VP213 Dual 90MHz 6-Bit Analog to Digital Converter Preliminary Information DS4067 - 1.4 May 1996 The VP213 is a dual 90MHz 6-bit Analog to Digital Converter designed for use in consumer satellite receivers and decoders, video systems, multimedia and communications applications. Operating from a single +5V supply, the VP213 includes an on-chip high bandwidth ADC driver amplifier, a 6-bit ADC and digital I/O that can be interfaced to either +5V or +3V. The VP213 also has the necessary bias voltages for the reference resistor chain in the 'flash' architecture of the ADC. FEATURES ■ 90MHz Conversion Rate ■ TTL Clock/Data Interface ■ 1 Volt Analog Input Range ■ Internal ADC Reference ■ Digital I/O’s compatible with +5V or +3V logic ■ Single 5 Volt Supply ■ Dual ADC System for good channel matching APPLICATIONS ■ Satellite Decoders ■ Multimedia ■ Communications CLKIN 1 28 DA5 VCCD 2 27 DA4 DGND 3 26 DA3 VRT 4 25 DA2 COMPA 5 24 DA1 VINA 6 23 DA0 AGND 7 22 OGND VCCA 8 21 VCCO VP213 VRM 9 20 DB5 COMPB 10 19 DB4 VINB 11 18 DB3 VRB 12 17 DB2 N.C. 13 16 DB1 N.C. 14 15 DB0 MP28 Fig.1 Pin connections - top view (wide body) ORDERING INFORMATION VP213A CG MP1S (Commercial - 28 pin plastic SO) VCCA VCCD VCCO ------------------------------------------------8 2 COMPA VINA VRM VRB VRT VINB COMPB 21 23 24 25 26 27 28 5 6 ADC DRIVER 6 6-BIT ADC + LATCHES DATA OUTPUTS 9 VRB VRM VRT 12 1 CLOCK DRIVER OP AMPS VREF 15 16 17 18 19 20 VRB VRM VRT 4 11 + ADC DRIVER 6 6-BIT ADC LATCHES DATA OUTPUTS 10 3 7 DGND AGND 22 ------------------------------------------------Fig.2 System block diagram OGND DA0 DA1 DA2 DA3 DA4 DA5 CLKIN DB0 DB1 DB2 DB3 DB4 DB5 VP213 ABSOLUTE MAXIMUM RATINGS THERMAL CHARACTERISTICS DC supply voltage (VCCA, VCCD, VCCO) -0.3 to+7V Analog input voltage (VIN) -0.3 to VCC+0.3V Digital inputs (CLKIN) VCC Digital output current (Ioh, Iol, Isc) -20 to +20mA Ambient operating temperature (Tamb) 0°C to +70°C Storage temperature (Tstorage) -55°C to +125°C THERMAL RESISTANCES Junction to case(Θjc) Junction to ambient(Θja) 32°C/W 84°C/W ELECTRICAL CHARACTERISTICS Test conditions (unless otherwise stated) Tamb = 25°C, VCCA/D/O = +5V, full temperature range = 0°C to +70°C DC CHARACTERISTICS All specifications apply to either of the two ADCs Symbol Temp. Test Level Min. Value Typ. Max. - - - 6 - - Bits Static performance Differential non-linearity DNL Integral non-linearity INL +25°C Full +25°C Full 4 4 4 4 - - ±0.5 ±0.5 ±0.5 ±0.5 LSB LSB LSB LSB Full 4 4 4 4 1 4 1 4 1 4 1 4.75 4.75 4.75 14 34 3 260 5.0 5.0 5.0 19 42 11 360 5.25 5.25 5.25 26 51 15 460 V V V mA mA mA mA mA mA mW Characteristic Resolution No missing codes Power supply Analog supply voltage Digital supply voltage Output supply voltage Analog supply current Power dissipation PD Analog input Input range Input resistance Input capacitance Gain variation Vin Rin Cin GV Full +25°C +25°C +25°C 5 1 5 4 20k - 1.0 25k 4.0 - 30k 0.25 V Ω pF dB Gm F3dB Aindc Vcomp +25°C +25°C +25°C +25°C 1 4 1 1 3.35 1.8 200 3.6 2.0 0.25 3.85 2.2 dB MHz V V CLKIN Input voltage high Vih Input voltage low Vil Input current high Iih Iil 1 4 1 4 1 4 1 4 2.0 –0.2 - –0.35 - 0.8 1 –0.5 - V V V V µA Input current low +25°C Full +25°C Full +25°C Full +25°C Full +25°C Full +25°C Full +25°C Full +25°C Full 1 4 1 4 1 4 1 4 2.4 - - 3.0 0.4 -400 1 - Digital supply current DICC Output supply current OICC Gain matching Input -3dB bandwidth Ain input voltage Comp output TTL digital outputs Output voltage high Voh Output voltage low Vol Output