SSF3018 Feathers: ID=60A Advanced trench process technology Special designed for Convertors and power controls High density cell design for ultra low Rdson Fully characterized Avalanche voltage and current Avalanche Energy 100% test BV=100V Rdson=15mohm Description: The SSF3018 is a new generation of middle voltage and high current N–Channel enhancement mode trench power MOSFET. This new technology increases the cell density and reduces the on-resistance; its typical Rdson can reduce to 13.8mohm. Application: Power switching application Absolute Maximum Ratings SSF3018 TOP View (TO220) Parameter Max. Units ID@Tc=25ْ C Continuous drain current,VGS@10V 60 ID@Tc=100ْC Continuous drain current,VGS@10V 50 IDM Pulsed drain current ① 240 PD@TC=25ْC Power dissipation 147 W Linear derating factor 2.0 W/ْ C VGS Gate-to-Source voltage ±20 V EAS Single pulse avalanche energy ② 480 mJ EAR Repetitive avalanche energy TBD TJ Operating Junction and TSTG Storage Temperature Range A ْC –55 to +150 Thermal Resistance RθJC Parameter Min. Typ. Max. Units Junction-to-case — 0.85 — ْC/W Electrical Characteristics @TJ=25 ْC(unless otherwise specified) Parameter Min. Typ. BVDSS Drain-to-Source breakdown voltage 100 — — V VGS=0V,ID=250μA RDS(on) Static Drain-to-Source on-resistance — 13.8 15 mΩ VGS=10V,ID=30A VGS(th) Gate threshold voltage 2.0 4.0 V VDS=VGS,ID=250μA gfs Forward transconductance 42 — S VDS=10V,ID=30A — 1 IDSS Drain-to-Source leakage current — Max. Units — — 100 Gate-to-Source forward leakage — — 100 Gate-to-Source reverse leakage — — -100 Qg Total gate charge — 49 — Qgs Gate-to-Source charge — 15 — IGSS ©Silikron Semiconductor CO. LTD. 2009.7.15 Test Conditions VDS=100V,VGS=0V μA VDS=100V, VGS=0V,TJ=150ْC nA VGS=20V VGS=-20V nC Version: 1.0 ID=10A VDS=0.5VDSS page 1of5 SSF3018 Qgd Gate-to-Drain("Miller") charge — 11 — VGS=10V td(on) Turn-on delay time — 27 — VDS=0.5VDSS tr Rise time — 40 — td(off) Turn-Off delay time — 43 — tf Fall time — 37 — VGS=10V Ciss Input capacitance — 2650 — VGS=0V Coss Output capacitance — 335 — Crss Reverse transfer capacitance — 60 — ID=10A nS RG=15Ω pF VDS=25V f=1.0MHZ Source-Drain Ratings and Characteristics Parameter Continuous Source Current. IS ISM (Body Diode) Pulsed Source Current (Body Diode) ① . Min. Typ. Max. — — 60 Units MOSFET symbol A — — 240 Test Conditions showing the integral reverse p-n junction diode. VSD Diode Forward Voltage — — 1.3 V TJ=25ْC,IS=30A,VGS=0V ③ trr Reverse Recovery Time - 59 — nS IF=0.5*IS, VGS=0V, VR=0.5*VDSS Qrr Reverse Recovery Charge - 112 — nC di/dt=100A/μs ③ ton Forward Turn-on Time Intrinsic turn-on time is negligible (turn-on is dominated by Ls + LD) Notes: ① Repetitive rating; pulse width limited by max junction temperature. ② Test condition: L =0.3mH, ID = 37A, VDD = 50V ③ Pulse width≤300μS; duty cycle≤1.5% RG = 25ΩStarting TJ = 25°C EAS test circuits: Gate charge test circuit: BV dss ©Silikron Semiconductor CO. LTD. 2009.7.15 Version: 1.0 page 2of5 SSF3018 Switch Waveforms: Switch Time Test Circuit: Input Admittance Capacitance On Resistance vs. Junction Temperature On Resistance vs. Drain Current ©Silikron Semiconductor CO. LTD. 2009.7.15 Version: 1.0 page 3of5 SSF3018 Gate Charge Forward Voltage Drop of Intrinsic Diode Output Characteristics@25℃ Drain Current vs. Case Temperature Maximum Transient Thermal Impedance ©Silikron Semiconductor CO. LTD. 2009.7.15 Version: 1.0 page 4of5 SSF3018 TO220 MECHANICAL DATA: ©Silikron Semiconductor CO. LTD. 2009.7.15 Version: 1.0 page 5of5