MICRON MT24D836

OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
MT12D436
MT24D836
DRAM
MODULE
FEATURES
• JEDEC- and industry-standard pinout in a 72-pin,
single in-line memory module (SIMM)
• 16MB (4 Meg x 36) and 32MB (8 Meg x 36) parity
versions
• High-performance CMOS silicon-gate process
• Single 5V ±10% power supply
• All inputs, outputs and clocks are TTL-compatible
• Refresh modes: RAS#-ONLY, CAS#-BEFORE-RAS#
(CBR) and HIDDEN
• 2,048-cycle refresh distributed across 32ms
• FAST PAGE MODE (FPM) access cycle
• Multiple RAS# lines allow x18 or x36 widths
OPTIONS
MARKING
• Timing
60ns access
-6
• Packages
72 -pin SIMM
72 -pin SIMM (gold)
72-pin SIMM low profile (1.00")
72-pin SIMM (gold) low profile (1.00")
PIN ASSIGNMENT (Front View)
72-Pin SIMM
(DD-5) 4 Meg x 36 (shown)
(DD-6) 8 Meg x 36
(DD-7) 4 Meg x 36 Low Profile
PIN SYMBOL
PIN SYMBOL
PIN SYMBOL
PIN
1
Vss
19
A10
37
DQ18
55
2
DQ1
20
DQ5
38
DQ36
56
3
DQ19
21
DQ23
39
Vss
57
4
DQ2
22
DQ6
40
CAS0#
58
5
DQ20
23
DQ24
41
CAS2#
59
6
DQ3
24
DQ7
42
CAS3#
60
7
DQ21
25
DQ25
43
CAS1#
61
8
DQ4
26
DQ8
44
RAS0#
62
9
DQ22
27
DQ26
45 NC/RAS1#* 63
10
Vcc
28
A7
46
NC
64
11
NC
29
NC (A11)
47
WE#
65
12
A0
30
Vcc
48
NC
66
13
A1
31
A8
49
DQ10
67
14
A2
32
A9
50
DQ28
68
15
A3
33 NC/RAS3#* 51
DQ11
69
16
A4
34
RAS2#
52
DQ29
70
17
A5
35
DQ27
53
DQ12
71
18
A6
36
DQ9
54
DQ30
72
*32MB version only
M
G
DM
DG
KEY TIMING PARAMETERS
SPEED
-6
tRC
tRAC
tPC
tAA
tCAC
tRP
110ns
60ns
35ns
30ns
15ns
40ns
PART NUMBERS
PART NUMBER
MT12D436G-xx
MT12D436M-xx
MT12D436DG-xx
MT12D436DM-xx
MT24D836G-xx
MT24D836M-xx
xx = speed
CONFIGURATION
4 Meg x 36
4 Meg x 36
4 Meg x 36
4 Meg x 36
8 Meg x 36
8 Meg x 36
PLATING
Gold
Tin/Lead
Gold
Tin/Lead
Gold
Tin/Lead
HEIGHT
1.190"
1.190"
1.000"
1.000"
1.190"
1.190"
SYMBOL
DQ13
DQ31
DQ14
DQ32
Vcc
DQ33
DQ15
DQ34
DQ16
DQ35
DQ17
NC
PRD1
PRD2
PRD3
PRD4
NC
Vss
NOTE: Symbols in parentheses are not used on these modules but may be used
for other modules in this product family. They are for reference only.
GENERAL DESCRIPTION
The MT12D436 and MT24D836 are randomly accessed
16MB and 32MB solid-state memories organized in a x36
configuration. During READ or WRITE cycles, each bit is
uniquely addressed through the 22 address bits, which are
entered 11 bits (A0 -A10) at a time. RAS# is used to latch the
first 11 bits and CAS# the latter 11 bits. A READ or WRITE
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
cycle is selected with the WE# input. A logic HIGH on WE#
dictates READ mode, while a logic LOW on WE# dictates
WRITE mode. During a WRITE cycle, data-in (D) is latched
by the falling edge of CAS#. Since WE# goes LOW prior to
CAS# going LOW, the output pin(s) remain open (High-Z)
until the next CAS# cycle.
