ETC EDI2DL32256V35BC

EDI2DL32256V
256Kx32 Synchronous Pipline Burst SRAM 3.3V
FEATURES
DESCRIPTION
■ tKHQV times of 3.5, 3.8 and 4.0ns
The EDI2DL32256VxxBC is a 3.3V, 256Kx32 Synchronous Pipeline
Burst SRAM constructed with two 256Kx16 die mounted on a
multi-layer laminate substrate. The device is packaged in a 119
lead, 14mm by 22mm, BGA. It is available with clock speeds of166,
150 and 133 MHz. The device is a Pipeline Burst SRAM, allowing
the user to develop a fast external memory for Texas Instruments’
“C6x”. In Burst Mode data from the first memory location is
available in three clock cycles, while the subsequent data is
available in one clock cycle (3/1/1/1). Subsequent burst addresses are generated by the TMS320C6x DSP. Individual address
locations can also be read, allowing one memory access in 3 clock
cycles. All synchronous inputs are gated by registers controlled by
a positive-edge-triggered clock input (CLK). The synchronous inputs include all addresses, all data inputs, chip enable (CE\), burst
control input (ADSC\), byte write enables (BW0\ to BW3\) and
Write Enable (BWE\).
■ 166, 150 and 133 MHz clock speed
■ DSP Memory Solution
• Texas Instruments’ TMS320C6201
• Texas Instruments’ TMS320C67x
■ Package:
• 119 pin BGA, JEDEC MO-163
■ 3.3V Operating Supply Voltage
■ 3.5ns Output Enable access time
■ Single Write Control and Output Enable Lines
■ Single Chip Enable Line
■ 56% space savings vs. monolithic TQFPs
■ Multiple VCC and VSS pins
Asynchronous inputs include the output enable (OE\), burst mode
control (MODE), and sleep mode control (ZZ). The data outputs
(DQ), enabled by OE\, are also asynchronous.
■ Reduced inductance and capacitance
Address lines and the chip enable are registered with the address
status controller (ADSC\) input pin.
FIG. 1
PIN CONFIGURATION
1
2
3
4
5
BLOCK DIAGRAM
6
7
A
VDD
A
A
NC
A
A
VDD
A
B
NC
NC
A
ADSC\
A
A
NC
B
C
NC
A
A
VDD
A
A
NC
C
D
DQ16
NC
VSS
NC
VSS
NC
DQ8
D
E
DQ18
DQ17
VSS
CE\
VSS
DQ9
DQ10
E
F
VDD
DQ19
VSS
OE\
VSS
DQ11
VDD
F
G
DQ21
DQ20
BE2\
NC
BE1\
DQ12
DQ13
G
H
DQ23
DQ22
VSS
NC
VSS
DQ14
DQ15
H
J
VDD
VDD
NC
VDD
NC
VDD
VDD
J
K
DQ31
DQ30
VSS
CLK
VSS
DQ6
DQ7
K
L
DQ29
DQ28
BE3\
NC
BE0\
DQ4
DQ5
L
M
VDD
DQ27
VSS
BWE\
VSS
DQ3
VDD
M
N
DQ26
DQ25
VSS
A1
VSS
DQ1
DQ2
N
P
DQ24
NC
VSS
A0
VSS
NC
DQ0
P
R
NC
A
MODE
VDD
NC
A
NC
R
T
NC
NC
A
A
A
NC
ZZ
T
U
VDD
NC
NC
NC
NC
NC
VDD
U
1
2
3
4
5
6
7
November 2000, Rev. 1
ECO #13417
A0-17
CLK
ADSC\
OE\
BWE\
CE\
MODE
ZZ
BE0\
BE1\
256K X 16
SSRAM
BE2\
BE3\
256K X 16
SSRAM
1
DQ0-7
DQ8-15
DQ16-23
DQ24-31
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EDI2DL32256V
PIN DESCRIPTIONS
Pin
Symbol
Type
Various
A0-17
L5,G5
G3,L3
M4
BE0\,BE1\,
BE2\,BE3\
BWE\
K4
CLK
E4
CE\
F4
B4
OE\
ADSC\
R3
MODE
Input
Synchronous
Input
Synchronous
Input
Synchronous
Input
Synchronous
Input
Synchronous
Input
Input
Synchronous
Input
Description
T7
ZZ
Various
Various
Various
DQ0-31
Vcc
Vss
Input
Synchronous
Input/Output
Supply
Ground
Addresses: These inputs are registered and must meet setup and hold times around the rising edge
of CLK.
