NEC UPD16510GR-8JG

DATA SHEET
MOS INTEGRATED CIRCUIT
µPD16510
VERTICAL DRIVER FOR CCD SENSOR
The µPD16510 is a vertical driver dedicated for CCD area image sensors that incorporates a level conversion
circuit and a three-level output function. It contains a CCD vertical register driver (4 channels) and a VOD shutter
driver (1 channel).
The µPD16510, which uses the CMOS process, provides optimum transmission delay and output ON resistance
characteristics for the vertical drive of CCD sensors. It can be used for low-voltage logic (logic power-supply voltage:
2.0 to 5.5 V).
FEATURES
• CCD vertical register driver : 4 channels, VOD shutter driver: 1 channel
• Small package
: 20-pin plastic shrink SOP (225 mil)
• High breakdown voltage
: 33 V MAX.
• Low output ON resistance
: 30 Ω TYP.
• Low voltage operation (logic power-supply voltage: 2.0 to 5.5 V)
• Latch-up free
• Pin-compatible with µPD16506 (CCD driver)
APPLICATIONS
• Camcorders
ORDERING INFORMATION
Part Number
Package
µPD16510GR-8JG
20-pin plastic shrink SOP (225 mil)
The information in this document is subject to change without notice.
Document No. S12191EJ2V0DS00 (2nd edition)
(Previous No. IC-3448)
Date Published May 1997 N
Printed in Japan
The mark
shows major revised points.
1994
µPD16510
BLOCK DIAGRAM
Vsb
20
VDD1
16
VSS
2
TI1
7
4
VDD2a
19 VDD2b
VDD1
VDD2a
Three
level
5
TO1
3
BO1
VSS
PG1
VDD2b
8
Two
level
BI1
TI2
9
14
VSS
Input interface
(2.0 to 5.5 V)
VDD1
VDD2a
Three
level
PG2
13
BI2
12
VSS
VDD2b
Two
level
SUBI
10
NC
11
18 BO2
VSS
Vsb
Two
level
2
VCC
6
GND
15
17 TO2
1
VSS
SUBO
µPD16510
PIN CONFIGURATION
20-pin plastic shrink SOP (225 mil)
SUBO
VSS
BO1
VDD2a
TO1
VCC
TI1
PG1
BI1
SUBI
Remark
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
Vsb
VDD2b
BO2
TO2
VDD1
GND
TI2
PG2
BI2
NC
The µPD16510 is pin-compatible with the µPD16506 (CCD driver).
However, the VOD shutter drive pulse input polarity switching pin (SSP) of the µPD16506 corresponds
to the GND pin in the µPD16510 (pin 15).
PIN FUNCTIONS
No.
Symbol
I/O
Pin Function
1
SUBO
O
VOD shutter drive pulse output
2
VSS
–
VL power supply
3
BO1
O
Two-level pulse output
4
VDD2a
–
VMa (Three-level driver) power supply
5
TO1
O
Three-level pulse output
6
VCC
–
Logic power supply
7
TI1
I
Three-level driver input (See Functions table on p. 4)
8
PG1
I
9
BI1
I
Two-level driver input (See Functions table on p. 4)
10
SUBI
I
VOD shutter drive pulse input
11
NC
–
Non connect
12
BI2
I
Two-level driver input (See Functions table on p. 4)
13
PG2
I
Three-level driver input (See Functions table on p. 4)
14
TI2
I
15
GND
–
Ground
16
VDD1
–
VH power supply
17
TO2
O
Three-level pulse output
18
BO2
O
Two-level pulse output
19
VDD2b
–
VMb (Two-level driver) power supply
20
Vsb
–
VHH (for SUB drive) power supply
3
µPD16510
FUNCTIONS
VL = VSS, VMa = VDD2a, VMb = VDD2b, VH = VDD1, VHH = Vsb
Pin TO1
Pin TO2
Input
Input
Output (TO1)
TI1
PG1
L
L
L
Output (TO2)
TI2
PG2
VH
L
L
VH
H
VMa
L
H
VMa
H
L
VL
H
L
VL
H
H
H
H
Pin BO1
Input
Pin BO2
Output (BO1)
BI1
Input
Pin SUBO
Output (BO2)
BI2
Input
Output (SUBO)
SUBI
L
VMb
L
VMb
L
VHH
H
VL
H
VL
H
VL
Usage Caution
Because the µPD16510 contains a PN junction (diode) between VDD2 → VDD1, if the voltage is VDD2 > VDD1, an
abnormal current will result.
Therefore, apply power in the sequence VDD1 → VDD2, or apply power simultaneously to VDD1 and VDD2.
