TI TLV5610IYZR

 TLV5610IYZ
SBAS389A – JULY 2006 – REVISED JULY 2006
2.7V to 5.5V, 12-Bit, Octal
DIGITAL-TO-ANALOG CONVERTER
in a Wafer Chip-Scale Package—Pb-Free/Green
FEATURES
APPLICATIONS
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Eight, 12-Bit, Voltage Output DACs in One
Package
Pin-Compatible, Pb-Free, RoHS-Compliant
Upgrade to the TLV5610IYE
Programmable Settling Time versus Power
Consumption:
– 1µs in Fast Mode
– 3µs in Slow Mode
Compatible With TMS320™ DSP Family and
SPI™ Serial Ports
Differential and Single-Ended Analog
Input/Output
Separate Software Control for ADC and DAC
Power Down
Monotonic Over Temperature
Low Power Consumption:
– 18mW in Slow Mode at 3V
– 48mW in Fast Mode at 3V
Power Down Mode
Buffered, High-Impedance Reference Inputs
Data Output for Daisy-Chaining
Digital Servo-Control Loops
Digital Offset and Gain Adjustment
Industrial Process Control
Machine and Motion Control Devices
Mass Storage Devices
WAFER CHIP-SCALE PACKAGE
(BOTTOM VIEW)
LDAC
MODE
OUTD
REF
18 17 16
DOUT
19
DVDD
20
OUTB
OUTC
15
14
13
12
DGND
1
DIN
2
34
56
FS
SCLK
AVDD
10
AGND
9
OUTH
78
OUTE
PRE
OUTA
11
OUTG
OUTF
DESCRIPTION
The TLV5610IYZ is the lead-free version of the TLV5610IYE, an eight-channel, 12-bit, voltage output
digital-to-analog converter (DAC) with a flexible serial interface. The serial interface allows glueless interface to
TMS320 and SPI, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing
four control and 12 data bits.
Additional features include a power-down mode, an LDAC input for simultaneous update of all eight DAC
outputs, and a data output that can be used to cascade multiple devices.
The resistor string output voltage is buffered by a rail-to-rail output amplifier with a programmable settling time to
allow the designer to optimize speed versus power dissipation. The buffered, high-impedance reference input
can be connected to the supply voltage.
The TLV5610IYZ is implemented in a CMOS process and is available in a 20-terminal wafer chip-scale package
(WCSP). The TLV5610IYZ is characterized for operation from –40°C to +85°C in a wire-bonded small outline
(SO) package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
TMS320 is a trademark of Texas Instruments, Inc.
SPI, QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corp.
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006, Texas Instruments Incorporated
TLV5610IYZ
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SBAS389A – JULY 2006 – REVISED JULY 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION
(1)
TA
WCSP-20 PACKAGE (1)
–40°C to +85°C
TLV5610IYZ
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range (unless otherwise noted) (1)
TLV5610IYZ
UNIT
7
V
Reference input voltage range
– 0.3 to AVDD + 0.3
V
Digital input voltage range
– 0.3 to DVDD + 0.3
V
–40 to +85
°C
Supply voltage (AVDD, DVDD to GND)
Operating free-air temperature range, TA
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Supply voltage, AVDD, DVDD
MIN
NOM
MAX
5V operation
4.5
5
5.5
V
3V operation
2.7
3
3.3
V
High-level digital input, VIH
DVDD = 2.7V to 5.5V
Low-level digital input, VIL
DVDD = 2.7V to 5.5V
Reference voltage, VREF
2
V
V
GND
4.096
AVDD
AVDD = 3V
GND
2.048
AVDD
2
V
kΩ
Load capacitance, CL
100
pF
Clock frequency, fCLK
30
MHz
+85
°C
Operating free-air temperature, TA
2
V
0..8
AVDD = 5V
Load resistance. RL
