SSF4006 Feathers: ID =160A Advanced trench process technology BV=40V avalanche energy, 100% test Rdson=0.005Ω Fully characterized avalanche voltage and current Description: The SSF4006 is a new generation of high voltage and low current N–Channel enhancement mode trench power MOSFET. This new technology increases the device reliability SSF4006 TOP View (T0-220) and electrical parameter repeatability. SSF4006 is assembled in high reliability and qualified assembly house. Application: Commercial-industrial application Absolute Maximum Ratings Parameter Max. ID@Tc=25ْ C Continuous drain current,VGS@10V 160 ID@Tc=100ْC Continuous drain current,VGS@10V 100 IDM Pulsed drain current ① 640 Power dissipation 150 W Linear derating factor 2.0 W/ْ C Gate-to-Source voltage ±20 V 480 mJ PD@TC=25ْC VGS EAS Single pulse avalanche energy ② Units A EAR Repetitive avalanche energy TBD mJ dv/dt Peak diode recovery voltage 31 v/ns TJ Operating Junction and TSTG Storage Temperature Range –55 to +150 ْC Thermal Resistance Parameter Min. Typ. Max. RθJC Junction-to-case — 0.83 — RθJA Junction-to-ambient — — 62 Units ْC/W Electrical Characteristics @TJ=25 ْC(unless otherwise specified) Parameter Min. Typ. Drain-to-Source breakdown voltage 40 — RDS(on) Static Drain-to-Source on-resistance — VGS(th) 2.0 — 4.0 — — 1 — — 10 Gate-to-Source forward leakage — — 100 Gate-to-Source reverse leakage — — -100 BVDSS IDSS IGSS Gate threshold voltage Drain-to-Source leakage current ©Silikron Semiconductor CO.,LTD. 2009.6.10 Max. Units — 0.0045 0.005 Test Conditions V VGS=0V,ID=250μA Ω VGS=10V,ID=30A V VDS=VGS,ID=250μA VDS=40V,VGS=0V μA VDS=40V, VGS=0V,TJ=150ْC nA VGS=20V VGS=-20V Version : 1.0 page 1of4 SSF4006 90 — ID=30A,VGS=10V Qg Total gate charge Qgs Gate-to-Source charge — 14 — Qgd Gate-to-Drain("Miller") charge — 24 — td(on) Turn-on delay time — 18.2 Rise time — 15.6 Turn-Off delay time — 70.5 Fall time — 13.8 VGS=10V Ciss Input capacitance — 3150 VGS=0V Coss Output capacitance — 300 Crss Reverse transfer capacitance — 240 tr td(off) tf nC VDD=30V VDD=30V nS ID=2A ,RL=15Ω RG=2.5Ω pF VDS=25V f=1.0MHZ Source-Drain Ratings and Characteristics Parameter IS ISM Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) ① VSD Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge ton . Forward Turn-on Time . Min. Typ. Max. — — 160 Units Test Conditions MOSFET symbol showing the A integral reverse — — 640 — — 1.3 V TJ=25ْC,IS=40A,VGS=0V ③ - 57 — nS TJ=25ْC,IF=75A - 107 — μC di/dt=100A/μs ③ p-n junction diode. Intrinsic turn-on time is negligible (turn-on is dominated by Ls + LD) Notes: ① Repetitive rating; pulse width limited by max junction temperature. ② Test condition: L =0.3mH, VDD = 47V,Id=57A ③ Pulse width≤300μS, duty cycle≤1.5% ; RG = 25Ω Starting TJ = 25°C ©Silikron Semiconductor CO.,LTD. 2009.6.10 Version : 1.0 page 2of4 SSF4006 EAS Test Circuit: Gate Charge Test Circuit: Switch Time Test Circuit: ©Silikron Semiconductor CO.,LTD. Switch Waveform: 2009.6.10 Version : 1.0 page 3of4 SSF4006 TO-220 MECHANICAL DATA: ©Silikron Semiconductor CO.,LTD. 2009.6.10 Version : 1.0 page 4of4