TI TLV5626

TLV5626
2.7 V TO 5.5 V LOW POWER DUAL 8-BIT DIGITAL-TO-ANALOG
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features
D
D
D
D
D
D
D PACKAGE
(TOP VIEW)
Dual 8-Bit Voltage Output DAC
Programmable Internal Reference
Programmable Settling Time:
0.8 µs in Fast Mode ,
2.8 µs in Slow Mode
Compatible With TMS320 and SPI Serial
Ports
Differential Nonlinearity <0.1 LSB Typ
Monotonic Over Temperature
DIN
SCLK
CS
OUTA
1
8
2
7
3
6
4
5
VDD
OUTB
REF
AGND
applications
D
D
D
D
D
Digital Servo Control Loops
Digital Offset and Gain Adjustment
Industrial Process Control
Machine and Motion Control Devices
Mass Storage Devices
description
The TLV5626 is a dual 8-bit voltage output DAC with a flexible 3-wire serial interface.The serial interface allows
glueless interface to TMS320 and SPI, QSPI, and Microwire serial ports. It is programmed with a 16-bit
serial string containing 2 control and 8 data bits.
The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class AB
output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows
the designer to optimize speed versus power dissipation. With its on-chip programmable precision voltage
reference, the TLV5626 simplifies overall system design.
Because of its ability to source up to 1 mA, the reference can also be used as a system reference. Implemented
with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in
an 8-pin SOIC package to reduce board space in standard commercial and industrial temperature ranges.
AVAILABLE OPTIONS
PACKAGE
TA
SOIC
(D)
0°C to 70°C
TLV5626CD
– 40°C to 85°C
TLV5626ID
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
Copyright  1999, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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functional block diagram
REF
AGND
VDD
PGA With
Output Enable
Voltage
Bandgap
Power-On
Reset
Power
and Speed
Control
2
2
2-Bit
Control
Latch
x2
OUTA
x2
OUTB
DIN
8-Bit
DAC A
Latch
8
SCLK
Serial
Interface
and
Control
CS
8
8
Buffer
8
8-Bit
DAC B
Latch
8
Terminal Functions
TERMINAL
NAME
NO.
I/O/P
DESCRIPTION
AGND
5
P
Ground
CS
3
I
Chip select. Digital input active low, used to enable/disable inputs
DIN
1
I
Digital serial data input
OUTA
4
I
DAC A analog voltage output
OUTB
7
O
DAC B analog voltage output
REF
6
I/O
Analog reference voltage input/output
SCLK
2
I
Digital serial clock input
VDD
8
P
Positive power supply
2
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absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage (VDD to AGND) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Reference input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to VDD + 0.3 V
Digital input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to VDD + 0.3 V
Operating free-air temperature range, TA: TLV5626C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
TLV5626I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 85°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
Supply voltage
voltage, VDD
VDD = 5 V
VDD = 3 V
Power on threshold voltage, POR
High-level digital input voltage, VIH
Low-level digital input voltage, VIL
Reference voltage, Vref to REF terminal
Reference voltage, Vref to REF terminal
MIN
NOM
MAX
4.5
5
5.5
V
2.7
3
3.3
V
2
V
0.55
VDD = 2.7 V to 5.5 V
VDD = 2.7 V to 5.5 V
2
VDD = 5 V (see Note 1)
VDD = 3 V (see Note 1)
Load resistance, RL
UNIT
V
AGND
2.048
AGND
1.024
0.8
V
VDD –1.5
VDD – 1.5
V
2
V
kΩ
Load capacitance, CL
100
pF
Clock frequency, fCLK
20
MHz
Operating free-air
free air temperature,
temperature TA
TLV5626C
TLV5626I
0
70
–40
85
°C
NOTE 1: Due to the x2 output buffer, a reference input voltage ≥ (VDD – 0.4 V)/2 causes clipping of the transfer function. The output buffer of the
internal reference must be disabled, if an external reference is used.
