TI SN74SSTU32864

SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
D
D
D
D
D
D
D
Member of the Texas Instruments
Widebus+ Family
Pinout Optimizes DDR-II DIMM PCB Layout
Configurable as 25-Bit 1:1 or 14-Bit 1:2
Registered Buffer
Chip-Select Inputs Gate the Data Outputs
from Changing State and Minimizes System
Power Consumption
Output Edge-Control Circuitry Minimizes
Switching Noise in an Unterminated Line
Supports SSTL_18 Data Inputs
Differential Clock (CLK and CLK) Inputs
D
D
D
D
Supports LVCMOS Switching Levels on the
Control and RESET Inputs
RESET Input Disables Differential Input
Receivers, Resets All Registers, and
Forces All Outputs Low
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
ESD Protection Exceeds JESD 22
– 5000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
description/ordering information
This 25-bit 1:1 or 14-bit 1:2 configurable registered buffer is designed for 1.7-V to 1.9-V VCC operation. In the
1:1 pinout configuration, only one device per DIMM is required to drive nine SDRAM loads. In the 1:2 pinout
configuration, two devices per DIMM are required to drive 18 SDRAM loads.
All inputs are SSTL_18, except the LVCMOS reset (RESET) and LVCMOS control (Cn) inputs. All outputs are
edge-controlled circuits optimized for unterminated DIMM loads and meet SSTL_18 specifications.
The SN74SSTU32864 operates from a differential clock (CLK and CLK). Data are registered at the crossing
of CLK going high and CLK going low.
The C0 input controls the pinout configuration of the 1:2 pinout from register-A configuration (when low) to
register-B configuration (when high). The C1 input controls the pinout configuration from 25-bit 1:1 (when low)
to 14-bit 1:2 (when high). C0 and C1 should not be switched during normal operation. They should be hard-wired
to a valid low or high level to configure the register in the desired mode. In the 25-bit 1:1 pinout configuration,
the A6, D6, and H6 terminals are driven low and should not be used.
The device supports low-power standby operation. When RESET is low, the differential input receivers are
disabled, and undriven (floating) data, clock, and reference voltage (VREF) inputs are allowed. In addition, when
RESET is low, all registers are reset and all outputs are forced low. The LVCMOS RESET and Cn inputs always
must be held at a valid logic high or low level.
The two VREF pins (A3 and T3), are connected together internally by approximately 150 Ω. However, it is
necessary to connect only one of the two VREF pins to the external VREF power supply. An unused VREF pin
should be terminated with a VREF coupling capacitor.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
0°C to 70°C
LFBGA – GKE
Tape and reel SN74SSTU32864GKER
SU864
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design
guidelines are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus+ is a trademark of Texas Instruments.
Copyright  2003, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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1
SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
description/ordering information (continued)
The device also supports low-power active operation by monitoring both system chip select (DCS and CSR)
inputs and will gate the Qn outputs from changing states when both DCS and CSR inputs are high. If either DCS
or CSR input is low, the Qn outputs function normally. The RESET input has priority over the DCS and CSR
control and forces the output low. If the DCS control functionality is not desired, the CSR input can be hard-wired
to ground, in which case, the setup-time requirement for DCS is the same as for the other D data inputs.
To ensure defined outputs from the register before a stable clock has been supplied, RESET must be held in
the low state during power up.
terminal assignments for 1:1 register (C0 = 0, C1 = 0)
GKE PACKAGE
(TOP VIEW)
1
A
B
C
2
3
4
5
6
1
2
3
4
5
6
A
D1 (DCKE)
NC
DNU
D2
D15
VCC
GND
Q1 (QCKE)
B
VREF
GND
Q2
Q15
C
D3
D16
D
D4 (DODT)
NC
VCC
GND
VCC
GND
VCC
GND
E
D5
D17
D
F
D6
D18
E
G
NC
RESET
F
H
CLK
D7 (DCS)
G
J
CLK
CSR
H
K
D8
D19
J
L
D9
D20
K
M
D10
D21
L
N
D11
D22
P
D12
D23
R
D13
D24
T
D14
D25
M
N
P
R
T
2
Q3
Q16
Q4 (QODT)
DNU
VCC
GND
Q5
Q17
Q6
Q18
VCC
GND
VCC
GND
C1
C0
Q7 (QCS)
DNU
VCC
GND
VCC
GND
NC
NC
Q8
Q19
VCC
GND
VCC
GND
Q9
Q20
Q10
Q21
VCC
GND
VCC
GND
Q11
Q22
Q12
Q23
VCC
VREF
VCC
VCC
Q13
Q24
Q14
Q25
Each pin name in parentheses indicates the DDR-II DIMM signal name.
