SPT574 FAST, COMPLETE 12-BIT µP COMPATIBLE A/D CONVERTER WITH SAMPLE/HOLD FEATURES APPLICATIONS • Improved Version of the HADC574Z • Complete 12-Bit A/D Converter with Sample/Hold, Reference and Clock • Low Power Dissipation (100 mW Max) • 12-Bit Linearity (Over Temp) • 25 µs Max Conversion Time • Single +5 V Supply • Full Bipolar and Unipolar Input Range • • • • • GENERAL DESCRIPTION The SPT574 has standard bipolar and unipolar input ranges of 10 V and 20 V that are controlled by a bipolar offset pin and laser trimmed for specified linearity, gain and offset accuracy. The SPT574 is a complete, 12-bit successive approximation A/D converter manufactured in CMOS technology. The device is an improved version of the HADC574Z. Included on chip are an internal reference, clock, and a sample-and-hold. The S/H is an additional feature not available on similar devices. Data Acquisition Systems 8 or 12-Bit µP Input Functions Process Control Systems Test and Scientific Instruments Personal Computer Interface The power supply is +5 V. The device also has an optional mode control voltage which may be used depending on the application. With a maximum dissipation of 100 mW at the specified voltages, power consumption is about five times lower than that of currently available devices. The SPT574 features 25 µs (max) conversion time of 10 or 20 V input signals. Also, a three-state output buffer is added for direct interface to an 8, 12, or 16-bit µP bus. The SPT574 is available in 28-lead ceramic sidebrazed DIP, PDIP and SOIC packages in the commercial temperature range. Output BLOCK DIAGRAM Nibble A Nibble B Nibble C Three-State Buffers And Control STS 12-Bit SAR 12-Bit Capacitance DAC + Comp - Clock Offset/Gain Trim Control Logic Ref 20 V In 10 V In 12/8 CS Ao BIP Off R/C CE Ref Out AGND ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur) 1 25 °C Supply Voltages Mode Control Voltage (VEE to DGND) .................... 0 to +7 V Logic Supply Voltage (VDD to DGND) ...................0 to +7 V Analog to Digital Ground (AGND to DGND) ................. ±1 V Input Voltages Control Input Voltages (to DGND) (CE, CS, Ao, 12/8, R/C) ......................... -0.5 to VDD +0.5 V Analog Input Voltage (to AGND) (REF IN, BIP OFF, 10 VIN) ...................................... ±16.5 V 20 V VIN Input Voltage (to AGND) .............................. ±24 V Note: Output Reference Output Voltage .............. Indefinite Short to GND Momentary Short to VDD Temperature Operating Temperature, Ambient .................... 0 to +70 °C Junction ......................... +165 °C Lead Temperature, (Soldering 10 Seconds) ........... +300 °C Storage Temperature .................................... -65 to +150 °C Operation at any Absolute Maximum Rating is not implied. See Operating Conditions for proper nominal applied conditions in typical applications. ELECTRICAL SPECIFICATIONS TA = TMIN to TMAX, VEE = 0 to +5 V, VDD = +5 V, fS = 40 kHz, fIN = 10 kHz, unless otherwise specified. PARAMETER TEST CONDITIONS TEST LEVEL MIN SPT574C TYP MAX MIN SPT574B TYP MAX UNITS DC ELECTRICAL CHARACTERISTICS Resolution VI 12 12 Bits ±1 ±0.5 LSB Linearity Error TA= 0 to +70 °C VI Differential Linearity No Missing Codes VI Unipolar Offset; 10 V, 20 V +25 °C Adjustable to Zero VI ±2 ±2 LSB Bipolar Offset; ±5 V, ±10 V +25 °C Adjustable to Zero VI ±10 ±4 LSB Full Scale Calibration Error1 +25 °C Adjustable to Zero VI 0.3 0.3 % of FS Full Scale Calibration Error1 No Adjustment to Zero TA = 0 to +70 °C V 0.47 0.37 % of FS V V V ±1.0 ±2.0 ±12 ±1.0 ±2.0 ±12 ppm/°C ppm/°C ppm/°C Temperature Coefficients Unipolar Offset Bipolar Offset Full Scale Calibration Using Internal Reference Power Supply Rejection +4.75 V<VDD<+5.25 V Max Change in Full Scale Calibration Analog Input Ranges Bipolar Unipolar Input Impedance 10 Volt Span 20 Volt Span 12 12 Bits ±0.5 VI VI VI VI VI -5 -10 0 0 VI VI 15 60 +5 +10 +10 +20 21 84 -5 -10 0 0 15 60 21 84 ±0.5 LSB +5 +10 +10 +20 Volts Volts Volts Volts kΩ kΩ SPT574 2 8/1/00 ELECTRICAL SPECIFICATIONS TA = TMIN to TMAX, VEE = 0 to +5 V, VDD = +5 V, fS = 40 kHz, fIN = 10 kHz, unless otherwise specified. PARAMETER TEST CONDITIONS TEST LEVEL MIN SPT574C TYP MAX MIN SPT574B TYP MAX UNITS DC ELECTRICAL CHARACTERISTICS Power Supplies Operating Voltage Range VDD VEE2 Operating Current IDD IEE2 IV IV +4.5 +5.5 VDD +4.5 +5.5 VDD Volts Volts IV IV 13 167 20 13 167 20 mA µA Power Dissipation VI 65 100 65 100 mW Internal Reference Voltage Output Current3 VI VI 2.4 0.5 2.5 2.6 2.4 0.5 2.5 2.6 Volts mA Logic 0 Logic1 VI VI -0.5 2.0 +0.8 5.5 -0.5 2.0 +0.8 5.5 Volts Volts Current VI -5.0 5.0 -5.0 VEE = +5 V DIGITAL CHARACTERISTICS Logic Inputs (CE, CS , R/C , Ao, 12/8 ) Capacitance Logic Outputs (DB11-DB0, STS) Logic 0 Logic 1 Leakage V (ISink = 1.6 mA) (ISOURCE = 500 µA) (High Z State, DB11-DB0 Only) Capacitance AC Accuracy Spurious Free Dyn. Range Total Harmonic Distortion Signal-to-Noise Ratio Signal-to-Noise & Distortion (SINAD) Intermodulation Distortion 0. 1 5 VI VI VI 0. 1 +0.4 +2.4 -5 0.1 5.0 5 +5 +0.4 +2.4 -5 0.1 µA pF +5 Volts Volts µA V 5 5 pF V V V V 78 -77 72 71 78 -77 72 71 dB dB dB dB fS=40 kHz, fIN=10 kHz V -75 -75 dB fIN=10 kHz; fIN2=11.5 kHz Note 1: Fixed 50 Ω resistor from REF OUT to REF IN and REF OUT to BIP OFF. Note 2: VEE is optional and is only used to set the mode for the internal sample/hold. When not using VEE, the pin should be treated as a no connect. If VEE is connected to 0 to -15 V, aperture delay (tAP) will increase from 20 ns (typ) to 4000 ns (typ). Note 3: Available for external loads; external load should not change during conversion. SPT574 3 8/1/00 ELECTRICAL SPECIFICATIONS TA = TMIN to TMAX, VEE = 0 to +5 V, VDD = +5 V, fS = 40 kHz, fIN = 10 kHz, unless otherwise specified. TEST CONDITIONS PARAMETER TEST LEVEL MIN SPT574C TYP MAX MIN SPT574B TYP MAX UNITS AC ELECTRICAL CHARACTERISTICS4 Convert Mode Timing tDSC STS Delay from CE tHEC CE Pulse Width tSSC CS to CE Setup VI VI VI 50 50 60 30 20 200 50 50 60 30 20 200 ns ns ns tHSC CS Low during CE High VI 50 20 50 20 ns tSRC R/C to CE Setup VI 50 0 50 0 ns tHRC R/C Low During CE High tSAC Ao to CE Setup tHAC Ao Valid During CE High tC Conversion Time5 12-Bit Cycle 8-Bit Cycle VI VI VI 50 0 50 20 50 0 50 20 ns ns ns VI VI 20 22 16 25 18 75 35 100 0 150 Read Mode Timing tDD Access Time from CE tHD Data Valid After CE Low tHL Output Float Delay tSSR CS to CE Setup VI VI VI VI 50 tSRR R/C to CE Setup tSAR Ao to CE Setup tHSR CS Valid After CE Low VI VI VI 0 50 0 25 tHRR R/C High After CE Low tHS STS Delay After Data Valid tHAR Ao Valid after CE Low VI VI VI 0 300 50 400 25 25 150 50 1000 20 22 16 25 18 µs µs 75 35 100 0 150 ns ns ns ns 0 50 0 25 0 300 50 400 150 ns ns ns ns ns ns 1000 Note 4: Time is measured from 50% level of digital transitions. Note 5: Includes acquisition time. Figure 1 - Convert Mode Timing Diagram Figure 2 - Read Mode Timing Diagram CE CE CS t HEC t SSC CS t SSR t HSR t HRR t HSC t SRC R/C R/C t SRR t HRC Ao Ao t SAR t SAC t HAR t HAC STS STS t DSC tC t HD t HS HIGH DB11-DB0 IMPEDANCE DB11-DB0 DATA VALID High Impedance t DD t HL SPT574 4 8/1/00 ELECTRICAL SPECIFICATIONS TA = TMIN to TMAX, VEE = 0 to +5 V, VDD = +5 V, fS = 40 kHz, fIN = 10 kHz, unless otherwise specified. TEST CONDITIONS PARAMETER TEST LEVEL MIN SPT574C TYP MAX MIN SPT574B TYP MAX UNITS AC ELECTRICAL CHARACTERISTICS4 Stand-Alone Mode Timing tHRL Low R/C Pulse Width VI tDS STS Delay from R/C VI tHDR Data Valid After R/C Low tHS STS Delay After Data Valid tHRH High R/C Pulse Width tDDR Data Access Time Sample-and-Hold Aperture Delay Aperture Uncertainty Time VI VI VI VI VEE = +5 V VEE = +5 V 25 300 100 All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition. ns 400 200 25 300 100 