UNIT
–40
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ELECTRICAL CHARACTERISTICS
Over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
16
21
mA
6
8
mA
Power Supply
IDD
Power-supply current
Fast
Slow
No load, VREF = 4.096V, all inputs = DVDD or
GND
Power-down supply current
POR
Power-on threshold
PSRR
Power-supply rejection ratio
µA
0.1
Full-scale; see Note
(1)
2
V
–60
dB
Static DAC Specifications
Resolution
12
INL
Integral nonlinearity
Code 40 to 4095, VREF = 2V, 4V
±2
DNL
Differential nonlinearity
Code 40 to 4095, VREF = 2V, 4V
±0.5
EZS
Zero-scale error (offset error at zero-scale)
EZS TC
Zero-scale error temperature coefficient
EG
Gain error
EG TC
Gain error temperature coefficient
Bits
±6
LSB
±1
LSB
±30
mV
µV/°C
30
±0.6
10
% Full-Scale V
ppm/°C
Output Specifications
VO
Voltage output range
RL = 10kΩ
Output load regulation accuracy
RL = 2kΩ vs 10kΩ
0
AVDD – 4
±0.3
V
% Full-Scale V
Reference Input
VI
Input voltage range
RI
Input resistance
CI
Input capacitance
Reference input bandwidth
0
AVDD
100
5
Fast
Slow
VREF = 0.4VPP + 2.048VDC, input code = 0x800
VREF = 2VPP at 1kHz + 2.048VDC (2)
Reference feedthrough
V
kΩ
pF
2.2
MHz
1.9
MHz
–84
dB
Digital Inputs
IIH
High-level digital input current
VI = DVDD
IIL
Low-level digital input current
VI = 0V
CI
Input capacitance
1
µA
µA
–1
8
pF
Digital Outputs
VOH
High-level digital output voltage
RL = 10kΩ
VOL
Low-level digital output voltage
RL = 10kΩ
Output voltage rise time
RL = 10kΩ, CL = 20pF, incl. propagation delay
2.6
V
0.4
V
7
20
ns
1
3
µs
3
7
µs
0.5
1
µs
1
2
Analog Output Dynamic Performance
tS(FS)
tS(CC)
SR
(1)
(2)
(3)
(4)
(5)
(6)
Output settling time (3), full-scale
Output settling time (4), code to code
Slew rate (5)
Fast
Slow
Fast
Slow
Fast
Slow
RL = 10kΩ, CL = 1000pF
RL = 10kΩ, CL = 1000pF
RL = 10kΩ, CL = 1000pF
(6)
Glitch energy
See Note
Channel crosstalk
10kHz sine, 4VPP
µs
4
10
1
3
V/µs
4
nV-s
–90
V/µs
dB
Power-supply rejection ratio at full-scale is measured by varying AVDD and is given by the following equation:
PSRR = 20 log[(EG(AVDDmax) – EG(AVDDmin))]/VDDmax.
Reference feedthrough is measured at the DAC output with an input code = 0x000.
Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change of
0x80 to 0xFFF and 0xFFF to 0x080, respectively. Assured by design; not production tested.
Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change of one
count. The max time applies to code changes near zero scale or full-scale. Assured by design; not production tested.
Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.
Code transition: 0x7FF to 0x800.
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SBAS389A – JULY 2006 – REVISED JULY 2006
twH
twL
SCLK
X
4
3
2
1
16
17
X
th(D)
tsu(D)
DIN
X
D15
DOUT
X
D15
D14
(1)
D14
D13
(1)
D13
D12
(1)
D12
D1
(1)
D1
D0
(1)
D0
X
(1)
X
tsu(FS - C17)
tsu(FS - CK)
tsu(C16 - FS)
twH(FS)
FS
(mC Mode)
tsu(CK - FS)
twL(FS)
FS
(DSP Mode)
X
NOTE: (1) Previous input data.
Figure 1. Serial Interface Timing
t wL(LDAC)
LDAC
ts
±0.5 LSB
OUTx
Figure 2. Output Timing
DIGITAL INPUT TIMING REQUIREMENTS
PARAMETER
tsu(FS-CK)
Setup time, FS low before next negative SCLK edge
TYP
MAX
UNIT
8
ns
tsu(C16-FS)
Setup time, 16th negative edge after FS low on which bit D0 is sampled before rising edge
of FS. µC mode only
10
ns
tsu(FS-C17)
µC mode, setup time, FS high before 17th positive SCLK.