Byte Write: A byte write is LOW for a WRITE cycle and HIGH for a READ BE2\, BE3\ cycle. BE0\ controls
DQ0-7. BE1\ controls DQ8-15. BE2\ controls DQ16-23. BE3\ controls DQ24-31
Byte Write Enable: This active LOW input gates byte write operations and must meet the setup and hold
times around the rising edge of CLK.
Clock:This signal registers the addresses, data, chip enables, write control and burst control inputs on
its rising edge. All synchronous inputs must meet setup and hold times around the clockís rising edge.
Chip Enable: This active LOW inputs is used to enable the device.
Output Enable: This active LOW asynchronous input enables the data output drivers
Address Status Controller: This active LOW input causes device to be deselected or selected along with new
external address to be registered. A READ or WRITE cycle is initiated depending upon write control inputs.
Static Mode: This input selects the burst sequence. A LOW on this pin selects LINEAR BURST. A NC or
HIGH on this pin selects INTERLEAVED BURST.
Snooze: This active HIGH input puts the device in low power consumption standby mode. For normal
operation, this input has to be either LOW or NC (no connect)
Data Inputs/Outputs: First byte is DQ0-7, second byte is DQ8-15, third byte is DQ16-23, fourth byte is DQ24-31
Core power supply: +3.3V -5%/+5%
Ground
TRUTH TABLE
Operation
Deselected Cycle, Power Down
WRITE Cycle, Begin Burst
READ Cycle, Begin Burst
READ Cycle, Begin Burst
READ Cycle, Suspend Burst
READ Cycle, Suspend Burst
READ Cycle, Suspend Burst
READ Cycle, Suspend Burst
WRITE Cycle, Suspend Burst
WRITE Cycle, Suspend Burst
Address Used
None
External
External
External
Current
Current
Current
Current
Current
Current
CE\
H
L
L
L
X
X
H
H
X
H
ADSC\
L
L
L
L
H
H
H
H
H
H
WRITE\
X
L
H
H
H
H
H
H
L
L
OE\
X
X
L
H
L
H
L
H
X
X
DQ
High-Z
D
Q
High-Z
Q
High-Z
Q
High-Z
D
D
NOTE:
1. X means ìdonít careî, H means logic HIGH. L means logic LOW.
2a.WRITE\ = L, means [BE0\*BE1\*BE2\*BE3\]*BWE\ equals LOW
2b.WRITE\ = H, means [BE0\*BE1\*BE2\*BE3\]*BWE\ equals HIGH
3. All inputs except OE\ must meet setup and hold times around the rising edge (LOW to HIGH) of CLK.
4. Suspending burst generates wait cycle
5. For a write operation following a read operation, OE\ must be HIGH before the input data required setup time plus High-Z time for OE\ and staying HIGH though
out the input data hold time.