1000 400 1000 150 IV V All electrical characteristics are subject to the following conditions: 25 200 150 20 300 TEST LEVEL TEST LEVEL CODES 20 300 ns ns ns ns ns ns ps, RMS TEST PROCEDURE I 100% production tested at the specified temperature. II 100% production tested at TA=25 °C, and sample tested at the specified temperatures. III QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design and characterization data. IV V Parameter is a typical value for information purposes only. VI 100% production tested at TA = 25 °C. Parameter is guaranteed over specified temperature range. Figure 3 - Low Pulse for R/C - Outputs Enabled After Conversion t 25 Figure 4 - High Pulse for R/C - Outputs Enabled While R/C is High, Otherwise High Impedance HRL R/C R/C t t t HRH DS DS STS STS t t HDR t t C t HS DDR t C HDR HIGH-Z HIGH-Z DATA VALID DB11-DB0 DB11-DB0 DATA VALID DATA VALID SPT574 5 8/1/00 CIRCUIT OPERATION The SPT574 is a complete 12-bit analog-to-digital converter that consists of a single chip version of the industry standard 574. This single chip contains a precision 12-bit capacitor digital-to-analog converter (CDAC) with voltage reference, comparator, successive approximation register (SAR), sampleand-hold, clock, output buffers and control circuitry to make it possible to use the SPT574 with few external components. When the control section of the SPT574 initiates a conversion command, the clock is enabled and the successive-approximation register is reset to all zeros. Once the conversion cycle begins, it cannot be stopped or restarted and data is not available from the output buffers. The SAR, timed by the clock, sequences through the conversion cycle and returns an end-of-convert flag to the control section of the ADC. The clock is then disabled by the control section, the output status goes low, and the control section is enabled to allow the data to be read by external command. The internal SPT574 12-bit CDAC is sequenced by the SAR starting from the MSB to the LSB at the beginning of the conversion cycle to provide an output voltage from the CDAC that is equal to the input signal voltage (which is divided by the input voltage divider network). The comparator determines whether the addition of each successively-weighted bit voltage causes the CDAC output voltage summation to be greater or less than the input voltage; if the sum is less, the bit is left on; if more, the bit is turned off. After testing all the bits, the SAR contains a 12-bit binary code which accurately represents the input signal to within ±1/2 LSB. The internal reference provides the voltage reference to the CDAC with excellent stability over temperature and time. The reference is trimmed to 2.5 volts and can supply at least 0.5 mA to an external load. Any external load on the SPT574 reference must remain constant during conversion. The sample-and-hold feature is a bonus of the CDAC architecture. Therefore the majority of the S/H specifications are included within the A/D specifications. Although the sample-and-hold circuit is not implemented in the classical sense, the sampling nature of the capacitive DAC makes the SPT574 appear to have a built-in sampleand-hold. This sample-and-hold action substantially increases the signal bandwidth of the SPT574 over that of similar competing devices. Note that even though the user may use an external sampleand-hold for very high frequency inputs, the internal sampleand-hold still provides a very useful isolation function. Once the internal sample is taken by the CDAC capacitance, the input of the SPT574 is disconnected from the user’s sampleand-hold. This prevents transients occurring during conversion from affecting the attached sample-and-hold buffer. All other 574 circuits will cause a transient load current on the sample-and-hold which will upset the buffer output and may add error to