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electrical characteristics over recommended operating conditions (unless otherwise noted)
power supply
PARAMETER
IDD
TEST CONDITIONS
No load,
All inputs = AGND or VDD,
DAC latch = 0x800
Power supply current
TYP
MAX
VDD = 5 V,
Int. ref.
Fast
MIN
4.2
5
mA
Slow
2
2.5
mA
VDD = 3 V,
Int. ref.
Fast
3.7
4.6
mA
Slow
1.7
2.2
mA
VDD = 5 V,
Ext. ref.
Fast
3.8
4.6
mA
Slow
1.7
2.1
mA
VDD = 3 V,
Ext. ref.
Fast
3.4
4.2
mA
Slow
1.4
1.8
mA
Power-down supply current
PSRR
µA
1
Power supply rejection ratio
Zero scale, See Note 2
–65
Full scale,
–65
See Note 3
UNIT
dB
NOTES: 2. Power supply rejection ratio at zero scale is measured by varying VDD and is given by:
PSRR = 20 log [(EZS(VDDmax) – EZS(VDDmin))/VDDmax]
3. Power supply rejection ratio at full scale is measured by varying VDD and is given by:
PSRR = 20 log [(EG(VDDmax) – EG(VDDmin))/VDDmax]
static DAC specifications
PARAMETER
TEST CONDITIONS
MIN
Resolution
TYP
MAX
8
UNIT
bits
INL
Integral nonlinearity, end point adjusted
See Note 4
± 0.4
±1
LSB
DNL
Differential nonlinearity
See Note 5
± 0.1
± 0.5
LSB
EZS
EZS TC
Zero-scale error (offset error at zero scale)
See Note 6
±24
mV
Zero-scale-error temperature coefficient
See Note 7
EG
Gain error
See Note 8
10
ppm/°C
± 0.6
% full
scale V
EG TC
Gain error temperature coefficient
See Note 9
10
ppm/°C
NOTES: 4. The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error, is the maximum deviation of the output
from the line between zero and full scale excluding the effects of zero code and full-scale errors.
5. The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measured and ideal 1
LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains
constant) as a change in the digital input code.
6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
7. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (Tmax) – EZS (Tmin)]/Vref × 106/(Tmax – Tmin).
8. Gain error is the deviation from the ideal output (2Vref – 1 LSB) with an output load of 10 k excluding the effects of the zero-error.
9. Gain temperature coefficient is given by: EG TC = [EG(Tmax) – EG (Tmin)]/Vref × 106/(Tmax – Tmin).
output specifications
PARAMETER
VO
Output voltage
Output load regulation accuracy
4
TEST CONDITIONS
RL = 10 kΩ
0
VO = 4.096 V, 2.048 V,
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TYP
MAX
VDD–0.4
± 0.25
UNIT
V
% full
scale V
TLV5626
2.7 V TO 5.5 V LOW POWER DUAL 8-BIT DIGITAL-TO-ANALOG
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electrical characteristics over recommended operating conditions (unless otherwise noted)
(Continued)
reference pin configured as output (REF)
PARAMETER
Vref(OUTL)
Vref(OUTH)
Low reference voltage
Iref(source)
Iref(sink)
Output source current
TEST CONDITIONS
High reference voltage
VDD > 4.75 V
MIN
TYP
MAX
UNIT
1.003
1.024
1.045
V
2.027
2.048
2.069
1
Output sink current
–1
mA
Load capacitance
PSRR
100
Power supply rejection ratio
V
mA
–65
pF
dB
reference pin configured as input (REF)
PARAMETER
VI
RI
Input voltage
CI
Input capacitance
TEST CONDITIONS
MIN
TYP
0
VDD–1.5
Input resistance
Reference input bandwidth
REF = 0.2
0 2 Vpp + 1.024
1 024 V dc
Reference feedthrough
REF = 1 Vpp at 1 kHz + 1.024 V dc (see Note 10)
MAX
UNIT
V
10
MΩ
5
pF
Fast
1.3
MHz
Slow
525
kHz
– 80
dB
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.