6. This device contains circuitry that will ensure the outputs will be in High-Z during power-up.
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November 2000, Rev. 1
ECO #13417
EDI2DL32256V
ABSOLUTE MAXIMUM RATINGS*
Voltage on Vcc Supply Relative to Vss
RECOMMENDED OPERATING CONDITIONS
-0.5V to 4.6V
VIN
Symbol
Min
Max
-0.5V to Vcc+0.5V
Input High Voltage
VIH
2
Vcc+0.3
V
-55°C to +110°C
Input Low Voltage
VIL
-0.3
0.7
V
Supply Voltage
Vcc
3.135
3.465
V
Storage Temperature
Junction Temperature
+110°C
Power Dissipation
3 Watts
Short Circuit Output Current (per I/O)
Description
20 mA
CAPACITANCE
(f = 1MHz, VIN = VCC or VSS)
* Stresses greater than those listed under "Absolute Maximum Ratings" may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions greater than those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
Parameter
Address Lines
Data Lines
Control Lines
PARTIAL TRUTH TABLE
Function
BWE\
BE0\
BE1\
BE2\
READ
H
X
X
X
X
WRITE one Byte (DQ0-7)
L
L
H
H
H
WRITE all Bytes
L
L
L
L
L
Unit
Symbol
Max
Unit
CA
TBD
pF
CD/Q
TBD
pF
CC
TBD
pF
BE\3
DC ELECTRICAL CHARACTERISTICS
(f = 1MHz, VIN = VCC or Vss)
Parameter
Symbol
Power Supply Current: Operating
I CC1
CMOS Standby
I SB2
TTL Standby
I SB3
TTL Standby
I SB4
Input Leakage Current
Output Leakage Current
Output High Voltage
Output Low Voltage
IL I
IL O
VOH
VOL
Conditions
Min
Device Selected; all inputs ≤ V IL or ≥ VIH;
cycle time ≥ tKC MIN; V CC = MAX; outputs open
Device deselected; V CC = MAX; all inputs ≤
VSS +0.2 or ≥ V CC -0.2; all inputs static;
CLK frequency = 0
Device deselected; all inputs ≤ V IL or ≥ VIH;
all inputs static; V CC = MAX; CLK frequency = 0
Device deselected; all inputs ≤ V IL or ≥ VIH;
VCC = MAX; CLK cycle time ≥ t CK MIN
0V < VIN < V CC
Output(s) disabled, 0V ≤ V OUT ≤ V CC
I OH = -2.0mA
I OL = 2.0mA
AC TEST CIRCUIT
Units
850
mA
20
mA
40
mA
40
mA
2
2
µA
µA
V
V
-2
-2
2.4
0.7
AC TEST CONDITIONS
Parameter
Output
Max
Z0
Z0==50Ω
50Ω
Input Pulse Levels
Input Rise and Fall Times (max)
Input and Output Timing Levels
50Ω
Output Load
I/O
Unit
VSS to 2.5
V
1.8
ns
1.25
V
See figure, at left
Vt = 1.5V
1.25V
AC Output Load Equivalent
November 2000, Rev. 1
ECO #13417
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EDI2DL32256V
AC ELECTRICAL CHARACTERISTICS
Description
Symbol
Min
3.5ns
Max
Min
3.8ns
Max
Min
4.0ns
Max
Units
Clock
Clock cycle time
tKHKH
6
6.7
7.5
Clock HIGH time
tKHKL
2.4
2.6
2.8
Clock LOW time
tKLKH
2.4
2.6
2.8
Output Times
Clock to output valid
tKHQV
Clock to output in Low-Z
tKHQX
0
3.5
Clock to output in High-Z
tKHQZ
1.5
OE to output valid
tOELQV
OE to output in Low-Z
tOELQX
OE to output in High-Z
tOEHQZ
3.8
0
6
1.5
3.5
0
4.0
0
6.7
1.5
3.5
0
3.5
7.5
3.8
0
3.5
3.8
Setup Times
Address Status Controller valid to Clock
tSCVKH
1.5
1.5
1.5
Address valid to Clock
tAVKH
1.5
1.5
1.5
Chip Enable valid to Clock
tEVKH
1.5
1.5
1.5
Write Enable (BWE\) valid to Clock
tWLKH
1.5
1.5
1.5
Data Valid to Clock
tDVKH
1.5
1.5
1.5
