TI TLV5627CDG4

 SLAS232A − JUNE1999 − REVISED JULY 2002
D Four 8-Bit D/A Converters
D Programmable Settling Time
of 2.5 µs or 8.5 µs Typ
D TMS320, (Q)SPI, and Microwire
D
D
D
D
Compatible Serial Interface
Low Power Consumption:
7 mW, Slow Mode − 5-V Supply
3 mW, Slow Mode − 3-V Supply
Reference Input Buffers
Monotonic Over Temperature
Dual 2.7-V to 5.5-V Supply (Separate Digital
and Analog Supplies)
D Hardware Power Down
D Software Power Down
D Simultaneous Update
applications
D
D
D
D
D
Battery Powered Test Instruments
Digital Offset and Gain Adjustment
Industrial Process Controls
Machine and Motion Control Devices
Arbitrary Waveform Generation
D OR PW PACKAGE
(TOP VIEW)
description
The TLV5627 is a four channel, 8-bit voltage
output digital-to-analog converter (DAC) with a
flexible 4-wire serial interface. The 4-wire serial
interface allows glueless interface to TMS320,
SPI, QSPI, and Microwire serial ports. The
TLV5627 is programmed with a 16-bit serial word
comprised of a DAC address, individual DAC
control bits, and an 8-bit DAC value.
DVDD
PD
LDAC
DIN
SCLK
CS
FS
DGND
1
16
2
15
3
14
4
13
5
12
6
11
7
10
8
9
AVDD
REFINAB
OUTA
OUTB
OUTC
OUTD
REFINCD
AGND
The device has provision for two supplies: one
digital supply for the serial interface (via pins
DVDD and DGND), and one for the DACs,
reference buffers and output buffers (via pins AVDD and AGND). Each supply is independent of the other, and
can be any value between 2.7 V and 5.5 V. The dual supplies allow a typical application where the DAC will be
controlled via a microprocessor operating on a 3-V supply (also used on pins DVDD and DGND), with the DACs
operating on a 5-V supply. The digital and analog supplies can be tied together.
The resistor string output voltage is buffered by an x2 gain rail-to-rail output buffer. The buffer features a
Class AB output stage to improve stability and reduce settling time. A rail-to-rail output stage and a power-down
mode make it ideal for single voltage, battery based applications. The settling time of the DAC is programmable
to allow the designer to optimize speed versus power dissipation. The settling time is chosen by the control bits
within the 16-bit serial input string. A high-impedance buffer is integrated on the REFINAB and REFINCD
terminals to reduce the need for a low source impedance drive to the terminal. REFINAB and REFINCD allow
DACs A and B to have a different reference voltage than DACs C and D.
The device, implemented with a CMOS process, is available in 16-terminal SOIC and TSSOP packages. The
TLV5627C is characterized for operation from 0°C to 70°C. The TLV5627I is characterized for operation from
−40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
Copyright  2002, Texas Instruments Incorporated
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AVAILABLE OPTIONS
PACKAGE
TA
SOIC
(D)
TSSOP
(PW)
0°C to 70°C
TLV5627CD
TLV5627CPW
−40°C to 85°C
TLV5627ID
TLV5627IPW
functional block diagram
AVDD
15
REFINAB
DVDD
16
1
DAC A
+
_
Power-On
Reset
DIN
4
Serial
Input
Register
10
2
10-Bit
Data
and
Control
Register
7
FS
5
SCLK
CS
6
14
x2
8
8-Bit
DAC
Latch
2
2-Bit
Control
Data
Latch
DAC
Select/
Control
Logic
OUTA
8
2
Power Down/
Speed Control
13
DAC B
OUTB
DAC C
12
OUTC
DAC D
11
OUTD
REFINCD
3
9
AGND
2
2
8
DGND
LDAC
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Terminal Functions
TERMINAL
NAME
NO.
I/O
DESCRIPTION
AGND
9
AVDD
CS
16
DGND
8
DIN
4
DVDD
1
FS
7
I
Frame sync input. The falling edge of the frame sync pulse indicates the start of a serial data frame shifted out
to the TLV5627.
PD
2
I
Power-down pin. Powers down all DACs (overriding their individual power down settings), and all output stages.
This terminal is active low.
