NSC 54ABT16374

54ABT16374
16-Bit D Flip-Flop with TRI-STATE ® Outputs
General Description
Features
The ABT16374 contains sixteen non-inverting D flip-flops
with TRI-STATE outputs and is intended for bus oriented
applications. The device is byte controlled. A buffered clock
(CP) and Output Enable (OE) are common to each byte and
can be shorted together for full 16-bit operation.
Separate control logic for each byte
16-bit version of the ABT374
Edge-triggered D-type inputs
Buffered Positive edge-triggered clock
High impedance glitch free bus loading during entire
power up and power down cycle
n Non-destructive hot insertion capability
n Guaranteed latch-up protection
n Standard Microcircuit Drawing (SMD) 5962-9320101
n
n
n
n
n
Ordering Code:
Commercial
Package
Package Description
Number
54ABT16374W-QML
WA48A
48-Lead Cerpack
Connection Diagram
Logic Symbol
Pin Assignment for Cerpack
DS100224-1
Pin Description
Pin
Description
Names
OEn
TRI-STATE Output Enable Input (Active Low)
CPn
Clock Pulse Input (Active Rising Edge)
D0–D15
Data Inputs
O0–O15
TRI-STATE Outputs
DS100224-2
TRI-STATE ® is a registered trademark of National Semiconductor Corporation.
© 2004 National Semiconductor Corporation
DS100224
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54ABT16374 16-Bit D Flip-Flop with TRI-STATE Outputs
July 1998
54ABT16374
Functional Description
Truth Tables
The ABT16374 consists of sixteen edge-triggered flip-flops
with individual D-type inputs and TRI-STATE true outputs.
The device is byte controlled with each byte functioning
identically, but independent of the other. The control pins can
be shorted together to obtain full 16-bit operation. Each byte
has a buffered clock and buffered Output Enable common to
all flip-flops within that byte. The description which follows
applies to each byte. Each flip-flop will store the state of their
individual D inputs that meet the setup and hold time requirements on the LOW-to-HIGH Clock (CPn) transition. With the
Output Enable (OEn) LOW, the contents of the flip-flops are
available at the outputs. When OEn is HIGH, the outputs go
to the high impedance state. Operation of the OEn input
does not affect the state of the flip-flops.
Inputs
Outputs
CP1
OE1
D0–D7
O0–O7
N
L
H
H
N
L
L
L
L
L
X
(Previous)
X
H
X
Z
CP2
OE2
D8–D15
O8–O15
N
L
H
H
N
L
L
L
L
L
X
(Previous)
X
H
X
Z
Inputs
Outputs
H = High Voltage Level
L = Low Voltage Level
X = Immaterial
Z = High Impedance
Logic Diagrams
Byte 1 (0:7)
DS100224-3
Byte 2 (8:15)
DS100224-4
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2
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
Ceramic
VCC Pin Potential to
Ground Pin
Input Voltage (Note 2)
Input Current (Note 2)
Voltage Applied to Any Output
in the Disabled or
Power-Off State
in the HIGH State
Current Applied to Output
in LOW State (Max)
DC Latchup Source Current:
OE Pin
(Across Comm Operating Range)
Other Pins
Over Voltage Latchup (I/O)
−65˚C to +150˚C
−55˚C to +125˚C
−55˚C to +175˚C
−350 mA
−500 mA
10V
Recommended Operating
Conditions
−0.5V to +7.0V
−0.5V to +7.0V
−30 mA to +5.0 mA
Free Air Ambient Temperature
Military
Supply Voltage
Military
Minimum Input Edge Rate
Data Input
Enable Input
Clock Input
−0.5V to 5.5V
−0.5V to VCC
twice the rated IOL (mA)
−55˚C to +125˚C
+4.5V to +5.5V
(∆V/∆t)
50 mV/ns
20 mV/ns
100mV/ns
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under these
conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
ABT16374
Units
VCC
Conditions
Min Typ Max
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
IIH
Input HIGH Current
2.0
V
0.8
V
−1.2
V
Recognized HIGH Signal
Recognized LOW Signal
Min
IIN = −18 mA
54ABT
2.5
V
Min
IOH = −3 mA
54ABT
2.0
V
Min
IOH = −24 mA
0.55
V
Min
IOL = 48 mA
5
µA
Max
VIN = 2.7V (Note 4)
54ABT
5
VIN = VCC
IBVI
Input HIGH Current Breakdown Test
7
µA
Max
VIN = 7.0V
IIL
Input LOW Current
−5
µA
Max
VIN = 0.5V (Note 4)
VID
Input Leakage Test
V
0.0
IID = 1.9 µA
−5
4.75
VIN = 0.0V
All Other Pins Grounded
IOZH
Output Leakage Current
50
µA
0−5.5V
VOUT = 2.7V; OE = 2.0V
IOZL
Output Leakage Current
−50
µA
0−5.5V
VOUT = 0.5V; OE = 2.0V
IOS
Output Short-Circuit Current
−275
mA
Max
VOUT = 0.0V
ICEX
Output High Leakage Current
50
µA
Max
VOUT = VCC
IZZ
Bus Drainage Test
100
µA
0.0
VOUT = 5.5V; All Others VCC or GND
ICCH
Power Supply Current
2.0
mA
Max
All Outputs HIGH
ICCL
Power Supply Current
62
mA
Max
All Outputs LOW
ICCZ
Power Supply Current
Max
OE = VCC; All Others at VCC or GND
Max
Enable Input VI = VCC − 2.1V
ICCT
Additional ICC/Input
−100
2.0
mA
Outputs Enabled
2.5
mA
Outputs TRI-STATE
2.5
mA
Outputs TRI-STATE
2.5
mA
VI = VCC − 2.1V
Data Input VI = VCC − 2.1V
All Others at VCC or GND
ICCD
Dynamic ICC
No Load
mA/
(Note 4)
0.30
MHz
Max
Outputs Open
OE = GND, (Note 3)
One Bit Toggling, 50% Duty Cycle
Note 3: For 8-bit toggling, ICCD < 0.8 mA/MHz.