4
µPD16510
ELECTRICAL SPECIFICATIONS
ABSOLUTE MAXIMUM RATINGS (Unless otherwise specified, TA = 25 ˚C, GND = 0 V)
Parameter
Symbol
Conditions
Rating
Unit
Power supply voltage
VCC
VSS–0.3 to VSS +20.0
V
Power supply voltage
VDD1
VSS–0.3 to VSS +33.0
V
Power supply voltage
VDD2
VSS–0.3 to VSS +33.0
V
Power supply voltage
Vsb
VSS–0.3 to VSS +33.0
V
Input voltage
VI
VSS–0.3 to V CC+0.3
V
Operating ambient temperature
TA
–25 to +85
°C
Storage temperature
Tstg
–40 to +125
°C
Power dissipation
Pd
260
mW
Caution
T A = 85 °C
Exposure to Absolute Maximum Rating for extended periods may affect device reliability;
exceeding the ratings could cause permanent damage. The parameters apply independently.
RECOMMENDED OPERATING CONDITIONS (TA = 25 ˚C, GND = 0 V)
Parameter
Power supply voltage
Symbol
Conditions
VCC
MIN.
TYP.
2.0
Unit
5.5
V
Power supply voltage
VDD1
Note
10.5
21.0
V
Power supply voltage
VDD1–VSS
Note
20.5
31.0
V
Power supply voltage
VDD2a
–1.0
+4.0
V
Power supply voltage
VDD2b
–1.0
+4.0
V
Power supply voltage
VSS
–10.0
–6.0
V
Power supply voltage
Vsb–VSS
31.0
V
Note
15.0
MAX.
Input voltage, high
V IH
–0.8 VCC
VCC
V
Input voltage, low
VIL
0
0.3 VCC
V
Operating ambient temperature
TA
–20
+70
°C
Note Set the values of VDD1 and VSS to conform to VDD1–VSS specification value.
5
µPD16510
ELECTRICAL CHARACTERISTICS
(Unless otherwise specified, VDD1 = +15 V, VDD2a = 0 V, VDD2b = +1.0 V, Vsb = +21.5 V, VCC = +2.5 V,
VSS = –7.0 V, TA = 25 °C, GND = 0 V)
Parameter
Symbol
Output voltage, high
VH
Output voltage, middle
VMa
Output voltage, middle
VMb
Output voltage, low
VL
Conditions
MIN.
IO = –20 µA
IO = 20 µA
TYP.
MAX.
Unit
VDD1–0.1
VDD1
V
VDD2a–0.1
VDD2a
V
VDD2b–0.1
VDD2b
V
VSS +0.1
VSS
V
Output voltage, sub high
V subH
IO = –20 µA
Vsb–0.1
Vsb
V
Output voltage, sub low
VsubL
IO = 20 µA
VSS +0.1
VSS
V
Output ON resistance
RL
IO = 10 mA
20
30
Ω
Output ON resistance
RM
IO = ±10 mA
30
45
Ω
Output ON resistance
RH
IO = –10 mA
30
40
Ω
Output ON resistance
Rsub
30
40
Ω
Transmission delay time 1
T D1
200
ns
Transmission delay time 2
T D2
200
ns
Transmission delay time 3
T D3
200
ns
Rise/Fall time 1
TP1
See Figure 1. Output Load Circuit.
500
ns
Rise/Fall time 2
TP2
See Figure 2. Timing Chart.
500
ns
Rise/Fall time 3
TP3
200
ns
Consumption Current
ICC
Consumption Current
IDD2a
Consumption Current
No load, see Figure 2. Timing Chart.
See Figure 1. Output Load Circuit.
0.5
1.0
mA
See Figure 3. Input Waveform.
3.0
5.0
mA
IDD2b
3.0
5.0
mA
Consumption Current
lDD1
1.5
3.0
mA
Consumption Current
Isb
1.2
1.8
mA
Figure 1. Output Load Circuit
2000 pF
2000 pF
1000 pF
TO1
BO2
3000 pF
3000 pF
1000 pF
BO1
TO2
2000 pF
6
2000 pF
SUBO
1600 pF
µPD16510
Figure 2. Timing Chart
BI1, BI2
TI1, TI2
TD1
TD1
VMb
VMa
BO1, BO2
TO1, TO2
VL
TP1
TP1
PG1, PG2
TD2
TD2
VH
TO1, TO2
VMa
TP2
TP2
SUBI
TD3
TD3
VHH
SUBO
VL
TP3
TP3
7
µPD16510
Figure 3. Input Waveform
Input pulse timing diagram
63.5 µs
127 µs
2 µs
Tl2
Tl1
Bl1
Bl2
PG1
2.5 µ s
PG2
63.5 µ s
2.5 µ s
2 µs
16.7 ms
SUBI
Overlap section enlarged diagram
Tl1
Bl1
Tl2
Bl2
0
8
0.7
1.4
2.1
2.8
3.5
4.2
4.9 µs
µPD16510
APPLICATION CIRCUIT EXAMPLE
VSS
Vsb
VCC
VDD1
VSUB (substrate voltage)
CCD
0.1 µF
SUB
1 MΩ
1
SUBO
Vsb
20
2
VSS
VDD2b
19
3
BO1
BO2
18
4
VDD2a
TO2
17
5
TO1
VDD1
16
6
VCC
GND
15
7
Tl1
Tl2
14
8
PG1
PG2
13
9
Bl1
Bl2
12
NC
11
0.1 µF
0.1 µ F
V1
SUB
TG
V1
0.1 µ F
µ PD16510
SSG
V2
V3
V4
0.1 µ F
V2
V3
V4
10 SUBI
9
µPD16510
PACKAGE DRAWING
20 PIN PLASTIC SHRINK SOP (225mil)
20
11
P
detail of lead end
1
H
10
A
I
E
K
F
G
J
N
B
C
D
M
L
M
NOTE
Each lead centerline is located within 0.10 mm (0.004 inch) of
its true position (T.P.) at maximum material condition.