LDAC
3
I
Load DAC. When the LDAC signal is high, no DAC output updates occur when the input digital data is read into
the serial interface. The DAC outputs are only updated when LDAC is low.
REFINAB
15
I
Voltage reference input for DACs A and B.
REFINCD
10
I
Voltage reference input for DACs C and D.
6
Analog ground
Analog supply
I
Chip select. This terminal is active low.
Digital ground
I
Serial data input
Digital supply
SCLK
5
I
Serial clock input
OUTA
14
O
DAC A output
OUTB
13
O
DAC B output
OUTC
12
O
DAC C output
OUTD
11
O
DAC D output
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage, (DVDD, AVDD to GND) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Supply voltage difference, (AVDD to DVDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −2.8 V to 2.8 V
Digital input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to DVDD + 0.3 V
Reference input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to AVDD + 0.3 V
Operating free-air temperature range, TA: TLV5627C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
TLV5627I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 85°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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recommended operating conditions
Supply voltage, AVDD, DVDD
High-level digital input voltage, VIH
Low-level digital input voltage, VIL
Reference voltage, Vref to REFINAB, REFINCD terminal
MIN
NOM
5-V supply
4.5
5
5.5
3-V supply
2.7
3
3.3
DVDD = 2.7 V
2
DVDD = 5.5 V
2.4
MAX
UNIT
V
V
DVDD = 2.7 V
0.6
DVDD = 5.5 V
1
5-V supply (see Note 1)
0
2.048
3-V supply (see Note 1)
0
1.024
2
10
Load resistance, RL
AVDD−1.5
AVDD−1.5
V
V
kΩ
Load capacitance, CL
100
pF
Serial clock rate, SCLK
20
MHz
Operating free-air temperature
TLV5627C
0
70
TLV5627I
−40
85
°C
NOTE 1: Voltages greater than AVDD/2 will cause output saturation for large DAC codes.
electrical characteristics over recommended operating free-air temperature range
(unless otherwise noted)
static DAC specifications
PARAMETER
TEST CONDITIONS
Resolution
EZS
EG
MIN
TYP
MAX
8
UNIT
bits
Integral nonlinearity (INL), end point adjusted
See Note 2
±0.3
±0.5
LSB
Differential nonlinearity (DNL)
See Note 3
±0.03
±0.5
LSB
Zero scale error (offset error at zero scale)
See Note 4
Zero scale error temperature coefficient
See Note 5
Gain error
See Note 6
Gain error temperature coefficient
See Note 7
±10
10
±0.6
10
mV
ppm/°C
%of FS
voltage
ppm/°C
NOTES: 2. The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error, is the maximum deviation of the output
from the line between zero and full scale excluding the effects of zero code and full-scale errors.
3. The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measured and ideal
1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains
constant) as a change in the digital input code.
4. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
5. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (Tmax) − EZS (Tmin)]/Vref × 106/(Tmax − Tmin).
6. Gain error is the deviation from the ideal output (2Vref − 1 LSB) with an output load of 10 kΩ excluding the effects of the zero-error.
7. Gain temperature coefficient is given by: EG TC = [EG(Tmax) − EG (Tmin)]/Vref × 106/(Tmax − Tmin).
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electrical characteristics over recommended operating free-air temperature range
(unless otherwise noted) (continued)
individual DAC output specifications
PARAMETER
VO
TEST CONDITIONS
Voltage output
RL = 10 kΩ
Output load regulation accuracy
RL = 2 kΩ vs 10 kΩ
MIN
TYP
0
MAX
AVDD−0.4
0.1
UNIT
V
0.25
% of FS
voltage
MAX
UNIT
reference input (REFINAB, REFINCD)
PARAMETER
VI
RI
Input voltage range
CI
Input capacitance
TEST CONDITIONS
MIN
See Note 8
TYP
0
AVDD−1.5
Input resistance
Reference feed through
REFIN = 1 Vpp at 1 kHz + 1.024 V dc
(see Note 9)
Reference input bandwidth
REFIN = 0.2 Vpp + 1.024 V dc
V
10
MΩ
5
pF
−75
dB
Slow
0.5
Fast
1
MHz
NOTES: 8. Reference input voltages greater than VDD/2 will cause output saturation for large DAC codes.
