 400)
= 1.185" sq. Ceramic Hex In-line Package, HIP (Package 401)
= 22.4 mm Ceramic Quad Flat Pack, CQFP (Package 519)
ACCESS TIME (ns)
37
72
= 35ns SRAM and 70ns FLASH
= 70ns SRAM and 120ns FLASH
ORGANIZATION, 128K x 16
FLASH
SRAM
WHITE ELECTRONIC DESIGNS CORP.
DEVICE TYPE
SRAM SPEED
FLASH SPEED
PACKAGE
SMD NO.
128K x 16 Mixed Module
70ns
120ns
66 pin HIP (H)
5962-96900 01HXX
128K x 16 Mixed Module
70ns
120ns
66 pin HIP (H1)
5962-96900 01HYX
128K x 16 Mixed Module
35ns
70ns
66 pin HIP (H)
5962-96900 02HXX
128K x 16 Mixed Module
35ns
70ns
66 pin HIP (H1)
5962-96900 02HYX
128K x 16 Mixed Module
70ns
120ns
68 lead CQFP/J (G1U)
5962-96900 01HX*
128K x 16 Mixed Module
35ns
70ns
68 lead CQFP/J (G1U)
5962-96900 02HX*
*SMD Pending
15
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com