10
ns
tsu(CK-FS)
DSP mode, setup time, SLCK low before FS low.
5
ns
twL(LDAC)
LDAC duration low
10
ns
twH
SCLK pulse duration high
16
ns
twL
SCLK pulse duration low
16
ns
tsu(D)
Setup time, data ready before SCLK falling edge
8
ns
th(D)
Hold time, data held valid after SCLK falling edge
5
ns
twH(FS)
FS duration high
10
ns
twL(FS)
FS duration low
10
ns
ts
4
MIN
See Analog Output Dynamic
Performance
Settling time
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Functional Block Diagram
REF
12/10
12/10
12/10
X2
DAC A
Holding
Latch
OUTA
DAC A
Latch
SCLK
DIN
DOUT
12
Serial
Interface
FS
8
DAC B, C, D, E, F, G, and H
Same as DAC A
MODE
PRE
LDAC
OUT
B, C, D,
E, F, G,
and H
Terminal Functions
TERMINAL
NAME
NO.
I/O
DESCRIPTION
AGND
10
P
Analog ground
AVDD
11
P
Analog power supply
DGND
1
P
Digital ground
DIN
2
I
Digital serial data input
DOUT
19
O
Digital serial data output
DVDD
20
P
Digital power supply
FS
4
I
Frame sync input
LDAC
18
I
Load DAC. The DAC outputs are only updated if this signal is low. It is an asynchronous input.
MODE
17
I
DSP/µC mode pin. High = µC mode; NC = DSP mode.
PRE
5
I
Preset input
REF
16
I
Voltage reference input
SCLK
3
I
Serial clock input
12–15, 6–9
O
DAC outputs A, B, C, D, E, F, G and H
OUTA–OUTH
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TYPICAL CHARACTERISTICS
OUTPUT LOAD REGULATION
OUTPUT LOAD REGULATION
1.0
1.0
VDD = 3V,
VREF = 2V,
Zero Scale
0.9
VDD = 5V,
VREF = 4V
Zero Scale
0.9
0.8
0.8
0.7
VO, Output Voltage (V)
VO, Output Voltage (V)
Fast
0.6
0.5
0.4
0.3
0.7
0.6
0.5
Fast
0.4
0.3
0.2
0.2
0.1
0.1
Slow
Slow
0
0
0.5
0
1.5
1.0
Sinking Current, mA
0
2.0
0.5
Figure 3.
1.5
1.0
Sinking Current (mA)
2.0
Figure 4.
OUTPUT LOAD REGULATION
OUTPUT LOAD REGULATION
2.06
4.12
2.055
Slow
VDD = 3V,
VREF = 2V,
Full Scale
VDD = 5V,
VREF = 4V
Full Scale
4.11
Fast
2.05
VO, Output Voltage (V)
VO, Output Voltage (V)
4.10
Fast
2.045
2.04
2.035
Slow
4.09
4.08
4.07
4.06
2.03
2.025
0.05
4.05
4.04
0.5
1
1.5
2
2.5
3
Sourcing Current (mA)
3.5
4
0
1.0
1.5
2.0
2.5
Sourcing Current (mA)
Figure 5.
6
0.5
Figure 6.
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3.0
3.5
4.0
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TYPICAL CHARACTERISTICS (continued)
INTEGRAL NONLINEARITY
vs CODE
4
3
INL (LSB)
2
1
0
-1
-2
-3
-4
0
1024
2048
3072
4096
3072
4096
Code
Figure 7.
DIFFERENTIAL NONLINEARITY
vs CODE
1.0
0.8
0.4
DNL (LSB)
0.6
0.2
0
-0.2
-0.4
-0.6
-0.8
-1.0
0
1024
2048
Code
Figure 8.
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APPLICATION INFORMATION
GENERAL FUNCTION
The TLV5610IYZ is an eight-channel, 12-bit, single-supply DAC, based on a resistor string architecture. The
TLV5610IYZ, a green/PB-free device, is pin-compatible with the TLV5610IYE. The TLV5610IYZ consists of a
serial interface, a speed and power-down control logic, a reference input buffer, a resistor string, and a rail-to-rail
output buffer.