1
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
FAST PAGE MODE
FAST PAGE MODE operations allow faster data operations (READ or WRITE) within a row-address-defined (A0 A10) page boundary. The FAST PAGE MODE cycle is
always initiated with a row address strobed-in by RAS#
followed by a column address strobed-in by CAS#. CAS#
may be toggled-in by holding RAS# LOW and strobing-in
different column addresses, thus executing faster memory
cycles. Returning RAS# HIGH terminates the FAST PAGE
MODE operation.
the RAS# HIGH time. Memory cell data is retained in its
correct state by maintaining power and executing any
RAS# cycle (READ, WRITE) or RAS# refresh cycle (RAS#
ONLY, CBR or HIDDEN) so that all 2,048 combinations of
RAS# addresses (A 0-A10) are executed at least every 32ms,
regardless of sequence. The CBR REFRESH cycle will invoke the refresh counter for automatic RAS# addressing.
x18 CONFIGURATION
For x18 applications, the corresponding DQ and CAS#
pins must be connected together (DQ1 to DQ19, DQ2
to DQ20 and so forth, and CAS0# to CAS2# and CAS1# to
CAS3#). Each RAS# is then a bank select for the x18 memory
organization.
REFRESH
Returning RAS# and CAS# HIGH terminates a memory
cycle and decreases chip current to a reduced standby level.
Also, the chip is preconditioned for the next cycle during
FUNCTIONAL BLOCK DIAGRAM
MT12D436 (16MB)
DQ1
DQ10
DQ9
DQ1-4
WE#
DQ1-4
WE#
D
Q
WE#
DQ1-4
WE#
U2
U1
DQ18
U9
DQ1-4
WE#
U5
D
Q
WE#
U6
U10
CAS0#
CAS#
CAS#
CAS#
CAS#
CAS#
CAS#
RAS0#
RAS#
RAS#
RAS#
RAS#
RAS#
RAS#
OE# A0-A10
OE# A0-A10
OE# A0-A10
OE# A0-A10
11
11
11
11
CAS1#
A0-A10
11
A0-A10
11
WE#
DQ19
DQ27
DQ1-4
WE#
DQ1-4
WE#
U3
D
Q
WE#
DQ28
DQ36
DQ1-4
WE#
U11
U4
DQ1-4
WE#
U7
Q
D
WE#
U12
U8
CAS2#
CAS#
CAS#
CAS#
CAS#
CAS#
CAS#
RAS2#
RAS#
RAS#
RAS#
RAS#
RAS#
RAS#
OE# A0-A10
OE# A0-A10
OE# A0-A10
OE# A0-A10
11
11
11
11
CAS3#
A0-A10
11
A0-A10
11
A0-A10
VCC
U1-U12
VSS
U1-U12
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
U1-U8 = 4 Meg x 4 DRAMs
U9-U12 = 4 Meg x 1 DRAMs
2
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
FUNCTIONAL BLOCK DIAGRAM