9. Reference feedthrough is measured at the DAC output with an input code = 000 hex and a Vref(REFINAB or REFINCD)
input = 1.024 Vdc + 1 Vpp at 1 kHz.
digital inputs (D0−D11, CS, WEB, LDAC, PD)
PARAMETER
IIH
IIL
High-level digital input current
CI
Input capacitance
TEST CONDITIONS
MIN
TYP
VI = DVDD
VI = 0 V
Low-level digital input current
MAX
UNIT
±1
µA
±1
µA
3
pF
power supply
PARAMETER
TEST CONDITIONS
5-V supply, No load, Clock running
IDD
Power supply current
3-V supply, No load, Clock running
Power down supply current, See Figure 12
Power supply rejection ratio
Gain
MIN
MAX
1.4
2.2
Fast
3.5
5.5
Slow
1
1.5
Fast
3
4.5
1
Zero scale gain
PSRR
TYP
Slow
UNIT
mA
mA
µA
−68
See Notes 10 and 11
−68
dB
10. Zero-scale-error rejection ratio (EZS−RR) is measured by varying the AVDD from 5 ±0.5 V and 3 ±0.3 V dc, and measuring the
proportion of this signal imposed on the zero-code output voltage.
11. Gain-error rejection ratio (EG-RR) is measured by varying the AVDD from 5 ±0.5 V and 3 ±0.3 V dc and measuring the proportion
of this signal imposed on the full-scale output voltage after subtracting the zero scale change.
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electrical characteristics over recommended operating free-air temperature range
(unless otherwise noted) (continued)
analog output dynamic performance
PARAMETER
SR
TEST CONDITIONS
CL = 100 pF, RL = 10 kΩ,
VO = 10% to 90%,
Vref = 2.048 V, 1024 V
Output slew rate
ts
Output settling time
To ± 0.1 LSB, CL = 100 pF,
RL = 10 kΩ, See Notes 12 and 14
ts(c)
Output settling time, code to code
To ± 0.1 LSB, CL = 100 pF,
RL = 10 kΩ, See Notes 13 and 14
Glitch energy
Code transition from 7F0 to 800
SNR
Signal-to-noise ratio
S/(N+D)
Signal to noise + distortion
THD
Total harmonic distortion
SFDR
Spurious free dynamic range
MIN
Fast
TYP
MAX
5
UNIT
V/µs
Slow
1
Fast
2.5
4
V/µs
Slow
8.5
18
Fast
1
Slow
2
µss
µss
10
nV-sec
57
Sinewave generated by DAC,
Reference voltage = 1.024 at 3 V and 2.048 at 5 V,
fs = 400 KSPS, fOUT = 1.1 kHz sinewave,
CL = 100 pF,
RL = 10 kΩ,
BW = 20 kHz
49
dB
−50
60
NOTES: 12. Settling time is the time for the output signal to remain within ± 0.1 LSB of the final measured value for a digital input code change
of 0x020 to 0xFF0 or 0xFF0 to 0x020.
13. Settling time is the time for the output signal to remain within ± 0.1 LSB of the final measured value for a digital input code change
of one count.
14. Limits are ensured by design and characterization, but are not production tested.
digital input timing requirements
MIN
tsu(CS−FS)
tsu(FS−CK)
Setup time, CS low before FS↓
MAX
UNIT
ns
8
ns
tsu(C16−FS)
Setup time, sixteenth negative SCLK edge after FS low on which bit D0 is sampled before
rising edge of FS
10
ns
tsu(C16−CS)
Setup time. The first positive SCLK edge after D0 is sampled before CS rising edge. If FS
is used instead of the SCLK positive edge to update the DAC, then the setup time is between
the FS rising edge and CS rising edge.
