LUGUANG BYW98-200

BYW98-200
High Efficiency Fast Recovery Rectifier Diodes
DO-201AD
MAIN PRODUCT CHARACTERISTICS
IF(AV)
3A
VRRM
200 V
Tj (max)
150 °C
VF (max)
0.85 V
trr (max)
35 ns
FEATURES AND BENEFITS
VERY LOW CONDUCTION LOSSES
NEGLIGIBLE SWITCHING LOSSES
LOW FORWARD AND REVERSE RECOVERY
TIMES
Dimensions in inches and (millimeters)
DESCRIPTION
Low voltage drop and rectifier suited for switching
mode base drive and transistor circuits.
ABSOLUTE RATINGS (limiting values)
Symbol
Parameter
VRRM
Repetitive peak reverse voltage
IFRM
Repetitive peak forward current *
IF (AV)
Average forward current*
IFSM
Surge non repetitive forward current
Tstg
Storage temperature range
tp=5 µs
F=1KHz
Ta = 75°C
δ = 0.5
tp = 10ms
Sinusoidal
Value
Unit
200
V
110
A
3
A
70
A
- 65 to + 150
°C
Tj
Maximum operating junction temperature
150
°C
TL
Maximum lead temperature for soldering during 10s at
4mm from case
230
°C
* On infinite heatsink with 10mm lead length.
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mail:[email protected]
BYW98-200
High Efficiency Fast Recovery Rectifier Diodes
THERMAL RESISTANCE
Symbol
Rth (j-a)
Parameter
Junction-ambient *
Value
Unit
25
°C/W
* On infinite heatsink with 10mm lead length.
STATIC ELECTRICAL CHARACTERISTICS
Symbol
IR *
VF **
Parameter
Test Conditions
Min.
Reverse leakage
current
Tj = 25°C
Forward voltage drop
Tj = 25°C
IF = 9A
Tj = 100°C
IF = 3A
Typ.
VR = VRRM
Tj = 100°C
Max.
Unit
10
µA
0.5
mA
1.2
V
0.78
0.85
Typ.
Max.
Unit
35
ns
Pulse test : * tp = 5 ms, δ < 2 %
** tp = 380 µs, δ < 2 %
To evaluate the conduction losses use the following equations:
2
P = 0.75 x IF(AV) + 0.04 IF (RMS)
RECOVERY CHARACTERISTICS
Symbol
Test Conditions
Min.
trr
Tj = 25°C
VR = 30V
IF = 1A
dIF/dt = - 50A/µs
Qrr
Tj = 25°C
VR ≤ 30V
IF = 3A
dIF/dt = - 20A/µs
15
nC
tfr
Tj = 25°C
IF = 3A
Measured at 1.1 x VF max
dIF/dt = - 50A/µs
20
ns
Tj = 25°C
dIF/dt = - 50A/µs
5
V
VFP
IF = 3A
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mail:[email protected]
BYW98-200
High Efficiency Fast Recovery Rectifier Diodes
Fig. 1: Average forward power dissipation versus
average forward current.
Fig. 2: Average forward current versus ambient
temperature (δ=0.5).
IF(av)(A)
PF(av)(W)
3.5
3.5
δ = 0.05
3.0
δ = 0.1
δ = 0.2
δ=1
δ = 0.5
Rth(j-a)=Rth(j-l)
3.0
2.5
2.5
2.0
2.0
1.5
1.5
Rth(j-a)=75°C/W
1.0
1.0
T
0.5
δ=tp/T
IF(av) (A)
0.0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
T
0.5
tp
3.5
Fig. 3: Thermal resistance versus lead length.
0.0
δ=tp/T
0
Tamb(°C)
tp
25
50
75
100
125
150
Fig. 4: Variation of thermal impedance junction to
ambient versus pulse duration (recommended pad
layout, epoxy FR4, e(Cu)=35µm).
Rth(°C/W)
Zth(j-a)/Rth(j-a)
90
1.00
80
δ = 0.5
Rth(j-a)
70
δ = 0.2
60
50
0.10
40
δ = 0.1
Rth(j-l)
30
T
20
Single pulse
10
0
tp(s)
Lleads(mm)
5
10
15
20
25
Fig. 5: Forward voltage drop versus forward
current (maximum values).
70.00
0.01
1E-1
1E+0
1E+1
δ=tp/T
tp
1E+2
5E+2
Fig. 6: Junction capacitance versus reverse
voltage applied (typical values).
IFM(A)
C(pF)
100
F=1MHz
Tj=25°C
Tj=100°C
(Typical values)
10.00
50
Tj=25°C
Tj=100°C
1.00
20
VFM(V)
0.10
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2
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VR(V)
10
1
10
mail:[email protected]
100
200
BYW98-200
High Efficiency Fast Recovery Rectifier Diodes
Fig. 7: Reverse recovery time versus dIF/dt.
Fig. 8: Peak reverse recovery current versus
dIF/dt.
trr(ns)
2.5
100
IF=3A
90% confidence
Tj=100°C
80
IRM(A)
IF=3A
90% confidence
Tj=100°C
2.0
Tj=100°C
Tj=100°C
1.5
60
40
1.0
Tj=25°C
Tj=25°C
0.5
20
dIF/dt(A/µs)
0
1
10
100
0.0
dIF/dt(A/µs)
1
10
Fig. 9: Dynamic parameters versus junction
temperature.
%
250
IF=3A
dIF/dt=50A/µs
VR=30V
Qrr
200
IRM
150
100
25
trr
Tj(°C)
50
75
100
125
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150
mail:[email protected]
100