current high Ioh Output current low Iol Conditions Guaranteed Full Full Full +25°C Full +25°C Full +25°C Full +25°C 2 VCCA VCCD VCCO AICC Units mA V V V V µA mA - Pk to Pk Fin=300Hz to 20MHz Fin=15.36MHz VCCD = 5.25V Vin = 2.7V VCCD = 5.25V Vin = 0.4V VCCO = 4.75V Ioh = 400µA VCCO = 4.75V Iol = 1mA VCCO = 4.75V VCCO = 4.75V VP213 DC CHARACTERISTICS (cont.) Symbol Temp. Test Level Min. Value Typ. Max. VRB VRM VRT +25°C +25°C +25°C 1 1 1 2.367 2.848 3.337 2.525 3.04 3.55 2.671 3.212 3.763 Characteristic Symbol Temp. Test Level Min. Value Typ. Max. Switching performance Clock high pulse width Clock low pulse width Max. conversion rate Data output setup time Data output hold time Aperture delay Aperture delay matching Aperture jitter Tpw1 Tpw0 Fmax Tsetup Thold Tad Tadδ Taj +25°C +25°C +25°C +25°C +25°C +25°C +25°C +25°C 4 4 1 4 4 4 4 4 5.7 5.7 90 4 3 2 10 6 6 3 0.25 25 Dynamic performance Differential non-linearity Integral non-linearity Signal to noise ratio Total harmonic distortion Effective No. of bits Crosstalk rejection Input offset Error rate DNL INL SNR THD ENOB CTR Vos BER +25°C +25°C +25°C +25°C +25°C +25°C +25°C +25°C 4 4 1 4 1 5 1 5 –0.95 31.8 40 5.0 - 5.6 50 ±0.5 10e-8 Characteristic Reference voltage Vref ladder bottom Vref ladder middle Vref ladder top Units Conditions V V V AC CHARACTERISTICS Units Conditions 8 8 4 0.5 50 ns ns MHz ns ns ns ns ps rms Cload=10pF Cload=10pF +1.2 ±1 ±1 - LSB LSB dB dBc bits dBc LSB FCLK = 90.11MHz FIN = 11.26MHz NOTES 1. An input voltage of 0.0 volts ±0.5 LSB should nominally correspond to the ‘011111’ to ‘100000’B transition edge. TEST LEVELS Level 1 - 100% production tested. Level 2 - 100% production tested at 25°C and sample tested at specified temperatures. Level 3 - Sample tested only. Level 4 - Parameter is guaranteed by design and characterisation testing. Level 5 - Parameter is typical value only. Input Voltage Digital Output 1.0 Volt Full Scale Binary 00 Least positive valid input 000000 01 - 000001 ● ● ● 31 - 011111 32 0 100000 33 - 100001 ● ● ● 62 - 111110 63 Most positive valid input 111111 Code Table 1: Output coding 3 VP213 PIN DESCRIPTIONS - 28 Pin Plastic SO Package Pin Name 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 CLKIN VCCD DGND VRT COMPA VINA AGND VCCA VRM COMPB VINB VRB N.C. N.C. DB0 DB1 DB2 DB3 DB4 DB5 VCCO OGND DA0 DA1 DA2 DA3 DA4 DA5 Description TTL clock input Digital voltage supply for ADC’s and input clock Digital ground Reference voltage- ladder top Capacitor compensation - A channel Analog signal input - A channel Analog ground Analog voltage supply for drivers and references Reference voltage- ladder middle Capacitor compensation - B channel Analog signal input - B channel Reference voltage- ladder bottom Not connected Not connected TTL digital output - channel B - LSB TTL digital output - channel B - MSB Output voltage supply for TTL data outputs Output ground TTL digital output - channel A - LSB TTL digital output - channel A - MSB Table 2: Pin descriptions ELECTRICAL CHARACTERISTICS DEFINITIONS Analog Bandwidth The analog input frequency at which the spectral power of the fundamental frequency, as determined by FFT analysis is reduced by 3dB. Aperture Delay The delay between the rising edge of the 90MHz clock signal and the instant the analog input signal is sampled. Aperture Jitter The sample to sample variation in aperture delay. Bit Error Rate (BER) The number of spurious code errors produced for any given input sinewave frequency at a given clock