10
ns
twH
twL
Pulse duration, SCLK high
25
ns
Pulse duration, SCLK low
25
ns
tsu(D)
Setup time, data ready before SCLK falling edge
8
ns
th(D)
twH(FS)
Hold time, data held valid after SCLK falling edge
5
ns
20
ns
6
Setup time, FS low before first negative SCLK edge
NOM
10
Pulse duration, FS high
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PARAMETER MEASUREMENT INFORMATION
SCLK
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎ
1
2
tsu(D)
DIN
twH
twL
3
4
5
15
16
th(D)
D15
D14
D13
D12
tsu(FS-CK)
D1
D0
ÎÎ
ÎÎ
ÎÎÎ
ÎÎÎ
tsu(C16-CS)
tsu(CS-FS)
CS
twH(FS)
tsu(C16-FS)
FS
Figure 1. Timing Diagram
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TYPICAL CHARACTERISTICS
LOAD REGULATION
LOAD REGULATION
0.35
0.20
VDD = 5 V,
VREF = 2 V,
VO = Full Scale
0.16
VO − Output Voltage − V
VO − Output Voltage − V
0.30
VDD = 3 V,
VREF = 1 V,
VO = Full Scale
0.18
0.25
5 V Slow Mode, Sink
0.20
5 V Fast Mode, Sink
0.15
0.10
0.14
3 V Slow Mode, Sink
0.12
0.10
3 V Fast Mode, Sink
0.08
0.06
0.04
0.05
0.02
0
0
0
0.02 0.04 0.1
0.2
0.4
0.8
1
2
4
0
Load Current − mA
0.01 0.02 0.05 0.1 0.2 0.5
Load Current − mA
Figure 2
0.8
1
2
Figure 3
LOAD REGULATION
LOAD REGULATION
4.002
2.003
4.00
2.0025
5 V Slow Mode, Source
3 V Fast Mode, Source
VO − Output Voltage − V
VO − Output Voltage − V
3.998
3.996
3.994
5 V Fast Mode, Source
3.992
3.99
3.988
VDD = 5 V,
VREF = 2 V,
VO = Full Scale
3.986
0.02 0.04 0.1 0.2 0.4 0.8
Load Current − mA
1
2
2.0015
3 V Slow Mode, Source
2.001
2.0005
2
VDD = 3 V,
VREF = 1 V,
VO = Full Scale
1.9995
3.984
0
2.002
4
1.999
0
0.01 0.02 0.05 0.1 0.2 0.5
Load Current − mA
Figure 4
8
Figure 5
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0.8
1
2
SLAS232A − JUNE1999 − REVISED JULY 2002
TYPICAL CHARACTERISTICS
SUPPLY CURRENT
vs
TEMPERATURE
SUPPLY CURRENT
vs
TEMPERATURE
4
4
VDD = 3 V,
VREF = 1.024 V,
VO = Full Scale
3.5
Fast Mode
Fast Mode
I DD − Supply Current − mA
I DD − Supply Current − mA
3.5
3
2.5
2
1.5
3
2.5
2
Slow Mode
1.5
Slow Mode
1
VDD = 5 V,
VREF = 1.024 V,
VO = Full Scale
1
0.5
−40
−20
0
20
40
60
80
0.5
−40
100
−20
T − Temperature − °C
20
40
60
80
100
T − Temperature − °C
Figure 6
Figure 7
TOTAL HARMONIC DISTORTION
vs
FREQUENCY
TOTAL HARMONIC DISTORTION
vs
FREQUENCY
0
0
Vref = 1 V dc + 1 V p/p Sinewave,
Output Full Scale
−10
THD − Total Harmonic Distortion − dB
THD − Total Harmonic Distortion − dB
0
−20
−30
−−40
−50
−60
Fast Mode
−70
−80
0
5
10
20
30
50
100
Vref = 1 V dc + 1 V p/p Sinewave,
Output Full Scale
−10
−20
−30
−−40
−50
−60
Slow Mode
−70
−80
0
5
f − Frequency − kHz
10
20
30
50
100
f − Frequency − kHz
Figure 8
Figure 9
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TYPICAL CHARACTERISTICS
0
Vref = 1 V dc + 1 V p/p Sinewave,
Output Full Scale
−10
TOTAL HARMONIC DISTORTION AND NOISE
vs
FREQUENCY
THD − Total Harmonic Distortion And Noise − dB
THD − Total Harmonic Distortion And Noise − dB
TOTAL HARMONIC DISTORTION AND NOISE
vs
FREQUENCY
−20
−30
−−40
−50
Fast Mode
−60
−70
−80
0
Vref = 1 V dc + 1 V p/p Sinewave,
Output Full Scale
−10
−20
−30
−−40
−50
Slow Mode
−60
−70
−80
0
5
10
30
20
50
100
0
5
10
f − Frequency − kHz
Figure 10
Figure 11
SUPPLY CURRENT
vs
TIME
(WHEN ENTERING POWER-DOWN MODE)
4000
I DD − Supply Current − µ A
3500
3000
2500
2000
1500
1000
500
0
0
200
400
600
800
t − Time − ns
Figure 12
10
20
30
f − Frequency − kHz
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1000
50
100
SLAS232A − JUNE1999 − REVISED JULY 2002
TYPICAL CHARACTERISTICS