digital inputs
PARAMETER
IIH
IIL
High-level digital input current
Ci
Input capacitance
TEST CONDITIONS
VI = VDD
VI = 0 V
Low-level digital input current
MIN
TYP
MAX
1
UNIT
µA
µA
–1
8
pF
analog output dynamic performance
PARAMETER
TEST CONDITIONS
CL = 100 pF,,
TYP
MAX
Fast
MIN
0.8
2.4
Slow
2.8
5.5
Fast
0.4
1.2
Slow
0.8
1.6
Fast
12
Slow
1.8
ts(FS)
(FS)
time full scale
Output settling time,
RL = 10 kΩ,,
See Note 11
ts(CC)
(CC)
Output settling time
time, code to code
RL = 10 kΩ,,
See Note 12
CL = 100 pF,,
SR
Slew rate
RL = 10 kΩ,,
See Note 13
CL = 100 pF,,
Glitch energy
DIN = 0 to 1,
CS = VDD
fCLK = 100 kHz,
Signal-to-noise ratio
53
57
S/(N+D)
Signal-to-noise + distortion
48
47
THD
Total harmonic distortion
SFDR
Spurious free dynamic range
fs = 480 kSPS,, fout = 1 kHz,,
RL = 10 kΩ,
CL = 100 pF
–50
50
µs
µs
V/µs
5
SNR
UNIT
nV–S
–48
dB
62
NOTES: 11. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change
of 0x020 to 0xFD0 or 0xFD0 to 0x020 respectively. Not tested, assured by design.
12. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change
of one count. Not tested, assured by design.
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.
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digital input timing requirements
MIN
NOM
MAX
UNIT
tsu(CS–CK)
tsu(C16-CS)
Setup time, CS low before first negative SCLK edge
Setup time, 16th negative SCLK edge (when D0 is sampled) before CS rising edge
10
ns
10
ns
twH
twL
SCLK pulse width high
25
ns
SCLK pulse width low
25
ns
tsu(D)
th(D)
Setup time, data ready before SCLK falling edge
10
ns
Hold time, data held valid after SCLK falling edge
5
ns
PARAMETER MEASUREMENT INFORMATION
twL
SCLK
X
1
2
tsu(D)
DIN
X
twH
3
4
5 15
X
16
th(D)
D15
D14
D13
D12
D1
D0
X
tsu(C16-CS)
tsu(CS-CK)
CS
Figure 1. Timing Diagram
6
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TYPICAL CHARACTERISTICS
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
4.5
4.5
4
Fast Mode
I DD – Supply Current – mA
I DD – Supply Current – mA
4
3.5
3
2.5
2
Slow Mode
1.5
Fast Mode
3.5
3
2.5
2
Slow Mode
1.5
VDD = 5 V
Vref = Int. 2 V
Input Code = 1023 (Both DACs)
1
VDD = 3 V
Vref = Int. 1 V
Input Code = 1023 (Both DACs)
1
0.5
–40 –30 –20 –10 0 10 20 30 40 50 60 70 80 90
TA – Free-Air Temperature – °C
0.5
–40 –30 –20 –10 0 10 20 30 40 50 60 70 80 90
TA – Free-Air Temperature – °C
Figure 2
Figure 3
POWER DOWN SUPPLY CURRENT
vs
TIME
OUTPUT VOLTAGE
vs
LOAD CURRENT
2.064
2.4
VDD = 3 V
Vref = Int. 1 V
Input Code = 4095
Fast Mode
2.2
2.062
2
VO – Output Voltage – V
I DD – Power Down Supply Current – mA
2.6
1.8
1.6
1.4
1.2
1
0.8
0.6
0.4
2.06
Slow Mode
2.058
2.056
2.054
2.052
0.2
0
0
10
20
50
30
40
t – Time – µs
60
70
80
2.05
0
0.5
1
1.5
2
2.5
3
3.5
4
Source Current – mA
Figure 4
Figure 5
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TYPICAL CHARACTERISTICS
