AOSMD AO4478L

AO4478L
N-Channel Enhancement Mode Field Effect Transistor
General Description
Features
The AO4478L uses advanced trench technology to
provide excellent RDS(ON), low gate charge. This
device is suitable for use as general puspose, PWM and
a load switch applications.
-RoHS Compliant
-Halogen Free
VDS (V) = 30V
ID = 9A (VGS = 10V)
RDS(ON) <19mΩ (VGS = 10V)
RDS(ON) <26mΩ (VGS = 4.5V)
100% UIS Tested!
100% Rg Tested!
SOIC-8
D
D
G
G
S
S
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Symbol
VDS
Drain-Source Voltage
VGS
Gate-Source Voltage
TA=25°C
Continuous Drain
Current
Maximum
30
Units
V
±25
V
9.0
ID
IDM
7.0
Avalanche Current C
Repetitive avalanche energy L=0.1mHC
TA=25°C
B
Power Dissipation
TA=70°C
Iar
Ear
17
14
3.1
Junction and Storage Temperature Range
TJ, TSTG
Pulsed Drain Current
TA=70°C
C
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
AD
Maximum Junction-to-Ambient
C
Maximum Junction-to-Lead
Alpha & Omega Semiconductor, Ltd.
PD
mJ
W
2.0
-55 to 150
Symbol
t ≤ 10s
Steady-State
Steady-State
A
60
RθJA
RθJL
Typ
31
59
16
°C
Max
40
75
24
Units
°C/W
°C/W
°C/W
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AO4478L
Electrical Characteristics (T J=25°C unless otherwise noted)
Parameter
Symbol
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
Conditions
Min
ID=250µA, VGS=0V
IGSS
Gate-Body leakage current
VDS=0V, VGS= ±25V
VGS(th)
Gate Threshold Voltage
VDS=VGS ID=250µA
1
ID(ON)
On state drain current
VGS=10V, VDS=5V
60
RDS(ON)
Static Drain-Source On-Resistance
VGS=10V, ID=9A
Gate resistance
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
Qg(4.5V) Total Gate Charge
Qgs
Gate Source Charge
Qgd
tD(on)
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
Turn-Off Fall Time
2
V
A
19
VGS=4.5V, ID=8A
21
26
VDS=5V, ID=10A
24
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Rg
nA
30
Diode Forward Voltage
IS=1A,VGS=0V
Maximum Body-Diode Continuous Current
Reverse Transfer Capacitance
1.6
0.70
466
VGS=0V, VDS=15V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
VGS=10V, VDS=15V, ID=9A
uA
100
16
Forward Transconductance
Output Capacitance
5
25
TJ=125°C
VSD
Crss
V
TJ=55°C
gFS
Units
1
Zero Gate Voltage Drain Current
Coss
Max
30
VDS=30V, VGS=0V
IDSS
IS
Typ
mΩ
mΩ
S
1
V
4
A
560
pF
90
pF
61
pF
3.7
5.6
Ω
9.3
11
nC
4.3
5.2
nC
1
nC
Gate Drain Charge
2.3
nC
Turn-On DelayTime
5
ns
VGS=10V, VDS=15V, RL=1.65Ω,
RGEN=3Ω
8
ns
20
ns
5
ns
trr
Body Diode Reverse Recovery Time
IF=9A, dI/dt=500A/µs
7.5
Qrr
Body Diode Reverse Recovery Charge IF=9A, dI/dt=500A/µs
9.8
9
ns
nC
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
value in any given application depends on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.
C. Ratings are based on low frequency and duty cycles to keep initialT
J=25°C.
D. The RθJA is the sum of the thermal impedence from junction to lead RθJL and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
2
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in
FR-4 board with
2oz. Copper, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
Rev0: Sep 2008
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Alpha & Omega Semiconductor, Ltd.
