ETC SW640

SAMWIN
SW640
General Description
Features
N-Channel MOSFET
BVDSS (Minimum)
RDS(ON) (Maximum)
ID
Qg (Typical)
PD (@TC=25 )
This power MOSFET is produced in SAMWIN with
advanced VDMOS process, planar stripe.This
technology enable power MOSFET to have better
characteristics, such as fast switching time, low on
resistance, low gate charge and especially excellent
avalanche characteristics. It is mainly suitable for
half bridge or full bridge resonant topology like a
electronic ballast, and also low power switching
mode power appliances.
: 200 V
: 0.18 ohm
: 18A
: 40 nc
: 139 W
D
G
S
Absolute Maximum Ratings
Symbol
VDSS
Parameter
Drain to Source Voltage
Continuous Drain Current (@Tc=25
ID
IDM
)
Continuous Drain Current (@Tc=100
)
Drain Current Pulsed
(Note 1)
Value
Units
200
V
18
A
11.4
A
72
A
VGS
Gate to Source Voltage
EAS
Single Pulsed Avalanche Energy
(Note 2)
250
mJ
EAR
Repetitive Avalanche Energy
(Note 1)
13.9
mJ
Peak Diode Recovery dv/dt
(Note 3)
5.5
V/ns
139
W
dv/dt
Total Power Dissipation (@Tc=25
PD
TSTG,TJ
TL
30
)
Derating Factor above 25
V
1.10
Operating junction temperature &Storage temperature
W/
-55~+150
Maximum Lead Temperature for soldering purpose, 1/8 from Case
for 5 seconds.
300
Thermal Characteristics
Value
Symbol
Parameter
Units
Min
Typ
Max
R
JC
Thermal Resistance, Junction-to-Case
-
-
0.9
/W
R
CS
Thermal Resistance, Case-to-Sink
-
-
0.5
/W
R
JA
Thermal Resistance, Junction-to-Ambient
-
-
62.5
/W
1/6
REV0.2
05.6.9
SAMWIN
Electrical Characteristics
SW640
(Tc=25
unless otherwise noted)
Value
Symbol
Parameter
Test Conditions
Units
Min
Typ
Max
200
-
-
-
0.2
-
-
-
1
uA
Off Characteristics
BVDSS
Drain- Source Breakdown Voltage
VGS=0V,ID=250uA
BVDSS/
Tj
Breakdown Voltage Temperature
coefficient
ID=250uA,referenced to 25
V
V/
VDS=200V, VGS=0V
IDSS
IGSS
Drain-Source Leakage Current
VDS=160V, Tc=125
Gate-Source Leakage Current
VGS=30V,VDS=0V
-
-
100
nA
Gate-Source Leakage Reverse
VGS=-30V, VDS=0V
-
-
-100
nA
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS=VGS,ID=250uA
2.0
-
4.0
V
RDS(ON)
Static Drain-Source On-state
Resistance
VGS=10V,ID=3.25A
-
0.15
0.18
ohm
-
1350
1750
-
180
240
-
45
60
-
25
50
-
80
230
-
150
300
-
70
200
-
40
55
-
6
-
-
21
-
Min.
Typ.
Max.
Integral Reverse
p-n Junction Diode
in the MOSFET
-
-
18
-
-
72
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VGS=0V,VDS=25V, f=1MHz
pF
Dynamic Characteristics
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
Turn-on Delay Time
Rise Time
Turn-off Delay Time
VDD=200V,ID=6.5A
RG=50ohm
(Note4,5)
Fall Time
Total Gate Charge
Gate-Source Charge
VDS=320V,VGS=10V, ID=6.5A
(Note4,5)
Gate-Drain Charge (Miller Charge)
n
s
nc
Source-Drain Diode Ratings and Characteristics
Symbol
Parameter
Test Conditions
Unit.
IS
Continuous Source Current
ISM
Pulsed Source Current
VSD
Diode Forward Voltage
IS=6.5A,VGS=0V
-
-
1.5
V
trr
Reverse Recovery Time
-
195
-
ns
Qrr
Reverse Recovery Charge
IS=6.5A,VGS=0V,
dIF/dt=100A/us
-
1.47
-
uc
NOTES
1. Repeativity rating: pulse width limited by junction temperature
2. L=18.6mH,IAS=18A,VDD=50V,RG=0ohm, Starting TJ=25
3. ISD 18A,di/dt 100A/us,VDD BVDSS, Starting TJ=25
4. Pulse Test: Pulse Width 300us,Duty Cycle 2%
5. Essentially independent of operating temperature.
REV0.2
A
2/6
05.6.9
SW640
VGS
top:10V
9V
8V
7V
6V
5.5V
5V
bottom:5.0V
10
o
25 C
ID,Drain Current [A]
ID,Drain Current [A]
SAMWIN
1
10
o
150 C
1
∗ Note:
∗ Note:
1.250us pulse test
1.VDS=50V
2.250us pulse test.
