Fast Recovery Epitaxial Diode (FRED) Module PSND 100E IFAV VRRM = 104 A = 800-1200V Preliminary Data Sheet VRSM V 800 1000 1200 VRRM V 800 1000 1200 Type PSND 100E/08 PSND 100E/10 PSND 100E/12 Symbol Test Conditions IFAV IFSM TC = 70°C TVJ = 45°C VR = 0 t = 10 ms (50 Hz), sine t = 8.3 ms (60 Hz), sine 104 1500 1650 A A A TVJ = TVJM VR = 0 t = 10 ms (50 Hz), sine t = 8.3 ms (60 Hz), sine 1350 1480 A A TVJ = 45°C VR = 0 t = 10 ms (50 Hz), sine t = 8.3 ms (60 Hz), sine 11250 11300 A2 s A2 s TVJ = TVJM VR = 0 t = 10 ms (50 Hz), sine t = 8.3 ms (60 Hz), sine 9110 9090 A2 s A2 s -40 ... + 150 150 -40 ... + 125 °C °C °C ∫ i2 dt TVJ TVJM Tstg VISOL Md Weight 50/60 HZ, RMS IISOL ≤ 1 mA Maximum Ratings t = 1 min t=1s Mounting torque Terminal connection torque typ. (M6) (M6) 2500 3000 V∼ V∼ 5 5 270 Nm Nm g Features • Package with screw terminals • Isolation voltage 3000 V∼ • Planar glasspassivated chips • Short recovery time • Low forward voltage drop • Short recovery behaviour • UL registered, E 148688 Applications • Inductive heating and melting • Free wheeling diode in converters and motor control circuits • Uninterruptible power supplies (UPS) • Ultrasonic cleaners and welders Advantages • High reliability circuit operation • Low voltage peaks for reduced protection circuits • Low noise switching • Low losses Symbol Test Conditions Characteristic Value IR VR = VRRM TVJ = 25°C VR = VRRM TVJ = TVJM IF = 100 A TVJ = 25°C TVJ = 25°C; IF=1A; -diF/dt=400A/µs VR= 30V IF=100A; -diF/dt=200A/µs; VR=100V L ≤ 0,05 mH; TVJ = 100°C For power-loss calculations only TVJ = TVJM per diode; DC current per diode; DC current Creeping distance on surface Creeping distance in air Max. allowable acceleration ≤ ≤ ≤ VF trr IRM VTO rT RthJH RthJC dS dA a POWERSEM GmbH, Walpersdorfer Str. 53 91126 D- Schwabach Phone: 09122 - 9764-0 Fax.: 09122 - 9764-20 250 2.5 1.55 typ. 100 µA mA V ns typ. 48 A 0.7 1.8 0.84 0.65 10 9.4 50 V mΩ K/W K/W mm mm m/s2 Package, style and outline Dimensions in mm (1mm = 0.0394“) 2003 POWERSEM reserves the right to change limits, test conditions and dimensions