DNL − Differential Nonlinearity − LSB
DIFFERENTIAL NONLINEARITY
vs
DIGITAL OUTPUT CODE
0.20
0.15
0.10
0.05
−0.00
−0.05
−0.10
−0.15
−0.20
0
64
128
192
255
Digital Output Code
Figure 13
INL − Integral Nonlinearity − LSB
INTEGRAL NONLINEARITY
vs
DIGITAL OUTPUT CODE
0.4
0.3
0.2
0.1
−0.0
−0.1
−0.2
−0.3
−0.4
0
64
128
192
255
Digital Output Code
Figure 14
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APPLICATION INFORMATION
general function
The TLV5627 is an 8-bit single supply DAC based on a resistor string architecture. The device consists of a serial
interface, speed and power-down control logic, a reference input buffer, a resistor string, and a rail-to-rail output
buffer.
The output voltage (full scale determined by external reference) is given by:
2 REF CODE
[V]
2n
Where REF is the reference voltage and CODE is the digital input value within the range of 010 to 2n−1, where
n=8 (bits). The 16-bit data word, consisting of control bits and the new DAC value, is illustrated in the data format
section. A power-on reset initially resets the internal latches to a defined state (all bits zero).
serial interface
The device has to be enabled with CS set to low. A falling edge of FS starts shifting the data bit-per-bit (starting
with the MSB) to the internal register on the falling edges of SCLK. After 16 bits have been transferred or FS
rises, the content of the shift register is moved to the DAC latch, which updates the voltage output to the new
level.
The serial interface of the TLV5627 can be used in two basic modes:
D Four wire (with chip select)
D Three wire (without chip select)
Using chip select (four-wire mode), it is possible to have more than one device connected to the serial port of
the data source (DSP or microcontroller). The interface is compatible with the TMS320 family. Figure 15 shows
an example with two TLV5627s connected directly to a TMS320 DSP.
TLV5627
TLV5627
CS FS DIN SCLK
CS FS DIN SCLK
TMS320
DSP
XF0
XF1
FSX
DX
CLKX
Figure 15. TMS320 Interface
12
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APPLICATION INFORMATION
serial interface (continued)
If there is no need to have more than one device on the serial bus, then CS can be tied low. Figure 16 shows
an example of how to connect the TLV5627 to a TMS320, SPI, or Microwire port using only three pins.
TMS320
DSP
TLV5627
FSX
SPI
FS
DIN
DX
CLKX
TLV5627
FS
DIN
SS
MOSI
SCLK
SCLK
Microwire
FS
DIN
I/O
SO
SK
SCLK
CS
TLV5627
SCLK
CS
CS
Figure 16. Three-Wire Interface
Notes on SPI and Microwire: Before the controller starts the data transfer, the software has to generate a falling
edge on the I/O pin connected to FS. If the word width is 8 bits (SPI and Microwire), two write operations must
be performed to program the TLV5627. After the write operation(s), the DAC output is updated automatically
on the next positive clock edge following the sixteenth falling clock edge.
serial clock frequency and update rate
The maximum serial clock frequency is given by:
f
SCLKmax
+
t
wH(min)
1
)t
+ 20 MHz
wL(min)
The maximum update rate is:
f
UPDATEmax
+
1
ǒ wH(min) ) twL(min)Ǔ
+ 1.25 MHz
16 t
The maximum update rate is a theoretical value for the serial interface since the settling time of the TLV5627
has to be considered also.
data format
The 16-bit data word for the TLV5627 consists of two parts:
D Control bits
D New DAC value
D15
D14
D13
D12
A1
A0
PWR
SPD
SPD: Speed control bit.
PWR: Power control bit.