frequency. In this case it is the number of codes occurring outside the histogram cusp for a 1/2 FS sinewave. Data Outputs, Set-up and Hold Time Data output timings are measured from the 50% threshold to the 50% threshold on the rising edge of the output clock. Differential Non-linearity The deviation in any code width from an ideal 1 LSB step. 4 Effective Number of Bits (ENOB) This is a measure of a device's dynamic performance and may be obtained from the SNR or from a sine wave curve test fit according to the following expressions: ENOB = SNR-1.76/6.02 or ENOB = N-log2[rms error (actual)/rms error (ideal)] where N is the conversion resolution and the actual rms error is the deviation from an ideal sine wave, calculated from the converter outputs with a sine wave input. Integral Non-linearity (INL) The deviation of the centre of each code from a reference line which has been determined by a least squares curve fit. Signal-to-Noise Ratio (SNR) The ratio of the rms signal amplitude to the rms value of ‘noise’ which is defined as the sum of all other spectral components, including the harmonics, but excluding D.C. with a full-scale analog input signal. VP213 Device Description The VP213 is a dual 90MHz 6-bit ADC system, (see Fig.2). Included on chip is a high bandwidth ADC driver amplifier, a 6-bit analog to digital converter, latches and TTL compatible data outputs. The VP213 also has the necessary bias voltages for the reference resistor chain in the ‘flash’ architecture of the ADC. VRM Analog Input The analog inputs, (VIN A,B) are A.C. coupled into the non-inverting input of the ADC driver amplifiers, which provide the necessary bandwidth, gain, offset and low impedance required to drive the ADC. The amplifier has been designed so that an input of 0 volts will produce an output level equal to the voltage present at the middle of the ADC resistor chain, VRM (3.00V typ.). This is achieved by an internal feedback loop within each amplifier which compares the amplifier output with VRM, (see Fig.3). This voltage will produce a transition binary code of 011111 to 100000 at the output of the ADC. DC SHIFT COMP_(Q,I) CCOMP Fig.3 DC offset internal feedback loop An on chip band gap voltage reference circuit combined with two op-amps provides all the necessary bias voltages for the ADC reference resistor chain, bottom (VRB), middle (VRM) and top(VRT). VRB, VRM and VRT have been brought out to pins 12, 9 and 4 respectively and should be decoupled with 100nF capacitors close to the package pins. Digital Interface The TTL data output pins, (DA0-DA5) and (DB0-DB5), have been optimized to interface with devices in close proximity to the VP213 and are designed to provide satisfactory logic levels at speeds up to 90MHz into a fanout of one and a total load capacitance of 10pF. All data outputs should have approximately equivalent loading to ensure proper setup and hold times. For capacitive loads in excess of 10pF, output buffers are recommended. ADC Circuit The VP213 employs a ‘flash’ architecture consisting of a reference resistor chain, an array of 64 comparators, encoding logic and a 6-bit latch. The 63 reference levels generated by the resistor chain are compared with the analog output signal from the ADC driver amplifier using the comparator array. This produces a thermometer code which the encoding logic converts into a 6-bit word. Clock Interface The clock signal to the ADC synchronizes the sampling, conversion and output stages of the device as shown