MT24D836 (32MB)
DQ1
DQ10
DQ9
DQ1 - 4
WE#
DQ1 - 4
D
Q
WE#
WE#
U1
DQ18
DQ1 - 4
WE#
U2
DQ1 - 4
WE#
U17
D
Q
WE#
U5
U6
U18
CAS0#
CAS#
CAS#
CAS#
CAS#
CAS#
CAS#
RAS0#
RAS#
RAS#
RAS#
RAS#
RAS#
RAS#
OE# A0-A10
OE# A0-A10
OE# A0-A10
OE# A0-A10
11
11
11
11
CAS1#
A0-A10
11
DQ19
DQ27
DQ1 - 4
WE#
WE#
DQ1 - 4
D
Q
WE#
WE#
U3
11
DQ28
DQ36
DQ1 - 4
WE#
U4
A0-A10
DQ1 - 4
WE#
U7
U19
Q
D
WE#
U8
U20
CAS2#
CAS#
CAS#
CAS#
CAS#
CAS#
CAS#
RAS2#
RAS#
RAS#
RAS#
RAS#
RAS#
RAS#
OE# A0-A10
OE# A0-A10
OE# A0-A10
OE# A0-A10
11
11
11
11
11
DQ9
DQ10
CAS3#
A0-A10
A0-A10
11
A0-A10
DQ1
DQ1 - 4
WE#
DQ1 - 4
RAS1#
WE#
U16
DQ1 - 4
WE#
U11
U21
Q
D
WE#
U12
U22
CAS#
CAS#
CAS#
CAS#
CAS#
RAS#
RAS#
RAS#
RAS#
RAS#
RAS#
OE# A0-A10
OE# A0-A10
OE# A0-A10
OE# A0-A10
11
11
11
11
DQ1 - 4
WE#
A0-A10
11
DQ27
DQ1 - 4
D
Q
WE#
WE#
U13
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
DQ1 - 4
CAS#
DQ19
RAS3#
Q
WE#
WE#
U15
D
DQ18
11
DQ28
DQ36
DQ1 - 4
WE#
U14
A0-A10
DQ1 - 4
WE#
U9
U23
D
Q
WE#
U10
U24
CAS#
CAS#
CAS#
CAS#
CAS#
CAS#
RAS#
RAS#
RAS#
RAS#
RAS#
RAS#
OE# A0-A10
OE# A0-A10
OE# A0-A10
OE# A0-A10
11
11
11
11
VCC
U1-U24
VSS
U1-U24
A0-A10
11
A0-A10
11
U1-U16 = 4 Meg x 4 DRAMs
U17-U24 = 4 Meg x 1 DRAMs
3
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
TRUTH TABLE
ADDRESSES
DATA-IN/OUT
RAS#
CAS#
WE#
tR
tC
DQ1-DQ36
Standby
H
H→X
X
X
X
High-Z
READ
L
L
H
ROW
COL
Data-Out
EARLY WRITE
L
L
L
ROW
COL
Data-In
FUNCTION
FAST-PAGE-MODE
1st Cycle
L
H→L
H
ROW
COL
Data-Out
READ
2nd Cycle
L
H→L
H
n/a
COL
Data-Out
FAST-PAGE-MODE
1st Cycle
L
H→L
L
ROW
COL
Data-In
EARLY-WRITE
2nd Cycle
L
H→L
L
n/a
COL
Data-In
RAS#-ONLY REFRESH
L
H
X
ROW
n/a
High-Z
HIDDEN
READ
L→H→L
L
H
ROW
COL
Data-Out
REFRESH
WRITE
L→H→L
L
L
ROW
COL
Data-In
H→L
L
H
X
X
High-Z
CBR REFRESH
JEDEC-DEFINED
PRESENCE-DETECT – MT12D436 (16MB)
SYMBOL
PIN
-6
PRD1
67
VSS
PRD2
68
NC
PRD3
69
NC
PRD4
70
NC
JEDEC-DEFINED
PRESENCE-DETECT – MT24D836 (32MB)
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
SYMBOL
PIN
-6
PRD1
67
NC
PRD2
68
VSS
PRD3
69
NC
PRD4
70
NC
4
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect reliability.