the conversion itself. Furthermore, the isolation of the input after the acquisition time in the SPT574 allows the user an opportunity to release the hold on an external sample-and-hold and start it tracking the next sample. This increases system throughput with the user’s existing components. TYPICAL INTERFACE CIRCUIT The SPT574 is a complete A/D converter that is fully operational when powered up and issued a Start Convert Signal. Only a few external components are necessary as shown in figures 5 and 6. The two typical interface circuits are for operating the SPT574 in either an unipolar or bipolar input mode. Information on these connections and on conditions concerning board layout to achieve the best operation are discussed below. For each application of this device, strict attention must be given to power supply decoupling, board layout (to reduce pickup between analog and digital sections), and grounding. Digital timing, calibration and the analog signal source must be considered for correct operation. POWER SUPPLIES The supply voltage for the SPT574 must be kept as quiet as possible from noise pickup and also regulated from transients or drops. Because the part has 12-bit accuracy, voltage spikes on the supply lines can cause several LSB deviations on the output. Switching power supply noise can be a problem. Careful filtering and shielding should be employed to prevent the noise from being picked up by the converter. VDD should be bypassed with a 10 µF tantalum capacitor located close to the converter to filter noise and counter the problems caused by the variations in supply current. VEE is only used as a logic input and is immune to typical supply variation. GROUNDING CONSIDERATIONS Resistance of any path between the analog and digital grounds should be as low as possible to accommodate the ground currents present with this device. To achieve specified accuracy, a double-sided printed circuit board with a copper ground plane on the component side is recommended. Keep analog signal traces away from digital lines. It is best to lay the PC board out such that there is an analog section and a digital section with a single point ground connection between the two through an RF bead located as close to the device as possible. If possible, run analog signals between ground traces and cross digital lines at right angles only. SPT574 6 8/1/00 The analog and digital common pins should be tied together as close to the package as possible to guarantee best performance. The code dependent currents flow through the VDD terminal and not through the analog and digital common pins. RANGE CONSIDERATIONS The SPT574 may be operated by a microprocessor or in the stand-alone mode. The part has four standard input ranges: 0 V to +10 V, 0 V to +20 V, ±5 V and ±10 V. The maximum errors that are listed in the specifications for gain and offset may be adjusted externally to zero as explained in the next two sections. The gain adjustment should be done at positive full scale. The ideal input corresponding to the last code change is applied. This is 1 and 1/2 LSB below the nominal full scale which is +9.9963 V for the 10 V range and +19.9927 V for the 20 V range. Adjust the gain potentiometer R2 for flicker between codes 1111 1111 1110 and 1111 1111 1111. If calibration is not necessary for the intended application, replace R2 with a 50 Ω, 1% metal film resistor and remove the network from the BIP OFF pin. Connect the BIP OFF pin to AGND. Connect the analog input to the 10 V IN pin for the 0 to 10 V range or to the 20 V IN pin for the 0 to 20 V range. BIPOLAR The gain and offset errors listed in the specification may be adjusted to zero using the potentiometers R1 and R2. (See figure 6.) If adjustment is not needed, either or both pots may be replaced by a 50 Ω, 1% metal film resistor. CALIBRATION & CONNECTION PROCEDURES