ITEM
MILLIMETERS
INCHES
A
7.00 MAX.
0.276 MAX.
B
0.575 MAX.
0.023 MAX.
C
0.65 (T.P.)
0.026 (T.P.)
D
0.22 +0.10
–0.05
0.009 +0.004
–0.003
E
0.1±0.1
0.004±0.004
F
1.45 MAX.
0.057 MAX.
G
1.15±0.1
0.045 +0.005
–0.004
H
6.4±0.2
0.252±0.008
I
4.4±0.1
0.173 +0.005
–0.004
J
1.0±0.2
0.039 +0.009
–0.008
K
0.15 +0.10
–0.05
0.006 +0.004
–0.002
L
0.5±0.2
0.020 +0.008
–0.009
M
0.10
0.004
N
0.10
0.004
P
3˚ +7˚
–3˚
3˚ +7˚
–3˚
P20GR-65-225C-1
10
µPD16510
RECOMMENDED SOLDERING CONDITIONS
When soldering this product, it is highly recommended to observe the conditions as shown below. If other soldering
processes are used, or if the soldering is performed under different conditions, please make sure to consult with our
sales offices.
For more details, refer to our document “SEMICONDUCTOR DEVICE MOUNTING TECHNOLOGY MANUAL”
(C10535E).
Surface mount device
µPD16510GR-8JG: 20-pin plastic shrink SOP (225 mil)
Process
Conditions
Symbol
Infrared ray reflow
Peak temperature: 235 °C or below (Package surface temperature),
Reflow time: 30 seconds or less (at 210 °C or higher),
Maximum number of reflow processes: 3 times.
IR35-00-3
VPS
Peak temperature: 215 °C or below (Package surface temperature),
Reflow time: 40 seconds or less (at 200 °C or higher),
Maximum number of reflow processes: 3 times.
VP15-00-3
Wave soldering
Solder temperature: 260 °C or below, Flow time: 10 seconds or less,
Maximum number of flow processes: 1 time,
Pre-heating temperature: 120 °C or below (Package surface temperature).
WS60-00-1
Partial heating method
Pin temperature: 300 °C or below,
Heat time: 3 seconds or less (Per each side of the device).
—
Caution Apply only one kind of soldering condition to a device, except for “partial heating method”, or the
device will be damaged by heat stress.
11
µPD16510
[MEMO]
12
µPD16510
[MEMO]
13
µPD16510
[MEMO]
14
µPD16510
NOTES FOR CMOS DEVICES
1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note: Strong electric field, when exposed to a MOS device, can cause destruction
of the gate oxide and ultimately degrade the device operation. Steps must
be taken to stop generation of static electricity as much as possible, and
quickly dissipate it once, when it has occurred. Environmental control must
be adequate. When it is dry, humidifier should be used. It is recommended
to avoid using insulators that easily build static electricity. Semiconductor
devices must be stored and transported in an anti-static container, static
shielding bag or conductive material.
All test and measurement tools
including work bench and floor should be grounded. The operator should
be grounded using wrist strap. Semiconductor devices must not be touched
with bare hands. Similar precautions need to be taken for PW boards with
semiconductor devices on it.
2 HANDLING OF UNUSED INPUT PINS FOR CMOS
Note: No connection for CMOS device inputs can be cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input
level may be generated due to noise, etc., hence causing malfunction. CMOS
device behave differently than Bipolar or NMOS devices. Input levels of
CMOS devices must be fixed high or low by using a pull-up or pull-down
circuitry.
Each unused pin should be connected to VDD or GND with a
resistor, if it is considered to have a possibility of being an output pin. All
handling related to the unused pins must be judged device by device and
related specifications governing the devices.
3 STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note: Power-on does not necessarily define initial status of MOS device. Production process of MOS does not define the initial operation status of the device.
Immediately after the power source is turned ON, the devices with reset
function have not yet been initialized. Hence, power-on does not guarantee
out-pin levels, I/O settings or contents of registers. Device is not initialized
until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function.
15
µPD16510
[MEMO]
The application circuits and their parameters are for reference only and are not intended for use in actual design-ins.
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96.5