IRFR2307Z IRFU2307Z Features HEXFET® Power MOSFET Advanced Process Technology Ultra Low On-Resistance l175°C Operating Temperature lFast Switching lRepetitive Avalanche Allowed up to Tjmax l l D RDS(on) = 16mΩ G Description Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications. ID = 42A S D-Pak IRFR2307Z Absolute Maximum Ratings Parameter ID @ T C = 25°C VDSS = 75V Max. Continuous Drain Current, V GS @ 10V (Silicon Limited) IDM 42 c Linear Derating Factor Gate-to-Source Voltage d E AS (Thermally limited) Single Pulse Avalanche Energy Single Pulse Avalanche Energy Tested Value E AS (Tested ) c IAR Avalanche Current E AR TJ Repetitive Avalanche Energy T STG Storage Temperature Range 210 h Parameter Junction-to-Ambient (PCB mount) Junction-to-Ambient j 100 mJ A °C Mounting Torque, 6-32 or M3 screw R θJA W/°C V -55 to + 175 300 (1.6mm from case ) y ij y 10 lbf in (1.1N m) Thermal Resistance R θJA 0.70 ± 20 mJ Soldering Temperature, for 10 seconds j W 140 Operating Junction and Junction-to-Case 110 See Fig.12a, 12b, 15, 16 g R θJC A 38 Continuous Drain Current, V GS @ 10V (Package Limited) Pulsed Drain Current P D @T C = 25°C Power Dissipation V GS Units 53 ID @ T C = 100°C Continuous Drain Current, V GS @ 10V ID @ T C = 25°C I-Pak IRFU2307Z Typ. Max. ––– 1.42 ––– 40 ––– 110 Units °C/W HEXFET® is a registered trademark of International Rectifier. 1 / 11 www.freescale.net.cn IRFR2307Z IRFU2307Z Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter Min. Typ. Max. Units Drain-to-Source Breakdown Voltage 75 ––– ––– ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.072 ––– V/°C Reference to 25°C, ID = 1mA RDS(on) Static Drain-to-Source On-Resistance ––– 12.8 16 mΩ VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 100µA gfs Forward Transconductance 30 ––– ––– S VDS = 25V, ID = 32A IDSS Drain-to-Source Leakage Current ––– ––– 25 µA ––– ––– 250 Gate-to-Source Forward Leakage ––– ––– 200 Gate-to-Source Reverse Leakage ––– ––– -200 Qg Total Gate Charge ––– 50 75 Qgs Gate-to-Source Charge ––– 14 ––– Qgd Gate-to-Drain ("Miller") Charge ––– 19 ––– td(on) Turn-On Delay Time ––– 16 ––– VDD = 38V tr Rise Time ––– 65 ––– ID = 32A td(off) Turn-Off Delay Time ––– 44 ––– tf Fall Time ––– 29 ––– VGS = 10V LD Internal Drain Inductance ––– 4.5 ––– Between lead, LS Internal Source Inductance ––– 7.5 ––– IGSS V Conditions V(BR)DSS VGS = 0V, ID = 250µA VGS = 10V, ID = 32A e VDS = 75V, VGS = 0V VDS = 75V, VGS = 0V, TJ = 125°C nA VGS = 20V VGS = -20V ID = 32A nC VDS = 60V VGS = 10V ns nH RG = 10 Ω e e D 6mm (0.25in.) G from package S and center of die contact Ciss Input Capacitance ––– 2190 ––– VGS = 0V Coss Output Capacitance ––– 280 ––– Crss Reverse Transfer Capacitance ––– 150 ––– Coss Output Capacitance ––– 1070 ––– VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz Coss Output Capacitance ––– 190 ––– VGS = 0V, VDS = 60V, ƒ = 1.0MHz Coss eff. Effective Output Capacitance ––– 400 ––– VGS = 0V, VDS = 0V to 60V VDS = 25V pF ƒ = 1.0MHz f Source-Drain Ratings and Characteristics Parameter Min. Typ. Max. Units Conditions IS Continuous Source Current ––– ––– 42 ISM (Body Diode) Pulsed Source Current ––– ––– 210 VSD (Body Diode) Diode Forward Voltage ––– ––– 1.3 V p-n junction diode. TJ = 25°C, IS = 32A, VGS = 0V trr Reverse Recovery Time ––– 31 47 ns TJ = 25°C, IF = 32A, VDD = 38V Qrr Reverse Recovery Charge ––– 31 47 nC di/dt = 100A/µs ton Forward Turn-On Time 2 / 11 c MOSFET symbol A showing the integral reverse e e Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) www.freescale.net.cn IRFR2307Z IRFU2307Z 1000 1000 100 BOTTOM TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V 4.5V 10 1 4.5V 100 BOTTOM VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V 4.5V 10 4.5V ≤60µs PULSE WIDTH ≤60µs PULSE WIDTH Tj = 25°C 0.1 0.1 1 10 0.1 100 10 100 VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 80 Gfs , Forward Transconductance (S) ID, Drain-to-Source Current(Α) 1 VDS, Drain-to-Source Voltage (V) 1000 100 TJ = 175°C 10 TJ = 25°C 1 VDS = 20V TJ = 25°C 60 TJ = 175°C 40 20 VDS = 10V 380µs PULSE WIDTH ≤60µs PULSE WIDTH 0.1 0 2 4 6 8 VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics 3 / 11 Tj = 175°C 1 10 0 10 20 30 40 50 60 70 ID,Drain-to-Source Current (A) Fig 4. Typical Forward Transconductance vs. Drain Current www.freescale.net.cn IRFR2307Z IRFU2307Z 4000 VGS, Gate-to-Source Voltage (V) Coss = Cds + Cgd 3000 C, Capacitance(pF) 20 VGS = 0V, f = 1 MHZ Ciss = Cgs + Cgd, Cds SHORTED Crss = Cgd Ciss 2000 1000 Coss Crss VDS = 