OUTPUT VOLTAGE
vs
LOAD CURRENT
OUTPUT VOLTAGE
vs
LOAD CURRENT
3
4.128
VDD = 5 V
Vref = Int. 2 V
Input Code = 4095
Fast Mode
2.5
VO – Output Voltage – V
VO – Output Voltage – V
4.126
VDD = 3 V
Vref = Int. 1 V
Input Code = 0
4.124
Slow Mode
4.122
4.12
4.118
Fast Mode
2
1.5
1
0.5
4.116
Slow Mode
0
4.114
0
0.5
1
1.5
2
2.5
3
3.5
0
4
0.5
Figure 6
THD+N – Total Harmonic Distortion and Noise – dB
VDD = 5 V
Vref = Int. 2 V
Input Code = 0
VO – Output Voltage – V
4
3.5
Fast Mode
3
2.5
2
1.5
1
Slow Mode
0
0.5
1
3
3.5
4
1.5
2
2.5
Sink Current – mA
3
3.5
4
0
–10
VDD = 5 V
Vref = 1 V dc + 1 V p/p Sinewave
Output Full Scale
–20
–30
–40
–50
–60
Slow Mode
–70
Fast Mode
–80
–90
–100
100
1000
10000
f – Frequency – Hz
Figure 8
8
2.5
TOTAL HARMONIC DISTORTION AND NOISE
vs
FREQUENCY
5
0
2
Figure 7
OUTPUT VOLTAGE
vs
LOAD CURRENT
0.5
1.5
Sink Current – mA
Source Current – mA
4.5
1
Figure 9
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TYPICAL CHARACTERISTICS
TOTAL HARMONIC DISTORTION
vs
FREQUENCY
THD – Total Harmonic Distortion – dB
0
–10
VDD = 5 V
Vref = 1 V dc + 1 V p/p Sinewave
Output Full Scale
–20
–30
–40
–50
–60
–70
Slow Mode
–80
Fast Mode
–90
–100
100
1000
10000
100000
f – Frequency – Hz
Figure 10
DNL – Differential Nonlinearity – LSB
DIFFERENTIAL NONLINEARITY
vs
DIGITAL OUTPUT CODE
0.20
0.15
0.10
0.05
–0.00
–0.05
–0.10
–0.15
–0.2
0
16
32
48
64
80
96
112 128 144 160 176 192 208 224 240 256
Digital Output Code
Figure 11
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TYPICAL CHARACTERISTICS
INL – Integral Nonlinearity – LSB
INTEGRAL NONLINEARITY
vs
DIGITAL OUTPUT CODE
1.0
0.8
0.6
0.4
0.2
–0.0
–0.2
–0.4
–0.6
–0.8
–1.0
0
16
32
48
64
80
96
112 128 144 160 176 192 208 224 240 256
Digital Output Code
Figure 12
APPLICATION INFORMATION
general function
The TLV5626 is a dual 8-bit, single supply DAC, based on a resistor string architecture. It consists of a serial
interface, a speed and power-down control logic, a programmable internal reference, a resistor string, and a
rail-to-rail output buffer.
The output voltage (full scale determined by reference) is given by:
2 REF CODE [V]
0x1000
Where REF is the reference voltage and CODE is the digital input value in the range 0x000 to 0xFF0.Bits 3 to
0 must be set to zero. A power on reset initially puts the internal latches to a defined state (all bits zero).
serial interface
A falling edge of CS starts shifting the data bit-per-bit (starting with the MSB) to the internal register on the falling
edges of SCLK. After 16 bits have been transferred or CS rises, the content of the shift register is moved to the
target latches (DAC A, DAC B, BUFFER, CONTROL), depending on the control bits within the data word.
Figure 13 shows examples of how to connect the TLV5626 to TMS320, SPI, and Microwire.
