SUNTAC IRF634B

IRF634B
!
POWER MOSFET
GENERAL DESCRIPTION
FEATURES
This Power MOSFET is designed for low voltage, high
‹ Dynamic dv/dt Rating
speed power switching applications such as switching
‹ Repetitive Avalanche Rated
regulators, converters, solenoid and relay drivers.
‹ Fast Switching
‹ Ease of Paralleling
‹ Simple Drive Requirements
PIN CONFIGURATION
SYMBOL
D
TO-220
SO URCE
DRAIN
G ATE
Top View
G
S
1
2
N-Channel MOSFET
3
ORDERING INFORMATION
Part Number
Package
IRF634B...............................................TO-220
ABSOLUTE MAXIMUM RATINGS
Rating
Drain to Current Ё Continuous
Ё Pulsed (Note 1)
Symbol
Value
Unit
ID
8.5
A
IDM
36
Gate-to-Source Voltage Ё Continue
VGS
±30
Total Power Dissipation
PD
Derate above 25к
Single Pulse Avalanche Energy (Note 2)
EAS
V
74
W
0.59
W/к
200
mJ
Avalanche Current (Note 1)
IAR
8.5
A
Repetitive Avalanche Energy (Note 1)
EAR
7.4
mJ
Peak Diode Recovery dv/dt (Note 3)
Operating and Storage Temperature Range
Thermal Resistance Ё Junction to Case
Ё Junction to Ambient
Maximum Lead Temperature for Soldering Purposes, 1/8” from case for 10 seconds
dv/dt
5.5
V/ns
TJ, TSTG
-55 to 150
к
șJC
1.70
к/W
șJA
62
TL
300
к
Page 1
IRF634B
!
POWER MOSFET
ELECTRICAL CHARACTERISTICS
Unless otherwise specified, TJ = 25к.
CIRF634B
Characteristic
Drain-Source Breakdown Voltage
(VGS = 0 V, ID = 250 ӴA)
Symbol
Min
V(BR)DSS
250
Typ
Max
Units
V
ӴA
Drain-Source Leakage Current
(VDS = 250V, VGS = 0 V)
(VDS = 160V, VGS = 0 V, TJ = 125к)
IDSS
Gate-Source Leakage Current-Forward
(Vgsf = 20 V, VDS = 0 V)
IGSSF
100
nA
Gate-Source Leakage Current-Reverse
(Vgsr = -20 V, VDS = 0 V)
IGSSR
-100
nA
Gate Threshold Voltage
(VDS = VGS, ID = 250 ӴA)
VGS(th)
4.0
V
Static Drain-Source On-Resistance (VGS = 10 V, ID = 5.4A) (Note 4)
RDS(on)
10
250
Forward Transconductance (VDS = 50V, ID = 5.4 A) (Note 4)
Input Capacitance
(VDS = 25 V, VGS = 0 V,
f = 1.0 MHz)
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
(VDD = 100 V, ID = 5.9 A,
RG = 12ȍ, RD = 16ȍ) (Note 4)
Fall Time
Total Gate Charge
(VDS = 160V, ID = 5.9A
VGS = 10 V) (Note 4)
Gate-Source Charge
Gate-Drain Charge
gFS
2.0
...............0.35..............0.45
3.8
ȍ
mhos
Ciss
780
Coss
100
pF
pF
Crss
26
pF
td(on)
9.4
tr
28
ns
ns
td(off)
39
ns
tf
20
ns
Qg
43
Qgs
7.0
nC
nC
Qgd
23
nC
Internal Drain Inductance
(Measured from the drain lead 0.25” from package to center of die)
LD
4.5
nH
Internal Drain Inductance
(Measured from the source lead 0.25” from package to source bond pad)
LS
7.5
nH
Qrr
1.1
ton
**
trr
170
SOURCE-DRAIN DIODE CHARACTERISTICS
Reverse Recovery Charge
Forward Turn-On Time
Reverse Recovery Time
Diode Forward Voltage
IF = 5.9A, di/dt = 100A/µs , TJ = 25к
(Note 4)
IS = 9.0A, VGS = 0 V, TJ = 25к (Note 4)
VSD
2.2
µC
340
ns
1.5
V
Note
(1) Repetitive rating; pulse width limited by max. junction temperature
(2)
VDD = 50V, starting TJ = 25к, L=4.9mH, RG = 25ȍ, IAS = 8.5A
(3)
ISD Љ 8.5A, di/dt Љ 300A/µs, VDD Љ V(BR)DSS, TJ Љ 150к
(4)
Pulse Test: Pulse Width Љ300µs, Duty Cycle Љ22%
** Negligible, Dominated by circuit inductance
Page 2
IRF634B
!