ABSOLUTE MAXIMUM RATINGS*
Voltage on Any Pin Relative to VSS .................... -1V to +7V
Operating Temperature, TA (ambient) .......... 0°C to +70°C
Storage Temperature (plastic) .................... -55°C to +125°C
Power Dissipation ........................................................... 12W
Short Circuit Output Current ..................................... 50mA
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS
(Notes: 1, 5, 6) (VCC = +5V ±10%)
PARAMETER/CONDITION
SYMBOL
MIN
MAX
UNITS
Supply Voltage
VCC
4.5
5.5
V
Input High (Logic 1) Voltage, all inputs
VIH
2.4
5.5
V
Input Low (Logic 0) Voltage, all inputs
VIL
-1.0
0.8
V
NOTES
INPUT LEAKAGE CURRENT
RAS0#-RAS3#
II1
-12
12
µA
Any input 0V ≤ VIN ≤ 5.5V
A0-A10, WE#
II2
-48
48
µA
23
(All other pins not under test = 0V)
CAS0#-CAS3#
II3
-12
12
µA
23
OUTPUT LEAKAGE CURRENT
(DQ is disabled; 0V ≤ VOUT ≤ 5.5V)
DQ1-DQ36
IOZ
-10
10
µA
23
VOH
2.4
OUTPUT LEVELS
Output High Voltage (IOUT = -5mA)
Output Low Voltage (IOUT = 4.2mA)
V
VOL
0.4
V
MAX
PARAMETER/CONDITION
SYMBOL
SIZE
-6
UNITS NOTES
STANDBY CURRENT: (TTL)
(RAS# = CAS# = VIH)
ICC1
16MB
32MB
22
44
mA
STANDBY CURRENT: (CMOS)
(RAS# = CAS# = other inputs = VCC -0.2V)
ICC2
16MB
32MB
16
32
mA
OPERATING CURRENT: Random READ/WRITE
Average power supply current
(RAS#, CAS#, address cycling: tRC = tRC [MIN])
ICC3
16MB
32MB
1,400
1,422
mA
3, 22
OPERATING CURRENT: FAST PAGE MODE
Average power supply current
(RAS# = VIL, CAS#, address cycling: tPC = tPC [MIN])
ICC4
16MB
32MB
1,040
1,062
mA
3, 22
REFRESH CURRENT: RAS#-ONLY
Average power supply current
(RAS# cycling, CAS# = VIH: tRC = tRC [MIN])
ICC5
16MB
32MB
1,400
1,422
mA
3, 22
REFRESH CURRENT: CBR
Average power supply current
(RAS#, CAS#, address cycling: tRC = tRC [MIN])
ICC6
16MB
32MB
1,400
1,422
mA
3, 4
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
5
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
CAPACITANCE
MAX
PARAMETER
SYMBOL 16MB
32MB
UNITS
NOTES
Input Capacitance: A0-A10
CI1
70
140
pF
2
Input Capacitance: WE#
CI2
94
188
pF
2
Input Capacitance: RAS0#, RAS1#, RAS2#, RAS3#
CI3
50
50
pF
2
Input Capacitance: CAS0#, CAS1#, CAS2#, CAS3#
CI4
25
50
pF
2
Input/Output Capacitance: DQ1-DQ8, DQ10-DQ17, DQ19-DQ26, DQ28-DQ35
CIO1
10
18
pF
2
Input/Output Capacitance: DQ9, DQ18, DQ27, DQ36
CIO2
16
28
pF
2
AC ELECTRICAL CHARACTERISTICS
(Notes: 5, 6, 7, 8, 9, 10, 11, 12) (VCC = +5V ±10%)
AC CHARACTERISTICS
PARAMETER
Access time from column address
Column-address hold time (referenced to RAS#)
Column-address setup time
Row-address setup time
Access time from CAS#
Column-address hold time
CAS# pulse width
CAS# hold time (CBR REFRESH)
CAS# to output in Low-Z
CAS# precharge time
Access time from CAS# precharge
CAS# to RAS# precharge time
CAS# hold time
CAS# setup time (CBR REFRESH)
Write command to CAS# lead time
Data-in hold time
Data-in setup time
Output buffer turn-off delay
FAST-PAGE-MODE READ or WRITE cycle time
Access time from RAS#
RAS# to column-address delay time
Row-address hold time
RAS# pulse width
RAS# pulse width (FAST PAGE MODE)
Random READ or WRITE cycle time
RAS# to CAS# delay time
Read command hold time (referenced to CAS#)
Read command setup time
Refresh period (2,048 cycles)
RAS# precharge time
RAS# to CAS# precharge time
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
-6
SYMBOL
tAA
tAR
tASC
tASR
tCAC
tCAH
tCAS
tCHR
tCLZ
tCP
tCPA
tCRP
tCSH
tCSR
tCWL
tDH
tDS
tOFF
tPC
tRAC
tRAD
tRAH
tRAS
tRASP
tRC
tRCD
tRCH
tRCS
tREF
tRP
tRPC
6
MIN
MAX
30
45
0
0
15
10
15
15
3
10
10,000
35
10
60
10
15
10
0
3
35
15
60
15
10
60
60
110
20
0
0
10,000
125,000
32
40
0
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
ns
ns
NOTES
4
21
13
4
18
18
17, 21
15
14
16
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
AC ELECTRICAL CHARACTERISTICS
(Notes: 5, 6, 7, 8, 9, 10, 11, 12) (VCC = +5V ±10%)
AC CHARACTERISTICS
PARAMETER
Read command hold time (referenced to RAS#)
RAS# hold time
Write command to RAS# lead time
Transition time (rise or fall)
Write command hold time
Write command hold time (referenced to RAS#)
WE# command setup time
Write command pulse width
WE# hold time (CBR REFRESH)
WE# setup time (CBR REFRESH)
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
-6
SYMBOL
tRRH
tRSH
tRWL
tT
tWCH
tWCR
tWCS
tWP
tWRH
tWRP
7
MIN
0
15
15
2
10
45
0
10
10
10
MAX
50
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
NOTES
16
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
NOTES
14. The tRCD (MAX) limit is no longer specified. tRCD
(MAX) was specified as a reference point only. If
tRCD was greater than the specified tRCD (MAX)
limit, then access time was controlled exclusively by
tCAC (tRAC [MIN] no longer applied). With or
without the tRCD (MAX) limit, tAA and tCAC must
always be met.