NC – No internal connection
DNU – Do not use
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
logic diagram for 1:1 register configuration (positive logic)
RESET
CLK
CLK
VREF
D1 (DCKE)
G2
H1
J1
A3, T3
A1
D
CLK
A5
Q1 (QCKE)
R
D4 (DODT)
D1
D
CLK
D5
Q4 (QODT)
R
D7 (DCS)
H2
D
CLK
H5
Q7 (QCS)
R
CSR
J2
One of 22 Channels
D2
B1
D
CE
CLK
B5
Q2
R
To 21 Other Channels (D3, D5, D6, D8–D25)
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3
SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
GKE PACKAGE
(TOP VIEW)
1
2
3
4
5
terminal assignments for 1:2 register A (C0 = 0, C1 = 1)
1
6
2
3
4
5
6
Q1B
(QCKEB)
A
D1 (DCKE)
NC
VREF
VCC
Q1A
(QCKEA)
B
D2
DNU
GND
GND
Q2A
Q2B
C
D3
DNU
VCC
VCC
Q3A
Q3B
D
D
D4 (DODT)
NC
GND
GND
Q4A
(QODTA)
Q4B
(QODTB)
E
E
D5
DNU
VCC
GND
Q5A
Q5B
A
B
C
F
F
D6
DNU
VCC
GND
Q6A
Q6B
G
G
NC
RESET
VCC
VCC
C1
C0
H
H
CLK
D7 (DCS)
GND
GND
Q7A
(QCSA)
Q7B
(QCSB)
J
CLK
CSR
DNU
VCC
GND
NC
D8
VCC
GND
NC
K
Q8A
Q8B
VCC
GND
VCC
GND
Q9A
Q9B
Q10A
Q10B
VCC
GND
VCC
GND
Q11A
Q11B
Q12A
Q12B
VCC
VREF
VCC
VCC
Q13A
Q13B
Q14A
Q14B
J
K
L
L
D9
DNU
M
M
D10
DNU
N
N
D11
DNU
P
P
D12
DNU
R
R
D13
DNU
T
T
D14
DNU
Each pin name in parentheses indicates the DDR-II DIMM signal name.
NC – No internal connection
DNU – Do not use
4
POST OFFICE BOX 655303
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SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
logic diagram 1:2 register-A configuration (positive logic)
RESET
CLK
CLK
VREF
D1 (DCKE)
G2
H1
J1
A3, T3
A1
A5
D
Q1A (QCKEA)
CLK
A6
R
D4 (DODT)
D1
D5
D
Q1B (QCKEB)
Q4A (QODTA)
CLK
D6
R
D7 (DCS)
H2
H5
D
Q4B (QODTB)
Q7A (QCSA)
CLK
H6
R
CSR
Q7B (QCSB)
J2
One of Eleven Channels
D2
B1
D CE
B5
Q2A
CLK
B6
R
Q2B
To 10 Other Channels (D3, D5, D6, D8–D14)
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5
SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
GKE PACKAGE
(TOP VIEW)
1
A
B
C
D
2
3
4
5
terminal assignments for 1:2 register B (C0 = 1, C1 = 1)
6
1
2
3
4
5
6
A
D1
NC
Q1B
D2
DNU
VCC
GND
Q1A
B
VREF
GND
Q2A
Q2B
C
D3
DNU
NC
VCC
GND
Q3B
D4
VCC
GND
Q3A
D
Q4A
Q4B
E
D5
DNU
D6
DNU
VCC
GND
Q5B
F
VCC
GND
Q5A
E
Q6A
Q6B
F
G
NC
RESET
VCC
VCC
C1
C0
H
CLK
D7 (DCS)
GND
GND
Q7A
(QCSA)
Q7B
(QCSB)
J
CLK
CSR
NC
D8
DNU
VCC
GND
NC
K
VCC
GND
Q8A
Q8B
L
D9
DNU
Q9B
D10
DNU
VCC
GND
Q9A
M
VCC
GND
Q10A
Q10B
N
D11
(DODT)
DNU
VCC
VCC
Q11A
(QODTA)
Q11B
(QODTB)
P
P
D12
DNU
GND
GND
Q12A
Q12B
R
R
D13
DNU
VCC
VCC
Q13A
Q13B
T
D14
(DCKE)
VCC
Q14A
(QCKEA)
Q14B
(QCKEB)
G
H
J
K
L
M
N
T
DNU
VREF
Each pin name in parentheses indicates the DDR-II DIMM signal name.