UNIPOLAR The calibration procedure consists of adjusting the converter’s most negative output to its ideal value for offset adjustment and then adjusting the most positive output to its ideal value for gain adjustment. Starting with offset adjustment and referring to figure 5, the midpoint of the first LSB increment should be positioned at the origin to get an output code of all 0s. To do this, an input of +1/2 LSB or +1.22 mV for the 10 V range and +2.44 mV for the 20 V range should be applied to the SPT574. Adjust the offset potentiometer R1 for code transition flickers between 0000 0000 0000 and 0000 0000 0001. Figure 5 - Unipolar Input Connections To calibrate, connect the analog input signal to the 10 V IN pin for a ±5 V range or to the 20 V IN pin for a ±10 V range. First apply a DC input voltage 1/2 LSB above negative full scale which is -4.9988 V for the ±5 V range or -9.9976 V for the ±10 V range. Adjust the offset potentiometer R1 for flicker between output codes 0000 0000 0000 and 0000 0000 0001. Next, apply a DC input voltage 1 and 1/2 LSB below positive full scale which is +4.9963 V for the ±5 V range or +9.9927 V for the ±10 V range. Adjust the gain potentiometer R2 for flicker between codes 1111 1111 1110 and 1111 1111 1111. Figure 6 - Bipolar Input Connections Output Bits Output Bits R/C R/C Nibble A CS Ao Control Logic Nibble B Nibble C Ao Control Logic CE 12-Bits STS VDD +5 V .1 µF Strobe +15 V 12-Bits 12-Bit SAR Oscillator VDD R1 100 kΩ Strobe 12-Bits 100 kΩ Analog Inputs 0 to 20 V Sample/Hold 10 V In 20 V In DGND Comp CDAC ±5 V LSB MSB Sample/Hold 10 V In Analog Inputs BIP Off MSB Comp CDAC LSB 20 V In ±10 V 100 Ω BIP Off 100 Ω R1 VRef Out 100 Ω (Calibration) +5 V .1 µF 12-Bits DGND 0 to 10 V Nibble C STS 12-Bit SAR Oscillator Nibble B Three-State Buffers And Control 12/8 CE -15 V Nibble A CS Three-State Buffers And Control 12/8 Ref Ref Amp Offset/Gain Trim Network VRef Out Ref Ref Amp Offset/Gain Trim Network R2 100 Ω R1 VRef In VEE VRef In VEE SPT574 7 8/1/00 ALTERNATIVE Figure 7 - Interfacing the SPT574 to an 8-Bit Data Bus In some applications, a full scale of 10.24 V (for an LSB of 2.5 mV) or 20.48 V (for an LSB of 5.0 mV) is more convenient. In the unipolar mode of operation, replace R2 with a 200 Ω potentiometer and add 150 Ω in series with the 10 V IN pin for 10.24 V input range or 500 Ω in series with the 20 V IN pin for 20.48 V input range. In bipolar mode of operation, replace R1 with a 500 Ω potentiometer (in addition to the previous changes). The calibration will remain similar to the standard calibration procedure. Ao Address Bus ~ STS 12/8 MSB Ao Data Bus CONTROLLING THE SPT574 The SPT574 can be operated by most microprocessor systems due to the control input pins and on-chip logic. It may also be operated in the stand-alone mode and enabled by the R/C input pin. Full µP control consists of selecting an 8 or 12-bit conversion cycle, initiating the conversion, and reading the output data when ready. The output read has the options of choosing either 12-bits at once or 8 bits followed by 4-bits in a left-justified format. All five control inputs are TTL/ CMOS compatible and include 12/8 , CS , Ao, R/C and CE. The use of these inputs in controlling the converter’s operations is shown in table I, and the internal control logic is shown in a simplified schematic in figure 10. STAND-ALONE OPERATION The simplest interface is a control line connected to R/C . The output controls must be tied to known states as follows: CE and 12/8 are wired high, Ao and CS are wired low. The output data arrives in words of 12-bits each. The limits on R/C duty cycle are shown in figures 3 and 4. It may have a duty cycle within and including the extremes shown in the specifications. In general, data may be read when R/C is high unless STS is also high, indicating a conversion is in