Address Status Controller Hold time
tKHSCX
0.5
0.5
0.5
Address Hold time
tKHAX
0.5
0.5
0.5
Chip Enable Hold time
tKHEX
0.5
0.5
0.5
Write Enable (BWE\) Hold time
tKHWX
0.5
0.5
0.5
Data Hold time
tKHDX
0.5
0.5
0.5
Hold Times
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November 2000, Rev. 1
ECO #13417
EDI2DL32256V
FIG. 2
READ TIMING
tKHKL tKLKH
tKHKH
CLK
tSC VKH
tKHSC X
ADSC\
tEVKH
CE\
tKHEX
tAVKH
ADDR
A1
A2
A3
A5
A4
tKHAX
OE\
tOELQ X
tOEHQZ
tOELQ V
WRITE\
tKHQ Z
tKHQ V
tKHQ X
DQ
November 2000, Rev. 1
ECO #13417
Q(A1)
Q(A2)
5
Q(A3)
Q(A4)
Q(A5)
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EDI2DL32256V
FIG. 3
WRITE TIMING
tKHK H
t KHK L t KLKH
CLK
t SC VKH
t KHSCX
ADSC\
t EVKH
CE\
t KHEX
t AVKH
ADDR
A2
A1
A3
A4
A5
t KHAX
OE\
KHG WX
t WVKH
t KHWX
WRITE\
t DVK H
DQ
D(A1)
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t KHDX
D(A2)
6
D(A3)
D (A4)
D(A5)
November 2000, Rev. 1
ECO #13417
EDI2DL32256V
ORDERING INFORMATION
Commercial Temperature Range (0°C to +70°C)
Part Number
tKQ (ns)
Clock Frequency
(MHz)
EDI2DL32256V35BC
3.5
166
EDI2DL32256V38BC
3.8
150
TBD
EDI2DL32256V40BC
4.0
133
TBD
PACKAGE DESCRIPTION:
Industrial Temperature Range (-40°C to +85°C)
Part Number
tKQ (ns)
Clock Frequency
(MHz)
EDI2DL32256V40BI
4.0
133
Package
No.
TBD
Package
No.
TBD
119 LEAD BGA
JEDEC MO-163
0.110 MAX
0.300 BSC
0.551 BSC
R 0.062 MAX
(4x)
A
B
PIN 1 INDEX
C
D
E
F
G
0.800
BSC
0.050
TYP
H
0.866
BSC
J
K
L
M
N
P
R
T
U
0.028 MAX
0.050 TYP
ALL DIMENSIONS ARE IN INCHES
November 2000, Rev. 1
ECO #13417
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EDI2DL32256V
FIG. 5
INTERFACING THE TEXAS INSTRUMENTS TMS320C6201
WITH THE EDI2DL32256V (256Kx32 SSRAM)
EA0-22
A0-17
(NOTE 1)
CE2\
CE1\
CE0\
CE\
(NOTE 4)
MODE
NC, Vss, Vcc
ZZ (NOTE 2)
BE3\
BE2\
EDI2DL32256V
BE1\
BE0\
OE\
ADSC\
ADV\
GW\ (NOTE 3)
CLK
BE3\
Texas Instruments BE2\
1\
TMS320C6201 BE
BE0\
SSOE\
SSADS\
SSADV\
SSWE\
CLKOUT1
CLKOUT2
ED0-31
DQ0-31
NOTES:
1. Either CE0 or CE2 can be used to enable the device.
2. When the ZZ pin is asserted HIGH, the device will be in CMOS standby mode regardless of the state of any other pins. While in standby mode the device will
take one complete Clock cycle to become active again after a LOW is asserted on the ZZ pin. One possible option for the designer concerned about power is
to tie the ZZ signal to the chip enable they are using for the device. Any time the chip is disabled (by driving the chip enable pin HIGH) the device will go into
standby mode. Standby mode can also be achieved by tying the ZZ pin LOW or allowing it to float and meeting all the signal conditions specified in the data
sheet.
3. Use CLKOUT1 for running the memory at the same clock speed as the C6x. Use CLKOUT2 for running the SBSRAM at one half the clock rate of the C6x.
4. The MODE pin can be tied to Vss (Linear Burst), tied to Vcc (Interleaved Burst) or allowed to float (Interleaved Burst).
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November 2000, Rev. 1
ECO #13417