NC – No internal connection
DNU – Do not use
6
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
logic diagram 1:2 register-B configuration (positive logic)
RESET
CLK
CLK
VREF
D14 (DCKE)
G2
H1
J1
A3, T3
T1
T5
D
Q14A (QCKEA)
CLK
T6
R
D11 (DODT)
N1
N5
D
Q14B (QCKEB)
Q11A (QODTA)
CLK
N6
R
D7 (DCS)
H2
H5
D
Q11B (QODTB)
Q7A (QCSA)
CLK
H6
R
CSR
Q7B (QCSB)
J2
One of Eleven Channels
D1
A1
D CE
A5
Q1A
CLK
A6
R
Q1B
To 10 Other Channels (D2–D6, D8–D10, D12–D13)
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SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
TERMINAL FUNCTIONS
TERMINAL NAME
DESCRIPTION
GND
Ground
Ground input
VCC
Power-supply voltage
1.8 V nominal
VREF
Input reference voltage
0.9 V nominal
CLK
Positive master clock input
Differential input
CLK
Negative master clock input
Differential input
C0, C1
Configuration control inputs – Register A, Register B, 1:1, 1:2 select
LVCMOS inputs
RESET
Asynchronous reset input – resets registers and disables VREF data and clock
differential-input receivers
LVCMOS input
D1–D25
Data inputs – clocked in on the crossing of the rising edge of CLK and the falling edge of
CLK
SSTL_18 inputs
CSR, DCS
Chip select inputs – disables D1-D25† outputs switching when both inputs are high
SSTL_18 inputs
DODT
The outputs of this register bit will not be suspended by the DCS and CSR control.
SSTL_18 input
DCKE
The outputs of this register bit will not be suspended by the DCS and CSR control.
SSTL_18 input
Q1–Q25‡
Data outputs that are suspended by the DCS and CSR control
1.8 V CMOS outputs
QCS
Data output that will not be suspended by the DCS and CSR control
1.8 V CMOS output
QODT
Data output that will not be suspended by the DCS and CSR control
1.8 V CMOS output
QCKE
Data output that will not be suspended by the DCS and CSR control
1.8 V CMOS output
NC
No internal connection
Do not use – inputs are in standby-equivalent mode, and outputs are driven low.
DNU
† Data inputs = D2, D3, D5, D6, D8–D25 when C0 = 0 and C1 = 0
Data inputs = D2, D3 D5, D6, D8–D14 when C0 = 0 and C1 = 1
Data inputs = D1–D6, D8–D10, D12, D13 when C0 = 1 and C1 = 1.
‡ Data outputs = Q2, Q3, Q5, Q6, Q8–Q25 when C0 = 0 and C1 = 0
Data outputs = Q2, Q3 Q5, Q6, Q8–Q14 when C0 = 0 and C1 = 1
Data outputs = Q1–Q6, Q8–Q10, Q12, Q13 when C0 = 1 and C1 = 1.
8
ELECTRICAL
CHARACTERISTICS
POST OFFICE BOX 655303
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SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
FUNCTION TABLES
INPUTS
RESET
DCS
H
H
CLK
OUTPUT
Qn
CSR
CLK
Dn
L
X
↑
↓
L
L
L
X
↑
↓
H
H
H
X
L
↑
↓
L
L
H
X
L
↑
↓
H
H
H
H
H
↑
↓
X
Q0
H
X
X
L or H
L or H
X
Q0
L
X or
floating
X or
floating
X or
floating
X or
floating
X or
floating
L
INPUTS
OUTPUTS
RESET
CLK
CLK
DCKE,
DCS,
DODT
H
↑
↓
H
QCKE,
QCS,
QODT
H
H
↑
↓
L
L
H
L or H
L or H
X
Q0
L
X or
floating
X or
floating
X or
floating
L
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 2.5 V
Input voltage range, VI (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 2.5 V
Output voltage range, VO (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Input clamp current, IIK (VI < 0 or VI > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA
Output clamp current, IOK (VO < 0 or VO > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA
Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA
Continuous current through each VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA
Package thermal impedance, θJA (see Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36°C/W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. This value is limited to 2.5 V maximum.