progress. Table I - Truth Table for the SPT574 Control Inputs Operation CE CS R/C 12/8 Ao 0 X X X X None X 1 X X X None 0 0 X 0 Initiate 12 bit conversion 0 0 X 1 Initiate 8 bit conversion 0 X 0 Initiate 12 bit conversion 0 1 1 X 1 Initiate 8 bit conversion 1 0 X 0 Initiate 12 bit conversion 1 0 X 1 Initiate 8 bit conversion 1 0 1 1 X Enable 12 bit Output 1 0 1 0 0 Enable 8 MSB's Only 1 0 1 0 1 Enable 4 LSB's Plus 4 LSB DIG COM CONTROLLED OPERATION CONVERSION LENGTH A conversion start transition latches the state of Ao as shown in figure 7 and table I. The latched state determines if the conversion stops with 8 bits (Ao high) or continues for 12 bits (Ao low). If all 12 bits are read following an 8-bit conversion, the three LSBs will be a logic 0 and DB3 will be a logic 1. Ao is latched because it is also involved in enabling the output buffers as will be explained later. No other control inputs are latched. CONVERSION START A conversion may be initiated by a logic transition on any of the three inputs: CE, CS , R/C , as shown in table I. The last of the three to reach the correct state starts the conversions, so one, two or all three may be dynamically controlled. The nominal delay from each is the same and all three may change state simultaneously. In order to assure that a particular input controls the start of conversion, the other two should be set up at least 50 ns earlier. Refer to the convert mode timing specifications. The Convert Start timing diagram is illustrated in figure 1. The output signal STS is the status flag and goes high only when a conversion is in progress. While STS is high, the output buffers remain in a high impedance state so that data can not be read. Also, when STS is high, an additional Start Convert will not reset the converter or reinitiate a conversion. Note, if Ao changes state after a conversion begins, an additional Start Convert command will latch the new start of Ao and possibly cause a wrong cycle length for that conversion (8 versus 12 bits). Trailing Zeroes SPT574 8 8/1/00 READING THE OUTPUT DATA SAMPLE-AND-HOLD (S/H) CONTROL MODE The output data buffers remain in a high impedance state until the following four conditions are met: R/C is high, STS is low, CE is high, and CS is low. The data lines become active in response to the four conditions and output data according to the conditions of 12/8 and Ao. The timing diagram for this process is shown in figure 2. When 12/8 is high, all 12 data outputs become active simultaneously and the Ao input is ignored. This is for easy interface to a 12 or 16-bit data bus. The 12/8 input is usually tied high or low, although it is TTL/CMOS compatible. When 12/8 is low, the output is separated into two 8-bit bytes as shown below. This control mode is provided to allow full use of the internal S/H, eliminating the need for an external S/H in most applications. The SPT574 in the control mode also eliminates the need for one of the control signals, usually the convert command. The command that puts the internal S/H in the hold state also initiates a conversion, reducing time constraints in many systems. As soon as the conversion is completed the internal S/H immediately begins slewing to track the input signal. See figure 9. Figure 8 - Output When 12/8 Is Low BYTE 1 X X X X BYTE 2 X X X X MSB X X X X O O O O LSB This configuration makes it easy to connect to an 8-bit data bus as shown in figure 7. The Ao control can be connected to the least significant bit of the address bus in order to store the output data into two consecutive memory locations. When Ao is pulled low, the 8 MSBs are enabled only. When Ao is high, the 4 MSBs are disabled, bits 4 through 7 are forced to a zero and the four LSBs are enabled. The two byte format is left justified data as shown above and can be considered to have a decimal point or binary to the left of