IXYS IXFB100N50P

PolarHVTM HiPerFET
Power MOSFET
IXFB 100N50P
VDSS
ID25
RDS(on)
trr
N-Channel Enhancement Mode
Avalanche Rated
Fast Intrinsic Diode
Symbol
Test Conditions
VDSS
TJ = 25° C to 150° C
500
V
VDGR
TJ = 25° C to 150° C; RGS = 1 MΩ
500
V
VGSS
Continuous
±30
V
VGSM
Transient
±40
V
ID25
IDRMS
IDM
TC = 25° C
External lead current limit
TC = 25° C, pulse width limited by TJM
100
75
250
A
A
A
IAR
TC = 25° C
100
A
EAR
TC = 25° C
100
mJ
EAS
TC = 25° C
5
J
dv/dt
IS ≤ IDM, di/dt ≤ 100 A/µs, VDD ≤ VDSS,
TJ ≤150° C, RG = 2 Ω
20
V/ns
PD
Maximum Ratings
1250
W
-55 ... +150
150
-55 ... +150
°C
°C
°C
300
260
°C
°C
30..120/7.5...2.7
N/lb
TJ
TJM
Tstg
TL
TSOLD
1.6 mm (0.062 in.) from case for 10 s
Plastic body for 10 s
FC
Mounting force
PLUS264TM (IXFB)
G
Weight
10
g
Characteristic Values
Min. Typ.
Max.
BVDSS
VGS = 0 V, ID = 3 mA
500
VGS(th)
VDS = VGS, ID = 8 mA
3.0
IGSS
VGS = ±30 VDC, VDS = 0
IDSS
VDS = VDSS
VGS = 0 V
RDS(on)
VGS = 10 V, ID = 0.5 ID25, Note 1
© 2006 IXYS All rights reserved
TJ = 125° C
S
D = Drain
TAB = Drain
Features
l
l
l
International standard packages
Fast recovery diode
Unclamped Inductive Switching (UIS)
rated
Low package inductance
- easy to drive and to protect
Advantages
l
l
l
Symbol
Test Conditions
(TJ = 25° C, unless otherwise specified)
(TAB)
D
G = Gate
S = Source
l
TC = 25° C
= 500 V
= 100 A
≤ 49 mΩ
Ω
≤ 200 ns
Plus 264TM package for clip or spring
Space savings
High power density
V
5.0
V
±200
nA
25
2000
µA
µA
49
mΩ
DS99496E(01/06)
IXFB 100N50P
Symbol
Test Conditions
Characteristic Values
(TJ = 25° C, unless otherwise specified)
Min. Typ. Max.
gfs
VDS = 20 V; ID = 0.5 ID25, Note 1
50
80
S
20
nF
1700
pF
140
pF
36
ns
29
ns
110
ns
26
ns
240
nC
96
nC
78
nC
Ciss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Coss
Crss
td(on)
tr
VGS = 10 V, VDS = 0.5 VDSS, ID =0.5 ID25
td(off)
RG = 1 Ω (External)
tf
Qg(on)
Qgs
VGS = 10 V, VDS = 0.5 VDSS, ID = 0.5 ID25
Qgd
PLUS264TM (IXFB) Outline
0.10 ° C/W
RthJC
° C/W
0.13
RthCS
Source-Drain Diode
Characteristic Values
(TJ = 25° C, unless otherwise specified)
Min. Typ. Max.
Symbol
Test Conditions
IS
VGS = 0 V
100
A
ISM
Repetitive
250
A
VSD
IF = IS, VGS = 0 V, Note 1
1.5
V
trr
IF = 25A, -di/dt = 100 A/µs
200
ns
QRM
IRM
VR = 100V
0.6
6.0
µC
A
Notes:
1. Pulse test, t ≤300 µs, duty cycle d≤ 2 %
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by 4,835,592
one or moreof the following U.S. patents: 4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1
6,534,343
6,583,505
6,683,344
6,710,405B2
6,710,463
6,727,585
6,759,692
6,771,478 B2
IXFB 100N50P
Fig. 1. Output Characteristics
@ 25ºC
Fig. 2. Extended Output Characteristics
@ 25ºC
100
220
V GS = 10V
8V
90
180
80
160
70
7V
60
I D - Amperes
I D - Amperes
V GS = 10V
9V
200
50
40
6V
30
8V
140
120
100
7V
80
60
20
40
10
20
5V
0
6V
0
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
5.5
0
2
4
6
8
100
18
20
22
24
26
2.5
R DS(on) - Normalized
I D - Amperes
16
V GS = 10V
2.8
70
60
50
6V
40
30
2.2
1.9
I D = 100A
1.6
I D = 50A
1.3
1
20
5V
0.7
10
0.4
0
0
1
2
3
4
5
6
7
8
9
10
-50
11
-25
0
25
50
75
100
125
150
125
150
T J - Degrees Centigrade
V DS - Volts
Fig. 5. R DS(on) Normalized to ID = 50A Value
vs. Drain Current
Fig. 6. Maximum Drain Current v s.
Case Temperature
90
3
V GS = 10V
2.8
External Lead Current Limit
80
TJ = 125ºC
2.6
70
2.4
2.2
I D - Amperes
R DS(on) - Normalized
14
3.1
V GS = 10V
8V
7V
80
12
Fig. 4. R DS(on) Normalized to ID = 50A Value
v s. Junction Temperature
Fig. 3. Output Characteristics
@ 125ºC
90
10
V DS - Volts
V DS - Volts
2
1.8
1.6
60
50
40
30
1.4
TJ = 25ºC
20
1.2
10
1
0.8
0
0
20
40
60
80
100
120
I D - Amperes
© 2006 IXYS All rights reserved
140
160
180
200
220
-50
-25
0
25
50
75
T J - Degrees Centigrade
100
IXFB 100N50P
Fig. 8. Transconductance
Fig. 7. Input Admittance
160
150
135
140
120
120
g f s - Siemens
I D - Amperes
105
100
TJ = 125ºC
25ºC
- 40ºC
80
60
TJ = - 40ºC
25ºC
125ºC
90
75
60
45
40
30
20
15
0
0
4
4.5
5
5.5
6
6.5
7
7.5
0
20
40
60
V GS - Volts
Fig. 9. Forward Voltage Drop of
Intrinsic Diode
100
120
140
160
180
225
250
Fig. 10. Gate Charge
300
10
V DS = 250V
9
250
I D = 50A
8
I G = 10mA
7
200
V GS - Volts
I S - Amperes
80
I D - Amperes
150
100
TJ = 125ºC
6
5
4
3
2
TJ = 25ºC
50
1
0
0
0.4
0.6
0.8
1
1.2
1.4
1.6
0
25
50
V SD - Volts
75
100
125
150
175
200
Q G - NanoCoulombs
Fig. 12. Forward-Bias Safe Operating Area
Fig. 11. Capacitance
100,000
1,000
RDS(on) Limit
C iss
25µs
10,000
I D - Amperes
Capacitance - PicoFarads
f = 1 MHz
C oss
1,000
100µs
100
1ms
10ms
10
DC
TJ = 150ºC
C rss
TC = 25ºC
100
1
0
5
10
15
20
25
30
35
40
V DS - Volts
IXYS reserves the right to change limits, test conditions, and dimensions.
10
100
V DS - Volts
1000
IXFB 100N50P
Fig. 13. Maximum Transient Thermal Resistance
R (th)JC - ºC / W
1.000
0.100
0.010
0.001
0.0001
0.001
0.01
0.1
Pulse W idth - Seconds
© 2006 IXYS All rights reserved
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