SSM2318GEN N-channel Enhancement-mode Power MOSFET PRODUCT SUMMARY BVDSS 30V R DS(ON) 720mΩ ID 1A DESCRIPTION The SSM2318GEN acheives fast switching performance with low gate charge without a complex drive circuit. It is suitable for low voltage applications such as DC/DC converters and general load-switching circuits. The SSM2318GEN is supplied in an RoHS-compliant SOT-23-3 package, which is widely used for lower power commercial and industrial surface mount applications. Pb-free; RoHS-compliant SOT-23-3 D The gate has internal ESD protection. S SOT-23-3 G ABSOLUTE MAXIMUM RATINGS Symbol Parameter VDS Drain-source voltage VGS Gate-source voltage ID IDM PD Continuous drain current Pulsed drain current 3 , Value Units 30 V ± 16 V T A = 25°C 1 A TA = 70°C 800 mA 2 A 1.38 W 0.01 W/°C 1,2 3 Total power dissipation , TA = 25°C Linear derating factor TSTG Storage temperature range -55 to 150 °C TJ Operating junction temperature range -55 to 150 °C THERMAL CHARACTERISTICS Symbol RΘJA Parameter Maximum thermal resistance, junction-ambient 3 Value Units 90 °C/W Notes: 1.Pulse width must be limited to avoid exceeding the maximum junction temperature of 150°C. 2.Pulse width <300us, duty cycle <2%. 3.Mounted on a square inch of copper pad on FR4 board ; 270°C/W when mounted on the minimum pad area required for soldering. 6/16/2006 Rev.3.01 www.SiliconStandard.com 1 of 5 SSM2318GEN ELECTRICAL CHARACTERISTICS Symbol (at Tj = 25°C, unless otherwise specified) Parameter Test Conditions BVDSS Drain-source breakdown voltage VGS=0V, ID=250uA ∆ BV DSS/∆ Tj Breakdown voltage temperature coefficient Reference to 25°C, ID=1mA RDS(ON) Static drain-source on-resistance VGS=4V, ID=500mA VGS=2.5V, ID=200mA VGS(th) Gate threshold voltage Min. Typ. 30 - - V - 0.04 - V/°C 720 mΩ - - Max. Units - - 1200 mΩ VDS=VGS, ID=250uA 0.4 - 1.3 V gfs Forward transconductance VDS=4V, ID=500mA - 725 - mS IDSS Drain-source leakage current VDS=30V, VGS=0V - - 1 uA VDS=24V ,VGS=0V, Tj = 70°C - - 25 uA VGS=±16V - - ±30 uA ID=1A - 1.1 1.8 nC IGSS Gate-source leakage current 2 Qg Total gate charge Qgs Gate-source charge VDS=25V - 0.4 - nC Qgd Gate-drain ("Miller") charge VGS=4.5V - 0.4 - nC VDS=15V - 17 - ns - ns 2 td(on) Turn-on delay time tr Rise time ID=1A - 44 td(off) Turn-off delay time RG=3.3Ω , VGS=5V - 45 - ns tf Fall time RD=15Ω - 55 - ns Ciss Input capacitance VGS=0V - 30 48 pF Coss Output capacitance VDS=25V - 12 - pF Crss Reverse transfer capacitance f=1.0MHz - 11 - pF Source-Drain Diode Symbol VSD Parameter Forward voltage 2 Test Conditions IS=1A, VGS=0V Min. Typ. - - Max. Units 1.3 V Notes: 1.Pulse width must be limited to avoid exceeding the maximum junction temperature of 150°C. 2.Pulse width <300us, duty cycle <2%. 6/16/2006 Rev.3.01 www.SiliconStandard.com 2 of 5 SSM2318GEN 2.5 2.5 5.0V 4.5V 4.0 V ID , Drain Current (A) 2.0 o 5.0V 4.5V TA=150 C 2.0 ID , Drain Current (A) o T A = 25 C 1.5 1.0 2.5V 4.0 V 1.5 1.0 2.5V 0.5 0.5 V G = 1 .5V V G = 1 .5V 0.0 0.0 0.0 2.0 4.0 0.0 6.0 2.0 4.0 6.0 V DS , Drain-to-Source Voltage (V) V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 3300 2.0 I D =500mA V G =4V I D =200mA T A =25 o C Normalized RDS(ON) 1.6 RDS(ON) (mΩ ) 2300 1300 1.2 0.8 0.4 300 1 2 3 4 -50 5 0 V GS , Gate-to-Source Voltage (V) 50 100 150 o T j , Junction Temperature ( C) Fig 3. On-Resistance vs. Gate Voltage Fig 4. Normalized On-Resistance vs. Junction Temperature 2.0 1.0 0.8 Normalized VGS(th) (V) IS(A) 1.5 0.6 T j =150 o C T j =25 o C 0.4 1.0 0.5 0.2 0.0 0.0 0 0.2 0.4 0.6 0.8 1 V SD , Source-to-Drain Voltage (V) Fig 5. Forward Characteristic of 1.2 -50 0 100 150 Fig 6. Gate Threshold Voltage vs. Reverse Diode 6/16/2006 Rev.3.01 50 T j , Junction Temperature ( o C) www.SiliconStandard.com Junction Temperature 3 of 5 SSM2318GEN f=1.0MHz 12 100 V DS =15V V DS =20V V DS =25V 9 C (pF) VGS , Gate to Source Voltage (V) I D =1A 6 C iss 3 C oss C rss 10 0 0.0 0.5 1.0 1.5 2.0 1 2.5 5 9 13 17 21 25 29 V DS , Drain-to-Source Voltage (V) Q G , Total Gate Charge (nC) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 1 Normalized Thermal Response (Rthja) 10 1 ID (A) 10ms 100ms 0.1 T A =25 o C Single Pulse 1s DC Duty factor=0.5 0.2 0.1 0.1 PDM t T 0.05 Duty factor = t/T Peak Tj = PDM x Rthja + T a Rthja = 270°C/W 0.01 Single Pulse 0.01 0.01 0.1 1 10 100 0.0001 0.001 0.01 V DS , Drain-to-Source Voltage (V) 0.1 1 10 100 t , Pulse Width (s) Fig 9. Maximum Safe Operating Area Fig 10. Effective Transient Thermal Impedance 2.0 VG V DS =5V ID , Drain Current (A) 1.5 QG 4.5V T j =25 o C T j =150 o C QGS 1.0 QGD 0.5 Charge Q 0.0 0 2 4 6 V GS , Gate-to-Source Voltage (V) Fig 11. Transfer Characteristics 6/16/2006 Rev.3.01 Fig 12. Gate Charge Circuit www.SiliconStandard.com 4 of 5 SSM2318GEN PHYSICAL DIMENSIONS SOT-23-3 SOT-23-3 SYMBOL MILLIMETERS MIN. MAX. A 0.89 1.45 A1 0 0.15 A2 0.70 1.30 b 0.30 0.50 c 0.08 0.25 D 2.65 3.10 E 2.10 3.00 E1 1.19 2.30 e 0.95BSC e1 1.90BSC L 0.30 L1 Θ 0.60 0.60REF 0° 8° *Dimensions do not include mold protrusions. PART MARKING PART NUMBER CODE: NM = SSM2318GEN First character is underlined to indicate Pb-free part NMXX XX = DATE/LOT CODE - contact SSC for information on decoding this. PACKING: Moisture sensitivity level MSL3 3000 pcs in antistatic tape on a reel packed in a moisture barrier bag (MBB). Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 6/16/2006 Rev.3.01 www.SiliconStandard.com 5 of 5