POWER MOSFET
TYPICAL ELECTRICAL CHARACTERISTICS
100
100
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
10
1
4.5V
0.1
20µs PULSE WIDTH
T = 25 C
°
J
0.01
0.1
1
10
10
4.5V
1
100
3.5
TJ = 25 ° C
V DS = 50V
20µs PULSE WIDTH
6.0
7.0
8.0
VGS , Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
7P
9.0
R DS(on) , Drain-to-Source On Resistance
(Normalized)
I D , Drain-to-Source Current (A)
TJ = 175 ° C
5.0
10
100
Fig 2. Typical Output Characteristics
100
0.1
4.0
°
J
1
VDS , Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
1
20µs PULSE WIDTH
T = 175 C
0.1
0.1
VDS , Drain-to-Source Voltage (V)
10
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
TOP
I D , Drain-to-Source Current (A)
I D , Drain-to-Source Current (A)
TOP
ID = 7.9A
3.0
2.5
2.0
1.5
1.0
0.5
0.0
-60 -40 -20
VGS = 10V
0
20 40 60 80 100 120 140 160 180
TJ , Junction Temperature ( °C)
Fig 4. Normalized On-Resistance
Vs. Temperature
Page 3
IRF634B
!
POWER MOSFET
VGS = 0V,
f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
1000
C, Capacitance(pF)
Coss = Cds + Cgd
Ciss
800
600
Coss
400
Crss
200
VGS , Gate-to-Source Voltage (V)
20
1200
10
100
12
8
4
FOR TEST CIRCUIT
SEE FIGURE 13
0
1000
0
10
100
10
TJ = 175 ° C
1
TJ = 25 ° C
V GS = 0 V
0.6
0.8
1.0
Fig 7. Typical Source-Drain Diode
Forward Voltage
P
ID , Drain-to-Source Current (A)
ISD , Reverse Drain Current (A)
100
0.4
30
40
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
VSD ,Source-to-Drain Voltage (V)
20
QG , Total Gate Charge (nC)
VDS , Drain-to-Source Voltage (V)
0.1
0.2
VDS = 200V
VDS = 125V
VDS = 50V
16
0
1
ID = 4.8A
1.2
OPERATION IN THIS AREA
LIMITED BY R DS (on)
10
100µsec
1
1msec
Tc = 25°C
Tj = 175°C
Single Pulse
0.1
1
10msec
10
100
1000
VDS , Drain-toSource Voltage (V)
Fig 8. Maximum Safe Operating Area
Page 4
IRF634B
!
POWER MOSFET
VDS
VGS
I D , Drain Current (A)
8.0
RD
D.U.T.
RG
+
-VDD
6.0
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
4.0
Fig 10a. Switching Time Test Circuit
2.0
VDS
90%
0.0
50
25
75
100
125
150
175
TC , Case Temperature ( ° C)
10%
VGS
Fig 9. Maximum Drain Current Vs.
Case Temperature
td(on)
tr
t d(off)
tf
Fig 10b. Switching Time Waveforms
Thermal Response (Z thJC )
10
1
D = 0.50
0.20
0.10
P DM
0.05
0.1
0.02
0.01
0.01
0.00001
SINGLE PULSE
(THERMAL RESPONSE)
t1
t2
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.0001
0.001
0.01
0.1
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
P
Page 5
IRF634B
!
POWER MOSFET
D R IV E R
L
VDS
D .U .T
RG
+
V
- DD
IA S
2V0GS
V
A
0 .0 1 Ω
tp
Fig 12a. Unclamped Inductive Test Circuit
V (B R )D SS
tp
EAS , Single Pulse Avalanche Energy (mJ)
1 5V
TOP
160
BOTTOM
ID
2.0A
3.4A
4.8A
120
80
40
0
25
50
75
100
125
150
175
Starting TJ , Junction Temperature ( °C)
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
IAS
Fig 12b. Unclamped Inductive Waveforms
Current Regulator
Same Type as D.U.T.
QG
10 V
50KΩ
12V
.2µF
.3µF
QGS
QGD
D.U.T.
VG
+
V
- DS
VGS
3mA
Charge
Fig 13a. Basic Gate Charge Waveform
P
IG
ID
Current Sampling Resistors
Fig 13b. Gate Charge Test Circuit
Page 6