AON6405L P-Channel Enhancement Mode Field Effect Transistor General Description Features The AON6405L combines advanced trench MOSFET technology with a low resistance package to provide extremely low RDS(ON).This device is ideal for load switch and battery protection applications. VDS (V) = -30V (VGS = -10V) ID = -30A RDS(ON) < 7mΩ (VGS = -10V) RDS(ON) < 8mΩ (VGS = -4.5V) ESD Protected! 100% UIS Tested! -RoHS Compliant -Halogen Free D Top View Fits SOIC8 footprint ! S D S D S D G D Rg G S DFN5X6 Absolute Maximum Ratings TA=25°C unless otherwise noted Parameter Symbol VDS Drain-Source Voltage VGS Gate-Source Voltage Continuous Drain G Current TC=25°C Pulsed Drain Current C Avalanche Current C TC=100°C Power Dissipation ID IDM B Power Dissipation A ±20 V A -23 -160 -15 TA=70°C Repetitive avalanche energy L=0.1mH Units V -30 TA=25°C Continuous Drain Current Maximum -30 C TC=25°C TA=25°C Junction and Storage Temperature Range Alpha & Omega Semiconductor, Ltd. -54 A EAR 146 mJ 83 2.5 W 1.6 TJ, TSTG °C -55 to 150 Symbol t ≤ 10s Steady-State Steady-State W 33 PDSM TA=70°C Thermal Characteristics Parameter A Maximum Junction-to-Ambient Maximum Junction-to-Ambient AD Maximum Junction-to-Case -12 PD TC=100°C A IDSM IAR RθJA RθJC Typ 14.2 42 1.2 Max 17 50 1.5 Units °C/W °C/W °C/W www.aosmd.com AON6405L Electrical Characteristics (TJ=25°C unless otherwise noted) Symbol Parameter STATIC PARAMETERS BVDSS Drain-Source Breakdown Voltage Conditions Min ID=-250µA, VGS=0V -30 -1 Zero Gate Voltage Drain Current IGSS Gate-Body leakage current VDS=0V, VGS= ±16V Gate Threshold Voltage On state drain current VDS=VGS ID=-250µA -0.8 VGS=-10V, VDS=-5V -160 ID(ON) TJ=55°C VGS=-10V, ID=-20A RDS(ON) TJ=125°C Static Drain-Source On-Resistance VGS=-4.5V, ID=-20A gFS Forward Transconductance VSD IS=-1A,VGS=0V Diode Forward Voltage Maximum Body-Diode Continuous Current IS VDS=-5V, ID=-20A DYNAMIC PARAMETERS Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance Rg Gate resistance SWITCHING PARAMETERS Qg(-10V) Total Gate Charge Qg(-4.5V) Total Gate Charge Qgs Gate Source Charge Qgd Gate Drain Charge tD(on) Turn-On DelayTime tr Turn-On Rise Time tD(off) Turn-Off DelayTime tf Turn-Off Fall Time Max -5 VGS=0V, VDS=0V, f=1MHz VGS=-10V, VDS=-15V, ID=-20A VGS=-10V, VDS=-15V, RL=0.75Ω, RGEN=3Ω µA ±10 µA -1.2 -1.6 V 5.5 7 7 8.5 6.1 8 mΩ -1 V -50 A 5500 pF A 70 -0.65 4580 VGS=0V, VDS=-15V, f=1MHz Units V VDS=-30V, VGS=0V IDSS VGS(th) Typ mΩ S 755 pF 564 pF 160 210 Ω 87 105 nC 41 nC 12.8 nC 17 nC 180 ns 260 1.2 ns µs 9.7 µs trr Body Diode Reverse Recovery Time IF=-20A, dI/dt=300A/µs 32 Qrr Body Diode Reverse Recovery Charge IF=-20A, dI/dt=300A/µs 77 40 ns nC A: The value of R θJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T A =25°C. The Power dissipation P DSM is based on R θJA and the maximum allowed junction temperature of 150°C. The value in any given application depends on the user's specific board design. B. The power dissipation P D is based on T J(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation limit for cases where additional heatsinking is used. C. Repetitive rating, pulse width limited by junction temperature T J(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep initial T J =25°C. D. The RθJA is the sum of the thermal impedence from junction to case R θJC and case to ambient. E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max. F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of T J(MAX)=150°C. The SOA curve provides a single pulse rating. G. The maximum current rating is limited by bond-wires. H. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. Rev 0: July 2008 COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN, FUNCTIONS AND RELIABILITY WITHOUT NOTICE. Alpha & Omega Semiconductor, Ltd. www.aosmd.com AON6405L TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 160 100 -10V 140 -4V -3.5V 120 80 -ID(A) -5V 100 -ID (A) VDS=-5V 80 -3V 60 40 60 125°C 40 20 VGS=-2.5V 20 25°C 0 0 0 1 2 3 4 0 5 -VDS (Volts) Figure 1: On-Region Characteristics(Note E) 3 4 Normalized On-Resistance 1.8 VGS=-4.5V 7 RDS(ON) (mΩ) 2 -VGS(Volts) Figure 2: Transfer Characteristics(Note E) 8 6 5 VGS=-10V 4 ID=-20A 1.6 VGS=-10V 1.4 1.2 VGS=-4.5V 1 0.8 3 0 5 10 15 20 25 0 30 25 50 75 100 125 150 175 Temperature (°C) Figure 4: On-Resistance vs. Junction Temperature (Note E) -ID (A) Figure 3: On-Resistance vs. Drain Current and Gate Voltage(Note E) 1.0E+02 20 ID=-20A 1.0E+01 16 1.0E+00 12 -IS (A) RDS(ON) (mΩ) 1 125°C 8 125°C 1.0E-01 25°C 1.0E-02 1.0E-03 4 25°C 1.0E-04 0 2 4 6 8 -VGS (Volts) Figure 5: On-Resistance vs. Gate-Source Voltage(Note E) Alpha & Omega Semiconductor, Ltd. 10 1.0E-05 0.0 0.2 0.4 0.6 0.8 1.0 -VSD (Volts) Figure 6: Body-Diode Characteristics(Note E) www.aosmd.com AON6405L TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 7000 10 VDS=-15V ID=-20A 6000 Ciss Capacitance (pF) -VGS (Volts) 8 6 4 5000 4000 3000 2000 Coss 2 1000 Crss 0 0 0 20 40 60 80 100 0 5 Qg (nC) Figure 7: Gate-Charge Characteristics 20 25 30 200 100.0 10.0 100µs 10s 10ms 1ms DC 1.0 0.1 160 10µs RDS(ON) limited Power (W) -ID (Amps) 15 -VDS (Volts) Figure 8: Capacitance Characteristics 1000.0 TJ(Max)=150°C TC=25°C 120 80 40 TJ(Max)=150°C TC=25°C 0.0 0 0.01 0.1 1 -VDS (Volts) 10 100 Figure 9: Maximum Forward Biased Safe Operating Area (Note F) 10 ZθJC Normalized Transient Thermal Resistance 10 D=Ton/T TJ,PK=TC+PDM.ZθJC.RθJC RθJC=1.5°C/W 0.0001 0.001 0.01 0.1 1 10 Pulse Width (s) Figure 10: Single Pulse Power Rating Junction-toCase (Note F) In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse 1 0.1 PD Ton T Single Pulse 0.01 0.00001 0.0001 0.001 0.01 0.1 1 10 100 Pulse Width (s) Figure 11: Normalized Maximum Transient Thermal Impedance (Note F) Alpha & Omega Semiconductor, Ltd. www.aosmd.com AON6405L Gate Charge Test Circuit & Waveform Vgs Qg -10V - - VDC + VDC Qgs Vds Qgd + DUT Vgs Ig Charge Resistive Switching Test Circuit & Waveforms RL Vds t off t on td(on) Vgs - DUT Vgs t d(off) tr tf 90% Vdd VDC + Rg Vgs 10% Vds Unclamped Inductive Switching (UIS) Test Circuit & Waveforms 2 L E AR= 1/2 LIAR Vds Vds Id - Vgs Vgs VDC + Rg BVDSS Vdd Id I AR DUT Vgs Vgs Diode Recovery Test Circuit & Waveforms Q rr = - Idt Vds + DUT Vgs Vds - Isd Vgs Ig Alpha & Omega Semiconductor, Ltd. L -Isd + Vdd t rr dI/dt -I RM Vdd VDC - -I F -Vds www.aosmd.com