3. The package thermal impedance is calculated in accordance with JESD 51-7.
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SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
recommended operating conditions (see Note 4)
MIN
NOM
1.7
MAX
VCC
VREF
Supply voltage
VI
VIH
Input voltage
AC high-level input voltage
Data inputs, CSR
VIL
VIH
AC low-level input voltage
Data inputs, CSR
DC high-level input voltage
Data inputs, CSR
VIL
VIH
DC low-level input voltage
Data inputs, CSR
High-level input voltage
RESET, Cn
VIL
VICR
Low-level input voltage
RESET, Cn
Common-mode input voltage range
CLK, CLK
0.675
VI(PP)
IOH
Peak-to-peak input voltage
CLK, CLK
600
High-level output current
–8
IOL
TA
Low-level output current
8
0.49 × VCC
Reference voltage
0
0.5 × VCC
V
0.51 × VCC
V
VCC
VREF+250 mV
VREF+125 mV
V
V
VREF–125 mV
0.65 × VCC
V
V
0.35 × VCC
0
V
V
VREF–250 mV
Operating free-air temperature
UNIT
1.9
1.125
V
V
mV
70
mA
_C
NOTE 4: The RESET and Cn inputs of the device must be held at valid logic voltage levels (not floating) to ensure proper device operation. The
differential inputs must not be floating unless RESET is low. Refer to the TI application report, Implications of Slow or Floating CMOS
Inputs, literature number SCBA004.
10
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SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VOH
IOH = –100 µA
IOH = –6 mA
VOL
IOL = 100 µA
IOL = 6 mA
II
ICC
ICCD
All inputs‡
VI = VCC or GND
RESET = GND
Static operating
RESET = VCC, VI = VIH(AC) or VIL(AC)
Dynamic operating –
clock only
RESET = VCC, VI = VIH(AC) or VIL(AC),
CLK and CLK switching 50% duty cycle
Dynamic operating –
per each data input,
1:2 configuration
Chip-select-enabled
low-power active
mode – clock only
ICCDLP
Chip-select-enabled
low-power active
mode –
1:1 configuration
Chip-select-enabled
low-power active
mode –
1:2 configuration
Data inputs, CSR
Ci
1.7 V
Static standby
Dynamic operating –
per each data input,
1:1 configuration
CLK, CLK
VCC
1.7 V to 1.9 V
MIN
TYP†
1.7 V to 1.9 V
0.2
1.7 V
0.5
IO = 0
±5
19V
1.9
RESET = VCC, VI = VIH(AC) or VIL(AC),
CLK a
and
CLK switching
C
dC
s c g 50% duty
du y cycle,
cyc e,
One data input switching at one-half clock
frequency, 50% duty cycle
µA
mA
µA/
MHz
µA/
clock
MHz/
D input
36
RESET = VCC, VI = VIH(AC) or VIL(AC),
CLK and CLK switching 50% duty cycle
µA/
MHz
27
IO = 0
VI = VREF ± 250 mV
VICR = 0.9 V, VI(PP) = 600 mV
2
1.8 V
µA/
clock
MHz/
D input
2
2.5
1.8 V
RESET
VI = VCC or GND
† All typical values are at VCC = 1.8 V, TA = 25°C.
‡ Each VREF pin (A3 or T3) should be tested independently, with the other (untested) pin open.
3
2
µA
40
18
1.8 V
V
100
28
IO = 0
UNIT
V
1.9 V
RESET = VCC, VI = VIH(AC) or VIL(AC),
CLK a
and
CLK switching
C
dC
s c g 50% duty
du y cycle,
cyc e,
One data input switching at one-half clock
frequency, 50% duty cycle
MAX
VCC–0.2
1.2
3.5
3
pF
2.5
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (see Figure 1 and Note 5)
MIN
fclock
tw
Clock frequency
tact
tinact
Differential inputs active time (see Note 6)
tsu
th
Pulse duration, CLK, CLK high or low
Hold time
UNIT
500
MHz
1
Differential inputs inactive time (see Note 7)
Setup time
MAX
DCS before CLK↑, CLK↓, CSR high; CSR before CLK↑, CLK↓, DCS high
0.7
DCS before CLK↑, CLK↓, CSR low
0.5
DODT, DCKE, and Data before CLK↑, CLK↓
0.5
DCS, DODT, DCKE, and Data after CLK↑, CLK↓
0.5
ns
10
ns
15
ns
ns
ns
NOTES: 5. All input slew rates are 1 V/ns ±20%.
6. VREF must be held at a valid input level and data inputs must be held low for a minimum time of tact max, after RESET is taken high.
7. VREF, data, and clock inputs must be held at valid voltage levels (not floating) for a minimum time of tinact max, after RESET is taken
low.