TMS320
DSP FSX
DX
CLKX
TLV5626
CS
DIN
SCLK
SPI
I/O
MOSI
SCK
TLV5626
CS
DIN
SCLK
Figure 13. Three-Wire Interface
10
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Microwire
I/O
SO
SK
TLV5626
CS
DIN
SCLK
TLV5626
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APPLICATION INFORMATION
Notes on SPI and Microwire: Before the controller starts the data transfer, the software has to generate a
falling edge on the I/O pin connected to CS. If the word width is 8 bits (SPI and Microwire), two write
operations must be performed to program the TLV5626. After the write operation(s), the holding registers or the
control register are updated automatically on the 16th positive clock edge.
serial clock frequency and update rate
The maximum serial clock frequency is given by:
f sclkmax
+t
)t
1
whmin
wlmin
+ 20 MHz
The maximum update rate is:
f updatemax
+ 16 ǒt
1
whmin
)t
Ǔ+
1.25 MHz
wlmin
The maximum update rate is just a theoretical value for the serial interface, as the settling time of the TLV5626
has to be considered, too.
data format
The 16-bit data word for the TLV5626 consists of two parts:
D
D
Program bits
(D15..D12)
New data
(D11..D0)
D15
D14
D13
D12
R1
SPD
PWR
R0
SPD: Speed control bit
PWR: Power control bit
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
12 Data bits
1 → fast mode
1 → power down
0 → slow mode
0 → normal operation
The following table lists the possible combination of the register select bits:
register select bits
R1
R0
REGISTER
0
0
Write data to DAC B and BUFFER
0
1
Write data to BUFFER
1
0
Write data to DAC A and update DAC B with BUFFER content
1
1
Write data to control register
The meaning of the 12 data bits depends on the register. If one of the DAC registers or the BUFFER is selected,
then the 12 data bits determine the new DAC value:
data bits: DAC A, DAC B and BUFFER
D11
D10
D9
D8
D7
D6
D5
D4
New DAC Value
D3
D2
D1
D0
0
0
0
0
If control is selected, then D1, D0 of the 12 data bits are used to program the reference voltage:
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APPLICATION INFORMATION
data bits: CONTROL
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
X
X
X
X
X
X
X
X
X
X
REF1
REF0
X: don’t care
REF1 and REF0 determine the reference source and, if internal reference is selected, the reference voltage.
reference bits
REF1
REF0
REFERENCE
0
0
External
0
1
1.024 V
1
0
2.048 V
1
1
External
CAUTION:
If external reference voltage is applied to the REF pin, external reference MUST be selected.
examples of operation:
D
Set DAC A output, select fast mode, select internal reference at 2.048 V:
1. Set reference voltage to 2.048 V (CONTROL register):
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
1
1
0
1
0
0
0
0
0
0
0
0
0
0
1
0
D6
D5
D4
D3
D2
D1
D0
0
0
0
0
2. Write new DAC A value and update DAC A output:
D15
D14
D13
D12
1
1
0
0
D11
D10
D9
D8
D7
New DAC A output value
The DAC A output is updated on the rising clock edge after D0 is sampled.
To output data consecutively using the same DAC configuration, it is not necessary to program the CONTROL
register again.
D
Set DAC B output, select fast mode, select external reference:
3. Select external reference (CONTROL register):
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
1
1
0
1
0
0
0
0
0
0
0
0
0
0
0
0
D4
D3
D2
D1
D0
0
0
0
0
4. Write new DAC B value to BUFFER and update DAC B output:
D15
D14
D13
D12
0
1
0
0
D11
D10
D9
D8
D7
D6
D5
New BUFFER content and DAC B output value
X = Don’t care
The DAC A output is updated on the rising clock edge after D0 is sampled.
To output data consecutively using the same DAC configuration, it is not necessary to program the CONTROL
register again.