15. The tRAD (MAX) limit is no longer specified. tRAD
(MAX) was specified as a reference point only. If
tRAD was greater than the specified tRAD (MAX)
limit, then access time was controlled exclusively by
tAA (tRAC and tCAC no longer applied). With or
without the tRAD (MAX) limit, tAA, tRAC and tCAC
must always be met.
16. Either tRCH or tRRH must be satisfied for a READ
cycle.
17. tOFF (MAX) defines the time at which the output
achieves the open circuit condition and is not
referenced to VOH or VOL.
18. These parameters are referenced to CAS# leading
edge in EARLY WRITE cycles.
19. OE# is tied permanently LOW; LATE WRITE or
READ-MODIFY-WRITE operations are not permissible and should not be attempted.
20. A HIDDEN REFRESH may also be performed after
a WRITE cycle. In this case, WE# = LOW and
OE# = HIGH.
21. The 3ns minimum is a parameter guaranteed by
design.
22. Column address changed once each cycle.
23. 16MB module values will be half of those shown.
1. All voltages referenced to VSS.
2. This parameter is sampled. Capacitance is measured
using MIL-STD-883C, Method 3012.1 (1 MHz AC,
VCC = 4.5V, DC bias = 2.4V at 15mV RMS).
3. ICC is dependent on output loading and cycle rates.
Specified values are obtained with minimum cycle
time and the outputs open.
4. Enables on-chip refresh and address counters.
5. The minimum specifications are used only to indicate
cycle time at which proper operation over the full
temperature range is ensured.
6. An initial pause of 100µs is required after power-up,
followed by eight RAS# refresh cycles (RAS#-ONLY
or CBR with WE# HIGH), before proper device
operation is ensured. The eight RAS# cycle wake-ups
should be repeated any time the tREF refresh
requirement is exceeded.
7. AC characteristics assume tT = 5ns.
8. VIH (MIN) and VIL (MAX) are reference levels for
measuring timing of input signals. Transition times
are measured between VIH and VIL (or between VIL
and VIH).
9. In addition to meeting the transition rate specification, all input signals must transit between VIH and
VIL (or between VIL and VIH) in a monotonic manner.
10. If CAS# = V IH, data output is High-Z.
11. If CAS# = V IL, data output may contain data from the
last valid READ cycle.
12. Measured with a load equivalent to two TTL gates
and 100pF, VOL = 0.8V and VOH = 2V.
13. If CAS# is LOW at the falling edge of RAS#, Q will be
maintained from the previous cycle. To initiate a new
cycle and clear the data-out buffer, CAS# must be
pulsed HIGH for tCP.