(D15 . . . D12)
(D11 . . . D0)
D11
1 → fast mode
1 → power down
D10
D9
D8
D7
D6
D5
New DAC value (8 bits)
D4
D3
D2
D1
D0
0
0
0
0
0 → slow mode
0 → normal operation
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• DALLAS, TEXAS 75265
13
SLAS232A − JUNE1999 − REVISED JULY 2002
APPLICATION INFORMATION
In power-down mode, all amplifiers within the TLV5627 are disabled. A particular DAC (A, B, C, D) of the
TLV5627 is selected by A1 and A0 within the input word.
A1
A0
DAC
0
0
A
0
1
B
1
0
C
1
1
D
TLV5627 interfaced to TMS320C203 DSP
hardware interfacing
Figure 17 shows an example of how to connect the TLV5627 to a TMS320C203 DSP. The serial port is
configured in burst mode, with FSX generated by the TMS320C203 to provide the frame sync (FS) input to the
TLV5627. Data is transmitted on the DX line, with the serial clock input on the CLKX line. The general-purpose
input/output port bits IO0 and IO1 are used to generate the chip select ( CS) and DAC latch update ( LDAC)
inputs to the TLV5627. The active low power down ( PD) is pulled high all the time to ensure the DACs are
enabled.
TMS320C203
TLV5627
SDIN
DX
VDD
SCLK
CLKX
FSX
FS
I/O 0
CS
I/O 1
LDAC
PD
VOUTA
VOUTB
REF
REFINAB
VOUTC
REFINCD
VOUTD
VSS
Figure 17. TLV5627 Interfaced with TMS320C203
14
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SLAS232A − JUNE1999 − REVISED JULY 2002
APPLICATION INFORMATION
TLV5627 interfaced to MCS51 microcontroller
hardware interfacing
Figure 18 shows an example of how to connect the TLV5627 to an MCS51 Microcontroller. The serial DAC
input data and external control signals are sent via I/O Port 3 of the controller. The serial data is sent on the RxD
line, with the serial clock output on the TxD line. Port 3 bits 3, 4, and 5 are configured as outputs to provide the
DAC latch update (LDAC), chip select (CS) and frame sync (FS) signals for the TLV5627. The active low power
down pin (PD) of the TLV5627 is pulled high to ensure that the DACs are enabled.
MCS®51
TLV5627
RxD
SDIN
TxD
SCLK
P3.3
LDAC
P3.4
CS
P3.4
FS
VDD
PD
VOUTA
VOUTB
REF
REFINAB
VOUTC
REFINCD
VOUTD
VSS
Figure 18. TLV5627 Interfaced with MCS51
linearity, offset, and gain error using single ended supplies
When an amplifier is operated from a single supply, the voltage offset can still be either positive or negative. With
a positive offset, the output voltage changes on the first code change. With a negative offset, the output voltage
may not change with the first code, depending on the magnitude of the offset voltage.
The output amplifier attempts to drive the output to a negative voltage. However, because the most negative
supply rail is ground, the output cannot drive below ground and clamps the output at 0 V.
The output voltage then remains at zero until the input code value produces a sufficient positive output voltage
to overcome the negative offset voltage, resulting in the transfer function shown in Figure 19.
Output
Voltage
0V
DAC Code
Negative
Offset
Figure 19. Effect of Negative Offset (single supply)
MCS is a registered trademark of Intel Corporation.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
15
SLAS232A − JUNE1999 − REVISED JULY 2002
APPLICATION INFORMATION
linearity, offset, and gain error using single ended supplies (continued)
The offset error, not the linearity error, produces this breakpoint. The transfer function would have followed the
dotted line if the output buffer could drive below the ground rail.
For a DAC, linearity is measured between zero-input code (all inputs 0) and full-scale code (all inputs 1) after
offset and full scale are adjusted out or accounted for in some way. However, single supply operation does not
allow for adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity
is measured between full-scale code and the lowest code that produces a positive output voltage.
power-supply bypassing and ground management
Printed-circuit boards that use separate analog and digital ground planes offer the best system performance.
Wire-wrap boards do not perform well and should not be used. The two ground planes should be connected
together at the low-impedance power-supply source. The best ground connection may be achieved by
connecting the DAC AGND terminal to the system analog ground plane, making sure that analog ground
currents are well-managed and there are negligible voltage drops across the ground plane.