Note 4: Guaranteed, but not tested.
3
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54ABT16374
Absolute Maximum Ratings (Note 1)
54ABT16374
DC Electrical Characteristics
Conditions
Symbol
Parameter
Min
Max
Units
VCC
CL = 50 pF,
RL = 500Ω
VOLP
Quiet Output Maximum Dynamic VOL
1.1
V
5.0
TA = 25˚C (Note 5)
VOLV
Quiet Output Minimum Dynamic VOL
-0.45
V
5.0
TA = 25˚C(Note 5)
Note 5: Max number of outputs defined as (n). n − 1 data inputs are driven 0V to 3V. One output at LOW.
AC Electrical Characteristics
54ABT
TA = −55˚C to +125˚C
Symbol
VCC = 4.5V to 5.5V
Parameter
Units
CL = 50 pF
Min
fmax
Max Clock
Max
150
MHz
Frequency
tPLH
Propagation Delay
tPHL
CP to On
1.5
6.9
tPZH
Output Enable Time
0.8
6.5
1.2
6.5
1.5
9.6
1.5
7.2
1.5
tPZL
tPHZ
Output Disable Time
tPLZ
6.9
ns
ns
ns
AC Operating Requirements
54ABT
TA = −55˚C to +125˚C
Symbol
Parameter
VCC = 4.5V to 5.5V
Units
CL = 50 pF
Min
ts(H)
Setup Time, HIGH
1.3
ts(L)
or LOW Dn to CP
1.3
th(H)
Hold Time, HIGH
1.5
th(L)
or LOW Dn to CP
1.5
tw(H)
Pulse Width, CP
3.3
tw(L)
HIGH or LOW
3.3
Max
ns
ns
ns
Capacitance
Symbol
Parameter
Typ
Units
Conditions (TA = 25˚C)
CIN
Input Capacitance
5.0
pF
VCC = 0V
COUT (Note 6)
Output Capacitance
11.0
pF
VCC = 5.0V
Note 6: COUT is measured at frequency f = 1 MHz, per MIL-STD-883B, Method 3012.
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4
54ABT16374
AC Loading
DS100224-6
*Includes jig and probe capacitance
DS100224-10
FIGURE 1. Standard AC Test Load
FIGURE 5. Propagation Delay,
Pulse Width Waveforms
DS100224-7
FIGURE 2. Propagation Delay Waveforms
for Inverting and Non-Inverting Functions
DS100224-11
FIGURE 6. Setup Time, Hold Time
and Recovery Time Waveforms
DS100224-8
FIGURE 3. Test Input Pulse Requirements
DS100224-12
Amplitude
Rep Rate
tW
tr
tf
3.0V
1 MHz
500 ns
2.5 ns
2.5 ns
FIGURE 7. TRI-STATE Output HIGH
and LOW Enable and Disable Times
FIGURE 4. Test Input Signal Requirements
5
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54ABT16374 16-Bit D Flip-Flop with TRI-STATE Outputs
Physical Dimensions
inches (millimeters) unless otherwise noted
48-Lead Cerpack
NS Package Number WA48A
LIFE SUPPORT POLICY
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
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systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and
whose failure to perform when properly used in
accordance with instructions for use provided in the
labeling, can be reasonably expected to result in a
significant injury to the user.
2. A critical component is any component of a life
support device or system whose failure to perform
can be reasonably expected to cause the failure of
the life support device or system, or to affect its
safety or effectiveness.
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