12
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SLAS236 –JUNE 1999
APPLICATION INFORMATION
examples of operation: (continued)
D
Set DAC A value, set DAC B value, update both simultaneously, select slow mode, select internal reference
at 1.024 V:
1. Set reference voltage to 1.024 V (CONTROL register):
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
1
0
0
1
0
0
0
0
0
0
0
0
0
0
0
1
D8
D7
D6
D5
D4
D3
D2
D1
D0
0
0
0
0
D3
D2
D1
D0
0
0
0
0
2. Write data for DAC B to BUFFER:
D15
D14
D13
D12
0
0
0
1
D11
D10
D9
New DAC B value
X = Don’t care
3. Write new DAC A value and update DAC A and B simultaneously:
D15
D14
D13
D12
1
0
0
0
D11
D10
D9
D8
D7
D6
D5
D4
New DAC A value
X = Don’t care
Both outputs are updated on the rising clock edge after D0 from the DAC A data word is sampled.
D
Set power-down mode:
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
X
X
1
X
X
X
X
X
X
X
X
X
X
X
X
X
X = Don’t care
linearity, offset, and gain error using single ended supplies
When an amplifier is operated from a single supply, the voltage offset can still be either positive or negative. With
a positive offset, the output voltage changes on the first code change. With a negative offset, the output voltage
may not change with the first code, depending on the magnitude of the offset voltage.
The output amplifier attempts to drive the output to a negative voltage. However, because the most negative
supply rail is ground, the output cannot drive below ground and clamps the output at 0 V.
The output voltage then remains at zero until the input code value produces a sufficient positive output voltage
to overcome the negative offset voltage, resulting in the transfer function shown in Figure 14.
Output
Voltage
0V
DAC Code
Negative
Offset
Figure 14. Effect of Negative Offset (single supply)
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APPLICATION INFORMATION
This offset error, not the linearity error, produces this breakpoint. The transfer function would have followed the
dotted line if the output buffer could drive below the ground rail.
For a DAC, linearity is measured between zero-input code (all inputs 0) and full-scale code (all inputs 1) after
offset and full scale are adjusted out or accounted for in some way. However, single supply operation does not
allow for adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity
is measured between full-scale code and the lowest code that produces a positive output voltage.
definitions of specifications and terminology
integral nonlinearity (INL)
The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum
deviation of the output from the line between zero and full scale excluding the effects of zero code and full-scale
errors.
differential nonlinearity (DNL)
The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the
measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage
changes in the same direction (or remains constant) as a change in the digital input code.
zero-scale error (EZS)
Zero-scale error is defined as the deviation of the output from 0 V at a digital input value of 0.
gain error (EG)
Gain error is the error in slope of the DAC transfer function.
signal-to-noise ratio + distortion (S/N+D)
S/N+D is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components
below the Nyquist frequency, including harmonics but excluding dc. The value for S/N+D is expressed in
decibels.
spurious free dynamic range (SFDR)
Spurious free dynamic range is the difference between the rms value of the output signal and the rms value of
the spurious signal within a specified bandwidth. The value for SFDR is expressed in decibels.
14
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SLAS236 –JUNE 1999
MECHANICAL DATA
D (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
14 PINS SHOWN
0.050 (1,27)
0.020 (0,51)
0.014 (0,35)
14
0.010 (0,25) M
8
0.008 (0,20) NOM
0.244 (6,20)
0.228 (5,80)
0.157 (4,00)
0.150 (3,81)
Gage Plane
0.010 (0,25)
1
7
0°– 8°
A
0.044 (1,12)
0.016 (0,40)
Seating Plane
0.069 (1,75) MAX
0.010 (0,25)
0.004 (0,10)
PINS **
0.004 (0,10)
8
14
16
A MAX
0.197
(5,00)
0.344
(8,75)
0.394
(10,00)
A MIN
0.189
(4,80)
0.337
(8,55)
0.386
(9,80)
DIM
4040047 / D 10/96
NOTES: A.
B.
C.
D.
All linear dimensions are in inches (millimeters).
This drawing is subject to change without notice.
Body dimensions do not include mold flash or protrusion, not to exceed 0.006 (0,15).
Falls within JEDEC MS-012
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Copyright  1999, Texas Instruments Incorporated