2.TC=25oC
0.1
0.1
0.1
1
2
10
4
6
8
10
VGS, Gate-Source Voltage [V]
VDS,Drain-to-Source voltage [V]
Fig 1. On-State Characteristics
Fig 2. Transfer Characteristics
IDR,Reverse Drain Current[A]
RDS(ON)
Drain-Source On-Resistance[ohm]
1.0
0.8
VGS=20V
0.6
VGS=10V
0.4
10
o
150 C
1
∗ Note:
0.2
1.vGS=0v
o
∗ Note:TJ=25 C
2.250us test
0.1
0.2
0.0
0
10
20
30
40
50
60
0.4
0.6
Fig 3. On Resistance Variation vs.
Drain Current and Gate Voltage
1.0
1.2
1.4
1.6
1.8
2.0
Fig 4. On State Current vs.
Allowable Case Temperature
4000
12
3750
Ciss = Cgs+Cgd(Cds=shorted)
3500
Coss= Cds+Cgd
3250
VDS=160V
10
Crss = Cgd
VDS=100V
VGS,Gate-Source Voltage [V]
3000
2750
2500
Ciss
2250
2000
Coss
1750
1500
Crss
1250
1000
750
∗ Note:
500
1.VGS=0V
250
0.8
VSD,Source-Drain Voltage[V]
ID, Drain Current[A]
Capacitance [pF]
o
25 C
2.f=1MHz.
0
0.1
VDS=40V
8
6
4
2
Note:ID=18A
0
1
0
10
10
20
30
40
50
QG,Total Gate Charge [nC]
VDS,Drain-Source Voltage [V]
Fig 6. Gate Charge Characteristics
Fig 5. Capacitance Characteristics
(Non-Repetitve)
3/6
REV0.2
05.6.9
SAMWIN
SW640
3.0
2.5
RDs(on)(Normalized)
1.1
1.0
0.9
∗ Note:
1.VGS=0V
Drain-Source On-Resistance
BVDSS[Normalized]
Drain-Source Breakdown Voltage
1.2
2.0
1.5
1.0
∗Note:
0.5
1.VGS=10V
2.ID=250uA
0.8
-100
-50
0
50
100
150
2.ID=9A
0.0
-100
200
-50
0
50
100
150
200
o
TJ,Junction Temperature[ C]
o
TJ,Junction Temperatur [ C]
Fig 7. Breakdown Voltage Variation vs.
Junction Temperature
Fig 8. On-Resistance Variation vs.
Junction Temperature
20
Operation In This Area
Limted By RDS(ON)
2
16
10us
100us
1
10
ID, Drain Current[A]
ID, Drain Current[A]
10
1ms
10ms
0
10
∗Note:
1.Tc=25°C
2.Tj=150°C
3.Single Pulse
-1
10
0
1
10
8
4
0
25
2
10
12
10
50
75
VD,Drain-Source Voltage[V]
100
125
150
o
Tc,Case Temperature [ C]
Fig9. Maximum Safe Operating
Fig 10. Maximum Drain Current
Vs. Case Temperature
1
0 .2
0 .1
0 .1
0 .0 5
0 .0 2
0 .0 1
θJC
Z
(t),Thermal Response
D = 0 .5
∗ N o te :
1 .Z
s in g le p u ls e
0 .0 1
1 E -5
1 E -4
o
Θ JC
(t)= 0 .9 C /w M a x
2 .D u ty F a c to r ,D = t1 /t2
3 .T j- T c = P D M * Z Θ J C ( t)
1 E -3
0 .0 1
0 .1
1
10
t1 ,S q u a r e W a v e P u ls e D u r a tio n ( s e c )
Fig 11. Transient Thermal Response Curve
4/6
REV0.2
05.6.9
SAMWIN
SW640
VGS
Same Type
as DUT
50K
Qg
10V
200nF
300nF
Qgd
Qgs
VDS
VGS
DUT
1mA
Charge
Fig 12. Gate Charge test Circuit & Waveforms
RL
VDS
VDD
(0.5 rated VDS)
10V
Pulse
Generator
RG
DUT
VDS
Vin
90%
10%
tf
td(on) tr
ton
td(off)
toff
Fig 13. Switching test Circuit & Waveforms
L
1
BVDSS
EAS= --- LLIAS2--------------2
BVDSS-VDD
VDS
VDD
BVDSS
IAS
RG
VDD
DUT
ID(t)
VDS(t)
10V
tp
Time
Fig 14. Unclamped Inductive Switching test Circuit & Waveforms
5/6
REV0.2
05.6.9
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