The output voltage (full-scale determined by external reference) for each channel is given by:
REF CODE [V]
0x1000
(1)
Where:
REF is the reference voltage.
CODE is the digital input value.
The input range is 0x000 to 0xFFF.
A power on reset initially puts the internal latches to a defined state (all bits zero).
SERIAL INTERFACE
A falling edge of FS starts shifting the data on DIN, starting with the MSB to the internal register on the falling
edges of SCLK. After 16 bits have been transferred, the content of the shift register is moved to one of the DAC
holding registers, depending on the address bits within the data word. A logic '0' on the LDAC pin is required to
transfer the content of the DAC holding register to the DAC latch and to update the DAC outputs. LDAC is an
asynchronous input; it can be held low if a simultaneous update of all eight channels is not needed.
For daisy-chaining, DOUT provides the data sampled on DIN with a delay of 16 clock cycles.
DSP Mode:
SCLK
FS
DIN
X
D15
D14
D1
D0
E15
E14
X
D15
D14
D1
D0
X
E15
E1
E0
X
E1
E0
X
X
F15
F15
X
F15
F15
mC Mode:
SCLK
FS
DIN
E14
X
Figure 9. Timing Diagrams
The differences between DSP mode (MODE = NC or 0) and µC (MODE = 1) mode:
• In µC mode, FS must be held low until all 16 data bits have been transferred. If FS is driven high before the
16th falling clock edge, the data transfer is cancelled. The DAC is updated after a rising edge on FS.
• In DSP mode, FS must only stay low for 20ns and can go high before the 16th falling clock edge.
8
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APPLICATION INFORMATION (continued)
SERIAL CLOCK FREQUENCY AND UPDATE RATE
The maximum serial clock frequency is given by:
1
f
+
+ 30MHz
sclkmax
t
)t
whmin
wlmin
(2)
The maximum update rate is given by:
1
f
+
+ 1.95MHz
updatemax
Ǔ
16ǒt
)t
whmin
wlmin
(3)
Note that the maximum update rate is just a theoretical value for the serial interface because the settling time of
the DAC must also be considered.
DATA FORMAT
The 16 bit data word consists of two parts:
1. Address bits (D15...D12)
2. Data bits (D11...D0)
Table 1. Data Format (1)
D15
D14
D13
D12
A3
A2
A1
A0
(1)
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
Data
Ax: Address bits. See Table 2.
REGISTER MAP
Table 2. Register Map
A3
A2
A1
A0
FUNCTION
0
0
0
0
DAC A
0
0
0
1
DAC B
0
0
1
0
DAC C
0
0
1
1
DAC D
0
1
0
0
DAC E
0
1
0
1
DAC F
0
1
1
0
DAC G
0
1
1
1
DAC H
1
0
0
0
CTRL0
1
0
0
1
CTRL1
1
0
1
0
Preset
1
0
1
1
Reserved
1
1
0
0
DAC A and B
1
1
0
1
DAC C and D
1
1
1
0
DAC E and F
1
1
1
1
DAC G and H
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DAC A-H AND TWO-CHANNEL REGISTERS
Writing to DAC A–H sets the output voltage of channel A–H. It is possible to automatically generate the
complement of one channel by writing to one of the four, two-channel registers (DAC A and B, etc.).
The TLV5610IYZ decodes all 12 data bits.
PRESET
The outputs of all DAC channels can be driven to a predefined value stored in the preset register by driving the
PRE input low. The PRE input is asynchronous to the clock.
CTRL0
Table 3. CTRL0 Bit Register
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
X
X
X
X
X
X
X
PD
DO
X
X
IM
Bit Definitions:
PD
Full Device Power Down.
0 = Normal
1 = Power Down
DO
Digital Output Enable.
0 = Disable
1 = Enable
IM
Input Mode.
0 = Straight Binary
1 = Twos Complement
X
Reserved.
If DOUT is enabled, the data input on DIN is output on DOUT with a 16-cycle delay. This feature makes it
possible to daisy-chain multiple DACs on one serial bus.