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AO4478L
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
30
70
7V
60
25
10V
50
4.5V
20
40
ID(A)
ID (A)
VDS= 5V
4V
30
15
125°C
10
20
VGS= 3V
10
25°C
5
2.5V
0
0
0
1
2
3
4
5
0
1
2.0
35
1.8
RDS(ON) (mΩ)
Normalized On-Resistance
40
VGS=4.5V
25
20
15
VGS=10V
10
5
0
5
10
15
20
1.6
5
1.2
VGS=10V
ID=9A
1.0
0.8
0.6
25
0
25
50
75
100
125
150
175
Temperature (°C)
Figure 4: On-Resistance vs. Junction
Temperature(Note E)
1E+01
ID=9A
60
1E+00
50
1E-01
IS (A)
RDS(ON) (mΩ)
4
VGS=4.5V
ID=8A
1.4
ID (A)
Figure 3: On-Resistance vs. Drain Current and
Gate Voltage(Note E)
70
3
VGS(Volts)
Figure 2: Transfer Characteristics(Note E)
VDS (Volts)
Figure 1: On-Region Characteristics(Note E)
30
2
40
125°C
1E-02
25°C
125°C
30
1E-03
25°C
20
1E-04
10
2
3
4
5
6
7
8
9
VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source
Voltage(Note E)
Alpha & Omega Semiconductor, Ltd.
10
1E-05
0.0
0.2
0.4
0.6
0.8
1.0
VSD (Volts)
Figure 6: Body-Diode Characteristics(Note E)
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AO4478L
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
800
10
VGS (Volts)
600
Capacitance (pF)
VDS=15V
ID=9A
8
6
4
400
0
2
4
6
8
Coss
200
2
0
Ciss
Crss
0
10
0
Qg (nC)
Figure 7: Gate-Charge Characteristics
TA=25°C
20
25
30
TA=25°C
TA=150°C
TA=150°C
RDS(ON) limited
100
ID (Amps)
ID(A), Peak Avalanche Current
30
15
1000
50
40
10
VDS (Volts)
Figure 8: Capacitance Characteristics
70
60
5
TA=100°C
20
TA=125°C
10µs
10
100µs
1
1ms
10ms
100ms
TJ(Max)=150°C
TA=25°C
0.1
10
10s
DC
0.01
0
0.000001
0.1
0.00001
0.0001
0.001
Time in avalanche, tA (s)
Figure 9: Single Pulse Avalanche capability
(Note C)
1
10
100
VDS (Volts)
Figure 10: Maximum Forward Biased
Safe Operating Area (Note F)
1000
Power (W)
TJ(Max)=150°C
TA=25°C
100
10
1
0.00001
0.001
0.1
10
1000
Pulse Width (s)
Figure 11: Single Pulse Power Rating Junction-to-Ambient (Note F)
Alpha & Omega Semiconductor, Ltd.
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AO4478L
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
ZθJA Normalized Transient
Thermal Resistance
10
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
RθJA=75°C/W
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
1
0.1
PD
0.01
Ton
Single Pulse
0.001
0.00001
0.0001
0.001
0.01
0.1
1
T
10
100
1000
Pulse Width (s)
Figure 12: Normalized Maximum Transient Thermal Impedance (Note F)
Alpha & Omega Semiconductor, Ltd.
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AOD4478L
Gate Charge Test Circuit & W aveform
Vgs
Qg
10V
+
VDC
+ Vds
-
VDC
DUT
Qgs
Qgd
-
Vgs
Ig
Charge
Resistive Switching Test Circuit & Waveforms
RL
Vds
Vds
Vgs
Rg
90%
+ Vdd
DUT
VDC
-
10%
Vgs
Vgs
t d(on)
tr
t d(off)
t on
tf
t off
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
L
2
E AR= 1/2 LIAR
Vds
BVDSS
Vds
Id
+ Vdd
Vgs
Vgs
VDC
Rg
-
I AR
Id
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q rr = - Idt
Vds +
DUT
Vds -
Isd
Vgs
Isd
L
Vgs
Ig
Alpha & Omega Semiconductor, Ltd.
+ Vdd
VDC
-
IF
t rr
dI/dt
I RM
Vds
Vdd
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