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
8
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
READ CYCLE
tRC
tRP
tRAS
RAS#
V IH
V IL
tCSH
tRSH
tRRH
,
,
,
,
,,,,,,, , ,,,,, ,
,, ,
, ,,
,, ,,
,
tRCD
tCRP
CAS#
tCAS
V IH
V IL
tAR
tRAD
tASR
ADDR
V IH
V IL
tRAH
tASC
ROW
tCAH
ROW
COLUMN
tRCH
tRCS
WE#
V IH
V IL
tAA
tRAC
tCAC
tOFF
tCLZ
DQ
V IOH
V IOL
OPEN
OPEN
VALID DATA
,
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6
-6
SYMBOL
tAA
tAR
tASC
tASR
MIN
45
0
0
tCAC
tCAH
tCAS
tCLZ
tCRP
15
10
15
3
tCSH
10
60
tOFF
3
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
MAX
30
10,000
15
SYMBOL
UNITS
ns
ns
ns
MIN
tRAC
tRAD
15
tRAH
10
60
110
ns
ns
tRAS
ns
ns
ns
tRCD
ns
ns
tRP
ns
tRC
UNITS
60
ns
ns
10,000
ns
ns
ns
20
0
ns
ns
tRRH
0
40
0
ns
ns
ns
tRSH
15
ns
tRCH
tRCS
9
MAX
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
EARLY WRITE CYCLE
tRC
tRAS
RAS#
tRP
V IH
V IL
tCSH
tRSH
,
,
,
,
,
,
,, , , , ,
,
,
,
,
,
,
,
,,,, ,, ,,,,,,,,,
,, ,,, ,
, , ,,
,,
tCRP
CAS#
tRCD
tCAS
V IH
V IL
tAR
tRAD
tASR
ADDR
V IH
V IL
tRAH
tASC
ROW
tCAH
ROW
COLUMN
tCWL
tRWL
tWCR
tWCS
tWCH
tWP
WE#
V IH
V IL
tDH
tDS
V
DQ V IOH
IOL
VALID DATA
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6
SYMBOL
tAR
tASC
MIN
45
-6
MAX
UNITS
ns
SYMBOL
MIN
MAX
UNITS
tRAH
10
60
110
10,000
ns
ns
ns
0
0
ns
ns
tRAS
10
15
10
ns
ns
ns
tRCD
60
15
ns
ns
tRWL
10
0
ns
ns
tWCR
tDS
tRAD
15
ns
tASR
tCAH
tCAS
tCRP
tCSH
tCWL
tDH
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
10,000
tRC
20
40
ns
ns
15
15
10
ns
ns
ns
tWCS
45
0
ns
ns
tWP
10
ns
tRP
tRSH
tWCH
10
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
FAST-PAGE-MODE READ CYCLE
tRASP
V IH
V IL
RAS#
tCSH
tCRP
CAS#
tRP
tRSH
tPC
tRCD
tCAS
tCP
tCAS
tCP
tCAS
tCP
,
,
,
,
,
,
,
,
,
,
,, ,,, ,, ,, , ,,,,
,
,
,
,
,
, ,
, , ,,,,
, , ,,,,
,
V IH
V IL
tAR
tRAD
tASR
ADDR
V IH
V IL
tRAH
tASC
ROW
tCAH
COLUMN
tASC
COLUMN
tCAH
COLUMN
tRCH
ROW
tRCS
tRRH
tRCH
tRCH
V IH
V IL
tAA
tAA
tRAC
tCPA
tCAC
tOFF
tCLZ
DQ
tCAH
tRCS
tRCS
WE#
tASC
V IOH
V IOL
tCAC
tAA
tCPA
tOFF
tCLZ
tOFF
tCLZ
VALID
DATA
OPEN
tCAC
VALID
DATA
VALID
DATA
OPEN
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6
SYMBOL
tAA
tAR
tASC
tASR
MIN
45
0
0