CTRL1
Table 4. CTRL1 Bit Register
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
X
X
X
X
X
X
X
PD
DO
X
X
IM
Bit Definitions:
PXY
Power Down DACXY. In power-down mode, the amplifiers of the selected DAC pair within the device
are disabled and the total power consumption of the device is significantly reduced. Power-down
mode of a specific DAC pair can be selected by setting the PXY bit within the data word to '1'.
0 = Normal
1 = Power Down
SXY
DACXY Speed Mode. There are two settling time modes: fast and slow. Fast mode of a DAC pair is
selected by setting SXY to '1', and slow mode is selected by setting SXY to '0'.
0 = Slow
1 = Fast
NOTE: XY refers to DAC pair AB, CD, EF, or GH.
10
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USING THE TLV5610IYZ WAFER CHIP-SCALE PACKAGE (WCSP)
TLV5610 qualifications are done using a wire-bonded small outline (SO) package. The qualifications include:
steady state life, thermal shock, ESD, latch-up, biased HAST, autoclave, and characterization. These qualified
devices are orderable as TLV5610IDW.
NOTE: The wafer chip-scale package (WCSP) for the TLV5610IYZ uses the same die as TLV5610IDW, but is
not qualified. WCSP qualification, including board level reliability (BLR), is the responsibility of the customer.
It is recommended that underfill be used for increased reliability. BLR is application-dependent, but may include
tests such as: temperature cycling, drop test, key push, bend, vibration, and package shear.
For general guidelines on board assembly of the WCSP, the following documentation provides more details:
•
•
Application Report NanoStar™ & NanoFree™ 300µm Solder Bump WCSP Application—SBVA017
Design Summary WCSP Little Logic—SCET007B
NOTE: The use of underfill is required and greatly reduces the risk of thermal mismatch fails.
Underfill is an epoxy/adhesive that may be added during the board assembly process to improve board
level/system level reliability. The process is to dispense the epoxy under the dice after die attach reflow. The
epoxy adheres to the body of the device and to the printed-circuit board. It reduces stress placed upon the
solder joints because of thermal coefficient of expansion (TCE) mismatch between the board and the
component. Underfill material is highly filled with silica or other fillers to increase epoxy modulus, reduce creep
sensitivity, and decrease material TCE.
NOTE: The recommendation for peak flow temperatures of +250°C to +260°C is based on general empirical
results that indicate that this temperature range is needed to facilitate good wetting of the solder bump to the
substrate or circuit board pad. Lower peak temperatures may cause nonwets (cold solder joints).
Bottom View
Top View
A.
All linear dimensions are in millimeters.
B.
This drawing is subject to change without notice.
Figure 10. TLV5610IYZ Wafer Chip-Scale Package
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Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Original (July 2006) to A Revision ......................................................................................................... Page
•
•
•
12
Deleted separate INL and DNL specifications for Code 20 to 1023; not relevant to this device.......................................... 3
Replaced timing diagram ...................................................................................................................................................... 4
Updated Digital Input Timing Requirements Table ............................................................................................................... 4
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PACKAGE OPTION ADDENDUM
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21-Aug-2012
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package
Drawing
Pins
Package Qty
Eco Plan
(2)
Lead/
Ball Finish
MSL Peak Temp
(3)
Samples
(Requires Login)
TLV5610IYZR
ACTIVE
DSBGA
YZ
20
3000
Green (RoHS
& no Sb/Br)
SNAGCU
Level-NC-NC-UNLIM
TLV5610IYZT
ACTIVE
DSBGA
YZ
20
250
Green (RoHS
& no Sb/Br)
SNAGCU
Level-NC-NC-UNLIM
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
21-Aug-2012
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
TLV5610IYZR
DSBGA
YZ
20
3000
180.0
8.4
TLV5610IYZT
DSBGA
YZ
20
250
180.0
8.4
Pack Materials-Page 1
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
2.18
3.18
1.0
4.0
8.0
Q2
2.18
3.18
1.0
4.0
8.0
Q2
PACKAGE MATERIALS INFORMATION
www.ti.com
21-Aug-2012
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
TLV5610IYZR
DSBGA
YZ
20
3000
220.0
220.0
34.0
TLV5610IYZT
DSBGA
YZ
20
250
220.0
220.0
34.0
Pack Materials-Page 2
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