A 0.1-µF ceramic-capacitor bypass should be connected between VDD and AGND and mounted with short leads
as close as possible to the device. Use of ferrite beads may further isolate the system analog supply from the
digital power supply.
Figure 20 shows the ground plane layout and bypassing technique.
Analog Ground Plane
1
8
2
7
3
6
4
5
0.1 µF
Figure 20. Power-Supply Bypassing
16
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SLAS232A − JUNE1999 − REVISED JULY 2002
MECHANICAL DATA
D (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
14 PIN SHOWN
0.050 (1,27)
0.020 (0,51)
0.014 (0,35)
14
0.010 (0,25) M
8
0.008 (0,20) NOM
0.244 (6,20)
0.228 (5,80)
0.157 (4,00)
0.150 (3,81)
Gage Plane
0.010 (0,25)
1
7
0°−ā 8°
A
0.044 (1,12)
0.016 (0,40)
Seating Plane
0.069 (1,75) MAX
0.010 (0,25)
0.004 (0,10)
PINS **
0.004 (0,10)
8
14
16
A MAX
0.197
(5,00)
0.344
(8,75)
0.394
(10,00)
A MIN
0.189
(4,80)
0.337
(8,55)
0.386
(9,80)
DIM
4040047 / D 10/96
NOTES: A.
B.
C.
D.
All linear dimensions are in inches (millimeters).
This drawing is subject to change without notice.
Body dimensions do not include mold flash or protrusion, not to exceed 0.006 (0,15).
Falls within JEDEC MS-012
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
17
SLAS232A − JUNE1999 − REVISED JULY 2002
MECHANICAL DATA
PW (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
14 PIN SHOWN
0,30
0,19
0,65
14
0,10 M
8
0,15 NOM
4,50
4,30
6,60
6,20
Gage Plane
0,25
1
7
0°−ā 8°
0,75
0,50
A
Seating Plane
0,15
0,05
1,20 MAX
0,10
PINS **
8
14
16
20
24
28
A MAX
3,10
5,10
5,10
6,60
7,90
9,80
A MIN
2,90
4,90
4,90
6,40
7,70
9,60
DIM
4040064 / E 08/96
NOTES: A.
B.
C.
D.
18
All linear dimensions are in millimeters.
This drawing is subject to change without notice.
Body dimensions do not include mold flash or protrusion not to exceed 0,15.
Falls within JEDEC MO-153
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
PACKAGE OPTION ADDENDUM
www.ti.com
28-Aug-2008
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
TLV5627CD
ACTIVE
SOIC
D
16
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627CDG4
ACTIVE
SOIC
D
16
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627CDR
ACTIVE
SOIC
D
16
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627CDRG4
ACTIVE
SOIC
D
16
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627CPW
ACTIVE
TSSOP
PW
16
90
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627CPWG4
ACTIVE
TSSOP
PW
16
90
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627CPWR
ACTIVE
TSSOP
PW
16
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627CPWRG4
ACTIVE
TSSOP
PW
16
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627ID
ACTIVE
SOIC
D
16
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627IDG4
ACTIVE
SOIC
D
16
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627IPW
ACTIVE
TSSOP
PW
16
90
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627IPWG4
ACTIVE
TSSOP
PW
16
90
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627IPWR
ACTIVE
TSSOP
PW
16
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
TLV5627IPWRG4
ACTIVE
TSSOP
PW
16
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
28-Aug-2008
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
25-Sep-2009
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
TLV5627CDR
SOIC
D
16
2500
330.0
16.4
6.5
10.3
2.1
8.0
16.0
Q1
TLV5627CPWR
TSSOP
PW
16
2000
330.0
12.4
6.9
5.6
1.6
8.0
12.0
Q1
TLV5627IPWR
TSSOP
PW
16
2000
330.0
12.4
6.9
5.6
1.6
8.0
12.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
25-Sep-2009
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
TLV5627CDR
SOIC
D
16
2500
346.0
346.0
33.0
TLV5627CPWR
TSSOP
PW
16
2000
346.0
346.0
29.0
TLV5627IPWR
TSSOP
PW
16
2000
346.0
346.0
29.0
Pack Materials-Page 2
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