tCAC
15
tCAH
10
tCAS
15
3
10
tCLZ
tCP
-6
MAX
30
tCPA
10,000
SYMBOL
tOFF
tPC
tRAD
tRAH
ns
ns
ns
tRCD
tRP
tCRP
10
tCSH
60
ns
MIN
3
35
tRAC
ns
ns
ns
ns
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
35
UNITS
ns
ns
ns
ns
tRASP
UNITS
ns
ns
60
ns
125,000
ns
ns
ns
20
0
ns
ns
tRRH
0
40
0
ns
ns
ns
tRSH
15
ns
tRCH
tRCS
11
15
10
60
MAX
15
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
FAST-PAGE-MODE EARLY-WRITE CYCLE
tRP
tRASP
RAS#
V IH
V IL
tCSH
tPC
,
,,,,, ,,,, ,,,
,
,
,
,
,
,
,
,
,
,
,
,
,, ,,, ,, ,,
tCRP
CAS#
tRCD
tCAS
tCP
tCAS
tRSH
tCP
tCAS
V IH
V IL
tAR
tRAD
tASR
ADDR
V IH
V IL
tRAH
tASC
ROW
tCAH
tASC
COLUMN
tCAH
COLUMN
tCWL
tWCS
tWCH
tWCS
tWCH
tWCS
tWP
V
DQ V IOH
IOL
tDS
VALID DATA
tDH
VALID DATA
tWCH
tWP
tWCR
tDH
ROW
tCWL
V IH
V IL
tDS
,
,,,,
,
,
,
,,,,,
,
tCAH
COLUMN
tCWL
tWP
WE#
tASC
tCP
tDS
tRWL
tDH
VALID DATA
DON’T CARE
,
UNDEFINED
TIMING PARAMETERS
-6
SYMBOL
tAR
tASC
tASR
tCAH
tCAS
tCP
tCRP
tCSH
tCWL
tDH
tDS
tPC
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
MIN
45
0
0
-6
MAX
UNITS
ns
ns
ns
SYMBOL
tRAD
tRAH
tRASP
ns
ns
tRCD
10
10
60
ns
ns
ns
tRSH
15
10
ns
ns
tWCR
0
35
ns
ns
10
15
10,000
MAX
125,000
UNITS
ns
ns
ns
20
40
ns
ns
15
15
10
ns
ns
ns
tWCS
45
0
ns
ns
tWP
10
ns
tRP
tRWL
tWCH
12
MIN
15
10
60
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
FAST-PAGE-MODE READ-EARLY-WRITE CYCLE
(Pseudo READ-MODIFY-WRITE)
tRASP
RAS#
tRP
V IH
V IL
tRSH
tCSH
tCRP
CAS#
tPC
tRCD
tCAS
tCP
tCAS
tCP
,, ,, ,,, ,,,,
,
,
,
,
,
,
,
,
,, , , ,, , ,
,
,,,
V IH
V IL
tAR
tRAD
tASR
ADDR
V IH
V IL
tASC
tRAH
ROW
tASC
tCAH
COLUMN
tCAH
ROW
COLUMN
tCWL
tRWL
tRCS
tWP
tWCS
WE#
V IH
V IL
tCAC
t CLZ
DQ
tWCH
V OH
V OL
NOTE 1
t OFF
tDS
VALID
DATA
OPEN
tDH
VALID DATA
tAA
t RAC
,
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6
SYMBOL
MIN
UNITS
30
ns
ns
ns
tOFF
ns
ns
tRAD
ns
ns
ns
tRASP
10
10
ns
ns
tRP
60
15
ns
ns
tRWL
10
0
ns
ns
tWCS
tAA
tAR
tASC
45
0
tASR
0
tCAC
tCAH
tCAS
tCLZ
tCP
tCRP
tCSH
tCWL
tDH
tDS
-6
MAX
15
10
15
3
10,000
SYMBOL
tPC
MIN
MAX
UNITS
3
35
15
ns
ns
60
ns
ns
ns
125,000
ns
ns
tRAC
tRAH
tRCD
tRCS
tRSH
tWCH
tWP
15
10
60
20
0
40
15
ns
ns
ns
15
10
ns
ns
0
10
ns
ns
NOTE: 1. Do not drive data prior to tristate.
