VISHAY T8714VA-SF-F

T8714VA
Vishay Semiconductors
Specification of GaAlAs IR Emitting Diode Chip
FEATURES
• Package type: chip
-
• Package form: single chip
• Technology: double hetero
• Dimensions chip (L x W x H in mm): 0.37 x 0.37
x 0.16
• Peak wavelength: λ = 865 nm
• Compliant to RoHS directive 2002/95/EC
accordance to WEEE 2002/96/EC
and
in
21594-1
DESCRIPTION
T8714VA is an infrared, 865 nm emitting diode in GaAlAs
double hetero technology with high radiant power and high
speed. Anode is the bond pad on top.
GENERAL INFORMATION
The datasheet is based on Vishay optoelectronics sample testing under certain predetermined and assumed conditions, and is
provided for illustration purpose only. Customers are encouraged to perform testing in actual proposed packaged and used
conditions. Vishay optoelectronics die products are tested using Vishay optoelectronics based quality assurance procedures and
are manufactured using Vishay optoelectronics established processes. Estimates such as those described and set forth in this
datasheet for semiconductor die will vary depending on a number of packaging, handling, use, and other factors. Therefore sold
die may not perform on an equivalent basis to standard package products.
PRODUCT SUMMARY
COMPONENT
Ie (mW/sr)
ϕ (deg)
λp (nm)
tr (ns)
4.2
> ± 80
865
13
T8714VA
Note
Test condition see table “Basic Characteristics”
ORDERING INFORMATION
ORDERING CODE
T8714VA-SF-F
PACKAGING
REMARKS
PACKAGE FORM
Wafer sawn on foil
MOQ: 25 000 pcs
Chip
Note
MOQ: minimum order quantity
ABSOLUTE MAXIMUM RATINGS
SYMBOL
VALUE
UNIT
Forward current
PARAMETER
TEST CONDITION
IF
100
mA
Reverse voltage
VR
5
V
IFSM
1
A
Tj
125
°C
Operating temperature range
Tamb
- 40 to + 100
°C
Storage temperature range chip
Tstg1
- 40 to + 100
°C
Storage temperature range on foil
Tstg2
- 40 to + 50
°C
Surge forward current
tp = 100 µs
Junction temperature
Note
Tamb = 25 °C, unless otherwise specified
Document Number: 81130
Rev. 1.3, 29-Mar-10
For technical questions, contact: [email protected]
www.vishay.com
1
T8714VA
Vishay Semiconductors Specification of GaAlAs IR Emitting
Diode Chip
BASIC CHARACTERISTICS
(1)
TEST CONDITION
SYMBOL
Forward voltage
PARAMETER
IF = 100 mA
VF
MIN.
TYP.
1.5
V
Radiant power (2)
IF = 100 mA
φe
26
mW
Radiant intensity (3)
IF = 100 mA
Ie
4.2
mW/sr
Radiant power
(epoxy encapsulated)
IF = 100 mA
φe
52
mW
Radiant power chip (4)
IF = 50 mA
φe
Temperature coefficient of radiant
power
IF = 100 mA
TKφe
Reverse voltage
IR = 10 µA
VR
Temperature coefficient of forward
voltage
IF = 1 mA
TKVF
4.4
MAX.
5.8
5
UNIT
7.2
mW
- 0.35
%/K
18
V
- 1.8
mV/K
Angle of half intensity
IF = 100 mA
ϕ
Peak wavelength
IF = 30 mA
λp
Spectral bandwidth
IF = 30 mA
λ0.5
48
nm
Rise time/fall time
IF = 100 mA
tr, tf
13
ns
> ± 80
850
deg
865
880
nm
Notes
(1) T
amb = 25 °C, unless otherwise specified
(2) The measurements are based on samples of die which are mounted on a TO-18 gold header without resin coating
(3) The radiant intensity, I , is measured on the geometric axis of the TO-18 header
e
(4) The radiant power, φ , is measured with chip on bare plate and aperture angle about 30°, as indicated on the label of each wafer
e
BASIC CHARACTERISTICS
Tamb = 25 °C, unless otherwise specified
ϕe rel - Relative Radiant Power
1.0
- 70°
- 80° 90°
80°
70°
- 60°
0.8
60°
- 50°
IF = 30 mA
50°
- 40°
40°
0.6
- 30°
30°
- 20°
0.4
20°
- 10°
10°
0.2
0°
100
0
700
21623
750
800
850
900
950
0
50
100
Relative Angular Intensity
21596
1000
0°
50
λ - Wavelength (nm)
Fig. 1 - Relative Spectral Emission
φe rel = f (λ)
Fig. 2 - Radiant Characteristics
Irel = f(ϕ)
DIMENSIONS
Electrode pattern:
Sectional view (schematic):
P (anode) side
anode
N (cathode) side
P-type GaAlAs
typ. 150 µm
P-type GaAlAs
N-type GaAlAs
21624
Fig. 3
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For technical questions, contact: [email protected]
Document Number: 81130
Rev. 1.3, 29-Mar-10
T8714VA
Specification of GaAlAs IR Emitting
Diode Chip
Vishay Semiconductors
MECHANICAL DIMENSIONS
PARAMETER
SYMBOL
MIN.
TYP.
MAX.
UNIT
Length of chip edge (x-direction)
Lx
0.37
Length of chip edge (y-direction)
Ly
0.37
mm
Emission area
AE
0.325 x 0.325
mm2
Die height
H
0.16
mm
Diameter of bondpad
d
0.14
mm
ADDITIONAL INFORMATION
mm
(1)
Frontside metallization, anode
Aluminum
Backside metallization, cathode
Gold alloy
Dicing
Sawing
Die bonding technology
Epoxy bonding
Note
(1) All chips are checked in accordance with the Vishay Semiconductor, specification of visual inspection FVOV6870.
The visual inspection shall be made in accordance with the “specification of visual inspection as referenced”. The visual inspection of chip
backside is performed with stereo microscope with incident light and 40x to 80x magnification.
The quality inspection (final visual inspection) is performed by production. An additional visual inspection step as special release procedure
by QM is not installed.
HANDLING AND STORAGE CONDITIONS
• The hermetically sealed shipment lots shall be opened in temperature and moisture controlled cleanroom environment only. It
is mandatory to follow the rules for disposition of material that can be hazardous for humans and environment.
• Product must be handled only at ESD safe workstations. Standard ESD precautions and safe work environments are as defined
in MIL-HDBK-263.
• Singulated die are not to be handled with tweezers. A vacuum wand with non metallic ESD protected tip should be used.
PACKING
Chips are fixed on adhesive foil. Upon request the foils can be mounted on plastic frame or disco frame. For shipment, the wafers
are arranged to stacks and hermetically sealed in plastic bags to ensure protection against environmental influence (humidity and
contamination).
Use for recycling reliable operators only. We can help getting in touch with your nearest sales office. By agreement we will take
back packing material, if it is sorted. You will have to bear the costs of transport. We will invoice you for any costs incurred for
packing material that is returned unsorted or which we are not obliged to accept.
Document Number: 81130
Rev. 1.3, 29-Mar-10
For technical questions, contact: [email protected]
www.vishay.com
3
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Document Number: 91000
Revision: 11-Mar-11
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