byte 1. Ao may be toggled without damage to the converter at any time. Break-before-make action is guaranteed between the two data bytes. This assures that the outputs in figure 7 will never be enabled at the same time. In figure 2, it can be seen that a read operation usually begins after the conversion is completed and STS is low. If earlier access is needed, the read can begin no later than the addition of time tDD and tHS before STS goes low. In the control mode it is assumed that during the required 4 µs acquisition time the signal is not slewing faster than the slew rate of the SPT574. No assumption is made about the input level after the convert command arrives since the input signal is sampled and conversion begins immediately after the convert command. This means that the convert command can be used to switch an input multiplexer or change gains on a programmable gain amplifier, allowing the input signal to settle before the next acquisition at the end of the conversion. Because aperture jitter is minimized by the internal S/H, a high input frequency can be converted without an external S/H. See table II. Table II - Conversion Timing (VEE = +5 V) Parameter Throughput Time (tAQ+tC) 12-Bit Conversions 8-Bit Conversions Conversion Time (tC) 12-Bit Conversions 8-Bit Conversions Acquisition Time(tAC) Aperture Delay (tAP) Aperture Uncertainty (tJ) S/H Control Mode Min Typ Max Units 22 16 µs µs 18 12 4 20 0.3 25 18 µs µs µs ns ns Figure 9 - S/H Control Mode Timing (VEE = +5 V) R/C tC tAP Signal Acquisition Conversion Signal Acquisition tAQ SPT574 9 8/1/00 Figure 10 - Control Logic Nibble B Zero Override Nibble A,B Input Buffers 12/8 Nibble C CS Read Control A R/C H D Q CK CE R EOC8 CK Delay Q STS D Q AO Latch EOC12 PACKAGE OUTLINES 28-Lead PDIP INCHES SYMBOL A B C D E F G H I J K K 28 I 1 MIN 0.115 0.014 0.030 0.008 0.125 0.600 0.485 1.380 0.005 MILLIMETERS MAX 0.250 0.200 0.022 0.100 0.070 0.015 0.195 0.625 0.580 1.565 0.040 MIN 2.92 0.36 0.76 0.20 3.18 15.24 12.32 35.05 0.13 MAX 6.35 5.08 0.56 2.54 1.78 0.38 4.95 15.88 14.73 39.75 1.02 J H G A B F C D E SPT574 10 8/1/00 PACKAGE OUTLINES 28-Lead Sidebrazed 28 H INCHES SYMBOL I 1 J G A E F MIN MILLIMETERS MAX MIN MAX A 0.077 0.093 1.96 2.36 B C 0.016 0.095 0.020 0.105 0.41 2.41 0.51 2.67 D E F 0.040 0.215 .050 typ 0.060 0.235 1.02 5.46 1.27 typ 1.52 5.97 G H I J 1.388 0.585 0.009 0.600 1.412 0.605 0.012 0.620 35.26 14.86 0.23 15.24 35.86 15.37 0.30 15.75 C B D 28-Lead SOIC INCHES SYMBOL 28 MIN 1 A MIN A 0.696 0.712 17.68 B 0.004 0.012 0.10 C I H MILLIMETERS MAX .050 typ MAX 18.08 0.30 1.27 typ D 0.014 0.019 0.36 0.48 E 0.009 0.012 0.23 0.30 2.64 F 0.080 0.104 2.03 G 0.016 0.050 0.41 1.27 H 0.394 0.419 10.01 10.64 I 0.291 0.299 7.39 7.59 H F B C D G E SPT574 11 8/1/00 PIN ASSIGNMENTS PIN FUNCTIONS NAME FUNCTION 1 VDD STS 28 2 12/8 DB11 27 VDD Logic Supply Voltage, Nominally +5 V 3 CS DB10 26 12/8 Data Mode Selection 4 Ao DB9 25 CS Chip Selection 5 R/C DB8 24 Ao Byte Address/Short Cycle 6 CE DB7 23 R/C Read/Convert 7 N/C DB6 22 CE Chip Enable 8 REF OUT DB5 21 VEE Mode Control Voltage, Nominally +5 V 9 AGND DB4 20 REF OUT Reference Output, Nominally +2.5 V 10 REF IN DB3 19 AGND Analog Ground 11 VEE DB2 18 REF IN Reference Input N/C Pin Not Connected to Device 12 BIP OFF DB1 17 13 10 V IN BIP OFF Bipolar Offset DB0 16 10 V IN 10 Volt Analog Input 14 20 V IN DGND 15 20 V IN 20 Volt Analog Input DGND Digital Ground DB0 - DB11 Digital Data Output DB11 - MSB DB0 - LSB STS Status 28-LEAD DIP/SOIC ORDERING INFORMATION TEMPERATURE RANGE 0 to +70 °C LINEARITY ERROR MAX ±1/2 LSB SPT574BCJ 0 to +70 °C ±1/2 LSB 28L Sidebrazed DIP SPT574BCS 0 to +70 °C ±1/2 LSB 28L SOIC SPT574CCN 0 to +70 °C ±1 LSB 28L Plastic DIP SPT574CCJ 0 to +70 °C ±1 LSB 28L Sidebrazed DIP SPT574CCS 0 to +70 °C ±1 LSB 28L SOIC PART NUMBER SPT574BCN PACKAGE TYPE 28L Plastic DIP SPT574 12 8/1/00