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
13
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
RAS#-ONLY REFRESH CYCLE
(WE# = DON’T CARE)
tRC
tRAS
V IH
V IL
,,
RAS#
CAS#
ADDR
tCRP
tRP
,
,
,
,
,, ,, ,,
,
tRPC
V IH
V IL
tASR
tRAH
V IH
V IL
ROW
V
DQ V OH
OL
ROW
OPEN
CBR REFRESH CYCLE
(Addresses = DON’T CARE)
tRP
RAS#
tRAS
tRP
tRAS
V IH
V IL
tRPC
,,,,,,,,,,,,,,,,,,,
, ,
,,,
tCP
CAS#
V IH
V IL
DQ
V OH
V OL
tCSR
tCSR
tCHR
OPEN
tWRP
WE#
tRPC
tCHR
tWRH
tWRP
tWRH
V IH
V IL
,
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6
-6
SYMBOL
tASR
MIN
MAX
UNITS
SYMBOL
MIN
MAX
UNITS
60
110
40
10,000
ns
ns
ns
0
15
10
ns
ns
ns
tRAS
10
10
ns
ns
tRPC
tCSR
tWRH
0
10
ns
ns
tRAH
10
ns
tWRP
10
ns
tCHR
tCP
tCRP
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
tRC
tRP
14
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
HIDDEN REFRESH CYCLE 20
(WE# = HIGH)
tRAS
RAS#
tRAS
V IH
V IL
,
,
,
,
,
,
,,
,
,
,
,
,
, ,, , , , , ,
,
,
,
tCRP
CAS#
tRP
tRSH
tRCD
tCHR
V IH
V IL
tAR
tRAD
tASR
ADDR
V IH
V IL
tRAH
tASC
ROW
tCAH
COLUMN
tAA
tRAC
tCAC
tOFF
tCLZ
DQ
V IOH
V IOL
OPEN
VALID DATA
OPEN
,
DON’T CARE
UNDEFINED
TIMING PARAMETERS
-6
SYMBOL
tAA
tAR
tASC
tASR
tCAC
tCAH
tCHR
tCLZ
tCRP
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
MIN
-6
MAX
30
45
0
0
15
UNITS
ns
ns
ns
ns
ns
SYMBOL
tOFF
MIN
MAX
UNITS
3
15
60
ns
ns
ns
10,000
ns
ns
ns
tRAC
tRAD
15
tRAH
10
tRAS
10
15
ns
ns
tRCD
tRP
60
20
40
3
10
ns
ns
tRSH
15
15
ns
ns
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
72-Pin SIMM
(16MB)
4.260 (108.20)
4.240 (107.70)
.200 (5.08)
MAX
1.200 (30.48)
1.180 (29.97)
.125 (3.18)
TYP
.400 (10.16)
TYP
.250 (6.35)
.054 (1.37)
.047 (1.19)
1.75 (44.45) TYP
.080 (2.03)
PIN 1
.250 (6.35)
.050 (1.27)
TYP
.040 (1.02)
TYP
.133 (3.38)
TYP
3.75 (95.25)
72-Pin SIMM
(16MB)
4.260 (108.20)
4.240 (107.70)
.350 (8.89)
MAX
1.200 (30.48)
1.180 (29.97)
.125 (3.18)
TYP.
.400 (10.16)
TYP.
.250 (6.35)
.054 (1.37)
.047 (1.19)
1.75 (44.45) TYP.
.080 (2.03)
PIN 1
.250 (6.35)
.050 (1.27)
TYP.
.040 (1.02)
TYP.
.133 (3.38)
TYP.
3.75 (95.25)
NOTE:
1. All dimensions in inches (millimeters)
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
MAX
or typical where noted.
MIN
16
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
PARITY DRAM SIMMs
72-Pin SIMM
(32MB)
FRONT VIEW
4.260 (108.20)
4.240 (107.70)
.350 (8.98)
MAX
.133 (3.38)
TYP
.125 (3.18)
TYP
1.010 (25.65)
.990 (25.15)
.400 (10.16)
TYP
.250 (6.35)
1.75 (44.45) TYP
.080 (2.03)
PIN 1
.250 (6.35)
.050 (1.27)
TYP
.040 (1.02)
TYP
.235 (5.97)
MIN
.054 (1.37)
.047 (1.19)
3.75 (95.25)
BACK VIEW
NOTE:
1. All dimensions in inches (millimeters) MAX or typical where noted.
MIN
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
E-mail: [email protected], Internet: http://www.micron.com, Customer Comment Line: 800-932-4992
Micron is a registered trademark of Micron Technology, Inc.
4, 8 Meg x 36 Parity DRAM SIMMs
DM45.pm5 – Rev. 3/97
17
Micron Technology, Inc., reserves the right to change products or specifications without notice.
„1997, Micron Technology, Inc.