in the timing diagram (see Fig.4). The output of the ADC driver amp is sampled when the comparator array is latched on the rising edge of the input clock. Data is then presented to the TTL data outputs and latched on the falling edge of the input clock. Latch Comparator τ1 L C VIN(A,B) TO ADC CC Reference Voltage V ref. ADC DRIVER AMP INPUT SIGNAL Data Out Clock to ADC N-1 N N+1 VIN(A,B) Tpw 1 Tpw 0 CLKIN Data Outputs N-1 N+1 N Tsu TTL Threshold THold Fig.4 System timing diagram 5 VP213 Layout And Grounding As with all high speed A to D converters, careful consideration must be given to the PCB layout. High performance can be obtained from the VP213 by tying all grounds to a solid low impedance ground plane. Separate analog and digital ground planes with a single common link under the device can also be used to help reduce the amount of digital noise fed back into the analog section of the converter. The VP213 should be decoupled with low impedance 100nF ceramic capacitors close to the package pins to avoid lead inductance effects and the decoupling on supply lines CLKIN 1.2µH 50R 100n 100n Cc Ccomp VINA 50R VCCA 47µ 100n should further be improved by using a 47µF tantalum capacitor in parallel with a 100nF ceramic capacitor. If VCCA is derived from VCCD, a small inductor should be used to reduce digital noise on the analog power supply. Jitter and noise on clock input pins must be minimised. Long clock lines should therefore be avoided and all clock lines correctly terminated. Cross talk of digital signals to the analog inputs must also be prevented as sampling cross talk produces DC offsets on the sampled data, for this reason analog inputs should not be run next to clock or data lines. Device connections to the ground plane should be as short as possible. 1 28 2 27 3 26 4 25 5 VP213 24 6 23 7 22 8 21 100n 47µ 100n 100n Cc A Channel Data 50R 100n VCCD 9 20 10 19 11 18 12 17 13 16 Analog Ground 14 15 Digital Ground Ccomp VINB 100n B Channel Data Fig.5 Applications diagram Application Circuit Fig.5 shows a typical applications circuit for the VP213. The supply connections are made using separate low noise digital and analog power supplies and VCCD is further isolated from VCCO using a 1.2µH inductor. The COMPA and COMPB pins must be decoupled to reduce any ripple at low frequencies which may distort the ADC driver amplifier output, (see Fig.2.) The decoupling capacitor value is determined by the required low frequency performance of the system and can be obtained from the following equation. CComp 6 = 75x10- 6 Fin x VRipple A ripple voltage ≤ 10mV is recommended for good system performance, e.g. If the analog input frequency Fin= 10KHz a value of 0.75µF is required for CComp. To ensure effective A.C. coupling at low input frequencies, the coupling capacitors on pins 6 and 11 can be calculated from the high pass filter corner frequency equation, Fc = 1 2 x π x RC where Fc = Lower -3dB corner frequency (R = Input Resistance, 25K typ. - 20K min) http://www.mitelsemi.com World Headquarters - Canada Tel: +1 (613) 592 2122 Fax: +1 (613) 592 6909 North America Tel: +1 (770) 486 0194 Fax: +1 (770) 631 8213 Asia/Pacific Tel: +65 333 6193 Fax: +65 333 6192 Europe, Middle East, and Africa (EMEA) Tel: +44 (0) 1793 518528 Fax: +44 (0) 1793 518581 Information relating to products and services furnished herein by Mitel Corporation or its subsidiaries (collectively “Mitel”) is believed to be reliable. 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