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11
SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figure 1)
FROM
(INPUT)
PARAMETER
fmax
tpdm†
tpdmss†
tRPHL†
TO
(OUTPUT)
VCC = 1.8 V
± 0.1 V
MIN
500
1.4
UNIT
MAX
MHz
CLK and CLK
Q
2.5
ns
CLK and CLK
Q
2.7
ns
RESET
Q
3
ns
† Includes 350-ps test-load transmission-line delay
output slew rates over recommended operating free-air temperature range (unless otherwise
noted) (see Figure 2)
PARAMETER
FROM
TO
MIN
MAX
UNIT
dV/dt_r
20%
80%
1.9
4.9
V/ns
dV/dt_f
80%
20%
1.9
4.9
V/ns
1
V/ns
dV/dt_Ƥ
20% or 80%
§ Difference between dV/dt_r (rising edge rate) and dV/dt_f (falling edge rate)
12
VCC = 1.8 V
± 0.1 V
POST OFFICE BOX 655303
80% or 20%
• DALLAS, TEXAS 75265
SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
PARAMETER MEASUREMENT INFORMATION
VCC
ZO = 50 Ω,
tD = 350 ps
Test
Point
DUT
RL = 1 kΩ
CLK
RL = 100 Ω
Clock Inputs
CL = 30 pF
(see Note A)
ZO = 50 Ω,
tD = 350 ps
CLK
ZO = 50 Ω,
tD = 350 ps
Output
Test Point
Out
Test
Point
RL = 1 kΩ
LOAD CIRCUIT
tw
VIH
VREF
Input
VIL
VCC
LVCMOS
RESET
Input
VCC/2
VCC/2
VOLTAGE WAVEFORMS
PULSE DURATION
0V
tinact
ICC
(see
Note B)
VREF
VI(PP)
tact
90%
10%
ICC (operating)
Timing
Inputs
ICC (standby)
VOLTAGE AND CURRENT WAVEFORMS
INPUTS ACTIVE AND INACTIVE TIMES
VICR
VICR
tPLH
tPHL
VOH
Output
VTT
VTT
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VI(PP)
Timing
Inputs
tsu
VIH
LVCMOS
RESET
Input
VICR
VCC/2
VIL
tPHL
th
VOH
VIH
Input
VREF
Output
VREF
VTT
VOL
VIL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
NOTES: A. CL includes probe and jig capacitance.
B. ICC tested with clock and data inputs held at VCC or GND, and IO = 0 mA.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω,
input slew rate = 1 V/ns ±20% (unless otherwise noted).
D. The outputs are measured one at a time with one transition per measurement.
E. VREF = VCC/2
F. VIH = VREF + 250 mV (ac voltage levels) for differential inputs. VIH = VCC for LVCMOS input.
G. VIL = VREF – 250 mV (ac voltage levels) for differential inputs. VIL = GND for LVCMOS input.
H. VI(PP) = 600 mV
I. tPLH and tPHL are the same as tpd.
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
13
SN74SSTU32864
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES434 – MARCH 2003
PARAMETER MEASUREMENT INFORMATION
VCC
DUT
RL = 50 Ω
Test Point
Out
VOH
80%
CL = 5 pF
(see Note A)
Output
20%
VOL
dV_f
dt_f
LOAD CIRCUIT
HIGH-TO-LOW SLEW-RATE MEASUREMENT
VOLTAGE WAVEFORMS
HIGH-TO-LOW SLEW-RATE MEASUREMENT
DUT
dt_r
dV_r
Test Point
Out
CL = 5 pF
(see Note A)
RL = 50 Ω
LOAD CIRCUIT
LOW-TO-HIGH SLEW-RATE MEASUREMENT
20%
Figure 2. Output Slew-Rate Measurement Information
POST OFFICE BOX 655303
VOH
VOL
VOLTAGE WAVEFORMS
LOW-TO-HIGH SLEW-RATE MEASUREMENT
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics:
PRR ≤ 10 MHz, ZO = 50 Ω, input slew rate = 1 V/ns ± 20% (unless otherwise specified).
14
80%
Output
• DALLAS, TEXAS 75265
PACKAGE OPTION ADDENDUM
www.ti.com
30-Mar-2005
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
SN74SSTU32864GKER
ACTIVE
LFBGA
GKE
96
1000
SN74SSTU32864ZKER
ACTIVE
LFBGA
ZKE
96
1000 Green (RoHS &
no Sb/Br)
TBD
Lead/Ball Finish
MSL Peak Temp (3)
/
Level-3-220C-168 HR
/
Level-3-250C-1WEEK
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS) or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
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Addendum-Page 1
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