60V VDS= 38V VDS= 15V 16 12 8 4 0 0 1 ID= 32A 10 0 100 1000 ID, Drain-to-Source Current (A) ISD , Reverse Drain Current (A) 1000.00 100.00 TJ = 175°C 10.00 1.00 TJ = 25°C VGS = 0V 0.4 0.6 0.8 1.0 1.2 1.4 VSD , Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 / 11 60 80 Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 0.2 40 QG Total Gate Charge (nC) VDS , Drain-to-Source Voltage (V) 0.10 20 1.6 OPERATION IN THIS AREA LIMITED BY R DS (on) 100 100µsec 10 1msec 10msec 1 Tc = 25°C Tj = 175°C Single Pulse 0.1 1 DC 10 100 VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area www.freescale.net.cn IRFR2307Z IRFU2307Z 60 2.5 RDS(on) , Drain-to-Source On Resistance (Normalized) LIMITED BY PACKAGE ID , Drain Current (A) 50 40 30 20 10 0 25 50 75 100 125 150 ID = 32A VGS = 10V 2.0 1.5 1.0 0.5 175 -60 -40 -20 TC , Case Temperature (°C) 0 20 40 60 80 100 120 140 160 180 TJ , Junction Temperature (°C) Fig 10. Normalized On-Resistance vs. Temperature Fig 9. Maximum Drain Current vs. Case Temperature Thermal Response ( Z thJC ) 10 1 D = 0.50 0.20 0.10 0.1 0.05 τJ 0.02 0.01 R1 R1 τJ τ1 R2 R2 τ2 τ1 τC τ τ2 Ri (°C/W) τi (sec) 0.7938 0.000499 0.6257 0.005682 Ci= τi/Ri Ci i/Ri 0.01 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 5 / 11 www.freescale.net.cn IRFR2307Z IRFU2307Z D.U.T RG VGS 20V DRIVER L VDS + V - DD IAS tp A 0.01Ω Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp EAS, Single Pulse Avalanche Energy (mJ) 500 15V ID 3.4A 4.6A BOTTOM 32A TOP 400 300 200 100 0 25 50 75 100 125 150 175 Starting TJ, Junction Temperature (°C) I AS Fig 12c. Maximum Avalanche Energy vs. Drain Current Fig 12b. Unclamped Inductive Waveforms QG QGS QGD 5.0 VG Charge Fig 13a. Basic Gate Charge Waveform L DUT 0 1K VCC VGS(th) Gate threshold Voltage (V) 10 V ID = 1.0A ID = 1.0mA ID = 250µA ID = 100µA 4.5 4.0 3.5 3.0 2.5 2.0 1.5 1.0 -75 -50 -25 0 25 50 75 100 125 150 175 TJ , Temperature ( °C ) Fig 13b. Gate Charge Test Circuit 6 / 11 Fig 14. Threshold Voltage vs. Temperature www.freescale.net.cn IRFR2307Z IRFU2307Z 1000 Avalanche Current (A) Duty Cycle = Single Pulse 100 Allowed avalanche Current vs avalanche pulsewidth, tav assuming ∆Tj = 25°C due to avalanche losses 0.01 10 0.05 0.10 1 0.1 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 15. Typical Avalanche Current vs.Pulsewidth EAR , Avalanche Energy (mJ) 120 TOP Single Pulse BOTTOM 1% Duty Cycle ID = 32A 100 80 60 40 20 0 25 50 75 100 125 150 Starting TJ , Junction Temperature (°C) Fig 16. Maximum Avalanche Energy vs. Temperature 7 / 11 Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 12a, 12b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 15, 16). tav = Average time in avalanche. 175 D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see figure 11) PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC Iav = 2DT/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav www.freescale.net.cn IRFR2307Z IRFU2307Z D.U.T Driver Gate Drive + • • • • D.U.T. ISD Waveform Reverse Recovery Current + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test P.W. Period * RG D= VGS=10V Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer - - Period P.W. + VDD + Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage - Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs VDS VGS RG RD D.U.T. + -VDD 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Fig 18a. Switching Time Test Circuit VDS 90% 10% VGS td(on) tr t d(off) tf Fig 18b. Switching Time Waveforms 8 / 11 www.freescale.net.cn IRFR2307Z IRFU2307Z D-Pak (TO-252AA) Tape & Reel Information Dimensions are shown in millimeters (inches) TR TRR 16.3 ( .641 ) 15.7 ( .619 ) 12.1 ( .476 ) 11.9 ( .469 ) FEED DIRECTION TRL 16.3 ( .641 ) 15.7 ( .619 ) 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 13 INCH 16 mm NOTES : 1. OUTLINE CONFORMS TO EIA-481. Notes: Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS . max. junction temperature. (See fig. 11). Limited by TJmax, starting TJ = 25°C, L = 0.197mH Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive RG = 25Ω, IAS = 32A, VGS =10V. Part not avalanche performance. recommended for use above this value. This value determined from sample failure population. 100% Pulse width ≤ 1.0ms; duty cycle ≤ 2%. tested to this value in production. When mounted on 1" square PCB (FR-4 or G-10 Material) . For recommended footprint and soldering techniques refer to application note #AN-994 Rθ is measured at TJ approximately 90°C Repetitive rating; pulse width limited by 11 /11 www.freescale.net.cn